LCD Screen Testing Method and System Based on Automatic Chip Identification

Abstract

This invention discloses a method and system for testing LCD screens based on automatic chip identification, relating to the field of LCD screen testing technology. The method includes: identifying the chip information of the LCD screen under test to determine its chip type; determining a target test program based on the chip type of the LCD screen under test and candidate test programs corresponding to various test items integrated in the test program storage and recall module; executing the target test program and controlling the output of test results; wherein a signal isolation protection module is used to separate interference signals from test signals generated during the execution of the target test program; using current and voltage sensors to monitor the current and voltage values ​​of the LCD screen under test in real time during the test; and invoking a protection mechanism when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition.

Description

Technical Field

[0001] This application relates to the field of LCD screen testing technology, and more specifically, to an LCD screen testing method and system based on automatic chip identification. Background Technology

[0002] With the rapid development of LCD technology, LCD screens are increasingly widely used in various electronic products. However, LCD screens require rigorous testing during the production process to ensure their quality and performance meet design requirements. Traditional LCD screen defect detection mainly relies on manual visual inspection methods, which are inefficient and susceptible to the subjective factors of the inspectors, making it impossible to guarantee the quality of the inspection. Manual inspection is easily affected by factors such as personal vision, mood, fatigue, and lighting, leading to low work efficiency.

[0003] There is currently no effective solution to the above problems. Summary of the Invention

[0004] This application provides a method and system for testing LCD screens based on automatic chip identification to solve the above-mentioned technical problems.

[0005] This application provides a method for testing LCD screens based on automatic chip identification, comprising: identifying the chip information of the LCD screen to be tested to determine the chip type of the LCD screen to be tested; determining a target test program based on the chip type of the LCD screen to be tested and candidate test programs corresponding to multiple test items integrated in the test program storage and recall module; executing the target test program and controlling the output of test results; wherein, a signal isolation protection module is used to separate interference signals from test signals generated during the execution of the target test program; using current sensors and voltage sensors to monitor the current and voltage values ​​of the LCD screen to be tested in real time during the test process; and invoking a protection mechanism when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition.

[0006] This application provides a liquid crystal display (LCD) testing system based on automatic chip identification, comprising: an automatic chip identification module for identifying chip information of the LCD under test to determine the chip type of the LCD under test; a test program storage and recall module for determining a target test program based on the chip type of the LCD under test determined by the automatic chip identification module and candidate test programs corresponding to multiple test items integrated in the test program storage and recall module; a control unit for receiving and processing data from various modules, executing the target test program, and controlling the output of test results; wherein the various modules communicate with each other via a high-speed bus; a current and voltage detection module for real-time monitoring of the current and voltage values ​​of the LCD under test during the test process using current and voltage sensors; and for invoking a protection mechanism when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition; and a signal isolation protection module for separating interference signals from test signals generated by the control unit during the execution of the target test program.

[0007] Based on the embodiments provided in this application, the chip information of the LCD screen under test is identified to determine the chip type; the target test program is determined according to the chip type of the LCD screen under test and the candidate test programs corresponding to various test items integrated in the test program storage and recall module; the target test program is executed, and the test results are controlled and output; wherein, the signal isolation protection module is used to separate interference signals from the test signals generated during the execution of the target test program; the current and voltage values ​​of the LCD screen under test are monitored in real time using current and voltage sensors during the test; and the protection mechanism is invoked when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition. This improves the testing efficiency and accuracy of the LCD screen. By automatically identifying the chip type, determining whether the current is qualified, implementing voltage protection, and isolating test signals, the system can meet the factory's comprehensive testing needs for LCD screens. At the same time, the system has a high degree of intelligence and automation, reducing the frequency of manual intervention and test program changes, and lowering production costs and labor intensity. Furthermore, the system has good scalability and compatibility, and can adapt to future development trends in LCD screen testing technology.

[0008] In summary, the LCD screen testing system and its implementation method based on automatic chip identification proposed in this application have the advantages of high efficiency, accuracy, intelligence and high degree of automation, which can meet the needs of modern factories for LCD screen testing and have high practical value and application prospects. Attached Figure Description

[0009] The accompanying drawings, which are included to provide a further understanding of embodiments of the invention and form part of this application, illustrate exemplary embodiments of the invention and, together with their description, serve to explain the invention and do not constitute an undue limitation thereof. In the drawings:

[0010] Figure 1 This is a flowchart of an optional LCD screen testing method based on automatic chip identification according to an embodiment of this application;

[0011] Figure 2 This is a structural diagram of an optional LCD screen testing system based on automatic chip identification according to an embodiment of this application;

[0012] Figure 3 This is a schematic diagram of an optional current and voltage detection module according to an embodiment of this application;

[0013] Figure 4 This is a schematic diagram of an optional signal isolation and protection module according to an embodiment of this application.

[0014] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0015] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings.

[0016] Traditional LCD screen testing systems often suffer from problems such as complex testing procedures, low testing efficiency, and frequent test procedure changes, making it difficult to meet the large-scale, high-efficiency production needs of modern factories. Therefore, this invention proposes an intelligent LCD screen testing system that uses an STM32F103VCT6 microcontroller as the core control unit. This system can automatically identify chip types, determine current compliance, implement voltage protection, isolate test signals, and meet the testing requirements of all LCD screens in the factory, thereby significantly improving testing efficiency and accuracy.

[0017] Optionally, such as Figure 1 As shown, this application provides a liquid crystal display (LCD) testing method based on automatic chip identification, including:

[0018] S101, Identify the chip information of the LCD screen to be tested in order to determine the chip type of the LCD screen to be tested;

[0019] S102, determine the target test program based on the chip type of the LCD screen to be tested and the candidate test programs corresponding to various test items integrated in the test program storage and recall module;

[0020] S103 executes the target test program and controls the output of test results; among which, the signal isolation protection module is used to separate interference signals from the test signals generated during the execution of the target test program;

[0021] Interference signals refer to non-target signals that may adversely affect the LCD screen testing system during the testing process. These signals may originate from various factors, including but not limited to: Electromagnetic interference: interference caused by electromagnetic fields generated by other electronic devices or power lines, which may affect sensor readings and signal transmission of the testing system; Power supply noise: fluctuations or noise in the power supply line, which may be caused by the power supply itself or other devices connected to the same power supply; Crosstalk: signal interference caused by electromagnetic coupling between multiple signal lines or circuit board traces; Radio frequency interference: interference generated by radio frequency equipment, such as wireless communication equipment, radar, etc.; Digital noise: rapid voltage changes that may be generated by switching operations in digital circuits, which can couple into analog circuits and affect the accuracy of test signals; Environmental noise: noise caused by environmental factors such as electrostatic discharge, temperature changes, and humidity changes; Equipment noise: noise generated by internal components of the testing equipment, such as amplifier noise and sensor noise; Signal reflection and refraction: signal reflection and refraction caused by impedance mismatch in long cables or transmission lines.

[0022] In a testing system, the signal isolation and protection module separates interference signals from the test signals generated by the control unit during the execution of the target test program, ensuring the accuracy and reliability of the test results. By using isolation and filtering circuits, the system can reduce or eliminate the influence of these interference signals, thereby improving the stability and accuracy of the test.

[0023] S104 uses current and voltage sensors to monitor the current and voltage values ​​of the LCD screen under test in real time during the test process; and calls the protection mechanism if the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition.

[0024] With high-precision current and voltage sensors, the system can accurately determine whether the current of the LCD screen is qualified and take timely protective measures when the voltage is abnormal, ensuring the safety and reliability of the testing process.

[0025] During LCD screen testing, the protection mechanism is invoked to ensure test safety and the integrity of the LCD screen. The protection mechanism activates when the current or voltage values ​​detected by current and voltage sensors exceed the preset safety range. Specifically, the protection mechanism can include the following aspects: Power-off protection: Upon detecting abnormal current or voltage, the system immediately cuts off the power supply to prevent damage to the LCD screen or test equipment; Alarm notification: The system may issue audible and visual alarms to notify operators to check and handle the abnormal situation; Data logging: When an abnormality occurs, the system records the current and voltage values ​​at the time of occurrence, as well as the time of occurrence, for subsequent cause analysis; Automatic reset: In some cases, the system may attempt an automatic reset to restart the test process; Short-circuit protection: If a short circuit is detected, the protection mechanism will prevent current from continuing to flow, avoiding the risk of circuit overheating or fire; Overload protection: When the current exceeds the maximum value that the LCD screen or test equipment can withstand, the protection mechanism will limit the current to prevent equipment damage; Abnormal voltage protection: If the voltage exceeds the normal operating range, the system will adjust the voltage or cut off the power supply to protect the LCD screen and test equipment.

[0026] The implementation of these protection mechanisms can refer to specific LCD screen testing technologies. For example, by powering on the LCD screen and determining whether the voltage value is the expected value, if the voltage value is abnormal, the power is turned off, the connectors are reconnected, or other protective measures are taken. In this way, the protection mechanisms help improve the reliability and safety of the testing process.

[0027] Based on the embodiments provided in this application, the chip information of the LCD screen under test is identified to determine the chip type; the target test program is determined according to the chip type of the LCD screen under test and the candidate test programs corresponding to various test items integrated in the test program storage and recall module; the target test program is executed, and the test results are controlled and output; wherein, the signal isolation protection module is used to separate interference signals from the test signals generated during the execution of the target test program; the current and voltage values ​​of the LCD screen under test are monitored in real time using current and voltage sensors during the test; and the protection mechanism is invoked when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition. This improves the testing efficiency and accuracy of the LCD screen. By automatically identifying the chip type, determining whether the current is qualified, implementing voltage protection, and isolating test signals, the system can meet the factory's comprehensive testing needs for LCD screens. At the same time, the system has a high degree of intelligence and automation, reducing the frequency of manual intervention and test program changes, and lowering production costs and labor intensity. Furthermore, the system has good scalability and compatibility, and can adapt to future development trends in LCD screen testing technology.

[0028] In summary, the LCD screen testing system and its implementation method based on automatic chip identification proposed in this application have the advantages of high efficiency, accuracy, intelligence and high degree of automation, which can meet the needs of modern factories for LCD screen testing and have high practical value and application prospects.

[0029] Optionally, such as Figure 2 As shown, this application provides a liquid crystal display (LCD) testing system based on automatic chip identification. This system implements the method as described in claim 1, characterized in that it includes:

[0030] The chip automatic identification module 201 is used to identify the chip information of the LCD screen to be tested in order to determine the chip type of the LCD screen to be tested.

[0031] Advanced automatic chip identification technology is employed, which automatically matches the corresponding test program by reading the chip information on the LCD screen. This technology not only avoids the tedious process of manually selecting test programs but also greatly improves the accuracy and efficiency of testing. Furthermore, this technology supports the identification of multiple chip types, meeting the factory's testing needs for different types of LCD screens.

[0032] The test program storage and recall module 202 is used to determine the target test program based on the chip type of the LCD screen to be tested determined by the chip automatic identification module 201 and the candidate test programs corresponding to various test items integrated in the test program storage and recall module 202.

[0033] The control unit 203 is used to receive and process data from various modules, execute target test programs, and control the output of test results; wherein, the various modules communicate with each other via a high-speed bus;

[0034] The system has a clear overall architecture, and the modules communicate with each other through a high-speed bus to ensure the real-time performance and accuracy of the data.

[0035] The current and voltage detection module 204 is used to monitor the current and voltage values ​​of the LCD screen under test in real time during the test process using current and voltage sensors; and to invoke the protection mechanism if the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition.

[0036] The signal isolation and protection module 205 is used to separate the interference signal from the test signal generated during the execution of the target test program by the control unit 203.

[0037] For example, the current and voltage detection module 204 can be as follows: Figure 3 As shown. The signal isolation and protection module 205 can be used as follows. Figure 4 As shown.

[0038] Furthermore, the automatic chip identification module identifies the chip information of the LCD screen under test to determine the chip type of the LCD screen under test, and is configured as follows:

[0039] Initialize and write the first register of the LCD screen to be tested;

[0040] The test LCD screen is checked by calling the reset function; if the test LCD screen is not reset, it is reset.

[0041] Read the value of the first register to identify the ID value of the LCD screen under test;

[0042] The first register is the ID register.

[0043] Correct the identified ID value;

[0044] Iterate through the predefined ID array. For each ID value in the predefined ID array, determine whether the identified ID value matches the current ID value. If the identified ID value matches the current ID value, determine the chip series type corresponding to the current ID value as the chip series type of the LCD screen to be tested. The predefined ID array stores the ID values ​​of different LCD screen chips and their corresponding index values. The index values ​​are used to identify the chip series type of the LCD screen chip.

[0045] If the chip series type of the LCD screen to be tested does not belong to the preset chip series type, the chip series type of the LCD screen to be tested will be determined as the chip type of the LCD screen to be tested.

[0046] If the chip series of the LCD screen to be tested belongs to the preset chip series, the chip type of the LCD screen to be tested is determined by reading the value of the second register of the LCD screen to be tested.

[0047] Furthermore, the preset chip types include the 7781 series, 9325 series, and 9225 series. If the chip type of the LCD screen under test belongs to the preset chip type, the chip type of the LCD screen under test is determined by reading the value of the second register of the LCD screen under test, and is configured as follows:

[0048] If the chip series of the LCD screen to be tested belongs to the 7781 series, the second register is the 0xFF register; read the value of the 0xFF register; if the value of the 0xFF register is not 0, then the chip type of the LCD screen to be tested is determined to be the 7781 model; if the value of the 0xFF register is 0, then the chip type of the LCD screen to be tested is determined to be the 7781R model.

[0049] If the chip type of the LCD screen under test belongs to the 9325 series, the second register is register 0xE4. Read the value of register 0xE4. If the value of register 0xE4 is 0x1C30, the chip type of the LCD screen under test is determined to be 9325. If the value of register 0xE4 is 0x310b, the chip type of the LCD screen under test is determined to be 3225A. If the value of register 0xE4 is 0x1480, read the value of register 0xCD of the LCD screen under test. Based on the value of register 0xCD, determine whether the chip type of the LCD screen under test is 9325C or 9325D.

[0050] If the chip series of the LCD screen to be tested belongs to the 9225 series, the second register is the 0xED register; read the value of the 0xED register; if the value of the 0xED register is 0x2683, then the chip type of the LCD screen to be tested is determined to be the 9225 model; if the value of the 0xED register is 0x2682, then the chip type of the LCD screen to be tested is determined to be the 1L19225C model.

[0051] For example, in one process: initialization and write commands: First, the registers of the LCD display are initialized and written through a loop. This is to ensure that the LCD screen is in a known initial state for the subsequent recognition process.

[0052] Reset Detection: The tst_Reset() function is called to check if the LCD screen has been reset. If the LCD screen has not been reset, a reset operation will be performed in advance to ensure stability.

[0053] Reading the ID register: Use the TEST_LCD_ReadReg16BIT(0x00) function to read the LCD screen's ID register. This register typically contains information used to identify the chip model.

[0054] ID value correction: Based on the read ID value, some corrections are performed. This is because some chips may read the ID in a misaligned or incorrect way. For example, if the ID is 0x1006, it is corrected to 0x7006; if it is 0x3145, it is corrected to 0x4531.

[0055] ID matching: Iterate through a predefined ID array IC and check if the read ID matches a certain ID in the array. If a matching ID is found, it means that the chip model of the LCD screen has been identified.

[0056] Differentiating specific models: For certain specific chip models, further differentiation is required. This is done by reading the value of another register (0xFF). If the value of this register is not 0, it is considered to be a 7781 model; if it is 0, execution jumps to the 7781.

[0057] Distinguishing the 9325 series: For the 9325 series chips, read the value of the 0xE4 register to distinguish different sub-models. For example, if the value of 0xE4 is 0x1C30, it is considered a 9325 model; if it is 0x310b, it is considered a 3225A model; if it is 0x1480, the value of the 0xCD register needs to be read further to distinguish between 9325C and 9325D.

[0058] To differentiate between the 9225 series: For chips in the 9225 series, read the value of the 0xED register. If the value is 0x2683, it is considered a 9225 model; if it is 0x2682, it is considered a 1L19225C model.

[0059] Return result: Once the chip model is identified, an index value is returned via the return statement. This index value corresponds to the position in the predefined ID array IC, which indicates the identified chip model.

[0060] The entire process involves reading specific register values, combining them with a predefined ID array, and using specific correction and differentiation logic to identify the LCD screen chip model.

[0061] Furthermore, one test item corresponds to multiple candidate test programs; the test items include latent black spot test items, white and black spot test items, bright and dark scratch test items, combined misalignment test items, brightness and contrast test items, color accuracy test items, and dead pixel test items; the test program storage and recall module determines the target test program based on the chip type of the LCD screen under test determined by the chip automatic identification module and the candidate test programs corresponding to the multiple test items integrated in the test program storage and recall module, and is configured as follows:

[0062] Based on the constructed chip test database, the target test items supported by the chip type of the LCD screen to be tested and the various candidate test programs corresponding to the target test items are determined. The chip test database includes the LCD screen chip type, supported test items and the corresponding various candidate test programs.

[0063] Analyze the degree of support of the LCD screen under test for the target test items, as well as the combination and selection of various candidate test programs corresponding to the target test items;

[0064] Based on the analysis results, the target combined test program is determined from a variety of candidate test programs corresponding to the target test items;

[0065] Based on the chip type of the LCD screen to be tested, the test parameters of the target combination test program are optimized, and the optimized target combination test program is determined as the target test program.

[0066] Furthermore, the analysis examines the degree of support the LCD screen under test provides for the target test items, as well as the combination and selection methods of various candidate test programs corresponding to the target test items. Based on the analysis results, the target combined test program is determined from the various candidate test programs corresponding to the target test items and configured as follows:

[0067] Determine the performance parameters of the LCD screen to be tested that are relevant to the target test items;

[0068] Based on the performance parameters related to the target test item, determine the degree to which the chip type of the LCD screen under test supports the target test item; among which, the performance parameters corresponding to the target test item include resolution, color depth, response time, and power consumption;

[0069] Each candidate test program is treated as a node to build a test program dependency network;

[0070] If there is a dependency between two candidate test programs, for example, the output of one test program is the input of the other, then a directed edge is established between the corresponding nodes;

[0071] An initial influence score is assigned to each candidate test program based on the following formula; wherein the initial influence score is based on the candidate test program's position and number of connections in the test program's dependent network;

[0072] InitialInfluence(p)=k×degree(p)+∑ q∈dependent(p) InitialInfluence(q)

[0073] Where InitialInfluence(p) is the initial influence score of node p in the network dependent on the test program; k is an adjustment constant; degree(p) is the degree of node p; dependent(p) is the set of nodes dependent on node p; node q is the node dependent on node p; InitialInfluence(q) is the initial influence score of node q.

[0074] Create a reference matrix DSM; where the rows and columns of the reference matrix DSM represent candidate test programs. If program i depends on program j, then mark it as 1 at position DSM[i][j].

[0075] Hierarchical clustering algorithms are used to analyze the reference matrix DSM to identify candidate test programs that can be executed in parallel.

[0076] Calculate the K-shell value for each node; the K-shell value reflects the node's centrality in the network that the test program depends on.

[0077] The K-shell value is the minimum shell of a node, representing how many layers of nodes need to be removed from the node before the network is disconnected.

[0078] Candidate test programs are sorted according to their K-shell values, with priority given to test programs that are highly core to the test.

[0079] The dynamic adaptability score is determined for each candidate test program based on the following formula; the dynamic adaptability score takes into account the adaptability of the test program to different chip types and its performance in different test environments.

[0080] AdapabilityScore(p)

[0081] =α1×Accuracy(p)+α2×Flexibility(p)+α3×Stability(p)

[0082] Where AdapabilityScore(p) is the dynamic adaptability score of the candidate test program corresponding to node p; Accuracy(p) is the accuracy of the candidate test program corresponding to node p; Flexiblebility(p) is the flexibility of the candidate test program corresponding to node p; Stability(p) is the stability of the candidate test program corresponding to node p; α1, α2, and α3 are all weight coefficients.

[0083] Based on the initial influence score, K-shell core ranking, and dynamic adaptability score, the combination and selection methods of various candidate test programs corresponding to the target test project are analyzed, and the analysis results are obtained.

[0084] Based on the clustering and analysis results of the reference matrix DSM, the target combined test program is determined from a variety of candidate test programs corresponding to the target test items.

[0085] When analyzing the combination and selection of multiple candidate test programs for a target test item, design structure matrices and K-shell methods can be used. These two methods can help us understand the dependencies and interactions between test programs, as well as identify key test programs.

[0086] Applications of Design Structure Matrices: Design structure matrices are a method for representing and analyzing system models. They use a square matrix to display the relationships between elements within the system. In selecting test programs, each test program can be considered an element of this matrix. If a dependency exists between two test programs, it is marked as 1 at the corresponding matrix position; otherwise, it is marked as 0. In this way, we can visually observe the dependency structure between test programs.

[0087] Application of the K-shell method: The K-shell method is a coarse-grained decomposition method based on the global structure of a network. It determines the importance of a node based on its position in the network. In the selection of test programs, we can consider each test program as a node in the network, and the K-shell value of a node indicates its coreness in the testing process.

[0088] This approach, combining DSM and K-shell methodologies, provides a comprehensive and detailed perspective for analyzing and selecting test programs, ensuring the efficiency and systematic nature of the testing process. By employing this method, critical test programs are prioritized for execution, while dependency conflicts are reduced, thereby improving overall testing efficiency and effectiveness.

[0089] Furthermore, based on the following formula, and according to the clustering results of the reference matrix DSM, the core ranking of K-shell, and the dynamic adaptability score, the combination and selection methods of various candidate test programs corresponding to the target test item are analyzed:

[0090]

[0091] Wherein, OptimalCombination represents the optimal combination of candidate test programs; C is a subset of the candidate test program set P, which includes multiple candidate test programs corresponding to the target test item; This is used to find all possible subsets C of test programs such that the sum of the products of the dynamic adaptability scores and the overall influence of all candidate test programs in C is maximized. The overall influence includes CoreInfluence(p) and InitialInfluence(p). AdapabilityScore(p) represents the dynamic adaptability score of the candidate test program corresponding to node p. CoreInfluence(p) represents the core influence of the candidate test program corresponding to node p in the test program dependency network, which is evaluated based on the K-shell value of node p. The K-shell value of node p reflects the coreness of node p in the test program dependency network, that is, the connectivity of neighboring nodes after node p is removed. InitialInfluence(p) is the initial influence score of node p.

[0092] Furthermore, the degree of support the LCD screen under test provides for the target test items is expressed as follows:

[0093]

[0094] In this formula, S represents the overall support score; R represents the resolution score, determined based on the theoretical resolution of the LCD screen under test and the resolution required by the target test item; D represents the color depth score, determined based on the theoretical color depth of the LCD screen under test and the color depth required by the target test item; T represents the response time score, determined based on the theoretical response time of the LCD screen under test and the response time required by the target test item; P represents the power consumption score, determined based on the theoretical power consumption of the LCD screen under test and the power consumption required by the target test item; ω1, ω2, ω3, and ω4 are weighting factors, corresponding to the relative importance of resolution, color depth, response time, and power consumption, respectively, with ω1+ω2+ω3+ω4=1; A represents the adaptability score, scoring the LCD screen under test's ability to adapt to the test environment, ranging from 0 to 1; and I represents the innovation score, scoring the improvement brought by the LCD screen under test to the test item, ranging from 0 to 1. This formula, by introducing adaptability and innovation scores, considers not only traditional performance parameters but also the adaptability and innovation of the chip in practical applications, thus providing a more comprehensive and forward-looking evaluation method. This approach can help testing teams better understand the chip's potential and limitations, and how it can adapt to future testing needs.

[0095] Furthermore, the LCD screen testing system based on automatic chip identification also includes:

[0096] The human-computer interaction interface is used to receive user input to modify the first candidate test program corresponding to multiple test items, modify the test parameters or test process of the first candidate test program; and display the test results of the LCD screen under test output by the control unit and the test report generated based on the test results.

[0097] Furthermore, the first register is the ID register;

[0098] The control unit includes an STM32F103VCT6 microcontroller. The STM32F103VCT6 is a high-performance, low-power 32-bit microcontroller with rich peripheral interfaces and powerful processing capabilities. In this system, the STM32F103VCT6 serves as the core control unit, responsible for receiving and processing data from various modules, executing test programs, and controlling the output of test results. Its high-speed computing power and abundant interface resources provide strong guarantees for the system's stability and scalability.

[0099] It should be noted that the embodiments implemented on the LCD screen testing system side based on automatic chip identification in this application can be referenced with the embodiments implemented on the LCD screen testing method side based on automatic chip identification, and will not be described in detail here.

[0100] The above are merely preferred embodiments of the present invention and do not limit the scope of the patent. Any equivalent structural or procedural transformations made based on the description and drawings of the present invention, or direct or indirect applications in other related technical fields, are similarly included within the scope of patent protection of the present invention.

Claims

1. A method for testing LCD screens based on automatic chip identification, characterized in that, include: The chip information of the LCD screen to be tested is identified to determine the chip type of the LCD screen to be tested; The target test program is determined based on the chip type of the LCD screen to be tested and the candidate test programs corresponding to various test items integrated in the test program storage and recall module. The target test program is executed, and the test results are controlled to be output; wherein, the signal isolation protection module is used to separate the interference signal from the test signal generated during the execution of the target test program; The current and voltage values ​​of the LCD screen under test are monitored in real time during the test using current and voltage sensors; and a protection mechanism is invoked if the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition. One test item corresponds to multiple candidate test programs; the test items include latent black spot test items, white and black spot test items, bright and dark scratch test items, combined misalignment test items, brightness and contrast test items, color accuracy test items, and dead pixel test items; the target test program is determined based on the chip type of the LCD screen under test and the candidate test programs corresponding to the multiple test items integrated in the test program storage and recall module, and is configured as follows: Based on the constructed chip test database, the target test items supported by the chip type of the LCD screen to be tested and the various candidate test programs corresponding to the target test items are determined. The chip test database includes the LCD screen chip type, supported test items and the corresponding various candidate test programs. Analyze the degree of support the LCD screen under test has for the target test item, as well as the combination and selection methods of various candidate test programs corresponding to the target test item; Based on the analysis results, a target combined test program is determined from a variety of candidate test programs corresponding to the target test item; Based on the chip type of the LCD screen to be tested, the test parameters of the target combination test program are optimized, and the optimized target combination test program is determined as the target test program. The analysis examines the degree of support the LCD screen under test provides for the target test item, as well as the combination and selection methods of various candidate test programs corresponding to the target test item. Based on the analysis results, a target combined test program is determined from the various candidate test programs corresponding to the target test item and configured as follows: Determine the performance parameters of the LCD screen to be tested that are related to the target test item; Based on the performance parameters related to the target test item, determine the degree to which the chip type of the LCD screen under test supports the target test item; wherein, the performance parameters corresponding to the target test item include resolution, color depth, response time, and power consumption; Each candidate test program is treated as a node to build a test program dependency network; If there is a dependency between two candidate test programs, then a directed edge is established between the corresponding nodes; An initial influence score is assigned to each candidate test program; wherein the initial influence score is based on the candidate test program's position and number of connections in the test program's dependent network.

2. A liquid crystal display (LCD) testing system based on automatic chip identification, wherein the system implements the method as described in claim 1, characterized in that, include: The chip automatic identification module is used to identify the chip information of the LCD screen under test in order to determine the chip type of the LCD screen under test. The test program storage and recall module is used to determine the target test program based on the chip type of the LCD screen to be tested determined by the chip automatic identification module and the candidate test programs corresponding to various test items integrated in the test program storage and recall module. The control unit is used to receive and process data from various modules, execute the target test program, and control the output of test results; wherein, the various modules communicate with each other via a high-speed bus; The current and voltage detection module is used to monitor the current and voltage values ​​of the LCD screen under test in real time during the test using current and voltage sensors; and to invoke the protection mechanism if the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition. A signal isolation and protection module is used to separate interference signals from test signals generated during the execution of the target test program by the control unit; One test item corresponds to multiple candidate test programs; the test items include latent black spot test items, white and black spot test items, bright and dark scratch test items, combined misalignment test items, brightness and contrast test items, color accuracy test items, and dead pixel test items; the test program storage and recall module determines the target test program based on the chip type of the LCD screen under test determined by the chip automatic identification module and the candidate test programs corresponding to the multiple test items integrated in the test program storage and recall module, and is configured as follows: Based on the constructed chip test database, the target test items supported by the chip type of the LCD screen to be tested and the various candidate test programs corresponding to the target test items are determined. The chip test database includes the LCD screen chip type, supported test items and the corresponding various candidate test programs. Analyze the degree of support the LCD screen under test has for the target test item, as well as the combination and selection methods of various candidate test programs corresponding to the target test item; Based on the analysis results, a target combined test program is determined from a variety of candidate test programs corresponding to the target test item; Based on the chip type of the LCD screen to be tested, the test parameters of the target combination test program are optimized, and the optimized target combination test program is determined as the target test program. The analysis examines the degree of support the LCD screen under test provides for the target test item, as well as the combination and selection methods of various candidate test programs corresponding to the target test item. Based on the analysis results, a target combined test program is determined from the various candidate test programs corresponding to the target test item and configured as follows: Determine the performance parameters of the LCD screen to be tested that are related to the target test item; Based on the performance parameters related to the target test item, determine the degree to which the chip type of the LCD screen under test supports the target test item; wherein, the performance parameters corresponding to the target test item include resolution, color depth, response time, and power consumption; Each candidate test program is treated as a node to build a test program dependency network; If there is a dependency between two candidate test programs, then a directed edge is established between the corresponding nodes; An initial influence score is assigned to each candidate test program; wherein the initial influence score is based on the candidate test program's position and number of connections in the test program's dependent network.

3. The LCD screen testing system based on automatic chip identification according to claim 2, characterized in that, The automatic chip identification module identifies the chip information of the LCD screen under test to determine the chip type of the LCD screen under test, and is configured as follows: The first register of the LCD screen under test is initialized and written. The test LCD screen is checked by calling a reset function; if the test LCD screen is not reset, it is reset. Read the value of the first register to identify the ID value of the LCD screen under test; Correct the identified ID value; The predefined ID array is traversed. For each ID value in the predefined ID array, it is determined whether the identified ID value matches the current ID value. If the identified ID value matches the current ID value, the chip series type corresponding to the current ID value is determined as the chip series type of the LCD screen to be tested. The predefined ID array stores the ID values ​​of different LCD screen chips and their corresponding index values. The index values ​​are used to identify the chip series type of the LCD screen chip. If the chip series type of the LCD screen to be tested does not belong to the preset chip series type, the chip series type of the LCD screen to be tested is determined as the chip type of the LCD screen to be tested; If the chip series type of the LCD screen under test belongs to the preset chip series type, the chip type of the LCD screen under test is determined by reading the value of the second register of the LCD screen under test.

4. The LCD screen testing system based on automatic chip identification according to claim 3, characterized in that, The preset chip series types include the 7781 series, 9325 series, and 9225 series; if the chip series type of the LCD screen under test belongs to the preset chip series type, the chip type of the LCD screen under test is determined by reading the value of the second register of the LCD screen under test, and is configured as follows: If the chip series type of the LCD screen under test belongs to the 7781 series chip type, the second register is the 0xFF register; read the value of the 0xFF register; if the value of the 0xFF register is not 0, then the chip type of the LCD screen under test is determined to be the 7781 model; if the value of the 0xFF register is 0, then the chip type of the LCD screen under test is determined to be the 7781R model. If the chip series of the LCD screen under test belongs to the 9325 series chip type, the second register is register 0xE4; read the value of register 0xE4; if the value of register 0xE4 is 0x1C30, then the chip type of the LCD screen under test is determined to be 9325 model; if the value of register 0xE4 is 0x310b, then the chip type of the LCD screen under test is determined to be 3225A model; if the value of register 0xE4 is 0x1480, then read the value of register 0xCD of the LCD screen under test; determine whether the chip type of the LCD screen under test is 9325C model or 9325D model based on the value of register 0xCD; If the chip series type of the LCD screen under test belongs to the 9225 series chip type, the second register is the 0xED register; read the value of the 0xED register; if the value of the 0xED register is 0x2683, then the chip type of the LCD screen under test is determined to be the 9225 model; if the value of the 0xED register is 0x2682, then the chip type of the LCD screen under test is determined to be the 1L19225C model.

5. The LCD screen testing system based on automatic chip identification according to claim 2, characterized in that, Create a reference matrix ; wherein, the reference matrix The rows and columns represent the candidate test programs. If the program Depends on program Then in The position is marked as 1; The reference matrix was processed using a hierarchical clustering algorithm. Analyze the data to identify candidate test programs that can be executed in parallel; Calculate the K-shell value for each node; wherein the K-shell value is used to reflect the coreness of the node in the network that the test program depends on; The candidate test programs are sorted according to the K-shell value; Each candidate test procedure determines a dynamic adaptability score; Based on the initial influence score, K-shell core ranking, and dynamic adaptability score, the combination and selection methods of various candidate test programs corresponding to the target test project are analyzed to obtain the analysis results. Based on the clustering results of the reference matrix DSM and the analysis results, the target combined test program is determined from a variety of candidate test programs corresponding to the target test item.

6. The LCD screen testing system based on automatic chip identification according to claim 5, characterized in that, Based on the clustering results of the reference matrix DSM, the core ranking of K-shell, and the dynamic adaptability score, the combination and selection methods of various candidate test programs corresponding to the target test item are analyzed.

7. The LCD screen testing system based on automatic chip identification according to claim 2, characterized in that, The LCD screen testing system based on automatic chip identification also includes: The human-computer interaction interface is used to receive user input of modification instructions for the first candidate test program corresponding to the multiple test items, modify the test parameters or test process of the first candidate test program; and display the test results of the LCD screen under test output by the control unit and the test report generated based on the test results.

8. The LCD screen testing system based on automatic chip identification according to claim 3, characterized in that, The first register is the ID register; The control unit includes an STM32F103VCT6 microcontroller.

Images