Global temperature-controlled laser scanning galvanometer life test device and test method

Abstract

The application relates to a global temperature control laser scanning galvanometer life test device and a test method. The global temperature control laser scanning galvanometer life test device comprises a mounting clamp, a temperature control device, a laser and a position detector. The temperature control device comprises a box body and a temperature control unit. The mounting clamp is located in the box body, the scanning galvanometer assembly is fixed in the box body through the mounting clamp, the control unit controls the heating and temperature control of the box body, the temperature environment of the scanning galvanometer assembly is adjusted, the environmental adaptability of the scanning galvanometer assembly is detected in cooperation with the laser and the position detector, and therefore the product quality of the scanning galvanometer assembly is ensured.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of laser manufacturing and additive manufacturing, in particular to a global temperature control laser scanning galvanometer life test device and test method. BACKGROUND

[0002] The galvanometer is simply a high-speed scanning galvanometer used in the laser industry. The so-called galvanometer can also be called a galvanometer. Its design idea completely follows the design method of the galvanometer. The mirror replaces the needle, and the signal of the probe is replaced by a direct current signal controlled by a computer to complete the predetermined action. The existing high-speed scanning galvanometer is used to measure the deflection angle of the laser scanning galvanometer by using the principle of interference fringes, which can improve the measurement accuracy of the galvanometer.

[0003] However, the existing laser galvanometer test device and test method cannot measure the environmental adaptability of the galvanometer at different temperatures, so as to ensure the product quality of the galvanometer under different temperature conditions. SUMMARY

[0004] Therefore, it is necessary to provide a global temperature control laser scanning galvanometer life test device and test method in view of the problem that the existing laser galvanometer test device and test method cannot measure temperature drift and the environmental adaptability of the galvanometer, so as to ensure the product quality of the galvanometer.

[0005] In a first aspect, an embodiment of the present application provides a global temperature control laser scanning galvanometer life test device, which comprises:

[0006] A mounting clamp is used to fix a scanning galvanometer assembly, and the scanning galvanometer assembly comprises a mirror;

[0007] A temperature control device comprises a box body and a temperature control unit, the temperature control unit is used to adjust the temperature in the box body, the box body is used to accommodate the mounting clamp and the scanning galvanometer assembly, and the box body is provided with a light transmission hole;

[0008] A laser is located outside the box body, the laser can emit laser to the scanning galvanometer assembly, and the laser can pass through the light transmission hole to the mirror;

[0009] A position detector is located outside the box body, and the mirror can reflect the laser so that the laser passes through the light transmission hole to the position detector.

[0010] In one of the embodiments, the global temperature-controlled laser scanning galvanometer life test device further comprises an adjusting mechanism, the adjusting mechanism is located in the box, the mounting clamp is fixed on the adjusting mechanism, the adjusting mechanism can drive the mounting clamp to move along a first direction and a second direction, and the adjusting mechanism can also adjust the angle of the mirror relative to the first direction.

[0011] In one of the embodiments, the adjusting mechanism comprises a first adjusting assembly, the first adjusting assembly comprises a first driving member, a first driving rod and a first adjusting platform, the first adjusting platform is fixed in the box, the first driving member is fixed in the box, the first driving rod is arranged at the output end of the first driving member, and the first driving member can drive the first driving rod to drive the first adjusting platform to move along the first direction.

[0012] In one of the embodiments, the adjusting mechanism comprises a second adjusting assembly, the second adjusting assembly comprises a second driving member, a second driving rod and a second adjusting platform, the second adjusting platform is fixed on the first adjusting platform, the second driving member is fixed on the first adjusting platform, the second driving rod is arranged at the output end of the second driving member, and the second driving member can drive the second driving rod to drive the second adjusting platform to move along the second direction.

[0013] In one of the embodiments, the adjusting mechanism comprises an angle adjusting assembly, the angle adjusting assembly comprises a first rotating seat, a second rotating seat and a third driving member, the first rotating seat is fixed on the second adjusting platform, the third driving member is fixed on the second adjusting platform, the first rotating seat is provided with an arc-shaped groove, the second rotating seat is provided with an arc-shaped protrusion, the arc-shaped groove and the arc-shaped protrusion are arc-surface matched, and the third driving member can drive the second rotating seat to rotate along the arc-shaped groove.

[0014] In one of the embodiments, the temperature control device further comprises a heating assembly, the heating assembly comprises a heating pipe and a heating motor, the heating pipe is arranged on the inner wall of the box, the heating motor is arranged at the bottom of the box, and the temperature control unit can control the heating motor.

[0015] In one of the embodiments, a vibration isolation table is further arranged in the box, the vibration isolation table is arranged in the box, and the mounting clamp is fixed on the vibration isolation table.

[0016] In one of the embodiments, the global temperature-controlled laser scanning galvanometer life test device further comprises a mounting table, the mounting table is located outside the box, and the mounting table is used for fixing the laser and the position detector.

[0017] In one of the embodiments, the global temperature-controlled laser scanning galvanometer life test device further comprises a temperature sensor arranged in the box, the temperature sensor is electrically connected with the temperature control unit, the temperature sensor can monitor the temperature of the scanning galvanometer assembly, and the temperature control unit is used for controlling the temperature adjustment in the box according to the temperature monitored by the temperature sensor.

[0018] In a second aspect, the embodiments of the present application further provide a global temperature-controlled laser scanning galvanometer life test method, which is tested by using the global temperature-controlled laser scanning galvanometer life test device, and the global temperature-controlled laser scanning galvanometer life test method comprises the following steps:

[0019] The laser galvanometer assembly is adjusted to zero position by using the adjusting mechanism, and the lens mounting angle is adjusted so that the laser reflected by the lens can fall into the position detector;

[0020] The temperature control device is started, and the heating temperature is set as the test temperature T;

[0021] The temperature of the galvanometer motor is measured by using the temperature sensor, and after the temperature is stable, the life index test is performed.

[0022] Advantages:

[0023] The embodiments of the present application provide a global temperature-controlled laser scanning galvanometer life test device and test method. The global temperature-controlled laser scanning galvanometer life test device comprises a mounting clamp, a temperature control device, a laser, and a position detector. The temperature control device comprises a box and a temperature control unit. The mounting clamp is located in the box, and the scanning galvanometer assembly is fixed in the box by the mounting clamp. The control unit controls the heating and temperature control in the box, so as to adjust the temperature environment of the scanning galvanometer assembly, and then cooperate with the laser and the position detector to detect the environmental adaptability of the scanning galvanometer assembly, so as to ensure the product quality of the scanning galvanometer assembly. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 A structure schematic diagram of a global temperature-controlled laser scanning galvanometer life test device provided by some embodiments of the present application is provided.

[0025] Figure 2 A structure schematic diagram of a mounting clamp and adjusting mechanism of a global temperature-controlled laser scanning galvanometer life test device provided by some embodiments of the present application is provided.

[0026] Figure 3 A structure schematic diagram of an adjusting mechanism of a global temperature-controlled laser scanning galvanometer life test device provided by some embodiments of the present application is provided.

[0027] Figure 4A relationship diagram between a deflection angle of a scanning galvanometer assembly of a global temperature-controlled laser scanning galvanometer life test device and a displacement detected by a position detector is provided for some embodiments of the present application.

[0028] Figure 5 A relationship diagram between a deflection angle of a scanning galvanometer assembly of a global temperature-controlled laser scanning galvanometer life test device and a displacement of a reflected light spot is provided for some embodiments of the present application.

[0029] Reference signs:

[0030] 1, temperature control device; 11, box; 12, light transmission hole; 13, vibration isolation table;

[0031] 2, mounting clamp; 21, mounting frame; 211, base; 212, connecting plate; 22, fixed plate;

[0032] 3, laser;

[0033] 4, position detector;

[0034] 5, adjustment mechanism; 51, first adjustment assembly; 511, first driving rod; 512, first adjustment platform; 52, second adjustment assembly; 521, second driving rod; 522, second adjustment platform; 53, angle adjustment assembly; 531, first rotating seat; 532, second rotating seat;

[0035] 100, scanning galvanometer assembly; 101, mirror; 102, galvanometer motor;

[0036] X, first direction; Y, second direction; Z, third direction. DETAILED DESCRIPTION

[0037] In order to make the above objectives, features and advantages of the present application more apparent and comprehensible, the specific embodiments of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, a lot of specific details are set forth in order to fully understand the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the spirit of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0038] In the description of the application, it should be understood that, if there are these terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of facilitating the description of the application and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the application.

[0039] In addition, if there are these terms "first", "second", these terms are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first", "second" can explicitly or implicitly include at least one of the features. In the description of the application, if the term "multiple" appears, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise explicitly specified.

[0040] In this application, unless otherwise explicitly specified and limited, if there are terms such as "mounting", "connecting", "connecting", "fixing" and the like, these terms should be broadly understood. For example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0041] In this application, unless otherwise explicitly specified and limited, if there are similar descriptions such as "first feature on or under second feature", the meaning can be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature "above", "above" and "above" of the second feature can be that the first feature is directly above or obliquely above the second feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "below" and "below" of the second feature can be that the first feature is directly below or obliquely below the second feature, or only indicates that the horizontal height of the first feature is less than that of the second feature.

[0042] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0043] Firstly, see Figures 1-3 One embodiment of this application provides a globally temperature-controlled laser scanning galvanometer life test device, which includes a mounting fixture 2, a temperature control device 1, a laser 3, and a position detector 4.

[0044] In this embodiment, the mounting clamp 2 is used to fix the scanning galvanometer assembly 100, which includes a lens 101; the temperature control device 1 includes a housing 11 and a temperature control unit, which is used to adjust the temperature inside the housing 11. The housing 11 is used to accommodate the mounting clamp 2 and the scanning galvanometer assembly 100, and the housing 11 has a light-transmitting hole; the laser 3 is located outside the housing 11 and can emit laser light to the scanning galvanometer assembly 100. The laser light can pass through the light-transmitting hole and reach the lens 101; the position detector 4 is located outside the housing 11, and the lens 101 can reflect the laser light so that the laser light passes through the light-transmitting hole and reaches the position detector 4.

[0045] The laser scanning galvanometer life test device with global temperature control provided in this application uses a mounting clamp 2 to fix the scanning galvanometer assembly 100 in the housing 11. The control unit heats and controls the temperature inside the housing 11, thereby adjusting the temperature environment of the scanning galvanometer assembly 100. In conjunction with the laser 3 and the position detector 4, the device detects the environmental adaptability of the scanning galvanometer assembly 100, thereby ensuring the product quality of the scanning galvanometer assembly 100.

[0046] It should be noted that the first direction X is the X direction, the second direction Y is the Y direction, and the third direction Z is the Z direction. The first direction X, the second direction Y, and the third direction Z are all perpendicular to each other.

[0047] like Figures 1-3 As shown, in some embodiments, the global temperature-controlled laser scanning galvanometer life test device further includes an adjustment mechanism 5, which is located inside the housing 11. The mounting fixture 2 is fixed on the adjustment mechanism 5. The adjustment mechanism 5 can drive the mounting fixture 2 to move along the first direction X and the second direction Y. The adjustment mechanism 5 can also adjust the angle of the lens 101 relative to the first direction X.

[0048] By setting the adjusting mechanism 5 in the box body 11, and fixing the mounting clamp 2 to the adjusting mechanism 5, the mounting clamp 2 and the scanning galvanometer assembly 100 fixed on the mounting clamp 2 can be moved along the first direction X and the second direction Y under the driving of the adjusting mechanism 5, and the angle of the lens 101 relative to the first direction X is adjusted, so that the moving range of the lens 101 is greatly improved, and the test degree of the lens 101 is improved, so that the product quality of the scanning galvanometer assembly 100 is further improved.

[0049] As shown in Figures 1-3 , specifically, the adjusting mechanism 5 includes a first adjusting assembly 51, the first adjusting assembly 51 includes a first driving piece, a first driving rod 511 and a first adjusting platform 512, the first adjusting platform 512 is fixed in the box body 11, the first driving piece is fixed in the box body 11, the first driving rod 511 is arranged at the output end of the first driving piece, and the first driving piece can drive the first driving rod 511 to drive the first adjusting platform 512 to move along the first direction X.

[0050] By driving the first driving rod 511 to drive the first adjusting platform 512 to move along the first direction X through the first driving piece, the moving range of the lens 101 along the first direction X can be expanded, so that the test degree of the lens 101 is improved, the product quality of the scanning galvanometer assembly 100 is further improved, and the automation degree of the global temperature control laser scanning galvanometer life test device is improved, so that the experimental efficiency is improved, thereby speeding up the production efficiency of the scanning galvanometer assembly 100.

[0051] As shown in Figures 1-3 , specifically, the adjusting mechanism 5 includes a second adjusting assembly 52, the second adjusting assembly 52 includes a second driving piece, a second driving rod 521 and a second adjusting platform 522, the second adjusting platform 522 is fixed to the first adjusting platform 512, the second driving piece is fixed to the first adjusting platform 512, the second driving rod 521 is arranged at the output end of the second driving piece, and the second driving piece can drive the second driving rod 521 to drive the second adjusting platform 522 to move along the second direction Y.

[0052] By driving the second driving rod 521 to drive the second adjusting platform 522 to move along the second direction Y through the second driving piece, the moving range of the lens 101 along the second direction Y can be expanded, so that the test degree of the lens 101 is further improved, the product quality of the scanning galvanometer assembly 100 is further improved, and the automation degree of the global temperature control laser scanning galvanometer life test device is improved, so that the experimental efficiency is further improved, thereby speeding up the production efficiency of the scanning galvanometer assembly 100.

[0053] As shown in Figures 1-3As shown, specifically, the adjusting mechanism 5 includes an angle adjusting assembly 53, a first rotating seat 531, a second rotating seat 532 and a third driving member. The first rotating seat 531 is fixed to the second adjusting platform 522, and the third driving member is fixed to the second adjusting platform 522. The first rotating seat 531 is provided with an arc-shaped groove, and the second rotating seat 532 is provided with an arc-shaped protrusion. The arc-shaped groove and the arc-shaped protrusion are arc-surface matched. The third driving member can drive the second rotating seat 532 to rotate along the arc-shaped groove, so as to adjust the angle of the lens 101 relative to the first direction X.

[0054] By setting the arc-shaped groove on the first rotating seat 531, the arc-shaped protrusion on the second rotating seat 532, and the third driving member capable of driving the second rotating seat 532 to rotate along the arc-shaped groove, the angle of the lens 101 relative to the first direction X is adjusted, thereby further improving the testing degree of the lens 101 and further improving the product quality of the scanning galvanometer assembly 100.

[0055] Specifically, the axis direction of the arc-shaped groove in the embodiment of the application is the second direction Y.

[0056] As shown in the Figures 1-3 some embodiments, the temperature control device 1 further includes a heating assembly. The heating assembly includes a heating pipe and a heating motor. The heating pipe is arranged on the inner wall of the box body 11, and the heating motor is arranged at the bottom of the box body 11. The temperature control unit can control the heating motor. By arranging the heating pipe on the inner wall of the box body 11 and heating the heating pipe by the heating motor, the temperature inside the box body 11 is raised. In addition, the temperature inside the box body 11 can be controlled by controlling the on-off of the heating unit by the temperature control unit.

[0057] As shown in the Figures 1-3 some embodiments, the box body 11 further includes a vibration isolation table 13. The vibration isolation table 13 is arranged in the box body 11, and the mounting clamp 2 is fixed to the vibration isolation table 13.

[0058] By arranging the vibration isolation table 13 in the box body 11 and fixing the mounting clamp 2 to the vibration isolation table 13, the mounting clamp 2 can be cushioned, so that the lens 101 fixed to the mounting clamp 2 can be more stable, and the adjustment of the lens 101 can be more accurate, thereby making the detection result detected by the position detector more accurate and improving the experimental effect.

[0059] As shown in the Figures 1-3 some embodiments, the global temperature control laser scanning galvanometer service life test device further includes a mounting table. The mounting table is located outside the box body 11, and is used for fixing the laser 3 and the position detector 4.

[0060] In some embodiments, the mounting table is further provided with a fixing member. The fixing member is used for fixing the laser 3 and the position detector 4 to the mounting table.

[0061] By setting the mounting table to place the laser 3 and the position detector 4, and fixing the laser 3 and the position detector 4 on the mounting table through the fixing part, the placement position of the laser 3 and the position detector 4 can be fixed, so that the laser 3 and the position detector 4 are more stable, the test result is more accurate, and by fixing the position of the laser 3 and the position detector 4, the experimental efficiency can be improved.

[0062] As shown in Figures 1-3 In some embodiments, the global temperature-controlled laser scanning galvanometer life test device further comprises a temperature sensor, the temperature sensor is arranged in the box 11, the temperature sensor is electrically connected with the temperature control unit, the temperature sensor can monitor the temperature of the scanning galvanometer assembly 100, and the temperature control unit is used to control the temperature in the box 11 to adjust the temperature according to the temperature monitored by the temperature sensor.

[0063] Specifically, the temperature control unit comprises a control screen and a control panel, the control screen is electrically connected with the temperature sensor, the control screen can display the temperature in the box 11, and the control panel is electrically connected with the heating motor, the control panel can control the switch of the heating motor, so as to adjust the temperature in the box 11.

[0064] As shown in Figures 1-3 In some embodiments, the mounting clamp 2 comprises a mounting frame 21 and a fixing plate 22, the mounting frame 21 comprises a base 211 and a connecting plate 212, the base 211 is fixed in the box 11, the connecting plate 212 is arranged in the third direction Z, and the bottom of the connecting plate 212 is fixed on the base 211, the fixing plate 22 is fixedly connected with the connecting plate 212, and the fixing plate 22 is used to fix the scanning galvanometer assembly 100.

[0065] As shown in Figures 1-3 In some embodiments, the connecting plate 212 is provided with a sliding rail, the sliding rail is arranged in the third direction Z, the fixing plate 22 is slidably connected with the sliding rail, the fixing plate 22 is provided with a fastener, and the fastener is used to fix the position of the fixing plate 22 on the sliding rail.

[0066] By arranging the sliding rail on the connecting plate 212 and slidably connecting the fixing plate 22 with the sliding rail, the fixing plate 22 can slide in the third direction Z, so as to drive the scanning galvanometer assembly 100 to move in the third direction Z, thereby adjusting the position of the lens 101 in the third direction Z, further improving the test degree of the lens 101, and further improving the product quality of the scanning galvanometer assembly 100. In addition, the position of the fixing plate 22 on the sliding rail is fixed by the fastener, so that the stability of the scanning galvanometer assembly 100 is greatly improved, and the experimental quality is improved.

[0067] The second aspect is shown in Figures 4-5As shown, the embodiment of the present application also provides a global temperature control laser scanning galvanometer life test method. The global temperature control laser scanning galvanometer life test method uses the global temperature control laser scanning galvanometer life test device described above to perform a test. The global temperature control laser scanning galvanometer life test method includes the following steps:

[0068] Adjust the laser galvanometer assembly to zero position by using the adjusting mechanism 5, and adjust the installation angle of the mirror 101 so that the laser reflected by the mirror 101 can fall into the position detector 4.

[0069] Start the temperature control device 1, and set the heating temperature to the test temperature T.

[0070] Measure the temperature of the galvanometer motor 102 by using the temperature sensor. After the temperature is stable, perform the life index test.

[0071] As shown in some embodiments, specifically, start the global temperature control laser scanning galvanometer life test device and the scanning galvanometer assembly 100 to be tested, turn on the monochromatic laser 3, and place the mirror 101 at zero position. Adjust the installation angle of the mirror 101 to ensure that the light spot can appear on the position detector when the mirror 101 is at the maximum deflection angle in the positive and negative directions and at zero position. Figures 4-5

[0072] In some embodiments, the life index test includes pre-test, which is index test. The index test includes scanning galvanometer maximum scanning angle test, deflection accuracy test, linearity test, and zero position deviation test.

[0073] In the embodiment of the present application, the life index test also includes in-test. After the scanning galvanometer assembly 100 passes the pre-test, start the in-test. The in-test time is 1500 hours, and the test period is 24 hours. In each test period, perform an index test to test the maximum scanning angle, deflection accuracy, linearity, and zero position deviation of the scanning galvanometer assembly 100.

[0074] In the embodiment of the present application, the life index test also includes post-test. After the scanning galvanometer assembly 100 completes the 1500-hour in-test, stop the life test and finally perform an index test.

[0075] In some embodiments, after completing the above-mentioned life index test, if the scanning galvanometer assembly 100 does not fail and the index test meets the requirements, it is considered that the scanning galvanometer assembly 100 passes the life test at temperature T.

[0076] ​Any combination of the technical features in the above-described embodiments can be made, and for the sake of brevity, not all possible combinations are described, however, it is to be understood that the application embraces all such possible combinations.

[0077] The above-described embodiments only express several implementation manners of the present application, and the description is relatively specific and detailed, but it should not be understood as a limitation on the patent scope of the application. It should be pointed out that for ordinary skilled persons in the art, some modifications and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the patent protection scope of the present application should be subject to the appended claims.

Claims

1. A global temperature-controlled laser scanning galvanometer life test device, characterized in that, The global temperature-controlled laser scanning galvanometer life test device comprises: A mounting clamp for fixing a scanning galvanometer assembly, the scanning galvanometer assembly comprising a mirror; A temperature control device comprising a box and a temperature control unit for adjusting the temperature in the box, the box being used to accommodate the mounting clamp and the scanning galvanometer assembly, the box being provided with a light-transmitting hole; A laser located outside the box, the laser being capable of emitting laser light to the scanning galvanometer assembly, the laser light being capable of passing through the light-transmitting hole to the mirror; A position detector located outside the box, the mirror being capable of reflecting the laser light so that the laser light passes through the light-transmitting hole to the position detector.

2. The global temperature-controlled laser scanning galvanometer life test device according to claim 1, wherein, The global temperature-controlled laser scanning galvanometer life test device further comprises an adjustment mechanism located in the box, the mounting clamp being fixed to the adjustment mechanism, the adjustment mechanism being capable of moving the mounting clamp in a first direction and a second direction, the adjustment mechanism also being capable of adjusting the angle of the mirror relative to the first direction.

3. The global temperature-controlled laser scanning galvanometer life test apparatus according to claim 2, wherein, The adjustment mechanism comprises a first adjustment assembly, the first adjustment assembly comprising a first driving member, a first driving rod and a first adjustment platform, the first adjustment platform being fixed in the box, the first driving member being fixed in the box, the first driving rod being provided at the output end of the first driving member, the first driving member being capable of driving the first driving rod to move the first adjustment platform in the first direction.

4. The global temperature-controlled laser scanning galvanometer life test device of claim 3, wherein, The adjustment mechanism comprises a second adjustment assembly, the second adjustment assembly comprising a second driving member, a second driving rod and a second adjustment platform, the second adjustment platform being fixed to the first adjustment platform, the second driving member being fixed to the first adjustment platform, the second driving rod being provided at the output end of the second driving member, the second driving member being capable of driving the second driving rod to move the second adjustment platform in the second direction.

5. The global temperature-controlled laser scanning galvanometer life test apparatus of claim 4, wherein, The adjustment mechanism comprises an angle adjustment assembly, the angle adjustment assembly comprising a first rotating seat, a second rotating seat and a third driving member, the first rotating seat being fixed to the second adjustment platform, the third driving member being fixed to the second adjustment platform, the first rotating seat being provided with an arc-shaped groove, the second rotating seat being provided with an arc-shaped protrusion, the arc surface of the arc-shaped groove and the arc-shaped protrusion being matched, the third driving member being capable of driving the second rotating seat to rotate along the arc-shaped groove.

6. The global temperature-controlled laser scanning galvanometer life test device of claim 5, wherein, The temperature control device further comprises a heating assembly, the heating assembly comprising a heating pipe and a heating motor, the heating pipe being provided on the inner wall of the box, the heating motor being provided at the bottom of the box, the temperature control unit being capable of controlling the heating motor.

7. The global temperature-controlled laser scanning galvanometer life test apparatus of claim 1, wherein, A vibration isolation table is further provided in the box, the vibration isolation table being provided in the box, the mounting clamp being fixed to the vibration isolation table.

8. The global temperature-controlled laser scanning galvanometer life test apparatus of claim 1, wherein, The global temperature-controlled laser scanning galvanometer life test device further comprises a mounting table located outside the box, the mounting table being used to fix the laser and the position detector.

9. The global temperature-controlled laser scanning galvanometer life test apparatus of claim 6, wherein, The global temperature-controlled laser scanning galvanometer life test device further comprises a temperature sensor arranged in the box, the temperature sensor is electrically connected with the temperature control unit, the temperature sensor can monitor the temperature of the scanning galvanometer assembly, and the temperature control unit is used for controlling the adjustment of the temperature in the box according to the temperature monitored by the temperature sensor.

10. A global temperature-controlled laser scanning galvanometer life test method, characterized in that, The global temperature-controlled laser scanning galvanometer life test device is used for testing, and the global temperature-controlled laser scanning galvanometer life test method comprises the following steps: The scanning galvanometer assembly is adjusted to zero position by using the adjusting mechanism, and the lens mounting angle is adjusted so that the laser reflected by the lens can fall into the position detector; The temperature control device is started, and the heating temperature is set as the test temperature T; The temperature of the galvanometer motor is measured by using the temperature sensor, and the life index test is carried out after the temperature is stable.

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