Trimming calibration system and method
By connecting the measuring equipment to the equipment to be tested, and using the trained error calculation network for automatic clock and voltage calibration, the problem of low equipment repair and adjustment efficiency caused by manual manual adjustment in the prior art is solved, and fast and efficient trim calibration is achieved.
Patent Information
- Application Number
- CN202411434880.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-15
- Publication Date
- 2025-02-14
AI Technical Summary
In the prior art, manual adjustment is required when modifying the trim register, resulting in low efficiency of equipment repair, especially when there are a large number of equipment to be repaired.
By connecting the measuring device to the device to be tested, the current clock frequency and clock adjustment value of the device to be tested are obtained in real time, and the trained clock error calculation network is used for error compensation, and the clock calibration control signal is automatically sent to complete the clock calibration. Similarly, the reference voltage is calibrated.
Without manual adjustment, the fast clock and voltage calibration of the equipment to be tested is achieved, greatly improving the efficiency of Trim calibration.
Smart Images
Figure CN119440170A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of trim calibration technology, and in particular to a trim calibration system and method. Background Art
[0002] As time goes by, the device may deviate from certain parameters due to various reasons (such as aging, temperature changes, wear, etc.), resulting in a decrease in device performance. At this time, the trim registers in the device will be adjusted to compensate for the effects of environmental changes or device aging to ensure that the device performs at its best.
[0003] At present, the method of trimming the trim register is generally to write a program to set the value of the trim register of the DUT board, and then use an oscilloscope to observe whether the clock or LDO voltage reaches the design value. If not, adjust the value of the trim register again and download it again until the clock or LDO voltage reaches the design value. However, the whole process requires manual adjustment by human intervention, resulting in low efficiency of equipment trimming, especially when there are a large number of devices to be trimmed. Summary of the invention
[0004] The present application provides a trim calibration system and method, which can avoid manual adjustment and achieve fast clock calibration of a device under test through a measuring device, thereby greatly improving the efficiency of trim calibration.
[0005] In a first aspect, an embodiment of the present application provides a trimming and calibration system, including a measuring device and a device to be tested;
[0006] The device under test iterates through the output clock frequency and the clock trim value of the trim register;
[0007] The data transmission pin of the measuring device is connected to the data transmission pin of the device under test; the timer capture pin of the measuring device is connected to the clock output pin of the device under test; the measuring device is used for:
[0008] Get the current clock frequency and the current clock adjustment value of the device under test, and form a two-dimensional clock vector;
[0009] Input the clock two-dimensional vector into the trained clock error calculation network to obtain the clock error value;
[0010] Add the current clock frequency and the clock error value to obtain the target clock frequency;
[0011] Determine whether the target clock frequency is equal to the preset clock frequency;
[0012] If so, a clock calibration control signal is sent to the device under test through the data transmission pin;
[0013] After receiving the clock calibration control signal, the device under test stops traversing the clock frequency and the clock trimming value, and writes the current clock trimming value into the electrically erasable programmable read-only memory.
[0014] Further, the device under test traverses the output reference voltage and the voltage trimming value of the trim register;
[0015] The ADC sampling pin of the measuring device is connected to the voltage pin of the device under test; the measuring device is also used to:
[0016] Obtain the current reference voltage and current voltage adjustment value of the device under test and form a two-dimensional voltage vector;
[0017] Input the voltage two-dimensional vector into the voltage error calculation network to obtain the voltage error value;
[0018] Add the current reference voltage and the voltage error value to obtain the target voltage value;
[0019] Determine whether the target voltage value is equal to the preset voltage value;
[0020] If so, a voltage calibration control signal is sent to the device under test through the data transmission pin;
[0021] After receiving the voltage calibration control signal, the device under test stops traversing the reference voltage and the voltage adjustment value, and writes the current voltage adjustment value into the electrically erasable programmable read-only memory.
[0022] Furthermore, the measuring equipment is also used for:
[0023] Get the real clock frequency, the measured clock adjustment value and the measured clock frequency;
[0024] The measured clock adjustment value and the measured clock frequency are used as inputs, and the difference between the real clock frequency and the measured clock frequency is used as output to train a fully connected neural network to obtain a trained clock error calculation network.
[0025] Furthermore, the measuring equipment is also used for:
[0026] Obtaining the real reference voltage, the measured voltage adjustment value and the measured reference voltage;
[0027] The measured voltage adjustment value and the measured reference voltage are used as inputs, and the difference between the real reference voltage and the measured reference voltage is used as output to train a fully connected neural network to obtain a trained voltage error calculation network.
[0028] Furthermore, the measuring equipment is also used for:
[0029] After the clock calibration control signal is sent, a clock calibration curve is generated according to each current clock trimming value and the current clock frequency acquired before the clock calibration control signal is sent.
[0030] Furthermore, the measuring equipment is also used for:
[0031] After the voltage calibration control signal is sent, a voltage calibration curve is generated according to each current voltage adjustment value and the current reference voltage acquired before the voltage calibration control signal is sent.
[0032] In a second aspect, an embodiment of the present application provides a trimming and calibration method, which is applied to a measuring device, comprising:
[0033] Get the current clock frequency and the current clock adjustment value of the device under test, and form a two-dimensional clock vector;
[0034] Input the clock two-dimensional vector into the trained clock error calculation network to obtain the clock error value;
[0035] Add the current clock frequency and the clock error value to obtain the target clock frequency;
[0036] Determine whether the target clock frequency is equal to the preset clock frequency; if so, send a clock calibration control signal to the device under test so that the device under test writes the current clock adjustment value into the electrically erasable programmable read-only memory.
[0037] Furthermore, the method also includes:
[0038] Get the real clock frequency, the measured clock adjustment value and the measured clock frequency;
[0039] The measured clock adjustment value and the measured clock frequency are used as inputs, and the difference between the real clock frequency and the measured clock frequency is used as output to train a fully connected neural network to obtain a trained clock error calculation network.
[0040] Furthermore, the method also includes:
[0041] Obtain the current reference voltage and current voltage adjustment value of the device under test and form a two-dimensional voltage vector;
[0042] Input the voltage two-dimensional vector into the voltage error calculation network to obtain the voltage error value;
[0043] Add the current reference voltage and the voltage error value to obtain the target voltage value;
[0044] Determine whether the target voltage value is equal to the preset voltage value; if so, send a voltage calibration control signal to the device under test so that the device under test writes the current voltage adjustment value into the electrically erasable programmable read-only memory.
[0045] Furthermore, the method also includes:
[0046] Obtaining the real reference voltage, the measured voltage adjustment value and the measured reference voltage;
[0047] The measured voltage adjustment value and the measured reference voltage are used as inputs, and the difference between the real reference voltage and the measured reference voltage is used as output to train a fully connected neural network to obtain a trained voltage error calculation network.
[0048] In summary, compared with the prior art, the technical solution provided in the embodiment of the present application has at least the following beneficial effects:
[0049] The embodiment of the present application provides a trimming and calibration system, wherein the device under test traverses and outputs its own clock frequency and the clock trimming value of the trim register. After the measuring device is connected to the device under test, it can obtain the current clock trimming value and the current clock frequency of the device under test in real time, and use the trained clock error calculation network to obtain the clock error value, thereby performing error compensation on the current clock frequency, and after obtaining the corresponding target clock frequency, it is determined whether the target clock frequency reaches the preset clock frequency. If it reaches the preset clock frequency, a clock calibration control signal is sent to the device under test. After receiving the clock calibration control signal, the device under test considers that the current clock trimming value is the correct clock trimming value, and writes it into the electrically erasable programmable read-only memory. The above system does not require manual adjustment, and the fast clock calibration of the device under test is realized through the measuring device, which greatly improves the efficiency of trim calibration. BRIEF DESCRIPTION OF THE DRAWINGS
[0050] Figure 1 A structural diagram of a trimming and calibration system provided for an exemplary embodiment of the present application.
[0051] Figure 2 A flowchart of a trimming and calibration method is provided for an exemplary embodiment of the present application. DETAILED DESCRIPTION
[0052] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments.
[0053] Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making any creative work shall fall within the scope of protection of this application.
[0054] See also Figure 1 , an embodiment of the present application provides a trimming and calibration system, including a measuring device and a device to be tested.
[0055] The device under test iterates through the output clock frequency and the clock trim value of the trim register.
[0056] The data transmission pin of the measuring device is connected to the data transmission pin of the device under test; the timer capture pin of the measuring device is connected to the clock output pin of the device under test; the measuring device is used to: obtain the current clock frequency and the current clock adjustment value of the device under test, and form a clock two-dimensional vector; input the clock two-dimensional vector into the trained clock error calculation network to obtain the clock error value; add the current clock frequency and the clock error value to obtain the target clock frequency; determine whether the target clock frequency is equal to the preset clock frequency; if so, send a clock calibration control signal to the device under test through the data transmission pin.
[0057] The data transmission pins include several I / O pins. Because the high and low level display of the I / O port will not be affected by the main frequency, the present application adopts the I / O port display mode when performing clock calibration.
[0058] Specifically, the trim register stores multiple clock trim values used to adjust the clock frequency. The device under test traverses these clock trim values and outputs the adjusted clock frequency corresponding to each clock trim value through the pin. The I / O pin of the measuring device is connected to the I / O pin of the device under test, and the current clock trim value (trim value) is obtained in real time; the timer capture pin of the measuring device is connected to the clock output pin of the device under test, and the current clock frequency of the device under test is measured in real time.
[0059] In a specific implementation process, the low-speed clock and the corresponding low-speed clock trim value, the high-speed clock and the corresponding high-speed clock trim value of the device under test can be measured and calibrated using the above system.
[0060] After receiving the clock calibration control signal, the device under test stops traversing the clock frequency and the clock trimming value, and writes the current clock trimming value into the electrically erasable programmable read-only memory.
[0061] Among them, the electrically erasable programmable read-only memory, or EEPROM (Electrically Erasable Programmable Read Only Memory), is a storage chip that does not lose data after power failure. The EEPROM is in the DUT board (device under test). The DUT board itself traverses the value of the trim register in the program until the measurement device sends a calibration control signal, stops adjusting the trim register, and then the DUT board writes the current trim value into the EEPROM.
[0062] The above embodiment provides a trimming and calibration system, wherein the device under test traverses and outputs its own clock frequency and the clock trimming value of the trim register. After the measuring device is connected to the device under test, it can obtain the current clock trimming value and the current clock frequency of the device under test in real time, and use the trained clock error calculation network to obtain the clock error value, thereby performing error compensation on the current clock frequency, and after obtaining the corresponding target clock frequency, it is determined whether the target clock frequency reaches the preset clock frequency. If it reaches the preset clock frequency, a clock calibration control signal is sent to the device under test. After receiving the clock calibration control signal, the device under test considers that the current clock trimming value is the correct clock trimming value, and writes it into the electrically erasable programmable read-only memory. The above system does not require manual adjustment, and realizes fast clock calibration of the device under test through the measuring device, which greatly improves the efficiency of trim calibration.
[0063] In some embodiments, the device under test iterates through the output reference voltage and the voltage trim value of the trim register.
[0064] The ADC sampling pin of the measuring device is connected to the voltage pin of the device under test; the measuring device is also used to: obtain the current reference voltage and the current voltage adjustment value of the device under test, and form a voltage two-dimensional vector; input the voltage two-dimensional vector into the voltage error calculation network to obtain the voltage error value; add the current reference voltage and the voltage error value to obtain the target voltage value; determine whether the target voltage value is equal to the preset voltage value; if so, send a voltage calibration control signal to the device under test through the data transmission pin.
[0065] Among them, the voltage pin is an LDO (linear regulator) pin, which is used to output the voltage value of the LDO.
[0066] Specifically, the trim register also stores multiple voltage trim values used to adjust the reference voltage. The device under test traverses these voltage trim values and outputs the reference voltage corresponding to each voltage trim value through the voltage pin. The I / O pin of the measuring device is connected to the I / O pin of the device under test, and the current voltage trim value (trim value) is obtained in real time; the ADC sampling pin of the measuring device is connected to the LDO pin of the device under test, and the current reference voltage is obtained in real time.
[0067] After receiving the voltage calibration control signal, the device under test stops traversing the reference voltage and the voltage adjustment value, and writes the current voltage adjustment value into the electrically erasable programmable read-only memory.
[0068] The above embodiment further realizes the calibration of the voltage trim value, thereby improving the functional diversity of the present application.
[0069] In some embodiments, the measuring device is also used to: obtain the true clock frequency, the measured clock adjustment value and the measured clock frequency; use the measured clock adjustment value and the measured clock frequency as input and the difference between the true clock frequency and the measured clock frequency as output to train a fully connected neural network to obtain a trained clock error calculation network.
[0070] Specifically, in the training phase of the clock error calculation network, the input of the fully connected neural network is the measured clock trim value, the measured clock frequency and the difference. The difference here comes from the difference between the actual clock frequency of the device under test read by an oscilloscope and the measured clock frequency measured by the measuring device, constructing multiple sets of "measured clock trim value, measured clock frequency, difference" data.
[0071] A fully connected neural network is constructed, and the measurement clock adjustment value and measurement clock frequency of each "measurement clock adjustment value, measurement clock frequency, difference value" data are taken as input and the difference value is taken as output for training to obtain a clock error calculation network.
[0072] Furthermore, the measuring device is also used to: obtain the real reference voltage, the measured voltage adjustment value and the measured reference voltage; use the measured voltage adjustment value and the measured reference voltage as input, and use the difference between the real reference voltage and the measured reference voltage as output to train a fully connected neural network to obtain a trained voltage error calculation network.
[0073] Specifically, in the training stage of the voltage error calculation network, the input of the fully connected neural network is the measured voltage adjustment value, the measured reference voltage and the difference. The difference here comes from the difference between the actual reference voltage of the device under test read by an oscilloscope and the measured reference voltage measured by the measuring device, constructing multiple sets of "measured voltage adjustment value, measured reference voltage, difference" data.
[0074] A fully connected neural network is constructed, and the measured voltage adjustment value and the measured reference voltage of each "measured voltage adjustment value, measured reference voltage, and difference value" data are taken as input and the difference value is taken as output for training to obtain a voltage error calculation network.
[0075] In some embodiments, the measuring device is also used to:
[0076] After the clock calibration control signal is sent, a clock calibration curve is generated according to each current clock trimming value and the current clock frequency acquired before the clock calibration control signal is sent.
[0077] After the voltage calibration control signal is sent, a voltage calibration curve is generated according to each current voltage adjustment value and the current reference voltage acquired before the voltage calibration control signal is sent.
[0078] Specifically, the measuring device can record and save all trim values traversed by the printed DUT board and the corresponding output clock frequency and LDO value, and draw a graph on the PC for chip designers to analyze.
[0079] See also Figure 2 The present application embodiment provides a calibration method for adjusting the measurement equipment, including:
[0080] Step S11, obtaining the current clock frequency and the current clock adjustment value of the device under test, and forming a two-dimensional clock vector.
[0081] Step S12, inputting the clock two-dimensional vector into the trained clock error calculation network to obtain the clock error value.
[0082] Step S13, adding the current clock frequency and the clock error value to obtain the target clock frequency.
[0083] Step S14, determining whether the target clock frequency is equal to the preset clock frequency.
[0084] Step S15: If yes, a clock calibration control signal is sent to the device under test, so that the device under test writes the current clock adjustment value into the electrically erasable programmable read-only memory.
[0085] Specifically, both the low-speed clock and the high-speed clock can be calibrated using the above method, the difference being that the corresponding preset clock frequencies are different, and the preset clock frequencies can be determined by the working requirements of the device under test.
[0086] In some embodiments, the method further comprises:
[0087] Get the true clock frequency, measured clock trim value, and measured clock frequency.
[0088] The measured clock adjustment value and the measured clock frequency are used as inputs, and the difference between the real clock frequency and the measured clock frequency is used as output to train a fully connected neural network to obtain a trained clock error calculation network.
[0089] In some embodiments, the method further comprises:
[0090] Step S21, obtaining the current reference voltage and the current voltage adjustment value of the device under test, and forming a two-dimensional voltage vector.
[0091] Step S22, inputting the voltage two-dimensional vector into a voltage error calculation network to obtain a voltage error value.
[0092] Step S23, adding the current reference voltage and the voltage error value to obtain a target voltage value.
[0093] Step S24, determining whether the target voltage value is equal to the preset voltage value.
[0094] Step S25: If yes, a voltage calibration control signal is sent to the device under test, so that the device under test writes the current voltage adjustment value into the electrically erasable programmable read-only memory.
[0095] The preset voltage value is specifically determined by the working requirements of the device under test.
[0096] In some embodiments, the method further comprises:
[0097] Get the true reference voltage, the measured voltage trim value, and the measured reference voltage.
[0098] The measured voltage adjustment value and the measured reference voltage are used as inputs, and the difference between the real reference voltage and the measured reference voltage is used as output to train a fully connected neural network to obtain a trained voltage error calculation network.
[0099] The technical features of the above embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0100] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.
Claims
1. A trimming and calibration system, characterized in that: Includes measuring equipment and equipment under test; The device under test traverses the output clock frequency and the clock trimming value of the trim register; The data transmission pin of the measuring device is connected to the data transmission pin of the device under test; the timer capture pin of the measuring device is connected to the clock output pin of the device under test; the measuring device is used to: Obtaining the current clock frequency and the current clock adjustment value of the device under test, and forming a two-dimensional clock vector; Inputting the clock two-dimensional vector into a trained clock error calculation network to obtain a clock error value; Adding the current clock frequency and the clock error value to obtain a target clock frequency; Determining whether the target clock frequency is equal to a preset clock frequency; If yes, sending a clock calibration control signal to the device under test via the data transmission pin; After receiving the clock calibration control signal, the device under test stops traversing the clock frequency and the clock trimming value, and writes the current clock trimming value into a electrically erasable programmable read-only memory.
2. The trimming and calibration system according to claim 1, characterized in that: The device under test traverses the output reference voltage and the voltage trimming value of the trim register; The ADC sampling pin of the measuring device is connected to the voltage pin of the device under test; the measuring device is also used for: Obtaining the current reference voltage and the current voltage adjustment value of the device under test, and forming a two-dimensional voltage vector; Inputting the voltage two-dimensional vector into a voltage error calculation network to obtain a voltage error value; Adding the current reference voltage and the voltage error value to obtain a target voltage value; Determining whether the target voltage value is equal to a preset voltage value; If so, sending a voltage calibration control signal to the device under test through the data transmission pin; After receiving the voltage calibration control signal, the device under test stops traversing the reference voltage and the voltage adjustment value, and writes the current voltage adjustment value into the electrically erasable programmable read-only memory.
3. The trimming and calibration system according to claim 1, characterized in that: The measuring device is also used for: Get the real clock frequency, the measured clock adjustment value and the measured clock frequency; The measurement clock adjustment value and the measurement clock frequency are used as inputs, and the difference between the real clock frequency and the measurement clock frequency is used as output to train a fully connected neural network to obtain the trained clock error calculation network.
4. The trimming and calibration system according to claim 2, characterized in that: The measuring device is also used for: Obtaining the real reference voltage, the measured voltage adjustment value and the measured reference voltage; The measured voltage adjustment value and the measured reference voltage are used as inputs, and the difference between the real reference voltage and the measured reference voltage is used as output to train a fully connected neural network to obtain the trained voltage error calculation network.
5. The trimming and calibration system according to claim 3, characterized in that: The measuring device is also used for: After sending the clock calibration control signal, a clock calibration curve is generated according to each current clock adjustment value and current clock frequency acquired before sending the clock calibration control signal.
6. The trimming and calibration system according to claim 4, characterized in that: The measuring device is also used for: After the voltage calibration control signal is sent, a voltage calibration curve is generated according to each current voltage adjustment value and the current reference voltage acquired before the voltage calibration control signal is sent.
7. A trimming and calibration method, characterized in that: Applied to measuring equipment, including: Get the current clock frequency and the current clock adjustment value of the device under test, and form a two-dimensional clock vector; Inputting the clock two-dimensional vector into a trained clock error calculation network to obtain a clock error value; Adding the current clock frequency and the clock error value to obtain a target clock frequency; Determining whether the target clock frequency is equal to a preset clock frequency; If so, a clock calibration control signal is sent to the device under test, so that the device under test writes the current clock adjustment value into a electrically erasable programmable read-only memory.
8. The trimming and calibration method according to claim 7, characterized in that: Also includes: Get the real clock frequency, the measured clock adjustment value and the measured clock frequency; The measurement clock adjustment value and the measurement clock frequency are used as inputs, and the difference between the real clock frequency and the measurement clock frequency is used as output to train a fully connected neural network to obtain the trained clock error calculation network.
9. The trimming and calibration method according to claim 7, characterized in that: Also includes: Obtaining the current reference voltage and the current voltage adjustment value of the device under test, and forming a two-dimensional voltage vector; Inputting the voltage two-dimensional vector into a voltage error calculation network to obtain a voltage error value; Adding the current reference voltage and the voltage error value to obtain a target voltage value; Determining whether the target voltage value is equal to a preset voltage value; If so, a voltage calibration control signal is sent to the device under test, so that the device under test writes the current voltage adjustment value into a electrically erasable programmable read-only memory.
10. The trimming and calibration method according to claim 9, characterized in that: Also includes: Obtaining the real reference voltage, the measured voltage adjustment value and the measured reference voltage; The measured voltage adjustment value and the measured reference voltage are used as inputs, and the difference between the real reference voltage and the measured reference voltage is used as output to train a fully connected neural network to obtain the trained voltage error calculation network.