A chip high and low temperature test box

Abstract

The present application discloses a chip high and low temperature test box, which belongs to the field of chip testing technology. It mainly includes a carrying box; a low temperature component, the low temperature component has an inner shell and an outer shell; a high temperature component, a feeding component, the feeding component includes: a compartment box, a support frame, the support frame is respectively provided with a feeding part and a discharging part; a moving block, a carrying plate is installed on the moving block; a lifting machine, at least two groups of connecting blocks, a cylinder, a push block is installed at the output end of the cylinder, a rod body, a sphere is provided at the end of the rod body, a placement box, a groove is provided on the placement box; two groups of slide rails, an insert block, a card slot is provided on the insert block; a spring, a placement plate, notches are provided on the inner shell and the outer shell, and a stopper is installed on the placement plate. The present application's chip high and low temperature test box, through the setting of the feeding component, enables the chip to be automatically placed and transported to the high temperature component and the low temperature component during the high and low temperature test, so as to achieve the effect of automatically placing and transporting the object to be tested.

Description

Technical Field

[0001] The present application relates to the field of chip testing technology, and in particular to a chip high and low temperature testing box. Background Art

[0002] A chip is a microelectronic device that integrates a large number of transistors, resistors, capacitors and other electronic components on a piece of semiconductor material. It is like a highly concentrated electronic circuit city. Various electronic components are interconnected and work together on this tiny chip to achieve specific functions, such as data processing, signal amplification, storage memory, etc.

[0003] During the production process of chips, high and low temperature tests are required to ensure their electrical performance;

[0004] For example, the patent with publication number CN215218884U specifically discloses a double-layer flameproof high and low temperature test chamber, which is configured to place the object to be tested in two independent upper and lower working chambers, respectively, and control the temperature of the working chambers through corresponding controllers, so that the object to be tested is in a high temperature state and a low temperature state respectively, and then the object to be tested is taken out and its performance is tested by a testing device;

[0005] However, in the process of transferring the object to be tested from one working room to another working room, the above patent still needs to be manually placed, and it also needs to be manually placed when taking out and putting in. Manual transfer and taking and placing of the object to be tested requires more time and manpower, thereby reducing the efficiency of the overall testing process;

[0006] Therefore, it is necessary to provide a chip high and low temperature test box to solve the above problems.

[0007] It should be noted that the above information disclosed in this background technology section is only for understanding the background technology of the present application concept, and therefore, it may contain information that does not constitute the prior art. Summary of the invention

[0008] Based on the above problems existing in the prior art, the problem to be solved by the present application is: to provide a chip high and low temperature test box to achieve the effect of automatically taking, placing and transporting objects to be tested.

[0009] The technical solution adopted by the present application to solve its technical problems is: a chip high and low temperature test box, including a carrying box; a low temperature component, the low temperature component is arranged on the carrying box, and the low temperature component has an inner liner and an outer shell; a high temperature component, the high temperature component is arranged on the low temperature component; a feeding component, the feeding component is arranged inside the carrying box, and the feeding component includes: a compartment box, the compartment box is arranged on the carrying box, and the compartment box has an equipment cavity; a support frame, the support frame is arranged inside the carrying box, and a feeding part and a discharging part are respectively arranged on the support frame; a moving block, the moving block is arranged on the feeding part, and a carrying plate is installed on the moving block; a hoist, the hoist is arranged inside the equipment cavity; at least two groups of connecting blocks, the connecting blocks are arranged On the lifting machine; cylinder, the cylinder is installed on the connecting block, a push block is installed at the output end of the cylinder, and a seat body is installed at one end of the push block; rod body, the rod body is rotatably installed on the seat body, a torsion spring is arranged between the rod body and the seat body, a ball is arranged at the end of the rod body, and the ball is made of elastic material; placement box, the placement box is arranged on the bearing plate, a partition is arranged inside the placement box, and a groove is provided on the placement box; two sets of slide rails, the slide rails are arranged inside the groove; plug-in block, the plug-in block is slidably arranged inside the groove, and a card slot is provided on the plug-in block; spring, the spring is connected between the plug-in block and the inner wall of the placement box; placement plate, the placement plate is installed on the inner wall of the inner tank, slots are provided on the inner tank and the outer shell, and a stopper is installed on the placement plate.

[0010] Furthermore, the feeding part has a first platform installed on a supporting frame, an electric cylinder is installed inside the first platform, the output end of the electric cylinder is connected to the moving block, the elevator has a frame installed in the equipment cavity, multiple sets of sprockets are rotatably installed on the frame, chains are arranged on the multiple sets of sprockets for transmission, a first motor is installed on the frame, the output end of the first motor is connected to one of the sprockets, and at least two sets of connecting blocks are installed on the chain.

[0011] Furthermore, a hinge sleeve is provided on the placement box, a hinge shaft is rotatably provided on the hinge sleeve, a closing plate is installed on the hinge shaft, a half gear is fixedly sleeved on the hinge shaft, a spring groove is provided inside the placement box, and one end of the spring is located inside the spring groove.

[0012] Furthermore, an active rack is installed on one side of the push block close to the bearing plate, the active rack protrudes from the push block, a slot is provided on the push block, and a blocking plate is installed on the active rack.

[0013] Furthermore, a straight slide is provided at one end of the slot close to the rod body, a first slide is arranged at the end of the straight slide, the groove bottom position of the straight slide is higher than the groove bottom position of the first slide, a second slide is arranged on the side of the first slide away from the straight slide, the groove bottom position of the first slide is higher than the groove bottom position of the second slide, a first stationary point is arranged at the position where the first slide and the second slide are connected, and the first stationary point is located in the second slide.

[0014] Furthermore, a transition channel is arranged at the end of the second slide, the groove bottom position of the second slide is higher than the groove bottom position of the transition channel, a second stationary point is arranged at the connection between the second slide and the transition channel, and the second stationary point is located in the transition channel.

[0015] Furthermore, a third slide is provided at the end of the transition channel, and the third slide has a first section connected to the transition channel, and a second section connected to the straight slide, the groove bottom position of the first section is lower than the groove bottom position of the transition channel, and a third stationary point is provided at the connection between the transition channel and the first section, and the third stationary point is located in the first section.

[0016] Furthermore, the low-temperature component includes a box door arranged on the outer shell, the inner shell has an opening, circulation pipes are installed on both sides of the outer wall of the inner shell, and equipment boxes are installed on both sides of the outer shell, and the interior of the equipment box has an installation cavity.

[0017] Furthermore, an opening and closing assembly is provided on the low-temperature assembly, and the opening and closing assembly includes a track arranged at the slot position, a sealing plate is slidably arranged on the track, a fixed block is installed on the outer wall of the inner tank, a driven rack is slidably arranged inside the fixed block, a fixed plate is installed on the driven rack, a connecting plate is installed at the bottom of the fixed plate, and the connecting plate is fixedly connected to the sealing plate.

[0018] Furthermore, a convex block is installed on the fixed block, a rotating shaft is rotatably installed on the convex block, a driven gear and a driving gear are respectively installed on the rotating shaft, and the driven gear and the driven rack are meshed and connected.

[0019] The beneficial effect of the present application is that the present application provides a chip high and low temperature test box, which, through the setting of the feeding component, can automatically take and place and transfer the chip to the high temperature component and the low temperature component during the high and low temperature test, thereby achieving the effect of automatically taking and placing and transferring the object to be tested.

[0020] In addition to the above-described purposes, features and advantages, the present application also has other purposes, features and advantages. The present application will be further described in detail with reference to the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The drawings constituting part of the present application are used to provide a further understanding of the present application. The exemplary embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0022] Figure 1 This is an overall schematic diagram of a chip high and low temperature test box in this application;

[0023] Figure 2 for Figure 1 A schematic cross-sectional view of the entire middle part;

[0024] Figure 3 for Figure 2 The enlarged schematic diagram of point A in the middle;

[0025] Figure 4 for Figure 1 The overall schematic diagram from another perspective;

[0026] Figure 5 for Figure 4 The structural diagram of the middle part as a whole;

[0027] Figure 6 for Figure 5 The enlarged schematic diagram of point B in the middle;

[0028] Figure 7 for Figure 5 The enlarged schematic diagram of the center C;

[0029] Figure 8 for Figure 6 A schematic cross-sectional view of the entire middle part;

[0030] Fig. 9 for Figure 8 The enlarged schematic diagram of point D in the middle;

[0031] Fig.10 for Figure 8 The enlarged schematic diagram of point E in the middle;

[0032] Fig.11 for Fig.10 The enlarged schematic diagram of F in the middle;

[0033] Fig.12 for Figure 1 The structural diagram of the middle part as a whole;

[0034] Fig.13 for Fig.12 The enlarged schematic diagram of G in the middle;

[0035] Fig.14 for Figure 5 The structural diagram of the middle part as a whole;

[0036] Fig.15 for Fig.14 The enlarged schematic diagram of the H in the middle;

[0037] Among them, the reference numerals in the figure are:

[0038] 1. Carrying box;

[0039] 2. High temperature components; 3. Low temperature components; 31. Box door; 32. Equipment box; 33. Shell; 34. Circulation pipe; 35. Inner tank; 36. Installation cavity;

[0040] 4. Feeding assembly; 41. Support frame; 401. Feeding part; 42. Compartment box; 43. Equipment cavity; 44. Elevator; 441. Frame; 442. Sprocket; 443. Chain; 45. Connecting block; 46. Cylinder; 47. Push block; 471. Slot; 472. Rod; 48. Active rack; 49. Moving block; 491. Loading plate;

[0041] 5. Placement assembly; 51. Placement box; 501. Groove; 52. Closing plate; 521. Half gear; 53. Partition plate; 54. Spring; 55. Insert block; 56. Slide rail;

[0042] 6. Card slot; 61. First slideway; 62. Second slideway; 63. Third slideway; 631. Transition channel; 632. Second section; 64. Straight slideway;

[0043] 7. Opening and closing assembly; 71. Track; 72. Sealing plate; 73. Driving gear; 74. Connecting plate; 75. Fixing plate; 76. Driven gear; 77. Driven rack; 78. Fixing block; 79. Notch; 710. Placement plate; 711. Stop block. DETAILED DESCRIPTION

[0044] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0045] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present application.

[0046] Embodiment 1: This embodiment specifically describes the basic structure and working principle of the chip high and low temperature test box, specifically:

[0047] like Figure 1-Figure 3 As shown, the present application provides a chip high and low temperature test box, including a carrying box 1, on which a low temperature component 3 is arranged, and the low temperature component 3 is used to simulate a low temperature environment;

[0048] The low temperature assembly 3 includes a housing 33 fixedly mounted on the carrying box 1, and an inner liner 35 is arranged inside the housing 33 for placing chips. The inner liner 35 has an opening suitable for taking and placing chips, and a door 31 is arranged on the housing 33 for sealing and opening the opening.

[0049] Circulation pipes 34 are fixedly installed on both sides of the outer wall of the inner tank 35, and the circulation pipes 34 are connected through refrigeration equipment (including a liquid pump, a box for storing a refrigerant medium, etc.), so that the refrigerant medium circulates in the circulation pipes 34 through the refrigeration equipment, thereby cooling the inner tank 35, thereby simulating a low temperature environment;

[0050] At the same time, equipment boxes 32 are fixedly installed on both sides of the shell 33, and the interior of the equipment box 32 has an installation cavity 36 suitable for placing the refrigeration equipment, and both ends of the circulation pipe 34 extend into the installation cavity 36 to facilitate connection with the input end and the output end of the refrigeration equipment, and then introduce the refrigerant medium into the circulation pipe 34;

[0051] Meanwhile, a high temperature component 2 is arranged on the low temperature component 3, and the high temperature component 2 has an inner liner 35, an outer shell 33 and an equipment box 32 of the same structure as the low temperature component 3, and an electric heating wire is arranged on the outer wall of the inner liner 35, so that the electric heating wire can be energized to increase its temperature, thereby heating the inner liner 35 to simulate a high temperature environment, and an electric power device for providing power to the electric heating wire is arranged inside the equipment box 32;

[0052] To summarize, when performing high and low temperature tests on the chip, open the box door 31 of the low-temperature component 3, place the chip into the inner tank 35 from the opening, then start the refrigeration equipment to introduce the refrigerant medium into the circulation pipe 34 to circulate it, thereby cooling the inner tank 35, and then perform a low-temperature simulation test on the chip. After standing for a period of time, open the box door 31 to take out the chip, put it into the high-temperature component 2, perform a high-temperature simulation test, take it out after standing for a period of time, and then test the chip through special testing equipment.

[0053] Embodiment 2: Although the above embodiment can realize high and low temperature testing of chips, manual transfer is required when placing and transferring chips, which increases the test time and greatly reduces the efficiency of chip detection;

[0054] To solve this problem, Figure 4-Figure 6 As shown, a feeding assembly 4 is provided inside the carrying box 1, and the feeding assembly 4 is used to transport chips;

[0055] The feeding assembly 4 includes a compartment box 42 arranged at the back of the carrying box 1, the compartment box 42 has an equipment cavity 43, and an elevator 44 is arranged inside the equipment cavity 43, the elevator 44 has a frame 441 fixedly installed in the equipment cavity 43, a plurality of sprockets 442 are rotatably installed on the frame 441, and chains 443 are arranged on the plurality of sprockets 442 for transmission, and a first motor is fixedly installed on the frame 441, and the output end of the first motor is connected to one of the sprockets 442, so that under the action of the first motor, the chain 443 can be circularly driven;

[0056] like Figure 6 and Figure 7 As shown, a plurality of connecting blocks 45 are fixedly arranged at a certain interval on the chain 443, a cylinder 46 is fixedly installed on the connecting block 45, and a push block 47 is fixedly installed at the output end of the cylinder 46, and the push block 47 is slidably arranged on the connecting block 45, so that the push block 47 can slide on the connecting block 45 under the drive of the cylinder 46;

[0057] Meanwhile, a support frame 41 is provided inside the carrying box 1, and a feeding part 401 and a discharging part are provided on the support frame 41, respectively, and the feeding part 401 and the discharging part are located at one side of the bottom of the elevator 44, so as to facilitate pushing the chip to the elevator 44 and discharging the chip;

[0058] The feeding part 401 includes a first platform fixedly mounted on the support frame 41, an electric cylinder is fixedly mounted inside the first platform, and a moving block 49 is fixedly mounted on the output end of the electric cylinder, so that when the electric cylinder is extended, the moving block 49 can move linearly synchronously;

[0059] Continue to refer Figure 6 , a bearing plate 491 is fixedly mounted on the moving block 49, and the bearing plate 491 is suitable for synchronously moving with the moving block 49;

[0060] It can be understood that during the cyclic lifting process of the elevator 44, one group of the connecting blocks 45 will be connected to the first platform, and at this time, the upper surface of the connecting block 45 is flush with the upper surface of the first platform. This state can be defined as the chip loading state, so that in this state, the carrier plate 491 gradually moves from the first platform to the connecting block 45 and gradually approaches the push block 47;

[0061] Meanwhile, a placement component 5 is provided on the carrier plate 491, and the placement component 5 is used for placing the chip. The placement component 5 includes a placement box 51 placed on the carrier plate 491, and a partition 53 is fixedly installed inside the placement box 51, and the partition 53 is used for placing the chip. Meanwhile, a press-fitting structure may be provided on the partition 53 to fix the chip. In this embodiment, the press-fitting structure may adopt a simple press plate or other forms, which are not limited here.

[0062] At the same time, a hinge sleeve is provided on the placement box 51, a hinge shaft is rotatably provided on the hinge sleeve, a closing plate 52 is fixedly installed on the hinge shaft, and the closing plate 52 is suitable for rotating to open or close the placement box 51;

[0063] A driving rack 48 is fixedly mounted on one side of the push block 47 close to the bearing plate 491. The driving rack 48 protrudes from the push block 47, and a half gear 521 is fixedly sleeved on the hinge shaft.

[0064] In the initial state, the closing plate 52 is in an open state, so that the staff can place the chip into the placing box 51. When the placing box 51 moves toward the pushing block 47, the active rack 48 slowly approaches the half gear 521 and meshes with the half gear 521, thereby driving the half gear 521 to rotate, and then driving the closing plate 52 to rotate. When the placing box 51 abuts against the pushing block 47, the active rack 48 passes over the half gear 521, and the closing plate 52 closes the placing box 51.

[0065] It should be noted that a blocking surface is formed at the position where the moving block 49 is connected to the carrying plate 491, and the blocking surface is used to resist the placement box 51. At the same time, the closing plate 52 is hinged on the side of the placement box 51 close to the blocking surface, and the height of the blocking surface is lower than the height of the placement box 51 and the active rack 48. Therefore, when the active rack 48 is engaged with the half gear 521, the placement box 51 will not move due to the effect of the blocking surface, and the blocking surface will not affect the opening and closing of the closing plate 52. At the same time, when the closing plate 52 is completely closed, the active rack 48 can pass over the blocking surface.

[0066] Preferably, the carrying plate 491 can be set to a rough surface, so that there is a greater static friction between the placing box 51 and the carrying plate 491, so that the force generated when the active rack 48 and the half gear 521 are engaged cannot overcome the static friction between the placing box 51 and the carrying plate 491, thereby making it possible to open and close the closing plate 52 without relying on the restriction of the blocking surface;

[0067] like Figure 6-Figure 7 and Fig. 9 As shown, a groove 501 with an open end is provided inside the placement box 51, and two sets of slide rails 56 are fixedly installed inside the groove 501. Insert blocks 55 are slidably provided on the slide rails 56, so that the insert blocks 55 can move along the length direction of the slide rails 56;

[0068] Meanwhile, a spring groove is provided on the inner wall of the placement box 51, and a spring 54 is provided between the spring groove and the insert block 55, so that under the action of the spring 54, the insert block 55 is located outside the groove 501 in the initial state, and the spring 54 can be completely received in the spring groove, so that the insert block 55 is completely received in the groove 501;

[0069] A slot 471 suitable for the movement of the plug block 55 is provided on the push block 47, so that the plug block 55 can enter the slot 471 when it extends out of the groove 501, thereby avoiding mechanical interference of the push block 47 on the movement of the plug block 55;

[0070] Continue to refer Fig. 9 A card slot 6 is provided on the insert block 55, and a limiting portion is provided at one end of the push block 47, the limiting portion being adapted to fit with the card slot 6 to control the position of the insert block 55;

[0071] The limiting part includes a seat body fixedly mounted on the push block 47, a rod body 472 is horizontally rotatably mounted on the seat body, a ball is fixedly mounted on the end of the rod body 472, and the ball is made of elastic material. At the same time, a straight slide 64 is provided at one end of the slot 6 close to the limiting part. In the initial state, the ball and the straight slide 64 are aligned. It should be noted that a torsion spring is provided between the rod body 472 and the seat body so that the rod body 472 maintains a fixed position in the initial state, thereby making the ball always aligned with the straight slide 64 in the initial state;

[0072] At the same time, a first slide 61 is provided at the end of the straight slide 64. The bottom position of the straight slide 64 is higher than the bottom position of the first slide 61. Therefore, after the ball enters the first slide 61 from the straight slide 64, it cannot return to the straight slide 64 from the first slide 61.

[0073] A second slideway 62 is provided on one side of the first slideway 61 away from the straight slideway 64. The bottom of the first slideway 61 is higher than the bottom of the second slideway 62. Thus, after the ball enters the second slideway 62 from the first slideway 61, it cannot return to the first slideway 61 from the second slideway 62. A first stationary point is provided at the position where the first slideway 61 and the second slideway 62 are connected. The first stationary point is located in the second slideway 62.

[0074] A transition channel 631 is provided at the end of the second slideway 62. The groove bottom position of the second slideway 62 is higher than the groove bottom position of the transition channel 631. Therefore, after the ball enters the transition channel 631 from the second slideway 62, it cannot return to the second slideway 62. A second stationary point is provided at the connection between the second slideway 62 and the transition channel 631. The second stationary point is located in the transition channel 631.

[0075] In summary, when the chip is being loaded, as the placement box 51 loaded with the chip slowly approaches the push block 47, the ball will enter the straight slide 64, and as the placement box 51 continues to advance, the ball will pass through the straight slide 64 and enter the first slide 61 until it reaches the first stationary point;

[0076] At this time, as the placement box 51 continues to be pushed forward, the ball will drive the insert block 55 to move toward the inside of the groove 501 and compress the spring 54 until the placement box 51 fits with the push block 47, and the electric cylinder is extended to the maximum position;

[0077] Then the electric cylinder starts to retract, and the insert block 55 starts to reset under the action of the bearing plate 491. As the insert block 55 resets, the ball moves along the second slideway 62 to the second stationary point, and finally stops at the second stationary point. At this time, the ball is hung at the second stationary point, and the insert block 55 is separated from the bearing plate 491 by pulling force, so that the placement box 51 and the push block 47 form a whole, and can move synchronously with the push block 47.

[0078] At this time, the lifting machine 44 starts to work and drives the placement box 51 to lift upwards through the push block 47.

[0079] In order to send the chip into the low temperature assembly 3 for testing, such as Figure 11-Figure 12 As shown, notches 79 are provided on both the outer shell 33 and the inner container 35, so that the placement box 51 can be lifted to the notch 79, and then the cylinder 46 is started, and the push block 47 is extended, thereby driving the placement box 51 to pass through the notch 79 and enter the inner container 35;

[0080] Meanwhile, a placement plate 710 is fixedly installed on the inner wall of the inner container 35, and the placement plate 710 is located at the notch 79, and a stopper 711 is provided at one end of the placement plate 710, so that the placement box 51 entering the inner container 35 can be pushed onto the placement plate 710;

[0081] like Fig. 9 As shown, a third slideway 63 is provided at the end of the transition channel 631, and the third slideway 63 has a first section connected to the transition channel 631, and a second section 632 connected to the straight slideway 64, wherein the groove bottom position of the first section is lower than the groove bottom position of the transition channel 631, so that the ball cannot return to the transition channel 631 after entering the first section from the transition channel 631, and a third stationary point is provided at the connection between the transition channel 631 and the first section, and the third stationary point is located in the first section;

[0082] Meanwhile, the second section 632 is inclined in a direction close to the straight slide 64, and its height gradually increases, and a transition step (not shown in the figure) is formed at the connection with the straight slide 64, so that the ball can enter the straight slide 64 from the second section 632, but cannot enter the second section 632 from the straight slide 64;

[0083] Therefore, when the placement box 51 is pushed to the placement plate 710, it will be blocked by the stopper 711, so that the placement box 51 is restricted. At this time, as the cylinder 46 continues to advance, it will drive the insert block 55 to move into the groove 501 again and compress the spring 54. At this time, the ball will reach the third stationary point along the transition channel 631;

[0084] When the cylinder 46 reaches the limit and starts to retract, the ball will gradually separate from the plug 55 along the third slide 63 and return to the initial position. At this time, the placement box 51 stays on the placement plate 710, so that the low-temperature test can be performed on the low-temperature component 3;

[0085] In this embodiment, the upper surface of the placement plate 710 is also set to a relatively rough surface, so that the placement box 51 and the placement plate 710 also have a large friction force, so that during the retreat of the cylinder 46, the active rack 48 can be driven to retreat synchronously, and the active rack 48 is engaged with the half gear 521 to open the closing plate 52, so that the chip can be fully in contact with the air in the test environment, which is convenient for testing the chip in the placement box 51.

[0086] It should be noted that a blocking plate is fixedly mounted on the active rack 48, and the notch 79 matches the size of the placement box 51, the push block 47, the active rack 48, the blocking plate and the half gear 521 (eg Fig.12 ), and then when the push block 47 drives the placement box 51 to enter or move out of the inner container 35, the slot 79 can be closed.

[0087] When the test is completed, the placement box 51 needs to be taken out of the test environment, and the cylinder 46 begins to extend, driving the push block 47 and the active rack 48 to approach the placement box 51;

[0088] First, the active rack 48 and the half gear 521 close the closing plate 52, and then enter the slide through the ball and reach the second stationary point to take out the placement box 51. This part has been described in the previous text, and the principle here is the same and will not be repeated here.

[0089] And the placement box 51 can reach the position of the high-temperature component 2 as the lifting machine 44 works. It can be understood that a test structure identical to that of the low-temperature component 3 is provided at the high-temperature component 2 for placing the placement box 51 and removing operations.

[0090] After the chip test is completed, the placement box 51 arrives at the discharge portion along the elevator 44. The discharge portion is provided with the same structure as the feeding portion 401 to facilitate the discharge of the placement box 51.

[0091] After the staff obtains the tested chip, they can conduct corresponding performance tests to evaluate the status of the chip.

[0092] Embodiment 3: In order to better seal the notch 79 during the chip test process, an opening and closing component 7 can be provided. This embodiment takes the low temperature component 3 as an example to explain the specific structure and principle of the opening and closing component 7. Specifically:

[0093] like Figure 13-Figure 14As shown, the opening and closing assembly 7 includes a track 71 arranged at the position of the notch 79, and a sealing plate 72 is slidably arranged on the track 71, so that the sealing plate 72 can seal the notch 79, and sealing strips are arranged on the four sides of the sealing plate 72 to further improve the sealing effect, and the material of the sealing plate 72 is a temperature-insulating material;

[0094] A fixing block 78 is fixedly installed on the outer wall of the inner container 35, a driven rack 77 is slidably arranged inside the fixing block 78, a fixing plate 75 is fixedly installed on the driven rack 77, and a connecting plate 74 is fixedly installed at the bottom of the fixing plate 75, and the connecting plate 74 is fixedly connected to the sealing plate 72;

[0095] A protrusion is fixedly mounted on the fixed block 78, a rotating shaft (not shown in the figure) is rotatably mounted on the protrusion, and a driven gear 76 and a driving gear 73 are respectively fixedly mounted on the rotating shaft, the driven gear 76 is meshedly connected with the driven rack 77, and the driving gear 73 can be meshedly connected with the driving rack 48;

[0096] When the active rack 48 and the active gear 73 are meshed, the active gear 73 is driven to rotate, thereby driving the driven gear 76 to rotate through the rotating shaft, and then driving the driven rack 77 to move inside the fixed block 78, and driving the closing plate 52 to move through the fixed block 78 and the connecting block 45, so that the notch 79 can be sealed and opened;

[0097] It should be noted that the width of the driving gear 73 is the same as that of the half gear 521, and the width of the driving rack 48 is greater than the sum of the widths of the driving gear 73 and the half gear 521, and when the placement box 51 is located at the notch 79, the height of the half gear 521 is the same as that of the driving gear 73, and when the push block 47 drives the driving rack 48 to move, it can mesh with the driving gear 73, and the half gear 521 will not interfere with the driving gear 73;

[0098] In summary, when the placement box 51 is driven to the notch 79 by the lifting machine 44, the cylinder 46 drives the push block 47 to move, and synchronously drives the active rack 48 to move. At this time, the active rack 48 is meshed with the active gear 73. At this time, the half gear 521 is located on one side of the driven gear 76, and there is a certain gap between the half gear 521 and the active gear 73, so that the active rack 48 can drive the active gear 73 to rotate without mechanical interference. With the continuous movement of the active rack 48, the active gear 73 drives the driven gear 76 to rotate through the rotating shaft, and then drives the driven rack 77 to move, and drives the sealing plate 72 to move through the connecting plate 74 and the fixing plate 75, thereby opening the notch 79;

[0099] It should be noted that when the slot 79 is fully opened, one end of the placement box 51 reaches the slot 79, thereby reducing the amount of temperature dissipation inside the liner 35, and the active rack 48 has a smooth section. When the slot 79 is fully opened, the active gear 73 enters the smooth section.

[0100] When the driving rack 48 retreats, it can mesh with the driving gear 73 again to close the sealing plate 72 .

[0101] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A chip high and low temperature test box, characterized by: include: A carrying box (1); a low-temperature component (3), the low-temperature component (3) being arranged on the carrying box (1), the low-temperature component (3) comprising an inner liner (35) and an outer shell (33); a high-temperature component (2), the high-temperature component (2) being arranged on the low-temperature component (3); A feeding assembly (4), wherein the feeding assembly (4) is arranged inside the carrying box (1), and the feeding assembly (4) comprises: a compartment box (42), wherein the compartment box (42) is arranged on the carrying box (1), and wherein the compartment box (42) has an equipment cavity (43); a support frame (41), wherein the support frame (41) is arranged inside the carrying box (1), and wherein a feeding portion (401) and a discharging portion are respectively arranged on the support frame (41); a moving block (49), wherein the moving block (49) is arranged on the feeding portion (401), and wherein a carrying plate (491) is installed on the moving block (49); and an elevator (44), wherein the elevator (44) is arranged on The interior of the equipment cavity (43); at least two groups of connection blocks (45), the connection blocks (45) being arranged on the lifting machine (44); a cylinder (46), the cylinder (46) being mounted on the connection block (45), a push block (47) being mounted on the output end of the cylinder (46), a seat body being mounted on one end of the push block (47); a rod body (472), the rod body (472) being rotatably mounted on the seat body, a torsion spring being arranged between the rod body (472) and the seat body, a ball being arranged at the end of the rod body (472), the ball being made of elastic material; a placement box (51), the placement box (51) being arranged on the supporting plate (491), the placement box A partition (53) is installed inside the inner container (51), and a groove (501) is provided on the placement box (51); two sets of slide rails (56), and the slide rails (56) are arranged inside the groove (501); an insert block (55), and the insert block (55) is slidably arranged inside the groove (501), and a slot (6) is provided on the insert block (55); a spring (54), and the spring (54) is connected between the insert block (55) and the inner wall of the placement box (51); a placement plate (710), and the placement plate (710) is installed on the inner wall of the inner container (35), and notches (79) are provided on both the inner container (35) and the outer shell (33). , a stopper (711) is installed on the placement plate (710); a hinge sleeve is provided on the placement box (51), a hinge shaft is rotatably provided on the hinge sleeve, a closing plate (52) is installed on the hinge shaft, a half gear (521) is fixedly sleeved on the hinge shaft, a spring (54) groove is provided inside the placement box (51), one end of the spring (54) is located inside the spring (54) groove; an active rack (48) is installed on the side of the push block (47) close to the bearing plate (491), the active rack (48) protrudes from the push block (47), a slot (471) is opened on the push block (47), and a blocking plate is installed on the active rack (48);The end of the slot (6) close to the rod body (472) has a straight slideway (64), the end of the straight slideway (64) is provided with a first slideway (61), the groove bottom position of the straight slideway (64) is higher than the groove bottom position of the first slideway (61), a second slideway (62) is provided on the side of the first slideway (61) away from the straight slideway (64), the groove bottom position of the first slideway (61) is higher than the groove bottom position of the second slideway (62), a first stationary point is provided at the position where the first slideway (61) and the second slideway (62) are connected, and the first stationary point is located in the second slideway (62); a transition channel (631) is provided at the end of the second slideway (62), the groove bottom position of the second slideway (62) is higher than the groove bottom position of the transition channel (631). A second stationary point is provided at the connection between the second slideway (62) and the transition channel (631), and the second stationary point is located in the transition channel (631); a third slideway (63) is provided at the end of the transition channel (631), and the third slideway (63) has a first section connected to the transition channel (631) and a second section (632) connected to the straight slideway (64), the groove bottom position of the first section is lower than the groove bottom position of the transition channel (631), and a third stationary point is provided at the connection between the transition channel (631) and the first section, and the third stationary point is located in the first section; the second slideway (62) extends in a direction close to the straight slideway (64), and the transition channel (631) extends in a direction away from the straight slideway (64). ; 2. A chip high and low temperature test box according to claim 1, characterized in that: The feeding part (401) has a first platform mounted on a support frame (41), an electric cylinder is mounted inside the first platform, and the output end of the electric cylinder is connected to a moving block (49); the elevator (44) has a frame (441) mounted in the equipment cavity (43), multiple groups of sprockets (442) are rotatably mounted on the frame (441), chains (443) are arranged on the multiple groups of sprockets (442) for transmission, a first motor is mounted on the frame (441), the output end of the first motor is connected to one of the groups of sprockets (442), and at least two groups of the connecting blocks (45) are mounted on the chain (443).

3. A chip high and low temperature test box according to claim 1, characterized in that: The low-temperature component (3) comprises a box door (31) arranged on the outer shell (33); the inner liner (35) has an opening; circulation pipes (34) are respectively installed on both sides of the outer wall of the inner liner (35); equipment boxes (32) are respectively installed on both sides of the outer shell (33); and the interior of the equipment box (32) has an installation cavity (36).

4. The chip high and low temperature test box according to claim 1, characterized in that: The low-temperature component (3) is provided with an opening and closing component (7), the opening and closing component (7) comprising a track (71) provided at the position of the notch (79), a sealing plate (72) being slidably provided on the track (71), a fixing block (78) being installed on the outer wall of the inner tank (35), a driven rack (77) being slidably provided inside the fixing block (78), a fixing plate (75) being installed on the driven rack (77), a connecting plate (74) being installed at the bottom of the fixing plate (75), and the connecting plate (74) being fixedly connected to the sealing plate (72).

5. A chip high and low temperature test box according to claim 4, characterized in that: The fixed block (78) is provided with a protrusion, a rotating shaft is rotatably provided on the protrusion, a driven gear (76) and a driving gear (73) are respectively provided on the rotating shaft, and the driven gear (76) and the driven rack (77) are meshingly connected.

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