Device and method for measuring off-axis degree of cluster jumper

Abstract

The invention discloses a device and a method for measuring the off-axis degree of a cluster jumper wire. The device comprises a light beam quality analyzer, an assembler and a guide rail, the assembler is provided with an assembling interface matched with the light-emitting end sleeve of the cluster jumper, the assembler is matched with the guide rail to enable the axial direction of the assembling interface to be parallel to the guide rail, and the middle axis of the light-emitting end sleeve of the cluster jumper assembled on the assembling interface is parallel to the guide rail; the detection surface of the light beam quality analyzer is vertical to the guide rail; and the light beam quality analyzer and the assembler move along the guide rail to change the distance between the light beam quality analyzer and the assembler. According to the method for measuring the off-axis degree of the bunched jumper wire, the single light-passing optical fiber serves as a test item, instrument errors caused by the fact that the light beam quality analyzer exceeds the linear response range due to the fact that the light power of full-light-passing test is too large are avoided, the measurement error is further reduced, and meanwhile the labor cost and the time cost are saved.

Description

Technical Field

[0001] The invention belongs to the field of cluster jumpers, and more specifically, relates to a device and method for measuring the eccentricity of cluster jumpers. Background Art

[0002] The cluster jumper is composed of multiple optical fibers, which are stacked in the metal ferrule of the cluster jumper. The light-emitting end faces of all optical fibers together form the combined end of the cluster jumper, and the optical fibers are flush at the combined end face. Multiple optical fibers are wrapped with a protective sheath.

[0003] In the field of laser imaging applications, cluster jumpers are widely used in industrial laser projection, UV printing and 3D printing, laser lighting and other application scenarios. Currently, the UV cluster jumpers on the market are mainly used in LDI (laser direct imaging). The application end requires that the eccentricity of the cluster jumper is within a small suitable range to facilitate the adaptation of the output end.

[0004] However, the existing eccentricity test of cluster jumpers treats cluster jumpers as equivalent optical fibers and performs eccentricity test through spot analysis in the case of full light transmission. In the full light transmission state, the energy emitted by cluster jumpers is 100 times that of a single optical fiber, and the spot size is also far larger than that of a single optical fiber. The existing beam quality analyzer has large instrument errors in eccentricity test experiments under high power and large spot. Directly applying the existing optical fiber eccentricity test will also cause system errors.

[0005] In addition, considering that the number of optical fibers in a cluster jumper is generally dozens or even hundreds, the method of measuring the eccentricity of the fully-passed cluster jumper as an equivalent optical fiber requires a laser group to connect many branch optical fibers. The cost of testing the eccentricity is high, and each optical fiber must be connected to a laser, which is time-consuming and labor-intensive, and requires a lot of labor and time costs. Summary of the invention

[0006] In view of the above defects or improvement needs of the prior art, the present invention provides a device and method for measuring the eccentricity of a cluster jumper, the purpose of which is to test the angle between the light beam emitted from the end face of the cluster jumper in the assembled state and the cluster jumper sleeve as the eccentricity, thereby reducing the error of the test system; replacing the full-pass light equivalent fiber test with the light beam emitted by a single optical fiber, reducing the error of the test instrument, and saving labor and time costs, thereby solving the technical problems of the existing method for testing the eccentricity of cluster jumpers with full-pass light equivalent fibers, large system errors and instrument errors, and ultimately large cumulative errors and consuming a lot of labor and time costs.

[0007] To achieve the above object, according to one aspect of the present invention, there is provided an eccentricity measurement device for a cluster jumper, comprising a beam quality analyzer, an assembler, and a guide rail;

[0008] The assembler has an assembly interface that matches with the light-emitting end sleeve of the cluster jumper. The assembler matches with the guide rail so that the axial direction of the assembly interface is parallel to the guide rail. The central axis of the light-emitting end sleeve of the cluster jumper assembled on the assembly interface is parallel to the guide rail.

[0009] The detection surface of the beam quality analyzer is perpendicular to the guide rail;

[0010] The beam quality analyzer and the assembler move along the guide rail to change the distance between them.

[0011] Preferably, in the device for measuring the eccentricity of the cluster jumper, the assembly interface of the assembler is an interface adapted to the cluster jumper; or

[0012] The assembly interface includes a base with a V-shaped groove in cross section and a pressing piece movably matched with the base. The pressing piece cooperates with the V-shaped groove base to apply a pre-tightening force to the light-emitting end sleeve of the cluster jumper placed between the two, thereby fixing the light-emitting end of the cluster jumper.

[0013] Preferably, in the device for measuring the eccentricity of the cluster jumper, a motion mechanism is provided between the assembler and the guide rail for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0014] Preferably, in the eccentricity measuring device for the cluster jumper, the beam quality analyzer is provided with a motion mechanism for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0015] Preferably, in the device for measuring the eccentricity of the cluster jumper, the beam quality analyzer and / or the assembler are in sliding cooperation with a guide rail.

[0016] According to another aspect of the present invention, a method for measuring the eccentricity of a cluster jumper is provided, which comprises the following steps:

[0017] (1) Determine the geometric center axis of the outer sleeve of the cluster jumper according to the specifications and dimensions of the cluster jumper to be tested, so that the geometric center axis of the outer sleeve of the cluster jumper is directly opposite to the beam quality analyzer;

[0018] (2) Select the optical fiber at the optical output end of the cluster jumper that is closest to the geometric center axis of the outer sleeve of the cluster jumper as the light-passing optical fiber, and connect the test laser to the light-passing optical fiber;

[0019] (3) Adjust the position of the beam quality analyzer relative to the outer sleeve of the cluster jumper to obtain the light spot of the light-passing optical fiber, and analyze the angle of the light beam emitted by the light-passing optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper as the eccentricity of the cluster jumper to be tested.

[0020] Preferably, in the method for measuring the eccentricity of the bundled jumper, in step (2), when multiple optical fibers are at equal and closest distances to the geometric center axis of the outer sleeve of the bundled jumper, any one of the multiple optical fibers is used as the light-passing optical fiber.

[0021] Preferably, the method for measuring the eccentricity of a cluster jumper uses the device for measuring the eccentricity of a cluster jumper provided by the present invention;

[0022] The cluster jumper is assembled on the assembler of the eccentricity measuring device of the cluster jumper provided by the present invention.

[0023] Preferably, the method for measuring the eccentricity of the cluster jumper, step (3) is specifically as follows:

[0024] (3-1) Calibration: Adjust the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper, so that the center of the light spot of the light-passing fiber falls on the preset position. This position is recorded as the reference position, and the center position of the light spot of the light-passing fiber of the beam quality analyzer is (x1, y1);

[0025] (3-2) Test: Keep the beam quality analyzer facing the geometric center axis of the outer sleeve of the cluster jumper, and adjust the distance between the beam quality analyzer and the light-emitting end face of the cluster jumper within the linear response range of the beam quality analyzer, so that the beam quality analyzer moves to the test position with a distance of L from the reference position in the direction of the geometric center axis of the outer sleeve of the cluster jumper. At this time, read the center position of the light spot of the light-passing fiber of the beam quality analyzer as (x2, y2);

[0026] (3-3) Analysis: Based on the change in the center position of the light spot of the light-transmitting optical fiber at the reference position and the test position, the angle of the light beam emitted by the light-transmitting optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper is calculated as the eccentricity of the cluster jumper to be tested; the details are as follows:

[0027] The eccentricity of the cluster jumper is:

[0028]

[0029] Preferably, in the method for measuring the eccentricity of the cluster jumper, the step (3-1) makes the light spot of the light-passing optical fiber fall on the origin position of the beam quality analyzer;

[0030] The preferred solution is to adjust the relative position of the beam quality analyzer and the light spot in a plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper, specifically:

[0031] The movement mechanism of the beam quality analyzer and / or the assembler of the eccentricity measuring device of the cluster jumper adjusts the position of the beam quality analyzer and / or the assembler in a plane perpendicular to the guide rail.

[0032] In general, the above technical solutions conceived by the present invention can achieve the following beneficial effects compared with the prior art:

[0033] 1. The eccentricity measuring device for the cluster jumper provided by the present invention takes the processing and assembly errors of the sleeve into consideration, and measures the angle of the emitted light beam relative to the geometric center of the outer sleeve of the cluster jumper as the eccentricity test result, which truly reflects the offset of the light beam emitted by the cluster jumper and the geometric center axis of the cluster jumper in the assembled state, eliminates the system error of the eccentricity test, and facilitates the adaptation of the output end.

[0034] 2. The eccentricity measurement method of the cluster jumper provided by the present invention uses a single light-passing optical fiber as the test item to avoid the instrument error caused by the beam quality analyzer exceeding the linear response range due to the excessive power of the full-light test light, further reducing the measurement error while saving labor and time costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 It is a structural schematic diagram of the eccentricity measurement device of the cluster jumper provided by the present invention;

[0036] Figure 2 It is a partial enlarged view of the assembler of the eccentricity measuring device of the cluster jumper provided by the present invention;

[0037] Figure 3 It is a schematic diagram of the principle of the method for measuring the eccentricity of the cluster jumper provided by the present invention;

[0038] Figure 4 It is a partial schematic diagram of the center of the light-emitting end face of the cluster jumper to be tested provided by an embodiment of the present invention.

[0039] In all the drawings, the same reference numerals are used to represent the same elements or structures, wherein: 1 is a beam quality analyzer, 2 is a cluster jumper, 21 is the light-emitting end of the cluster jumper, 211 is the geometric center axis of the outer sleeve of the cluster jumper, 212 is the light-passing optical fiber, 3 is an assembler, 4 is a guide rail, and 5 is a laser. DETAILED DESCRIPTION

[0040] In order to make the purpose, technical scheme and advantages of the present invention clearer, the present invention is further described in detail below in conjunction with the embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0041] The eccentricity measuring device of the cluster jumper provided by the present invention is as follows: Figure 1 As shown, it includes a beam quality analyzer, an assembler, and a guide rail;

[0042] The assembler has an assembly interface that matches the sleeve at the optical end of the cluster jumper. The assembler matches the guide rail so that the axial direction of the assembly interface is parallel to the guide rail. The central axis of the sleeve at the optical end of the cluster jumper assembled on the assembly interface is parallel to the guide rail. When used for batch testing of cluster jumpers of specific specifications, the assembly interface of the assembler can be designed to be an interface that is compatible with the cluster jumpers, such as a plug-in interface. The preferred solution is as follows: Figure 2 As shown, when adapting to cluster jumpers of different specifications, the assembly interface includes a base with a V-shaped groove in the cross section and a pressing piece that movably cooperates with the base. The pressing piece cooperates with the V-shaped groove base to apply a pre-tightening force to the light-emitting end sleeve of the cluster jumper placed between the two, thereby fixing the light-emitting end of the cluster jumper. In a preferred embodiment, a motion mechanism is provided between the assembler and the guide rail for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0043] The detection surface of the beam quality analyzer is perpendicular to the guide rail; in a preferred embodiment, the beam quality analyzer is provided with a motion mechanism for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0044] The beam quality analyzer and the assembler move along the guide rail to change the distance between them. The beam quality analyzer and / or the assembler are in sliding cooperation with the guide rail.

[0045] The outer sleeve of the cluster jumper has a geometric dimension of 8 to 20 mm, and the inner diameter of the sleeve is 1 to 5 mm, while the size of the light-emitting end of the optical fiber bundle is 1 to 2 mm, and the size of the optical fiber is about 100 to 200 um. The processing error of the cluster jumper is one of the sources of eccentricity, and the method of measuring the eccentricity of the cluster jumper by fully passing light through the cluster jumper does not take into account the processing error of the cluster jumper, including the center deviation of the multi-core stack of the cluster jumper. The eccentricity measurement device for the cluster jumper provided by the present invention measures the deflection of the center of the light beam emitted by the cluster jumper in the assembled state relative to the geometric center axis of the cluster jumper by fixing the posture of the outer sleeve of the cluster jumper and the beam quality analyzer. It covers the eccentricity caused by the processing error of the cluster jumper and the deflection of the light beam, and can be directly applied to the assembly of the cluster jumper.

[0046] At the same time, the method of measuring the eccentricity of the full-pass light of the cluster jumper as an equivalent optical fiber does not take into account the problem of reduced measurement accuracy caused by the full-pass light power. Generally, the beam quality analyzer uses CCD or CMOS as the photosensitive element. At present, when analyzing the outgoing light spot of a single optical fiber, the optical power is in its linear range, which has a high measurement accuracy. When the measured optical power increases significantly, it exceeds the linear range of the photosensitive element and the measurement accuracy decreases. The cluster jumper is composed of multiple optical fibers. In the case of full-pass light, the optical power and spot size of its spot are several times that of a single optical fiber. This problem is particularly prominent when the number of integrated light rays in the cluster jumper is large. Common specifications of cluster jumpers include 104 cores, 138 cores, 208 cores, etc. The energy of a single-core spot is 3w-5w, and the optical power after beam combination can reach 1000W, which exceeds the linear response range of ordinary beam quality analyzers.

[0047] Repeated experimental tests have shown that using the eccentricity of the optical fiber at the geometric center of the optical fiber array at the light-emitting end relative to the geometric center axis of the cluster jumper as the eccentricity of the output light beam of the cluster jumper can effectively characterize the output direction of the laser beam in the assembled state, thereby controlling the quality of the cluster jumper product and facilitating adaptation of the output end.

[0048] The eccentricity measuring device of the bundled jumper provided by the present invention is used, for example Figure 3 As shown, the specific steps for the eccentricity test of the cluster jumper are as follows:

[0049] (1) Determine the geometric center axis of the outer sleeve of the cluster jumper according to the specifications and dimensions of the cluster jumper to be tested, so that the geometric center axis of the outer sleeve of the cluster jumper is directly opposite to the beam quality analyzer;

[0050] According to a preferred solution, the cluster jumper is assembled on an assembler of the eccentricity measuring device of the cluster jumper provided by the present invention.

[0051] (2) Select the optical fiber whose light-emitting end of the cluster jumper is closest to the geometric center axis of the outer sleeve of the cluster jumper as the light-passing optical fiber, and connect the test laser to the light-passing optical fiber; when multiple optical fibers are at the same and closest distance to the geometric center axis of the outer sleeve of the cluster jumper, select any one of the multiple optical fibers as the light-passing optical fiber;

[0052] (3) Adjust the position of the beam quality analyzer relative to the outer sleeve of the cluster jumper to obtain the light spot of the light-passing optical fiber, and analyze the angle of the light beam emitted by the light-passing optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper as the eccentricity of the cluster jumper to be tested.

[0053] Step (3) is as follows:

[0054] (3-1) Calibration: Adjust the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper, so that the center of the light spot of the light-passing fiber falls on the preset position. This position is recorded as the reference position, and the center position of the light spot of the light-passing fiber of the beam quality analyzer is (x1, y1); more conveniently, make the light spot of the light-passing fiber fall on the origin position of the beam quality analyzer;

[0055] The preferred solution is to adjust the relative position of the beam quality analyzer and the light spot in a plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper, specifically:

[0056] The movement mechanism of the beam quality analyzer and / or the assembler of the eccentricity measuring device of the cluster jumper adjusts the position of the beam quality analyzer and / or the assembler in a plane perpendicular to the guide rail.

[0057] (3-2) Test: Keep the beam quality analyzer facing the geometric center axis of the outer sleeve of the cluster jumper, and adjust the distance between the beam quality analyzer and the light-emitting end face of the cluster jumper within the linear response range of the beam quality analyzer, so that the beam quality analyzer moves to the test position with a distance of L from the reference position in the direction of the geometric center axis of the outer sleeve of the cluster jumper. At this time, read the center position of the light spot of the light-passing fiber of the beam quality analyzer as (x2, y2);

[0058] (3-3) Analysis: Based on the change in the center position of the light spot of the light-transmitting optical fiber at the reference position and the test position, the angle of the light beam emitted by the light-transmitting optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper is calculated as the eccentricity of the cluster jumper to be tested; the details are as follows:

[0059] The eccentricity of the cluster jumper is:

[0060]

[0061] The following are examples:

[0062] The eccentricity measurement device of the cluster jumper provided in this embodiment is as follows: Figure 1 As shown, it includes a beam quality analyzer, an assembler, and a guide rail;

[0063] The assembler has an assembly interface that cooperates with the light-emitting end sleeve of the cluster jumper. The assembler cooperates with the guide rail to make the assembly interface axially parallel to the guide rail, and the central axis of the light-emitting end sleeve of the cluster jumper assembled on the assembly interface is parallel to the guide rail.

[0064] like Figure 2 As shown, the assembly interface provided in this embodiment includes a base with a V-shaped groove in the cross section and a pressing plate movably matched with the base, and the pressing plate cooperates with the V-groove base to apply a pre-tightening force to the light-emitting end sleeve of the cluster jumper placed between the two, thereby fixing the light-emitting end of the cluster jumper.

[0065] The assembler is arranged on a displacement platform and is used for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0066] The detection surface of the beam quality analyzer is perpendicular to the guide rail; the beam quality analyzer is provided with a displacement platform for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0067] The beam quality analyzer and the assembler move along the guide rail to change the distance between them. The beam quality analyzer and / or the assembler are in sliding cooperation with the guide rail.

[0068] This embodiment takes the eccentricity test of a 138-core cluster jumper as an example. The local arrangement of the optical fiber center of the end face of the 138-core cluster jumper is shown as follows: Figure 4 .

[0069] The specific steps for the eccentricity test of cluster jumpers are as follows:

[0070] (1) Determine the geometric center axis of the outer sleeve of the cluster jumper, that is, the center of the light-emitting end face, according to the specifications and dimensions of the cluster jumper to be tested, so that the geometric center axis of the outer sleeve of the cluster jumper is directly opposite to the beam quality analyzer;

[0071] In this embodiment, the cluster jumper is assembled on the assembler of the eccentricity measuring device of the cluster jumper provided by the present invention, the outer sleeve of the cluster jumper is placed on the base with a V-shaped groove, and the pressing plate is fixed and pre-tightened with screws so that the central axis of the outer sleeve of the cluster jumper is parallel to the guide rail.

[0072] (2) Select the optical fiber whose light-emitting end of the cluster jumper is closest to the geometric center axis of the outer sleeve of the cluster jumper as the light-passing optical fiber, and connect the test laser to the light-passing optical fiber; when multiple optical fibers are at the same and closest distance to the geometric center axis of the outer sleeve of the cluster jumper, select any one of the multiple optical fibers as the light-passing optical fiber;

[0073] The cross section of the inner wall of the cluster jumper ferrule is rectangular, and the optical fiber closest to the center point is selected as the center optical fiber of the cluster jumper as the light-passing optical fiber. Figure 4 As shown in the figure. First find the center point of the light-emitting end face of the combined end. The center fiber of the cluster jumper is the one whose core of the surrounding fiber is closest to the center point. If there are multiple center fibers, that is, there are multiple fibers equidistant from the center point, just select one of them. Use a flange to connect the light source to the laser pigtail. After the laser is powered on, a light spot emitted by the light-emitting fiber of the cluster jumper appears on the beam analyzer. The combined end of the cluster jumper is composed of the light-emitting end faces of all optical fibers. The light-emitting surface of the combined end of the cluster jumper is vertically incident on the center of the receiving surface of the beam quality analyzer.

[0074] (3) Adjust the position of the beam quality analyzer relative to the outer sleeve of the cluster jumper to obtain the light spot of the light-passing optical fiber, and analyze the angle of the light beam emitted by the light-passing optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper as the eccentricity of the cluster jumper to be tested.

[0075] Step (3) is as follows:

[0076] (3-1) Calibration: Adjust the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper so that the center of the light spot of the light-passing optical fiber falls on a preset position. This position is recorded as the reference position. The center position of the light spot of the light-passing optical fiber of the beam quality analyzer is (x1, y1). In this embodiment, the light spot of the light-passing optical fiber falls on the origin position of the beam quality analyzer.

[0077] The adjustment of the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper is specifically:

[0078] The movement mechanism of the beam quality analyzer and the assembler of the eccentricity measuring device of the cluster jumper adjusts the position of the beam quality analyzer and the assembler in a plane perpendicular to the guide rail.

[0079] The reference position is obtained by adjusting the center position of the central optical fiber light spot to coincide with the origin of the beam quality analyzer, and the optical fiber light-emitting end face is at a position 10 mm away from the beam quality analyzer.

[0080] (3-2) Test: Keep the beam quality analyzer facing the geometric center axis of the outer sleeve of the cluster jumper, and adjust the distance between the beam quality analyzer and the light-emitting end face of the cluster jumper within the linear response range of the beam quality analyzer, so that the beam quality analyzer moves to the test position at a distance of L from the reference position in the direction of the geometric center axis of the outer sleeve of the cluster jumper. The center position of the light spot of the light-passing fiber of the beam quality analyzer is read as (x2, y2); the test position is 5 mm away from the reference position in the direction away from the light source.

[0081] (3-3) Analysis: Based on the change in the center position of the light spot of the light-transmitting optical fiber at the reference position and the test position, the angle of the light beam emitted by the light-transmitting optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper is calculated as the eccentricity of the cluster jumper to be tested; the details are as follows:

[0082] The eccentricity of the cluster jumper is:

[0083]

[0084] The test results are shown in the following table:

[0085]

[0086] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A device for measuring the eccentricity of a cluster jumper, characterized in that: Includes a beam quality analyzer, an assembler, and a guide rail; The assembler has an assembly interface that matches with the light-emitting end sleeve of the cluster jumper. The assembler matches with the guide rail so that the axial direction of the assembly interface is parallel to the guide rail. The central axis of the light-emitting end sleeve of the cluster jumper assembled on the assembly interface is parallel to the guide rail. The detection surface of the beam quality analyzer is perpendicular to the guide rail; The beam quality analyzer and the assembler move along the guide rail to change the distance between them.

2. The eccentricity measuring device for cluster jumpers according to claim 1, characterized in that: The assembly interface of the assembler is an interface adapted to the cluster jumper; or The assembly interface includes a base with a V-shaped groove in cross section and a pressing piece movably matched with the base. The pressing piece cooperates with the V-shaped groove base to apply a pre-tightening force to the light-emitting end sleeve of the cluster jumper placed between the two, thereby fixing the light-emitting end of the cluster jumper.

3. The eccentricity measuring device for cluster jumpers according to claim 1, characterized in that: A motion mechanism is provided between the assembler and the guide rail, for adjusting the position of the assembler in a plane perpendicular to the guide rail.

4. The eccentricity measuring device for cluster jumpers according to claim 1, characterized in that: The beam quality analyzer is provided with a motion mechanism for adjusting the position of the assembler in a plane perpendicular to the guide rail.

5. The eccentricity measuring device for cluster jumpers according to claim 1, characterized in that: The beam quality analyzer and / or the assembler are slidably matched with the guide rail.

6. A method for measuring the eccentricity of a cluster jumper, characterized in that: The following steps are involved: (1) Determine the geometric center axis of the outer sleeve of the cluster jumper according to the specifications and dimensions of the cluster jumper to be tested, so that the geometric center axis of the outer sleeve of the cluster jumper is directly opposite to the beam quality analyzer; (2) Select the optical fiber at the optical output end of the cluster jumper that is closest to the geometric center axis of the outer sleeve of the cluster jumper as the light-passing optical fiber, and connect the test laser to the light-passing optical fiber; (3) Adjust the position of the beam quality analyzer relative to the outer sleeve of the cluster jumper to obtain the light spot of the light-passing optical fiber, and analyze the angle of the light beam emitted by the light-passing optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper as the eccentricity of the cluster jumper to be tested.

7. The method for measuring the eccentricity of a cluster jumper according to claim 6, characterized in that: Step (2) When multiple optical fibers are at the same and closest distance to the geometric center axis of the outer sleeve of the bundled jumper, any one of the multiple optical fibers is used as the light-passing optical fiber.

8. The method for measuring the eccentricity of a cluster jumper according to claim 6, characterized in that: An eccentricity measuring device for a cluster jumper as claimed in any one of claims 1 to 5 is used; The cluster jumper is assembled on the assembler of the eccentricity measuring device of the cluster jumper provided by the present invention.

9. The method for measuring the eccentricity of a cluster jumper according to claim 8, characterized in that: Step (3) is as follows: (3-1) Calibration: Adjust the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper, so that the center of the light spot of the light-passing fiber falls on the preset position. This position is recorded as the reference position, and the center position of the light spot of the light-passing fiber of the beam quality analyzer is (x1, y1); (3-2) Test: Keep the beam quality analyzer facing the geometric center axis of the outer sleeve of the cluster jumper, and adjust the distance between the beam quality analyzer and the light-emitting end face of the cluster jumper within the linear response range of the beam quality analyzer, so that the beam quality analyzer moves to the test position with a distance of L from the reference position in the direction of the geometric center axis of the outer sleeve of the cluster jumper. At this time, read the center position of the light spot of the light-passing fiber of the beam quality analyzer as (x2, y2); (3-3) Analysis: Based on the change in the center position of the light spot of the light-transmitting optical fiber at the reference position and the test position, the angle of the light beam emitted by the light-transmitting optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper is calculated as the eccentricity of the cluster jumper to be tested; the details are as follows: The eccentricity of the cluster jumper is:

10. The method for measuring the eccentricity of a cluster jumper according to claim 9, characterized in that: The step (3-1) causes the light spot of the light-passing optical fiber to fall at the origin of the beam quality analyzer; The preferred solution is to adjust the relative position of the beam quality analyzer and the light spot in a plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper, specifically: The movement mechanism of the beam quality analyzer and / or the assembler of the eccentricity measuring device of the cluster jumper adjusts the position of the beam quality analyzer and / or the assembler in a plane perpendicular to the guide rail.

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