A method and device for measuring the dielectric constant of an atomic clock storage bubble

Abstract

The present disclosure provides a method and device for measuring the dielectric constant of an atomic clock storage bubble. The method includes: starting a device for measuring the dielectric constant of an atomic clock storage bubble to obtain the measured resonant frequency of the atomic clock cavity bubble system; constructing a simulation model based on the state parameters of the cavity bubble system; carrying out parameter scanning analysis based on the simulation model to obtain a relationship image between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity bubble system; determining the dielectric constant value of the storage bubble based on the simulated frequency on the measured frequency control relationship image; changing the tuner position and ambient temperature, and performing statistical averaging of multiple measurements to improve the measurement accuracy, and also analyze the relationship between the dielectric constant of the storage bubble and the temperature. The present invention improves the problem that the current method of measuring the dielectric constant by inversion of the calculation formula lacks flexibility and has certain limitations. It is of great significance to the optimized design of high-performance cavity bubble systems, improving the temperature-frequency characteristics of atomic clocks, and promoting the development of small and lightweight active atomic clocks.

Description

Technical Field

[0001] The present invention relates to the technical field of quantum frequency standards and dielectric constant measurement, and in particular to a method and device for measuring the dielectric constant of an atomic clock storage bubble. Background Art

[0002] The cavity-bubble system is a core component of the physics of hydrogen and rubidium atomic clocks. Its performance directly determines the quality of the hydrogen quantum transition spectrum, thereby influencing the accuracy and stability of the atomic clock's output frequency and other frequency characteristics. Factors such as the structure, shape, material, surface condition, electromechanical parameters, and environment of components such as the microwave resonant cavity and storage bubble primarily influence the performance of the cavity-bubble system. Among these, the physical quantities of the storage bubble, such as its structure, shape, and material, are particularly important.

[0003] Storage bubbles are dielectric components that exist in large quantities in the cavity. Their shapes can be irregular and made of materials such as Teflon, quartz, ceramic or sapphire. Due to the different dielectric constants and temperature sensitivities of different materials, the structure, shape, material and environmental resistance of the microwave cavity are designed differently, which in turn makes the volume, weight, quality factor of quantum transition spectrum lines and environmental immunity of the cavity bubble system itself different.

[0004] In order to optimize the design and manufacture of high-performance hydrogen atomic clocks (rubidium atomic clocks), it is necessary to accurately measure the dielectric constant of the storage bubble and its variation with the environment based on practical conditions. However, the current method for measuring the dielectric constant is based on measuring the resonant frequency of a microwave resonant cavity containing a standard regular sample, and by constructing an expression formula for the resonant frequency and dielectric constant, and finally inverting it to achieve the measurement of the dielectric constant value.

[0005] Because the measurement object is a microwave resonant cavity containing a sample, both the sample and the resonant cavity may differ from the actual situation. Furthermore, the formulas for expressing the resonant frequency and dielectric constant are general models, not specifically tailored to the actual microwave resonant cavity or cavity-bubble system. As previously mentioned, the structure, shape, material, surface condition, electromechanical parameters, and environmental conditions of the microwave resonant cavity and storage bubble components primarily influence the performance of the cavity-bubble system. Physical quantities such as the structure, shape, and material of the storage bubble are particularly important. Therefore, the dielectric constant obtained using a general model is not accurate. Existing measurement solutions also place high demands on the measurement system, lack flexibility, and have certain limitations. Summary of the Invention

[0006] In view of this, the present invention provides a method and apparatus for measuring the dielectric constant of an atomic clock storage bubble, which can improve the accuracy of the measurement of the dielectric constant of the storage bubble.

[0007] In order to solve the above technical problems, the present invention is implemented as follows.

[0008] To provide a basic understanding of some aspects of the disclosed embodiments, the following is a brief summary. This summary is not intended to be a comprehensive review, identify key or essential elements, or delineate the scope of these embodiments. Its sole purpose is to present some concepts in a simplified form as a prelude to the detailed description that follows.

[0009] In a first aspect, an embodiment of the present invention provides a method for measuring the dielectric constant of an atomic clock storage bubble, the method comprising:

[0010] The device for measuring the dielectric constant of the atomic clock storage bubble is connected to the cavity bubble system used for the atomic clock;

[0011] The measuring device obtains the measured resonant frequency of the cavity-bubble system;

[0012] A simulation model is constructed based on the state parameters of the cavity-bubble system; the state parameters are data related to actual components of the cavity-bubble system, including measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling loop; parameter types include temperature, structural dimensions, surface roughness, electrical parameters, and surface coating parameters;

[0013] Perform parameter scanning analysis based on the simulation model to obtain an image of the relationship between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system;

[0014] determining a dielectric constant value of the storage bubble according to the measured resonance frequency and the simulated resonance frequency on the relationship image;

[0015] To improve the accuracy of dielectric constant measurement, the state parameters of the cavity system can be kept unchanged, the above operation can be repeated, and statistical averaging can be performed through multiple measurements; or the tuner position can be changed, the above operation can be repeated, and statistical averaging can be performed through multiple measurements to improve the measurement accuracy.

[0016] According to a preferred embodiment, the method further comprises: adjusting the temperature of the measurement environment, repeating all operations, and obtaining the relationship between the dielectric constant of the storage bubble and the temperature.

[0017] According to a preferred embodiment, the method further comprises: before measuring, evacuating the cavity bubble system.

[0018] In a second aspect, an embodiment of the present invention provides a device for measuring the dielectric constant of an atomic clock storage bubble, wherein the measured object is a storage bubble within a cavity bubble system used for the atomic clock; the device comprises: a vacuum constant temperature chamber, an atomic clock cavity bubble system, a network analyzer, a 10 MHz frequency reference source, a simulation module, and a calculation module; the device is connected to the cavity bubble system;

[0019] Vacuum constant temperature box, used to provide a vacuum measurement environment with different constant temperatures for the cavity and bubble system;

[0020] A cavity system, used to provide an electromagnetic energy field for measuring the dielectric constant and provide an interface for the measurement;

[0021] A network analyzer is used to measure the resonant frequency of the cavity system and read the measured resonant frequency by obtaining the S11 curve or S21 curve;

[0022] 10MHz frequency reference source, used to generate a 10MHz frequency standard, connected to the network analyzer and calibrated;

[0023] A simulation module is used to construct a simulation model of the cavity-bubble system according to the state parameters of the cavity-bubble system; perform parameter scanning analysis based on the simulation model to obtain an image of the relationship between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system;

[0024] The state parameters are data of actual components in the atomic clock, including measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring; parameter types include temperature, structural dimensions, surface roughness, electrical parameters, and surface coating parameters;

[0025] The calculation module is used to read the measured resonant frequency from the network analyzer, compare it with the simulated resonant frequency on the relationship image, and determine the dielectric constant value of the storage bubble.

[0026] The cavity-bubble system is composed of a microwave resonant cavity, a storage bubble, a tuner and an antenna coupling ring;

[0027] Preferably, the calculation module further obtains multiple dielectric constant values ​​at different resonant frequencies through multiple measurements for different tuner positions, and takes an average as the measurement result of the dielectric constant of the storage bubble.

[0028] According to a preferred embodiment, the simulation module constructs the state parameters of the cavity-bubble system based on which the simulation model is constructed, including: the temperature of the measurement environment; the cavity structure of the microwave resonant cavity, the film thickness, conductivity and roughness of the cavity surface coating; the structure and surface roughness of the storage bubble; the structure and position of the tuner and the film thickness, conductivity and roughness of the surface coating; the structure of the antenna coupling ring and the film thickness, conductivity and roughness of the surface coating; and the microwave power of the cavity-bubble system input to the network analyzer.

[0029] The microwave resonant cavity is a magnetron resonant cavity or a standard waveguide resonant cavity.

[0030] The antenna coupling ring is a measurement interface for measuring the resonant frequency of the cavity-bubble system, and the number of the antenna coupling ring is at least one.

[0031] The storage bubble, as the component to be tested, can be made of ceramic, quartz, Teflon or sapphire, and can be spherical, rectangular, ellipsoidal or cylindrical in shape.

[0032] Beneficial effects:

[0033] (1) The present invention provides a method and device for measuring the dielectric constant of an atomic clock storage bubble. The method and device mainly measure the dielectric constant of the storage bubble based on the atomic clock cavity bubble system. The measurement is performed using the actual cavity bubble system, resonant cavity, and storage bubble in the atomic clock, thereby avoiding the inaccuracy caused by the use of samples and external test environments. Moreover, the simulation model constructed by the present invention is also constructed based on the actual test environment and cavity bubble system. The present invention analyzes the influence of various parameters of the environment, atomic clock, and storage bubble on the test, and determines that the components that affect the results involve the measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring. The types of influencing parameters involve temperature, structural dimensions, surface roughness, electrical parameters, and surface coating parameters, so that the change in dielectric constant can be accurately reflected in the simulation model. By using such a simulation model to construct an image of the relationship between resonant frequency and dielectric constant, a more realistic measurement of the dielectric constant of the storage bubble can be achieved. At the same time, the measurement data can be used as a reference to correct and compensate for the frequency offset of the atomic clock affected by temperature, thereby improving the temperature coefficient of the atomic clock and enhancing environmental immunity.

[0034] (2) In a preferred embodiment, the dielectric constant of the storage bubble and its variation with the ambient temperature can be accurately measured in the practical state of the storage bubble, which solves the problem that the current method of using the calculation formula to invert the dielectric constant has high requirements for the measurement system, few model parameters, lacks flexibility, and has certain limitations.

[0035] (3) The optimized design of high-performance cavity systems in terms of structure, process, and environmental adaptability is of great significance, especially in the development of small and lightweight active atomic clocks. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0037] Figure 1 This is a flow chart of a method for measuring the dielectric constant of a hydrogen clock storage bubble provided by an embodiment of the present invention;

[0038] Figure 2 Schematic diagram of a device for measuring the dielectric constant of a hydrogen clock storage bubble provided by an embodiment of the present invention;

[0039] Figure 3 This is a schematic diagram of an S11 curve image provided by an embodiment of the present invention;

[0040] Figure 4 This is a schematic diagram of a dielectric constant-resonance frequency curve provided by an embodiment of the present invention;

[0041] Among them, 1-vacuum constant temperature device, 2-cavity bubble system, 21-microwave resonant cavity, 22-storage bubble, 23-tuner, 24-antenna coupling ring, 3-network analyzer, 4-10MHz frequency reference source, 5-computer, 6-simulation software. DETAILED DESCRIPTION

[0042] The present invention is described in detail below with reference to the accompanying drawings and embodiments.

[0043] The following description and the drawings sufficiently illustrate specific embodiments of the invention to enable those skilled in the art to practice them.

[0044] It should be understood that the embodiments described are only a portion of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative work are within the scope of protection of the present invention.

[0045] In the following description, unless otherwise indicated, identical numbers in different figures represent identical or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are merely examples of systems and methods consistent with certain aspects of the present invention, as detailed in the appended claims.

[0046] In the description of the present invention, it should be understood that the terms "first", "second", etc. are used for descriptive purposes only and are not to be understood as indicating or implying relative importance. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. In addition, in the description of the present invention, unless otherwise specified, "plurality" refers to two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the previous and subsequent associated objects are in an "or" relationship.

[0047] The following will be combined Figure 1-Figure 4 The present invention provides a detailed introduction to a method and apparatus for measuring the dielectric constant of an atomic clock storage bubble. The following description uses a hydrogen clock as an example; the present invention can also be used to measure the dielectric constant of a rubidium clock storage bubble.

[0048] In order to achieve the functional effect of measuring the dielectric constant of a hydrogen clock storage bubble, a method and device for measuring the dielectric constant of a hydrogen clock storage bubble and an implementation process are invented as follows:

[0049] S100, a device for measuring the dielectric constant of a storage bubble is connected to a cavity bubble system used for a hydrogen clock, wherein the storage bubble in the cavity bubble system is the measurement object; the measuring device is started to obtain the measured resonant frequency of the hydrogen clock cavity bubble system.

[0050] The cavity system used in the hydrogen clock can be the cavity system used in the development process of the atomic clock for development work; it can also be the cavity system in the atomic clock product for performance analysis of the atomic clock product.

[0051] Before measuring, the cavity system can be evacuated to avoid the influence of other gases on the measurement.

[0052] For example, Figure 2 The figure shows a schematic diagram of a device for measuring the dielectric constant of a hydrogen clock storage bubble. The device mainly consists of a vacuum constant temperature box 1, a cavity bubble system 2, a network analyzer 3, a 10MHz frequency reference source 4 and a computer 5. The cavity bubble system 2 consists of a microwave resonant cavity 21, a storage bubble 22, a tuner 23 and two antenna coupling loops 24. First, the cavity bubble system 2 is placed in the vacuum constant temperature box 1. The vacuum constant temperature box 1 here is the original part of the hydrogen clock. In practice, an additional vacuum constant temperature box can also be used to achieve ambient temperature control. One of the antenna coupling loops 24 is connected to the network analyzer 3 as the external interface of the cavity bubble system 2. The network analyzer 3 is connected to the 10MHz frequency reference source 4 and the computer 5, thereby forming a measuring device.

[0053] Start the measuring device, set the ambient temperature to T1 through the vacuum thermostat 1, and the vacuum degree is less than or equal to the set vacuum degree P0. At this time, the gas inside and outside the storage bubble 22 no longer affects the resonant frequency of the cavity bubble system 2. After the temperature is balanced, the network analyzer 3 is used to measure the following Figure 3 As shown in the S11 curve A at the temperature T1, the frequency value corresponding to the minimum value of the curve A is the measured resonant frequency of the cavity system 2.

[0054] In practice, both antenna coupling loops 24 can be connected to the network analyzer 3 , and the network analyzer measures the S21 curve at temperature T1 . The frequency value corresponding to the maximum value of the curve is the measured resonant frequency of the cavity system 2 .

[0055] In this case, the structure of the microwave resonant cavity 21 is a standard cylindrical waveguide resonant cavity; the storage bulb 22 is a spherical quartz glass bulb; the 10 MHz frequency reference source 4 is a VCH 1003 hydrogen clock, which is used to generate a 10 MHz high-stability frequency standard source, connected to and calibrated by the network analyzer 3 to ensure the accuracy of frequency measurement; the computer 5 is used to collect the measured resonant frequency based on the S11 curve measured by the network analyzer 3.

[0056] S200: constructing a simulation model according to the state parameters of the actual cavity-bubble system.

[0057] For example, a simulation model of the cavity system 2 can be constructed on a computer 5 using simulation software 6 such as HFSS, CST, and COMSOL.

[0058] The present invention analyzes the influence of various parameters of the environment, atomic clock, and storage bubble on the test, and determines that the components that affect the results include the measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling loop. The types of influencing parameters include temperature, structural dimensions, surface roughness, electrical parameters, and surface coating parameters. This allows the change in dielectric constant to be accurately reflected in the simulation model. Using such a simulation model to construct an image of the relationship between resonant frequency and dielectric constant, it is possible to achieve a more realistic measurement of the dielectric constant of the storage bubble.

[0059] In this preferred embodiment, the state parameters of the cavity-bubble system 2 include: the temperature T1 of the ambient vacuum oven; the cavity dimensions, thickness, conductivity, and roughness of the cavity surface coating of the microwave resonant cavity 21; the dimensions and surface roughness of the storage bubble 22; the dimensions and position of the tuner 23, as well as the thickness, conductivity, and roughness of the surface coating; the dimensions of the antenna coupling loop 24, as well as the thickness, conductivity, and roughness of the surface coating; and the microwave power input to the cavity-bubble system 2 by the network analyzer 3. In this case, when constructing the simulation model, simulation software 6 was used to solve the simulated resonant frequency for the excitation model in HFSS.

[0060] S300 , performing parameter scanning analysis based on the simulation model to obtain an image of the relationship between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system.

[0061] For example, Figure 4 As shown, curve a1 is the simulated resonant frequencies obtained after the storage bubble 22 in the cavity bubble system 2 takes different dielectric constants during simulation in the computer 5. The horizontal axis of the curve a1 is the dielectric constant and the vertical axis is the simulated resonant frequency. It can be seen that the curve a1 clearly shows the relationship between the dielectric constant of the storage bubble 22 and the resonant frequency of the cavity bubble system 2.

[0062] S400: Determine the dielectric constant value of the storage bubble based on the measured resonance frequency and the resonance frequency on the relationship image.

[0063] For example, the measured resonant frequency f1 in step S100 is compared with Figure 4 The horizontal coordinate value corresponding to the vertical coordinate point f1 of the simulation frequency curve a1 is ε1, from which it can be obtained that ε1 is the actual value of the dielectric constant of the storage bubble 22, thereby realizing the measurement of the dielectric constant of the hydrogen clock storage bubble 22.

[0064] S500, changing the position of the tuner in the cavity system, repeating the above operation, and improving the measurement accuracy through statistical averaging of multiple measurements.

[0065] For example, if the other state parameters of the cavity-bubble system 2 remain unchanged and only the tuner 23 is adjusted to a different position, the resonant frequency of the cavity-bubble system 2 will change. To perform another measurement, the steps S100-S400 are repeated to measure the dielectric constant of the storage bubble 22 at that position of the tuner 23. By changing the position multiple times and taking multiple measurements, and averaging the multiple measured values, a more accurate value for the dielectric constant of the storage bubble 22 can be obtained.

[0066] S600: Adjust the ambient temperature and repeat the above operation to analyze the relationship between the dielectric constant of the storage bubble and the temperature.

[0067] For example, if the other state parameters of the cavity system 2 remain unchanged and only the temperature value of the vacuum constant temperature box 1 is set from T1 to T2, the resonant frequency of the cavity system 2 will change. To achieve re-measurement, it is necessary to repeat the process of S100-S400. The resonant frequency of the cavity system 2 under the ambient temperature T2 can be measured. Figure 3 The S11 curve A2 shown and Figure 4 The dielectric constant and resonant frequency curve a2 is shown. The corresponding measured frequency f2 can be obtained and compared with Figure 4 The dielectric constant ε2 of the storage bubble 22 is obtained. By changing the temperature setting value of the vacuum constant box 1 multiple times and repeating the above process, the law of the dielectric constant of the storage bubble 22 changing with temperature can be obtained after multiple measurements.

[0068] Through the above-mentioned case study, in order to achieve the desired effect of measuring the dielectric constant of a hydrogen clock storage bubble, a more realistic measurement of the dielectric constant of storage bubble 22 was achieved, primarily based on hydrogen clock cavity bubble system 2, by measuring the resonant frequency and constructing a simulation model of the relationship between the resonant frequency and the dielectric constant. This method, which accurately measures the dielectric constant of storage bubble 22 and its variation with ambient temperature while the storage bubble 22 is in its practical state, addresses the current limitations of inverse dielectric constant measurement methods using limited samples and simple calculation formulas, such as high measurement system requirements, a limited number of model parameters, a lack of flexibility, and certain limitations. This method and apparatus are of great significance for the optimized design of high-performance cavity bubble systems in terms of their structure, process, environmental adaptability, and reliability, particularly in the development of compact, lightweight, active hydrogen atomic clocks.

[0069] It should be noted that the aforementioned embodiments of the apparatus for measuring the dielectric constant of a storage bubble, when implementing the method for measuring the dielectric constant of a storage bubble, are merely exemplified by the division of the aforementioned functional modules. In actual applications, the aforementioned functions can be assigned to different functional modules as needed, i.e., the internal structure of the apparatus can be divided into different functional modules to perform all or part of the functions described above. Furthermore, the aforementioned embodiments of the method for measuring the dielectric constant of a storage bubble and the apparatus for measuring the dielectric constant of a storage bubble are based on the same concept. The implementation process is detailed in the method embodiments and will not be further elaborated here.

[0070] The serial numbers of the above embodiments of the present invention are for description only and do not represent the advantages or disadvantages of the embodiments.

[0071] The above specific embodiments merely illustrate the design principles of the present invention. The shapes and names of the components described herein may vary and are not limiting. Therefore, those skilled in the art may modify or substitute equivalents for the technical solutions described in the above embodiments. Such modifications and substitutions, without departing from the inventive spirit and technical solutions of the present invention, shall fall within the scope of protection of the present invention.

Claims

1. A method for measuring the dielectric constant of an atomic clock storage bubble, characterized in that: The following steps are involved: The device for measuring the dielectric constant of an atomic clock storage bubble is connected to a cavity bubble system used for the atomic clock; the storage bubble in the cavity bubble system is the measurement object; The measuring device obtains the measured resonant frequency of the cavity-bubble system; constructing a simulation model according to the state parameters of the cavity-bubble system; The state parameters are data related to actual devices of the cavity-bubble system, including measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring; parameter types include temperature, structural dimensions, surface roughness, electrical parameters, and surface coating parameters; Perform parameter scanning analysis based on the simulation model to obtain an image of the relationship between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system; Determining the dielectric constant value of the storage bubble according to the measured resonance frequency and comparing it with the simulated resonance frequency on the relationship image; The position of the tuner in the cavity bubble system is changed, and the above operation is repeated. The statistical average of multiple measurements is used as the measurement result of the storage bubble dielectric constant.

2. The method according to claim 1, characterized in that The method further includes: adjusting the temperature of the measurement environment, repeating all operations, and obtaining the relationship between the dielectric constant of the storage bubble and the temperature.

3. The method according to claim 1, characterized in that The method further comprises: before measuring, evacuating the cavity bubble system.

4. The method according to claim 1, wherein The atomic clock is a hydrogen clock or a rubidium clock.

5. A device for measuring the dielectric constant of an atomic clock storage bubble, characterized in that: The device includes: a vacuum constant temperature box, a network analyzer, a 10MHz frequency reference source, a simulation module and a calculation module; the device is connected to a cavity bubble system used for an atomic clock, and the storage bubble in the cavity bubble system is the measurement object; Vacuum constant temperature box, used to provide a vacuum measurement environment with different constant temperatures for the cavity and bubble system; A cavity system, used to provide an electromagnetic energy field for measuring the dielectric constant and provide an interface for the measurement; A network analyzer is used to measure the resonant frequency of the cavity system and read the measured resonant frequency by obtaining the S11 curve or S21 curve; 10MHz frequency reference source, used to generate a 10MHz frequency standard, connected to the network analyzer and calibrated; A simulation module is used to construct a simulation model of the cavity-bubble system according to the state parameters of the cavity-bubble system; perform parameter scanning analysis based on the simulation model to obtain an image of the relationship between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system; The state parameters are data of actual components of the cavity-bubble system design, including measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring; parameter types include temperature, structural dimensions, surface roughness, electrical parameters, and surface coating parameters; The calculation module is used to read the measured resonant frequency from the network analyzer, compare it with the simulated resonant frequency on the relationship image, and determine the dielectric constant value of the storage bubble.

6. The device according to claim 5, characterized in that The cavity-bubble system is composed of a microwave resonant cavity, a storage bubble, a tuner and an antenna coupling ring; The calculation module further obtains multiple dielectric constant values ​​at different resonant frequencies through multiple measurements based on different tuner positions, and takes an average as the measurement result of the dielectric constant of the storage bubble.

7. The device according to claim 5, characterized in that The simulation module constructs the simulation model based on the state parameters of the cavity-bubble system, including: the temperature of the measurement environment; the cavity structure of the microwave resonant cavity, the film thickness, conductivity and roughness of the cavity surface coating; the structure and surface roughness of the storage bubble; the structure and position of the tuner and the film thickness, conductivity and roughness of the surface coating; the structure of the antenna coupling ring and the film thickness, conductivity and roughness of the surface coating; and the microwave power input to the cavity-bubble system by the network analyzer.

8. The device according to claim 6, characterized in that The microwave resonant cavity is a magnetron resonant cavity or a standard waveguide resonant cavity.

9. The device according to claim 6, characterized in that The antenna coupling ring is a measurement interface for measuring the resonant frequency of the cavity-bubble system, and the number of the antenna coupling ring is at least one.

10. The device according to claim 5, characterized in that The storage bubble, as the component to be tested, is made of ceramic, quartz, Teflon or sapphire, and has a spherical, rectangular, ellipsoidal or cylindrical shape.

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