Transformer test strategy generation method, device, equipment and storage medium

Abstract

The present invention discloses a transformer test strategy generation method, device, equipment and storage medium. The method comprises: obtaining transformer information of a transformer to be tested and equipment parameters of spare test equipment, determining characteristic parameters of the magnetizing inductance of the transformer to be tested under no-load state according to the transformer information, determining transformer test equivalent reactance based on the magnetizing inductance characteristic parameters, determining total reactive power of the transformer to be tested according to the transformer test equivalent reactance, determining compensation reactance value required for the transformer to be tested test based on the total reactive power, selecting target test equipment from spare test equipment according to the compensation reactance value and equipment parameters, and determining the test strategy of the transformer to be tested based on the target test equipment; because the present invention analyzes the magnetizing inductance of the transformer and accurately calculates the compensation reactance value required for the test, thereby reasonably selecting the test equipment, greatly improving the rationality of the test, accurately discovering potential defects of the equipment, and avoiding subsequent operation safety problems.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical equipment, and in particular to a transformer test strategy generation method, device, equipment and storage medium. Background Art

[0002] As a key hub equipment of the power system, the operating status and health level of large-capacity oil-immersed power transformers are directly related to the safety and stability of the power system. The insulation performance of the transformer is a key indicator for evaluating the health of the transformer. It is affected to a certain extent by the equipment manufacturing process. If the process is not strictly controlled, bubbles, cracks, impurities or metal burr defects may appear inside the insulation of the factory transformer, resulting in uneven electric field distribution and causing partial discharge. The transformer induction withstand voltage partial discharge test can effectively detect the internal discharge characteristics of the transformer after the insulation deteriorates or fails, and discover the latent discharge defects of the equipment. It is one of the main test items that are indispensable for the handover and diagnosis of various transformers.

[0003] The partial discharge test of the transformer induction withstand voltage zone is relatively complicated to carry out, and the main problems in the current transformer test are as follows: the transformer excitation inductance is not considered in the calculation process of the equivalent test parameters, and the calculation result of the total reactive power that needs to be compensated deviates from the actual value, resulting in improper selection of test equipment and unreasonable formulation of test strategies, which makes it impossible to accurately and effectively detect the internal discharge characteristics of the transformer after insulation degradation or failure, and unable to discover the latent discharge defects of the equipment. Summary of the invention

[0004] The main purpose of the present invention is to provide a transformer test strategy generation method, device, equipment and storage medium, aiming to solve the technical problems in the prior art that the transformer test analysis does not take the transformer excitation inductance into consideration, resulting in inaccurate calculation of the total reactive power to be compensated, improper selection of test equipment, and unreasonable formulation of test strategies.

[0005] To achieve the above object, the present invention provides a transformer test strategy generation method, the method comprising the following steps:

[0006] Obtaining transformer information of the transformer to be tested and equipment parameters of a backup test equipment of the transformer to be tested;

[0007] Determine the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, and determine the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters;

[0008] Determine the total reactive power of the transformer to be tested according to the transformer test equivalent reactance;

[0009] Determine the compensating reactance value required for the transformer test based on the total reactive power;

[0010] A target test device is selected from the backup test devices according to the compensation reactance value and the device parameters, and a test strategy for the transformer to be tested is determined based on the target test device.

[0011] Optionally, the transformer information includes low-voltage side rated current, low-voltage side rated voltage, rated frequency, no-load loss parameter and no-load current per unit value, and the magnetizing inductance characteristic parameters include magnetizing impedance, single-phase magnetizing resistance and single-phase magnetizing reactance;

[0012] The step of determining the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, and determining the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters, comprises:

[0013] Determining a no-load current based on the transformer rated current and the no-load current per unit value;

[0014] Determine the excitation impedance according to the no-load current and the rated current of the low-voltage side;

[0015] Determine a single-phase exciting resistance based on the no-load current and the no-load loss parameter;

[0016] Determine the single-phase excitation reactance according to the excitation impedance, the single-phase excitation resistance and the rated frequency;

[0017] The transformer test equivalent reactance is determined based on the single-phase excitation reactance.

[0018] Optionally, determining the total reactive power of the transformer to be tested according to the transformer test equivalent reactance includes:

[0019] According to the transformer information, the capacitance parameters of the high-voltage winding to the low-voltage winding and the ground, the capacitance parameters of the low-voltage winding to the high-voltage winding and the ground, and the capacitance parameters of the high-voltage and low-voltage windings to the ground of the transformer to be tested are obtained;

[0020] Determine the three-phase winding equivalent capacitance parameters based on the capacitance parameters of the high voltage winding to the low voltage winding and the ground, the capacitance parameters of the low voltage winding to the high voltage winding and the ground, and the capacitance parameters of the high and low voltage windings to the ground;

[0021] Determine the transformer test equivalent inlet capacitance parameter according to the three-phase winding equivalent capacitance parameter;

[0022] Obtaining the test frequency and the pressure side test voltage of the transformer to be tested;

[0023] The total reactive power of the transformer to be tested is determined based on the test frequency, the pressurized side test voltage, the transformer test equivalent inlet capacitance parameter and the transformer test equivalent reactance.

[0024] Optionally, determining the compensating reactance value required for the transformer test based on the total reactive power includes:

[0025] The compensating reactance value required for the transformer test is determined based on the total reactive power, the test frequency of the transformer to be tested, and the test voltage on the pressure side:

[0026]

[0027] Among them, L is the compensation reactance value, U is the test voltage on the pressurized side, f is the test frequency, Q all is the total reactive power.

[0028] Optionally, the target test equipment includes a target reactor; the step of selecting the target test equipment from the backup test equipment according to the compensation reactance value and the equipment parameter, and determining the test strategy of the transformer to be tested based on the target test equipment includes:

[0029] Determine the reactance value of each standby reactor in the standby test equipment based on the equipment parameters;

[0030] Matching the reactance value of each standby reactor with the compensation reactance value, and selecting candidate reactors from the standby reactors based on the matching result;

[0031] Determining a reactance selection priority of each candidate reactor based on the reactance value of each candidate reactor;

[0032] selecting a target reactor from the candidate reactors according to the reactor selection priority;

[0033] Determine the high-voltage side voltage of the transformer to be tested when it is excited based on the transformer information;

[0034] Determine the maximum voltage of the transformer to be tested when it is excited according to the high-voltage side voltage during the excitation;

[0035] Determine the excitation shift position based on the maximum voltage measured during the excitation;

[0036] A test strategy for the transformer to be tested is determined according to the excitation gear position and the target reactor.

[0037] Optionally, the target test equipment further includes a target power supply device; and the test strategy for determining the transformer to be tested according to the excitation gear position and the target reactor includes:

[0038] Determine the no-load loss parameter under the excitation voltage according to the rated frequency, test frequency, no-load loss parameter, low-voltage side rated voltage of the transformer to be tested, and the maximum voltage measured during excitation:

[0039]

[0040] in, is the no-load loss parameter under the excitation voltage, is the rated frequency, is the test frequency, is the no-load loss parameter, is the rated voltage of the low voltage side, The highest voltage is measured when the voltage is applied during excitation;

[0041] The target active power required during the test of the transformer to be tested is determined based on the no-load loss parameter, the excitation transformer loss parameter and the frequency converter cabinet loss parameter under the excitation voltage:

[0042]

[0043] in, is the target active power, is the no-load loss parameter under the excitation voltage, is the excitation transformer loss parameter, is the loss parameter of the frequency converter cabinet;

[0044] Determine the power parameters of each backup power supply device in the backup test device based on the device parameters;

[0045] Matching the power parameters of each backup power supply device with the target active power, and selecting the target power supply device from the backup power supply devices based on the matching result;

[0046] A test strategy for the transformer to be tested is determined according to the target power supply device, the excitation gear position and the target reactor.

[0047] Optionally, the target test equipment further includes a target cable device; and the test strategy for determining the transformer to be tested according to the target power supply device, the excitation gear position and the target reactor includes:

[0048] Determine the maximum output current of the target power device based on the rated output voltage of the target power device:

[0049]

[0050] in, is the maximum output current, is the rated output voltage, is the no-load loss parameter under the excitation voltage;

[0051] Determine the cable diameter threshold according to the maximum output current and the preset line current density:

[0052]

[0053] in, is the cable diameter threshold, is the maximum output current, is the preset line current density;

[0054] Screening out a target cable device from the backup test equipment based on the cable diameter threshold;

[0055] A test strategy for the transformer to be tested is determined according to the target cable equipment, the target power supply equipment, the excitation gear position and the target reactor.

[0056] In addition, to achieve the above-mentioned purpose, the present invention also proposes a transformer test strategy generation device, the transformer test strategy generation device comprising:

[0057] An information acquisition module, used to acquire transformer information of the transformer to be tested and equipment parameters of a backup test equipment of the transformer to be tested;

[0058] A no-load excitation analysis module, used to determine the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, and determine the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters;

[0059] A reactive power calculation module, used to determine the total reactive power of the transformer to be tested according to the transformer test equivalent reactance;

[0060] A compensation reactance calculation module, used to determine the compensation reactance value required for the transformer test based on the total reactive power;

[0061] A test strategy generating module is used to select a target test device from the backup test devices according to the compensation reactance value and the device parameters, and determine a test strategy for the transformer to be tested based on the target test device.

[0062] In addition, to achieve the above-mentioned purpose, the present application also proposes a transformer test strategy generation device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, and the computer program is configured to implement the steps of the transformer test strategy generation method described above.

[0063] In addition, to achieve the above-mentioned purpose, the present application also proposes a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the transformer test strategy generation method as described above are implemented.

[0064] The present invention obtains transformer information of the transformer to be tested and equipment parameters of the spare test equipment of the transformer to be tested, determines the excitation inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, determines the transformer test equivalent reactance based on the excitation inductance characteristic parameters, determines the total reactive power of the transformer to be tested according to the transformer test equivalent reactance, determines the compensation reactance value required for the transformer to be tested based on the total reactive power, selects a target test equipment from the spare test equipment according to the compensation reactance value and the equipment parameters, and determines the test strategy of the transformer to be tested based on the target test equipment; because the present invention effectively avoids deviations in the calculation of the total reactive power result that needs to be compensated by analyzing the transformer excitation inductance, accurately calculates the compensation reactance value required for the test, thereby reasonably selecting the test equipment, greatly improving the rationality of the test, ensuring that the transformer discharge test can effectively detect the discharge characteristics of the transformer, accurately discover the latent defects of the equipment, and avoid subsequent operation safety problems. BRIEF DESCRIPTION OF THE DRAWINGS

[0065] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0066] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0067] Figure 1 It is a structural schematic diagram of a transformer test strategy generating device in a hardware operating environment involved in an embodiment of the present invention;

[0068] Figure 2 It is a flowchart of the first embodiment of the transformer test strategy generation method of the present invention;

[0069] Figure 3 A schematic diagram of a flow chart of a second embodiment of a transformer test strategy generation method according to the present invention;

[0070] Figure 4 A principle block diagram for formulating a test strategy in a second embodiment of a transformer test strategy generation method of the present invention;

[0071] Figure 5 This is a structural block diagram of the first embodiment of the transformer test strategy generating device of the present invention.

[0072] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0073] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0074] Reference Figure 1 , Figure 1 A schematic diagram of a transformer test strategy generating device structure for a hardware operating environment involved in an embodiment of the present invention.

[0075] like Figure 1 As shown, the transformer test strategy generation device may include: a processor 1001, such as a central processing unit (CPU), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display), an input unit such as a keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a wireless fidelity (Wireless-Fidelity, WI-FI) interface). The memory 1005 may be a high-speed random access memory (Random Access Memory, RAM), or a stable non-volatile memory (Non-Volatile Memory, NVM), such as a disk storage. The memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0076] Those skilled in the art will understand that Figure 1 The structure shown in the figure does not constitute a limitation on the transformer test strategy generating device, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0077] like Figure 1 As shown, the memory 1005 as a computer-readable storage medium may include an operating system, a network communication module, a user interface module, and a transformer test strategy generation program.

[0078] exist Figure 1In the transformer test strategy generation device shown, the network interface 1004 is mainly used for data communication with the network server; the user interface 1003 is mainly used for data interaction with the user; the processor 1001 and the memory 1005 in the transformer test strategy generation device of the present invention can be set in the transformer test strategy generation device, and the transformer test strategy generation device calls the transformer test strategy generation program stored in the memory 1005 through the processor 1001, and executes the transformer test strategy generation method provided by the embodiment of the present invention.

[0079] The embodiment of the present invention provides a transformer test strategy generation method, referring to Figure 2 , Figure 2 It is a flowchart diagram of the first embodiment of the transformer test strategy generation method of the present invention.

[0080] In this embodiment, the transformer test strategy generation method includes the following steps:

[0081] Step S10: Obtain transformer information of the transformer to be tested and equipment parameters of a backup test equipment of the transformer to be tested.

[0082] It should be noted that this embodiment can be applied to equivalent parameter calculation, test equipment selection and test strategy generation before the partial discharge test of the inductive withstand voltage strip of a high-impedance transformer. By obtaining the transformer information of the transformer to be tested and the equipment parameters of the spare test equipment of the transformer to be tested, the magnetizing inductance characteristic parameters of the transformer to be tested under no-load state are determined according to the transformer information, and the transformer test equivalent reactance is determined based on the magnetizing inductance characteristic parameters. The total reactive power of the transformer to be tested is determined according to the transformer test equivalent reactance, and the compensation reactance value required for the transformer to be tested is determined based on the total reactive power. The target test equipment is selected from the spare test equipment according to the compensation reactance value and the equipment parameters, and the test strategy of the transformer to be tested is determined based on the target test equipment. The total reactive power that needs to be compensated during the partial discharge test of the inductive withstand voltage strip of the high-impedance transformer can be accurately calculated, and the test equipment such as the compensation reactance and the test power supply can be selected as needed to assist the test personnel in completing the preparation of the high-impedance transformer test plan.

[0083] It should be understood that the execution subject of this embodiment can be a computing service device with data processing, network communication and program running functions, such as a tablet computer, a personal computer, a mobile phone, etc., or a terminal electronic terminal device capable of realizing the above functions, etc. The following terminal device is taken as an example to illustrate this embodiment and the following embodiments.

[0084] It should be noted that the transformer to be tested may be a high-impedance transformer that needs to undergo a transformer induction withstand voltage band partial discharge test, such as a large-capacity oil-immersed power transformer, etc., which is not limited in this embodiment.

[0085] It should be noted that the transformer information may be the nameplate information and factory test parameters of the transformer to be tested. For example, the transformer information may include the connection group number, transformation ratio, rated current, per-unit no-load current, rated voltage, no-load loss, capacitance between windings and to ground, etc.

[0086] It should be noted that the backup test equipment may be a test equipment or device for performing a transformer induction withstand voltage band partial discharge test on the transformer to be tested. For example, the backup test equipment may include reactance equipment, a frequency conversion cabinet, a test power supply vehicle, cables, etc.

[0087] It should be noted that the above-mentioned equipment parameters may be the nameplate parameters of the standby test equipment. For example, the equipment parameters may include the reactance value, rated current, rated voltage and other parameters of the reactance equipment, the transformation ratio, voltage and load loss of each gear of the excitation transformer, the frequency converter cabinet including the adjustable frequency range, loss and rated output voltage, the cable diameter of the cable, and the power supply vehicle power and rated output voltage of the test power supply vehicle.

[0088] Step S20: determining the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, and determining the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters.

[0089] It should be noted that the magnetizing inductance characteristic parameter may be a parameter describing the magnetizing characteristics of the transformer under no-load condition. In some embodiments, the magnetizing inductance characteristic parameter may include magnetizing impedance, single-phase magnetizing resistance, single-phase magnetizing reactance, etc. The above transformer test equivalent reactance may be a reactance parameter obtained by representing the complex electromagnetic behavior of the transformer with an equivalent circuit model.

[0090] In some embodiments, when the terminal device performs a transformer test, the equivalent reactance parameters of the transformer can be calculated by measuring parameters such as the no-load loss, short-circuit loss, no-load current and short-circuit voltage of the transformer.

[0091] It should be noted that this embodiment fully considers the transformer excitation inductance in the process of calculating the equivalent test parameters, accurately analyzes the magnetization characteristics of the transformer under no-load state, avoids the deviation between the calculation result of the total reactive power that needs to be compensated and the actual value, and realizes the accurate selection of appropriate test equipment to ensure that the calculation result of the resonant frequency is consistent with the actual value.

[0092] Furthermore, in order to accurately analyze the magnetization characteristics under no-load state and ensure the accuracy of equivalent test parameter calculation, the above step S20 may include:

[0093] Step S201: determining a no-load current based on the transformer rated current and the no-load current per unit value.

[0094] It should be noted that the transformer information includes the low-voltage side rated current, the low-voltage side rated voltage, the rated frequency, the no-load loss parameters and the no-load current per unit value, and the magnetizing inductance characteristic parameters include the magnetizing impedance, the single-phase magnetizing resistance and the single-phase magnetizing reactance.

[0095] It can be understood that, in this embodiment, by calculating the no-load current, the core loss and magnetization characteristics of the transformer can be evaluated, thereby judging the health of the transformer. The no-load current is calculated with reference to the following formula:

[0096]

[0097] in, Indicates the no-load current, Indicates the rated current of the low voltage side, Indicates the per-unit value of no-load current.

[0098] Step S202: determining the excitation impedance according to the no-load current and the low-voltage side rated current.

[0099] It is understood that the terminal equipment can calculate the excitation impedance based on the rated voltage and no-load current of the transformer, referring to the following formula:

[0100]

[0101] in, represents the magnetizing impedance, Indicates the rated voltage of the low voltage side. Indicates no-load current.

[0102] Step S203: determining a single-phase excitation resistance based on the no-load current and the no-load loss parameter.

[0103] It is understandable that the terminal equipment can calculate the single-phase exciting resistance according to the no-load loss and no-load current, referring to the following formula:

[0104]

[0105] in, Represents the single-phase exciting resistance, Indicates no-load loss, Indicates no-load current.

[0106] Step S204: determining the single-phase excitation reactance according to the excitation impedance, the single-phase excitation resistance and the rated frequency.

[0107] It is understandable that the terminal device can determine the single-phase excitation reactance according to the excitation impedance, the single-phase excitation resistance and the rated frequency, referring to the following formula:

[0108]

[0109] in, represents the single-phase magnetizing reactance, Indicates the rated frequency, represents the magnetizing impedance, Represents the single-phase exciting resistance.

[0110] Step S205: Determine the transformer test equivalent reactance based on the single-phase excitation reactance.

[0111] It can be understood that, considering the triangle connection mode on the low-voltage side of the transformer, the single-phase excitation reactance connection is a series-parallel structure during the test, and the transformer test equivalent reactance is calculated according to the following formula:

[0112]

[0113] in, Indicates the transformer test equivalent reactance, Represents the single-phase magnetizing reactance.

[0114] Step S30: determining the total reactive power of the transformer to be tested according to the transformer test equivalent reactance.

[0115] It should be noted that the total reactive power can be the power that is exchanged back and forth with the power supply during the operation of the transformer under test due to the inductance characteristics of its windings and cores. This power does not consume energy in the transformer, but is the power required to establish and maintain the magnetic field in the inductor and capacitor elements.

[0116] In some embodiments, the terminal device can calculate the total reactive power of the transformer to be tested based on the test frequency, the pressure side test voltage, the transformer test equivalent reactance and the equivalent entrance capacitance before the inductive withstand voltage strip partial discharge test.

[0117] Furthermore, in order to accurately calculate the total reactive power and improve the accuracy of test parameter calculation, the above step S30 may include:

[0118] Step S301: obtaining the capacitance parameters of the high voltage winding to the low voltage winding and the ground, the capacitance parameters of the low voltage winding to the high voltage winding and the ground, and the capacitance parameters of the high and low voltage windings to the ground of the transformer to be tested according to the transformer information.

[0119] It should be noted that the capacitance parameters of the transformer's high-voltage winding to the low-voltage winding and ground, the capacitance parameters of the low-voltage winding to the high-voltage winding and ground, and the capacitance parameters of the high- and low-voltage windings to ground are parameters that describe the capacitance effects between transformer windings and between windings and ground.

[0120] Step S302: Determine the three-phase winding equivalent capacitance parameters based on the capacitance parameters of the high voltage winding to the low voltage winding and ground, the capacitance parameters of the low voltage winding to the high voltage winding and ground, and the capacitance parameters of the high and low voltage windings to ground.

[0121] It should be noted that the three-phase winding equivalent capacitance parameters may be winding equivalent capacitance parameters of each phase of the three-phase transformer. For example, the three-phase winding equivalent capacitance parameters may include A-phase winding equivalent capacitance, B-phase winding equivalent capacitance and C-phase winding equivalent capacitance.

[0122] It can be understood that in this embodiment, a set of equations can be established, according to the capacitance of the high voltage winding to the low voltage winding and the ground , low voltage winding to high voltage winding and ground capacitance , High and low voltage winding to ground capacitance Calculate the capacitance of the high voltage winding to the low voltage winding , High voltage winding to ground capacitance , low voltage winding to ground capacitance , refer to the following formula:

[0123]

[0124] In some embodiments, the A-phase winding, the B-phase winding and the C-phase winding are used as the three-phase winding, and the equivalent capacitance of the single-phase induction withstand voltage belt partial discharge test is calculated according to the following formula, and the equivalent capacitance of the A-phase winding is calculated with reference to the following formula:

[0125]

[0126] in, It represents the equivalent capacitance of phase A winding. Indicates the transformation ratio, Indicates the capacitance of the high voltage winding to the low voltage winding, Indicates the capacitance of the high voltage winding to ground, Represents the capacitance of the low voltage winding to ground.

[0127] Calculate the equivalent capacitance of phase B winding according to the following formula:

[0128]

[0129] in, represents the equivalent capacitance of phase B winding, Indicates the transformation ratio, Indicates the capacitance of the high voltage winding to the low voltage winding, Indicates the capacitance of the high voltage winding to ground, Represents the capacitance of the low voltage winding to ground.

[0130] Calculate the equivalent capacitance of phase C winding according to the following formula:

[0131]

[0132] in, represents the equivalent capacitance of the C-phase winding, Indicates the transformation ratio, Indicates the capacitance of the high voltage winding to the low voltage winding, Indicates the capacitance of the high voltage winding to ground, Represents the capacitance of the low voltage winding to ground.

[0133] Step S303: Determine the transformer test equivalent inlet capacitance parameters according to the three-phase winding equivalent capacitance parameters.

[0134] It should be noted that the transformer test equivalent input capacitance parameter can be equivalent to a single capacitance value after comprehensively considering the equivalent capacitance parameters of the three-phase winding of the transformer.

[0135] It can be understood that the transformer test equivalent inlet capacitance parameters are calculated according to the following formula:

[0136]

[0137] in, Indicates the transformer test equivalent input capacitance parameter, It represents the equivalent capacitance of phase A winding. represents the equivalent capacitance of phase B winding, Represents the equivalent capacitance of the C-phase winding.

[0138] Step S304: obtaining the test frequency and the pressure-side test voltage of the transformer to be tested.

[0139] In some embodiments, the test frequency in the partial discharge test of the induction withstand voltage belt may be greater than the rated frequency. For example, the operating frequency of the frequency converter cabinet is generally 30Hz-300Hz, and the test frequency of 100Hz-200Hz is an appropriate working state.

[0140] Step S305: Determine the total reactive power of the transformer to be tested based on the test frequency, the pressurized side test voltage, the transformer test equivalent inlet capacitance parameter and the transformer test equivalent reactance.

[0141] It is understood that the terminal equipment can calculate the total reactive power of the transformer to be tested based on the test frequency, the pressure side test voltage, the transformer test equivalent inlet capacitance parameters and the transformer test equivalent reactance, referring to the following formula:

[0142]

[0143] in, represents the total reactive power, represents the test frequency, Indicates the test voltage on the pressurized side. Indicates the transformer test equivalent input capacitance parameter, Indicates the transformer test equivalent reactance.

[0144] Step S40: Determine the compensating reactance value required for the transformer test based on the total reactive power.

[0145] It should be noted that the compensation reactance value can be the reactance value of the reactor connected for the purpose of improving the reactive power balance of the transformer, improving the power factor, suppressing harmonics, stabilizing the voltage, etc. The compensation reactance value can be provided by the compensation reactor in the standby test equipment.

[0146] It is understandable that the terminal equipment corrects and calculates the total reactive power through the high-impedance transformer test equivalent reactance, which can effectively avoid test failures caused by improper selection of compensation reactors, thereby accurately selecting suitable compensation reactors and avoiding inaccurate test results caused by improper selection of test equipment.

[0147] Furthermore, in order to accurately select a suitable reactance device, the above step S40 may include:

[0148] The compensating reactance value required for the transformer test is determined based on the total reactive power, the test frequency of the transformer to be tested, and the test voltage on the pressure side:

[0149]

[0150] Among them, L is the compensation reactance value, U is the test voltage on the pressurized side, f is the test frequency, Q all is the total reactive power.

[0151] It should be noted that the terminal equipment can determine, based on the principle of parallel resonance, that the inductive reactive power absorbed by the compensating reactance can compensate for the capacitive reactive power absorbed by the high impedance transformer under test. The above test frequency can be 100Hz-200Hz, which is an appropriate working state. The test frequency in the appropriate working state is used as the variable range, and the compensation reactance value range is calculated according to the above formula. The standby reactor reactance value is matched with the compensation reactance value range. For example, the closer the standby reactor reactance value is to the calculated value of the compensation reactance when the test frequency is 150Hz, the higher the priority.

[0152] Step S50: selecting a target test device from the backup test devices according to the compensation reactance value and the device parameters, and determining a test strategy for the transformer to be tested based on the target test device.

[0153] It should be noted that the target test equipment can be equipment that meets the test requirements in the spare test equipment, for example, selecting a reactance device that matches the compensation reactance value according to the compensation reactance value. The above test strategy can be a test plan preparation strategy. For example, the test strategy can include selecting appropriate test equipment, selecting test equipment parameters such as resonant compensation reactance, test power supply and cable, and excitation gear shift within a reasonable range, ensuring that the test equipment matches the on-site requirements of the transformer, and avoiding the situation where the test equipment does not meet the on-site requirements or far exceeds the requirements, resulting in a waste of resources.

[0154] It can be understood that this embodiment calculates the capacitive reactive power absorbed by the equivalent capacitance of the high-impedance transformer test and the inductive reactive power absorbed by the equivalent reactance of the high-impedance transformer test by using the factory parameters of the high-impedance transformer, and corrects the total reactive power by using the equivalent reactance of the high-impedance transformer test, which can effectively avoid test failures caused by improper selection of compensating reactance, effectively avoid situations where test requirements are not met due to improper selection of test equipment and unreasonable strategy formulation, and can largely ensure that the test projects are carried out on schedule and effectively reduce test costs.

[0155] This embodiment obtains transformer information of the transformer to be tested and equipment parameters of the spare test equipment of the transformer to be tested, determines the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, determines the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters, determines the total reactive power of the transformer to be tested according to the transformer test equivalent reactance, determines the compensation reactance value required for the transformer to be tested based on the total reactive power, selects a target test equipment from the spare test equipment according to the compensation reactance value and the equipment parameters, and determines the test strategy of the transformer to be tested based on the target test equipment; because this embodiment effectively avoids deviations in the calculation of the total reactive power result that needs to be compensated by analyzing the transformer magnetizing inductance, accurately calculates the compensation reactance value required for the test, thereby reasonably selecting the test equipment, greatly improving the rationality of the test, and ensuring that the transformer discharge test can effectively detect the discharge characteristics of the transformer, accurately discover potential defects of the equipment, and avoid subsequent operational safety problems.

[0156] refer to Figure 3 , Figure 3 It is a flowchart diagram of the second embodiment of the transformer test strategy generation method of the present invention.

[0157] Based on the above first embodiment, in this embodiment, the step S50 further includes:

[0158] Step S501: Determine the reactance value of each standby reactor in the standby test equipment based on the equipment parameters.

[0159] It should be noted that the target test equipment of this embodiment includes a target reactor. The above-mentioned standby test equipment may include a plurality of standby reactors with different or same reactance values, so as to provide selection for transformer tests with different compensation reactance requirements.

[0160] Step S502: Match the reactance value of each standby reactor with the compensation reactance value, and select candidate reactors from the standby reactors based on the matching result.

[0161] It can be understood that, in this embodiment, based on matching the reactance value of each standby reactor with the compensation reactance value, the reactor with matching reactance value among the standby reactors can be selected as a candidate reactor.

[0162] Step S503: Determine the reactance selection priority of each candidate reactor based on the reactance value of each candidate reactor.

[0163] It can be understood that if there are multiple candidate reactors whose reactance values ​​are successfully matched, the priority of each candidate reactor is calculated and the candidate reactor with the highest priority is selected as the target reactor.

[0164] Step S504: Select a target reactor from the candidate reactors according to the reactor selection priority.

[0165] It is understandable that, in this embodiment, the priority of the candidate reactor can be determined based on the test frequency, and the candidate reactor whose reactance value is closer to the calculated value of the compensation reactance at the test frequency is used as the target reactor. For example, the candidate reactor whose reactance value is closer to the calculated value of the compensation reactance when the test frequency is 150 Hz is used as the target reactor.

[0166] Step S505: Determine the high-voltage side voltage of the transformer to be tested when it is excited based on the transformer information.

[0167] It should be noted that the high-voltage side voltage during excitation refers to the voltage applied to the high-voltage side of the transformer during the induction withstand voltage test or partial discharge test of the transformer. This voltage is usually higher than the rated voltage of the transformer. The purpose is to simulate the overvoltage conditions that the transformer may encounter during operation and to test the insulation strength and stability of the transformer.

[0168] Step S506: Determine the maximum voltage to be measured when the transformer to be tested is excited according to the high-voltage side voltage during the excitation.

[0169] It is understood that the maximum voltage measured during excitation is calculated by referring to the following formula:

[0170]

[0171] in, It indicates the highest voltage measured when the voltage is increased during excitation. Indicates the high-voltage side voltage during excitation.

[0172] Step S507: Determine the excitation shift position based on the maximum voltage measured during the excitation.

[0173] It is understandable that in this embodiment, the excitation variable gear position selection can be performed according to the maximum voltage measured during the excitation, and the rated output voltage of the selected gear position is required to be higher than the maximum voltage measured during the excitation. Further, considering that the output voltage of the frequency converter cabinet is the low-voltage side voltage of the excitation variable, when the frequency converter cabinet outputs the rated voltage, the closer the output voltage of the excitation variable is to the maximum voltage measured during the excitation, the higher the priority.

[0174] Step S508: determining a test strategy for the transformer to be tested according to the excitation gear position and the target reactor.

[0175] It can be understood that this embodiment effectively avoids test failures caused by improper selection of compensating reactors, and at the same time analyzes the selection of excitation gears to ensure that appropriate compensating reactors and excitation gears are selected in the test strategy, effectively avoiding the situation where test requirements are not met due to improper selection of such test equipment.

[0176] Furthermore, in order to accurately select a suitable power supply device and ensure the power supply stability of the test power supply, the above step S508 may include:

[0177] Step S518: Determine the no-load loss parameter under the excitation voltage according to the rated frequency, test frequency, no-load loss parameter, low-voltage side rated voltage and the maximum voltage measured during excitation of the transformer to be tested:

[0178]

[0179] in, is the no-load loss parameter under the excitation voltage, is the rated frequency, is the test frequency, is the no-load loss parameter, is the rated voltage of the low voltage side, The highest voltage is measured when the voltage is applied during excitation;

[0180] Step S528: Determine the target active power required during the test of the transformer under test based on the no-load loss parameter, the excitation transformer loss parameter and the frequency converter cabinet loss parameter under the excitation voltage:

[0181]

[0182] in, is the target active power, is the no-load loss parameter under the excitation voltage, is the excitation transformer loss parameter, is the loss parameter of the frequency converter cabinet;

[0183] Step S538: determining the power parameters of each backup power supply device in the backup test device based on the device parameters;

[0184] Step S548: matching the power parameters of each backup power supply device with the target active power, and selecting the target power supply device from the backup power supply devices based on the matching result;

[0185] Step S558: Determine a test strategy for the transformer to be tested according to the target power supply device, the excitation gear position and the target reactor.

[0186] It should be noted that the target test equipment also includes a target power supply device. The backup power supply device can be a power supply device such as a power supply vehicle. The terminal device can analyze the power parameters of the backup power supply device to select a target power supply device that can provide the target active power, thereby ensuring the stability of the test power supply and avoiding the problem of insufficient test power supply and failure to stimulate.

[0187] It should be noted that the no-load loss of the high impedance transformer mainly includes hysteresis loss and eddy current loss.

[0188] In some embodiments, the terminal device may require the power of the test power supply vehicle to be greater than the maximum active power required during the test. For example, the greater the power of the power supply device, the higher the selection priority.

[0189] Furthermore, in order to accurately select a suitable cable and ensure the rationality of the test strategy, the above step S558 may include:

[0190] Determine the maximum output current of the target power device based on the rated output voltage of the target power device:

[0191]

[0192] in, is the maximum output current, is the rated output voltage, is the no-load loss parameter under the excitation voltage;

[0193] Determine the cable diameter threshold according to the maximum output current and the preset line current density:

[0194]

[0195] in, is the cable diameter threshold, is the maximum output current, is the preset line current density;

[0196] Screening out a target cable device from the backup test equipment based on the cable diameter threshold;

[0197] A test strategy for the transformer to be tested is determined according to the target cable equipment, the target power supply equipment, the excitation gear position and the target reactor.

[0198] It should be noted that the target test equipment also includes target cable equipment. The cable equipment may be a cable connected to the power supply equipment.

[0199] It is understandable that this embodiment can select a suitable target cable device based on the cable diameter, for example, requiring the test cable diameter to be larger than the minimum cable diameter required. Furthermore, the larger the cable diameter, the higher the priority, thereby avoiding the problem of severe temperature rise caused by the low test cable diameter.

[0200] It should be understood that the prior art does not perform calculations and analysis on the selection of test equipment such as test power supply and cable, excitation gear shift, etc., which may easily lead to situations such as insufficient power of the test power supply and failure to excite, serious temperature rise of the test cable diameter, and inability to pressurize to the test voltage due to a relatively small excitation voltage. This embodiment can effectively avoid test failures caused by improper selection of compensation reactors by selecting appropriate test power supply, compensation reactor, excitation gear shift, and cable, and at the same time supplements the selection of test equipment such as excitation gear shift, test power supply vehicle, and cable diameter, effectively avoiding the situation where test requirements are not met due to improper selection of such test equipment, and can largely ensure that the test project is carried out on schedule.

[0201] In some embodiments, reference Figure 4 , Figure 4 A principle block diagram is developed for the test strategy. By obtaining the test equipment information (i.e., the transformer information of the transformer to be tested, which may include group number, excitation ratio, rated current, rated voltage and no-load loss, etc.) and the test equipment information (i.e., the equipment parameters of the standby test equipment, which may include the compensation reactance value of each reactor, excitation gear parameters, frequency converter cabinet parameters, test power supply vehicle parameters and cable parameters, etc.), the equivalent inlet capacitance and equivalent reactance are calculated based on the test equipment information and the test equipment information. The total reactive power is calculated based on the equivalent inlet capacitance and the equivalent reactance. The compensating reactor is selected according to the total reactive power. The excitation gear, test power supply vehicle and cable are selected according to the test equipment information and the test equipment information, so as to develop a suitable test strategy based on the selection results of various test equipment.

[0202] This embodiment determines the reactance value of each standby reactor in the standby test equipment based on the equipment parameters; matches the reactance value of each standby reactor with the compensation reactance value, and selects candidate reactors from the standby reactors based on the matching results; determines the reactance selection priority of each candidate reactor based on the reactance value of each candidate reactor; selects a target reactor from the candidate reactors according to the reactance selection priority; determines the high-voltage side voltage of the transformer to be tested when it is excited based on the transformer information; determines the maximum voltage measured by pressurization when the transformer to be tested is excited based on the high-voltage side voltage when it is excited; determines the excitation gear position based on the maximum voltage measured by pressurization when it is excited; determines the test strategy of the transformer to be tested based on the excitation gear position and the target reactor, effectively avoiding test failure caused by improper selection of compensation reactors, and at the same time analyzes the selection of excitation gear position to ensure that appropriate compensation reactors and excitation gear positions are selected in the test strategy, effectively avoiding the situation where test requirements are not met due to improper selection of such test equipment.

[0203] In addition, an embodiment of the present invention further proposes a computer-readable storage medium, on which a transformer test strategy generation program is stored. When the transformer test strategy generation program is executed by a processor, the steps of the transformer test strategy generation method described above are implemented.

[0204] The computer-readable storage medium provided in the present application may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination of the above. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM: Random Access Memory), a read-only memory (ROM: Read Only Memory), an erasable programmable read-only memory (EPROM: Erasable Programmable Read Only Memory or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM: CD-Read Only Memory), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program, which may be used by or in combination with an instruction execution system, system or device. The program code contained on the computer-readable storage medium may be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency: Radio Frequency), etc., or any suitable combination of the above.

[0205] The computer-readable storage medium may be included in the transformer test strategy generation device; or may exist independently without being assembled into the transformer test strategy generation device.

[0206] In addition, an embodiment of the present invention further provides a computer program product, including a transformer test strategy generation program, which implements the steps of the transformer test strategy generation method as described above when executed by a processor.

[0207] The specific implementation manner of the computer program product of the present invention is basically the same as the embodiments of the above-mentioned transformer test strategy generation method, and will not be repeated here.

[0208] Reference Figure 5 Figure 5 This is a structural block diagram of the first embodiment of the transformer test strategy generating device of the present invention.

[0209] like Figure 5 As shown, the transformer test strategy generation device proposed in the embodiment of the present invention includes:

[0210] The information acquisition module 10 is used to acquire transformer information of the transformer to be tested and equipment parameters of the standby test equipment of the transformer to be tested;

[0211] A no-load excitation analysis module 20, used to determine the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, and determine the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters;

[0212] A reactive power calculation module 30, used to determine the total reactive power of the transformer to be tested according to the transformer test equivalent reactance;

[0213] A compensation reactance calculation module 40, configured to determine a compensation reactance value required for the transformer under test based on the total reactive power;

[0214] The test strategy generating module 50 is used to select a target test device from the backup test devices according to the compensation reactance value and the device parameters, and determine the test strategy of the transformer to be tested based on the target test device.

[0215] This embodiment obtains transformer information of the transformer to be tested and equipment parameters of the spare test equipment of the transformer to be tested, determines the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, determines the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters, determines the total reactive power of the transformer to be tested according to the transformer test equivalent reactance, determines the compensation reactance value required for the transformer to be tested based on the total reactive power, selects a target test equipment from the spare test equipment according to the compensation reactance value and the equipment parameters, and determines the test strategy of the transformer to be tested based on the target test equipment; because this embodiment effectively avoids deviations in the calculation of the total reactive power result that needs to be compensated by analyzing the transformer magnetizing inductance, accurately calculates the compensation reactance value required for the test, thereby reasonably selecting the test equipment, greatly improving the rationality of the test, and ensuring that the transformer discharge test can effectively detect the discharge characteristics of the transformer, accurately discover potential defects of the equipment, and avoid subsequent operational safety problems.

[0216] The transformer test strategy generation device provided by the present application adopts the transformer test strategy generation method in the above embodiment, which can solve the technical problem of transformer test strategy generation. Compared with the prior art, the beneficial effects of the transformer test strategy generation device provided by the present application are the same as the beneficial effects of the transformer test strategy generation method provided by the above embodiment, and other technical features in the transformer test strategy generation device are the same as the features disclosed in the above embodiment method, which will not be repeated here.

[0217] It should be understood that the above is only an example and does not constitute any limitation on the technical solution of the present invention. In specific applications, technicians in this field can make settings as needed, and the present invention does not limit this.

[0218] It should be noted that the workflow described above is merely illustrative and does not limit the scope of protection of the present invention. In practical applications, technicians in this field can select part or all of them according to actual needs to achieve the purpose of the present embodiment, and no limitation is made here.

[0219] In addition, for technical details not fully described in this embodiment, reference can be made to the transformer test strategy generation method provided in any embodiment of the present invention, and will not be repeated here.

[0220] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or system. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or system including the element.

[0221] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0222] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as a read-only memory / random access memory, a magnetic disk, or an optical disk), and includes a number of instructions for enabling a terminal device (which can be a mobile phone, a computer, a server, an air conditioner, or a network device, etc.) to execute the methods described in each embodiment of the present invention.

[0223] The above are only preferred embodiments of the present invention, and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A transformer test strategy generation method, characterized in that: The transformer test strategy generation method comprises: Obtaining transformer information of the transformer to be tested and equipment parameters of a backup test equipment of the transformer to be tested; Determine the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, and determine the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters, wherein the magnetizing inductance characteristic parameters include magnetizing impedance, single-phase magnetizing resistance and single-phase magnetizing reactance; Determine the total reactive power of the transformer to be tested according to the transformer test equivalent reactance; Determine the compensating reactance value required for the transformer test based on the total reactive power; Selecting a target test device from the backup test devices according to the compensation reactance value and the device parameters, and determining a test strategy for the transformer to be tested based on the target test device; Determining the total reactive power of the transformer to be tested according to the transformer test equivalent reactance includes: According to the transformer information, the capacitance parameters of the high-voltage winding to the low-voltage winding and the ground, the capacitance parameters of the low-voltage winding to the high-voltage winding and the ground, and the capacitance parameters of the high-voltage and low-voltage windings to the ground of the transformer to be tested are obtained; Determine the three-phase winding equivalent capacitance parameters based on the capacitance parameters of the high voltage winding to the low voltage winding and the ground, the capacitance parameters of the low voltage winding to the high voltage winding and the ground, and the capacitance parameters of the high and low voltage windings to the ground; Determine the transformer test equivalent inlet capacitance parameter according to the three-phase winding equivalent capacitance parameter; Obtaining the test frequency and the pressure side test voltage of the transformer to be tested; The total reactive power of the transformer to be tested is determined based on the test frequency, the pressurized side test voltage, the transformer test equivalent inlet capacitance parameter and the transformer test equivalent reactance, referring to the following formula: in, represents the total reactive power, represents the test frequency, Indicates the test voltage on the pressurized side. Indicates the transformer test equivalent input capacitance parameter, Indicates the transformer test equivalent reactance.

2. The transformer test strategy generation method according to claim 1, characterized in that: The transformer information includes low-voltage side rated current, low-voltage side rated voltage, rated frequency, no-load loss parameters and no-load current per unit value; The step of determining the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, and determining the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters, comprises: Determining a no-load current based on the transformer rated current and the no-load current per unit value; Determine the excitation impedance according to the no-load current and the rated current of the low-voltage side; Determine a single-phase exciting resistance based on the no-load current and the no-load loss parameter; Determine the single-phase excitation reactance according to the excitation impedance, the single-phase excitation resistance and the rated frequency; The transformer test equivalent reactance is determined based on the single-phase excitation reactance.

3. The transformer test strategy generation method according to claim 2, characterized in that: The step of determining the compensating reactance value required for the transformer test based on the total reactive power comprises: The compensating reactance value required for the transformer test is determined based on the total reactive power, the test frequency of the transformer to be tested, and the test voltage on the pressure side: Among them, L is the compensation reactance value, U is the test voltage on the pressurized side, f is the test frequency, Q all is the total reactive power.

4. The transformer test strategy generation method according to any one of claims 1 to 3, characterized in that: The target test equipment includes a target reactor; the target test equipment is selected from the standby test equipment according to the compensation reactance value and the equipment parameter, and a test strategy of the transformer to be tested is determined based on the target test equipment, including: Determine the reactance value of each standby reactor in the standby test equipment based on the equipment parameters; Matching the reactance value of each standby reactor with the compensation reactance value, and selecting candidate reactors from the standby reactors based on the matching result; Determining a reactance selection priority of each candidate reactor based on the reactance value of each candidate reactor; selecting a target reactor from the candidate reactors according to the reactor selection priority; Determine the high-voltage side voltage of the transformer to be tested when it is excited based on the transformer information; Determine the maximum voltage of the transformer to be tested when it is excited according to the high-voltage side voltage during the excitation; Determine the excitation shift position based on the maximum voltage measured during the excitation; A test strategy for the transformer to be tested is determined according to the excitation gear position and the target reactor.

5. The transformer test strategy generation method according to claim 4, characterized in that: The target test equipment also includes a target power supply device; the test strategy for determining the transformer to be tested according to the excitation gear position and the target reactor includes: Determine the no-load loss parameter under the excitation voltage according to the rated frequency, test frequency, no-load loss parameter, low-voltage side rated voltage of the transformer to be tested, and the maximum voltage measured during excitation: in, is the no-load loss parameter under the excitation voltage, is the rated frequency, is the test frequency, is the no-load loss parameter, is the rated voltage of the low voltage side, The highest voltage is measured when the voltage is applied during excitation; The target active power required during the test of the transformer to be tested is determined based on the no-load loss parameter, the excitation transformer loss parameter and the frequency converter cabinet loss parameter under the excitation voltage: in, is the target active power, is the no-load loss parameter under the excitation voltage, is the excitation transformer loss parameter, is the loss parameter of the frequency converter cabinet; Determine the power parameters of each backup power supply device in the backup test device based on the device parameters; Matching the power parameters of each backup power supply device with the target active power, and selecting the target power supply device from the backup power supply devices based on the matching result; A test strategy for the transformer to be tested is determined according to the target power supply device, the excitation gear position and the target reactor.

6. The transformer test strategy generation method according to claim 5, characterized in that: The target test equipment also includes a target cable device; the test strategy for determining the transformer to be tested according to the target power supply equipment, the excitation gear position and the target reactor includes: Determine the maximum output current of the target power device based on the rated output voltage of the target power device: in, is the maximum output current, is the rated output voltage, is the no-load loss parameter under the excitation voltage; Determine the cable diameter threshold according to the maximum output current and the preset line current density: in, is the cable diameter threshold, is the maximum output current, is the preset line current density; Screening out a target cable device from the backup test equipment based on the cable diameter threshold; A test strategy for the transformer to be tested is determined according to the target cable equipment, the target power supply equipment, the excitation gear position and the target reactor.

7. A transformer test strategy generation device, characterized in that: The transformer test strategy generating device comprises: An information acquisition module, used to acquire transformer information of the transformer to be tested and equipment parameters of a backup test equipment of the transformer to be tested; A no-load excitation analysis module, used to determine the magnetizing inductance characteristic parameters of the transformer to be tested in a no-load state according to the transformer information, and determine the transformer test equivalent reactance based on the magnetizing inductance characteristic parameters, wherein the magnetizing inductance characteristic parameters include magnetizing impedance, single-phase magnetizing resistance and single-phase magnetizing reactance; A reactive power calculation module, used to determine the total reactive power of the transformer to be tested according to the transformer test equivalent reactance; A compensation reactance calculation module, used to determine the compensation reactance value required for the transformer test based on the total reactive power; A test strategy generating module, configured to select a target test device from the backup test devices according to the compensation reactance value and the device parameters, and determine a test strategy for the transformer to be tested based on the target test device; The reactive power calculation module is also used to obtain the capacitance parameters of the high-voltage winding to the low-voltage winding and the ground, the capacitance parameters of the low-voltage winding to the high-voltage winding and the ground, and the capacitance parameters of the high- and low-voltage windings to the ground of the transformer to be tested according to the transformer information; determine the three-phase winding equivalent capacitance parameters based on the capacitance parameters of the high-voltage winding to the low-voltage winding and the ground, the capacitance parameters of the low-voltage winding to the high-voltage winding and the ground, and the capacitance parameters of the high- and low-voltage windings to the ground; determine the transformer test equivalent inlet capacitance parameters according to the three-phase winding equivalent capacitance parameters; obtain the test frequency and the pressurized side test voltage of the transformer to be tested; determine the total reactive power of the transformer to be tested based on the test frequency, the pressurized side test voltage, the transformer test equivalent inlet capacitance parameters, and the transformer test equivalent reactance, referring to the following formula: in, represents the total reactive power, represents the test frequency, Indicates the test voltage on the pressurized side. Indicates the transformer test equivalent input capacitance parameter, Indicates the transformer test equivalent reactance.

8. A transformer test strategy generation device, characterized in that: The transformer test strategy generation device comprises: a memory, a processor, and a transformer test strategy generation program stored in the memory and executable on the processor, wherein the transformer test strategy generation program is configured to implement the transformer test strategy generation method according to any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a transformer test strategy generation program, and when the transformer test strategy generation program is executed by a processor, the transformer test strategy generation method according to any one of claims 1 to 6 is implemented.

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