Photoelectric load optical axis and IMU deviation calibration device and calibration and use method thereof

Abstract

A device for calibrating the optical axis of an optoelectronic load and an IMU deviation and a calibration and use method thereof, which relates to the technical field of optical correction devices, solves the problem that the conventional device for calibrating the optical axis of an optoelectronic load and an IMU deviation has low precision and cannot be installed and adjusted in batches. The device comprises a collimator, which is provided with a detector and a light source inside; a reflector I, which corresponds to a first opening; a pentaprism; a semi-transparent and semi-reflective mirror II, which corresponds to a second opening; a reflector II; a reflector III, which corresponds to a third opening; an IMU, on the surface of which a small reflector I and a small reflector II are attached; the light emitted by the collimator is divided into two beams after passing through the reflector I, the pentaprism, and the semi-transparent and semi-reflective mirror II, one beam of light is emitted from the second opening to the small reflector I, and is reflected by the small reflector I and returned along the original optical path; the other beam of light is emitted from the third opening to the small reflector II through the reflector II and the reflector III, and is reflected by the small reflector II and returned along the original optical path, and the two beams of returned light are focused at the center of the detector.

Description

Technical Field

[0001] The present invention relates to the field of optical correction devices, and in particular to a device for calibrating the deviation between an optical axis of a photoelectric load and an IMU, and a calibration and use method thereof. Background Art

[0002] In modern precision measurement and positioning systems, the inertial measurement unit (IMU) is one of the most important core components and is widely used in various high-precision navigation, control and attitude estimation tasks, such as unmanned systems, spacecraft, robots and self-driving cars. The main function of the IMU is to measure the angular velocity and acceleration of an object through its built-in rate gyroscope and accelerometer. By fusing these data, the attitude, velocity and position information of the object can be obtained. Therefore, in order to improve the measurement accuracy of the IMU, it must be accurately calibrated during the installation phase to ensure that each sensor of the IMU works in the correct spatial position and direction. Among them, the optical axis calibration of the photoelectric load helps to ensure the accuracy of the IMU measurement. By determining the physical relationship between the rotation axis of the gyroscope and the measurement axis of the accelerometer in the IMU, the navigation and control accuracy of the entire system can be improved.

[0003] Traditional optoelectronic load optical axis and IMU deviation calibration devices usually rely on the collaborative work of multiple high-precision devices, such as laser trackers, high-precision turntables, angle measuring instruments, etc., but each device needs to be adjusted and tested individually according to strict procedures to ensure its measurement accuracy and accurate operation, resulting in a high degree of manual intervention in each installation and adjustment link. Manual operation is often limited by the operator's technical level and experience. Any slight mistake may lead to a reduction in calibration accuracy, which in turn affects the performance of the entire system and cannot achieve fast and efficient mass production. At the same time, these high-end instruments are usually expensive, not only requiring a large amount of capital investment, but also requiring very high operation and maintenance requirements for the equipment, which limits its scope of application and popularity. Therefore, the development of a new optoelectronic load optical axis and IMU deviation calibration device that can improve calibration accuracy and is suitable for batch installation and adjustment has become the main direction of technological development. Summary of the invention

[0004] In order to solve the problem that the traditional photoelectric load optical axis and IMU deviation calibration device has low precision and cannot be installed and adjusted in batches, the present invention proposes a photoelectric load optical axis and IMU deviation calibration device and its calibration and use method. The technical solution of the present invention is as follows:

[0005] A device for calibrating the deviation between the optical axis of a photoelectric load and an IMU comprises:

[0006] A collimator, wherein a parabolic mirror, a semi-transparent and semi-reflective mirror I, a detector and a light source are arranged inside the collimator; the detector is located at the focus of the collimator; the semi-transparent and semi-reflective mirror I is located between the detector and the light source; the light emitted by the light source is reflected by the semi-transparent and semi-reflective mirror I onto the parabolic mirror, and becomes parallel light after being collimated and emitted outward, while the parallel light returned from the outside is focused on the detector through the semi-transparent and semi-reflective mirror I;

[0007] A lens barrel I, which is installed at the entrance of the collimator through a connecting piece, and a reflector I is installed inside one end of the lens barrel I and is provided with a first opening, and the first opening is used to project the light emitted from the collimator through the lens barrel I onto the reflector I;

[0008] A lens barrel II, one end of which is mounted on the end of the lens barrel I away from the reflector I, a pentaprism, a semi-transparent and semi-reflective mirror II and a reflector II are mounted inside the lens barrel II, the pentaprism is mounted on the end close to the lens barrel I, and the reflector II is mounted on the end away from the lens barrel I; the lens barrel II is provided with a second opening, and the second opening is used to emit the light reflected by the semi-transparent and semi-reflective mirror II out of the lens barrel II;

[0009] A lens barrel III, one end of which is mounted on an end of the lens barrel II close to the reflector II, and the other end of the lens barrel III is internally mounted with the reflector III; the lens barrel III is provided with a third opening, and the third opening is used to emit the light reflected by the reflector III out of the lens barrel III;

[0010] It also includes an IMU, which is mounted on the device to be calibrated, and a small reflector I and a small reflector II are respectively attached to the upper surface and the side surface of the IMU;

[0011] It also includes a plurality of adjustment parts, which are respectively arranged between the reflector I, the pentaprism, the semi-transparent mirror I, the semi-transparent mirror II, the reflector II, the reflector III and the corresponding lens barrels, and the angles of the reflector I, the pentaprism, the semi-transparent mirror I, the semi-transparent mirror II, the reflector II and the reflector III are controlled by grinding the adjustment parts;

[0012] The light emitted from the collimator 1 passes through the reflector I, the pentaprism and the semi-transparent and semi-reflective mirror II and is divided into two beams of light, one of which is emitted from the second opening to the small reflector I, and is reflected by the small reflector I, and the light returns along the original light path; the other beam of light passes through the reflector II and the reflector III in sequence, and is emitted from the third opening to the small reflector II, and is reflected by the small reflector II, and the light returns along the original light path, and the two beams of returned light are focused on the center position of the detector 2;

[0013] Further, the light source includes a lighting bulb and frosted glass;

[0014] Further, the adjustment member includes a first gasket, a second gasket, a third gasket, a fourth gasket and a fifth gasket, wherein the first gasket is arranged between the reflector I and the lens barrel I; the second gasket is arranged between the pentaprism and the lens barrel II; the third gasket is arranged between the semi-transparent and semi-reflective mirror II and the lens barrel II; the fourth gasket is arranged between the reflector II and the lens barrel II; the fifth gasket is arranged between the reflector III and the lens barrel III;

[0015] Furthermore, it also includes a plurality of lens fixing devices, which are used to fix the reflector I, the pentaprism, the semi-transparent and semi-reflective mirror I, the semi-transparent and semi-reflective mirror II, the reflector II and the reflector III on the corresponding lens barrels respectively; the lens fixing device includes a lens frame and a lens seat, and the lens frame and the lens seat are detachably connected;

[0016] Further, the shapes of the reflector I, pentaprism, semi-transparent mirror I, semi-transparent mirror II, reflector II and reflector III include rhombus, square, triangle or circle; the mirror frame has an inward groove structure, and the shapes of the grooves of the plurality of mirror frames respectively match the outer edge shapes of the correspondingly installed reflector I, pentaprism, semi-transparent mirror I, semi-transparent mirror II, reflector II and reflector III, so that they are fixed in the mirror frame;

[0017] Furthermore, the mirror base is a hollow tripod structure, forming a support base and being light-transmissive; the mirror base is provided with two raised snap-fit ​​parts, and the mirror frame is provided with two holes whose positions and shapes match those of the snap-fit ​​parts on the mirror base, and the mirror frame is fixed to the mirror base via the snap-fit ​​parts.

[0018] A calibration method for the above-mentioned photoelectric load optical axis and IMU deviation calibration device, wherein the calibration steps are as follows:

[0019] S1: Place a large-diameter plane reflector in front of the lens barrel II, place an autocollimator behind the lens barrel II, aim the autocollimator at the pentaprism, make the light emitted by the autocollimator pass through the pentaprism and hit the large-diameter plane reflector, grind the adjustment parts between the pentaprism and the lens barrel II, and then adjust the angle of the pentaprism, so that the light returns from the large-diameter plane reflector to form autocollimation, and complete the installation and adjustment of the pentaprism;

[0020] S2: fix the positions of the autocollimator, lens barrel II and large-aperture plane reflector described in S1, block the space between the pentaprism and the large-aperture plane reflector, make the light emitted by the autocollimator pass through the pentaprism and the semi-transparent and semi-reflective mirror II and reflect onto the large-aperture plane reflector, grind the adjustment piece between the semi-transparent and semi-reflective mirror II and the lens barrel II and adjust the angle of the semi-transparent and semi-reflective mirror II, make the light return from the large-aperture plane reflector to form autocollimation, and complete the installation and adjustment of the semi-transparent and semi-reflective mirror II;

[0021] S3: Continue to block the area between the semi-transparent and semi-reflective mirror II and the large-aperture plane reflector, and block the second opening, so that the light emitted by the autocollimator is reflected by the pentaprism, the semi-transparent and semi-reflective mirror II, and the reflector II to the large-aperture plane reflector, and the angle of the reflector II is adjusted by grinding the adjustment piece between the reflector II and the lens barrel II, so that the light returns from the large-aperture plane reflector to form autocollimation, and the installation and adjustment of the reflector II is completed;

[0022] S4: Remove the large-aperture plane reflector so that the light emitted by the autocollimator forms two light paths after passing through the pentaprism. One light path is that the light passes through the reflector I along the lens barrel I and is reflected onto the parallel light tube; the other light path is that the light passes through the semi-transparent and semi-reflective mirror II, the reflector II and the reflector III in sequence, and is emitted from the third opening to the parallel light tube. By grinding the adjustment parts between the reflector I and the lens barrel I and the adjustment parts between the reflector III and the lens barrel III, the angles of the reflector I and the reflector III are adjusted so that the two beams of light are focused on the center of the phase plane of the detector, and the installation and adjustment of this device is completed.

[0023] A method for using the above-mentioned photoelectric load optical axis and IMU deviation calibration device comprises the following steps:

[0024] P1: Install one side of the IMU on the device to be calibrated, and attach small reflector I and small reflector II to the upper surface of the IMU and the side surface away from the device to be calibrated respectively;

[0025] P2: Place the device to be calibrated in front of the collimator and adjust the device to be calibrated so that the parallel light emitted by the collimator is incident on the center of the detector of the device to be calibrated;

[0026] P3: The light emitted by the collimator passes through the lens barrel I, the reflector I in the lens barrel II, the pentaprism and the semi-transparent and semi-reflective mirror II in sequence, and is divided into two beams of light, one of which is emitted from the second opening to the small reflector I, and then the beam of light returns along the original optical path; at the same time, the other beam of light passes through the reflector II and the reflector III in sequence, and is emitted from the third opening to the small reflector II, and then the beam of light returns along the original optical path;

[0027] P4: By adjusting the position of the IMU, the two beams of returned light are focused on the center of the detector, thus completing the calibration of the consistency between the IMU installation reference and the optical axis;

[0028] Furthermore, the small reflector I monitors the misalignment of the IMU around the Z axis, where the Z axis is parallel to the optical axis; and the small reflector II monitors the misalignment of the IMU around the X axis and the Y axis.

[0029] Compared with the prior art, the present invention solves the problem that the traditional photoelectric load optical axis and IMU deviation calibration device has low precision and cannot be installed and adjusted in batches. The specific beneficial effects are:

[0030] 1. High-precision calibration: The optical axis of the photoelectric load and the IMU deviation calibration device provided by the present invention can realize the calibration of the angles of the optical axis of each direction of the photoelectric load components, and then accurately adjust the position of the IMU to avoid inaccurate measurements caused by coordinate accumulation or equipment deviation. This high-precision calibration method not only effectively reduces the angular deviation that may occur between the IMU and the optical axis of the photoelectric load, but also further improves the measurement accuracy and reliability of the entire system, providing more stable data support for precision positioning and control systems.

[0031] 2. Real-time correction of deviation: The photoelectric load optical axis and IMU deviation calibration device provided by the present invention can observe the deviation between the three mounting surfaces of the IMU and the photoelectric load optical axis at any time during use. When the deviation occurs, the two beams of light reflected by the two small reflectors attached to the upper and side surfaces of the IMU cannot be focused on the center of the detector. At this time, the position adjustment of the IMU can be corrected immediately. This real-time correction function greatly improves the flexibility and accuracy of the installation process, and avoids the accuracy loss caused by operation delays or error accumulation that may occur in traditional methods. This not only improves the correction accuracy, but also ensures the stability and accuracy reliability of the device after long-term use.

[0032] 3. Suitable for batch installation: Traditional calibration methods usually require each device to be adjusted and calibrated separately, which is not only time-consuming, but also easily leads to reduced calibration accuracy due to human factors. The optoelectronic load optical axis and IMU deviation calibration device provided by the present invention only needs to be accurately installed once to ensure the accuracy consistency between the IMU and the optical system of all devices. This batch calibration method greatly improves production efficiency and product consistency, reduces labor costs and the difficulty of equipment debugging, improves work efficiency, and can ensure consistency and accuracy in mass production.

[0033] 4. Solve the installation and adjustment problem: The photoelectric load optical axis and IMU deviation calibration device provided by the present invention adopts a simple structural design, and the usage is easy to understand. The structural design of the device reduces the steps and operating errors during debugging, making the calibration process more efficient and reliable. In addition, the calibration device of the present invention reduces costs and is suitable for a wider range of application scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 This is a schematic diagram of the distribution of the optical axis of the photoelectric load and the IMU deviation calibration device;

[0035] Figure 2 is a schematic diagram of a lens fixing device;

[0036] Figure 3 This is a schematic diagram of the installation of the mirror base and the mirror barrel;

[0037] Figure 4This is the calibration principle diagram of the photoelectric load optical axis and IMU deviation calibration device;

[0038] Figure 5 Schematic diagram of the coordinate distribution of IMU;

[0039] Among them: 1. collimator; 101. parabolic mirror; 102. semi-transparent and semi-reflective mirror I; 2. detector; 3. light source; 4. lens tube I; 5. lens tube II; 6. lens tube III; 7. reflector I; 701. lens frame; 702. lens base; 711. first gasket; 8. pentaprism; 811. second gasket; 9. semi-transparent and semi-reflective mirror II; 911. third gasket; 10. reflector II; 1011. fourth gasket; 11. reflector III; 1111. fifth gasket; 12. equipment to be calibrated; 13. IMU; 1301. small reflector I; 1302. small reflector II; 14. connector; 15. autocollimator; 16. large-aperture plane reflector. DETAILED DESCRIPTION

[0040] In order to make the technical solution of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the specification of the present invention. It should be noted that the following embodiments are only used to better understand the technical solution of the present invention and should not be understood as a limitation to the present invention.

[0041] Example 1.

[0042] This embodiment provides a device for calibrating the optical axis of an optoelectronic load and an IMU deviation, and its structure is as follows: Figure 1 and Figure 3-5As shown, it includes: a collimator 1, which is provided with a parabolic mirror 101, a semi-transparent and semi-reflective mirror I 102, a detector 2 and a light source 3; the detector 2 is located at the focus of the collimator 1; the semi-transparent and semi-reflective mirror I 102 is located between the detector 2 and the light source 3; the light emitted by the light source 3 is reflected by the semi-transparent and semi-reflective mirror I 102 to the parabolic mirror 101, and becomes parallel light after collimation and is emitted outward, and the parallel light returned from the outside is focused on the detector 2 through the semi-transparent and semi-reflective mirror I 102; a barrel I 4, which is installed at the entrance of the collimator 1 through a connecting member 14, and a reflector I 7 is installed at one end of the barrel I 4 and is provided with a first opening, and the first opening is used to project the light emitted from the collimator 1 through the barrel I 4 to the reflector I 7; a barrel II 5, one end of which is installed at the end of the barrel I 4 away from the reflector I 7, and a pentaprism 8, a semi-transparent and semi-reflective mirror II 7 are installed inside the barrel II 5. 9 and a reflector II 10, the pentaprism 8 is mounted at one end close to the lens barrel I 4, and the reflector II 10 is mounted at one end away from the lens barrel I 4; the lens barrel II 5 is provided with a second opening, and the second opening is used to emit the light reflected by the semi-transparent and semi-reflective mirror II 9 out of the lens barrel II 5; a lens barrel III 6, one end of which is mounted at one end of the lens barrel II 5 close to the reflector II 10, and a reflector III 11 is mounted inside the other end of the lens barrel III 6; the lens barrel III 6 is provided with a third opening, and the third opening is used to emit the light reflected by the reflector III 11 out of the lens barrel III 6; also includes an IMU 13, the IMU 13 is mounted on the device to be calibrated 12, and the upper surface and side surface of the IMU 13 are respectively attached with a small reflector I 1301 and a small reflector II 1302; also includes a plurality of adjustment members, and the plurality of adjustment members are respectively arranged on the reflector I 7, the pentaprism 8, the semi-transparent and semi-reflective mirror I 102, the semi-transparent and semi-reflective mirror II 9, between the reflector II 10 and the reflector III 11 and the corresponding lens barrels, the angles of the reflector I 7, the pentaprism 8, the semi-transparent and semi-reflective mirror I 102, the semi-transparent and semi-reflective mirror II 9, the reflector II 10 and the reflector III 11 are controlled by grinding adjustment parts; the light emitted by the collimator 1 passes through the reflector I 7, the pentaprism 8, and the semi-transparent and semi-reflective mirror II 9 and is divided into two beams of light, one of which is emitted from the second opening to the small reflector I 1301, and is reflected by the small reflector I 1301, and the light returns along the original light path; the other beam of light passes through the reflector II 10 and the reflector III 11 in sequence, and is emitted from the third opening to the small reflector II 1302, and is reflected by the small reflector II 1302, and the light returns along the original light path, and the two beams of returned light are focused on the center position of the detector 2.

[0043] Example 2.

[0044] This embodiment is a further illustration of the embodiment 1. The light source 3 is a combination of a lighting bulb and frosted glass. This combination enables the light source 3 to provide a uniform surface light source, which is suitable for a variety of optical detection and calibration tasks.

[0045] Example 3.

[0046] This embodiment is a further example of embodiment 1. The photoelectric load optical axis and IMU deviation calibration device also includes multiple lens fixing devices, such as Figure 1-4 As shown, the plurality of lens fixing devices are respectively used to fix the reflector I 7, the pentaprism 8, the semi-transparent mirror I 102, the semi-transparent mirror II 9, the reflector II 10 and the reflector III 11 on the corresponding lens barrels; the lens fixing device comprises a lens frame 701 and a lens seat 702, and the lens frame 701 and the lens seat 702 are detachably connected; the shapes of the reflector I 7, the pentaprism 8, the semi-transparent mirror I 102, the semi-transparent mirror II 9, the reflector II 10 and the reflector III 11 include rhombus, square, triangle or circle; the lens frame 701 has an inward groove structure, and the shapes of the grooves of the plurality of lens frames 701 are consistent with the shapes of the correspondingly installed reflectors I 7, the pentaprism 8, the semi-transparent mirror I 102, the semi-transparent mirror II 9, the reflector II 10 and the reflector III 11 matches the outer edge shape so that it is fixed in the lens frame 701; the lens base 702 is a hollow tripod structure, forming a support base to meet the light transmission requirement and reduce the overall weight of the device; the lens base 702 is provided with two raised snap-fit ​​parts, and the lens frame 701 is provided with two holes that match the positions and shapes of the snap-fit ​​parts on the lens base 702, and the lens frame 701 is fixed to the lens base 702 by the snap-fit ​​parts.

[0047] Example 4.

[0048] This embodiment is a further illustration of embodiment 1. Figure 1-4 As shown, the adjusting member includes a first gasket 711, a second gasket 811, a third gasket 911, a fourth gasket 1011 and a fifth gasket 1111, combined with Figure 3 In the installation schematic diagram of the lens holder 702 and the lens barrel, the first gasket 711 is arranged between the reflector Ⅰ 7 and the lens barrel Ⅰ 4; the second gasket 811 is arranged between the pentaprism 8 and the lens barrel Ⅱ 5; the third gasket 911 is arranged between the semi-transparent and semi-reflective mirror Ⅱ 9 and the lens barrel Ⅱ 5; the fourth gasket 1011 is arranged between the reflector Ⅱ 10 and the lens barrel Ⅱ 5; the fifth gasket 1111 is arranged between the reflector Ⅲ 11 and the lens barrel Ⅲ 6.

[0049] Example 5.

[0050] The photoelectric load optical axis and IMU deviation calibration device needs to be calibrated once before use. This embodiment provides a calibration method for the photoelectric load optical axis and IMU deviation calibration device, such as Figure 1 , Figure 3 and Figure 4 As shown, the calibration steps are as follows:

[0051] S1: Place a large-diameter plane reflector 16 in front of the lens barrel II 5, place an autocollimator 15 behind the lens barrel II 5, align the autocollimator 15 with the pentaprism 8, so that the light emitted by the autocollimator 15 passes through the pentaprism 8 and is projected onto the large-diameter plane reflector 16, and adjust the angle of the pentaprism 8 by grinding the adjustment piece between the pentaprism 8 and the lens barrel II 5, so that the light returns from the large-diameter plane reflector 16 to form autocollimation, and the installation and adjustment of the pentaprism 8 is completed;

[0052] S2: fix the positions of the autocollimator 15, the lens barrel II 5 and the large-aperture plane reflector 16 described in S1, shield the space between the pentaprism 8 and the large-aperture plane reflector 16, so that the light emitted by the autocollimator 15 is reflected by the pentaprism 8 and the semi-transparent and semi-reflective mirror II 9 to the large-aperture plane reflector 16, grind the adjustment piece between the semi-transparent and semi-reflective mirror II 9 and the lens barrel II 5, and then adjust the angle of the semi-transparent and semi-reflective mirror II 9, so that the light returns from the large-aperture plane reflector 16 to form self-collimation, and complete the installation and adjustment of the semi-transparent and semi-reflective mirror II 9;

[0053] S3: Continue to block the space between the semi-transparent and semi-reflective mirror II 9 and the large-aperture plane reflector 16, and block the second opening, so that the light emitted by the autocollimator 15 is reflected by the pentaprism 8, the semi-transparent and semi-reflective mirror II 9, and the reflector II 10 to the large-aperture plane reflector 16, and the angle of the reflector II 10 is adjusted by grinding the adjustment piece between the reflector II 10 and the lens barrel II 5, so that the light returns from the large-aperture plane reflector 16 to form autocollimation, and the installation and adjustment of the reflector II 10 is completed;

[0054] S4: Remove the large-aperture plane reflector 16, so that the light emitted by the autocollimator 15 forms two light paths after passing through the pentaprism 8. One light path is that the light passes through the reflector I 7 along the lens barrel Ⅰ 4 and is reflected onto the collimator 1; the other light path is that the light passes through the semi-transparent and semi-reflective mirror II 9, the reflector II 10 and the reflector III 11 in sequence, and is emitted from the third opening to the collimator 1. By grinding the adjustment parts between the reflector I 7 and the lens barrel Ⅰ 4 and the adjustment parts between the reflector III 11 and the lens barrel III 6, the angles of the reflector I 7 and the reflector III 11 are adjusted so that the two beams of light are focused on the center of the phase plane of the detector 2, and the installation and adjustment of this device is completed.

[0055] Example 6.

[0056] This embodiment provides a method for using a device for calibrating the optical axis of an optoelectronic load and an IMU deviation, such as Figure 1 and Figure 3-5 As shown, the following steps are included:

[0057] P1: Install one side surface of the IMU 13 on the device to be calibrated 12, and attach a small reflector I 1301 and a small reflector II 1302 to the upper surface of the IMU 13 and the side surface away from the device to be calibrated 12, respectively;

[0058] P2: Place the device to be calibrated 12 in front of the collimator 1, and adjust the device to be calibrated 12 so that the parallel light emitted by the collimator 1 is incident on the center of the detector of the device to be calibrated 12;

[0059] P3: The light emitted from the parallel light tube 1 passes through the reflector I 7, pentaprism 8 and semi-transparent and semi-reflective mirror II 9 in the lens barrel I 4 and the lens barrel II 5 in sequence, and then is divided into two beams of light, one of which is emitted from the second opening to the small reflector I 1301, and then the beam of light returns along the original optical path; at the same time, the other beam of light passes through the reflector II 10 and the reflector III 11 in sequence, and is emitted from the third opening to the small reflector II 1302, and then the beam of light returns along the original optical path; combined Figure 5 The coordinate distribution diagram of the IMU 13 shown, the small reflector I 1301 monitors the misalignment of the IMU 13 around the Z axis, and the Z axis is parallel to the optical axis; the small reflector II 1302 monitors the misalignment of the IMU 13 around the X axis and the misalignment around the Y axis;

[0060] P4: By adjusting the position of IMU 13, the two beams of returned light are focused on the center of detector 2, thus completing the calibration of the consistency between the installation reference of IMU 13 and the optical axis.

[0061] In combination with the photoelectric load optical axis and IMU deviation calibration device provided in the above embodiment, when in use, it only needs to be accurately installed once to ensure the accuracy consistency between the IMU 13 and the optical system of all devices, which is suitable for batch assembly and adjustment of equipment, and improves production efficiency and product consistency. At the same time, the deviation between the three mounting surfaces of the IMU 13 and the photoelectric load optical axis can be observed at any time during use. When a deviation occurs, the operator can immediately correct the position of the IMU 13 through the feedback provided by the observation device. This high-precision calibration method not only effectively reduces the angular deviation that may occur between the IMU 13 and the photoelectric load optical axis, but also further improves the measurement accuracy and reliability of the entire system, providing more stable data support for precision positioning and control systems.

[0062] Obviously, the above embodiments are only examples for clearly illustrating the technical solution of the present invention, and are not intended to limit the technical solution. For ordinary technicians in the relevant field, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation methods here. The obvious changes or modifications derived from this are still within the protection scope of the invention.

Claims

1. A device for calibrating the optical axis of a photoelectric load and an IMU deviation, characterized in that: include: A collimator (1) is provided with a parabolic mirror (101), a semi-transparent and semi-reflective mirror I (102), a detector (2) and a light source (3); the detector (2) is located at the focus of the collimator (1); the semi-transparent and semi-reflective mirror I (102) is located between the detector (2) and the light source (3); light emitted by the light source (3) is reflected by the semi-transparent and semi-reflective mirror I (102) onto the parabolic mirror (101), and after being collimated, becomes parallel light and is emitted outward, while the parallel light returned from the outside is focused on the detector (2) through the semi-transparent and semi-reflective mirror I (102); A lens barrel I (4) is mounted at the entrance of the collimator (1), a reflector I (7) is mounted inside one end of the lens barrel I (4) and a first opening is provided, the first opening is used to direct the light emitted from the collimator (1) through the lens barrel I (4) to the reflector I (7); A lens barrel II (5), one end of which is mounted on an end of the lens barrel I (4) away from the reflector I (7); a pentaprism (8), a semi-transparent and semi-reflective mirror II (9) and a reflector II (10) are mounted inside the lens barrel II (5); the pentaprism (8) is mounted on an end close to the lens barrel I (4), and the reflector II (10) is mounted on an end away from the lens barrel I (4); the lens barrel II (5) is provided with a second opening, and the second opening is used to emit light reflected by the semi-transparent and semi-reflective mirror II (9) out of the lens barrel II (5); A lens barrel III (6), one end of which is mounted on an end of the lens barrel II (5) close to the reflector II (10), and a reflector III (11) is mounted inside the other end of the lens barrel III (6); the lens barrel III (6) is provided with a third opening, and the third opening is used to emit light reflected by the reflector III (11) out of the lens barrel III (6); It also includes an IMU (13), wherein the IMU (13) is mounted on the device to be calibrated (12), and a small reflector I (1301) and a small reflector II (1302) are respectively attached to the upper surface and the side surface of the IMU (13); It also includes a plurality of adjustment parts, wherein the plurality of adjustment parts are respectively arranged between the reflector I (7), the pentaprism (8), the semi-transparent and semi-reflective mirror I (102), the semi-transparent and semi-reflective mirror II (9), the reflector II (10) and the reflector III (11) and the corresponding lens barrels, and the angles of the reflector I (7), the pentaprism (8), the semi-transparent and semi-reflective mirror I (102), the semi-transparent and semi-reflective mirror II (9), the reflector II (10) and the reflector III (11) are controlled by grinding the adjustment parts; The light emitted by the parallel light tube (1) passes through a reflector I (7), a pentaprism (8), and a semi-transparent and semi-reflective mirror II (9) and is then divided into two beams of light, one of which is emitted from the second opening to a small reflector I (1301), is reflected by the small reflector I (1301), and returns along the original optical path; the other beam of light passes through a reflector II (10) and a reflector III (11) in sequence and is emitted from the third opening to a small reflector II (1302), is reflected by the small reflector II (1302), and returns along the original optical path, and the two returned beams of light are focused at the center of the detector (2).

2. The optical axis and IMU deviation calibration device of the photoelectric load according to claim 1 is characterized in that: The light source (3) comprises a lighting bulb and frosted glass.

3. The photoelectric load optical axis and IMU deviation calibration device according to claim 1, characterized in that: The adjustment member comprises a first gasket (711), a second gasket (811), a third gasket (911), a fourth gasket (1011) and a fifth gasket (1111); the first gasket (711) is arranged between the reflector I (7) and the lens barrel I (4); the second gasket (811) is arranged between the pentaprism (8) and the lens barrel II (5); the third gasket (911) is arranged between the semi-transparent and semi-reflective mirror II (9) and the lens barrel II (5); the fourth gasket (1011) is arranged between the reflector II (10) and the lens barrel II (5); and the fifth gasket (1111) is arranged between the reflector III (11) and the lens barrel III (6).

4. The photoelectric load optical axis and IMU deviation calibration device according to claim 1, characterized in that: The lens fixing device also comprises a plurality of lens fixing devices, wherein the plurality of lens fixing devices are respectively used to fix the reflector I (7), the pentaprism (8), the semi-transparent and semi-reflective mirror I (102), the semi-transparent and semi-reflective mirror II (9), the reflector II (10) and the reflector III (11) on the corresponding lens barrels; the lens fixing devices comprise a lens frame (701) and a lens seat (702), and the lens frame (701) and the lens seat (702) are detachably connected.

5. The device for calibrating the optical axis of the photoelectric load and the IMU deviation according to claim 4, characterized in that: The shapes of the reflector I (7), pentaprism (8), semi-transparent mirror I (102), semi-transparent mirror II (9), reflector II (10) and reflector III (11) include rhombus, square, triangle or circle; the mirror frame (701) has an inward groove structure, and the shapes of the grooves of the plurality of mirror frames (701) respectively match the outer edge shapes of the correspondingly installed reflector I (7), pentaprism (8), semi-transparent mirror I (102), semi-transparent mirror II (9), reflector II (10) and reflector III (11), so that the reflectors are fixed in the mirror frame (701).

6. The device for calibrating the optical axis of the photoelectric load and the IMU deviation according to claim 4, characterized in that: The mirror base (702) is a hollow tripod structure, forming a support base and being light-transmissive; the mirror base (702) is provided with two raised snap-fit ​​components, the mirror frame (701) is provided with two holes whose positions and shapes match those of the snap-fit ​​components on the mirror base (702), and the mirror frame (701) is fixed to the mirror base (702) via the snap-fit ​​components.

7. A calibration method for the optical axis of the photoelectric load and the IMU deviation calibration device according to any one of claims 1 to 6, characterized in that: The calibration steps are as follows: S1: placing a large-diameter plane reflector (16) in front of the lens barrel II (5), placing an autocollimator (15) behind the lens barrel II (5), aligning the autocollimator (15) with the pentaprism (8), so that the light emitted by the autocollimator (15) passes through the pentaprism (8) and is projected onto the large-diameter plane reflector (16), and adjusting the angle of the pentaprism (8) by grinding the adjustment piece between the pentaprism (8) and the lens barrel II (5) so that the light returns from the large-diameter plane reflector (16) to form autocollimation, thereby completing the installation and adjustment of the pentaprism (8); S2: fix the positions of the autocollimator (15), the lens barrel II (5) and the large-aperture plane reflector (16) described in S1, shield the area between the pentaprism (8) and the large-aperture plane reflector (16), so that the light emitted by the autocollimator (15) is reflected by the pentaprism (8) and the semi-transparent and semi-reflective mirror II (9) to the large-aperture plane reflector (16), grind the adjustment piece between the semi-transparent and semi-reflective mirror II (9) and the lens barrel II (5), and then adjust the angle of the semi-transparent and semi-reflective mirror II (9), so that the light returns from the large-aperture plane reflector (16) to form autocollimation, and complete the installation and adjustment of the semi-transparent and semi-reflective mirror II (9); S3: Continue to block the space between the semi-transparent and semi-reflective mirror II (9) and the large-aperture plane reflector (16), and block the second opening, so that the light emitted by the autocollimator (15) is reflected by the pentaprism (8), the semi-transparent and semi-reflective mirror II (9), and the reflector II (10) to the large-aperture plane reflector (16), and the angle of the reflector II (10) is adjusted by grinding the adjustment piece between the reflector II (10) and the lens barrel II (5), so that the light returns from the large-aperture plane reflector (16) to form autocollimation, and the installation and adjustment of the reflector II (10) is completed; S4: Remove the large-aperture plane reflector (16) so that the light emitted by the autocollimator (15) forms two light paths after passing through the pentaprism (8). One light path is for the light to pass through the reflector I (7) along the lens barrel I (4) and be reflected onto the collimator (1); the other light path is for the light to pass through the semi-transparent and semi-reflective mirror II (9), reflector II (10) and reflector III (11) in sequence and be emitted from the third opening to the collimator (1). By grinding the adjustment parts between the reflector I (7) and the lens barrel I (4) and the adjustment parts between the reflector III (11) and the lens barrel III (6), the angles of the reflector I (7) and the reflector III (11) are adjusted so that the two beams of light are focused on the center of the phase plane of the detector (2), thereby completing the installation and adjustment of the device.

8. A method for using the photoelectric load optical axis and IMU deviation calibration device as claimed in any one of claims 1 to 6, characterized in that: The steps include: P1: Mount one side surface of the IMU (13) on the device to be calibrated (12), and attach a small reflector I (1301) and a small reflector II (1302) to the upper surface of the IMU (13) and the side surface away from the device to be calibrated (12), respectively; P2: placing the device to be calibrated (12) in front of the collimator (1), and adjusting the device to be calibrated (12) so that the parallel light emitted by the collimator (1) is incident on the center of the detector of the device to be calibrated (12); P3: The light emitted by the parallel light tube (1) passes through the lens barrel I (4), the reflector I (7) in the lens barrel II (5), the pentaprism (8) and the semi-transparent and semi-reflective mirror II (9) in sequence, and is then divided into two beams of light, one of which is emitted from the second opening to the small reflector I (1301), and then returns along the original optical path; at the same time, the other beam of light passes through the reflector II (10) and the reflector III (11) in sequence, and is emitted from the third opening to the small reflector II (1302), and then returns along the original optical path; P4: By adjusting the position of the IMU (13) so that the two beams of returning light are focused on the center of the detector (2), the calibration of the consistency between the installation reference of the IMU (13) and the optical axis is completed.

9. The method for using the photoelectric load optical axis and IMU deviation calibration device according to claim 8, characterized in that: The small reflector I (1301) monitors the misalignment of the IMU (13) around the Z axis, which is parallel to the optical axis; the small reflector II (1302) monitors the misalignment of the IMU (13) around the X axis and the Y axis.

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