Device and method for improving leakage current resistance and interference resistance

Abstract

The invention belongs to the technical field of electrical engineering and automatic control, and provides a device and method for improving leakage current resistance and interference resistance, and the device comprises a first instrument amplification module, a second instrument amplification module, a third instrument amplification module, a quiescent current adjustment module, and a microprocessor module. Acquiring quiescent current data and dynamic current data of the circuit; analyzing and processing to obtain a static characteristic value and a dynamic characteristic value; based on the obtained static characteristic value and the dynamic characteristic value, analyzing and processing to obtain a feedback signal value; comparing the feedback signal value with a feedback signal threshold value, analyzing and dividing into different areas; the feedback signal value is analyzed, processed and converted into a feedback signal of the electronic delay module, and networking is completed when the electronic delay module confirms that connection is correct through analysis and processing; the leakage current resistance and the interference resistance are effectively improved, data processing of mixed signals is optimized and analyzed, and potential problems in a circuit are specifically analyzed, so that the reliability and the safety of equipment are improved.

Description

Technical Field

[0001] The invention belongs to the field of electrical engineering and automatic control technology, in particular to power electronics technology, and specifically relates to a device and method for improving leakage current resistance and anti-interference. Background Art

[0002] In the civil explosives industry, long wires are usually used as firing lines to connect a number of electronic delay detonators. The detonator sends signals to each electronic delay detonator through the firing line, and each electronic delay detonator responds to the instructions sent by the detonator according to a specific protocol.

[0003] Generally, the communication between the detonator and the electronic delay detonator is divided into three stages: networking, charging, and detonation. Networking is time-consuming, and the detonators need to be connected and checked one by one. After the networking is completed, charging begins, and the charging is completed to enter the ready-to-explode state. After ensuring safety, the blaster detonates the detonator. In many practical applications, the blasthole filling may contain minerals or even directly be a water hole. Although the connection between the communication leg wire and the gun line of the electronic delay detonator is waterproof, due to the extrusion of the filling material, there is a certain probability of leakage at the connection. Small leakage has little effect on communication and detonation. When the leakage is too large, the communication will fail and the electronic delay detonator will not be able to detonate. When the number of detonators is large, the trouble caused by leakage is particularly serious.

[0004] In addition, since detonators sometimes work in conjunction with other equipment, such as communication radio stations, the interference source is very close and cannot be cut off at the source, it is also necessary to improve the anti-interference ability of the detonator itself.

[0005] A Chinese patent application with publication number CN113759288A discloses a leakage current detection circuit, method and leakage current detector. The leakage current detection circuit is used to detect the leakage current of the device to be tested, including a main winding, an auxiliary winding, a detection module and a signal output module, wherein the main winding is connected to the leakage current detection end of the device to be tested and coupled with the auxiliary winding, and the auxiliary winding is connected to the signal output module and the detection module respectively; the signal output module is used to output an alternating positive and negative pulse signal to put the auxiliary winding in a preset state. At this time, if there is a leakage current on the main winding, the leakage current coupled to the auxiliary winding is superimposed on the alternating positive and negative pulse signal, so that the current signal detected by the detection module is larger than the current signal detected when the alternating positive and negative pulse signal is not applied, thereby improving the sensitivity of the leakage current detection, and there is no need to use a detection device with higher sensitivity, thereby reducing the cost of detection.

[0006] The above technology provides a method and a detection device for detecting leakage current, but does not provide a good solution to improve the circuit's ability to resist leakage current and anti-interference, nor does it optimize the accuracy and reliability of the measurement. At the same time, it does not specifically analyze the potential problems in the circuit to improve the reliability and safety of the equipment.

[0007] To this end, the present invention provides a device and method for improving resistance to leakage current and interference. Summary of the invention

[0008] In order to make up for the deficiencies of the prior art, at least one technical problem raised in the background technology is solved.

[0009] The technical solution adopted by the present invention to solve the technical problem is: a method for improving leakage current resistance and anti-interference, comprising:

[0010] The first instrument amplification module, the second instrument amplification module, the third instrument amplification module, the static current adjustment module and the microprocessor, Out1 and Out2 are communication lines, Vdac is the analog signal output by the digital-to-analog converter DAC of the microprocessor, and Vadc is the analog signal transmitted to the analog-to-digital converter ADC input end of the microprocessor. The existing detonator current sampling only has the first instrument amplification module and the microprocessor, and the static current Iq and the dynamic current Is can only be amplified synchronously.

[0011] The first instrument amplifier module includes: a sampling resistor Rs, a first instrument amplifier U1 and a first isolation resistor R1. The sampling resistor Rs is connected in series between the communication lines Out1 and Out2 to obtain the communication current, which is amplified by Av1 times by U1 and then output to the first input end of the third instrument amplifier module, which is used to sample and amplify the communication current by Av1 times. The output voltage is: Vo1 = Iq*Rs*Av1, where Av1 represents the voltage gain of the first instrument amplifier;

[0012] The second instrument amplifier module includes: an impedance matching resistor Re, a feedback resistor Rf, a gain adjustment resistor Rg, a second instrument amplifier U2 and a second isolation resistor R2. The analog signal Vdac output by the digital-to-analog converter DAC of the microprocessor is amplified by U2 by Av2 times and then output to the second input end of the third instrument amplifier module, which is used to amplify the analog signal Vdac output by the digital-to-analog converter DAC of the microprocessor by Av2 times. The analog signal is the voltage corresponding to the static working current of the electronic delay module, and the output voltage is: Vo2=Iq*Av2

[0013] set up: Wherein, Av2 represents the voltage gain of the second instrumentation amplifier;

[0014] The third instrument amplifier module includes: a first voltage-dividing resistor R5, a second voltage-dividing resistor R6, a third voltage-dividing resistor R7, a third instrument amplifier U3 and a third isolation resistor R3. After being divided by the voltage-dividing network R5, R6 and R7, Vo1 and Vo2 are attenuated to their original values. To prevent the third instrument amplifier U3 from saturation, it is used to combine the outputs of the first and second instrument amplifier modules and buffer the outputs, and its total gain is 1, and the combined output is: Vo3 = Vo1-Vo2 = Iq*Av1, where Av3 represents the voltage gain of the third instrument amplifier;

[0015] The static current adjustment module includes: a first load resistor R4, a second load resistor R8 and an NMOS switch tube M1, which are used to control the load resistor of the first instrument amplifier module, the voltage division ratio To correctly obtain the static current Iq of the electronic delay module;

[0016] The microprocessor module includes: a microprocessor chip and its peripheral resistors, and belongs to the existing circuit.

[0017] As a further technical solution of the present invention, the specific acquisition process of measuring the static working current Iq is:

[0018] The microprocessor is initialized, P2.2 outputs a high level, M1 is turned on, the first load resistor R4 is grounded, the second load resistor R8 is short-circuited, and the sampling resistance is reduced to Prevent the output of the third instrument amplifier module from exceeding the input range of the microprocessor, start the ADC, perform analog-to-digital conversion on Vo3, and obtain the static current Iq;

[0019] Among them, P2.2 represents the output pin of the microprocessor;

[0020] As a further technical solution of the present invention, the specific acquisition process of measuring the dynamic current Is is:

[0021] The microprocessor works normally, P2.2 outputs a low level, M1 is cut off, the first load resistor R4 and the second load resistor R8 are connected in series to ground, R4+R8 is set to be much larger than R5+R6+R7, and the DAC is set to work to convert the static working current Iq into the analog output Vdac;

[0022] Send signaling, communicate normally with the electronic delay module, start ADC when the module returns data, and the first instrument amplifier module outputs sampling signals of static current Iq and dynamic current Is;

[0023] After being amplified by the second instrument amplifier module, Vdac is combined with the sampling signal output by the first instrument amplifier module in the third instrument amplifier module for processing;

[0024] Output Vo3 = Vo1-Vo2 = Iq*Av1+Is*Rs*Av1, perform analog-to-digital conversion on Vo3, and obtain a mixed signal Iq+Is*Rs of the static current Iq and the dynamic current Is. Usually Is is smaller than Iq.

[0025] As a further technical solution of the present invention, the specific process of data processing is:

[0026] The microprocessor works normally, performs data processing on the mixed signal Iq+Is*Rs, and obtains the feedback signal of the electronic delay module.

[0027] Since the dynamic signal Is is expanded to the original Rs times, the signal-to-noise ratio is expanded, and the anti-interference performance is improved, while the static current Iq input to the MCU maintains the original amplitude, the first instrument amplifier module and the second instrument amplifier module are set to work at the set working voltage VH to ensure that the sampling signal will not be saturated due to the increase of the sampling resistance when the leakage current is high;

[0028] As a further technical solution of the present invention, static current data and dynamic current data of the circuit are obtained, leakage current exists in the data of the static current measurement, and a hardware failure occurs when the dynamic current is measured, resulting in an abnormality in the mixed signal obtained by the processing, and the cause of the abnormality cannot be specifically determined. After the delayed processing, the problem cannot be quickly solved and the normal operation cannot be restored. Therefore, the mixed signal is separated and preliminarily processed before sending the mixed signal;

[0029] As a further technical solution of the present invention, the specific process of obtaining the static characteristic value is as follows:

[0030] Based on the obtained static current data and the preset static current threshold I q0 By comparison and analysis, the static characteristic value JT is obtained. The static current threshold represents the maximum current that the device can withstand when in normal standby mode. The static current threshold includes the maximum leakage current that the device can withstand when in normal standby mode.

[0031] If the quiescent current is less than the quiescent current threshold I q0 , then the static characteristic value JT is assigned a value of 1, indicating that the device maintains standby operation normally;

[0032] If the quiescent current is greater than or equal to the quiescent current threshold I q0 , then the static characteristic value JT is assigned a value of -1, indicating that the equipment maintains standby operation abnormally;

[0033] As a further technical solution of the present invention, the specific process of obtaining the dynamic characteristic value is as follows:

[0034] Based on the obtained dynamic current data and the preset dynamic current threshold I s0By comparison and analysis, the dynamic characteristic value DT is obtained. The dynamic characteristic threshold represents the maximum current that the device can withstand to maintain normal operation. The dynamic current threshold includes the maximum current that the device can withstand when a hardware fault occurs to maintain normal operation of the device.

[0035] If the dynamic current is less than the dynamic current threshold I s0 , then the dynamic characteristic value DT is assigned to 1, indicating that the equipment is operating normally;

[0036] If the dynamic current is greater than or equal to the dynamic current threshold I s0 , the dynamic characteristic value DT is assigned to -1, indicating that the equipment is operating abnormally;

[0037] As a further technical solution of the present invention, based on the obtained static characteristic value and dynamic characteristic value, a mixed signal of the static current Iq and the dynamic current Is is obtained: I q +I s *R s , the microprocessor converts the mixed signal I d +I s *R s Perform data processing to obtain the feedback signal value of the electronic delay module, analyze and process the feedback signal value and convert it into the feedback signal of the electronic delay module. After the electronic delay module is analyzed and processed to confirm that the connection is correct, the networking is completed;

[0038] As a further technical solution of the present invention, the specific process of obtaining the feedback signal value is as follows:

[0039] The obtained static eigenvalue JT and dynamic eigenvalue DT are subjected to data analysis and processing, and the formula is: Get the feedback signal value FK, where a 1 and a 2 is the preset correlation coefficient;

[0040] As a further technical solution of the present invention, the specific analysis process of the feedback signal value is as follows:

[0041] Based on the calculated feedback signal value FK and the preset feedback signal threshold FK 0 and FK 1 Compare and classify them into different types;

[0042] If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK 1 , the device operates normally in the standby state and the working state, the microprocessor analyzes and processes and sends a normal feedback signal to the electronic delay module, and the electronic delay module completes the networking after confirming that the connection is correct after analysis and processing;

[0043] If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK 0 And less than the feedback signal threshold FK 1 , the device is operating abnormally in the working state, and the microprocessor analyzes and processes and sends an abnormal feedback signal to the electronic delay module. The electronic delay module sends a cancel operation instruction after analysis and processing, and at the same time feedback shows that the device is abnormal in the working state;

[0044] If the calculated feedback signal value FK is less than the feedback signal threshold FK 0 , the device operates abnormally in the standby state, and the microprocessor analyzes and processes and sends an abnormal feedback signal to the electronic delay module. The electronic delay module sends a cancel operation instruction after analysis and processing, and at the same time feedback shows that the device is abnormal in the standby state;

[0045] The beneficial effects of the present invention are as follows:

[0046] 1. The load resistance of the first instrument amplifier module is controlled by the static current adjustment module, so that the measurement of the static current Iq is more accurate, and the dynamic current Is is amplified to the original Rs times, which improves the signal-to-noise ratio and makes the measurement of the dynamic current more accurate. Since the dynamic signal Is is amplified, the signal-to-noise ratio is improved, thereby enhancing the anti-interference performance. The output voltage is attenuated by the voltage divider network (R5 / R6 / R7) to prevent the third instrument amplifier module from saturation, further improving the stability of the system. The connection state of the first load resistor R4 and the second load resistor R8 is controlled by the NMOS switch tube M1, and the measurement range of the static current Iq can be flexibly adjusted to ensure the measurement accuracy. The system can measure the static current Iq and the dynamic current Iq at the same time. s, and the amplification factor of the dynamic current can be adjusted according to the sampling resistor Rs, thereby expanding the dynamic range of the measurement. The first instrument amplification module and the second instrument amplification module operate at a set operating voltage VH, ensuring that the sampling signal will not be saturated even in the case of high leakage current, thereby improving the reliability and robustness of the system. The microprocessor is responsible for the coordination and data processing of the entire system, and a high degree of integration of hardware and software is achieved through the digital-to-analog conversion (DAC) and analog-to-digital conversion (ADC) interfaces. The system adopts a modular design, and each module is responsible for a specific function, which is convenient for the expansion and maintenance of the system. The system can effectively amplify the dynamic current signal without affecting the static current measurement accuracy, thereby improving the accuracy and reliability of the measurement.

[0047] 2. Through real-time monitoring of static current and dynamic current, potential problems in the circuit can be discovered and diagnosed in time, thereby improving the overall reliability of the system. By setting the static current threshold and dynamic current threshold and performing corresponding characteristic value analysis, factors that may cause failures can be detected at an early stage, so that preventive measures can be taken. Through clear definitions of static characteristic values ​​JT and dynamic characteristic values ​​DT and setting of feedback signal thresholds, the system can automatically identify and report any abnormal conditions, allowing the maintenance team to quickly locate the problem and reduce troubleshooting time. By separating static current and dynamic current signals and analyzing them independently, it is ensured that the system can still make correct decisions even when one or more parameters deviate from the normal range. The feedback signal value FK is analyzed and processed by the microprocessor, and corresponding command responses are made according to different threshold intervals, so that the system has a certain degree of intelligent decision-making ability. By comprehensively considering the changes in static current and dynamic current, it provides an effective means to improve the reliability and safety of the equipment, and also provides a more scientific method for system maintenance, which is of great significance to ensure the normal operation of the equipment in a complex environment. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] The present invention will be further described below in conjunction with the accompanying drawings.

[0049] Figure 1 This is a circuit block diagram of a device for improving leakage current resistance and anti-interference in Embodiment 1 of the present invention;

[0050] Figure 2 It is a flow chart of the steps of a method for improving leakage current resistance and anti-interference in embodiment 2 of the present invention. DETAILED DESCRIPTION

[0051] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further explained below in conjunction with specific implementation methods.

[0052] Example 1

[0053] like Figure 1 As shown in the circuit block diagram of the present invention, a device and method for improving leakage current resistance and anti-interference of the present invention include:

[0054] The first instrument amplification module, the second instrument amplification module, the third instrument amplification module, the static current adjustment module and the microprocessor, Out1 and Out2 are communication lines, Vdac is the analog signal output by the digital-to-analog converter DAC of the microprocessor, and Vadc is the analog signal transmitted to the analog-to-digital converter ADC input end of the microprocessor. The existing detonator current sampling only has the first instrument amplification module and the microprocessor, and the static current Iq and the dynamic current Is can only be amplified synchronously.

[0055] The first instrument amplifier module includes: a sampling resistor Rs, a first instrument amplifier U1 and a first isolation resistor R1. The sampling resistor Rs is connected in series between the communication lines Out1 and Out2 to obtain the communication current, which is amplified by Av1 times by U1 and then output to the first input terminal of the third instrument amplifier module, which is used to sample and amplify the communication current by Av1 times. The output voltage is: Vo1 = Iq*Rs*Av1

[0056] Wherein, Av1 represents the voltage gain of the first instrumentation amplifier;

[0057] The second instrument amplifier module includes: an impedance matching resistor Re, a feedback resistor Rf, a gain adjustment resistor Rg, a second instrument amplifier U2 and a second isolation resistor R2. The analog signal Vdac output by the digital-to-analog converter DAC of the microprocessor is amplified by U2 by Av2 times and then output to the second input end of the third instrument amplifier module, which is used to amplify the analog signal Vdac output by the digital-to-analog converter DAC of the microprocessor by Av2 times. The analog signal is the voltage corresponding to the static working current of the electronic delay module, and the output voltage is: Vo2=Iq*Av2

[0058] set up: Wherein, Av2 represents the voltage gain of the second instrumentation amplifier;

[0059] The third instrument amplifier module includes: a first voltage-dividing resistor R5, a second voltage-dividing resistor R6, a third voltage-dividing resistor R7, a third instrument amplifier U3 and a third isolation resistor R3. After being divided by the voltage-dividing network R5, R6 and R7, Vo1 and Vo2 are attenuated to their original values. To prevent the third instrument amplifier U3 from saturation, it is used to combine the outputs of the first and second instrument amplifier modules and buffer the outputs. Its total gain is 1, and the combined output is: Vo3 = Vo1-Vo2 = Iq*Av1

[0060] Wherein, Av3 represents the voltage gain of the third instrumentation amplifier;

[0061] The static current adjustment module includes: a first load resistor R4, a second load resistor R8 and an NMOS switch tube M1, which are used to control the load resistance of the first instrument amplifier module, and the voltage division ratio is: To correctly obtain the static current Iq of the electronic delay module;

[0062] The microprocessor module includes: a microprocessor chip and its peripheral resistors, and belongs to the existing circuit.

[0063] The following steps are involved:

[0064] The first step is to measure the static operating current Iq

[0065] The microprocessor is initialized, P2.2 outputs a high level, M1 is turned on, the first load resistor R4 is grounded, and the second load resistor R8 is short-circuited, reducing the sampling resistance to: Prevent the output of the third instrument amplifier module from exceeding the input range of the microprocessor, start the ADC, perform analog-to-digital conversion on Vo3, and obtain the static current Iq;

[0066] Among them, P2.2 represents the output pin of the microprocessor;

[0067] The second step is to measure the dynamic current I s

[0068] The microprocessor works normally, P2.2 outputs a low level, M1 is cut off, the first load resistor R4 and the second load resistor R8 are connected in series to ground, R4+R8 is set to be much larger than R5+R6+R7, and the DAC is set to work to convert the static working current Iq into the analog output Vdac;

[0069] Send signaling, communicate normally with the electronic delay module, start ADC when the module returns data, and the first instrument amplifier module outputs sampling signals of static current Iq and dynamic current Is;

[0070] After being amplified by the second instrument amplifier module, Vdac is combined with the sampling signal output by the first instrument amplifier module in the third instrument amplifier module for processing;

[0071] Output Vo3 = Vo1-Vo2 = Iq*Av1+Is*Rs*Av1, perform analog-to-digital conversion on Vo3, and obtain a mixed signal of static current Iq and dynamic current Is: Iq+Is*Rs, usually Is is smaller than Iq;

[0072] Step 3: Data Processing

[0073] The microprocessor works normally, performs data processing on the mixed signal Id+Is*Rs, and obtains the feedback signal of the electronic delay module.

[0074] Since the dynamic signal Is is expanded to the original Rs times, the signal-to-noise ratio is increased, and the anti-interference performance is improved, while the static current Iq input to the MCU maintains the original amplitude. The first instrument amplifier module and the second instrument amplifier module are set to work at the set working voltage VH to ensure that the sampling signal will not be saturated due to the increase of the sampling resistance when the leakage current is high.

[0075] The technical solution of the embodiment of the present invention is: the load resistance of the first instrument amplifier module is controlled by the static current adjustment module, so that the measurement of the static current Iq is more accurate, the dynamic current Is is amplified to the original Rs times, the signal-to-noise ratio is improved, and the measurement of the dynamic current is more accurate. Since the dynamic signal Is is amplified, the signal-to-noise ratio is improved, thereby enhancing the anti-interference performance. The output voltage is attenuated by the voltage divider network (R5 / R6 / R7) to prevent the third instrument amplifier module from saturation, further improving the stability of the system. The connection state of the first load resistor R4 and the second load resistor R8 is controlled by the NMOS switch tube M1, so that the measurement range of the static current Iq can be flexibly adjusted to ensure the measurement accuracy. The system can simultaneously measure the static current Iq and the dynamic current I s, and the amplification factor of the dynamic current can be adjusted according to the sampling resistor Rs, thereby expanding the dynamic range of the measurement. The first instrument amplification module and the second instrument amplification module operate at a set operating voltage VH, ensuring that the sampling signal will not be saturated even in the case of high leakage current, thereby improving the reliability and robustness of the system. The microprocessor is responsible for the coordination and data processing of the entire system, and a high degree of integration of hardware and software is achieved through the digital-to-analog conversion (DAC) and analog-to-digital conversion (ADC) interfaces. The system adopts a modular design, and each module is responsible for a specific function, which is convenient for the expansion and maintenance of the system. The system can effectively amplify the dynamic current signal without affecting the static current measurement accuracy, thereby improving the accuracy and reliability of the measurement.

[0076] Example 2

[0077] Based on Example 1, the present invention processes and analyzes the mixed signal of static current and dynamic current, but anomalies may occur during the measurement process, so that an accurate mixed signal cannot be obtained, resulting in abnormal results in data processing and deviations in the feedback signal of the obtained electronic delay module. Therefore, the embodiment of the present invention optimizes and analyzes the data processing of the mixed signal, such as Figure 1 As shown, a method for improving leakage current resistance and anti-interference according to an embodiment of the present invention includes:

[0078] Step 1: Obtain static current data and dynamic current data of the circuit. There is leakage current in the static current data. A hardware failure occurs when measuring the dynamic current, resulting in an abnormal mixed signal obtained by processing. The cause of the abnormality cannot be determined specifically. After delayed processing, the problem cannot be quickly solved and normal operation cannot be restored. Therefore, the mixed signal is separated and preliminarily processed before sending it;

[0079] It should be noted that hardware failures include but are not limited to component failure, poor welding, power supply problems and thermal runaway. Hardware failures cause abnormal circuit current during operation;

[0080] Based on the obtained static current data and the preset static current threshold I q0 By comparison and analysis, the static characteristic value JT is obtained. The static current threshold represents the maximum current that the device can withstand when in normal standby mode. The static current threshold includes the maximum leakage current that the device can withstand when in normal standby mode.

[0081] It should be noted that the static current threshold is obtained through experimental testing. The current in the circuit is continuously increased when the device is in standby mode. Each time the current is increased, the device needs to be stable for a period of time before measurement. At the same time, the same conditions need to be measured multiple times for comparison. When the device cannot maintain a normal standby state, the current data is recorded and marked as the static current threshold.

[0082] If the quiescent current is less than the quiescent current threshold I q0 , then the static characteristic value JT is assigned a value of 1, indicating that the device maintains standby operation normally;

[0083] If the quiescent current is greater than or equal to the quiescent current threshold I q0 , then the static characteristic value JT is assigned a value of -1, indicating that the equipment maintains standby operation abnormally;

[0084] Based on the obtained dynamic current data and the preset dynamic current threshold I s0 By comparison and analysis, the dynamic characteristic value DT is obtained. The dynamic characteristic threshold represents the maximum current that the device can withstand to maintain normal operation. The dynamic current threshold includes the maximum current that the device can withstand when a hardware fault occurs to maintain normal operation of the device.

[0085] It should be noted that the dynamic current threshold is also obtained through experimental testing. The current in the circuit is continuously increased when the device is in normal operation. After each increase in current, the device needs to be stable for a period of time before measurement. At the same time, the same conditions need to be measured multiple times for comparison. When the device cannot maintain normal operation, the recorded current data is marked as the dynamic current threshold.

[0086] If the dynamic current is less than the dynamic current threshold I s0 , then the dynamic characteristic value DT is assigned to 1, indicating that the equipment is operating normally;

[0087] If the dynamic current is greater than or equal to the dynamic current threshold I s0 , the dynamic characteristic value DT is assigned to -1, indicating that the equipment is operating abnormally;

[0088] Step 2: Based on the obtained static characteristic value and dynamic characteristic value, obtain the feedback signal value of the electronic delay module, and obtain the mixed signal I of the static current Iq and the dynamic current Is d +I s *R s, the microprocessor converts the mixed signal I d +I s *R s Perform data processing, analyze and process the feedback signal value and convert it into the feedback signal of the electronic delay module. After the electronic delay module confirms that the connection is correct after analysis and processing, the networking is completed;

[0089] It should be noted that the electronic delay module is an electronic device used to control the detonation time of the explosive device to ensure that the explosion is accurately triggered at the predetermined time point, which can improve the safety and efficiency of the blasting operation;

[0090] In some embodiments, the obtained static eigenvalue JT and dynamic eigenvalue DT are subjected to data analysis and processing, and the formula is: Get the feedback signal value FK, where a 1 and a 2 is the preset correlation coefficient;

[0091] It should be noted that the feedback signal value FK is calculated by analyzing and processing the static characteristic value JT and the dynamic characteristic value DT, which reflects the specific situation of the circuit of the device in the standby and running states, and determines whether the device can normally operate and complete the instruction operation. The static characteristic value JT reflects the specific situation of the circuit of the device in the standby state, and the dynamic characteristic value DT reflects the specific situation of the circuit of the device when it is working. When the device can normally operate and complete the instruction operation, the electronic delay module completes the networking after confirming that the connection is correct after analysis and processing, and sends the next instruction operation;

[0092] Based on the calculated feedback signal value FK and the preset feedback signal threshold FK 0 and FK 1 Compare and classify them into different types;

[0093] If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK 1 , the device can operate normally in standby and working states, the microprocessor analyzes and processes and sends a normal feedback signal to the electronic delay module, and the electronic delay module completes the networking after confirming that the connection is correct after analysis and processing;

[0094] If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK 0 And less than the feedback signal threshold FK 1 , the device cannot operate normally in the working state, and the microprocessor analyzes and processes and sends an abnormal feedback signal to the electronic delay module. The electronic delay module sends a cancel operation instruction after analysis and processing, and at the same time feedback shows that the device is abnormal in the working state;

[0095] If the calculated feedback signal value FK is less than the feedback signal threshold FK 0 , the device cannot operate normally in the standby state, and the microprocessor analyzes and processes and sends an abnormal feedback signal to the electronic delay module. The electronic delay module sends a cancel operation instruction after analysis and processing, and at the same time feedback shows that the device is abnormal in the standby state;

[0096] For example, setting a 1 =0.5, Feedback signal threshold FK 0 =2, feedback signal threshold FK 1 =4; if the static characteristic value JT is 1, and the dynamic characteristic value DT is 0, the feedback signal value is calculated by the formula The analysis shows that the device cannot operate normally in the standby state. The microprocessor analyzes and processes and sends an abnormal feedback signal to the electronic delay module. The electronic delay module sends a cancel operation instruction after analysis and processing. At the same time, the feedback shows that the device is abnormal in the standby state.

[0097] The technical solution of the embodiment of the present invention is: by real-time monitoring of static current and dynamic current, potential problems in the circuit can be discovered and diagnosed in time, thereby improving the overall reliability of the system; by setting the static current threshold and the dynamic current threshold and performing corresponding characteristic value analysis, factors that may cause failures can be detected at an early stage, thereby taking preventive measures; by clearly defining the static characteristic value JT and the dynamic characteristic value DT and setting the feedback signal threshold, the system can automatically identify and report any abnormal situation, so that the maintenance team can quickly locate the problem and reduce the troubleshooting time; by separating the static current and dynamic current signals and analyzing them independently, it is ensured that even if one or more parameters deviate from the normal range, the system can still make correct decisions; the feedback signal value FK is analyzed and processed by the microprocessor, and corresponding command responses are made according to different threshold intervals, so that the system has a certain degree of intelligent decision-making ability; by comprehensively considering the changes in static current and dynamic current, an effective means is provided to improve the reliability and safety of the equipment, and a more scientific method is also provided for the maintenance of the system, which is of great significance to ensure the normal operation of the equipment in a complex environment.

[0098] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited by the above embodiments. The above embodiments and descriptions are only for explaining the principles of the present invention and cannot be considered to limit the scope of implementation of the present invention. All equivalent changes and improvements made within the scope of the present invention should still fall within the scope of the patent coverage of the present invention.

Claims

1. A device for improving leakage current resistance and anti-interference, characterized in that: include: A first instrument amplification module (10), a second instrument amplification module (20), a third instrument amplification module (30), a static current adjustment module (40) and a microprocessor (50); The first instrument amplifier module includes: a sampling resistor Rs, a first instrument amplifier U1 and a first isolation resistor R1, which is used to sample and amplify the communication current by Av1 times, and the output voltage is: Vo1 = Id*Rs*Av1; The second instrument amplifier module includes: an impedance matching resistor Re, a feedback resistor Rf, a gain adjustment resistor Rg, a second instrument amplifier U2 and a second isolation resistor R2, which is used to amplify the analog signal Vdac output by the digital-to-analog converter DAC of the microprocessor by Av2 times, and the output voltage is: Vo2 = Iq*Av2; The third instrument amplifier module includes: a first voltage-dividing resistor R5, a second voltage-dividing resistor R6, a third voltage-dividing resistor R7, a third instrument amplifier U3 and a third isolation resistor R3, which is used to combine the outputs of the first and second instrument amplifier modules and buffer the outputs, and the total gain is 1, and the combined output is: Vo3 = Vo1-Vo2 = Iq*Av1; The static current adjustment module includes: a first load resistor R4, a second load resistor R8 and an NMOS switch tube M1, which are used to control the load resistance and voltage division ratio of the first instrument amplifier module to correctly obtain the static current Iq of the electronic delay module; The microprocessor includes: a microprocessor chip and its peripheral resistors, outputs analog signals, performs data processing on the mixed signals, and obtains feedback signals from the electronic delay module.

2. The device for improving leakage current resistance and anti-interference according to claim 1, characterized in that: The steps for measuring the static current of the device are: The microprocessor is initialized, P2.2 outputs a high level, M1 is turned on, the first load resistor R4 is grounded, and the second load resistor R8 is short-circuited; Lower the sampling resistance to prevent the output of the third instrument amplifier module from exceeding the input range of the microprocessor; Start the ADC, perform analog-to-digital conversion on Vo3, and obtain the quiescent current Iq.

3. The device for improving leakage current resistance and anti-interference according to claim 1, characterized in that: The steps of measuring dynamic current of the device are: The microprocessor works normally, P2.2 outputs a low level, M1 is cut off, and the first load resistor R4 and the second load resistor R8 are connected in series and grounded; Set R4+R8 to be much larger than R5+R6+R7, set DAC to work, and convert the static working current Iq into analog output Vdac; Send signaling, communicate normally with the electronic delay module, start ADC when the module returns data, and the first instrument amplifier module outputs sampling signals of static current Iq and dynamic current Is; After being amplified by the second instrument amplifier module, Vdac is combined with the sampling signal output by the first instrument amplifier module in the third instrument amplifier module for processing; Output Vo3, perform analog-to-digital conversion on Vo3, and obtain a mixed signal of the static current Iq and the dynamic current Is.

4. The device for improving leakage current resistance and anti-interference according to claim 1, characterized in that: The data processing steps of the device are: The microprocessor works normally, performs data processing on the mixed signal, and obtains the feedback signal of the electronic delay module; Since the dynamic signal Is is expanded to the original Rs times, the signal-to-noise ratio is increased, the anti-interference performance is improved, and the static current Iq input to the MCU maintains the original amplitude; The first instrument amplifier module and the second instrument amplifier module are set to operate at a set operating voltage VH to ensure that the sampling signal will not be saturated due to increasing the sampling resistance when the leakage current is high.

5. A method for improving leakage current resistance and anti-interference, characterized in that: include: Acquire static current data and dynamic current data of the circuit, analyze and process the static current data and the dynamic current data to obtain a mixed signal, and separate and preliminarily process the mixed signal before sending it; Based on the obtained static current data and the preset static current threshold I q0 By comparison and analysis, the static characteristic value JT is obtained; Based on the obtained dynamic current data and the preset dynamic current threshold I s0 Compare and analyze to get the dynamic characteristic value DT; The obtained static characteristic value JT and dynamic characteristic value DT are subjected to data analysis and processing, and the feedback signal value FK is obtained through analysis and processing; Based on the comparison of the calculated feedback signal value FK with the preset feedback signal thresholds FK0 and FK1, the feedback signal is divided into different types; Based on the feedback signal value of the electronic delay module, a mixed signal of the static current Iq and the dynamic current Is is obtained: I q +I s *R s , the microprocessor converts the mixed signal I q +I s *R s Data processing is performed to analyze and process the feedback signal value and convert it into the feedback signal of the electronic delay module. After the electronic delay module confirms that the connection is correct after analysis and processing, the networking is completed.

6. A method for improving leakage current resistance and anti-interference according to claim 5, characterized in that: Based on the obtained static current data and the preset static current threshold I q0 By comparison and analysis, the static characteristic value JT is obtained. The static current threshold represents the maximum current that the device can withstand to maintain normal standby mode. The static current threshold includes the maximum leakage current that the device can withstand to maintain normal standby mode.

7. The method for improving leakage current resistance and anti-interference according to claim 5, characterized in that: The specific process of obtaining the static characteristic value is as follows: If the quiescent current is less than the quiescent current threshold I q0 , then the static characteristic value JT is assigned a value of 1, indicating that the device maintains standby operation normally; If the quiescent current is greater than or equal to the quiescent current threshold I q0 , the static characteristic value JT is assigned a value of -1, indicating that the equipment maintains standby operation abnormally.

8. The method for improving leakage current resistance and anti-interference according to claim 5, characterized in that: The specific process of obtaining the dynamic characteristic value is as follows: Based on the obtained dynamic current data and the preset dynamic current threshold I s0 By comparison and analysis, the dynamic characteristic value DT is obtained. The dynamic characteristic threshold represents the maximum current that the device can withstand to maintain normal operation. The dynamic current threshold includes the maximum current that the device can withstand when a hardware fault occurs to maintain normal operation of the device. If the dynamic current is less than the dynamic current threshold I s0 , then the dynamic characteristic value DT is assigned to 1, indicating that the equipment is operating normally; If the dynamic current is greater than or equal to the dynamic current threshold I s0 , the dynamic characteristic value DT is assigned to -1, indicating that the equipment is operating abnormally.

9. The method for improving leakage current resistance and anti-interference according to claim 5, characterized in that: The specific process of obtaining the feedback signal value is as follows: The obtained static eigenvalue JT and dynamic eigenvalue DT are subjected to data analysis and processing, and the formula is: The feedback signal value FK is obtained, wherein a1 and a2 are preset correlation coefficients.

10. The method for improving leakage current resistance and anti-interference according to claim 5, characterized in that: The specific analysis process of the feedback signal value is as follows: If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK1, the device operates normally in the standby state and the working state, and the microprocessor analyzes and processes and sends a normal feedback signal to the electronic delay module. The electronic delay module completes the networking after confirming that the connection is correct after analysis and processing; If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK0 and less than the feedback signal threshold FK1, the device is operating abnormally in the working state, and the microprocessor analyzes and processes and sends an abnormal feedback signal to the electronic delay module. The electronic delay module sends a cancel operation instruction after analysis and processing, and at the same time feedback shows that the device is abnormal in the working state; If the calculated feedback signal value FK is less than the feedback signal threshold FK0, the device operates abnormally in the standby state. The microprocessor analyzes and processes and sends an abnormal feedback signal to the electronic delay module. The electronic delay module confirms and sends a cancel operation instruction after analysis and processing, and feedback shows that the device is abnormal in the standby state.

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