Sar-ss type adc circuit, module based on neighboring pixel prediction

By combining multi-column shared ADCs with a predictive control unit, the problem of excessive number of traditional column-level ADCs is solved, efficient and low-power processing of 11-bit quantization is achieved, and the conversion speed and accuracy of SAR-SS ADCs are improved.

CN119521034BActive Publication Date: 2025-10-10ANHUI UNIV
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Patent Information

Application Number
CN202411661132.9
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-11-20
Publication Date
2025-10-10
Estimated Expiration
2044-11-20

AI Technical Summary

Technical Problem

In traditional column-level ADCs, one ADC is equipped for each column, resulting in a large number of ADCs in total and a large occupied area. In addition, there is a clear exponential relationship between the conversion speed, power consumption and number of bits of the SS ADC. Improving the conversion accuracy by 1 bit requires a nearly exponential increase in speed and power consumption.

Method used

A SAR-SS ADC circuit based on adjacent pixel prediction is adopted. By sharing the ADC in multiple columns and combining it with the prediction control unit, it is determined whether 5-bit coarse quantization is needed. The 11-bit quantization is then decomposed into 5-bit coarse quantization by the SAR-ADC unit and 6-bit fine quantization by the SS-ADC unit, thus reducing unnecessary time and power consumption.

Benefits of technology

It effectively reduces the number of ADCs, lowers power consumption, and increases speed while maintaining conversion accuracy, achieving efficient processing of 11-bit quantization.

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Abstract

The application relates to the technical field of image sensor design, and particularly discloses a SAR-SS type ADC circuit and module based on adjacent pixel prediction.The SAR-SS type ADC circuit comprises a signal input part, a gain amplifier, a sampling and holding and voltage lifting part, a prediction control part, a SAR-ADC part, an SS-ADC part and a data processing part.The application adopts a multi-column shared ADC mode to reduce the number of ADCs; meanwhile, 11-bit quantization is decomposed into 5-bit coarse quantization by the SAR-ADC part and 6-bit fine quantization by the SS-ADC part, and a prediction control part is additionally arranged to judge whether 5-bit coarse quantization is needed, so as to reduce unnecessary time consumption and power consumption of the 5-bit coarse quantization.The application solves the problem that the total number of ADCs is relatively large due to the fact that one column is matched with one in the traditional column-level ADC.
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Description

Technical Field

[0001] The present invention relates to the technical field of image sensor design, and more specifically to: 1. a SAR-SS type ADC circuit based on adjacent pixel prediction; 2. a SAR-SS type ADC module based on adjacent pixel prediction. Background Art

[0002] Complementary Metal Oxide Semiconductor Image Sensor (CMOS) is a type of image sensor widely used in digital cameras, mobile phone cameras, and surveillance cameras. Its function is to convert optical signals into digital signals. The analog-to-digital converter (ADC) is one of the most important components in a CMOS image sensor, responsible for converting the electrical signals generated by the photosensitive element into digital signals. The performance of the ADC directly affects the image quality of the CMOS image sensor.

[0003] Currently, there are three main types of ADCs used in CMOS: pixel-level, column-level, and chip-level. Column-level ADCs offer significant advantages over the other two due to their low power consumption, ease of design, and high conversion efficiency. Commonly used column-level ADCs include primary and secondary approximation, cyclic, and monoslope types. Each structure offers distinct performance characteristics, with advantages and disadvantages in accuracy, speed, and power consumption. ADCs of varying structures can be selected based on specific needs. Among them, SS ADCs, with their simple structure, low power consumption, and small footprint, have become the mainstream ADC choice in CMOS.

[0004] However, traditional column-level ADCs typically use one per column. While this maintains processing efficiency, it results in a large number of ADCs, leading to a larger footprint. Furthermore, the conversion speed, power consumption, and number of bits of traditional SS ADCs exhibit a significant exponential relationship. Improving conversion accuracy by just one bit requires a near-doubling of speed and power consumption, particularly for CMOS. Therefore, increasing speed while reducing power consumption has become a key research focus for improving SS ADCs. Summary of the Invention

[0005] Based on this, it is necessary to provide a SAR-SS type ADC circuit and module based on adjacent pixel prediction to address the problem that the total number of ADCs is too large due to the traditional column-level ADC using one ADC per column.

[0006] The present invention is achieved by adopting the following technical solutions:

[0007] In a first aspect, the present invention provides a SAR-SS type ADC circuit based on adjacent pixel prediction, comprising: a signal input unit, a gain amplifier, a sampling and holding and voltage raising unit, a prediction control unit, a SAR-ADC unit, an SS-ADC unit, and a data processing unit.

[0008] 1. The signal input part is used to control the N-column pixel signal [V sig,1 ,V ref,1 ]~[V sig,N ,V ref,N ]Enter in sequence for 11-bit quantization.

[0009] Among them, in [V sig,a ,V ref,a ]After completing 11-bit quantization, enter [V sig,a+1 ,V ref,a+1 ]; a∈[1,N-1].

[0010] 2. Gain amplifier is used for: When [V sig,n ,V ref,n ]After inputting, V ref,n With V sig,n Subtract and amplify to generate pixel voltage V pixel,n ; n∈[1,N].

[0011] 3. The sampling and holding and voltage boosting section is used for:

[0012] ①According to V pixel,n Output hold voltage signal V at 5-bit coarse quantization s1,n ;

[0013] ②According to V pixel,n Combined with a fixed voltage V in 6-bit fine quantization end , reference voltage V x To output the boost voltage signal V s2,n .

[0014] 4. The predictive control unit is used to: When [V sig,b ,V ref,b ]After input, predict whether 5-bit coarse quantization is needed; b∈[2,N].

[0015] 5. SAR-ADC is used for:

[0016] ①When [V sig,1 ,V ref,1 ]After input, based on V s1,1 Perform 5-bit coarse quantization to obtain code value D1<10:6>;

[0017] ②When [V sig,b ,V ref,b]After input, the corresponding operation is performed according to the prediction result of the prediction control unit:

[0018] If the prediction control unit predicts that 5-bit coarse quantization is not necessary, D b-1 <10:6> As D b <10:6>;

[0019] If the prediction control unit predicts that 5-bit coarse quantization is required, then based on V s1,b Perform 5-bit coarse quantization to obtain the code value D b <10:6>.

[0020] 6. SS-ADC is used for:

[0021] ①When [V sig,1 ,V ref,1 ]After the SAR-ADC part completes the 5-bit coarse quantization, it is then based on V s2,1 Perform 6-bit fine quantization to obtain the code value D1<6:0>;

[0022] ②When [V sig,b ,V ref,b ]After input, the corresponding operation is performed according to the prediction result of the prediction control unit:

[0023] If the prediction control unit predicts that 5-bit coarse quantization is not necessary, it is directly based on V s2,b Perform 6-bit fine quantization to obtain the code value D b <6:0>;

[0024] If the prediction control unit predicts that 5-bit coarse quantization is required, the SAR-ADC unit will complete the 5-bit coarse quantization and then calculate the value of the 5-bit coarse quantization based on V s2,b Perform 6-bit fine quantization to obtain the code value D b <6:0>.

[0025] 7. Data processing unit is used to: n <6:0>、D n <10:6> Perform 11-bit numerical correction to obtain 11-bit quantization result D n <10:0>.

[0026] Among them, D n <10:0>=D n <10:6>-D n <6:0>+D n <4:0>;

[0027] D n <4:0> indicates the correction value, D n <4:0>=V end -Vpixel,n .

[0028] The implementation of the SAR-SS type ADC circuit based on adjacent pixel prediction is a method or process according to an embodiment of the present disclosure.

[0029] In a second aspect, the present invention discloses a SAR-SS type ADC module based on adjacent pixel prediction, which adopts the layout of a SAR-SS type ADC circuit based on adjacent pixel prediction disclosed in the first aspect.

[0030] The implementation of the SAR-SS type ADC module based on adjacent pixel prediction is a method or process according to an embodiment of the present disclosure.

[0031] Compared with the prior art, the present invention has the following beneficial effects:

[0032] Based on the principle that adjacent pixels are similar and the values ​​of voltage signals converted from adjacent pixels are likely to be close, the present invention adopts a multi-column shared ADC approach to reduce the number of ADCs. At the same time, 11-bit quantization is decomposed into 5-bit division quantization by the SAR-ADC unit and 6-bit fine quantization by the SS-ADC unit. A prediction control unit is added to determine whether 5-bit coarse quantization is needed, thereby reducing unnecessary time and power consumption of 5-bit coarse quantization. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0034] Figure 1 This is a schematic diagram of the processing of the multi-column shared ADC proposed by the present invention;

[0035] Figure 2 A schematic structural diagram of a SAR-SS type ADC circuit based on adjacent pixel prediction provided by the present invention;

[0036] Figure 3 for Figure 2 Circuit connection diagram of the signal input part and gain amplifier part;

[0037] Figure 4 for Figure 2 Circuit connection diagram of the sampling and holding and voltage boosting parts;

[0038] Figure 5 for Figure 4 Circuit connection diagram of 7-bit ramp generator;

[0039] Figure 6 for Figure 2 Circuit connection diagram of SAR-ADC unit and prediction control unit;

[0040] Figure 7 for Figure 6 Circuit connection diagram of the predictive control unit;

[0041] Figure 8 for Figure 2 Circuit connection diagram of SS-ADC part;

[0042] Figure 9 for Figure 2 Schematic diagram of SAR-SS type ADC circuit for prediction;

[0043] Figure 10 for Figure 2 Circuit diagram of the data processing unit. DETAILED DESCRIPTION

[0044] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0045] It should be noted that when a component is referred to as being "mounted on" another component, it may be directly on the other component or there may be a central component. When a component is considered to be "set on" another component, it may be directly set on the other component or there may be a central component. When a component is considered to be "fixed to" another component, it may be directly fixed to the other component or there may be a central component.

[0046] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this invention pertains. The terms used herein in the specification of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "or / and" as used herein includes any and all combinations of one or more of the associated listed items.

[0047] The design basis of the present invention is that because adjacent pixels have similarities, the values ​​of voltage signals converted from pixels in adjacent columns are also similar; therefore, a multi-column shared ADC approach can be adopted.

[0048] See Figure 1This demonstrates how every eight columns of pixels, grouped together, share a single SAR-SS ADC (SAR-SS-ADC) based on neighboring pixel prediction. It should be noted that while the number of columns can be increased or decreased, grouping them as a group achieves an optimal balance between efficiency and area.

[0049] Example 1

[0050] See Figure 2 , Figure 2 A schematic structural diagram of a SAR-SS ADC circuit based on adjacent pixel prediction provided in Example 1 is shown, which includes: a signal input unit, a gain amplification unit, a sampling and holding and voltage boosting unit, a prediction control unit, a SAR-ADC unit, an SS-ADC unit, and a data processing unit.

[0051] The following are introduced separately (considering that the prediction control unit, SAR-ADC unit, and SS-ADC unit are closely related, they are combined into the ADC processing unit and introduced together):

[0052] 1. The signal input part is used to control the N-column pixel signal [V sig,1 ,V ref,1 ]~[V sig,N ,V ref,N ] are input sequentially for 11-bit quantization. See above, the optimal value of N is 8.

[0053] It should be noted that [V sig,n ,V ref,n ]Includes: pixel reset signal V sig,n , pixel readout signal V ref,n ; n∈[1,N].

[0054] Among them, in [V sig,a ,V ref,a ]After completing 11-bit quantization, enter [V sig,a+1 ,V ref,a+1 ]; a∈[1,N-1].

[0055] That is to say, one working cycle of SAR-SS-ADC is the processing time of N columns of pixel signals: N columns of pixel signals complete 11-bit quantization in sequence——[V sig,1 ,V ref,1 ] input, and complete 11-bit quantization, then start [V sig,2 ,V ref,2 ] input and complete 11-bit quantization until [V sig,8 ,V ref,8 ]Input and complete 11-bit quantization.

[0056] See Figure 3 In order to ensure the above working order, the signal input part adopts the following design:

[0057] The signal input section includes: N switches S P,1 ~S P,N .

[0058] Among them, S P,n The first end of the connection [V sig,n ,V ref,n ], and the second end is connected to the gain amplifier.

[0059] In this way, only S P,1 ~S P,N Control them so that they are not closed simultaneously but in sequence. Specifically, first close S P,1 , S P,2 ~S P,N Keep disconnected, [V sig,1 ,V ref,1 ] is input; in [V sig,1 ,V ref,1 ]After completing 11bit quantization, close S P,2 , S P,1 、S P,3 ~S P,N Keep disconnected, [V sig,2 ,V ref,2 ] is input, and so on, until all columns are quantized to 11 bits.

[0060] 2. Gain amplifier is used for: When [V sig,n ,V ref,n ]After inputting, V ref,n With V sig,n Subtract and amplify to generate pixel voltage V pixel,n .

[0061] See Figure 3 , the input of the gain amplifier and S P,n The second end is connected to the output terminal for outputting V pixel,n The gain amplifier can use a programmable gain amplifier, which has the effect of reducing the effect of the pixel output bus on the noise of the subsequent ADC, and ref,n With V sig,n Subtract and amplify to generate pixel voltage V pixel,n This enables the function of analog multi-sampling and reduces the noise caused by pixels.

[0062] 3. The sampling and holding and voltage boosting section is used for:

[0063] ①According to V pixel,n Output hold voltage signal V at 5-bit coarse quantization s1,n;

[0064] ②According to V pixel,n Combined with a fixed voltage V in 6-bit fine quantization end , reference voltage V x To output the boost voltage signal V s2,n .

[0065] See Figure 4 The sampling and holding and voltage raising part includes: 3 switches S0~S2, 2 switches S h0 ~S h1 , 1 capacitor C H , 1 7-bit ramp generator.

[0066] The first end of S0 is connected to the output end of the gain amplifier, and the second end is connected to C H The first end of S1, the first end of S2; the second end of S1 is used to output V s1,n ; The second end of S2 is used to output V s2,n ; C H The second end is connected to S h0 The first end, S h1 The first end of S h0 The second terminal is used to input V end ;S h1 The second end is connected to the output end of the 7-bit ramp generator; the output end of the 7-bit ramp generator is used to output the ramp signal V ramp .

[0067] Among them, V end It is a fixed voltage value of external input, used to lower the V in 6-bit fine quantization ramp . V end V x (i.e. V ramp The starting voltage) is higher than a predetermined value.

[0068] S0 control C H S1 and S2 control the connection of SAR-ADC and SS-ADC.

[0069] For the 7-bit ramp generator, it is used to provide a ramp signal V ramp The 7-bit ramp generator can be used as follows: Figure 5 The design includes: conversion circuit part, current source part, differential switch part, and operational amplifier array part.

[0070] The conversion circuit includes: 1 resistor R, 1 resistor R dummy ; The second end of R is connected to R dummy The second end of

[0071] The current source section includes: 18 current sources I0~I 17 ; Among them, I0 is i0 current source (i0 represents standard current), I1 is 2i0 current source, I2 is 4i0 current source, I3~I 17 is an 8i0 current source;

[0072] The differential switch section includes: 36 switches S W,0 ~S W,35 ; Among them, I e By S W,c Connect the first end of R through S W,d Connect R dummy The first end of; c∈[0,2,4,…,34], d∈[1,3,5,…,35];

[0073] The operational amplifier array includes: 2 operational amplifiers A0~A1, 1 capacitor C x , 1 NMOS tube N1; the positive input end of A0 is connected to the first end of R; the negative input end of A0 is connected to the output end of A0 and serves as the output end of the 7-bit ramp generator to output V ramp ; The positive input of A1 is connected to C x The first end of R, the second end of R, the drain of N1, and the negative input end are connected to V x , the output terminal is connected to C x The second end of , the gate of N1; the source of N1 is grounded.

[0074] The design of the above 7-bit ramp generator adopts a combination of binary coding and thermometer coding, which can combine the advantages of low complexity and small area of ​​binary coding circuit with high linearity and small burrs of thermometer decoding: the use of binary coding for the lower 3 bits can reduce the number of thermometer coding bits, thereby reducing the area of ​​the thermometer coding circuit. At the same time, an inverter chain is added to transmit the input signal to ensure delay synchronization; the use of thermometer coding for the upper 4 bits reduces the noise generated by excessive flipping bits during the carry process; and an op amp A1 and an NMOS transistor N1 are used to form a negative feedback circuit, which uses the negative feedback principle of the op amp to clamp the initial voltage of the ramp to a fixed value V x , so that V ramp V x It gradually rises as the starting point and is connected to the output through operational amplifier A0.

[0075] 4. The ADC processing unit includes: prediction control unit, SAR-ADC unit, and SS-ADC unit.

[0076] 401, the prediction control unit is used to: when [V sig,b ,V ref,b ]After input, predict whether 5-bit coarse quantization is needed; b∈[2,N].

[0077] It should be noted that in the quantification [V sig,1 ,V ref,1 ], since there is no pre-coarse quantization data, [V sig,1 ,V ref,1 ] quantization cycle only includes 5-bit coarse quantization stage and 6-bit fine quantization stage; while in quantization [V sig,2 ,V ref,2 ]~[V sig,N ,V ref,N ], a quantization cycle includes a prediction stage (must be performed), a 5-bit coarse quantization stage (whether to perform is determined based on the result of the prediction stage), and a 6-bit fine quantization stage (must be performed).

[0078] See Figure 7 In general, when the prediction control unit works, it generates the control signal IN, the control signal IP, and the reset signal RST according to the comparison signal VP (the output signal of the comparator Comp0 of the SAR-ADC unit) and the control signal CTL.

[0079] The prediction control unit adopts the following design, including: 5 sub-latches Latch1~Latch5, 1 inverter INV, 1 buffer BUF, 1 XNOR gate XNOR, 1 OR gate OR, and 2 AND gates AND1~AND2.

[0080] The input end of Latch1 and the input end of Latch2 are connected to VP; the output end of Latch1 is used to output the latch value VP1; the output end of Latch1 is connected to the input end of INV; the output end of INV is used to output the control signal IN1; the output end of INV is connected to the input end 1 of AND1; the output end of Latch2 is used to output the latch value VP2; the output end of Latch1 is connected to the input end of BUF; the output end of BUF is connected to the input end 2 of AND1; the output end of AND1 is used to output the control signal IN2; the input end 1 of XNOR is connected to VP1, the input end 2 is connected to VP2, and the output end is connected to the input end of Latch3; the output end of Latch3 is used to output the reset signal RST; the input end of Latch4 is connected to VP1, and the output end is used to output the control signal IP; the input end of Latch5 is connected to IN1, and the output end is connected to the input end 1 of OR; the input end 1 of AND2 is connected to IN2, the input end 2 is connected to CTL, and the output end is connected to the input end 2 of OR; the output end of OR is used to output the control signal IN.

[0081] 402, SAR-ADC unit is used for:

[0082] ①When [V sig,1 ,V ref,1 ]After input, based on V s1,1Perform 5-bit coarse quantization to obtain code value D1<10:6>;

[0083] ②When [V sig,b ,V ref,b ]After input, the corresponding operation is performed according to the prediction result of the prediction control unit:

[0084] If the prediction control unit predicts that 5-bit coarse quantization is not necessary, D b-1 <10:6> As D b <10:6>;

[0085] If the prediction control unit predicts that 5-bit coarse quantization is required, then based on V s1b Perform 5-bit coarse quantization to obtain the code value D b <10:6>.

[0086] See Figure 6 The SAR-ADC unit includes: a SAR logic unit, a capacitor array unit, a switch array unit, a coarse quantization power consumption controller, a comparator Comp0, a 5-bit latch, and three switches S3 to S5.

[0087] The first terminal of S3 is connected to the control voltage V cm , the second end is connected to the first end of S5 and the first end of S4;

[0088] The second end of S5 is used to output the array voltage V sar1 The second end of S4 is used to output the array voltage V sar0 ;

[0089] The negative input terminal of Comp0 is connected to the second terminal of S1 , the positive input terminal is connected to the second terminal of S4 , and the output terminal is used to output comparison signals VP and VN.

[0090] The capacitor array section includes: 5 capacitors C in parallel A ~C E ; C A ~C E The first end of is connected to the second end of S3. A ~C E The capacitance ratio is 1:1:2:4:8.

[0091] The switch array section includes: 15 switches S A0 ~S E0 、S A1 ~S E1 、S A2 ~S E2 ; Among them, S σ0 The first end, S σ1 The first end, S σ2 The first end is connected to Cσ the second end of S σ0 is connected to the control voltage V cm ; the second end of S σ1 is connected to the control voltage V l ; the second end of S σ2 is connected to the control voltage V h ; σ∈[A,B,C,D,E].

[0092] The SAR logic part is an asynchronous SAR logic, which is used to:

[0093] ① in 5bit coarse quantization, adjust the switch array part and S3 according to VP and VN;

[0094] ② in the working of the prediction control part, adjust S A0 ~S A2 and S3 according to IN, IP and RST.

[0095] Specifically, referring to Figure 6 , the SAR logic part generates the signal Ctrl_S3 for controlling S3 and the signal group Ctrl_S for controlling the switch array part. It should be noted that since there are 15 switches in the switch array part, Ctrl_S also contains 15 corresponding switch control signals (i.e. Ctrl_S A0 ~Ctrl_S E0 , Ctrl_S A1 ~Ctrl_S E1 , Ctrl_S A2 ~Ctrl_S E2 ), which are used to control S A0 ~S E0 , S A1 ~S E1 , S A2 ~S E2 respectively.

[0096] The coarse quantization power consumption control part is used to control Comp0 and close in time to reduce power consumption (by setting a time threshold: when Comp0 works to the time threshold, Comp0 can be closed);

[0097] The 5bit latch is used to latch the output signal of the SAR logic part and output D n <10:6>.

[0098] That is, the capacitor array part cooperates with the switch array part and S3 to adjust the first end voltage of S4 and S5; the SAR logic part controls the switch array part and S3; and S4 and S5 are connected in different stages to complete the corresponding stage work.

[0099] It should be noted that the SAR-ADC unit works in both the prediction stage and the 5-bit coarse quantization stage.

[0100] 403, SS-ADC unit is used for:

[0101] ①When [V sig,1 ,V ref,1 ]After the SAR-ADC part completes the 5-bit coarse quantization, it is then based on V s2,1 Perform 6-bit fine quantization to obtain the code value D1<6:0>;

[0102] ②When [V sig,b ,V ref,b ]After input, the corresponding operation is performed according to the prediction result of the prediction control unit:

[0103] If the prediction control unit predicts that 5-bit coarse quantization is not necessary, it is directly based on V s2,b Perform 6-bit fine quantization to obtain the code value D b <6:0>;

[0104] If the prediction control unit predicts that 5-bit coarse quantization is required, the SAR-ADC unit will complete the 5-bit coarse quantization and then calculate the value of the 5-bit coarse quantization based on the V s2,b Perform 6-bit fine quantization to obtain the code value D b <6:0>.

[0105] See Figure 8 The SS-ADC part includes: 1 comparator Comp1, 1 7-bit counter, 1 7-bit latch, and 1 fine-grained power consumption controller.

[0106] The positive input terminal of Comp1 is connected to the second terminal of S5, the negative input terminal is connected to the second terminal of S2, and the output terminal is used to output the control signal Counter_run;

[0107] The control terminal of the 7-bit counter is connected to the output terminal of Comp1, and the output terminal is connected to the 7-bit latch;

[0108] The 7-bit latch is used to latch the output signal of the 7-bit counter and output D n <6:0>;

[0109] The fine-grained power consumption control unit is used to control Comp1 to be turned off in time to reduce power consumption (through feedback control: when Counter_run is reversed, Comp1 can be turned off).

[0110] It should be noted that the SS-ADC part only works in the 6-bit fine quantization stage - although the fine quantization is designed to be 6 bits, in order to compensate for the error that may occur between coarse and fine quantization, a 1-bit redundant mode is adopted, that is, a 7-bit slope generator is used in the sample and hold and voltage lifting part, and a 7-bit counter is used in the SS-ADC, and subsequent correction is performed in the data processing part.

[0111] In addition, in the SAR-ADC part and the SS-ADC part described above, Comp0 and Comp1 are both dynamic comparators but have differences: Comp0 has only one preamplifier, and a kickback voltage reduction circuit is added to reduce the influence of kickback noise on Comp0; Comp1 uses a three-stage preamplifier structure and uses an output offset cancellation method to reduce the offset voltage.

[0112] In addition, for S1, S2, S4 and S5 described above, a unified control signal Ctrl_cmp can be used (that is, the control end is connected to the control signal Ctrl_cmp); it should be noted that when Ctrl_cmp is low, S1 and S4 are closed, and S2 and S5 are open; when Ctrl_cmp is high, S1 and S4 are open, and S2 and S5 are closed.

[0113] At this point, based on the above-mentioned sample and hold and voltage lifting part, prediction control part, SAR-ADC part and SS-ADC part:

[0114] ①In the 5-bit coarse quantization stage (when quantizing [V sig,1 ,V ref,1 ], it must be performed, and when quantizing [V sig,2 ,V ref,2 ]~[V sig,N ,V ref,N ], it is determined whether to perform according to the result of the prediction stage):

[0115] S0, S h0 and S1 are closed, S h0 is open, C H stores the difference voltage ΔV between V pixel,n and V end (at this time, ΔV = V pixel,n -V end ), and V pixel,n is directly used as V s1,n ;

[0116] S3 and S4 are closed, S A0 -S E0 are closed, S A1 -S E1 , S A2 -S E2 are open, CA ~C E Both connected to V cm , V sar0 Connect to Comp0 and connect to V s1,n Compare and output VP and VN to the SAR logic unit. The prediction control unit does not work at this time.

[0117] On the one hand, the SAR logic part is based on the asynchronous SAR logic method, which adjusts the switch array part and S3 according to VP and VN, and then adjusts V sar0 The specific method is as follows: SAR logic generates Ctrl_S3 according to VP and VN to keep S3 disconnected, and also generates Ctrl_S to control S E0 Disconnect, S E1 or S E2 Closed, the other switches in the switch array remain in their previous state, that is, S A0 ~S D0 Closed, S A1 ~S D1 、S A2 ~S D2 Disconnect; S E1 or S E2 After closing, V sar0 If the value changes, VP and VN will also change. The SAR logic will first generate a new Ctrl_S based on the new VP and VN to control S D0 Disconnect, S D1 or S D2 Closed, the other switches in the switch array remain in their previous state, that is, S A0 ~S C0 Closed, S A1 ~S C1 、S A2 ~S C2 Disconnect; and so on until S B0 ~S B2 Complete strobe; in S B0 ~S B2 After the selection is completed, the SAR logic unit will first generate a new Ctrl_S according to the new VP and VN to control S A1 Disconnect, S A0 or S A2 closure.

[0118] On the other hand, the 5-bit latch latches the output signal of the SAR logic unit and outputs D n <10:6>; until the coarse quantization is completed.

[0119] It should be noted that when the 5-bit coarse quantization reaches the last bit, in order to ensure the connection between coarse and fine quantization, the final output voltage of the 5-bit coarse quantization must be above the input voltage of Comp0. However, due to non-ideal characteristics such as comparator offset voltage, Comp0 flip errors may occur. Therefore, in the 6-bit fine quantization stage, the signal is pulled down by a certain amount of voltage to compensate for the possible flip errors. The correction value is: V end -V x .

[0120] ② In the 6-bit fine quantization stage (in quantization [V sig,1 ,V ref,1 ]~[V sig,N ,V ref,N ] must be carried out):

[0121] S h1 , S2 is closed, S0, S1 are disconnected, C H The second terminal is connected to V ramp , C H The voltage at the first terminal is V s2,n ——The difference voltage ΔV retained by the 5-bit coarse quantization in the previous stage plus V ramp (At this time, V s2,n =ΔV+V ramp ), thereby pulling the slope downward;

[0122] S4 is open, S5 is closed, V sar1 Connect to Comp1 and connect to V s2,n Compare, thus outputting Counter_run to drive the 7-bit counter to start counting, until Counter_run reverses and the 7-bit counter stops counting; the 7-bit latch latches the count value of the 7-bit counter and outputs D n <6:0>.

[0123] ③In the prediction stage (in the quantization [V sig,2 ,V ref,2 ]~[V sig,N ,V ref,N ] must be carried out):

[0124] The sampling and holding and voltage raising parts also adopt the 5-bit coarse quantization stage control method: S0, S h0 , S1 is closed, S h1 Disconnect, C H Storage V pixel,b With V end The difference voltage (in this case, ΔV=V pixel,b -V end ), V pixel,b Directly as Vs1,b .

[0125] The prediction phase will go through Figure 9 The first 2 periods shown: T p0 、T p1 ;also, Figure 9 The last two periods T are also shown. coarse (5-bit coarse quantization), T fine (6-bit fine quantization):

[0126] There are four situations in the prediction stage:

[0127] (1) If Figure 9 As shown in a:

[0128] In T p0 During this period, S3 is open, S4 is closed, S A0 Closed, S A1 、S A2 Disconnect, S B0 ~S B2 、S E0 ~S E2 Keep the switch state of the previous coarse quantization unchanged, at this time Comp0 is V sar0 、V s1,n Compare and output VP and VN; different from the 5-bit coarse quantization stage, the prediction control unit works at this time and processes VP and CTL, and outputs IP, IN, and RST to the SAR logic unit.

[0129] The SAR logic unit is still based on asynchronous SAR logic, and controls S according to IP, IN, and RST. A0 ~S A2 and S3 to adjust V sar0 The 5-bit latch does not work at this time and temporarily stores the result of the last 5-bit coarse quantization.

[0130] In T p1 During this period, S3 remains disconnected, S A2 Closed, S A0 、S A1 Disconnect, C A Connect to V h If V s1,b <V sar0 , we can determine the pixel voltage value V s1,b If the pixel voltage value is close to the previous column, the 5-bit coarse quantization stage is skipped: that is, at T coarse During this period, the SAR logic unit does not need to take any action and remains unchanged; during T fine During this period, 6-bit fine quantization is normally performed.

[0131] (2) IfFigure 9 As shown in b:

[0132] In T p0 During this period, S3 is open, S4 is closed, S A0 Closed, S A1 、S A2 Disconnect, S B0 ~S B2 、S E0 ~S E2 Keep the switch state of the previous coarse quantization unchanged, at this time Comp0 is V sar0 、V s1,n Compare and output VP and VN; different from the 5-bit coarse quantization stage, the prediction control unit works at this time and processes VP and CTL, and outputs IP, IN, and RST to the SAR logic unit.

[0133] The SAR logic unit is still based on asynchronous SAR logic, and controls S according to IP, IN, and RST. A0 ~S A2 and S3 to adjust V sar0 The 5-bit latch does not work at this time and temporarily stores the result of the last 5-bit coarse quantization.

[0134] In T p1 During this period, S3 remains disconnected, S A1 Closed, S A0 、S A2 Disconnect, C A Connect to V1; if V s1,b >V sar0 , we can determine the pixel voltage value V s1,b If the pixel voltage value is close to the previous column, the 5-bit coarse quantization stage is skipped: that is, at T coarse During this period, the SAR logic unit does not need to take any action and remains unchanged; during T fine During this period, 6-bit fine quantization is normally performed.

[0135] (3) If Figure 9 As shown in c:

[0136] In T p0 During this period, S3 is open, S4 is closed, S A0 Closed, S A1 、S A2 Disconnect, S B0 ~S B2 、S E0 ~S E2 Keep the switch state of the previous coarse quantization unchanged, at this time Comp0 is V sar0 、V s1,nCompare and output VP and VN; different from the 5-bit coarse quantization stage, the prediction control unit works at this time and processes VP and CTL, and outputs IP, IN, and RST to the SAR logic unit.

[0137] The SAR logic unit is still based on asynchronous SAR logic, and controls S according to IP, IN, and RST. A0 ~S A2 and S3 to adjust V sar0 The 5-bit latch does not work at this time and temporarily stores the result of the last 5-bit coarse quantization.

[0138] In T p1 Period, S3 closed, S A1 Closed, S A0 、S A2 Disconnect, C A Connect to V1; if V s1,b <V sar0 , we can determine the pixel voltage value V s1,b If the pixel voltage value is not near the previous column, the 5-bit coarse quantization stage cannot be skipped: the prediction control unit resets the SAR-ADC unit; at T coarse During the period, 5-bit coarse quantization is normally performed; fine During this period, 6-bit fine quantization is normally performed.

[0139] (4) If Figure 9 As shown in d:

[0140] In T p0 During this period, S3 is open, S4 is closed, S A0 Closed, S A1 、S A2 Disconnect, S B0 ~S B2 、S E0 ~S E2 Keep the switch state of the previous coarse quantization unchanged, at this time Comp0 is V sar0 、V s1,n Compare and output VP and VN; different from the 5-bit coarse quantization stage, the prediction control unit works at this time and processes VP and CTL, and outputs IP, IN, and RST to the SAR logic unit.

[0141] The SAR logic unit is still based on asynchronous SAR logic, and controls S according to IP, IN, and RST. A0 ~S A2 and S3 to adjust V sar0 The 5-bit latch does not work at this time and temporarily stores the result of the last 5-bit coarse quantization.

[0142] In T p1Period, S3 closed, S A2 Closed, S A0 、S A1 Disconnect, C A Connect to V h If V s1,b >V sar0 , we can determine the pixel voltage value V s1,b If the pixel voltage value is not near the previous column, the 5-bit coarse quantization stage cannot be skipped: the prediction control unit resets the SAR-ADC unit; at T coarse During the period, 5-bit coarse quantization is normally performed; fine During this period, 6-bit fine quantization is normally performed.

[0143] Combining the above four situations, we can successfully obtain D n <6:0>, D n <10:6>.

[0144] 5. Data processing unit is used to: n <6:0>, D n <10:6> Perform 11-bit numerical correction to obtain 11-bit quantization result D n <10:0>.

[0145] Among them, D n <10:0>=D n <10:6>-D n <6:0>+D n <4:0>;

[0146] D n <4:0> indicates the correction value, D n <4:0>=V end -V x .

[0147] See Figure 10 The data processing unit can be designed to include: 1 subtractor, 1 value corrector, and 1 10-bit latch.

[0148] The numerical modifier is used to provide D n <4:0>; the input of the subtractor is connected to D n <10:6>, input terminal 2 is connected to D n <6:0>, input terminal three-connection D n <4:0>, the output end is connected to the 10-bit latch; the 10-bit latch is used to latch the output signal of the subtractor and output D n <10:0>.

[0149] That is, the subtractor implements D n<10:6>-D n <6:0>+D n <4:0> and output to the 10-bit latch, the 10-bit latch outputs the final data as D n <10:0>.

[0150] The SAR-SS-ADC circuit based on the above design can realize [V sig,1 ,V ref,1 ]~[V sig,N ,V ref,N ] Perform 11-bit quantization sequentially, reduce the number of ADCs, and reduce unnecessary time and power consumption of 5-bit coarse quantization.

[0151] Example 2

[0152] This embodiment 2 discloses a SAR-SS ADC module based on adjacent pixel prediction, which adopts the layout of the SAR-SS ADC circuit based on adjacent pixel prediction disclosed in embodiment 1. The packaging mode makes it easier to promote and apply the above circuit.

[0153] The SAR-SS ADC module based on adjacent pixel prediction includes: a signal input module (corresponding to the signal input unit), a gain amplification module (corresponding to the gain amplification unit), a sample-hold and voltage-boosting module (corresponding to the sample-hold and voltage-boosting unit), a prediction control module (corresponding to the prediction control unit), a SAR-ADC module (corresponding to the SAR-ADC unit), an SS-ADC module (corresponding to the SS-ADC unit), and a data processing module (corresponding to the data processing unit). The specific circuit layout is described in Example 1 and will not be repeated here.

[0154] This embodiment 2 also simultaneously discloses a CMOS image sensor, which adopts the above-mentioned SAR-SS type ADC module based on adjacent pixel prediction.

[0155] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0156] The above-described embodiments merely illustrate several implementations of the present invention, and while their descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent. It should be noted that a person skilled in the art would be able to make numerous variations and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present invention. Therefore, the scope of protection of the patent for this invention shall be determined by the appended claims.

Claims

1. A SAR-SS type ADC circuit based on adjacent pixel prediction, characterized in that: include: Signal input part, which is used to control the N-column pixel signal [V sig,1 ,V ref,1 ]~[V sig,N ,V ref,N ] are input sequentially for 11-bit quantization; where [V sig,a ,V ref,a ]After completing 11-bit quantization, enter [V sig,a+1 ,V ref,a+1 ]; a∈[1,N-1]; N=8; Gain amplifier section, which is used for: When [V sig,n ,V ref,n ]After input, the pixel reset signal V ref,n and the pixel readout signal V sig,n Subtract and amplify to generate pixel voltage V pixel,n ; n∈[1,N]; The sampling and holding and voltage raising part is used to: pixel,n Output hold voltage signal V at 5-bit coarse quantization s1,n , combined with a fixed voltage V when 6-bit fine quantization end , reference voltage V x To output the boost voltage signal V s2,n ; The predictive control unit is used to: sig,b ,V ref,b ]After input, predict whether 5-bit coarse quantization is needed; b∈[2,N]; SAR-ADC section, which is used for: When [V sig,1 ,V ref,1 ]After input, based on V s1,1 Perform 5-bit coarse quantization to obtain the code value D1<10:6>; when [V sig,b ,V ref,b ] is input, and the corresponding operation is performed according to the prediction result of the prediction control unit; if the prediction control unit predicts that 5-bit coarse quantization is not required, D is retained. b-1 <10:6> As D b <10:6>; If the prediction control unit predicts that 5-bit coarse quantization is required, then based on V s1,b Perform 5-bit coarse quantization to obtain the code value D b <10:6>; SS-ADC section, which is used for: When [V sig,1 ,V ref,1 ]After the SAR-ADC part completes the 5-bit coarse quantization, it is then based on V s2,1 Perform 6-bit fine quantization to obtain the code value D1<6:0>; when [V sig,b ,V ref,b ] input, the corresponding operation is performed according to the prediction result of the prediction control unit; wherein, if the prediction control unit predicts that 5-bit coarse quantization is not required, it is directly based on V s2,b Perform 6-bit fine quantization to obtain the code value D b <6:0>; If the prediction control unit predicts that 5-bit coarse quantization is required, wait until the SAR-ADC unit completes the 5-bit coarse quantization, and then based on V s2,b Perform 6-bit fine quantization to obtain the code value D b <6:0>; as well as The data processing unit is used to n <6:0>、D n <10:6> Perform 11-bit numerical correction to obtain 11-bit quantization result D n <10:0>; Among them, D n <10:0>=D n <10:6>-D n <6:0>+D n <4:0>; D n <4:0> indicates the correction value, D n <4:0>=V end -V x .

2. The SAR-SS type ADC circuit based on adjacent pixel prediction according to claim 1, characterized in that: The signal input unit includes: N switches S P,1 ~S P,N ; Among them, S P,n The first end of the connection [V sig,n ,V ref,n ]; The input end of the gain amplifier is connected to S P,n The second end, the output end is used to output V pixel,n .

3. The SAR-SS type ADC circuit based on adjacent pixel prediction according to claim 1, characterized in that: The sampling, holding and voltage raising unit includes: 3 switches S0-S2, 2 switches S h0 ~S h1 , 1 capacitor C H , 1 7-bit ramp generator; The first end of S0 is connected to the output end of the gain amplifier, and the second end is connected to C H the first end of S1, the first end of S2; The second end of S1 is used to output V s1,n ; The second end of S2 is used to output V s2,n ; C H The second end is connected to S h0 The first end, S h1 The first end of S h0 The second terminal is used to input V end ;S h1 The second end is connected to the output end of the 7-bit ramp generator; the output end of the 7-bit ramp generator is used to output the ramp signal V ramp .

4. The SAR-SS type ADC circuit based on adjacent pixel prediction according to claim 3, characterized in that: The 7-bit ramp generator includes: a conversion circuit part, a current source part, a differential switch part, and an operational amplifier array part; The conversion circuit includes: 1 resistor R, 1 resistor R dummy ; The second end of R is connected to R dummy the second end; The current source section includes: 18 current sources I0~I 17 ; Among them, I0 is i0 current source, I1 is 2i0 current source, I2 is 4i0 current source, I3~I 17 is an 8i0 current source; i0 represents the standard current; The differential switch section includes: 36 switches S W,0 ~S W,35 ; Among them, I e By S W,c Connect the first end of R through S W,d Connect R dummy The first end of ; c∈[0,2,4,…,34], d∈[1,3,5,…,35]; The operational amplifier array includes: 2 operational amplifiers A0~A1, 1 capacitor C x , 1 NMOS tube N1; the positive input end of A0 is connected to the first end of R; the negative input end of A0 is connected to the output end of A0 and serves as the output end of the 7-bit ramp generator to output V ramp ; The positive input of A1 is connected to C x The first end of R, the second end of R, the drain of N1, and the negative input end are connected to V x , the output terminal is connected to C x The second end of , the gate of N1; the source of N1 is grounded.

5. The SAR-SS type ADC circuit based on adjacent pixel prediction according to claim 3 or 4, characterized in that: The SAR-ADC unit includes: a SAR logic unit, a capacitor array unit, a switch array unit, a coarse quantization power consumption controller, a comparator Comp0, a 5-bit latch, and three switches S3 to S5; The first terminal of S3 is connected to the control voltage V cm , the second end is connected to the first end of S5 and the first end of S4; The second end of S5 is used to output the array voltage V sar1 ; The second end of S4 is used to output the array voltage V sar0 ; The negative input terminal of Comp0 is connected to the second terminal of S1, the positive input terminal is connected to the second terminal of S4, and the output terminal is used to output comparison signals VP and VN. When the predictive control unit is in operation, it generates a control signal IN, a control signal IP, and a reset signal RST according to VP and the control signal CTL. The capacitor array section includes: 5 capacitors C in parallel A ~C E ; C A ~C E The first end of is connected to the second end of S3; The switch array section includes: 15 switches S A0 ~S E0 、S A1 ~S E1 、S A2 ~S E2 ; Among them, S σ0 The first end, S σ1 The first end, S σ2 The first end is connected to C σ The second end of S σ0 The second end is connected to the control voltage V cm ;S σ1 The second end is connected to the control voltage V l ;S σ2 The second end is connected to the control voltage V h ;σ∈[A,B,C,D,E]; The SAR logic is an asynchronous SAR logic, which is used to adjust the switch array and S3 according to VP and VN during 5-bit coarse quantization, and adjust S according to IN, IP, and RST during the operation of the prediction control unit. A0 ~S A2 and S3; The coarse power consumption control unit is used to control Comp0 to shut down in time to reduce power consumption; The 5-bit latch is used to latch the output signal of the SAR logic unit and output D n <10:6>.

6. The SAR-SS type ADC circuit based on adjacent pixel prediction according to claim 5, characterized in that: The prediction control unit includes: 5 sub-latches Latch1 to Latch5, 1 inverter INV, 1 buffer BUF, 1 exclusive OR gate XNOR, 1 OR gate OR, and 2 AND gates AND1 to AND2; The input of Latch1 and Latch2 are connected to VP; The output end of Latch1 is used to output the latch value VP1; the output end of Latch1 is connected to the input end of INV; the output end of INV is used to output the control signal IN1; the output end of INV is connected to the input end 1 of AND1; The output end of Latch2 is used to output the latch value VP2; the output end of Latch1 is connected to the input end of BUF; the output end of BUF is connected to the second input end of AND1; the output end of AND1 is used to output the control signal IN2; The first input of XNOR is connected to VP1, the second input is connected to VP2, and the output is connected to the input of Latch3; the output of Latch3 is used to output the reset signal RST; The input end of Latch4 is connected to VP1, and the output end is used to output the control signal IP; The input of Latch5 is connected to IN1, and the output is connected to input 1 of OR; Input 1 of AND2 is connected to IN2, input 2 is connected to CTL, and the output is connected to input 2 of OR; The output terminal of the OR is used to output a control signal IN.

7. The SAR-SS type ADC circuit based on adjacent pixel prediction according to claim 5, characterized in that: The control terminals of S1, S2, S4 and S5 are connected to the control signal Ctrl_cmp; Among them, when Ctrl_cmp is low, S1 and S4 are closed, and S2 and S5 are open; When Ctrl_cmp is high, S1 and S4 are open, and S2 and S5 are closed.

8. The SAR-SS type ADC circuit based on adjacent pixel prediction according to claim 5, characterized in that: The SS-ADC section includes: a comparator Comp1, a 7-bit counter, a 7-bit latch, and a fine-grained power consumption controller; The positive input terminal of Comp1 is connected to the second terminal of S5, the negative input terminal is connected to the second terminal of S2, and the output terminal is used to output the control signal Counter_run; The control terminal of the 7-bit counter is connected to the output terminal of Comp1, and the output terminal is connected to the 7-bit latch; The 7-bit latch is used to latch the output signal of the 7-bit counter and output D n <6:0>; The fine-grained power consumption control unit is used to control Comp1 to be turned off in time to reduce power consumption.

9. The SAR-SS type ADC circuit based on adjacent pixel prediction according to claim 1, characterized in that: The data processing unit includes: a subtractor, a value corrector, and a 10-bit latch; The numerical modifier is used to provide D n <4:0>; The input of the subtractor is connected to D n <10:6>, input terminal 2 is connected to D n <6:0>, input terminal three-connection D n <4:0>, the output is connected to a 10-bit latch; The 10-bit latch is used to latch the output signal of the subtractor and output D n <10:0>.

10. A SAR-SS type ADC module based on adjacent pixel prediction, characterized in that: A layout of a SAR-SS type ADC circuit based on adjacent pixel prediction as described in any one of claims 1 to 9 is adopted.

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