Test method, system, terminal and storage medium based on microinstruction classification operation

Abstract

The present application relates to a test method, system, terminal and storage medium based on microinstruction classification operation, and relates to the field of test technology. The method includes: in response to receiving a step instruction, classifying the microinstructions in the step instruction and determining the classification priority of the microinstructions, wherein the step instruction also includes a test instruction; in response to satisfying the test start condition, reading the microinstructions in sequence according to the classification priority; running the microinstructions according to the classification priority to obtain a special execution state of the test instruction, the special execution state is used to represent the test logic of the test instruction; reading and executing the test instruction according to the special execution state to obtain the test result of the electronic component. The present application has the effect of simplifying the setting of the step instruction.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a testing method, system, terminal and storage medium based on microinstruction classification operation. Background Art

[0002] Electronic component testing is a testing process that electronic components must undergo before leaving the factory. The purpose is to ensure that the electronic components meet the design requirements, can work normally and achieve the expected performance. During the testing process, it is necessary to consider various parameters of the components, their working status and their interactions with other components.

[0003] In the process of testing, the related technology uses step instructions to perform various operation steps. The step instructions include two parts: test instructions and microinstructions. In the setting of microinstructions, it is necessary to list the microinstructions as a whole according to the functional requirements. For example, if a loop is required before a jump, the loop microinstruction needs to be set first and the jump microinstruction needs to be set later.

[0004] With respect to the above-mentioned related technologies, the inventors believe that the setting order of microinstructions needs to strictly follow the test logic. In actual operation, it is easy to make setting order errors, resulting in errors in the overall test process, making the setting of step instructions more inconvenient. Summary of the invention

[0005] In order to simplify the setting of step instructions, the present application provides a test method, system, terminal and storage medium based on microinstruction classification operation.

[0006] In the first aspect, the present application provides a testing method based on microinstruction classification operation, which adopts the following technical solution:

[0007] A testing method based on microinstruction classification operation, comprising:

[0008] In response to receiving a step instruction, classifying microinstructions in the step instruction and determining a classification priority of the microinstructions, the step instruction further comprising a test instruction;

[0009] In response to satisfying a test start condition, reading the microinstructions in order according to the classification priority;

[0010] Running the microinstructions according to the classification priority to obtain a special execution state of the test instruction, wherein the special execution state is used to represent the test logic of the test instruction;

[0011] The test instruction is read and executed according to the special execution state to obtain the test result of the electronic component.

[0012] By adopting the above technical solution, the classification priority of the microinstructions is set, so that when testing electronic components, the microinstructions are read in sequence according to the classification priority, rather than according to the input order of the microinstructions. Therefore, when inputting microinstructions, the input order of the microinstructions can be ignored, which simplifies the input of microinstructions and thus simplifies the input of step instructions.

[0013] Optionally, in response to receiving the step instruction, the microinstructions are divided into a plurality of microinstruction groups according to a correspondence between the test instruction and the microinstructions;

[0014] Reading the instruction type of the test instruction corresponding to the microinstruction group;

[0015] Obtaining a test scenario for the electronic component;

[0016] The classification priority is determined according to the instruction type and the test scenario.

[0017] By adopting the above technical solution, different classification priorities are assigned to different microinstruction groups, so that the classification priority corresponding to each microinstruction group can adapt to different scenarios, thereby enhancing the universality of the solution.

[0018] Optionally, when the test result is an error, reading the problematic microinstruction group according to the test result;

[0019] Obtaining candidate classification priorities corresponding to the problematic microinstruction group;

[0020] Executing a first updating step, the first updating step comprising: updating the candidate classification priorities so that the candidate classification priorities are different in each iteration process;

[0021] Executing a first test step, the first test step comprising: testing the electronic components according to the candidate classification priority to obtain a first candidate test result;

[0022] Iterate the first updating step and the first testing step to obtain several groups of the first candidate test results;

[0023] Determine target test results from several groups of the first candidate test results, and record the classification priorities corresponding to the target test results, the target test results being test passed.

[0024] By adopting the above technical solution, the test logic of the electronic components is adjusted by updating the classification priority, and the correct classification priority is determined. Therefore, the technical solution provides a method for automatically repairing classification priority errors, and even if the relevant personnel input an incorrect classification priority, the classification priority can still be repaired.

[0025] Optionally, when there are at least two target test results, the target test results are scored according to a preset standard to obtain an evaluation score;

[0026] Calculate the score difference between the maximum evaluation score and the other evaluation scores among the evaluation scores;

[0027] If there is a first evaluation score in the evaluation scores, such that the difference between the first evaluation score and the maximum evaluation score is less than a preset difference threshold, a first test purpose corresponding to the first evaluation score is determined through a test model, and a second test purpose corresponding to the maximum evaluation score is determined through the test model;

[0028] Calculating a first similarity between the first test objective and an initial test requirement of the electronic component, and calculating a second similarity between the second test objective and the initial test requirement;

[0029] When the first similarity is greater than the second similarity, recording the classification priority corresponding to the first evaluation score;

[0030] When the first similarity is less than the second similarity, the classification priority corresponding to the maximum evaluation score is recorded.

[0031] By adopting the above technical solution, the ideal test results are determined from multiple target test results, and the classification priorities corresponding to the aforementioned test results are recorded, thereby providing samples for subsequent tests and ensuring the accuracy of subsequent tests.

[0032] Optionally, when the target test result is not detected, the first candidate test result is scored according to a preset standard to obtain several groups of candidate evaluation scores;

[0033] Selecting the maximum value among the candidate evaluation scores to obtain a maximum candidate evaluation score;

[0034] Determine a first classification priority and a first microinstruction group corresponding to the maximum candidate evaluation score;

[0035] Executing a second updating step, the second updating step comprising: updating a reading order of a single microinstruction of each microinstruction group in the first microinstruction group;

[0036] Executing a second test step, the second test step comprising: testing the electronic components according to the classification priority after the second updating step to obtain a second candidate test result;

[0037] Iterate the second updating step and the second testing step to obtain several groups of the second candidate test results;

[0038] Determine the target test results among several groups of the second candidate test results, and record the classification priorities corresponding to the target test results.

[0039] By adopting the above technical solution, when the target test result is not obtained, the test result is repaired by changing the reading order of the single microinstructions of each microinstruction group.

[0040] Optionally, determining other microinstruction groups related to the first microinstruction group;

[0041] When the first microinstruction group continues to use the first classification priority, updating the classification priorities of the other microinstruction groups to obtain a third candidate test result of the electronic component;

[0042] Determine the target test result among the third candidate test results, and record the classification priority corresponding to the target test result.

[0043] By adopting the above technical solution, the classification priority of other microinstruction groups is changed to repair the step instructions, so that the repaired step instructions can work normally and output accurate test results.

[0044] Optionally, searching for a target historical test record in the historical test records, wherein the target historical test record is consistent with the test scenario of the electronic component, and the similarity between the target historical test record and the test result of the electronic component is less than a preset threshold;

[0045] According to the error handling method in the target historical test record, the classification priority is updated to obtain the historical classification priority;

[0046] The electronic components are tested according to the historical classification priorities.

[0047] By adopting the above technical solution, a target historical test record is determined in the historical test records, and the target historical test record is used to update the classification priority, so that the updated classification priority is as accurate as possible.

[0048] In a second aspect, the present application provides a test system based on microinstruction classification operation, which adopts the following technical solution:

[0049] A test system based on microinstruction classification operation, comprising:

[0050] An acquisition module is used to acquire step instructions, test start conditions, classification priorities, test scenarios, preset difference thresholds, preset standards, and historical test records;

[0051] A memory for storing a program of any of the above-mentioned test methods based on microinstruction classification operation;

[0052] The program in the memory can be loaded and executed by the processor and implement any of the above-mentioned testing methods based on microinstruction classification operation.

[0053] By adopting the above technical solution, the classification priority of the microinstructions is set, so that when testing electronic components, the microinstructions are read in sequence according to the classification priority, rather than according to the input order of the microinstructions. Therefore, when inputting microinstructions, the input order of the microinstructions can be ignored, which simplifies the input of microinstructions and thus simplifies the input of step instructions.

[0054] In a third aspect, the present application provides a smart terminal, which adopts the following technical solution:

[0055] An intelligent terminal comprises a memory and a processor, wherein the memory stores a computer program which can be loaded by the processor and execute any one of the above methods.

[0056] By adopting the above technical solution, the classification priority of the microinstructions is set, so that when testing electronic components, the microinstructions are read in sequence according to the classification priority, rather than according to the input order of the microinstructions. Therefore, when inputting microinstructions, the input order of the microinstructions can be ignored, which simplifies the input of microinstructions and thus simplifies the input of step instructions.

[0057] In a fourth aspect, the present application provides a computer storage medium capable of storing a corresponding program, which has the feature of facilitating the setting of simplified step instructions, and adopts the following technical solution:

[0058] A computer-readable storage medium stores a computer program that can be loaded by a processor and execute any of the above-mentioned testing methods based on microinstruction classification operation.

[0059] By adopting the above technical solution, the classification priority of the microinstructions is set, so that when testing electronic components, the microinstructions are read in sequence according to the classification priority, rather than according to the input order of the microinstructions. Therefore, when inputting microinstructions, the input order of the microinstructions can be ignored, which simplifies the input of microinstructions and thus simplifies the input of step instructions.

[0060] In summary, the present application includes at least one of the following beneficial technical effects:

[0061] Setting the classification priority of microinstructions enables the microinstructions to be read in order according to the classification priority when testing electronic components, rather than in the order in which the microinstructions were input. Therefore, the input order of the microinstructions can be ignored when inputting microinstructions, which simplifies the input of microinstructions and thus simplifies the input of step instructions;

[0062] Different classification priorities are assigned to different microinstruction groups, so that the classification priority corresponding to each microinstruction group can adapt to different scenarios, enhancing the universality of the solution;

[0063] The test logic of the electronic components is adjusted by updating the classification priority, and the correct classification priority is determined therefrom. Therefore, the technical solution provides a method for automatically repairing classification priority errors, and even if the relevant personnel input an incorrect classification priority, the classification priority can still be repaired. BRIEF DESCRIPTION OF THE DRAWINGS

[0064] Figure 1 The present application provides a flowchart of a testing method based on microinstruction classification operation.

[0065] Figure 2 It is a flowchart of a method for configuring a classification priority provided in an embodiment of the present application.

[0066] Figure 3 It is a flow chart of a first method for updating classification priorities provided in an embodiment of the present application.

[0067] Figure 4 It is a flow chart of a second method for updating classification priorities provided in an embodiment of the present application.

[0068] Figure 5 The present application provides a flowchart of a method for updating the reading order of a single microinstruction.

[0069] Figure 6 It is a flowchart of an updating method of another microinstruction group provided in an embodiment of the present application.

[0070] Figure 7 The present application provides a flowchart of a test update method based on historical test records.

[0071] Figure 8 The present application embodiment provides a structural diagram of a test system based on microinstruction classification operation. DETAILED DESCRIPTION

[0072] In order to make the purpose, technical solutions and advantages of this application more clear, the following Figures 1 to 8 It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0073] The present application embodiment discloses a test method based on microinstruction classification operation. Figure 1 , the method comprising:

[0074] Step S101: In response to receiving a step instruction, classify the microinstructions in the step instruction and determine the classification priority of the microinstructions, the step instruction also includes a test instruction.

[0075] The step instruction is composed of test instructions and microinstructions. Among them, the test instruction is the control information of the high and low levels of each pin of the electronic component. The microinstruction is a special state instruction. For example, the microinstruction includes but is not limited to at least one of jump microinstructions, loop microinstructions, interrupt microinstructions, input and output microinstructions, and transmission microinstructions.

[0076] In some embodiments, the electronic components are connected to a host testing machine, and the host testing machine can send step instructions to the electronic components.

[0077] In this embodiment, the electronic components include but are not limited to integrated circuit chips, semiconductor devices, electronic instruments, etc.

[0078] Optionally, the classification priority of the microinstructions is pre-set and stored.

[0079] Optionally, the classification priority of the microinstructions is set according to the type of electronic components and the test purpose. For example, when the electronic component is an integrated circuit chip and a feasibility test is performed, the classification priority A is used; when the electronic component is an integrated circuit chip and a robustness test is performed, the classification priority B is used.

[0080] Step S102: In response to the test start condition being met, the microinstructions are read in order according to the classification priority.

[0081] The test start condition refers to the condition or situation under which the electronic component starts to be tested. Exemplarily, the upper test machine sends a test start signal to the electronic component, and the electronic component determines that the test start condition is satisfied after receiving the test start signal. Exemplarily, in response to reaching the test start time, it is determined that the test start condition is satisfied.

[0082] Step S103: Run the microinstructions according to the classification priority to obtain a special execution state of the test instruction, where the special execution state is used to represent the test logic of the test instruction.

[0083] Exemplarily, jump microinstructions are classified as L1, loop microinstructions are classified as L2, and other microinstructions are classified as L3. Then when running microinstructions, L1 microinstructions are run first, then L2 microinstructions are run, and finally L3 microinstructions are run.

[0084] Step S104: reading and executing the test instruction according to the special execution state to obtain the test result of the electronic component.

[0085] In an optional test scenario, microinstruction L1 is to run the third line of test instructions in a loop for 3 seconds, microinstruction L2 is to jump from the third line of test instructions to the fifth line of test instructions, and microinstruction L3 is to perform special operations on the sixth line of test instructions. Then, after reading and executing in the order of microinstructions L1, microinstructions L2, and microinstructions L3, the execution order of the test instructions is also carried out in the order of the execution of the microinstructions. Then, after running to the third line of test instructions, the third line of test instructions is run in a loop for 3 seconds, then jump to the fifth line of test instructions, and then perform special operations on the sixth line of test instructions.

[0086] Furthermore, if the method of the related technology is followed, it is required that microinstructions L1, L2, and L3 are input in order. If the input order of any microinstruction is wrong, it will affect the reading and execution of subsequent microinstructions. For example, if the microinstructions L2, L1, and L3 are input in order, the execution logic of the test instruction will become that after running to the third line of test instructions, it will jump to the fifth line of test instructions, and then loop the third line of test instructions for 3 seconds, and then perform special operations on the sixth line of test instructions. It is obvious here that after completing the action corresponding to microinstruction L2, the test instruction has been executed to the fifth line, and it is no longer possible to operate the loop to run the third line of test instructions for 3 seconds, resulting in the unavailability of the entire step instruction.

[0087] By adopting the above technical solution, the classification priority of the microinstructions is set, so that when testing electronic components, the microinstructions are read in sequence according to the classification priority, rather than according to the input order of the microinstructions. Therefore, when inputting microinstructions, the input order of the microinstructions can be ignored, which simplifies the input of microinstructions and thus simplifies the input of step instructions.

[0088] In some embodiments, a single test instruction may correspond to one or more microinstructions. For example, microinstruction 1 indicates jumping from the third line of test instructions to the fifth line of test instructions, and microinstruction 2 indicates looping and executing the third line of test instructions for 3 seconds. However, different test instructions have different requirements for microinstructions, so different microinstructions need to be configured with different classification priorities. The present application embodiment discloses a flow chart of a method for configuring classification priorities. Figure 2 , the method comprising:

[0089] Step S201: In response to receiving a step instruction, the microinstructions are divided into a plurality of microinstruction groups according to the correspondence between the test instructions and the microinstructions.

[0090] Each microinstruction group corresponds to the same test instruction. For example, microinstruction A indicates to jump from the third line of test instructions to the fifth line of test instructions, and microinstruction B is to execute the third line of test instructions three times in a loop. Then microinstruction A and microinstruction B are both related to the third line of test instructions, and microinstruction A and microinstruction B are assigned to the same microinstruction group.

[0091] Step S202: Read the instruction type of the test instruction corresponding to the microinstruction group.

[0092] Optionally, the instruction type includes at least one of a functional test instruction, a performance test instruction, a security test instruction, a compatibility test instruction, and a data verification test instruction.

[0093] Step S203: Acquire a test scenario for electronic components.

[0094] The test scenarios include but are not limited to the types of electronic components, test purposes, test batches, models of electronic components, etc.

[0095] In some embodiments, the test scenario may be manually input by relevant personnel.

[0096] In some embodiments, the upper tester sends a type query instruction to the electronic component. After receiving the type query instruction, the electronic component returns the type of the electronic component to the upper tester.

[0097] Step S204: Determine the classification priority according to the instruction type and the test scenario.

[0098] In some embodiments, in a preset mapping relationship, a corresponding classification priority is searched according to the instruction type and the test scenario, and the preset mapping relationship is used to represent the mapping of the instruction type and the test scenario to the classification priority.

[0099] In some embodiments, in the first mapping relationship, the corresponding first available classification priority is searched according to the instruction type. In the second mapping relationship, the corresponding second available classification priority is searched according to the test scenario. The intersection of the first available classification priority and the second available classification priority is calculated to obtain the classification priority used in this step.

[0100] By adopting the above technical solution, different classification priorities are assigned to different microinstruction groups, so that the classification priority corresponding to each microinstruction group can adapt to different scenarios, thereby enhancing the universality of the solution.

[0101] In actual tests, it is often the case that electronic components are good but the test results are wrong. This may be caused by a classification priority error. To solve this problem, the present application embodiment discloses a flow chart of a classification priority update method. Figure 3, the method comprising:

[0102] Step S301: when the test result is an error, read the problem microinstruction group according to the test result.

[0103] Exemplarily, the result error includes but is not limited to at least one of a syntax error, an instruction logic error, an execution order error, a resource conflict, an execution timing error, and a dependency error.

[0104] Optionally, a test result check plug-in is installed in the upper test machine, and the test result check plug-in can check the step instruction that generates the error. Therefore, after obtaining the step instruction, the corresponding test instruction can be further obtained through the step instruction, and the problem microinstruction group can be obtained.

[0105] Step S302: Obtain the candidate classification priority corresponding to the problematic microinstruction group.

[0106] The candidate classification priority refers to the classification priority adopted by the problem microinstruction group.

[0107] In some other embodiments, if there is only one candidate classification priority, it is determined whether the test instruction corresponding to the problem microinstruction has other associated test instructions; if so, the microinstruction corresponding to the associated test instruction is set as the problem microinstruction; if not, an alarm signal is generated and sent to the upper test machine. For example, the problem microinstruction corresponds to the third row of test instructions, and the second row of test instructions must be executed first to execute the third row of test instructions. The second row of test instructions is the associated test instruction of the third row of test instructions, and the microinstruction corresponding to the second row of test instructions is identified as the problem microinstruction.

[0108] Step S303: Execute the first updating step, which includes: updating the candidate classification priorities so that the candidate classification priorities in each iteration process are different.

[0109] Exemplarily, the order of candidate classification priorities is loop microinstructions L1, jump microinstructions L2, and interrupt microinstructions L3. Afterwards, the candidate classification priorities may be updated, and the updated candidate classification priorities may be L1, L3, and L2. Afterwards, the candidate classification priorities may be updated again, and the updated candidate classification priorities may be L2, L1, and L3.

[0110] Step S304: Execute a first test step, which includes: testing the electronic components according to the candidate classification priorities to obtain a first candidate test result.

[0111] Optionally, the microinstructions are read in order according to the candidate classification priority, and the microinstructions are executed according to the classification priority to obtain a special execution state of the test instruction. The test instruction is read and executed according to the special execution state to obtain the first candidate test result of the electronic component.

[0112] Step S305: Iterate the first updating step and the first testing step to obtain several groups of first candidate test results.

[0113] In some embodiments, when the number of first candidate test results does not change, the iteration of the first updating step and the first testing step is stopped.

[0114] In some embodiments, the maximum value of the type combination is calculated according to the microinstruction type of the problem microinstruction group. After the number of iterations reaches the aforementioned maximum value, the iterations of the first update step and the first test step are stopped. For example, if there are n types of microinstructions of the problem microinstruction group, the maximum number of iterations is n!-1.

[0115] In some embodiments, if it is detected that there is a target test result that passes the test in the first candidate test results, the iteration of the first updating step and the first testing step is stopped.

[0116] Step S306: determine the target test result among the groups of first candidate test results, and record the classification priority corresponding to the target test result, the target test result being the test passed.

[0117] Furthermore, the execution logic of the step instruction is determined according to the classification priority corresponding to the target test result. The execution logic is compared to see whether it is consistent with the test purpose of the electronic component. If so, the classification priority is recorded and saved, and used in the next test; if not, an alarm signal is generated and sent to the upper test machine.

[0118] By adopting the above technical solution, the test logic of the electronic components is adjusted by updating the classification priority, and the correct classification priority is determined. Therefore, the technical solution provides a method for automatically repairing classification priority errors, and even if the relevant personnel input an incorrect classification priority, the classification priority can still be repaired.

[0119] In the following embodiments, after determining the target test result, there may be multiple target test results that pass the test. Therefore, it is necessary to screen the target test results and select the test results that meet the test scenario. Therefore, the present application embodiment discloses a flow chart of a second method for updating the classification priority. Figure 4 , the method comprising:

[0120] Step S401: when there are at least two target test results, the target test results are scored according to a preset standard to obtain an evaluation score.

[0121] The preset standard is the test result obtained after the standard electronic component is tested. Exemplarily, the similarity between the target test result and the preset standard is calculated to obtain the evaluation score. Alternatively, the difference between the target test result and the preset standard is calculated to obtain the evaluation score. Alternatively, the target test result is converted into a first vector, and the preset standard is converted into a second vector; the Euclidean distance between the first vector and the second vector is calculated to obtain the evaluation score.

[0122] Step S402: Calculate the score difference between the maximum evaluation score and the other evaluation scores.

[0123] In some other embodiments, the evaluation scores are sorted from large to small. According to the above sorting, the score difference between the maximum evaluation score and other evaluation scores is calculated.

[0124] Step S403: If there is a first evaluation score in the evaluation scores, and the difference between the first evaluation score and the maximum evaluation score is less than the preset difference threshold, the first test purpose corresponding to the first evaluation score is determined through the test model, and the second test purpose corresponding to the maximum evaluation score is determined through the test model.

[0125] The test model is a model for generating test objectives corresponding to step instructions. Exemplarily, the microinstructions and test instructions corresponding to the first evaluation score are used as inputs of the test model, and the output of the test model is the first test objective. Exemplarily, the microinstructions and test instructions corresponding to the second evaluation score are used as inputs of the test model, and the output of the test model is the second test objective.

[0126] The preset difference threshold is a preset empirical value, and the embodiment of the present application does not limit the specific value of the preset difference threshold.

[0127] Step S404: Calculate a first similarity between the first test objective and the initial test requirement of the electronic component, and calculate a second similarity between the second test objective and the initial test requirement.

[0128] Initial test requirements refer to the pre-set test objectives for electronic components.

[0129] Optionally, the initial test requirement is converted into a first space vector, and the first test purpose is converted into a second space vector. The cosine similarity between the first space vector and the second space vector is calculated to obtain a first similarity. Similarly, the initial test requirement is converted into a first space vector, and the second test purpose is converted into a third space vector. The cosine similarity between the first space vector and the third space vector is calculated to obtain a second similarity.

[0130] Optionally, the initial test requirement is converted into a third vector, and the first test purpose is converted into a fourth vector. The Euclidean distance between the third vector and the fourth vector is calculated to obtain a first similarity. Similarly, the initial test requirement is converted into a third vector, and the second test purpose is converted into a fifth vector. The cosine similarity between the third vector and the fifth vector is calculated to obtain a second similarity.

[0131] Step S405: When the first similarity is greater than the second similarity, the classification priority corresponding to the first evaluation score is recorded.

[0132] When the first similarity is greater than the second similarity, the classification priority corresponding to the first evaluation score makes the step instruction closer to the initial test requirement, and thus the classification priority corresponding to the first evaluation score is recorded.

[0133] Step S406: When the first similarity is less than the second similarity, the classification priority corresponding to the maximum evaluation score is recorded.

[0134] When the first similarity is less than the second similarity, the classification priority corresponding to the maximum evaluation score makes the step instruction closer to the initial test requirement, so the classification priority corresponding to the maximum evaluation score is recorded.

[0135] By adopting the above technical solution, the ideal test results are determined from multiple target test results, and the classification priorities corresponding to the aforementioned test results are recorded, thereby providing samples for subsequent tests and ensuring the accuracy of subsequent tests.

[0136] In the following embodiments, the reading order of a single microinstruction within the same microinstruction can also be changed to adjust the classification priority. Therefore, the present application embodiment discloses a flow chart of a method for updating the reading order of a single microinstruction. Figure 5 , the method comprising:

[0137] Step S501: When no target test result is detected, the first candidate test result is scored according to a preset standard to obtain several groups of candidate evaluation scores.

[0138] The preset standard is the test result obtained after the standard electronic components are tested.

[0139] Step S502: Select the maximum value among the candidate evaluation scores to obtain the maximum candidate evaluation score.

[0140] In some other embodiments, the candidate evaluation scores are sorted from large to small to obtain the maximum candidate evaluation score.

[0141] Step S503: Determine the first classification priority and the first microinstruction group corresponding to the maximum candidate evaluation score.

[0142] In this step, after the first classification priority corresponding to the maximum candidate evaluation score is passed, the first microinstruction group is determined using the first classification priority.

[0143] Step S504: Execute a second updating step, the second updating step comprising: updating a reading order of a single microinstruction of each microinstruction group in the first microinstruction group.

[0144] For example, if the loop-type microinstructions include microinstruction a, microinstruction b and microinstruction c, and the single microinstruction reading order is a, b, c. Then the single microinstruction reading order can be updated to a, c, b. Afterwards, the single microinstruction reading order can also be updated to b, a, c.

[0145] Step S505: Execute a second test step, which includes: testing the electronic components according to the classification priority after the second updating step to obtain a second candidate test result.

[0146] Optionally, the microinstructions are read in order according to the candidate classification priority and each microinstruction is read in a single microinstruction reading order, and the microinstructions are run according to the classification priority to obtain a special execution state of the test instruction. The test instruction is read and executed according to the special execution state to obtain a second candidate test result of the electronic component.

[0147] Step S506: Iterate the second updating step and the second testing step to obtain several groups of second candidate test results.

[0148] In some embodiments, when the number of second candidate test results does not change, the iteration of the second updating step and the second testing step is stopped.

[0149] In some embodiments, the maximum value of the read order combination is calculated based on the total number of microinstructions included in the microinstruction group. After the number of iterations reaches the aforementioned maximum value, the iterations of the second update step and the second test step are stopped. For example, if the total number of microinstructions included in the microinstruction group is m, then the maximum number of iterations is m!-1.

[0150] Step S507: Determine target test results from the plurality of groups of second candidate test results, and record the classification priorities corresponding to the target test results.

[0151] Furthermore, the execution logic of the step instruction is determined according to the classification priority corresponding to the target test result. The execution logic is compared to see whether it is consistent with the test purpose of the electronic component. If so, the classification priority is recorded and saved, and used in the next test; if not, an alarm signal is generated and sent to the upper test machine.

[0152] By adopting the above technical solution, when the target test result is not obtained, the test result is repaired by changing the reading order of the single microinstructions of each microinstruction group.

[0153] In the following embodiments, in addition to changing the first microinstruction group, other microinstruction groups related to the first microinstruction group may also be updated. Therefore, the present application embodiment discloses a flow chart of a method for updating other microinstruction groups. Figure 6 , the method comprising:

[0154] Step S601: Determine other microinstruction groups related to the first microinstruction group.

[0155] Exemplarily, the first microinstruction group corresponds to the third row of test instructions, and to execute the third row of test instructions, it is necessary to execute the second row of test instructions first. Then the second row of test instructions are associated test instructions of the third row of test instructions, and the microinstructions corresponding to the second row of test instructions are identified as other microinstruction groups related to the first microinstruction group.

[0156] Step S602: While the first microinstruction group continues to use the first classification priority, the classification priorities of other microinstruction groups are updated to obtain a third candidate test result of the electronic component.

[0157] Exemplarily, the classification priority of each microinstruction group in the other microinstruction groups is updated separately, and the microinstructions are read using the updated classification priority to obtain the special execution state of the test instruction. The test instruction is read and executed according to the special execution state to obtain the third candidate test result of the electronic component.

[0158] Step S603: Determine the target test result in the third candidate test result, and record the classification priority corresponding to the target test result.

[0159] Furthermore, the execution logic of the step instruction is determined according to the classification priority corresponding to the target test result. The execution logic is compared to see whether it is consistent with the test purpose of the electronic component. If so, the classification priority is recorded and saved, and used in the next test; if not, an alarm signal is generated and sent to the upper test machine.

[0160] By adopting the above technical solution, the classification priority of other microinstruction groups is changed to repair the step instructions, so that the repaired step instructions can work normally and output accurate test results.

[0161] In the following embodiments, the classification priority can also be updated through historical test records. Therefore, the embodiment of the present application discloses a flow chart of a test update method based on historical test records. Figure 7 , the method comprising:

[0162] Step S701: searching for a target historical test record in the historical test records, wherein the target historical test record is consistent with a test scenario of the electronic component, and a similarity between the target historical test record and a test result of the electronic component is less than a preset threshold.

[0163] Exemplarily, the historical test records store the complete test process of each electronic component.

[0164] Search the historical records for candidate historical test records that are consistent with the test scenario of the electronic component. Calculate the similarity between the candidate historical test records and the test results, and use the historical test records that are less than a preset threshold as target historical test records.

[0165] The preset threshold is a preset empirical value, and the embodiment of the present application does not specifically limit the value of the preset threshold.

[0166] Step S702: Update the classification priority according to the error handling method in the target historical test record to obtain the historical classification priority.

[0167] The error handling method refers to a method for updating the classification priority when the test result of the electronic component is an error, and the update method makes the test result of the electronic component become a test pass.

[0168] Optionally, when there are at least two error processing methods, cluster the error processing methods and use the clustering result as the historical classification priority. Alternatively, obtain the post-processing effect corresponding to each error processing method, and select the historical test record with the best post-processing effect to generate the historical classification priority.

[0169] Step S703: testing electronic components according to historical classification priorities.

[0170] Exemplarily, the microinstructions are read in order according to the historical classification priority, and the special execution state of the test instruction is obtained according to the historical classification priority microinstructions. The test instruction is read and executed according to the special execution state to obtain the candidate test result of the electronic component.

[0171] By adopting the above technical solution, a target historical test record is determined in the historical test records, and the target historical test record is used to update the classification priority, so that the updated classification priority is as accurate as possible.

[0172] Based on the same inventive concept, the present application embodiment provides a structural diagram of a test system based on microinstruction classification operation, please refer to Figure 8 ,include:

[0173] The acquisition module 801 is used to acquire step instructions, test start conditions, classification priorities, test scenarios, preset difference thresholds, preset standards and historical test records;

[0174] A memory 802, used to store a program of any of the above-mentioned test methods based on microinstruction classification operation;

[0175] Processor 803, the program in the memory can be loaded and executed by the processor and implement any of the above-mentioned test methods based on microinstruction classification operation.

[0176] By adopting the above technical solution, the classification priority of the microinstructions is set, so that when testing electronic components, the microinstructions are read in sequence according to the classification priority, rather than according to the input order of the microinstructions. Therefore, when inputting microinstructions, the input order of the microinstructions can be ignored, which simplifies the input of microinstructions and thus simplifies the input of step instructions.

[0177] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device and unit described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0178] An embodiment of the present application provides a computer-readable storage medium storing a computer program that can be loaded by a processor and execute a test method based on microinstruction classification operation.

[0179] Computer storage media include, for example, various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROM), random access memories (RAM), magnetic disks or optical disks.

[0180] Based on the same inventive concept, an embodiment of the present application provides an intelligent terminal, including a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and executes a test method based on microinstruction classification operation.

[0181] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device and unit described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0182] The above are all preferred embodiments of the present application, and are not intended to limit the protection scope of the present application. Any feature disclosed in this specification (including the abstract and drawings), unless otherwise stated, can be replaced by other equivalent or alternative features with similar purposes. That is, unless otherwise stated, each feature is only an example of a series of equivalent or similar features.

Claims

1. A test method based on microinstruction classification operation, characterized in that: The method comprises: In response to receiving a step instruction, classifying microinstructions in the step instruction and determining a classification priority of the microinstructions, the step instruction further comprising a test instruction; In response to satisfying a test start condition, reading the microinstructions in order according to the classification priority; Running the microinstructions according to the classification priority to obtain a special execution state of the test instruction, wherein the special execution state is used to represent the test logic of the test instruction; Reading and executing the test instruction according to the special execution state to obtain the test result of the electronic component; In response to receiving the step instruction, dividing the microinstructions into a plurality of microinstruction groups according to a correspondence between the test instruction and the microinstructions; Reading the instruction type of the test instruction corresponding to the microinstruction group; Obtaining a test scenario for the electronic component; The classification priority is determined according to the instruction type and the test scenario.

2. The test method based on microinstruction classification operation according to claim 1 is characterized in that: The method further comprises: In the case where the test result is an error, reading the problem microinstruction group according to the test result; Obtaining candidate classification priorities corresponding to the problematic microinstruction group; Executing a first updating step, the first updating step comprising: updating the candidate classification priorities so that the candidate classification priorities are different in each iteration process; Executing a first test step, the first test step comprising: testing the electronic components according to the candidate classification priority to obtain a first candidate test result; Iterate the first updating step and the first testing step to obtain several groups of the first candidate test results; Determine target test results from several groups of the first candidate test results, and record the classification priorities corresponding to the target test results, the target test results being test passed.

3. The test method based on microinstruction classification operation according to claim 2 is characterized in that: The method further comprises: When there are at least two target test results, scoring the target test results according to a preset standard to obtain an evaluation score; Calculate the score difference between the maximum evaluation score and the other evaluation scores among the evaluation scores; If there is a first evaluation score in the evaluation scores, such that the difference between the first evaluation score and the maximum evaluation score is less than a preset difference threshold, a first test purpose corresponding to the first evaluation score is determined through a test model, and a second test purpose corresponding to the maximum evaluation score is determined through the test model; Calculating a first similarity between the first test objective and an initial test requirement of the electronic component, and calculating a second similarity between the second test objective and the initial test requirement; When the first similarity is greater than the second similarity, recording the classification priority corresponding to the first evaluation score; When the first similarity is less than the second similarity, the classification priority corresponding to the maximum evaluation score is recorded.

4. The test method based on microinstruction classification operation according to claim 2 is characterized in that: The method further comprises: In the case where the target test result is not detected, scoring the first candidate test result according to a preset standard to obtain several groups of candidate evaluation scores; Selecting the maximum value among the candidate evaluation scores to obtain a maximum candidate evaluation score; Determine a first classification priority and a first microinstruction group corresponding to the maximum candidate evaluation score; Executing a second updating step, the second updating step comprising: updating a reading order of a single microinstruction of each microinstruction group in the first microinstruction group; Executing a second test step, the second test step comprising: testing the electronic components according to the classification priority after the second updating step to obtain a second candidate test result; Iterate the second updating step and the second testing step to obtain several groups of the second candidate test results; Determine the target test results among several groups of the second candidate test results, and record the classification priorities corresponding to the target test results.

5. The test method based on microinstruction classification operation according to claim 4 is characterized in that: The method further comprises: determining other microinstruction groups related to the first microinstruction group; When the first microinstruction group continues to use the first classification priority, updating the classification priorities of the other microinstruction groups to obtain a third candidate test result of the electronic component; Determine the target test result among the third candidate test results, and record the classification priority corresponding to the target test result.

6. The test method based on microinstruction classification operation according to claim 1 is characterized in that: The method further comprises: Searching for a target historical test record in the historical test records, wherein the target historical test record is consistent with the test scenario of the electronic component, and the similarity between the target historical test record and the test result of the electronic component is less than a preset threshold; According to the error handling method in the target historical test record, the classification priority is updated to obtain the historical classification priority; The electronic components are tested according to the historical classification priorities.

7. A test system based on microinstruction classification operation, characterized in that: The system comprises: An acquisition module is used to acquire step instructions, test start conditions, classification priorities, test scenarios, preset difference thresholds, preset standards, and historical test records; A memory for storing a program of a test method based on microinstruction classification operation as claimed in any one of claims 1 to 6; The program in the memory can be loaded and executed by the processor and implements the test method based on microinstruction classification operation as claimed in any one of claims 1 to 6.

8. An intelligent terminal, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and executes any one of the methods of claims 1 to 6.

9. A computer-readable storage medium, characterized in that: A computer program is stored which can be loaded by a processor and execute the method according to any one of claims 1 to 6.

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