A histogram-based signal state transient analysis method, device and medium

Abstract

The present invention provides a histogram-based signal state transient analysis method, device and medium. The signal state transient analysis method comprises the following steps: S1, obtaining a demodulated signal parameter set and a demodulated signal tolerance set of all demodulated signals; S2, calculating histogram parameters; S3, calculating relevant parameters of each interval in the histogram; and S4, calculating relevant parameters of the signal state. The present invention performs transient analysis on the relevant parameters of the demodulated signal, thereby enabling state analysis of the demodulated signal based on the frequency modulation slope or frequency. The method is not only simple to implement, but also capable of adaptively dividing the signal state and displaying the overall distribution characteristics and discreteness of the signal.

Description

Technical Field

[0001] The present invention relates to the technical field of demodulation signal analysis, and in particular to a histogram-based signal state transient analysis method, device and medium. Background Art

[0002] Frequency hopping signals have strong anti-interference capabilities, a lower risk of interference at a certain frequency, and high security. The randomness of frequency hopping makes the signal more difficult to eavesdrop on, and are widely used in wireless communications such as Bluetooth, wireless LAN, and military communications.

[0003] The extended spectrum of the linear frequency modulation signal can also make the signal more resistant to interference. The linear change of its frequency makes the time-frequency characteristics very clear, and it is often used in radar and communication systems.

[0004] In summary, the frequency of the FH signal and the FM slope of the LFM signal are both very important parameters. When demodulating the frequency or FM slope when multiple signals are transmitted, some parameters are needed to describe their characteristic distribution in order to have a more comprehensive understanding of them. Summary of the Invention

[0005] The purpose of the present invention is to provide a histogram-based signal state transient analysis method, device and medium, which can perform state division on the histogram according to the signal-related parameters obtained by demodulation, and the divided signal states can display the overall distribution characteristics and discreteness of the signal.

[0006] In order to solve the above technical problems, the present invention adopts the following solutions:

[0007] A histogram-based signal state transient analysis method, the signal state transient analysis method comprising the following steps:

[0008] S1. Obtain demodulation signal parameter sets for all demodulated signals and the demodulated signal tolerance set

[0009] i sig =1,2,…,N sig ,

[0010] Wherein, the demodulated signal is a frequency hopping signal or a linear frequency modulation signal, then For the i sig The parameters of the demodulated signal refer to the frequency of the frequency hopping signal or the frequency modulation slope of the linear frequency modulation signal. For the i sig The tolerance of the demodulated signal, N sig is the number of demodulated signals;

[0011] S2. Obtain demodulated signal parameter set The maximum parameter f max and the minimum parameter f min and the demodulated signal tolerance set Minimum tolerance λ min , and according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min Calculate the histogram parameters and get the corresponding number of intervals N bin and interval width δ;

[0012] S3, traverse all demodulated signals, according to the number of intervals N bin The interval i where each demodulated signal is located is calculated by using the interval width δ bin , and according to the interval i where the demodulated signal is located bin Calculate the interval parameters to get the signal number array num in the interval bin , parameter sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the demodulated signal is located bin ;

[0013] S4, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , according to the signal number array num bin , parameter sum array f bin and the tolerance sum array λ bin Calculate the signal state parameters and traverse the array iVld bin , get the corresponding demodulated signal histogram interval array sig bin , signal status parameter array f state and the signal state tolerance array λ state ;

[0014] S5. Find the histogram interval array sig where the demodulated signal is located bin In array iVld bin The index in , and calculate the demodulated signal i sig Status index sig id , state error sig dev and state parameter sig f .

[0015] Furthermore, the tolerance represents the starting point to the ending point of a demodulated signal. When searching from the middle point of the demodulated signal backward on the histogram, the first point that exceeds the tolerance is recorded as the ending point; then searching from the middle point of the demodulated signal forward, the first point that exceeds the tolerance is recorded as the starting point.

[0016] Furthermore, in S2, according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min The process of calculating the histogram parameters is:

[0017] Initialize the interval width δ to the minimum tolerance λ min ;

[0018] Calculate and get the maximum parameter f max With the minimum parameter f min The difference between interval ;

[0019] The difference f interval Divide the result by the interval width δ and round it to get the number of intervals N bin ;

[0020] The difference f interval Divide by the number of intervals N bin The initialization interval width δ is updated based on the result.

[0021] Furthermore, in S3, according to the number of intervals N bin And the interval width δ is calculated to obtain each demodulated signal i sig The interval i bin , the calculation is specifically as follows:

[0022]

[0023] Among them, ceil(·) is a round-up operation and satisfies

[0024] Furthermore, in S3, according to the interval i where the demodulated signal is located, bin The interval parameters are calculated, and the calculation is specifically as follows:

[0025]

[0026] Among them, num bin (i bin ) is the interval i where the demodulated signal is located bin The number of signals in the array num bin , f bin (i bin ) is the interval i where the demodulated signal is located bin The sum of the parameters of the array f bin ,λ bin (i bin ) is the interval i where the demodulated signal is located bin The tolerance sum array λbin .

[0027] Furthermore, the step S4 includes the following steps:

[0028] S41, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , so that the array iVld bin The number of signal states N state The corresponding signal number array num bin The number of non-zero elements in ;

[0029] S42. Calculate and obtain the signal state index array iD state , signal status parameter array f state , signal state tolerance array λ state , the calculation is specifically as follows:

[0030]

[0031] Among them, num bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The number of signals in the array num bin , f bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The sum of the parameters of the array f bin ,λ bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The tolerance sum array λ bin ;

[0032] S43. Obtain current state parameter f stateNow , according to the current state parameter f stateNow Traverse other signal states to determine whether there is a state parameter f that meets the range conditions stateAnother , according to the judgment result, the histogram interval array sig of the demodulated signal bin , signal status parameter array f state , signal state tolerance array λ state And the number of signal states N state to update.

[0033] Furthermore, in S43, the range condition refers to the state parameter f stateAnother With the current state parameter f stateNow The difference between them is 2*λ min within the scope;

[0034] When it is determined that there is a state parameter f that meets the range condition stateAnother When the state parameter f meets the range condition, stateAnother The histogram interval array sig where the demodulated signal is located bin , signal status parameter array f state , signal state tolerance array λ state And the number of signal states N state to update.

[0035] Furthermore, in S5, the demodulated signal i is calculated sig Status index sig id , state error sig dev and state parameter sig f , the calculation process is:

[0036] Among them, idx refers to the histogram interval array sig where the demodulated signal is located bin (i) In array iVld bin The index in .

[0037] A histogram-based signal state transient analysis device, comprising:

[0038] a memory for non-transitory storage of computer-readable instructions;

[0039] The processor is configured to execute the computer-readable instructions, wherein the computer-readable instructions implement the histogram-based signal state transient analysis method when executed by the processor.

[0040] A non-transitory computer-readable storage medium stores computer-readable instructions, wherein the non-transitory computer-readable storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by a processor, the method for transient analysis of signal states based on a histogram is implemented.

[0041] Beneficial effects of the present invention:

[0042] The present invention provides a histogram-based signal state transient analysis method, device and medium. The signal state transient analysis method mainly performs transient analysis on relevant parameters of the demodulated signal. Thus, the demodulated signal can be analyzed according to the frequency modulation slope (linear frequency modulation analysis mode) or frequency (frequency hopping analysis mode). It is not only simple to implement, but also can adaptively divide the signal state and display the overall distribution characteristics and discreteness of the signal. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 Schematic diagram of the flow of the signal state transient analysis method in Example 1 of the present invention.

[0044] Figure 2 Schematic diagram of the histogram in Example 1 of the present invention. DETAILED DESCRIPTION

[0045] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, rather than all the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is in no way intended to limit the present invention and its application or use. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0046] Unless otherwise specifically stated, the relative arrangement of components and steps, the numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention.

[0047] At the same time, it should be understood that for the convenience of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship.

[0048] Additionally, descriptions of well-known structures, functions, and configurations may be omitted for clarity and conciseness. Those skilled in the art will recognize that various changes and modifications can be made to the examples described herein without departing from the spirit and scope of the present disclosure.

[0049] Technologies, methods and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, such technologies, methods and equipment should be considered part of the authorization specification.

[0050] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0051] The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with embodiments:

[0052] Example 1

[0053] In this embodiment, a histogram-based signal state transient analysis method is proposed. Figure 1 As shown, the signal state transient analysis method includes the following steps:

[0054] S1. Obtain demodulation signal parameter sets for all demodulated signals and the demodulated signal tolerance set

[0055] i sig =1,2,…,N sig ,

[0056] Wherein, the demodulated signal is a frequency hopping signal or a linear frequency modulation signal, then For the i sig The parameters of the demodulated signal refer to the frequency of the frequency hopping signal or the frequency modulation slope of the linear frequency modulation signal. For the i sig The tolerance of the demodulated signal, N sig is the number of demodulated signals;

[0057] S2. Obtain demodulated signal parameter set The maximum parameter f max and the minimum parameter f min and the demodulated signal tolerance set Minimum tolerance λ min , and according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min Calculate the histogram parameters and get the corresponding number of intervals N bin and interval width δ;

[0058] S3, traverse all demodulated signals, according to the number of intervals N bin The interval i where each demodulated signal is located is calculated by using the interval width δ bin , and according to the interval i where the demodulated signal is located bin Calculate the interval parameters to get the signal number array num in the interval bin , parameter sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the demodulated signal is located bin ;

[0059] S4, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin, according to the signal number array num bin , parameter sum array f bin and the tolerance sum array λ bin Calculate the signal state parameters and traverse the array iVld bin , get the corresponding demodulated signal histogram interval array sig bin , signal status parameter array f state and the signal state tolerance array λ state ;

[0060] S5. Find the histogram interval array sig where the demodulated signal is located bin In array iVld bin The index in , and calculate the demodulated signal i sig Status index sig id , state error sig dev and state parameter sig f .

[0061] It can be seen that the present invention performs transient analysis on the relevant parameters of the demodulated signal, thereby performing state analysis on the demodulated signal according to the frequency modulation slope (linear frequency modulation analysis mode) or frequency (frequency hopping analysis mode), and having a deeper understanding of the signal characteristics.

[0062] Based on the above principles, in this embodiment, a frequency hopping signal is taken as an example for the following description:

[0063] The signal state transient analysis method comprises the following steps:

[0064] S1. Obtain the frequency hopping signal parameter set of all frequency hopping signals and frequency hopping signal tolerance set i sig =1,2,…,N sig ,in, For the i sig The frequency of the frequency hopping signal, For the i sig The tolerance of frequency hopping signals, N sig is the number of frequency hopping signals;

[0065] S2. Obtain frequency hopping signal parameter set Maximum frequency f max and minimum frequency f min and frequency hopping signal tolerance set Minimum tolerance λ min , and according to the maximum frequency f max , minimum frequency f min and the minimum tolerance λ min Calculate the histogram parameters and get the corresponding number of intervals Nbin and interval width δ;

[0066] S3, traverse all frequency hopping signals, according to the number of intervals N bin The interval i where each frequency hopping signal is located is calculated by using the interval width δ bin , and according to the interval i where the frequency hopping signal is located bin Calculate the interval parameters to get the signal number array num in the interval bin , frequency sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the frequency hopping signal is located bin ;

[0067] S4, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , according to the signal number array num bin , frequency sum array f bin and the tolerance sum array λ bin Calculate the signal state parameters and traverse the array iVld bin , get the corresponding frequency hopping signal histogram interval array sig bin , signal state frequency array f state and the signal state tolerance array λ state ;

[0068] S5. Find the histogram interval array sig where the frequency hopping signal is located bin In array iVld bin The index in , and calculate the frequency hopping signal i sig Status index sig id , state error sig dev and state frequency sig f .

[0069] Preferably, the tolerance represents the start point to the end point of a frequency hopping signal, such as Figure 2 As shown, on the histogram, search from the middle point of the frequency hopping signal backward, and the first point that exceeds the tolerance is recorded as the end point; then search from the middle point of the frequency hopping signal forward, and the first point that exceeds the tolerance is recorded as the starting point.

[0070] When the corresponding frequency hopping signal parameter set is obtained based on the histogram and frequency hopping signal tolerance set After that, you can use the frequency hopping signal parameter set and frequency hopping signal tolerance set Calculate the histogram parameters, and the process of calculating the histogram parameters is:

[0071] The first step is to find the frequency hopping signal parameter set Maximum frequency f max and minimum frequency f min ; and find the frequency hopping signal tolerance set Minimum tolerance λ min ;

[0072] Furthermore, the maximum frequency f max and minimum frequency f min Update, that is, at the maximum frequency f max and minimum frequency f min Add redundancy to get the updated maximum frequency f max and minimum frequency f min , calculated as follows: Among them, λ min For redundancy;

[0073] Step 2: Initialize the interval width δ and initialize it to the minimum tolerance λ min , then δ=λ min ;

[0074] Step 3: Calculate and obtain the maximum frequency f max With the minimum frequency f min The difference between interval , that is, f interval =f max -f min ; Among them, if f interval =0, it can be assigned the value eps (precision of double-precision floating point numbers) in MATLAB;

[0075] Step 4: The difference f interval Divide the result by the interval width δ and round it to get the number of intervals N bin , that is, N bin =round(f interval / δ), where round(·) is a rounding operation, and when N bin <1, let N bin =1;

[0076] Step 5: The difference f interval Divide by the number of intervals N bin The result of the initialization interval width δ is updated, that is, δ=f interval / N bin .

[0077] Then, based on the number of intervals N bin The interval width δ can be used to calculate the relevant parameters of each interval in the histogram, mainly by traversing all frequency hopping signals and for each frequency hopping signal isig ,i sig =1,2,…,N sig The following calculations are performed:

[0078] The first step is to initialize the array num of the number of signals in the interval bin , frequency sum array f bin and the tolerance sum array λ bin , and each array size is N bin , all elements are 0;

[0079] Step 2: Initialize the histogram interval array sig where the frequency hopping signal is located bin , the array size is N sig ;

[0080] Step 3: Calculate the i-th sig The interval i where the frequency hopping signal is located bin , calculated as follows:

[0081] Among them, ceil(·) is a round-up operation. For the i sig The frequency of the frequency hopping signal, f min Frequency hopping signal parameter set The minimum frequency in , δ is the interval width, and satisfies

[0082] Step 4: According to the interval i where the frequency hopping signal is located bin Update the array num of the number of signals in the interval bin , frequency sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the frequency hopping signal is located bin , calculated as follows:

[0083]

[0084] Among them, i bin For the i sig The interval where the frequency hopping signal is located, For the i sig The frequency of the frequency hopping signal, For the i sig The tolerance of frequency hopping signals, then num bin (i bin ) is the interval i where the frequency hopping signal is located bin The number of signals in the array num bin , f bin (i bin ) is the interval i where the frequency hopping signal is located binThe frequency sum array f bin ,λ bin (i bin ) is the interval i where the frequency hopping signal is located bin The tolerance sum array λ bin .

[0085] Next, the signal state related parameters can be calculated based on the above interval parameters. The specific process is as follows:

[0086] The first step is to set the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , so that the array iVld bin The number of signal states N state The corresponding signal number array num bin The number of non-zero elements in ;

[0087] Step 2: Calculate and obtain the signal state index array iD state , signal state frequency array f state , signal state tolerance array λ state , the calculation is specifically as follows:

[0088]

[0089] Where i = 1, 2, ..., N vldBin , then num bin (iVld bin (i)) is the array iVld bin The interval i where the frequency hopping signal is located bin The number of signals in the array num bin , f bin (iVld bin (i)) is the array iVld bin The interval i where the frequency hopping signal is located bin The frequency sum array f bin ,λ bin (iVld bin (i)) is the array iVld bin The interval i where the frequency hopping signal is located bin The tolerance sum array λ bin ;

[0090] The third step is to traverse the signal state and find the current state frequency f stateNow Is there a difference of 2*λ between them? min State frequency f within the range stateAnother The specific process is as follows:

[0091] If there is a state frequency f stateAnother and the current state frequency f stateNow The difference is 2*λ min Within the range, take these state frequencies f stateAnother The mean of is taken as the new state frequency, and the corresponding new state tolerance can be obtained in the same way. The state frequency f stateAnother The corresponding signal interval is the current state frequency f stateNow The corresponding signal interval i bin ;

[0092] Then remove the repeated state frequency and state tolerance, and you can get the final frequency hopping signal histogram interval array sig bin , signal state frequency array f state and the signal state tolerance array λ state ; And, remove the array iVld bin If the index is repeated, the number of signal states N can be updated state ;

[0093] If there is no such state frequency f stateAnother , then record the arrays obtained before as the final array, and get the corresponding histogram interval array sig of the frequency hopping signal bin , signal state frequency array f state and the signal state tolerance array λ state .

[0094] Finally, the state-related parameters of the frequency hopping signal can be calculated based on the above signal state-related parameters, mainly by traversing all frequency hopping signals and calculating the state-related parameters of each frequency hopping signal i. sig ,i sig =1,2,…,N sig The following calculations are performed:

[0095] The first step is to find the histogram interval array sig where each frequency hopping signal is located bin (i) In array iVld bin Index idx in;

[0096] Step 2: Calculate the i-th sig The state index sig of the frequency hopping signal id , state error sig dev and state frequency sig f , calculated as follows:

[0097]

[0098] Among them, idx refers to the histogram interval array sig where the frequency hopping signal is located bin (i) In array iVldbin The index in .

[0099] In summary, the above steps can output the corresponding signal state parameters, including: the number of states N state , each signal status index sig id , state error sig dev and state frequency sig f , and the signal state frequency array f state and the signal state tolerance array λ state It is not only simple to implement, but also can adaptively divide the signal state and display the overall distribution characteristics and discreteness of the signal.

[0100] Example 2

[0101] A histogram-based signal state transient analysis device, comprising:

[0102] a memory for non-transitory storage of computer-readable instructions;

[0103] The processor is configured to execute the computer-readable instructions, wherein the computer-readable instructions implement the histogram-based signal state transient analysis method when executed by the processor.

[0104] A non-transitory computer-readable storage medium stores computer-readable instructions, wherein the non-transitory computer-readable storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by a processor, the method for transient analysis of signal states based on a histogram is implemented.

[0105] The above description is merely a preferred embodiment of the present invention and does not constitute any form of limitation to the present invention. Based on the technical essence of the present invention and within the spirit and principles of the present invention, any simple modification, equivalent replacement and improvement of the above embodiment shall still fall within the scope of protection of the technical solution of the present invention.

Claims

1. A histogram-based signal state transient analysis method, characterized in that: The signal state transient analysis method comprises the following steps: S1. Obtain demodulation signal parameter sets for all demodulated signals and the demodulated signal tolerance set i sig =1,2,…,N sig , Wherein, the demodulated signal is a frequency hopping signal or a linear frequency modulation signal, then For the i sig The parameters of the demodulated signal refer to the frequency of the frequency hopping signal or the frequency modulation slope of the linear frequency modulation signal. For the i sig The tolerance of the demodulated signal, N sig is the number of demodulated signals; S2. Obtain demodulated signal parameter set The maximum parameter f max and the minimum parameter f min and the demodulated signal tolerance set Minimum tolerance λ min , and according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min Calculate the histogram parameters and get the corresponding number of intervals N bin and interval width δ; S3, traverse all demodulated signals, according to the number of intervals N bin The interval i where each demodulated signal is located is calculated by using the interval width δ bin , and according to the interval i where the demodulated signal is located bin Calculate the interval parameters to get the signal number array num in the interval bin , parameter sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the demodulated signal is located bin ; S4, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , according to the signal number array num bin , parameter sum array f bin and the tolerance sum array λ bin Calculate the signal state parameters and traverse the array iVld bin , get the corresponding demodulated signal histogram interval array sig bin , signal status parameter array f state and the signal state tolerance array λ state ; S5. Find the histogram interval array sig where the demodulated signal is located bin In array iVld bin The index in , and calculate the demodulated signal i sig Status index sig id , state error sig dev and state parameter sig f .

2. The method for analyzing signal state transients based on histogram according to claim 1, wherein: The tolerance represents the starting point to the ending point of a demodulated signal. When searching from the middle point of the demodulated signal on the histogram, the first point that exceeds the tolerance is recorded as the ending point; then searching from the middle point of the demodulated signal forward, the first point that exceeds the tolerance is recorded as the starting point.

3. The histogram-based signal state transient analysis method according to claim 1, characterized in that: In S2, according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min The process of calculating the histogram parameters is: Initialize the interval width δ to the minimum tolerance λ min ; Calculate and get the maximum parameter f max With the minimum parameter f min The difference between interval ; The difference f interval Divide the result by the interval width δ and round it to get the number of intervals N bin ; The difference f interval Divide by the number of intervals N bin The initialization interval width δ is updated based on the result.

4. The method for transient analysis of signal states based on histogram according to claim 1, characterized in that: In S3, according to the number of intervals N bin And the interval width δ is calculated to obtain each demodulated signal i sig The interval i bin , the calculation is specifically as follows: Among them, ceil(·) is a round-up operation and satisfies 5. The histogram-based signal state transient analysis method according to claim 1, characterized in that: In S3, according to the interval i where the demodulated signal is located bin The interval parameters are calculated, and the calculation is specifically as follows: Among them, num bin (i bin ) is the interval i where the demodulated signal is located bin The number of signals in the array num bin , f bin (i bin ) is the interval i where the demodulated signal is located bin The sum of the parameters of the array f bin ,λ bin (i bin ) is the interval i where the demodulated signal is located bin The tolerance sum array λ bin .

6. The method for transient analysis of signal states based on histogram according to claim 1, characterized in that: The step S4 includes the following steps: S41, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , so that the array iVld bin The number of signal states N state The corresponding signal number array num bin The number of non-zero elements in ; S42. Calculate and obtain the signal state index array iD state , signal status parameter array f state , signal state tolerance array λ state , the calculation is specifically as follows: Among them, num bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The number of signals in the array num bin , f bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The sum of the parameters of the array f bin ,λ bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The tolerance sum array λ bin ; S43. Obtain current state parameter f stateNow , according to the current state parameter f stateNow Traverse other signal states to determine whether there is a state parameter f that meets the range conditions stateAnother , the range condition refers to the state parameter f stateAnother With the current state parameter f stateNow The difference between them is 2*λ min within the scope; If there is a state frequency f stateAnother and the current state frequency f stateNow The difference is 2*λ min Within the range, take the state frequency f stateAnother and the current state frequency f stateNow The mean of is taken as the new state frequency, and the corresponding new state tolerance is obtained in the same way. The state frequency f stateAnother The corresponding signal interval is the current state frequency f stateNow The corresponding signal interval i bin Then remove the repeated state frequency and state tolerance to obtain the final histogram interval array sig of the frequency hopping signal bin , signal state frequency array f state and the signal state tolerance array λ state , and remove the array iVld bin Repeat index in, update the number of signal states N state ; If there is no state frequency f that meets the range condition stateAnother , then record the arrays obtained before as the final array, and get the corresponding histogram interval array sig of the frequency hopping signal bin , signal state frequency array f state and the signal state tolerance array λ state .

7. The histogram-based signal state transient analysis method according to claim 1, characterized in that: In S5, the demodulated signal i is calculated sig Status index sig id , state error sig dev and state parameter sig f , the calculation process is: Among them, idx refers to the histogram interval array sig where the demodulated signal is located bin (i) In array iVld bin The index in .

8. A histogram-based signal state transient analysis device, characterized in that: include: a memory for non-transitory storage of computer-readable instructions; A processor is used to execute the computer-readable instructions, wherein the computer-readable instructions, when executed by the processor, implement the histogram-based signal state transient analysis method according to any one of claims 1 to 7.

9. A non-transitory computer-readable storage medium, wherein: The non-transitory computer-readable storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by a processor, the method for transient analysis of signal states based on a histogram according to any one of claims 1 to 7 is implemented.

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