Method and system for detecting assembly qualification of display equipment

Abstract

The invention relates to the technical field of display equipment production, in particular to an assembly qualification detection method and system for display equipment. The method comprises the following steps: acquiring the equipment size of to-be-detected display equipment; determining a rotation scheme of the matrix light source and the turntable according to the equipment size; according to the rotation scheme, rotation is carried out according to a preset rotation angle, and a detection image of the to-be-detected display device shot by the high-resolution imaging device at the corresponding moment is obtained; analyzing the detection image, and determining an internal change corresponding to each preset rotation angle; and determining whether the to-be-detected display equipment is unqualified or not according to the internal change corresponding to each preset rotation angle. And analyzing the image of the to-be-detected display equipment by using an image processing and analysis technology. And determining the internal change of the display equipment at each rotation angle by comparing a preset ideal image or standard. And evaluating the internal change at each rotation angle.

Description

Technical Field

[0001] The present application relates to the technical field of display device production, and in particular to a method and system for detecting qualified assembly of a display device. Background Art

[0002] With the development of display technology, the assembly quality inspection of display devices has become an important part of the production process. Traditional manual inspection methods are not only inefficient, but also easily affected by human factors, leading to misjudgment or missed judgment.

[0003] Existing display device assembly qualified inspection methods usually rely on manual inspection or simple automated inspection methods, which have problems such as low inspection efficiency and high missed inspection rate. Existing optical inspection methods, especially in the quality inspection of high-resolution display devices, often have difficulty in accurately capturing tiny defects and problems. Summary of the invention

[0004] The present application provides a method and system for detecting qualified assembly of a display device to solve the above-mentioned problems.

[0005] In a first aspect, the present application provides a method for detecting qualified assembly of a display device, the qualified assembly detection method being applied to a detection platform, the detection platform comprising a high-resolution imaging device, a matrix light source, a turntable, and a server, the qualified assembly detection method being applied to the server, the method comprising: Obtaining the device size of the display device to be detected; and determining the rotation scheme of the matrix light source and the turntable according to the device size; According to the rotation scheme, the display device to be detected is rotated according to a preset rotation angle, and a detection image of the display device to be detected taken by the high-resolution imaging device at a corresponding moment is obtained; Analyzing the detection image to determine the internal changes corresponding to each preset rotation angle; Whether the display device to be inspected is unqualified is determined according to the internal changes corresponding to each preset rotation angle.

[0006] Through this solution, the display device to be inspected is scanned by a high-resolution imaging device to obtain its external dimension information. Ensure that the subsequent inspection process can accurately align and cover all areas of the display device. Design the layout of the matrix light source and the rotation scheme of the turntable according to the device size. The layout of the matrix light source ensures that the light source can cover all areas of the display device, and the rotation scheme of the turntable ensures that the display device can be illuminated by the light source and captured by the imaging device at multiple angles and positions. The turntable rotates according to the preset rotation angle, the matrix light source synchronously illuminates the display device, and the high-resolution imaging device captures the image at each rotation angle. Ensure that the image of the display device is obtained from multiple angles so as to comprehensively analyze its internal changes. Use image processing and analysis technology to analyze the image of the display device to be inspected. The analysis content includes defects in the inspection image, changes in the internal structure, light refraction, etc. By comparing the preset ideal image or standard, determine the internal changes of the display device at each rotation angle. Evaluate the internal changes at each rotation angle. If any internal changes that do not meet the quality standards are detected, such as bubbles, lack of glue, abnormal refraction, etc., the display device to be inspected is judged to be unqualified.

[0007] Optionally, the rotation scheme includes light brightness, and the analyzing the detection image to determine the internal changes corresponding to each preset rotation angle includes: Determining the ideal light state of the display device to be detected according to the light brightness; Analyze the detection image to determine the pixel value of the display device to be detected within a preset range; Analyze the ideal light state to determine the ideal pixel value of the display device to be detected within a preset range; Compare the pixel value with the ideal pixel value to determine the pixel abnormality area; The pixel abnormal area is regarded as the internal change corresponding to each preset rotation angle.

[0008] Through this solution, by adjusting the brightness and angle of the matrix light source, the ideal light state is simulated so that the internal changes of the display device can be accurately captured during the inspection process. The images obtained by the high-resolution imaging device can accurately analyze the pixel values ​​of the display device in a specific area, providing a data basis for subsequent defect detection. Through the analysis of the ideal light state, the pixel values ​​that the display device should present under the best light conditions can be determined as a reference standard for defect detection. By comparing the actual pixel values ​​with the ideal pixel values, abnormal areas in the display device can be found, which are indicators of defects. By analyzing the abnormal pixel areas at different rotation angles, the internal changes of the display device can be fully understood, providing a basis for judging the quality of the device.

[0009] Optionally, analyzing the detection image to determine the internal changes corresponding to each preset rotation angle includes: Adjusting the angle parameters of the matrix light source so that the matrix light source is perpendicular to the display device to be detected; When the matrix light source is perpendicular to the display device to be detected, acquiring a vertical image taken by the high-resolution imaging device; Analyze the vertical image to obtain an image analysis result, and determine whether there are bubbles in the display device to be detected according to the image analysis result; If bubbles exist, the bubble size and bubble distribution position are determined according to the image analysis result, and the bubble size and bubble distribution position are used as the internal changes corresponding to each preset rotation angle.

[0010] Through this solution, it is ensured that the matrix light source can illuminate the display device to be inspected at a vertical angle so as to capture the clearest internal structure image. Under high-resolution imaging equipment, the vertically irradiated matrix light source can provide clear internal structure images for subsequent analysis. By analyzing the vertical image, tiny defects inside the display device, such as bubbles, lack of glue, etc., can be identified. Through image analysis, specific information about the internal structure of the display device, such as the type, size and location of the defect, can be obtained. Through the image analysis results, it can be clearly displayed whether there are internal defects such as bubbles in the device. If bubbles are detected, the size of the bubbles can be accurately measured and their distribution position in the display device can be determined. By recording the size and position of the bubbles at different rotation angles, the bubble situation inside the display device can be fully understood, providing data support for quality assessment.

[0011] Optionally, determining whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle includes: Determining a light refraction change according to the pixel abnormal area; Determining whether there is a refraction fault at an edge of the display device to be detected according to the light refraction change; If it exists, the fault position is determined according to the refraction change of the light; Determining whether the display device to be inspected is short of glue according to the fault position; If so, it is determined that the display device to be detected is unqualified.

[0012] Through this solution, by analyzing the abnormal pixel area, the changes in light refraction caused by defects inside the display device can be identified. By analyzing the changes in light refraction, it is determined whether there is a refraction fault at the edge of the display device due to a lack of glue or other manufacturing defects. The specific location of the refraction fault is accurately located to provide a basis for subsequent defect analysis and repair. By analyzing the location and characteristics of the refraction fault, it is determined whether the display device is defective due to a lack of glue. Based on the analysis results of the refraction fault and the lack of glue, it is determined whether the display device meets the quality standards, thereby determining whether it is qualified. Comprehensive and dynamic quality inspection of display devices is achieved, the accuracy and efficiency of inspection are improved, and the high requirements of modern manufacturing industry for display device quality control are met.

[0013] Optionally, determining whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle includes: Classifying the bubbles according to a preset bubble size threshold and the bubble size to determine whether there are large bubbles; If so, it will be determined that the display device to be tested is unqualified. Through this solution, a reference standard is provided for identifying the size of bubbles during the detection process, so as to distinguish acceptable and unacceptable bubbles. Through image analysis technology, bubbles inside the display device are detected and the size of each bubble is accurately measured. According to the bubble size threshold, the detected bubbles are divided into small bubbles and large bubbles for further analysis. It is identified whether there are large bubbles in the display device that exceed the threshold and affect the display quality. According to the presence of large bubbles, it is judged whether the display device meets the predetermined quality standards.

[0014] Optionally, determining whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle includes: Adjusting the light intensity of the matrix light source according to a preset light adjustment scheme; After the adjustment, obtaining a low-light image captured by the high-resolution imaging device; Analyzing the low-light image to obtain a low-light image analysis result; Determining whether small bubbles exist in the display device to be detected according to the low-light image analysis result and the preset bubble size threshold; If so, determining the gathering area of ​​the small bubbles according to the low-light image analysis result; According to the aggregation area, determining the number of small bubbles per unit area of ​​each aggregation area; The number of small bubbles is compared with a preset bubble quantity threshold. If the small bubble data is higher than the preset bubble quantity threshold, it is determined that the display device to be detected is unqualified.

[0015] Through this solution, by adjusting the light intensity, the internal changes of the display device can be observed under different lighting conditions to better identify small bubbles. Under low light conditions, high-resolution imaging devices can capture the details inside the display device, which is helpful for the identification of small bubbles. By analyzing low-light images, small bubbles inside the display device can be identified and corresponding analysis results can be obtained. The number of small bubbles per unit area in each aggregation area is calculated to evaluate the density of bubbles. Based on the number of small bubbles and the preset bubble volume threshold, it is determined whether the display device is qualified.

[0016] Optionally, after determining whether the display device to be inspected is glue-deficient according to the fault position, the method further includes: If there is no glue shortage, determining the glue overflow degree of the display device to be inspected according to the fault position; Determine a scraping solution according to the degree of glue overflow; If the display device to be tested is qualified, obtaining the preparation parameters of the display device to be tested; According to the degree of glue overflow, the actual amount of glue used is determined, and according to the actual amount of glue used, the preparation parameters are adjusted.

[0017] Through this solution, the specific location of the light refraction fault in the display device is identified to determine the glue overflow caused by excessive glue. The degree of glue overflow in the display device is evaluated to determine whether further scraping treatment is required. According to the degree of glue overflow, a suitable scraping treatment plan is formulated to remove excess glue. Evaluate whether the display device meets the quality standards after the scraping treatment. If the display device is qualified, obtain the parameters of its preparation process for subsequent analysis and adjustment. According to the degree of glue overflow after the scraping treatment, determine the actual amount of glue used. According to the actual amount of glue used, adjust the preparation parameters of the display device to optimize the manufacturing process.

[0018] Optionally, the detection platform further includes a storage platform, and before obtaining the device size of the display device to be detected, the method further includes: Acquire and analyze the image captured by the high-resolution imaging device, and determine whether there is a display device to be detected on the storage table according to the analysis result; If it exists, start the matrix light source, and acquire the light source image of the high-resolution imaging device after starting; Analyze the light source image to determine the lamination offset value between the touch screen and the liquid crystal display module of the display device to be detected; The lamination offset value is compared with a preset offset error to determine whether the lamination of the display device to be inspected is qualified.

[0019] Through this solution, the initial image of the display device is captured for subsequent analysis and processing. Through image analysis technology, the display device in the image is identified and its existence is determined. Confirm whether the display device to be tested has been placed on the storage table for subsequent testing. Provide uniform lighting for the display device to better observe the fit between the touch screen and the liquid crystal display module. Under the illumination of the light source, capture the image of the display device to analyze the fit. Through image analysis technology, determine the fit offset value between the touch screen and the liquid crystal display module. Obtain the specific fit offset value between the touch screen and the liquid crystal display module. Evaluate whether the fit offset is within an acceptable error range. Based on the comparison results, determine whether the fit of the display device meets the quality standards. It can ensure that the fit quality of the display device to be tested has been evaluated before obtaining the device size, thereby improving the accuracy and efficiency of the detection.

[0020] In a second aspect, the present application provides a display device assembly qualification detection system, the system comprising: A scheme determination module is used to obtain the device size of the display device to be detected; and determine the rotation scheme of the matrix light source and the turntable according to the device size; An image acquisition module, used to rotate the display device to be detected according to a preset rotation angle according to the rotation scheme, and obtain a detection image of the display device to be detected taken by a high-resolution imaging device at a corresponding moment; An image analysis module, used to analyze the detection image and determine the internal changes corresponding to each preset rotation angle; The qualified analysis module is used to determine whether the display device to be detected is unqualified according to the internal changes corresponding to each preset rotation angle.

[0021] Optionally, the rotation scheme includes light brightness, and the image analysis module analyzes the detection image to determine the internal changes corresponding to each preset rotation angle, and is used to: Determining the ideal light state of the display device to be detected according to the light brightness; Analyze the detection image to determine the pixel value of the display device to be detected within a preset range; Analyze the ideal light state to determine the ideal pixel value of the display device to be detected within a preset range; Compare the pixel value with the ideal pixel value to determine the pixel abnormality area; The pixel abnormal area is regarded as the internal change corresponding to each preset rotation angle.

[0022] Optionally, when the image analysis module analyzes the detection image to determine the internal changes corresponding to each preset rotation angle, it is used to: Adjusting the angle parameters of the matrix light source so that the matrix light source is perpendicular to the display device to be detected; When the matrix light source is perpendicular to the display device to be detected, acquiring a vertical image taken by the high-resolution imaging device; Analyze the vertical image to obtain an image analysis result, and determine whether there are bubbles in the display device to be detected according to the image analysis result; If bubbles exist, the bubble size and bubble distribution position are determined according to the image analysis result, and the bubble size and bubble distribution position are used as the internal changes corresponding to each preset rotation angle.

[0023] Optionally, when the qualified analysis module determines whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle, it is used to: Determining a light refraction change according to the pixel abnormal area; Determining whether there is a refraction fault at an edge of the display device to be detected according to the light refraction change; If it exists, the fault position is determined according to the refraction change of the light; Determining whether the display device to be inspected is short of glue according to the fault position; If so, it is determined that the display device to be detected is unqualified.

[0024] Optionally, when the qualified analysis module determines whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle, it is used to: Classifying the bubbles according to a preset bubble size threshold and the bubble size to determine whether there are large bubbles; If so, it will be determined that the display device to be tested is unqualified.

[0025] Optionally, when the qualified analysis module determines whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle, it is used to: Adjusting the light intensity of the matrix light source according to a preset light adjustment scheme; After the adjustment, obtaining a low-light image captured by the high-resolution imaging device; Analyzing the low-light image to obtain a low-light image analysis result; Determining whether small bubbles exist in the display device to be detected according to the low-light image analysis result and the preset bubble size threshold; If so, determining the gathering area of ​​the small bubbles according to the low-light image analysis result; According to the aggregation area, determining the number of small bubbles per unit area of ​​each aggregation area; The number of small bubbles is compared with a preset bubble quantity threshold. If the small bubble data is higher than the preset bubble quantity threshold, it is determined that the display device to be detected is unqualified.

[0026] Optionally, the qualified assembly detection system further includes a parameter adjustment module, which is used to: If there is no glue shortage, determining the glue overflow degree of the display device to be inspected according to the fault position; Determine a scraping solution according to the degree of glue overflow; If the display device to be tested is qualified, obtaining the preparation parameters of the display device to be tested; According to the degree of glue overflow, the actual amount of glue used is determined, and according to the actual amount of glue used, the preparation parameters are adjusted.

[0027] Optionally, the qualified assembly detection system further includes a fitting detection module, which is used to: Acquire and analyze the image captured by the high-resolution imaging device, and determine whether there is a display device to be detected on the storage table according to the analysis result; If it exists, start the matrix light source, and acquire the light source image of the high-resolution imaging device after starting; Analyze the light source image to determine the lamination offset value between the touch screen and the liquid crystal display module of the display device to be detected; The lamination offset value is compared with a preset offset error to determine whether the lamination of the display device to be inspected is qualified.

[0028] In a third aspect, the present application provides a detection platform, which includes: a high-resolution imaging device, a matrix light source, a turntable, and a server; The high-resolution imaging device is arranged directly above the detection platform and is used to capture the corresponding image of the display device to be detected during the detection process; There are multiple matrix light sources, and the matrix light sources are evenly arranged at preset intervals directly below the detection platform where the display device to be detected is placed. The matrix light source has a rotation function, and the rotation angle is (-90, 90) or (0, 90), and is used to provide light source for the detection of the display device to be detected; The turntable is arranged below the matrix light source, and has a rotation function with a rotation angle of (0,360) to assist the detection platform in detection; The server executes an assembly qualification detection method for a display device. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, a brief introduction will be given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0030] Figure 1 A schematic diagram of an application scenario provided for an embodiment of the present application; Figure 2 A flowchart of a method for detecting qualified assembly of a display device provided in one embodiment of the present application; Figure 3 A schematic diagram of the structure of a qualified assembly detection system for a display device provided in one embodiment of the present application; Figure 4 A data interaction diagram of a testing station provided in one embodiment of the present application; Figure 5 A schematic diagram of the structure of a testing platform provided in one embodiment of the present application; Figure 6 An embodiment of the present application provides a light refraction diagram of a display device, wherein the Q region is a refraction anomaly region. DETAILED DESCRIPTION

[0031] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0032] In addition, the term "and / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article, unless otherwise specified, generally means that the associated objects before and after are in an "or" relationship.

[0033] The embodiments of the present application are further described in detail below in conjunction with the drawings in the specification.

[0034] With the development of display technology, the assembly quality inspection of display devices has become an important part of the production process. Traditional manual inspection methods are not only inefficient, but also easily affected by human factors, leading to misjudgment or missed judgment.

[0035] Existing display device assembly qualified inspection methods usually rely on manual inspection or simple automated inspection methods, which have problems such as low inspection efficiency and high missed inspection rate. Existing optical inspection methods, especially in the quality inspection of high-resolution display devices, often have difficulty in accurately capturing tiny defects and problems.

[0036] Based on this, the present application provides a method and system for detecting the qualified assembly of a display device. The qualified assembly detection method is applied to a detection platform, which includes a high-resolution imaging device, a matrix light source, a turntable, and a server. The qualified assembly detection method is applied to the server, and the method includes: obtaining the device size of the display device to be detected; determining the rotation scheme of the matrix light source and the turntable according to the device size; rotating according to the preset rotation angle according to the rotation scheme, and obtaining the detection image of the display device to be detected taken by the high-resolution imaging device at the corresponding time; analyzing the detection image to determine the internal changes corresponding to each preset rotation angle; determining whether the display device to be detected is unqualified according to the internal changes corresponding to each preset rotation angle. Scan the display device to be detected by the high-resolution imaging device to obtain its external dimension information. Ensure that the subsequent detection process can accurately align and cover all areas of the display device. Design the layout of the matrix light source and the rotation scheme of the turntable according to the device size. The layout of the matrix light source ensures that the light source can cover all areas of the display device, and the rotation scheme of the turntable ensures that the display device can be irradiated by the light source and captured by the imaging device at multiple angles and positions. The turntable rotates according to the preset rotation angle, the matrix light source synchronously irradiates the display device, and the high-resolution imaging device captures the image at each rotation angle. It ensures that images of the display device are obtained from multiple angles in order to comprehensively analyze its internal changes. The images of the display device to be inspected are analyzed using image processing and analysis techniques. The analysis includes defects in the inspection image, changes in the internal structure, light refraction, etc. The internal changes of the display device at each rotation angle are determined by comparing with the preset ideal image or standard. The internal changes at each rotation angle are evaluated. If any internal changes that do not meet the quality standards are detected, such as bubbles, lack of glue, abnormal refraction, etc., the display device to be inspected is judged to be unqualified.

[0037] Figure 1A schematic diagram of an application scenario provided by the present application, in the production process of the display, when the quality inspection of the fully fitted screen is performed, the method provided by the present application is applied, specifically, the method provided by the present application is applied to any server, the server interacts with the inspection station, and the display device to be inspected is scanned by the high-resolution imaging device of the inspection station to obtain its external dimension information. Ensure that the subsequent inspection process can accurately align and cover all areas of the display device. According to the device size, the layout of the matrix light source of the inspection station and the rotation scheme of the turntable are designed. The layout of the matrix light source ensures that the light source can cover all areas of the display device, and the rotation scheme of the turntable ensures that the display device can be illuminated by the light source and captured by the imaging device at multiple angles and positions. The turntable rotates according to the preset rotation angle, the matrix light source synchronously illuminates the display device, and the high-resolution imaging device captures the image at each rotation angle. Ensure that the image of the display device is obtained from multiple angles so as to comprehensively analyze its internal changes. Image processing and analysis technology is used to analyze the image of the display device to be inspected. The analysis content includes defects in the detection image, changes in the internal structure, light refraction, etc. By comparing the preset ideal image or standard, the internal changes of the display device at each rotation angle are determined. The internal changes at each rotation angle are evaluated. If any internal changes that do not meet the quality standards are detected, such as bubbles, glue shortage, refraction anomalies, etc., the display device to be tested is determined to be unqualified. The specific implementation method can refer to the following embodiments.

[0038] Figure 2 This is a flow chart of a method for detecting qualified assembly of a display device provided in an embodiment of the present application. The method of this embodiment can be applied to the server in the above scenario. Figure 2 As shown, the method includes: S201, obtaining the device size of the display device to be detected; and determining the rotation scheme of the matrix light source and the turntable according to the device size.

[0039] The display device to be tested may be a display device that needs to undergo quality testing, such as a liquid crystal display (LCD), an organic light emitting diode display (OLED), a plasma display panel (PDP), and a fully laminated screen such as a touch screen (TP).

[0040] The device size may be the physical size of the display device to be detected, including length, width, thickness, etc.

[0041] The matrix light source may be a plurality of groups of light sources that emit light simultaneously, illuminating the display device to be inspected with the same brightness and angle.

[0042] The turntable may be a tabletop that can be electrically rotated, and is used to place the display device to be inspected, and to change the angle of the display device relative to the light source and the imaging device by rotating.

[0043] The rotation scheme can be a turntable rotation plan designed according to the equipment size and detection requirements, such as rotation angle, speed and direction.

[0044] Specifically, the traditional manual inspection method is not only inefficient, but also easily affected by human factors, resulting in misjudgment or missed judgment. In addition, manual inspection can usually only be carried out under static conditions, and it is impossible to simulate the dynamic performance of the device in actual use, thus affecting the accuracy of the inspection results. Existing optical inspection methods, especially in the quality inspection of high-resolution display devices, often find it difficult to accurately capture tiny defects and problems, such as bubbles, lack of glue, abnormal refraction, etc. inside the display screen. These problems are usually difficult to find through simple visual inspection. This solution uses a high-resolution imaging device to take images of the display device at multiple angles of the display device to be inspected, and uses image processing technology to analyze the boundaries and feature points in the image to obtain the external dimensions of the display device. The obtained device size is used to design the layout of the matrix light source and the rotation scheme of the turntable, such as the rotation angle and speed. The matrix light source needs to cover all areas of the display device to be inspected, and the rotation scheme of the turntable needs to enable the display device to be illuminated by the light source and captured by the imaging device at different angles and positions.

[0045] S202 . According to the rotation scheme, the display device to be inspected is rotated according to a preset rotation angle, and a detection image of the display device to be inspected taken by a high-resolution imaging device at a corresponding moment is obtained.

[0046] The preset rotation angle may be a rotation angle of the matrix light source or the turntable that is preset during the detection process, and these angles will be used to ensure that the display device is detected at multiple angles.

[0047] The corresponding moment may be a specific time point when the matrix light source or the turntable rotates to a preset angle and the high-resolution imaging device captures the detection image.

[0048] The high-resolution imaging device may be a camera or a video camera with high pixel density and image quality, and is used to capture images of the display device to be inspected.

[0049] The detection image may be an image of the display device captured by a high-resolution imaging device at a corresponding moment.

[0050] Specifically, according to the rotation scheme, the turntable and the matrix light source are started and rotated according to a preset rotation angle. At each rotation angle, the matrix light source illuminates the display device to be inspected, and the high-resolution imaging device captures the image of the display device.

[0051] S203, analyzing the detection image to determine the internal changes corresponding to each preset rotation angle.

[0052] Internal changes can be changes in the internal structure of the display device observed in the test image, such as bubbles, glue shortage, refraction anomalies (such as Figure 6 shown) etc.

[0053] Specifically, the acquired monitoring images are preprocessed, such as denoising and contrast enhancement, and the images of the display device to be inspected are analyzed using image processing and analysis techniques and image recognition algorithms. The analysis includes defects in the inspection images, changes in internal structures, light refraction, etc. By comparing with the preset ideal image or standard, the internal changes of the display device at each rotation angle can be determined.

[0054] S204: Determine whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle.

[0055] Specifically, the internal changes at each rotation angle are evaluated based on the analysis results of the monitoring images. If any internal changes that do not meet the quality standards are detected, such as bubbles, glue shortage, refraction anomalies, etc., the display device to be tested is determined to be unqualified.

[0056] Through this solution, the display device to be inspected is scanned by a high-resolution imaging device to obtain its external dimension information. Ensure that the subsequent inspection process can accurately align and cover all areas of the display device. Design the layout of the matrix light source and the rotation scheme of the turntable according to the device size. The layout of the matrix light source ensures that the light source can cover all areas of the display device, and the rotation scheme of the turntable ensures that the display device can be illuminated by the light source and captured by the imaging device at multiple angles and positions. The turntable rotates according to the preset rotation angle, the matrix light source synchronously illuminates the display device, and the high-resolution imaging device captures the image at each rotation angle. Ensure that the image of the display device is obtained from multiple angles so as to comprehensively analyze its internal changes. Use image processing and analysis technology to analyze the image of the display device to be inspected. The analysis content includes defects in the inspection image, changes in the internal structure, light refraction, etc. By comparing the preset ideal image or standard, determine the internal changes of the display device at each rotation angle. Evaluate the internal changes at each rotation angle. If any internal changes that do not meet the quality standards are detected, such as bubbles, lack of glue, abnormal refraction, etc., the display device to be inspected is judged to be unqualified.

[0057] In some embodiments, the rotation scheme includes light brightness, and based on the light brightness, determining the ideal light state of the display device to be detected; analyzing the detection image to determine the pixel value of the display device to be detected within a preset range; analyzing the ideal light state to determine the ideal pixel value of the display device to be detected within the preset range; comparing the pixel value with the ideal pixel value to determine the pixel abnormality area; and using the pixel abnormality area as the internal change corresponding to each preset rotation angle.

[0058] The light brightness may be the intensity of the light illuminating the display device to be detected.

[0059] The ideal light state may be the best light state that a display device should exhibit under specific conditions.

[0060] The ideal pixel value may be a pixel value that a display device should have within a preset range under an ideal light condition.

[0061] The pixel value can be information such as brightness, color, and contrast of each pixel in the detected image.

[0062] The preset range may be a specific area of ​​the display device that needs to be focused on during the inspection process. The preset range may be adjusted according to the inspection requirements to focus on the key parts of the display device and stored in a preset database.

[0063] The pixel abnormal area can be an area in the detection image where the actual pixel value is significantly different from the ideal pixel value.

[0064] Specifically, according to the characteristics of the display device to be tested, such as materials, surface treatment, etc., and the testing requirements, the appropriate light brightness is determined by adjusting the power of the matrix light source or using different light source combinations. According to the test image, the light state of the display device under different light brightness is analyzed to determine the ideal light state. The test image is analyzed to determine the pixel value of the display device within a preset range. The pixel value can reflect the light reflection and transmission of the display device under different light brightness. According to the ideal light state, the ideal pixel value of the display device within a preset range is determined. The ideal pixel value is a standard for comparing and analyzing the actual pixel value in the test image. The pixel value in the test image is compared with the ideal pixel value to determine the pixel abnormal area. These areas may indicate that the display device has defects, such as bubbles, lack of glue, refraction abnormality, etc. The pixel abnormal area is taken as the internal change corresponding to each preset rotation angle. These changes will be used to judge the quality of the display device.

[0065] Through this solution, by adjusting the brightness and angle of the matrix light source, the ideal light state is simulated so that the internal changes of the display device can be accurately captured during the inspection process. The images obtained by the high-resolution imaging device can accurately analyze the pixel values ​​of the display device in a specific area, providing a data basis for subsequent defect detection. Through the analysis of the ideal light state, the pixel values ​​that the display device should present under the best light conditions can be determined as a reference standard for defect detection. By comparing the actual pixel values ​​with the ideal pixel values, abnormal areas in the display device can be found, which are indicators of defects. By analyzing the abnormal pixel areas at different rotation angles, the internal changes of the display device can be fully understood, providing a basis for judging the quality of the device.

[0066] In some embodiments, the angle parameters of the matrix light source are adjusted so that the matrix light source is perpendicular to the display device to be detected; when the matrix light source is perpendicular to the display device to be detected, a vertical image taken by a high-resolution imaging device is acquired; the vertical image is analyzed to obtain an image analysis result, and based on the image analysis result, it is determined whether there are bubbles in the display device to be detected; if bubbles exist, the bubble size and bubble distribution position are determined based on the image analysis result, and the bubble size and bubble distribution position are used as the internal changes corresponding to each preset rotation angle.

[0067] The angle parameter may be a parameter used to adjust the angle of the light source, such as the tilt angle of the light source, the angle between the light source and the surface of the display device, and the like.

[0068] The vertical image may be an image captured when a matrix light source illuminates the display device at a vertical angle under a high-resolution imaging device.

[0069] The image analysis result may be the result obtained after image processing of the inspection image, such as information such as the type, size, and location of the defect.

[0070] The bubble size may be the size of the bubble inside the display device, usually expressed as a diameter or area.

[0071] The bubble distribution position may be a specific position of the bubble inside the display device, which is usually described by coordinates or relative positions.

[0072] Specifically, use the light source control software or hardware interface to adjust the angle of the matrix light source so that it is perpendicular to the surface of the display device. Start the high-resolution imaging device and take an image of the display device with the matrix light source irradiated vertically. Use image processing software to pre-process the vertical image by denoising and enhancing it, and then apply the image recognition algorithm to identify and locate defects. Analyze the pre-processed image, extract the defect features, and use the algorithm to quantify the size and location of the defect. Based on the image analysis results, check whether there are image features of bubbles, such as circular or elliptical transparent areas. Use the image measurement tool to measure the size of the bubbles and record their position coordinates. Associate the size and position information of the bubbles with the corresponding rotation angle to form a defect database for subsequent quality assessment.

[0073] Through this solution, it is ensured that the matrix light source can illuminate the display device to be inspected at a vertical angle so as to capture the clearest internal structure image. Under high-resolution imaging equipment, the vertically irradiated matrix light source can provide clear internal structure images for subsequent analysis. By analyzing the vertical image, tiny defects inside the display device, such as bubbles, lack of glue, etc., can be identified. Through image analysis, specific information about the internal structure of the display device, such as the type, size and location of the defect, can be obtained. Through the image analysis results, it can be clearly displayed whether there are internal defects such as bubbles in the device. If bubbles are detected, the size of the bubbles can be accurately measured and their distribution position in the display device can be determined. By recording the size and position of the bubbles at different rotation angles, the bubble situation inside the display device can be fully understood, providing data support for quality assessment.

[0074] In some embodiments, based on the abnormal pixel area, the refraction change of light is determined; based on the refraction change of light, it is determined whether there is a refraction fault at the edge of the device of the display device to be tested; if so, the fault position is determined based on the refraction change of light; based on the fault position, it is determined whether there is glue deficiency in the display device to be tested; if so, it is determined that the display device to be tested is unqualified.

[0075] The change in light refraction can be the change in the propagation direction of light when the light passes through different media (such as various layers of a display device) due to the different refractive indices of the media.

[0076] The device edge may be an edge region of a display device, typically a portion of the display device that contacts the external environment.

[0077] A refractive fault may be an area in a display device where light refraction is abnormal due to medium discontinuity or a sudden change in refractive index.

[0078] The fault position may be the specific position of the refractive fault in the display device, which is usually described by coordinates or relative positions. The fault position information helps to determine the nature and severity of the defect.

[0079] Glue deficiency may be caused by insufficient glue filling or uneven glue distribution in some areas during the manufacturing process of the display device, which may affect the structural integrity of the display device.

[0080] Specifically, use image processing technology to analyze the light refraction pattern in the detection image and identify abnormal light propagation paths. Mark the areas of light refraction faults in the image and analyze the characteristics of these areas. Use image measurement tools to measure the coordinates and range of the refraction faults. Compare the location of the refraction fault with the structure diagram of the display device to determine whether it coincides with the area related to the lack of glue. Evaluate the overall quality of the display device according to the preset quality standards, and if there is unacceptable lack of glue or other defects, it will be judged as unqualified.

[0081] Through this solution, by analyzing the abnormal pixel area, the changes in light refraction caused by defects inside the display device can be identified. By analyzing the changes in light refraction, it is determined whether there is a refraction fault at the edge of the display device due to a lack of glue or other manufacturing defects. The specific location of the refraction fault is accurately located to provide a basis for subsequent defect analysis and repair. By analyzing the location and characteristics of the refraction fault, it is determined whether the display device is defective due to a lack of glue. Based on the analysis results of the refraction fault and the lack of glue, it is determined whether the display device meets the quality standards, thereby determining whether it is qualified. Comprehensive and dynamic quality inspection of display devices is achieved, the accuracy and efficiency of inspection are improved, and the high requirements of modern manufacturing industry for display device quality control are met.

[0082] In some embodiments, the bubbles are classified according to a preset bubble size threshold and the bubble size to determine whether large bubbles exist; if so, the display device to be tested is determined to be unqualified.

[0083] The preset bubble size threshold may be a standard value preset in a display device quality inspection process for distinguishing bubble sizes.

[0084] A large bubble may be a bubble detected in the display device whose size exceeds a preset bubble size threshold.

[0085] Specifically, a standard is determined to distinguish between acceptable small bubbles and unacceptable large bubbles. Using image processing software, the bubble area in the image is identified, and the diameter or area of ​​the bubble is calculated using a measurement tool. The detected bubble size is compared with a threshold value to classify the bubbles into small and large bubbles. The classification results are checked to determine whether there are any bubbles whose size exceeds the threshold value. If large bubbles are present, the display device is judged as unqualified according to the preset quality standard.

[0086] Through this solution, a reference standard is provided for identifying the size of bubbles during the detection process, so as to distinguish acceptable and unacceptable bubbles. Through image analysis technology, bubbles inside the display device are detected and the size of each bubble is accurately measured. According to the bubble size threshold, the detected bubbles are divided into small bubbles and large bubbles for further analysis. It is identified whether there are large bubbles in the display device that exceed the threshold and affect the display quality. According to the presence of large bubbles, it is judged whether the display device meets the predetermined quality standards.

[0087] In some embodiments, the light intensity of the matrix light source is adjusted according to a preset light adjustment scheme; after the adjustment, a low-light image taken by a high-resolution imaging device is obtained; the low-light image is analyzed to obtain a low-light image analysis result; based on the low-light image analysis result and a preset bubble size threshold, it is determined whether there are small bubbles in the display device to be inspected; if so, the aggregation area of ​​the small bubbles is determined according to the low-light image analysis result; based on the aggregation area, the number of small bubbles per unit area of ​​each aggregation area is determined; the number of small bubbles is compared with the preset bubble amount threshold, and if the small bubble data is higher than the preset bubble amount threshold, it is determined that the display device to be inspected is unqualified.

[0088] The preset lighting adjustment scheme may be a pre-designed lighting configuration scheme for adjusting the light intensity and irradiation angle of the matrix light source, and is stored in a preset database.

[0089] The low-light image may be an image of a display device captured by a high-resolution imaging device using a lower light intensity.

[0090] The low-light image analysis result may be a result obtained after analyzing the low-light image.

[0091] Small bubbles can be small-sized bubbles inside a display device, usually smaller than a preset bubble size threshold. Small bubbles are caused by some minor problems in the manufacturing process. If the number is too large, it may affect the performance and appearance of the display device.

[0092] The gathering area may be an area where small bubbles gather inside the display device, and is usually described by coordinates or relative positions.

[0093] The preset bubble quantity threshold may be a preset standard value for determining the quantity of small bubbles inside the display device, and is stored in a preset database.

[0094] Specifically, use the light source control software or hardware interface to adjust the light intensity of the matrix light source according to the preset light adjustment plan, start the high-resolution imaging device, and take a low-light image of the display device under the adjusted light intensity. Use image processing software to perform pre-processing such as denoising and enhancement on the low-light image, and then apply the image recognition algorithm to identify and locate small bubbles. Check the low-light image analysis results to find all small bubbles that are smaller than the preset bubble size threshold. Use the image analysis tool to mark the area where small bubbles gather. Use the image measurement tool to measure the area of ​​the gathering area and calculate the number of small bubbles. Compare the number of small bubbles with the preset bubble volume threshold. If the number of small bubbles exceeds the threshold, the display device is judged to be unqualified.

[0095] Through this solution, by adjusting the light intensity, the internal changes of the display device can be observed under different lighting conditions to better identify small bubbles. Under low light conditions, high-resolution imaging devices can capture the details inside the display device, which is helpful for the identification of small bubbles. By analyzing low-light images, small bubbles inside the display device can be identified and corresponding analysis results can be obtained. The number of small bubbles per unit area in each aggregation area is calculated to evaluate the density of bubbles. Based on the number of small bubbles and the preset bubble volume threshold, it is determined whether the display device is qualified.

[0096] In some embodiments, if there is no glue deficiency, the degree of glue overflow of the display device to be tested is determined according to the fault position; a scraping plan is determined according to the degree of glue overflow; if the display device to be tested is qualified, the preparation parameters of the display device to be tested are obtained; according to the degree of glue overflow, the actual amount of glue used is determined, and the preparation parameters are adjusted according to the actual amount of glue used.

[0097] The degree of glue overflow may be the amount of glue overflowing from a predetermined position or exceeding a designed range during the manufacturing process of the display device.

[0098] The scraping solution may be a specific scraping treatment method formulated for glue overflowing on the display device.

[0099] The preparation parameters may be various process parameters used in the manufacturing process of the display device, such as the type, viscosity, curing time, temperature, pressure, glue coating speed, etc. of the glue.

[0100] The actual amount of glue used may be the actual amount of glue used in the actual manufacturing process, which is different from the theoretical calculated amount because there may be overflow of glue, waste, etc. in actual operation.

[0101] Specifically, use image processing software to analyze the fault features in the detection image and determine the coordinates and range of the fault. According to the fault position and the design specifications of the display device, analyze the area and thickness of the overflow glue and calculate the degree of overflow glue. According to the degree of overflow glue and the characteristics of the display device, select appropriate scraping tools and methods and formulate a scraping plan. Re-test the display device after scraping to evaluate its quality and performance to determine whether it is qualified. Record the preparation parameters of the display device, including information such as the type, amount, temperature, and pressure of the glue. By measuring the difference in glue usage before and after scraping, calculate the actual amount of glue used. According to the actual amount of glue used, analyze whether the setting of the preparation parameters is reasonable, and make adjustments if necessary to improve preparation efficiency and product quality.

[0102] Through this solution, the specific location of the light refraction fault in the display device is identified to determine the glue overflow caused by excessive glue. The degree of glue overflow in the display device is evaluated to determine whether further scraping treatment is required. According to the degree of glue overflow, a suitable scraping treatment plan is formulated to remove excess glue. Evaluate whether the display device meets the quality standards after the scraping treatment. If the display device is qualified, obtain the parameters of its preparation process for subsequent analysis and adjustment. According to the degree of glue overflow after the scraping treatment, determine the actual amount of glue used. According to the actual amount of glue used, adjust the preparation parameters of the display device to optimize the manufacturing process.

[0103] In some embodiments, the testing platform also includes a placement table, and before obtaining the device size of the display device to be tested, it also includes: obtaining and analyzing the image captured by the high-resolution imaging device, and determining whether there is a display device to be tested on the placement table based on the analysis result; if so, starting the matrix light source, and obtaining the light source image of the high-resolution imaging device after starting; analyzing the light source image to determine the fitting offset value between the touch screen and the liquid crystal display module of the display device to be tested; comparing the fitting offset value with the preset offset error to determine whether the fitting of the display device to be tested is qualified.

[0104] The captured image may be a static picture obtained by a high-resolution imaging device after capturing the stage when the matrix light source is perpendicular to the display device to be detected.

[0105] The light source image may be a static picture obtained by a high-resolution imaging device after photographing the display device when the matrix light source is perpendicular to the display device to be detected.

[0106] The lamination offset value may be the actual position deviation between the touch screen and the liquid crystal display module during the lamination process.

[0107] The preset offset error may be a preset maximum offset error range allowed between the touch screen and the liquid crystal display module during the manufacturing or testing process and stored in a preset database.

[0108] Specifically, use a high-resolution imaging device to photograph the storage table to ensure that the image is clear and includes the display device to be detected. Use image processing software to pre-process the captured image, such as denoising, contrast enhancement, etc., and then apply the image recognition algorithm to detect the presence of the display device. According to the image analysis results, determine whether there is a display device to be detected on the storage table. Start the matrix light source to ensure that the light source covers the entire display device area to be detected. Use a high-resolution imaging device to take an image of the display device again under the illumination of the light source. Pre-process and analyze the light source image, and use the image processing algorithm to identify and measure the fitting offset. According to the analysis results, calculate the specific value of the fitting offset. Compare the calculated fitting offset value with the preset offset error threshold. If the fitting offset value is within the preset error range, the fitting is determined to be qualified; if it exceeds the range, it is determined to be unqualified.

[0109] Through this solution, the initial image of the display device is captured for subsequent analysis and processing. Through image analysis technology, the display device in the image is identified and its existence is determined. Confirm whether the display device to be tested has been placed on the storage table for subsequent testing. Provide uniform lighting for the display device to better observe the fit between the touch screen and the liquid crystal display module. Under the illumination of the light source, capture the image of the display device to analyze the fit. Through image analysis technology, determine the fit offset value between the touch screen and the liquid crystal display module. Obtain the specific fit offset value between the touch screen and the liquid crystal display module. Evaluate whether the fit offset is within an acceptable error range. Based on the comparison results, determine whether the fit of the display device meets the quality standards. It can ensure that the fit quality of the display device to be tested has been evaluated before obtaining the device size, thereby improving the accuracy and efficiency of the detection.

[0110] Figure 3 A schematic diagram of a display device assembly qualification detection system provided in an embodiment of the present application is shown in FIG. Figure 3 As shown, the assembly qualification detection system 300 of the display device of this embodiment includes: a solution determination module 301 , an image acquisition module 302 , an image analysis module 303 , and a qualification analysis module 304 .

[0111] The scheme determination module 301 is used to obtain the device size of the display device to be detected; and determine the rotation scheme of the matrix light source and the turntable according to the device size; An image acquisition module 302 is used to rotate the display device to be detected according to a preset rotation angle according to the rotation scheme, and obtain a detection image of the display device to be detected taken by a high-resolution imaging device at a corresponding moment; An image analysis module 303 is used to analyze the detection image and determine the internal changes corresponding to each preset rotation angle; The qualified analysis module 304 is used to determine whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle.

[0112] Optionally, the rotation scheme includes light brightness, and the image analysis module 303 analyzes the detection image to determine the internal changes corresponding to each preset rotation angle, and is used to: Determining the ideal light state of the display device to be detected according to the light brightness; Analyze the detection image to determine the pixel value of the display device to be detected within a preset range; Analyze the ideal light state to determine the ideal pixel value of the display device to be detected within a preset range; Compare the pixel value with the ideal pixel value to determine the pixel abnormality area; The pixel abnormal area is regarded as the internal change corresponding to each preset rotation angle.

[0113] Optionally, when the image analysis module 303 analyzes the detection image to determine the internal changes corresponding to each preset rotation angle, it is used to: Adjusting the angle parameters of the matrix light source so that the matrix light source is perpendicular to the display device to be detected; When the matrix light source is perpendicular to the display device to be detected, acquiring a vertical image taken by the high-resolution imaging device; Analyze the vertical image to obtain an image analysis result, and determine whether there are bubbles in the display device to be detected according to the image analysis result; If bubbles exist, the bubble size and bubble distribution position are determined according to the image analysis result, and the bubble size and bubble distribution position are used as the internal changes corresponding to each preset rotation angle.

[0114] Optionally, when the qualified analysis module 304 determines whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle, it is used to: Determining a light refraction change according to the pixel abnormal area; Determining whether there is a refraction fault at an edge of the display device to be detected according to the light refraction change; If it exists, the fault position is determined according to the refraction change of the light; Determining whether the display device to be inspected is short of glue according to the fault position; If so, it is determined that the display device to be detected is unqualified.

[0115] Optionally, when the qualified analysis module 304 determines whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle, it is used to: Classifying the bubbles according to a preset bubble size threshold and the bubble size to determine whether there are large bubbles; If so, it will be determined that the display device to be tested is unqualified.

[0116] Optionally, when the qualified analysis module 304 determines whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle, it is used to: Adjusting the light intensity of the matrix light source according to a preset light adjustment scheme; After the adjustment, obtaining a low-light image captured by the high-resolution imaging device; Analyzing the low-light image to obtain a low-light image analysis result; Determining whether small bubbles exist in the display device to be detected according to the low-light image analysis result and the preset bubble size threshold; If so, determining the gathering area of ​​the small bubbles according to the low-light image analysis result; According to the aggregation area, determining the number of small bubbles per unit area of ​​each aggregation area; The number of small bubbles is compared with a preset bubble quantity threshold. If the small bubble data is higher than the preset bubble quantity threshold, it is determined that the display device to be detected is unqualified.

[0117] Optionally, the qualified assembly detection system 300 further includes a parameter adjustment module 305, which is used to: If there is no glue shortage, determining the glue overflow degree of the display device to be inspected according to the fault position; Determine a scraping solution according to the degree of glue overflow; If the display device to be tested is qualified, obtaining the preparation parameters of the display device to be tested; According to the degree of glue overflow, the actual amount of glue used is determined, and according to the actual amount of glue used, the preparation parameters are adjusted.

[0118] Optionally, the qualified assembly detection system 300 further includes a fitting detection module 306, which is used to: Acquire and analyze the image captured by the high-resolution imaging device, and determine whether there is a display device to be detected on the storage table according to the analysis result; If it exists, start the matrix light source, and acquire the light source image of the high-resolution imaging device after starting; Analyze the light source image to determine the lamination offset value between the touch screen and the liquid crystal display module of the display device to be detected; The lamination offset value is compared with a preset offset error to determine whether the lamination of the display device to be inspected is qualified.

[0119] The system of this embodiment can be used to execute the method of any of the above embodiments. The implementation principles and technical effects are similar and will not be described in detail here.

[0120] This solution also provides a detection platform, such as Figure 4 , Figure 5 As shown, it includes a high-resolution imaging device 1, a matrix light source 2, a turntable 3, and a server; The high-resolution imaging device 1 is arranged directly above the detection platform and is used to capture the corresponding image of the display device to be detected during the detection process; There are multiple matrix light sources 2, and several matrix light sources are evenly arranged at preset intervals directly below the detection platform where the display device to be detected is placed. The matrix light source 2 has a rotation function, and the rotation angle is (-90, 90) or (0, 90), which is used to provide light source for the detection of the display device to be detected; The turntable 3 is arranged below the matrix light source, and has a rotation function with a rotation angle of (0, 360) to assist the detection platform in detection; The server executes an assembly qualification detection method for a display device.

[0121] The detection platform of this embodiment can be used to execute the method of any of the above embodiments. The implementation principles and technical effects are similar and will not be described in detail here.

Claims

1. A method for detecting qualified assembly of a display device, characterized in that: The qualified assembly detection method is applied to a detection platform, the detection platform includes a high-resolution imaging device, a matrix light source, a turntable, and a server. The qualified assembly detection method is applied to the server, and the method includes: Obtaining the device size of the display device to be detected; and determining the rotation scheme of the matrix light source and the turntable according to the device size; According to the rotation scheme, the display device to be detected is rotated according to a preset rotation angle, and a detection image of the display device to be detected taken by the high-resolution imaging device at a corresponding moment is obtained; Analyzing the detection image to determine the internal changes corresponding to each preset rotation angle; Whether the display device to be inspected is unqualified is determined according to the internal changes corresponding to each preset rotation angle.

2. The method according to claim 1, characterized in that The rotation scheme includes light brightness, and the analyzing the detection image to determine the internal changes corresponding to each preset rotation angle includes: Determining the ideal light state of the display device to be detected according to the light brightness; Analyze the detection image to determine the pixel value of the display device to be detected within a preset range; Analyze the ideal light state to determine the ideal pixel value of the display device to be detected within a preset range; Compare the pixel value with the ideal pixel value to determine the pixel abnormality area; The pixel abnormal area is regarded as the internal change corresponding to each preset rotation angle.

3. The method according to claim 1, characterized in that The analyzing the detection image to determine the internal changes corresponding to each preset rotation angle includes: Adjusting the angle parameters of the matrix light source so that the matrix light source is perpendicular to the display device to be detected; When the matrix light source is perpendicular to the display device to be detected, acquiring a vertical image taken by the high-resolution imaging device; Analyze the vertical image to obtain an image analysis result, and determine whether there are bubbles in the display device to be detected according to the image analysis result; If bubbles exist, the bubble size and bubble distribution position are determined according to the image analysis result, and the bubble size and bubble distribution position are used as the internal changes corresponding to each preset rotation angle.

4. The method according to claim 2, characterized in that: The step of determining whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle includes: Determining a light refraction change according to the pixel abnormal area; Determining whether there is a refraction fault at an edge of the display device to be detected according to the light refraction change; If it exists, the fault position is determined according to the refraction change of the light; Determining whether the display device to be inspected is short of glue according to the fault position; If so, it is determined that the display device to be detected is unqualified.

5. The method according to claim 3, characterized in that: The step of determining whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle includes: Classifying the bubbles according to a preset bubble size threshold and the bubble size to determine whether there are large bubbles; If so, it will be determined that the display device to be tested is unqualified.

6. The method according to claim 5, characterized in that The step of determining whether the display device to be inspected is unqualified according to the internal changes corresponding to each preset rotation angle includes: Adjusting the light intensity of the matrix light source according to a preset light adjustment scheme; After the adjustment, obtaining a low-light image captured by the high-resolution imaging device; Analyzing the low-light image to obtain a low-light image analysis result; Determining whether small bubbles exist in the display device to be detected according to the low-light image analysis result and the preset bubble size threshold; If so, determining the gathering area of ​​the small bubbles according to the low-light image analysis result; According to the aggregation area, determining the number of small bubbles per unit area of ​​each aggregation area; The number of small bubbles is compared with a preset bubble quantity threshold. If the small bubble data is higher than the preset bubble quantity threshold, it is determined that the display device to be detected is unqualified.

7. The method according to claim 4, characterized in that After determining whether the display device to be inspected has glue deficiency according to the fault position, the method further includes: If there is no glue shortage, determining the glue overflow degree of the display device to be inspected according to the fault position; Determine a scraping solution according to the degree of glue overflow; If the display device to be tested is qualified, obtaining the preparation parameters of the display device to be tested; According to the degree of glue overflow, the actual amount of glue used is determined, and according to the actual amount of glue used, the preparation parameters are adjusted.

8. The method according to claim 1, characterized in that: The testing platform also includes a storage platform, and before obtaining the device size of the display device to be tested, the method further includes: Acquire and analyze the image captured by the high-resolution imaging device, and determine whether there is a display device to be detected on the storage table according to the analysis result; If it exists, start the matrix light source, and acquire the light source image of the high-resolution imaging device after starting; Analyze the light source image to determine the lamination offset value between the touch screen and the liquid crystal display module of the display device to be detected; The lamination offset value is compared with a preset offset error to determine whether the lamination of the display device to be inspected is qualified.

9. A testing platform, characterized in that: Including high-resolution imaging equipment, matrix light source, turntable, server, The high-resolution imaging device is arranged directly above the detection platform and is used to capture the corresponding image of the display device to be detected during the detection process; There are multiple matrix light sources, and the matrix light sources are evenly arranged at preset intervals directly below the detection platform where the display device to be detected is placed. The matrix light source has a rotation function, and the rotation angle is (-90, 90) or (0, 90), and is used to provide light source for the detection of the display device to be detected; The turntable is arranged below the matrix light source, and has a rotation function with a rotation angle of (0,360) to assist the detection platform in detection; The server executes the method according to any one of claims 1 to 8.

10. A display device assembly qualification detection system, characterized in that: The method as claimed in any one of claims 1 to 8 comprises: A scheme determination module is used to obtain the device size of the display device to be detected; and determine the rotation scheme of the matrix light source and the turntable according to the device size; An image acquisition module, used to rotate the display device to be detected according to a preset rotation angle according to the rotation scheme, and obtain a detection image of the display device to be detected taken by a high-resolution imaging device at a corresponding moment; An image analysis module, used to analyze the detection image and determine the internal changes corresponding to each preset rotation angle; The qualified analysis module is used to determine whether the display device to be detected is unqualified according to the internal changes corresponding to each preset rotation angle.

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