Test probe device

Abstract

The invention relates to a test probe arrangement (1) for making electrical contact of, in particular, multi-pole contacts, comprising a carrier part (2) having at least one guide opening (4), in which the test probe is mounted in a longitudinally displaceable manner, and comprising at least one test probe (5), the test probe (5) having a cylindrical housing (6), one or more, in particular pin-shaped contact elements (7) are arranged in the housing, each having a contact end (8) for contacting a contact piece, the housing (6) having a guide section (11) movably mounted in the guide opening (4) and a contact section (9) spaced apart from the guide section, and the contact end (8) being assigned to the contact section (9), wherein a spring element (810) is preloaded between the contact section (9) and the carrier part (2) and the spring element (810) adjoins the guide section (11) on the housing (6), an axial stop (12) is formed on the side of the carrier part (2) facing away from the spring element (10), which axial stop interacts with the carrier part (2) against the spring force of the spring element (10), wherein the maximum rotation and / or inclination angle of the test probe (5) relative to the carrier part (2) is defined by a guide opening (4) and a guide section (11), for which purpose the guide opening (4) and the guide section (11) each have a cross-section with at least one straight line, in particular a polygonal cross-section, and wherein the guide section (11) and the guide opening (4) are designed such that the test pin (5) can be pivoted in at least one sliding position relative to the carrier part (2). According to the invention, a transition section (17) is formed between the guide section (11) and the axial stop (12), said transition section (17) having a circular cross-section, the diameter of which on the one hand is at most as large as the minimum diagonal of the cross-section of the guide opening (4) and on the other hand is at most as large as the minimum diagonal of the cross-section of the axial stop (12). And on the other hand is smaller than the maximum diagonal of the cross section of the guide section (11) and larger than the minimum diagonal of the cross section of the guide section (11), so that the transition section (17) only partially radially protrudes beyond the guide section (11) when viewed from the periphery thereof.

Description

Technical Field

[0001] The invention relates to a test probe device for making electrical contact with, in particular, a multi-pole contact piece, the test probe device comprising a carrier component, the carrier component having at least one guide opening, and the test probe device comprising at least one test probe, the test probe being mounted in the guide opening so as to be longitudinally movably, wherein the test probe has a cylindrical housing, in which one or more, in particular pin-shaped contact elements are arranged adjacent to one another, the contact elements each having a contact end for contacting the contact piece, wherein the housing has a guide section mounted in the guide opening so as to be longitudinally movably and a contact section spaced apart from the guide section, and wherein the contact end is assigned to the contact section, wherein a preload is provided between the contact section and the carrier component. A spring element, and the spring element is adjacent to the guide section on the housing, and an axial stop is formed on the side of the support part facing away from the spring element, and the axial stop interacts with the support part against the spring force of the spring element, wherein the maximum rotation and / or tilting angle of the test probe about its longitudinal axis relative to the support part is defined by the guide opening and the guide section, for this purpose, the guide opening and the guide section each have at least one straight cross section, in particular a polygonal cross section, and wherein the guide section and the guide opening are designed so that the test probe can be swung relative to the support part in at least one sliding position, that is, its longitudinal axis can be pivoted relative to the longitudinal axis of the support part or the guide opening. Background Art

[0002] The test probe device of the mentioned type is known in the prior art. For example, a universal test probe device is described in the published patent application DE20 2019 106 239 U1. By adapting the outer cross-section of the shell of the test probe to the inner cross-section of the load-bearing component (referred to as the outer shell here), it is achieved to limit the maximum tilt or torsion angle of the built-in test probe relative to the load-bearing component. Here, the limitation changes according to the sliding position of the test probe relative to the support component in its longitudinal direction. If the test probe device is used to contact the contact piece, the test probe device is pressed onto the contact piece with the contact end of the test probe. As a result, the spring element is elastically deformed and the test probe is displaced relative to the load-bearing component. During the compression of the test probe in the load-bearing component, the test probe moves toward the load-bearing component so that the area of ​​the guide section of the test probe is now located in the guide opening, which has a different outer cross-section compared to the starting position, which allows a larger maximum tilt or torsion angle. This means that the test probe can be twisted farther in the compressed state than in the extended state. A similar test probe device is known from the public document EP 2 666 022 B1. Summary of the invention

[0003] The invention is based on the object of creating an improved test probe device which, in particular when carrying out the contacting of the contact pieces, has low spring sensitivity, ensures low wear and is designed to save installation space.

[0004] The object on which the invention is based is achieved by a test probe device having the features of claim 1. The test probe device has the advantage that the twistability of the rotating pin relative to the carrier part, regardless of the sliding position of the test probe, always remains the same or the same limit. Therefore, the maximum permissible rotation angle of the test probe relative to the carrier part is constant over the entire longitudinal range or the entire movement path of the test probe in the carrier part. This prevents the test probe from being twisted too far unnecessarily when contacting the contact piece, whereby when the test probe returns to the starting position, this twisting must be moved back accordingly far by the spring element, resulting in corresponding consequences for the wear of the test probe device. For example, if the test probe cannot be automatically moved back to the area with a more limited rotation angle due to static friction, it may get stuck and will prevent further use of the test probe device. The constant maximum rotation angle of the invention reliably prevents problems when the test probe transitions from the area with an increased maximum rotation angle to the area with a reduced maximum rotation angle. This means that the test probe device is less prone to errors and also less wear. On the contrary, in the test probe device of the invention, the swing play of the test probe relative to the carrier part is advantageously reduced in the starting position, i.e. in the extended state of the test probe. The swinging of the test probe relative to the carrier is understood to mean the pivoting or tilting of the test probe or the central longitudinal axis of the test probe relative to the longitudinal axis of the guide opening or the carrier. By the swinging movement of the test probe, the lateral displacement between the contact and the carrier when contacting the contact can be compensated, so that the inaccuracy of the positioning of the test probe device relative to the contact can be safely compensated. This is an advantage for both test probes with only one contact element and test probes with multiple contact elements. In the extended state, the axial stop can offset the force of the spring element and prevent the test probe from being moved out of the carrier by the spring element. Therefore, it defines the maximum rebound stroke of the test probe relative to the carrier. The embodiment of the test probe device according to the present invention ensures that the swing play is advantageously reduced in the starting position (i.e., in the extended state of the test probe), so that the test probe easily reaches the predetermined starting position relative to the swinging movement. In the process, the twistability of the test probe is advantageously not affected, so that the test probe is twisted at the first moment of contact with the contact, even before the swinging movement is allowed to occur. This ensures that the test probe and the contact can always be safely combined together. According to the invention, this is achieved by forming a transition section between the guide section of the test probe and the axial stop. The transition section leads from the guide section to the axial stop. According to the invention, the transition section has a circular cross section, the diameter of which is at most as large as the smallest inner width or diagonal of the cross section of the guide opening and is smaller than the largest diagonal of the cross section of the guide section, so that the transition section only partially protrudes radially beyond the guide section when viewed from its periphery. This means that the circular transition section is partially larger than the guide section when viewed from the outside.Since there is at least one straight line in the cross section of the guide section, which forms a secant with the circle, the cross-sectional width in the straight area is smaller than the width in the adjacent area, so that the cross section is reduced by the secant or straight line. Because the cross section of the guide section must be smaller than the cross section of the guide opening, and the transition area has a diameter that is at most as large as the minimum inner width or diagonal of the cross section of the guide opening and larger than the minimum width of the cross section of the guide section, the circular transition section is located between the straight line of the cross section of the guide section and the inner periphery of the cross section of the guide opening when viewed radially. Thus, the transition section acts as a swing centering device, but the rotatability or torsion of the test probe relative to the load-bearing component is not impaired here. Because the swing centering device is assigned to the axial stop, the axial stop and the swing centering are close to each other and are located on the side of the load-bearing component that faces away from the spring element. Therefore, there is no need for a centering device located on the side of the guide opening facing the spring element in the guide opening. This means that the guide opening itself can be easily manufactured, thereby saving cost and effort. In addition, the maximum necessary length of the guide opening is therefore significantly shortened, thereby overall (observed in the axial or longitudinal movement direction) can be manufactured in a particularly space-saving manner according to the present invention.

[0005] According to a preferred improvement of the present invention, the transition section has an insertion bevel in at least one area protruding beyond the guide section. The insertion bevel avoids an abrupt transition from the guide section to the swing limiter. More precisely, this ensures that the transition section penetrates into the guide opening gently and with low wear and realizes the centering of the test probe. Depending on the length of the axial range of the transition section, the insertion bevel can be longer or shorter. Preferably, the transition section is significantly shorter than the guide section, wherein the insertion bevel preferably has about half the length of the transition section. Due to the circular shape of the transition section, the insertion bevel forms a circular segment surface of the outer diameter or diameter leading from the guide section to the transition section. The insertion bevel is advantageously formed in an area protruding radially beyond the guide section, and is therefore particularly and preferably guided from a straight line (seen in the cross section of the guide section) to the transition section. Preferably, each straight line of the guide section is assigned a corresponding insertion bevel, which also causes the transition section to protrude beyond its straight line. A corresponding straight line in a cross section of the guide section, viewed in its longitudinal extent, forms a guide surface which in particular cooperates with a guide counter-surface of the guide opening in order to serve as a torsion limit.

[0006] Preferably, the insertion ramp extends rising from the guide section into the transition section, ie with increasing distance from the longitudinal centre axis of the test probe, and thus rises from the guide surface to a larger transition section or a guide section protruding beyond the guide surface.

[0007] The guide section preferably has a square cross section. The cross section of the guide section is therefore characterized by four or at least four straight lines and thus by four guide faces of equal length and width. The square cross section ensures that the test probe can be inserted into the carrier component or the guide opening of the carrier component in a plurality of rotational positions, each with a respective 90 degree twist. On the one hand, this facilitates installation and on the other hand it ensures that the anti-twist device or the maximum rotation angle is always the same regardless of the installation position of the test probe.

[0008] Alternatively or additionally, the guide opening preferably has a square cross section. This ensures a safe interaction with the test probe at all times. In particular, the guide section and the guide opening are both square in cross section, thereby ensuring a simple assembly and use of the test probe device. Due to the square cross section, the guide section and the guide opening each have four guide surfaces, which interact as torsion limits. At the same time, the guide surfaces act as bearing surfaces for the longitudinal displacement of the test probe relative to the carrier component.

[0009] According to a preferred refinement of the invention, the guide section has chamfered corners when viewed in cross section. This means that the guide surfaces do not intersect directly at a 90 degree angle, but are connected to each other via chamfered corners. The chamfered corners further reduce the wear of the test probe device and improve the twistability of the test probe at least within the maximum permissible rotation angle. Preferably, the straight line forming the chamfered corner in the cross section is shorter than the straight line defining the corresponding guide section.

[0010] According to a preferred improvement of the invention, the guide opening has rounded corners when viewed in cross section. The rounded corners provide a free space for the test probe or the housing of the test probe in the guide opening, in which a collision of the guide section with the load-bearing component is prevented. In particular, the chamfered corners of the guide section can be positioned in this area in an advantageous manner and moved in the longitudinal extension direction and the rotational direction. This reduces the possibility of wear and malfunctions. The square design of the cross section of the guide section, in particular with rounded corners, enables the test probe to achieve a maximum internal space with minimum external dimensions.

[0011] Preferably, the maximum rotation angle or tilt angle by which the test probe can be twisted relative to the carrier component about its longitudinal axis, in particular the central longitudinal axis or the eccentric longitudinal axis, is limited independently of the longitudinal displacement of the test probe in the carrier component. Thus, regardless of the sliding position of the test probe in the carrier component, the test probe can always be tilted or twisted relative to the carrier component by the same maximum tilt or rotation angle.

[0012] According to a preferred development of the invention, the guide opening is provided with a step with a gradually tapering cross section at its end remote from the axial stop, wherein the total length of the guide section and the transition section is greater than the distance of the step to the free end of the guide opening facing the axial stop. This ensures that only the axial stop is responsible for the unambiguous positioning of the test probe when the test probe is in the extended state, which axial stop adjoins the transition section. In particular, a further axial stop in the guide opening can be omitted and is preferably omitted. This enables a compact and cost-effective design of the test probe device.

[0013] According to a preferred development of the invention, the housing has a transverse hole in the region of the axial stop, which has a thread for a retaining screw, by means of which the connecting cable can be fastened in the housing. The connecting cable is used in particular for electrically contacting one or more contact elements. The connecting cable can be locked in the housing by means of the retaining screw, thereby ensuring strain relief of the connecting cable, which prevents tensile forces acting on the connecting cable from affecting the contact point between the connecting cable and the contact element. This optimizes the operational reliability of the test probe device.

[0014] According to another advantageous development of the invention, the contact section of the housing has at its free end at least one insertion bevel for centering the contact element. The insertion bevel ensures that the test probe is automatically aligned with the contact element when contacting the contact element. In particular, the insertion bevel causes a swiveling movement of the test probe relative to the carrier part. This ensures safe and simple contacting of the contact element.

[0015] Furthermore, it is preferably provided that the contact end of the respective contact element is completely located within the housing, in particular is set back to the free end face of the contact section. This ensures, in particular, that the test probe is centered relative to the contact piece before the contact element reaches the contact piece itself. This ensures that the contact element and the contact piece are securely connected together, so that secure contact is always ensured, even during extensive test processes.

[0016] According to a preferred improvement of the present invention, the carrier has one or more fastening openings spaced apart from the guide opening. For example, a fastening screw can be inserted into the fastening opening, and the carrier can be fastened to the carrier by the fastening screw, and the carrier can optionally carry a plurality of such carriers.

[0017] The carrier part preferably has a plurality of guide openings in each of which a test probe is mounted or can be mounted. This allows a plurality of test probes to be mounted on one carrier part, wherein the guide openings and the test probes are specifically designed as described above. As a result, each test probe can be twisted relative to the carrier part within a maximum permissible rotation angle and within a permissible swinging motion range without being influenced by other test probes in the same test probe device. This means that a plurality of contacts can be reliably contacted simultaneously using the test probe device.

[0018] Furthermore, it is preferably provided that the width of the carrier part is less than or equal to the width of the contact section. As a result, the carrier part does not protrude laterally beyond the contact section or the test probe. This ensures that the overall width of the test probe arrangement is only as wide as the width of the test probe in the region of the contact section. This means that a large number of such test probe arrangements can be arranged adjacent to one another on the main carrier part and the installation space can be optimally utilized.

[0019] According to a preferred development of the invention, the housing has a jacket section between the guide section and the contact section, which surrounds one or more contact elements and is radially guided in the carrier part. Therefore, the jacket section of the housing, in particular, which extends in the extension of the guide section, is also radially guided in the carrier part, whereby the swiveling movement of the test probe can be better adjusted. The greater the distance between the guided jacket section and the transition section or the axial stop, the easier it is to adjust the swiveling movement.

[0020] For guiding the jacket segment, there is preferably a support ring which is at least partially elastically and / or plastically deformable and at least partially maintains radial clamping between the jacket segment and the load-bearing component. Therefore, the support ring is arranged as an intermediate bearing between the load-bearing component and the jacket segment and is designed to be advantageous in terms of material technology, for example, in order to ensure a low friction coefficient. The elastic and / or plastic deformability of the support ring ensures preferably play-free guidance of the jacket segment and thus the test probe or the housing in the load-bearing component at least in the area where the support ring acts. The swing play and / or rotational play of the test probe remain unaffected in the area of ​​the guide section. The elastic deformability ensures that the support ring prevents jamming and thus prevents the housing from locking in the sliding position. The section of the guide opening in which the support ring is arranged is preferably designed to have a circular cross section, like the jacket segment, so that the rotational movement of the test probe relative to the load-bearing component is not weakened in the area of ​​this bearing point. Here, the support ring is designed so that it allows the jacket segment or the test probe to move axially relative to the load-bearing component and acts or is designed as a sliding ring to this extent.

[0021] Particularly preferably, the support ring has an insertion chamfer for the load-bearing part, which on the one hand facilitates assembly and on the other hand achieves the above-mentioned advantageous clearance compensation by elastic deformation of the support ring itself during assembly. Preferably, the support ring is conical, so that its outer diameter gradually decreases in the direction of insertion into the load-bearing part. Particularly preferably, the support ring has a support ring stop, which limits the maximum penetration depth of the support ring into the load-bearing part. The support ring stop is designed as an axial stop, which in particular interacts directly with the load-bearing part and has an outer diameter that is larger than the cross section of the opening or guide opening of the load-bearing part, so that the support ring is inserted into the load-bearing part for assembly.

[0022] The support ring preferably has a support ring stop which projects radially outwards and is held between the spring element on the one hand and the support part on the other hand. Thus, one end of the spring element is not supported directly on the support part, but axially on the support ring, which in turn is supported on the support part. As a result, the support ring is always subjected to a preload from the spring element acting in the direction of the support part, which presses the support ring into a guide opening of the support part that receives the support ring. Due to the good elastic deformation capacity of the support ring, it cooperates optimally with the jacket section and the support part, and the preload ensures that the sliding contact or bearing contact with the jacket section and the support part never loosens, thereby ensuring long-term safe operation. The deformability of the support ring is preferably designed in this case so that an elastic and / or plastic deformation can be triggered and maintained when the spring element applies the preload. A reduction in the radial clamping force of the support ring due to deformation or wear is then compensated by the spring element constantly pushing it into the support part. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] The present invention is explained in more detail below using the accompanying drawings.

[0024] Figure 1 shows a perspective view of an advantageous test probe arrangement,

[0025] Figure 2 shows a perspective longitudinal section view of a test probe device,

[0026] Figure 3 showing a perspective view of a portion of a housing of a test probe device,

[0027] Figure 4 A perspective longitudinal section showing components of a test probe device and a carrier component,

[0028] Figure 5 shows another perspective longitudinal section view of a test probe device,

[0029] Figure 6 shows a cross-sectional view of a test probe arrangement,

[0030] Fig. 7A and Figure 7B shows different mounting options for the test probe assembly,

[0031] Figure 8 A perspective view showing an advantageous modification of the test probe device,

[0032] Fig. 9 An enlarged longitudinal cross-sectional view of a test probe assembly is shown. DETAILED DESCRIPTION

[0033] Figure 1 A perspective view of a test probe device 1 is shown, which is designed to electrically contact a contact. The contact is, for example, a circuit board or another type of electrical / electronic test object whose function is to be tested. With the aid of the test probe device 1, the contact can be electrically contacted by touch contact, so that, for example, a current can be passed through the contact or a voltage can be electrically applied to the test object in order to test its function.

[0034] In order to be able to carry out a safe contacting process, in which in particular position tolerances of the contact element to the test probe device 1 can be compensated, the test probe device 1 described here is designed such that it can be partially rotated and pivoted. Figure 2 In this regard, a perspective longitudinal section through the test probe device 1 is shown.

[0035] The test probe device 1 has a carrier part 2, which has two fastening openings 3, through which the carrier part 2 can be fastened, in particular screwed, on a main carrier, for example. The carrier part 2 has a guide opening 4 between the fastening openings 3. A test probe 5 is mounted in the guide opening 4 so that it can be longitudinally moved. The test probe 5 has a multi-part housing 6, in which, according to the present exemplary embodiment, two pin-shaped contact elements 7 are arranged. In particular, the contact elements 7 are designed as spring contact pins. According to the present initial example, the contact elements 7 have a contact end 8, which is designed as a female contact plug for receiving a male contact plug. The contact end 8 is located in a contact section 9 of the test probe 5 or the housing 6. The contact end 9 is arranged away from the carrier part 2. Between the contact end 9 and the carrier part 2, a spring element 10, in this case a helical spring, is kept preloaded, which pushes the contact section 9 away from the carrier part 2. According to the present initial example, the helical spring is arranged coaxially with the housing 6 between the contact section 9 and the carrier part 2.

[0036] The housing 6 of the test probe 5 also has a guide section 11, which serves to mount and guide the test probe 5 in the guide opening 4 of the carrier part 2. The guide section 11 will be discussed in more detail with reference to the following figures. The guide section 11 is adjoined by an axial stop 12, the outer cross section of which is larger than the cross section of the guide opening 4, so that the housing 6 with the axial stop 12 can be pushed onto the carrier part 2 on the side facing away from the spring element 10 until the axial stop 12 collides with the carrier part 2. As a result, the axial stop 6 prevents a further movement of the test probe 5 by the spring element 10. As a result, the test probe 5 is held on the carrier part 2 between the spring element 10 and the axial stop 12. The multi-part design of the housing 6 here ensures a simple assembly of the test probe 5 on both sides of the carrier part 2, wherein at least the housing part with the guide section 11 has to be inserted into the carrier part 2 from the side facing away from the spring element.

[0037] The helical spring thus pushes the test probe into the starting position according to arrow A, in which the axial stop 12 rests against the carrier part 2. If a contact process is carried out, the test probe 5 is pressed against the contact piece with the contact end 9, whereby the test probe 5 can be compressed into the carrier part 2 against the spring force. The compression direction is determined by Figure 1 and Figure 2 The arrow B in FIG. 4 indicates that during the compression, the guide section 11 of the housing 6 is at least partially pushed out of the guide opening 4 .

[0038] Figure 3 A housing part of a housing 6 with a guide section 11 is shown in a perspective view. The guide section 11 is designed with a constant cross section, as seen in the longitudinal extension of the housing 6. The cross section is square here with four straight lines arranged at right angles to one another, so that there are four guide surfaces 13, wherein adjacent guide surfaces 13 are oriented perpendicularly to one another. The guide sections have a height H of the same size. 11 and width B 11 (H 11 =B 11 ). The guide surfaces 13 do not terminate directly with one another in the cross section; instead, the square cross section has chamfered corners or beveled corners 14 between adjacent guide surfaces. Optionally, the chamfered corners 14 are designed as rounded corners.

[0039] The axial stop 12 has a cross-section which corresponds substantially to the cross-sectional shape of the guide section 11 , but is generally larger, in particular, in the present case, its width B 12 Greater than its height H 12 (B 12 >H 12 ). In addition, its width B 12 Greater than the width B of the guide section 11 12 and height H11 (B 12 >B 12 , H 11 ). Optionally, the axial stop 12 also has a square cross section with chamfered corners. From a longitudinal extent, the axial stop 12 according to the present exemplary embodiment is shorter than the guide section 11 (L 11 >L 12 ). Alternatively, the axial stop is designed to be the same length as or longer than the guide section 11. In this case, the guide section 11 and the axial stop 12 are aligned with each other in such a way that the guide surface 13 is aligned parallel to the corresponding flat surface of the axial stop 12. In principle, the axial stop 12 can have any cross-section, as long as the cross-section of the axial stop 12 is larger than the cross-section of the guide opening 4, thereby ensuring that the axial stop 12 can apply a force to the carrier part 2 at least partially in the longitudinal displacement direction. Basically, the axial stop 12 is designed to have a cross-section that is larger than the guide section 11 and also larger than the guide opening 4, so that the axial stop 12 can axially abut or abut on the end face of the carrier part 2, or abut in the extended state of the test probe 5. The height H of the axial stop 12 12 and width B 12 The larger the stop surface 19, the larger the axial stop surface interacting with the carrier part 2. With the enlargement of the stop surface 19, the swing centering of the test probe 5 is improved when the test probe 5 is forced into an extended state by the spring element 10, in which the axial stop 12 abuts against the carrier part 2. The stop surface 19 of the axial stop 12 is advantageously designed perpendicular to the longitudinal extension of the test probe 5 in order to ensure a plane-parallel alignment in the stopped state, in which the test probe 5 or its longitudinal axis, in particular the central longitudinal axis M or an eccentric longitudinal axis parallel to the central longitudinal axis, extends parallel to the longitudinal axis of the carrier part 2. If the stop surface 19 is not in a position parallel to the end face of the carrier part 2, the axial stop 12 generates a tilting moment, which always forces the test probe 5 to be axially parallel oriented when the test probe 5 reaches the stop.

[0040] Figure 4 A perspective longitudinal section is shown with an offset relative to the central longitudinal axis M of the test probe 5, so that the cutting plane does not extend through the central longitudinal axis M, but is radially offset therefrom. The guide opening 4 has a cross section which is at least substantially complementary to the cross section of the guide section 11. The guide opening 4 also has a square cross section. According to the present exemplary embodiment and in contrast to the cross section of the guide section 11, the corners are not chamfered, but rounded. The width and height of the square cross section are here only slightly greater than the width and height of the guide section 11, for example Figure 6As shown, the guide section 11 can be mounted in the guide opening 4 in a movably manner with low wear. Since each guide surface 13 is assigned a guide counter-surface 15 of a square cross-section passing through the guide opening 4, the test probe 5 is advantageously movable in the guide opening 4 in the longitudinal direction or axial direction. The difference in size ensures, on the one hand, that the housing 6 is firmly guided in the guide opening 4, and on the other hand, that it can be twisted or tilted at a limited rotation angle relative to the carrier part 2 around the central longitudinal axis M. This particularly involves tilting around an eccentric longitudinal axis of the test probe, which is parallel to the central longitudinal axis. The smaller the size difference, the smaller the maximum rotation angle. Regardless of its size, the maximum rotation angle is constant and has nothing to do with the sliding position of the housing 6 in the carrier part 2.

[0041] At its end facing the spring element 11, the guide opening 4 has a taper in the form of a step 16, the inner diameter or inner cross section of which is smaller than the outer diameter or cross section of the housing 6 at the end of the guide section 11, so that the guide section 11 can be pushed through the carrier part 2 in the direction of the arrow A without exceeding the step 16. However, before the free end of the guide section 11 reaches the step 16, the axial stop 6 abuts the carrier part 2. For this purpose, the longitudinal extent (L of the housing part from the free end of the guide section 11 to the axial stop 6 is 11 +L 17 ) is designed to be smaller than the depth or length of the guide opening 4 up to the step 16.

[0042] from Figure 3 It can also be clearly seen in FIG. 1 that the housing 6 has a transition section 17 in the transition from the guide section 12 to the axial stop 6. The axial extent L of the axial stop 12 12 and the axial extent L of the guide section 11 11 or length, the length L of the transition section 17 17 Significantly shorter (L 17 <<L 11 ,L 12 ). In the transition section 17, the housing 6 has a circular cross section. The diameter of the circle is selected here to be as large as the smallest inner width or diagonal in the cross section of the guide opening 4, so that the transition section 17 can be completely inserted into the guide opening 4. Due to the circular shape, the torsion of the housing 6 in the guide opening 4 does not change even if the transition section 17 is inserted into the guide opening 4, so that the circular shape does not hinder the torsion of the housing 6 in the guide opening 4. However, the transition section 17 inserted into the guide opening 4 means that the test probe 5 can no longer or to a lesser extent pivot relative to the carrier part 2 in its longitudinal range. Therefore, the transition section 17 only limits the swinging movement of the test probe 5. In this respect, the transition section 17 can also be called a swing centering device.

[0043] Preferably, as shown, the diameter of the transition section 17 is greater than the height or width of the square cross section of the guide section 11, so that the transition section 17 partially protrudes radially beyond the guide surface 13. Otherwise, the diameter of the transition section 17 is selected to be smaller than the maximum diagonal of the cross section of the guide section 11, so that in other areas (seen in the circumferential direction) the guide section 11 protrudes beyond the transition section 17. In particular, in the area of ​​the chamfered corners 14, the guide section 11 protrudes in the radial direction beyond the transition section 17. According to an alternative exemplary embodiment not shown here, the guide section 11 continues as far as the axial stop 6 in the area where the diameter of the transition section 17 is smaller than the cross section of the guide section 11, so that only in the area of ​​the guide surface 13 is the circular shape or the circular shape of the transition section 17 partially recognizable and effective.

[0044] In order to facilitate the insertion of the transition section 17 into the guide opening 4, the transition section has an insertion bevel 18 in the region of each guide surface 13, which is guided from the corresponding guide section 13 along the outer diameter or the diameter of the transition section 17. Therefore, the insertion bevel 18 rises radially in the direction of the axial stop 12. This makes the corresponding insertion bevel 18 have a circular arc surface. When the transition section 17 is inserted into the guide opening 4, the insertion bevel 18 causes the test probe 5 to be swung and centered relative to the carrier part 2, through which the sway of the test probe 5 is reduced and the test probe is thus centered with respect to its swaying movement. Preferably, the length of the transition section is such that the test probe 5 is reliably aligned and centered during the rebound, and enables the test probe to perform a swaying movement quickly or after a short spring travel after the initial contact with the contact during compression. For example, the transition section 17 has an axial range or length of 0.05 mm to 0.5 mm. Furthermore, the starting position of the test probe 5 in the fully extended state is supported by the axial stop 12 which has a stop surface 19 which is aligned perpendicularly to the longitudinal extent of the pin 5 and rests flat against the carrier part 2 in the extended state, as already explained above.

[0045] The advantageous design of the test probe device 1 means that the test probe 5 can be twisted about its central longitudinal axis M in the bearing component 2 up to a maximum twisting angle and can also be pivoted or swung with its longitudinal axis relative to the longitudinal axis of the carrier component 2. The swung movement is captured in the extended starting position by means of the insertion bevel 18 and the transition section 17, while the rotational limitation remains constant over the entire longitudinal displacement of the test probe 5.

[0046] Figure 5A perspective view of a housing part of a housing 6 in a carrier part 2 in an extended state is shown, which has a guide section 11. It can be seen here that the axial stop 6 protrudes beyond the guide opening 4 and thus strikes the carrier part 2 with the axial stop surface 19, which prevents further rebound. Figure 5 It is also shown that the transition section 17 is located in the guide opening 4 .

[0047] Figure 6 It is also shown in a perspective sectional view, in which the cutting plane is located in the region of the transition section 17, that due to the circular shape, the diameter of which corresponds at most to the smallest diagonal of the square cross section of the guide opening 4, the rotatability of the test probe 5 in the guide opening 4 is not impaired. The maximum rotation angle is therefore limited only by the guide surface 18 or the guide section 11 and the cross section of the guide opening 4.

[0048] Optionally, the test probe device 1 has a transverse hole 20 in the housing in the region of the axial stop 12, which is radially aligned. In particular, the transverse hole 20 has a thread 21, a retaining screw 22 (eg a grub screw, such as Figure 5 A connecting cable (as shown in the example in FIG. 1 ) which is inserted into the housing 6 at its end facing away from the contact section 9 in order to make electrical contact with the contact element 8 can be screwed or screwed into this thread 21 in order to clamp a connecting cable in order to ensure strain relief at the contact point.

[0049] The advantageous design of the guide section and the guide opening both with a square cross section allows the test probe 5 to be inserted into the carrier part 2 in different rotational positions, each rotational position being offset by 90 degrees. Fig. 7A and Figure 7B Different mounting positions of the test probe 5 on the carrier part 2 are shown, which are rotated 90 degrees relative to each other. This ensures that the test probe device 1 can be easily adapted to different contact parts or boundary conditions. Preferably, the contact section 9 plays a decisive role in determining the dimensions of the carrier part 2. Preferably, as Fig. 7A and Figure 7B As shown, the width of the carrier component 2 is not wider than the width of the contact end 9.

[0050] Figure 8 A further exemplary embodiment of a test probe device 1 is shown, which differs from the aforementioned exemplary embodiment in that a plurality of guide openings 4 are formed in the carrier part 2, wherein a test probe 5 is inserted into each guide opening 4. The design of the test probe 5 and the guide opening 4 is as described above. Thus, a large number of test probes 5 can be used in the carrier part 2.

[0051] Advantageously, the test probe 5 or the corresponding contact section 9 of the housing 6 also has an insertion bevel 23, in particular on its outer side, in order to center the test probe 5 relative to the contact piece during the contact process. The insertion bevel 23 in particular produces a wide or long and gentle insertion area on the contact piece, as well as a nearly play-free centering on the inner area or inner side of the contact piece. At the same time, the outer and inner geometries of the contact section 9 allow the test probe 5 to tilt (swing) without the components getting stuck to each other. For this purpose, it is provided that the insertion bevel 23 ends at a raised portion 24, the cross section of which is larger than the outer shell area of ​​the housing 6 opposite the free end of the contact section 9. The raised portion 24 ensures a narrow or linear contact area between the contact section 9 and the interior of the contact piece, so that even if the test probe 5 swings, it is reliably prevented from getting stuck or jammed in the contact piece. The insertion bevel 23 is preferably coordinated with the spring force of the spring element 10, so that the compression and swinging of the test probe 5 only begin after the contact piece has been firmly contacted, without causing any damage to the contact piece.

[0052] Fig. 9 An enlarged longitudinal section through the test probe device 1 in the region of the carrier part 2 on the side remote from the axial stop 12 is shown. As a continuation of the guide section 11, the housing 6 has a jacket section 25, which is guided radially without play in the carrier part 2. For this purpose, a support ring 26 is arranged in the region of the tapering cross-sectional section of the guide opening 4 which forms the step 16 between the carrier part 2 and the jacket section 25. However, the support ring 26 can also be used in a guide opening with a constant cross section. The tapering cross section of the step 16 is preferably circular, so that a possible rotation of the test probe 5 in the guide opening 4 is not impaired. The support ring 26 is designed to be elastically deformable and is held radially clamped between the carrier part 2 and the jacket wall 25 or the housing 6 so that it is elastically deformable. For this purpose, for example, the outer diameter of the support ring 26 is at least partially slightly larger than the inner diameter of the guide opening 4 of the carrier part 2 in the region of the step 16 and / or its inner diameter is slightly smaller than the jacket section 25 of the housing 6, so that in the assembled position, as Fig. 9 As shown, the support ring 26 is elastically deformed radially to maintain prestress or pretension. Here, the support ring 26 is designed as a sliding ring so that the housing 6 with the jacket section 25 can be axially displaced or slidably installed in the support ring to enable the test probe 5 to compress and rebound.

[0053] The support ring 26 preferably has a radially protruding support ring stop 27, which limits the maximum axial penetration depth of the support ring 26 into the carrier part 2 and is located between the carrier part 2 and the spring element 10, so that the spring element is axially supported on the support ring stop 27. The support ring stop 27 is preferably formed in one piece with the support ring 26. Particularly preferably, the support ring 26 has an insertion bevel 28, which forms an outer diameter of the support ring 26 that decreases in the insertion direction. In particular, the support ring 26 is designed to be conical at least on the outer wall of the sleeve. Here, the conical shape of the support ring 26 or of the insertion bevel 28 extends in the undeformed state of the support ring 26, i.e., for example before assembly, preferably from the free end to be inserted into the carrier part 2 to the support ring stop 27, as shown in FIG. Fig. 9 By means of the spring element 10 or the preload provided by the spring element 10, the support ring 26 is pressed axially into the guide opening 4 or the tapering section of the guide opening 4, so that the support ring 26 is elastically deformed or pressed as the insertion depth increases. Optionally, the support ring 26 can also be plastically deformed here.

[0054] The deformation of the support ring 26 ensures that the test probe 5 is guided with the jacket section 25 in the region of the step 16 without play in the carrier part 2. As a result, the test probe 5 is provided with a pivot bearing or a bearing point in the region of the step 16, by which a pivot axis of the test probe 5 is defined, wherein the pivot axis is oriented transversely to the longitudinal extent of the test probe 5 or to the longitudinal axis of the guide opening 4. Due to the improved longitudinal guidance relative to the carrier part 2, the pivoting movement of the test probe 5 is optimized by the support ring 26 together with the transition section 17 and the axial stop 12. As the distance from the support ring 26 to the open end of the guide opening 4 facing the axial stop 12 increases, the guidance of the test probe 5 becomes more precise and the permissible pivoting angle becomes smaller. Depending on the application, the preferred ratio of the distance, cross-sectional shape and size of the axial stop 12 and the guide section 11 and the guide opening 4 is therefore selected so that the test probe 5 can perform a smaller or larger pivoting movement relative to the carrier part 2.

[0055] The spring force applied to the support ring 26 and its insertion bevel 28 also ensures that the support ring automatically moves further into the carrier part 4 when signs of wear appear, in order to maintain a support without play.

Claims

1. A test probe device (1) for achieving electrical contact of a contact piece, in particular a multi-pole contact piece, the test probe device having a carrier part (2), the carrier part having at least one guide opening (4), and the test probe device having at least one test probe (5), the test probe being mounted in the guide opening (4) so ​​as to be longitudinally movable, wherein the test probe (5) has a cylindrical housing (6), in which one or more, in particular pin-shaped contact elements (7) are arranged, the contact elements each having a contact end (8) for contacting the contact piece, wherein the housing (6) has a guide section (11) mounted in the guide opening (4) so ​​as to be longitudinally movable and a contact section (9) spaced apart from the guide section (11), and wherein the contact end (8) is assigned to the contact section (9), wherein a preload is provided between the contact section (9) and the carrier part (2). A spring element (10), and the spring element (10) is adjacent to the guide section (11) on the housing (6), and an axial stop (12) is formed on the side of the support part (2) facing away from the spring element (10), and the axial stop (12) interacts with the support part (2) against the spring force of the spring element (10), wherein the maximum rotation and / or tilting angle of the test probe (5) about its longitudinal axis relative to the support part (2) is limited by the guide opening (4) and the guide section (11), for this purpose, the guide opening (4) and the guide section (11) each have a cross section with at least one straight line, in particular a polygonal cross section, and wherein the guide section (11) and the guide opening (4) are designed so that the test probe (5) can be swung relative to the support part (2) in at least one sliding position, characterized in that A transition section (17) is formed between the guide section (11) and the axial stop (12), the transition section (17) having a circular cross section, the diameter of which is, on the one hand, at most as large as the minimum diagonal of the cross section of the guide opening (4), and, on the other hand, is smaller than the maximum diagonal of the cross section of the guide section (11) and larger than the minimum diagonal of the cross section of the guide section (11), so that the transition section (17) only partially protrudes radially beyond the guide section (11) when viewed from its periphery.

2. The test probe device according to claim 1, characterized in that: The transition section (17) has an insertion bevel (18) in at least one region protruding beyond the guide section (11).

3. A test probe device according to any one of the preceding claims, characterised in that The insertion bevel (18) extends upward from the guide section (11) into the transition section (17).

4. A test probe device according to any one of the preceding claims, characterized in that The guide section (11) has a square cross section.

5. A test probe device according to any one of the preceding claims, characterised in that The guide opening (4) has a square cross section.

6. A test probe device according to any one of the preceding claims, characterised in that The guide section (11) has corners (14) which are chamfered in cross section.

7. A test probe device according to any one of the preceding claims, characterised in that The guide opening (4) has rounded corners in cross section.

8. A test probe device according to any one of the preceding claims, characterised in that The limitation of the maximum rotation angle is independent of the longitudinal displacement of the test probe (5) in the carrier component (2).

9. A test probe device according to any one of the preceding claims, characterised in that The guide opening (4) is provided with a step (16) with a gradually tapering cross section at its end away from the axial stop (12), and the total length of the guide section (11) and the transition section (17) is smaller than the distance from the step (16) to the free end of the guide opening (4) facing the axial stop (12).

10. A test probe device according to any one of the preceding claims, characterised in that The housing (6) has a transverse hole (20) in the region of the axial stop (12), the transverse hole (20) having a thread (21) for a retaining screw (22), by means of which a connecting cable can be fastened in the housing (6).

11. A test probe device according to any one of the preceding claims, characterised in that The contact section (9) of the housing (6) has at its free end at least one insertion bevel (23) for centering on the contact piece.

12. A test probe device according to any one of the preceding claims, characterised in that The contact end (8) of the corresponding contact element (7) is completely located in the housing (6), in particular, is recessed to the free end face of the contact section (9).

13. A test probe device according to any one of the preceding claims, characterised in that The carrier component (2) has one or more fastening openings (3) spaced apart from the guide opening (4).

14. A test probe device according to any one of the preceding claims, characterised in that The carrier component (2) has a plurality of guide openings (4), in which test probes (5) are respectively installed or can be installed.

15. A test probe device according to any one of the preceding claims, characterised in that The width of the bearing component (2) is less than or equal to the width of the contact section (9).

16. A test probe device according to any one of the preceding claims, characterised in that The housing (6) has a jacket section (25) between a guide section (11) and the contact section (9) which surrounds the one or more contact elements (7) and is radially guided in the carrier part (2), in particular in a tapering section of the guide opening (4).

17. The test probe device according to claim 16, characterized in that: A supporting ring (26) is provided for guidance, which is at least partially elastically and / or plastically deformable and at least partially maintains radial tension between the jacket section (25) and the carrier part (2).

18. The test probe device according to any one of claims 16 and 17, characterized in that The support ring (26) has an insertion bevel (28) for the carrier part (2) and is in particular a conical support ring.

19. The test probe device according to any one of claims 17 or 18, characterized in that: The bearing ring (26) has a radially protruding bearing ring stop (27) which is held axially between the spring element (10) and the carrier part (2).

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