Electrical Signal Detection Method and Device

Abstract

The present application discloses an electrical signal detection method and device. The method includes obtaining electrical parameters of an electrical signal of an object to be detected at at least one sampling time point within a first target sampling period; in the case that there is a target sampling time point at which the electrical parameter is greater than a preset parameter among the at least one sampling time point, determining a duration during which the electrical parameter of the electrical signal is greater than the preset parameter according to the target sampling time point and the electrical parameter of the target sampling time point; and in the case that the duration is less than a preset duration, determining that there is an abnormality in the electrical signal within the first target sampling period. This solution can improve the recognition accuracy of short-time large current.

Description

Technical Field

[0001] This application relates to the field of batteries, and in particular, to a method and device for detecting electrical signals. Background Art

[0002] In a battery system, components such as contactors and fuses are often prone to damage due to short-term large currents, which can cause the vehicle to break down.

[0003] Currently, the detection of short-term large currents is mainly carried out through current sensors. The current sensor calculates the average current value through an averaging algorithm for multiple current values within a sampling period, and then uses this average value as the current value sampled in this sampling period.

[0004] However, in the current method, there is a situation where the accuracy of identifying short-term large currents is poor. Summary of the Invention

[0005] This application provides a method and device for detecting electrical signals, which can improve the accuracy of identifying short-term large currents.

[0006] In a first aspect, this application provides a method for detecting electrical signals, including:

[0007] Obtaining electrical parameters of the electrical signal of the object to be detected at at least one sampling time point within a first target sampling period;

[0008] In the case where there is a target sampling time point among the at least one sampling time point whose electrical parameter is greater than a preset parameter, determining the duration during which the electrical parameter of the electrical signal is greater than the preset parameter according to the target sampling time point and the electrical parameter of the target sampling time point;

[0009] In the case where the duration is less than a preset duration, determining that the electrical signal is abnormal within the first target sampling period.

[0010] In this technical solution, by configuring the preset parameter, it is determined whether the electrical parameter of each sampling time point is greater than the preset parameter, and the target sampling time points whose electrical parameters are greater than the preset parameter are collected. Based on these target sampling time points and the electrical parameters of the target sampling time points, it is possible to more accurately determine whether the electrical signal is abnormal within the first target sampling period, and it is possible to avoid averaging the normal electrical parameters of other sampling time points within the first target sampling period with the electrical parameters of the target sampling time points, resulting in an average electrical parameter less than the preset parameter and causing the failure to detect whether the electrical signal is abnormal, thereby improving the accuracy of identifying abnormal electrical signals.

[0011] In another possible implementation manner of the first aspect, the method further includes:

[0012] When the electrical signal is abnormal within the first target sampling period, obtain the abnormal time period during which the electrical signal becomes abnormal according to the time stamp of the target sampling time point;

[0013] Obtain the electrical parameters of each target sampling time point within the abnormal time period;

[0014] Generate an electrical signal abnormality detection result for the first target sampling period according to the electrical parameters of each target sampling time point within the abnormal time period.

[0015] In this technical solution, by generating an electrical signal abnormality detection result, after the subsequent maintenance personnel retrieve the electrical signal abnormality detection result, through the electrical parameters of each target sampling time point within the abnormal time period, they can master the specific occurrence of short-time large current, which is convenient for the maintenance personnel to conduct fault troubleshooting and improve the fault troubleshooting efficiency.

[0016] In another possible implementation manner of the first aspect, the generating an electrical signal abnormality detection result for the first target sampling period according to the electrical parameters of each target sampling time point within the abnormal time period includes:

[0017] Obtain the number of times the electrical signal is abnormal within the first target sampling period;

[0018] Determine the peak electrical parameter among the electrical parameters of each target sampling time point within the abnormal time period;

[0019] Generate the electrical signal abnormality detection result according to the number of times, the peak electrical parameter, and the time stamps of each target sampling time point.

[0020] In this technical solution, by obtaining the abnormal duration of the electrical parameter within the abnormal time period, the number of times of abnormality within the first target sampling period, and the peak electrical parameter, and generating an electrical signal abnormality detection result, after the subsequent maintenance personnel retrieve the electrical signal abnormality detection result, through the abnormal duration and the peak electrical parameter of the electrical parameter, they can generally master the specific occurrence of the previous short-time large current, which is convenient for the maintenance personnel to conduct fault troubleshooting and improve the fault troubleshooting efficiency.

[0021] In another possible implementation manner of the first aspect, the method further includes:

[0022] When the electrical parameter of the sampling time point is less than or equal to the preset parameter, determine that the electrical signal is normal within the first target sampling period.

[0023] In this technical solution, based on the electrical parameters of the normal electrical signal, the occurrence time of the short-time large current can also be deduced, etc., and the electrical signal abnormality detection result can be calibrated with this to ensure data accuracy, and the efficiency of maintenance personnel in troubleshooting can also be further improved.

[0024] In yet another possible implementation manner of the first aspect, the method further includes:

[0025] When the electrical signal is normal, determine the average value of the electrical parameters according to the electrical parameters at each sampling time point within the first target sampling period;

[0026] Generate the normal detection result of the electrical signal for the first target sampling period according to the average value of the electrical parameters.

[0027] In this technical solution, by obtaining the electrical parameters of the normal electrical signal output by the object to be detected according to the normal detection result of the electrical signal, a comprehensive detection of the electrical signal is realized. Subsequently, the maintenance personnel can also deduce the occurrence time of the short-time large current, etc., based on the electrical parameters of the normal electrical signal, and use this to calibrate the electrical signal abnormality detection result to ensure data accuracy, and the efficiency of maintenance personnel in troubleshooting can also be further improved.

[0028] In yet another possible implementation manner of the first aspect, the method further includes:

[0029] When the number of times the electrical signal is abnormal within the first target sampling period is N, obtain the electrical signal abnormality detection result corresponding to each time the electrical signal is abnormal, where N is a positive integer greater than 1;

[0030] Within the first target sampling period, determine at least one target electrical signal abnormality detection result from the N electrical signal abnormality detection results and send it to the host computer.

[0031] In this technical solution, sending the electrical signal detection result of the first target sampling period to the host computer can ensure the real-time nature of the detection result, prevent confusion with the electrical signal detection result of the next target sampling period, and improve the reliability of data transmission.

[0032] In yet another possible implementation manner of the first aspect, the method further includes:

[0033] Within the Mth target sampling period after the first target sampling period, determine whether there is an electrical signal abnormality detection result that has not been sent to the host computer among the N electrical signal abnormality detection results, where M is a positive integer;

[0034] In the case where there is an abnormal detection result of an electrical signal that has not been sent to the host computer, during the Mth target sampling period, continue to send the unsent abnormal detection result of the electrical signal to the host computer.

[0035] In this technical solution, by sending the abnormal detection result of the electrical signal that was not sent out in the previous target sampling period in the next target sampling period, the integrity of data transmission can be ensured and omission can be avoided. In addition, sending a small amount of abnormal detection results of electrical signals in each target sampling period can also reduce the occupation of data transmission resources.

[0036] In another possible implementation manner of the first aspect, the first target sampling period is a communication period with the host computer.

[0037] In a second aspect, the present application provides an electrical signal detection device, including: an electrical signal sensor and a processor, the electrical signal sensor is connected to the processor; the electrical signal sensor is used to sample the electrical signal of the object to be detected; the processor is used to receive the sampling signal and execute the above method. Description of the Drawings

[0038] Next, the features, advantages, and technical effects of the exemplary embodiments of the present application will be described with reference to the drawings.

[0039] Figure 1 It is a schematic structural diagram of the electrical signal detection device provided by the embodiment of the present application;

[0040] Figure 2 It is a schematic flowchart of the electrical signal detection method provided by the embodiment of the present application;

[0041] Figure 3 It is a schematic diagram of the sampling time points provided by the embodiment of the present application;

[0042] Figure 4 It is a schematic flowchart of the abnormal time period interception process provided by the embodiment of the present application;

[0043] Figure 5 It is a schematic flowchart of the abnormal time period interception process provided by another embodiment of the present application;

[0044] Figure 6 It is a schematic diagram of the electrical parameter sampling result provided by the embodiment of the present application;

[0045] Figure 7 It is a schematic flowchart of the abnormal detection result generation process of the electrical signal provided by the embodiment of the present application;

[0046] Figure 8 It is a schematic flowchart of the normal detection result generation process of the electrical signal provided by the embodiment of the present application;

[0047] Figure 9 Schematic diagram of the transmission process of the abnormal detection result of the electrical signal provided by the embodiment of the present application;

[0048] Figure 10 Flowchart of the short-time large current detection method provided by the embodiment of the present application;

[0049] Figure 11 Schematic diagram of the structure of the electrical signal detection device provided by the embodiment of the present application;

[0050] Figure 12 Principle block diagram of the electrical signal detection provided by the embodiment of the present application.

[0051] In the drawings, the drawings are not necessarily drawn to actual scale. Detailed implementation manners

[0052] To make the objectives, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Apparently, the described embodiments are some, but not all, of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0053] In the battery system, contactors and fuses, as important safety regulations parts, often get damaged. For example, in the automotive battery system, if the contactor and fuse are damaged, it may cause the vehicle to break down, which not only affects the user's travel, but also requires time-consuming and laborious maintenance. Among them, the main failure modes of the contactor are short-time large current breaking, short-time large current closing, and welding caused by overcurrent during closing for a long time. The main failure modes of the fuse are tolerance fusing caused by overcurrent for a long time and large current fusing caused by short-time large current. Since short-time large current is sporadic, it is necessary to pre-configure a current sensor to continuously sample electrical signals so that after a fault occurs, when troubleshooting, it can be analyzed whether there is a short-time large current situation based on the sampled signals. In the related art, current sensors mainly using fluxgate and Hall schemes are adopted, and the sampling period is in the microsecond level, but the communication period of the in-vehicle Controller Area Network (CAN) is generally in the millisecond level (for example, 10 milliseconds). Therefore, the current sensor will calculate multiple current values collected within the communication period through a certain algorithm and output an effective average value. Therefore, due to the short duration of short-time large current, the short-time large current occurring within a communication period may be regarded as abnormal data and excluded or averaged by other normal current values within the communication period, which results in the failure to identify short-time large current signals and brings great difficulties to subsequent fault troubleshooting and analysis.

[0054] In view of the above problems, the present application provides a concept for a current sensor solution that can detect short-term large currents, mainly to solve the situation where short-term large currents cannot be recognized when the above current sensor samples electrical signals. In addition, this solution can effectively store the characteristic data of these short-term large currents after identifying the short-term large currents, and send them to the host computer in a timely manner for maintenance personnel to view during subsequent troubleshooting and analysis.

[0055] Next, the technical solution of the present application will be described in detail through specific embodiments. It should be noted that the following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments.

[0056] Figure 1 FIG. is a schematic structural diagram of an electrical signal detection device provided by an embodiment of the present application, and this electrical signal detection device can be used to detect and identify short-term large currents. As Figure 1 shown, the electrical signal detection device may include an electrical signal sensor 110 and a processor 120. The electrical signal sensor 110 is electrically connected to the processor 120.

[0057] Among them, the electrical signal sensor can sample the electrical signal of the object to be detected. The processor can receive the sampling signal of the electrical signal sensor and analyze it to determine whether there is a short-term large current. When the processor detects a large current, it can intercept the sampling signal, extract the characteristic values therein and store them for subsequent troubleshooting and analysis.

[0058] Among them, the electrical signal sensor can be a Hall sensor or a fluxgate sensor. The processor can be a Micro Controller Unit (MCU). In addition, the object to be detected can be a fuse or a contactor.

[0059] Exemplarily, the MCU can come with a storage chip to store the above-mentioned large current characteristic values. In addition, a separate memory can also be configured, and by connecting it to the MCU, the MCU transfers the above-mentioned large current characteristic values to this separate memory.

[0060] Among them, a current threshold can be configured in the processor 120. When the current value of the sampling signal is greater than this current threshold, the processor 120 recognizes that a large current has occurred at present, and at this time, the sampling signal interception starts, and the large current characteristic values are extracted therefrom. Exemplarily, the large current characteristic values can be the duration of the large current and the current peak value (including the peak-to-peak value and the peak-valley value) within this duration.

[0061] Next, some embodiments will be used to detail how the processor recognizes a large current and extracts the large current characteristic values to generate an anomaly detection result.

[0062] Figure 2 The figure is a schematic flowchart of the electrical signal detection method provided by the embodiment of the present application. This method can be applied to the above-mentioned processor. Taking the processor as the execution subject as an example, as Figure 2 shown, the method can specifically include the following steps:

[0063] Step S210: Obtain the electrical parameters at at least one sampling time point of the electrical signal of the object to be detected within the first target sampling period.

[0064] In this embodiment, it has been mentioned above that the object to be detected can be a fuse or a contactor. Among them, when the battery system is working, an electrical signal will flow through the fuse or contactor in the battery system, and the electrical signal of the object to be detected can be obtained by sampling the signal through an electrical signal sensor.

[0065] In this embodiment, the first target sampling period can be a preset time period, which can be specifically set according to actual needs. For example, taking a vehicle as an example, the CAN communication period in a car is generally at the millisecond level, and the first target sampling period can refer to the communication period between the above-mentioned processor and the upper computer. For example, if the CAN communication period in a car is 10 milliseconds, the first target sampling period correspondingly is also 10 milliseconds.

[0066] Among them, multiple sampling time points can be set within the first target sampling period. Exemplarily, Figure 3 The figure is a schematic diagram of the sampling time points provided by the embodiment of the present application. As Figure 3 shown, 5 sampling time points can be set within a target sampling period, and the electrical signal has corresponding electrical parameters at each sampling time point. Among them, the electrical parameter corresponding to the sampling time point t1 is c1, the electrical parameter corresponding to the sampling time point t2 is c2, the electrical parameter corresponding to the sampling time point t3 is c3, the electrical parameter corresponding to the sampling time point t4 is c4, the electrical parameter corresponding to the sampling time point t5 is c5, and the preset parameter is c0.

[0067] In this embodiment, the sampling signal can be preprocessed and then transmitted into the processor as the electrical signal of the object to be detected. Among them, the electrical signal of the object to be detected can be converted into a digital signal by an analog-to-digital converter (ADC), and then the processor reads the digital signal to obtain the electrical parameters of the electrical signal.

[0068] Among them, the preprocessing can refer to signal amplification and filtering of the sampling signal to remove impurities, etc.

[0069] Step S220: When there is a target sampling time point among at least one sampling time point where the electrical parameter is greater than the preset parameter, determine the duration for which the electrical parameter of the electrical signal is greater than the preset parameter according to the target sampling time point and the electrical parameter at the target sampling time point.

[0070] Step S230: When the duration is less than the preset duration, determine that there is an abnormality in the electrical signal within the first target sampling period.

[0071] In this embodiment, referring to the above Figure 3 , each sampling time point has a corresponding electrical parameter, that is, the electrical parameter of the electrical signal of the object to be detected at this sampling time point. The electrical parameter of each sampling time point can be compared with the preset parameter, and whether the electrical parameter of this sampling time point is abnormal can be determined through the comparison result. Among them, when the electrical parameter is greater than the preset parameter, the electrical parameter of this sampling time point is an abnormal electrical parameter, and at this time this sampling time point is regarded as the target sampling time point.

[0072] Exemplarily, if the electrical parameter of the sampling time point t1 is greater than the preset parameter, then the electrical parameter of the sampling time point t1 is abnormal. Further, if the electrical parameter of the sampling time point t2 is also greater than the preset parameter, then the electrical parameter of the sampling time point t2 is also abnormal. At this time, the abnormal time period can be defined as including the time period [t1, t2].

[0073] Among them, the electrical parameter can refer to the voltage value or the current value, and the preset parameter can be the current threshold or other electrical parameters related to the current (such as the voltage threshold).

[0074] In this embodiment, for the convenience of comparison and to quickly obtain the comparison result, the preset parameter and the electrical parameter of the sampling time point are of the same type. For example, if the preset parameter is the current threshold, then the electrical parameter of the sampling time point is the current value.

[0075] In this embodiment, the duration of the abnormal time period is less than or equal to the duration of the first target sampling period. For example, if the duration of the first target sampling period is 10 milliseconds, then the abnormal time period can be 1 millisecond or 10 milliseconds.

[0076] Among them, after the processor finds the first sampling time point with abnormal parameters according to the preset parameter, it starts to intercept, and sequentially detects the subsequent sampling time points until it finds the last sampling time point with abnormal parameters, and then intercepts to obtain the abnormal time period.

[0077] Among them, by setting the preset duration, it can be determined whether there is a short-time large current in the object to be detected within the first target sampling period, and accurate identification of the short-time large current can be realized. Among them, the duration for which the electrical parameter of the electrical signal is greater than the preset parameter can be regarded as the abnormal time period.

[0078] In addition, in some other embodiments, it is also possible to determine whether there is an abnormality in the electrical signal of the object to be detected within the first target sampling period according to the number of target sampling time points. Further, when there are multiple target sampling time points, it is also possible to obtain the average value of the electrical parameters of these target sampling time points, and determine whether there is an abnormality in the electrical signal of the object to be detected within the first target sampling period according to the magnitude of the average value of the electrical parameters.

[0079] In the embodiments of the present application, by configuring preset parameters, it is determined whether the electrical parameter of each sampling time point is greater than the preset parameter, and the target sampling time points whose electrical parameters are greater than the preset parameter are collected. Based on these target sampling time points and the electrical parameters of the target sampling time points, it is possible to more accurately determine whether there is an abnormality in the electrical signal within the first target sampling period, and it is possible to avoid the normal electrical parameters of other sampling time points within the first target sampling period being averaged with the electrical parameters of the target sampling time points, resulting in the averaged electrical parameter being less than the preset parameter and causing the inability to detect whether the electrical signal is abnormal, thereby improving the recognition accuracy of abnormal electrical signals.

[0080] Exemplarily, in some embodiments, after determining that there is an abnormality in the electrical signal of the object to be detected within the first target sampling period, an electrical signal abnormality detection result can be generated according to the target sampling time points and the electrical parameters of the target sampling time points. Specifically, the electrical signal abnormality detection result can be obtained through the following steps:

[0081] (1) In the case where there is an abnormality in the electrical signal within the first target sampling period, according to the time stamp of the target sampling time point, obtain the abnormal time period when the electrical signal has an abnormality;

[0082] (2) Obtain the electrical parameters of each target sampling time point within the abnormal time period;

[0083] (3) Generate an electrical signal abnormality detection result for the first target sampling period according to the electrical parameters of each target sampling time point within the abnormal time period.

[0084] In this embodiment, the electrical signal abnormality detection result can be used for subsequent troubleshooting or maintenance of the object to be detected.

[0085] Exemplarily, the electrical signal abnormality detection result may include the number of times the electrical signal has an abnormality within the first target sampling period, the time stamp of each sampling time point, the electrical parameter of each sampling time point, the current date (including year, month, day, hour, minute, second), and the duration, etc.

[0086] In this embodiment, taking a short-time large current as an abnormal electrical signal as an example, since the occurrence times of the short-time large current may be few, usually maintenance personnel may retrieve the electrical signal detection results once every month for maintenance. At this time, it is necessary to record which month and day the abnormal detection result of the electrical signal is through the current date. That is, by recording the current date, the maintenance efficiency of the maintenance personnel can be improved.

[0087] In the embodiment of the present application, by generating the abnormal detection result of the electrical signal, after the subsequent maintenance personnel retrieve the abnormal detection result of the electrical signal, through the electrical parameters at each target sampling time point within the abnormal time period, the specific occurrence situation of the short-time large current can be mastered, which is convenient for the maintenance personnel to conduct fault troubleshooting and improves the fault troubleshooting efficiency.

[0088] The following introduces how to intercept the abnormal time period within the first target sampling period through some embodiments.

[0089] Figure 4 It is a schematic diagram of the abnormal time period intercepting process provided by the embodiment of the present application, as Figure 4 shown, the method includes the following steps:

[0090] Step S410: According to the preset parameters and the electrical parameters at each sampling time point in the first target sampling period, obtain the first sampling time point when the electrical parameters first appear abnormally and the second sampling time point when the electrical parameters last appear abnormally in the first target sampling period.

[0091] Step S420: Determine the abnormal time period according to the first sampling time point and the second sampling time point.

[0092] In this embodiment, the first target sampling period includes multiple sampling time points, and these sampling time points usually have a corresponding time sequence. When the electrical parameters of a certain sampling time point appear abnormally and it is the earliest time point among all the sampling time points in the first target sampling period, then this sampling time point is regarded as the first sampling time point. Correspondingly, when the electrical parameters of a certain sampling time point appear abnormally and it is the latest time point among all the sampling time points in the first target sampling period, then this sampling time point can be regarded as the second sampling time point.

[0093] Among them, there may be other sampling time points between the first sampling time point and the second sampling time point, and the electrical parameters of the other sampling time points do not appear abnormally, and the abnormal time period is located between the first sampling time point and the second sampling time point.

[0094] In this embodiment, the sampling period of the current sensor is usually in the microsecond level. If the first target sampling period is in the millisecond level, then there is a large range of investigation when extracting the target time period within the first target sampling period. By extracting the time period from the first sampling time point to the second sampling time point, it is equivalent to narrowing the investigation range, so that the target time period can be found more quickly.

[0095] Further, in some embodiments, Figure 5 is a schematic diagram of the abnormal time period extraction process provided by another embodiment of the present application, as Figure 5 shown, which includes the following steps:

[0096] Step S510: Obtain a current threshold and a duration threshold according to preset parameters;

[0097] Step S520: According to the electrical parameters of each sampling time point in the first target sampling period, obtain the time period during which the current of the electrical signal is greater than the current threshold and the duration is less than the duration threshold;

[0098] Step S530: Determine the abnormal time period in the first target sampling period according to the time period.

[0099] In this embodiment, each sampling time point has its own timestamp information. There is a sampling period (the sampling period is in the microsecond level) between two adjacent sampling time points. By calculating how many sampling periods are there between two sampling time points, the time interval between these two sampling time points is determined.

[0100] For step S520, in the order of the sampling time of each sampling time point, the current value of each sampling time point is obtained in turn and compared with the current threshold to determine the earliest sampling time point with an abnormal current value.

[0101] Among them, when the current value of the earliest sampling time point is abnormal, according to the order of sampling time, the current value of the next sampling time point can be obtained, and it is continued to determine whether the current value of the next sampling time point is abnormal, and so on, until N consecutive sampling time points are found (the current values of these N sampling time points are all abnormal). By calculating the time interval between the starting sampling time point and the ending sampling time point among these N consecutive sampling time points, the duration of the abnormal current (that is, the electrical signal with a current value greater than the current threshold) is determined.

[0102] Among them, if the duration of the abnormal current is less than the duration threshold, then the duration of the abnormal current can be used as the abnormal time period.

[0103] Exemplarily, Figure 6Schematic diagram of the electrical parameter sampling results provided by the embodiments of the present application, as Figure 6 shown. Taking the first target sampling period including a total of 21 sampling time points from sampling time point T1 to sampling time point T21 as an example, among them, within the time period from sampling time point T2 to sampling time point T10, the sampled current values are all greater than the current threshold, and this time period can be used as a first abnormal time period. Additionally, within the time period from sampling time point T17 to sampling time point T20, the sampled current values are also greater than the current threshold, and this time period can also be used as another second abnormal time period. That is, within one target sampling period, there are two abnormal time periods (i.e., the first abnormal time period and the second abnormal time period).

[0104] Exemplarily, the current threshold can be set to 1000 amperes, and the duration threshold can be set to 10 milliseconds.

[0105] In the embodiments of the present application, by preset parameters, it can be determined whether an electrical signal is an abnormal electrical signal, and combined with the duration of the abnormal electrical signal, it is possible to identify whether there is a short-time large current in the first target sampling period. At the same time, using the electrical parameters of each sampling time point, the abnormal time period can be quickly and accurately found from within the first target sampling period, improving the search efficiency of the abnormal time period. Additionally, by intercepting the electrical parameters of the target sampling time points within the abnormal time period and generating an electrical signal abnormal detection result therefrom, it is possible to avoid the short-time large current being averaged by other normal currents within the first target sampling time period, realizing the identification of the short-time large current.

[0106] Figure 7 Schematic diagram of the electrical signal abnormal detection result generation process provided by the embodiments of the present application, as Figure 7 shown. The method includes the following steps:

[0107] Step S710: Obtain the number of times the electrical signal is abnormal within the first target sampling period;

[0108] Step S720: Determine the peak electrical parameter among the electrical parameters of each target sampling time point within the abnormal time period;

[0109] Step S730: Generate an electrical signal abnormal detection result based on the number of times, the peak electrical parameter, and the timestamps of each target sampling time point.

[0110] In this embodiment, the electrical parameters of each sampling time point within the abnormal time period can be compared with each other to determine the peak electrical parameter.

[0111] In addition, according to the timestamps of each target sampling time point, the starting sampling time point and the ending sampling time point of the abnormal time period can be obtained, and the time difference between the starting sampling time point and the ending sampling time point is obtained as the abnormal duration of the electrical signal.

[0112] Among them, in the order of sampling time, the starting sampling time point of the abnormal time period is the first sampling time point in the abnormal time period, and the ending sampling time point of the abnormal time period is the last sampling time point in the abnormal time period.

[0113] In this embodiment, the abnormal duration, the number of abnormalities, and the peak electrical parameters can be directly packed as the electrical signal abnormality detection result, or the abnormal duration and the peak electrical parameters can be preliminarily processed first. For example, the abnormal duration and the peak electrical parameters within the same abnormal time period need to be associated. This is because within the same target sampling period, there may be multiple abnormal time periods, and confusion between the abnormal durations and peak electrical parameters of different abnormal time periods can be avoided through association.

[0114] Exemplarily, taking the electrical parameter of each sampling time point as the current value as an example, continue to refer to the above Figure 6 There is a peak current (which can be understood as the peak electrical parameter) at the sampling time point T6 within the first abnormal time period, and there is a peak current at the sampling time point T19 within the second abnormal time period. At this time, a first electrical signal abnormality detection result can be generated based on the peak current within the first abnormal time period and the duration of the first abnormal time period, and a second electrical signal abnormality detection result can be generated based on the peak current within the second abnormal time period and the duration of the second abnormal time period. That is, there are two electrical signal abnormality detection results within one target sampling period.

[0115] Exemplarily, referring to Table 1 below, Table 1 is a schematic table of electrical signal abnormality detection results:

[0116] Table 1

[0117]

[0118] As shown in Table 1 above, the two columns of message name and message method in the above Table 1 can be filled according to the electrical parameters of each target sampling time point within the abnormal time period. For example, the current peak is 1200A and the duration is 10 microseconds. Through the above Table 1, the current value and duration of short-time large current can be stored, which is convenient for subsequent maintenance personnel to consult.

[0119] In the embodiments of the present application, the abnormal duration of the electrical parameters, the number of abnormalities occurring within the first target sampling period, and the peak electrical parameters are obtained to generate an abnormal detection result of the electrical signal. Subsequently, after the maintenance personnel retrieve the abnormal detection result of the electrical signal, they can generally grasp the specific occurrence of the previous short-term large current through the abnormal duration of the electrical parameters and the peak electrical parameters, which facilitates the maintenance personnel to conduct fault troubleshooting and improves the efficiency of fault troubleshooting.

[0120] In some embodiments, if the electrical parameter at a sampling time point within the first target sampling period is less than or equal to a preset parameter, it is determined that the electrical signal is normal at this sampling time point. Further, if the electrical parameters at all sampling time points within the first target sampling period are less than or equal to the preset parameter, it is determined that the electrical signal is normal within the first target sampling period.

[0121] In addition, in some embodiments, there may be some other time periods in the first target sampling period except for the abnormal time period, and the electrical parameters at the sampling time points within these other time periods are all less than or equal to the preset parameter. At this time, the average value of the electrical parameters can be calculated based on the electrical parameters at each sampling time point within this other time period, and this average value of the electrical parameters is used to represent the electrical parameters of the electrical signal in this other time period.

[0122] Among them, in the case where the electrical signal is normal within the first target sampling period, in some other embodiments, a normal detection result of the electrical signal can be generated. Exemplarily, Figure 8 is a schematic diagram of the process for generating a normal detection result of the electrical signal provided by the embodiments of the present application, as Figure 8 shown, which includes the following steps:

[0123] Step S810: Determine other time periods except for the abnormal time period in the first target sampling period according to the preset parameter and the electrical parameters at each sampling time point in the first target sampling period;

[0124] Step S820: Generate a normal detection result of the electrical signal of the object to be detected in other time periods according to the electrical parameters at the sampling time points in other time periods.

[0125] Exemplarily, taking the preset parameter as the current threshold and the electrical parameter as the current value as an example, continue to refer to the above Figure 6 , the current values at the sampling time point T1, the sampling time points T11 to T16, and the sampling time point T21 are all less than the current threshold and are normal currents.

[0126] Among them, according to the current values at the sampling time point T1, the current values at the sampling time points T11 to T16, and the current value at the sampling time point T21, the normal detection result of the electrical signal corresponding to other time periods can be generated.

[0127] Exemplarily, continuing to refer to the above Figure 6 , the time period [T11, T16] is another time period, and the average value of the electrical parameters of this other time period is:

[0128] Average value of electrical parameters = (I11*T11 + I12*T12 + I13*T13 + I14*T14 + I15*T15 + I16*T16) / (T11 + T12 + T13 + T14 + T15 + T16)

[0129] where, In represents the current value at the nth sampling time point, and Tm represents the timestamp at the mth sampling time point.

[0130] Furthermore, in some other embodiments, when the electrical signal is normal within the first target sampling period, the electrical signal normal detection result for the first target sampling period can be generated through the following steps:

[0131] Step A1: When the electrical signal is normal within the first target sampling period, determine the average value of the electrical parameters according to the electrical parameters at each sampling time point within the first target sampling period;

[0132] Step A2: Generate the electrical signal normal detection result for the first target sampling period according to the average value of the electrical parameters.

[0133] In this embodiment, when the electrical signal is normal within the first target sampling period, the electrical parameters at all sampling time points within the first target sampling period are less than or equal to the preset parameters. By summarizing the electrical parameters at all sampling time points within the first target sampling period, then summing and taking the average, the average value of the electrical parameters is obtained.

[0134] Exemplarily, referring to Table 2 below, Table 2 is a schematic table of the electrical signal normal detection result:

[0135] Table 2

[0136]

[0137] As shown in Table 2 above, the two columns of message name and message method in the above Table 2 can be filled according to the electrical parameters at each sampling time point within other time periods. For example, the current peak value is 900.

[0138] By comparing Table 1 and Table 2 above, the electrical signal normal detection result and the electrical signal abnormal detection result can be distinguished by filling different identifiers in the column of "message description" in the table.

[0139] In the embodiments of the present application, in addition to detecting short-term large current through the abnormal detection result of the electrical signal, the electrical parameters of the normal electrical signal output by the object to be detected can also be obtained according to the normal detection result of the electrical signal, realizing the comprehensive detection of the electrical signal. Subsequently, the maintenance personnel can also reverse-deduce the occurrence time of the short-term large current based on the electrical parameters of the normal electrical signal, etc., and use this to proofread the abnormal detection result of the electrical signal, ensuring data accuracy and further improving the efficiency of the maintenance personnel in troubleshooting.

[0140] In some embodiments, after generating the abnormal detection result of the electrical signal, the processor can store the abnormal detection result of the electrical signal corresponding to the first target sampling period in the memory.

[0141] Among them, the abnormal detection results of the electrical signals in different target sampling periods can be stored under different targets in the memory. For example, directories L1 and L2 can be created in the memory. The abnormal detection result of the electrical signal in the previous target sampling period is stored in directory L1, and the abnormal detection result of the electrical signal in the subsequent target sampling period is stored in directory L2, which can prevent the abnormal detection results of the electrical signals in different target sampling periods from being confused.

[0142] In this embodiment, when the storage capacity of the memory permits, a long period can be stored, such as the abnormal detection results of the electrical signals corresponding to all target sampling periods within a month, which is convenient for the maintenance personnel to trace back.

[0143] Furthermore, as mentioned above, there may be multiple abnormal detection results of the electrical signal in the same target sampling period. Therefore, different names can be configured for each abnormal detection result of the electrical signal. For example, according to the chronological order of the occurrence of the electrical signal abnormality, the abnormal detection result of the electrical signal corresponding to the first occurrence of the electrical signal abnormality is called the "first abnormal detection result of the electrical signal".

[0144] Furthermore, in some other embodiments, the normal detection result of the electrical signal corresponding to the same target sampling period and the abnormal detection result of the electrical signal can also be stored under the same target. This is convenient for the maintenance personnel to analyze the abnormal electrical signal in combination with the normal detection result of the electrical signal subsequently, improving the troubleshooting efficiency.

[0145] In addition, in some embodiments, the memory can be an internal memory of the electrical signal sensor or an external memory of the electrical signal sensor. In addition, the occurrence times of the short-term large current, the current peak value of the short-term large current, the duration of the short-term large current, and the occurrence date of the short-term large current can also be stored.

[0146] In the embodiment of the present application, the processor identifies a short-time large current and generates an abnormal detection result of the electrical signal corresponding to the short-time large current and stores it in the memory, realizing the storage of the characteristic value of the short-time large current. It is not necessary for maintenance personnel to manually record the characteristic value, reducing the labor cost. And it is also convenient to retrieve the data stored in the memory when the fuse or contactor is damaged for troubleshooting.

[0147] Further, on the basis of the above embodiment, in some other embodiments, at the end of the first target sampling period or within the first target sampling period, the abnormal detection result of the electrical signal in the first target sampling period can be sent to the host computer. Specifically, when the number of times of abnormal electrical signals within the first target sampling period is N, the abnormal detection result of the electrical signal corresponding to each abnormal occurrence can be obtained; and within the first target sampling period, at least one target abnormal detection result of the electrical signal can be determined from the N abnormal detection results of the electrical signal and sent to the host computer. Wherein, N is a positive integer greater than 1.

[0148] In this embodiment, the host computer can be a battery management system (Battery Management System, BMS) in the vehicle. After the BMS receives the abnormal detection result of the electrical signal, it can be further uploaded to the cloud. The background staff can realize remote troubleshooting of the vehicle by retrieving the abnormal detection result of the electrical signal from the cloud.

[0149] In this embodiment, there may be a short-time large current (i.e., abnormal electrical signal) in each target sampling period. Therefore, it is necessary to distinguish the abnormal detection results of the electrical signals in each target sampling period to prevent confusion.

[0150] Among them, after the previous target sampling period ends, the abnormal detection result of the electrical signal in the previous target sampling period is sent to the host computer, and then when the next target sampling period arrives, it continues to detect whether there is a short-time large current in the next target sampling period. If so, continue to send the abnormal detection result of the electrical signal in the next target sampling period to the host computer after the next target sampling period ends.

[0151] In some other embodiments, when there are normal current and short-time large current in the same target sampling period, at this time, the target sampling period contains both the normal detection result of the electrical signal and the abnormal detection result of the electrical signal. At this time, these two detection results can be read and sent in two different frames of messages respectively.

[0152] Exemplarily, taking the interaction between the CAN device and the host computer as an example, the CAN device reads the normal detection result and abnormal detection result of the electrical signal from the memory and sends them out through CAN communication. The CAN communication is in 2 frames. The first frame sends the normal detection result of the electrical signal, and the second frame sends the abnormal detection result of the electrical signal.

[0153] In the embodiment of the present application, sending the detection result of the electrical signal in the first target sampling period to the host computer can ensure the real-time nature of the detection result, prevent confusion with the detection result of the electrical signal in the next target sampling period, and improve the reliability of data transmission.

[0154] Further, in some embodiments, Figure 9 is a schematic diagram of the sending process of the abnormal detection result of the electrical signal provided by the embodiment of the present application. As Figure 9 shown, it includes the following steps:

[0155] Step S910: Determine whether there is an abnormal detection result of the electrical signal that has not been sent to the host computer among the N abnormal detection results of the electrical signal within the Mth target sampling period after the first target sampling period;

[0156] Step S920: In the case that there is an abnormal detection result of the electrical signal that has not been sent to the host computer, within the Mth target sampling period, continue to send the unsent abnormal detection result of the electrical signal to the host computer. Wherein, M is a positive integer.

[0157] In this embodiment, during the process of sending the abnormal detection result of the electrical signal to the host computer, since it has been mentioned above that there may be multiple abnormal time periods within one target sampling period, and each abnormal time period corresponds to an abnormal detection result of the electrical signal, this leads to multiple abnormal detection results of the electrical signal within one target sampling period.

[0158] Among them, in order to ensure the data transmission efficiency, when there are several abnormal detection results of the electrical signal in one target sampling period, it is not necessary to send them all out at once in this target sampling period. For example, one or N - K abnormal detection results of the electrical signal can be selectively selected from the N abnormal detection results of the electrical signal for transmission, which reduces the data transmission volume and can avoid resource occupation. Then continue to send the remaining abnormal detection results of the electrical signal in the subsequent target sampling periods.

[0159] Among them, when selecting the abnormal detection results of the electrical signal to be sent in this target sampling period, these abnormal detection results of the electrical signal can be sorted according to the time sequence of the occurrence of the electrical signal abnormality, and then the first L sorted ones are selected as the target abnormal detection results to be sent, which can ensure the real-time nature of the detection result.

[0160] In this embodiment, at least one target electrical signal anomaly detection result is determined from the electrical signal anomaly detection results corresponding to N abnormal time periods and sent to the host computer, which can avoid excessive occupation of data transmission resources at the same time and improve adaptability in different scenarios.

[0161] As mentioned above, one or N-K electrical signal anomaly detection results are selectively selected from the N electrical signal anomaly detection results and sent to the host computer. Further, in this embodiment, after the end of the first target sampling period, it can be determined whether there are still electrical signal anomaly detection results that have not been sent to the host computer among all the electrical signal anomaly detection results in the first target sampling period; in the case where there are electrical signal anomaly detection results that have not been sent, the unsent electrical signal anomaly detection results can be continued to be sent at the end of the next target sampling period or the next M target sampling periods after the first target sampling period.

[0162] In this embodiment, since it is considered that short-time large current usually does not occur frequently, adjacent target sampling periods may not all have short-time large current. For example, if there is a short-time large current in the previous target sampling period and it occurs multiple times, then there are corresponding multiple electrical signal anomaly detection results, while there may be no short-time large current in the next target sampling period, and then there are no corresponding electrical signal anomaly detection results. In this way, the electrical signal anomaly detection results that have not been sent completely in the previous target sampling period can be sent in the next target sampling period, which not only avoids excessive occupation of data transmission resources at the same time but also ensures the integrity of the transmission of electrical signal anomaly detection results.

[0163] Exemplarily, continuing to refer to Table 1 above, Table 1 can be regarded as a message of electrical signal anomaly detection results. This message may contain electrical signal anomaly detection results corresponding to multiple short-time large currents. After the end of a target sampling period, in subsequent target sampling periods, according to the time sequence of the electrical signal anomaly detection results corresponding to each short-time large current recorded in this message, these electrical signal anomaly detection results can be sent in sequence.

[0164] Exemplarily, when there are three electrical signal anomaly detection results JG1, JG2, and JG3 corresponding to short-time large currents in the previous target sampling period, if in the order of the occurrence time of the short-time large currents, JG1>JG2>JG3, then after the end of the previous target sampling period, JG1 is sent, then JG2 is sent after the end of the next target sampling period, and then JG3 is sent after the end of the next next target sampling period. That is, at the end of each target sampling period, a corresponding electrical signal anomaly detection result is sent. In this way, while fully reducing the occupation of data transmission resources, it also ensures that all electrical signal anomaly detection results can be sent to the host computer.

[0165] In the embodiment of the present application, by sending out the abnormal detection result of the electrical signal that was not sent out in the previous target sampling period in the next target sampling period, the integrity of data transmission can be ensured and omission can be avoided. In addition, sending a small amount of abnormal detection results of the electrical signal in each target sampling period can also reduce the occupation of data transmission resources.

[0166] The following is an embodiment of the device of the present application, which can be used to execute the method embodiment of the present application. For details not disclosed in the device embodiment of the present application, please refer to the method embodiment of the present application.

[0167] Figure 10 It is a schematic structural diagram of the electrical signal detection device provided in the embodiment of the present application, as Figure 10 shown, the electrical signal detection device 1000 may include an acquisition module 1001 and a determination module 1002.

[0168] Among them, the acquisition module 1001 is used to acquire the electrical parameters of at least one sampling time point of the electrical signal of the object to be detected within the first target sampling period. The determination module 1002 is used to determine the duration during which the electrical parameter of the electrical signal is greater than the preset parameter according to the target sampling time point and the electrical parameter of the target sampling time point when there is a target sampling time point with an electrical parameter greater than the preset parameter among at least one sampling time point; when the duration is less than the preset duration, it is determined that the electrical signal is abnormal within the first target sampling period.

[0169] The device provided in the embodiment of the present application can be used to execute the method in the above embodiment, and its implementation principle and technical effect are similar, which will not be elaborated here.

[0170] Figure 11 It is a principle block diagram of the electrical signal detection provided in the embodiment of the present application. As Figure 11 shown, it includes an MCU + storage chip 1100, a CAN chip 1101, a connector 1102, a feedback circuit 1103, a Hall chip 1104, and a magnetic core 1105. Among them, the MCU can integrate a storage chip as a memory. The connector 1102 can be connected to the power supply and is connected to the CAN chip 1011 through the pin CANH and the pin CANL. Using the connector 1102 can integrate each port together.

[0171] In this embodiment, the electrical signal sensor can be a fluxgate sensor, a Hall sensor, or a shunt. For Hall sensors and shunts, their sampling frequencies are different. For example, the Hall sampling period > 3.6 microseconds, and the sampling period of the shunt is 125 microseconds. Here, the sampling period can represent the time interval between two adjacent sampling time points.

[0172] As Figure 11As shown, taking the fluxgate sensor as an example, the measured current flows through the coil wound on the magnetic core 1105, and the fluxgate signal is sensed by the Hall chip 1104. Among them, the fluxgate signal is the current signal collected by the fluxgate sensor chip, and the sampling frequency is 20 microseconds. This sampling frequency can be adjusted according to the capability of the fluxgate sensor chip. The MCU is mainly used to process the fluxgate signal, and the normal current and short-term high current value are identified through the built-in comparison algorithm.

[0173] In some embodiments, the electrical signal detection device further includes a memory.

[0174] Among them, refer to the above Figure 11 The memory may be a memory chip of the MCU itself. In other embodiments, the memory may also be independent of the MCU and electrically connected to the MCU.

[0175] The memory may store the electrical signal detection results output by the processor according to a set message format, specifically including normal electrical signal detection results and abnormal electrical signal detection results.

[0176] In some embodiments, the electrical signal detection device further includes a transceiver.

[0177] Among them, refer to the above Figure 11 The transceiver can be a CAN chip. After being connected to the memory, it can convert the electrical signal detection results stored in the memory into CAN signals and send them to the host computer in the form of messages.

[0178] In this embodiment, the CAN chip 1101 can be connected to the connector 1102 via two outputs (one is a high level and the other is a low level) to output the electrical signal detection result to the host computer.

[0179] In some embodiments, the electrical signal detection device may further include a voltage regulator.

[0180] Among them, one end of the voltage stabilizer is connected to the electric signal sensor, and the other end of the voltage stabilizer is connected to the power supply; the voltage stabilizer is used to stabilize the power supply signal of the power supply and transmit the stabilized power supply signal to the electric signal sensor. Among them, the voltage stabilizer is mainly used to ensure the stable power supply of the current sensor.

[0181] Among them, refer to the above Figure 11 , the power supply can be connected to the connector to supply power to the electrical signal sensor.

[0182] In some embodiments, the electrical signal detection device further includes: a filter amplifier.

[0183] Among them, one end of the filter amplifier is connected to the electrical signal sensor, and the other end of the filter amplifier is connected to the processor; the filter amplifier is used to filter and amplify the sampled signal.

[0184] Among them, the sampling signal can refer to the current signal collected by the fluxgate sensor chip. This current signal can be filtered and amplified by a filter amplifier to remove clutter noise and the like.

[0185] Further, in some embodiments, continuing to refer to the above Figure 11 , an adjustment circuit can also be configured for the electrical signal detection device. The adjustment circuit includes a comparison operator and can achieve negative feedback adjustment and excitation and protection current. The adjustment circuit reduces the influence of large current on the magnetic core through negative feedback on the circuit, improves the accuracy of data acquisition, forms a closed-loop magnetic feedback function, and enhances the product performance.

[0186] The short-time large current detection scheme of the present application will be introduced in detail through a specific embodiment below. Figure 12 It is a flowchart of the short-time large current detection method provided by the embodiment of the present application. As Figure 12 shown, it includes the following steps:

[0187] Step 1210: Sampling the electrical signal of the fluxgate sensor / Hall sensor / shunt.

[0188] Step 1220: Conditioning the electrical signal. This includes electrical signal amplification and / or electrical signal isolation protection.

[0189] Step 1230: Obtain the conditioned electrical signal.

[0190] Step 1240: Compare the current of the electrical signal with the current threshold.

[0191] Step 1250: When it is greater than or equal to the current threshold, the characteristic value of the short-time large current is calculated according to the steps in the above embodiments by the processor.

[0192] Among them, the characteristic value of the short-time large current can include the above peak current and duration.

[0193] Step 1260: When it is less than the current threshold, the characteristic value of the normal current can be calculated according to the calculation method of the electrical parameter mean value in the above embodiments.

[0194] Step 1270: Store the characteristic value of the normal current and / or abnormal current.

[0195] Step 1280: The CAN device sends the characteristic value of the normal current and / or abnormal current.

[0196] In this embodiment, a current with a value greater than 1200 amperes and a duration less than 12 milliseconds can be defined as a short-time large current. The definition of the short-time large current can be clearly informed to the processor, so that the processor can automatically count the characteristic values of the short-time large current. In addition, this method can be applied to current sensors such as fluxgate, Hall, and shunt at the same time.

[0197] In this embodiment, the characteristic values of normal current and abnormal current can be clarified through the message formats in Table 1 and Table 2 above, and the message definition of the current sensor can be clarified. Each message transmission of the CAN device has two frames, one frame is the characteristic value of normal current, and the other frame is the characteristic value of abnormal message.

[0198] In addition, an embodiment of the present application also provides a vehicle, which includes a vehicle body and the battery system described in any of the above embodiments, and the battery system is arranged in the vehicle body. Among them, the vehicle can be a new energy vehicle, such as a pure electric vehicle or a hybrid vehicle, etc.

[0199] It should be understood that the specific examples in this article are only to help those skilled in the art better understand the embodiments of the present application, rather than limiting the scope of the embodiments of the present application.

[0200] It should also be understood that in various embodiments of the present application, the magnitude of the sequence numbers of each process does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

[0201] It should also be understood that the various implementation manners described in this specification can be implemented alone or in combination, and the embodiments of the present application do not limit this.

[0202] If there is no special description, all implementation manners and optional implementation manners of the present application can be combined with each other to form a new technical solution.

[0203] If there is no special description, all technical features and optional technical features of the present application can be combined with each other to form a new technical solution.

[0204] If there is no special description, all steps of the present application can be carried out in sequence or randomly, and preferably in sequence. For example, the method includes steps (a) and (b), which means that the method can include steps (a) and (b) carried out in sequence, or can also include steps (b) and (a) carried out in sequence. For example, it is mentioned that the method may further include step (c), which means that step (c) can be added to the method in any order. For example, the method can include steps (a), (b) and (c), or can also include steps (a), (c) and (b), or can also include steps (c), (a) and (b), etc.

[0205] Although the present application has been described with reference to preferred embodiments, various modifications can be made to it without departing from the scope of the present application, and components therein can be replaced with equivalents. In particular, as long as there is no structural conflict, the technical features mentioned in each embodiment can be combined in any manner. The present application is not limited to the specific embodiments disclosed in the text, but includes all technical solutions falling within the scope of the claims.

Claims

1. A method for detecting an electrical signal, characterized in that: include: Acquire electrical parameters of an electrical signal of an object to be detected at at least one sampling time point within a first target sampling period; In the case that there is a target sampling time point in the at least one sampling time point where the electrical parameter is greater than the preset parameter, determining a duration during which the electrical parameter of the electrical signal is greater than the preset parameter according to the target sampling time point and the electrical parameter of the target sampling time point; When the duration is shorter than a preset duration, determining that the electrical signal is abnormal within the first target sampling period; In the case that the electrical signal is abnormal in the first target sampling period, generating an electrical signal abnormality detection result of the first target sampling period according to the target sampling time point and the electrical parameter at the target sampling time point, the electrical signal abnormality detection result including the number of times the electrical signal is abnormal in the first target sampling period, the timestamp of each sampling time point, the electrical parameter at each sampling time point, the current date and the duration; The method further includes: when the number of times the electrical signal is abnormal within the first target sampling period is N, obtaining an electrical signal abnormality detection result corresponding to each time the electrical signal is abnormal, where N is a positive integer greater than 1; In the first target sampling period, determining at least one target electrical signal abnormality detection result from the N electrical signal abnormality detection results, and sending it to the host computer; Within M target sampling periods after the first target sampling period, the electrical signal abnormality detection result that was not sent in the first target sampling period is sent, where M is a positive integer.

2. The method according to claim 1, characterized in that The method further comprises: When the electrical signal is abnormal within the first target sampling period, obtaining the abnormal time period in which the electrical signal is abnormal according to the timestamp of the target sampling time point; Obtaining electrical parameters at each target sampling time point within the abnormal time period; The electrical signal anomaly detection result of the first target sampling period is generated according to the electrical parameters of each target sampling time point within the abnormal time period.

3. The method according to claim 2, characterized in that The step of generating an abnormality detection result of an electrical signal of the first target sampling period according to the electrical parameters of each target sampling time point within the abnormal time period includes: Acquire the number of times the electrical signal is abnormal within the first target sampling period; Determine a peak electrical parameter among the electrical parameters at each target sampling time point within the abnormal time period; The electrical signal anomaly detection result is generated according to the number of times, the peak electrical parameter and the timestamp of each target sampling time point.

4. The method according to claim 1, characterized in that: The method further comprises: When the electrical parameter at the sampling time point is less than or equal to the preset parameter, it is determined that the electrical signal is normal within the first target sampling period.

5. The method according to claim 1, characterized in that The method further comprises: When the electrical signal is normal, determining an electrical parameter mean value according to the electrical parameters at each sampling time point within the first target sampling period; According to the electrical parameter mean, a normal detection result of the electrical signal of the first target sampling period is generated.

6. The method according to any one of claims 1 to 5, characterized in that The method further comprises: In an Mth target sampling period after the first target sampling period, determining whether there is an electrical signal abnormality detection result that has not been sent to the host computer among the N electrical signal abnormality detection results, where M is a positive integer; In the case where there are electrical signal abnormality detection results that have not been sent to the host computer, within the Mth target sampling period, the unsent electrical signal abnormality detection results continue to be sent to the host computer.

7. The method according to claim 6, characterized in that The first target sampling period is a communication period with the host computer.

8. An electrical signal detection device, characterized in that: include: An electrical signal sensor and a processor, wherein the electrical signal sensor is connected to the processor; The electrical signal sensor is used to sample the electrical signal of the object to be detected; The processor is used to receive a sampled signal and execute the method according to any one of claims 1 to 7.

9. The device according to claim 8, characterized in that The device further includes: a memory connected to the processor; The memory is used to store the electrical signal detection result output by the processor.

10. The device according to claim 9, characterized in that The device further includes: a transceiver connected to the memory; The transceiver is used to send the electrical signal detection result stored in the memory to the host computer.

11. The device according to claim 8, characterized in that The device further comprises: a voltage stabilizer, one end of which is connected to the electrical signal sensor, and the other end of which is connected to a power source; The voltage stabilizer is used to stabilize the power signal of the power supply and transmit the stabilized power signal to the electrical signal sensor.

12. The device according to claim 8, characterized in that The device further comprises: a filter amplifier, one end of which is connected to the electrical signal sensor, and the other end of which is connected to the processor; The filter amplifier is used to filter and amplify the sampling signal.

Images