Automatic test system and test method for electronic information equipment

Abstract

The invention provides an automatic test system and method for electronic information equipment, and relates to the field of electronic information equipment testing. The system comprises a measurement and control computer and a tested electronic information device, wherein the measurement and control computer converts a test control command into a data stream and sends the data stream to the tested electronic information device; the measurement and control computer comprises a controller, an input unit, a control unit, an application unit and a search unit, and is used for carrying out module division on the tested electronic information equipment; the divided modules comprise a power supply module, an image transmission module, an RAM memory module, a data storage module, a network communication module, a 1553B communication module, an RS422 serial port communication module, a switching value control module and a DSP processor module. According to the invention, the tested electronic information equipment is reversely improved by using the automatic test system, so that the convenience and the standardization degree of automatic test are improved, and the performance of the tested electronic information equipment is improved.

Description

Technical Field

[0001] The invention relates to an automatic testing system and a testing method for electronic information equipment, and relates to the field of electronic information equipment testing. Background Art

[0002] Integration testing runs through the entire life cycle of electronic information equipment development, production and use. It usually requires an automatic test system equipped with test requirements at each stage. The hardware of the automatic test system is mainly integrated with a small amount of special test resources assisted by general test instruments, boards and other test resources. A lot of work is concentrated on the development, debugging and maintenance of the test system software. Therefore, the development efficiency of the test system software largely determines the development progress of the automatic test system. To improve the efficiency of test system software development, it is necessary to mainly realize the following test software capabilities: 1. Migration and reuse; 2. Synchronous development of test programs (hereinafter referred to as: TP); 3. Interchangeability of test resources.

[0003] At present, the industry usually uses signal-oriented technology to achieve the above capabilities. Signal generation and measurement are described through a signal-oriented special language, and test resources are automatically and dynamically allocated and controlled without directly controlling test resources. The test software platform based on this technology has been applied in maintenance and detection equipment, mainly for rapid detection and fault location of electronic information equipment during use, but compared with the traditional instrument-oriented method, there are the following problems. 1. First, since it uses a signal-oriented language, it is necessary to customize the compiler according to the TP development environment to translate the signal-oriented language into a language that can be recognized by the TP development environment; secondly, since it is not directly oriented to test resources, it is necessary to solve the problem of automatic and dynamic allocation of test resources; therefore, the test software platform based on this technology is relatively technically difficult, has a long development cycle, and is costly; 2. It is more suitable for fully automatic testing that does not require human intervention, such as maintenance and inspection during the use phase of electronic information equipment. It has no obvious advantages for semi-automatic testing such as debugging and testing that require certain human intervention. This type of semi-automatic testing is very common in the production phase of electronic information equipment, especially in the research and development phase; since in the semi-automatic testing process, it is necessary to pay attention to a large amount of test process information, and it is necessary to manually select and control test resources, and grasp the input and output conditions of signals, etc. However, the automatic allocation of test resources makes the signal link unclear, especially when the link is complex, the signal link situation is difficult to clearly grasp, which will increase the difficulty of troubleshooting during debugging and testing.

[0004] Among them, the prior art CN109359025A discloses a more efficient electronic information equipment automatic test system and test method, which has the characteristics of higher transplantation and reusability. However, the prior art and background technology both focus on the improvement of the automatic test system, and there is little research on the standardization improvement of the electronic information equipment under test. Summary of the invention

[0005] Through the above background technology explanation, the existing technology is mostly focused on the improvement research of automatic testing systems, and using automatic testing systems to reversely improve the electronic information equipment under test, thereby improving the convenience and standardization of automatic testing and improving the performance of the electronic information equipment under test, is the inventive concept of the present invention.

[0006] The invention provides an automatic test system for electronic information equipment, comprising a measurement and control computer and electronic information equipment to be tested, wherein the measurement and control computer converts a test control command into a data stream and sends the data stream to the electronic information equipment to be tested; the measurement and control computer comprises a controller, an input unit, a control unit, an application unit, and a search unit, and is characterized in that the electronic information equipment to be tested is divided into modules, and the divided modules include a power supply module, an image transmission module, a RAM memory module, a data storage module, a network communication module, a 1553B communication module, an RS422 serial port communication module, a switch quantity control module, and a DSP processor module.

[0007] The power supply module provides different voltage requirements for the electronic information equipment under test; the electronic information equipment under test needs to be provided with a 28V DC voltage externally during operation, and there are different voltage requirements inside the electronic information equipment under test, and the secondary power supply needs to be converted into a corresponding working voltage in the electronic information equipment under test for the normal operation of related components, and the power supply module can be tested and monitored according to the secondary power supply voltage state; during the test, the power supply module includes two types of faults, one is undervoltage or power failure; the other is voltage instability caused by interference; The image transmission module is used to receive data information for image transmission and pass the digital information of the image to the DSP processor module for operation and processing. The failures of the image transmission module include the following two types: one is the inability to receive and transmit image data information; the other is the loss of image data information, resulting in erroneous image processing result information that makes the electronic information equipment under test unable to operate normally.

[0008] The DSP processor module outputs correct instructions for the DSP to process corresponding data information during the operation of the electronic information equipment under test. Functional failures in the operation of the DSP processor module will directly affect the safe operation of the electronic information equipment under test.

[0009] The RAM memory module and the DSP processor module perform direct and rapid data exchange and run the algorithm program for image data processing; the correctness of the data stored in the RAM memory module is the key to whether the electronic information equipment under test can operate normally; The data storage module uses NandFlash memory to store the algorithm program for DSP to process data; its failure will cause the processor to be unable to run the algorithm program to process data, and the system output result value will be abnormal, resulting in functional failure; if the data storage module is completely damaged, the image processing algorithm data cannot be stored, which will result in the system having no output results, thereby causing a complete failure.

[0010] The network communication module is used to upload the BIT (built-in test) running program of the electronic equipment under test, and complete the uploading of the reference map and related template file algorithm program before the system runs. If this module fails, it will cause errors in the uploaded data and fail to run normally.

[0011] The 1553B communication module is used for transmitting and exchanging data information between the electronic information equipment under test and other control systems.

[0012] The RS422 serial communication module is used for data communication between the electronic information equipment under test and the control system. During operation, the electronic information equipment sends the result instructions of information processing to the subsequent control unit using serial communication. Normal operation of this module ensures the correct transmission of instructions; when a fault occurs, its failure mode is communication data error or communication failure.

[0013] The switch quantity control module is used to control the power on and off of related components during the normal operation of the electronic information equipment under test. A functional failure of this module will cause the electronic information equipment under test to operate in a chaotic manner, unable to work normally, and output unstable data information, affecting normal operation.

[0014] The present invention also provides a testing method using an automatic testing system for electronic information equipment, which divides the electronic information equipment under test into modules including a power supply module, an image transmission module, a RAM memory module, a data storage module, a network communication module, a 1553B communication module, an RS422 serial port communication module, a switch quantity control module, and a DSP processor module according to a functional fault modeling method, and establishes divided objects, selects built-in test schemes, implements built-in test verification, and completes the excitation and response of signals between the test system and the electronic information equipment under test according to the BIT technical analysis of the object under test and the failure mode of each object.

[0015] The electronic information equipment automatic test system is based on the combination of the ATML automatic test system and the BIT technology of the electronic information equipment under test. During the test, the automatic test system and the electronic information equipment under test send and receive test instructions through data communication. At the same time, the automatic test system drives the instrument to be applied to the object under test according to the demand signal information in the test process. The object under test of the functional test runs the BIT program of the device under test under the test stimulus conditions according to the corresponding instructions and determines the functional status result of the object under test. The automatic test system is designed based on the ATML standard to meet the requirements of configurable and portable test information, and the test is completed through the cooperation between the instrument system on the automatic test equipment and the device under test.

[0016] The 1553B communication interface in the electronic information equipment under test is used as the communication interface for sending system test instructions and receiving results. When 1553B data communication is in progress, the test instrument with 1553B communication function in the automatic test system acts as the only BC (Bus Controller) of the bus system and communicates data with the 1553B communication module of the device under test as the RT (Remote Terminal) of the bus. The overall test process is controlled by the automatic test system based on the relevant test programs of ATML to centralize the test information to control the main control program, including the analysis of test information, the control of test items and test processes and action information; according to the specific needs of each test, the automatic test system controls the instrument to provide the demand signal to the electronic equipment under test, that is, sends the corresponding test instructions, and the electronic information equipment under test runs the BIT self-test program to perform independent tests or cooperate with related test demand signal tests, that is, the automatic test system sends other stimulus signals required for the test, and the object under test responds to the corresponding test after receiving the stimulus, and puts the test results into the buffer, and finally transmits the test results back to the automatic test system through data communication; if necessary, the automatic test system collects and measures the output signals of the electronic information equipment under test according to the project test, and the final result is transmitted back to the automatic test system according to the standard protocol for interpretation, and the wrong data is displayed and the fault is displayed on the system human-computer interaction interface, and the test result information is output to the standard test result file at the same time.

[0017] In the test process, 1553B communication is used to send test instructions and receive test result information. In the overall test process, the automatic test system first downloads the built-in test program to the object under test, and the object under test sends the corresponding test instructions. Secondly, the electronic information equipment under test runs the built-in test program or the automatic test system provides other stimulus signals to configure the test. After the verification program is completed, the test result information is stored in the output memory of the data communication. Finally, the automatic test system or equipment reads the data for the next step of external analysis.

[0018] The test is divided into self-test items and associated test items: the self-test items use the BIT technology of the electronic information equipment under test to send corresponding test instructions to the electronic information equipment under test through the automatic test system, and the electronic information equipment under test runs the self-test program to complete the corresponding test items; the associated test items use the excitation and measurement signals of the instruments and equipment in the automatic test system to cooperate with the BIT technology of the electronic information equipment under test to complete the corresponding test items. The automatic test system sends the corresponding test instructions according to the test requirements and cooperates to generate the corresponding test excitation signals. The electronic information equipment under test runs the self-test program, and the output signal is finally judged by the automatic test system through the self-test program judgment or the running program execution, and the test is completed. The associated tests include RS422 serial communication test, 1553B communication test, switch input test and image transmission test.

[0019] The test method further includes: the test control computer converts the test control command into a data stream and sends it to the electronic information equipment under test; (1) the controller of the test control computer receives the relevant test data value or control command through an input unit; (2) The control unit loads the test protocol from the test library unit to the application unit of the measurement and control computer; (3) searching and connecting the electronic information equipment under test through a search unit; (4) the search unit determines whether the control unit supports the test protocol of the electronic information equipment under test that is searched; (5) If the result of the determination in step (4) is that the found electronic information equipment under test supports the test protocol, the controller tests the found electronic information equipment under test; (6) Disconnect the electronic information equipment under test from the control unit; (7) the control unit unloads the test protocol from the test library unit; Step (5) is: (5-1) The control unit of the measurement and control computer calls the test application program interface through the test library unit, and provides the test application program interface to the application unit of the measurement and control computer; (5-2) The control unit converts the test control command into a data packet according to the test protocol through the abstract unit; (5-3) The control unit transmits data packets from the interface unit to the electronic information equipment under test through the drive unit; (5-4) The controller analyzes the data packets received from the electronic information equipment under test through the abstract unit (5-5) The control unit outputs the test result of the analyzed data packet through the output unit.

[0020] In summary, the present invention has the following advantages: (1) The module division of the electronic information equipment under test is realized, which increases the standardization and convenience of the test; (2) Use the automatic test system to reversely improve the electronic information equipment under test, thereby improving the convenience and standardization of automatic testing and improving the performance of the electronic information equipment under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a schematic diagram of module division of the electronic information equipment under test of the present invention; Figure 2 It is a schematic diagram of the structural principle of the electronic information equipment automatic testing system of the present invention. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0023] It should be noted that the installation methods, communication protocols and technical terms mentioned in the present invention are all technical terms that have long been clearly known in the relevant technical field, so no further explanation is given. In addition, the same reference numerals are used for the same components, but this does not affect and should not constitute an accurate understanding of the technical solution by those skilled in the art.

[0024] Referring to the present invention Figure 1 and Figure 2 , an automatic test system for electronic information equipment, including a measurement and control computer and an electronic information equipment under test, wherein the measurement and control computer converts a test control command into a data stream and sends the data stream to the electronic information equipment under test; the measurement and control computer includes a controller, an input unit, a control unit, an application unit, and a search unit, and is characterized in that the electronic information equipment under test is divided into modules, and the divided modules include a power supply module, an image transmission module, an image acquisition module, a RAM memory module, a data storage module, a network communication module, a 1553B communication module, an RS422 serial port communication module, a switch quantity control module, and a DSP processor module.

[0025] The power supply module provides different voltage requirements for the electronic information equipment under test; the electronic information equipment under test needs to be provided with a 28V DC voltage externally during operation, and there are different voltage requirements inside the electronic information equipment under test, and the secondary power supply needs to be converted into a corresponding working voltage in the electronic information equipment under test for the normal operation of related components, and the power supply module can be tested and monitored according to the secondary power supply voltage state; during the test, the power supply module includes two types of faults, one is undervoltage or power failure; the other is voltage instability caused by interference; The image transmission module is used to receive data information for image transmission and pass the digital information of the image to the DSP processor module for operation and processing. The failures of the image transmission module include the following two types: one is the inability to receive and transmit image data information; the other is the loss of image data information, resulting in erroneous image processing result information that makes the electronic information equipment under test unable to operate normally.

[0026] The DSP processor module outputs correct instructions for the DSP to process corresponding data information during the operation of the electronic information equipment under test. Functional failures in the operation of the DSP processor module will directly affect the safe operation of the electronic information equipment under test.

[0027] The RAM memory module and the DSP processor module perform direct and rapid data exchange and run the algorithm program for image data processing; the correctness of the data stored in the RAM memory module is the key to whether the electronic information equipment under test can operate normally; The data storage module uses NandFlash memory to store the algorithm program for DSP to process data; its failure will cause the processor to be unable to run the algorithm program to process data, and the system output result value will be abnormal, resulting in functional failure; if the data storage module is completely damaged, the image processing algorithm data cannot be stored, which will result in the system having no output results, thereby causing a complete failure.

[0028] The network communication module is used to upload the BIT (built-in test) running program of the electronic equipment under test, and complete the uploading of the reference map and related template file algorithm program before the system runs. If this module fails, it will cause errors in the uploaded data and fail to run normally.

[0029] The 1553B communication module is used for transmitting and exchanging data information between the electronic information equipment under test and other control systems.

[0030] The RS422 serial communication module is used for data communication between the electronic information equipment under test and the control system. During operation, the electronic information equipment sends the result instructions of information processing to the subsequent control unit using serial communication. Normal operation of this module ensures the correct transmission of instructions; when a fault occurs, its failure mode is communication data error or communication failure.

[0031] The switch quantity control module is used to control the power on and off of related components during the normal operation of the electronic information equipment under test. A functional failure of this module will cause the electronic information equipment under test to operate in a chaotic manner, unable to work normally, and output unstable data information, affecting normal operation.

[0032] A testing method using an automatic testing system for electronic information equipment divides the tested electronic information equipment into modules including a power supply module, an image transmission module, a RAM memory module, a data storage module, a network communication module, a 1553B communication module, an RS422 serial communication module, a switch quantity control module and a DSP processor module according to a functional fault modeling method, and establishes divided objects, selects built-in test schemes and implements built-in test verification according to BIT technical analysis of the tested object and the fault modes of each object, thereby completing the excitation and response of signals between the test system and the tested electronic information equipment.

[0033] Furthermore, if Figure 2 As shown, the electronic information equipment automatic test system is based on the combination of ATML automatic test system and BIT technology of the electronic information equipment under test; Figure 2 The left side of the figure shows an automatic test system based on the ATML automatic test system, and the right side shows an embedded BIT system of the electronic information equipment under test; during the test, the automatic test system and the electronic information equipment under test send and receive test instructions through data communication, wherein the automatic test system based on the ATML automatic test system shown on the left side finds the most effective configuration items and the values ​​at the best optimization effect in the configuration file, and combines them to form the entire TPS configuration file, and then embeds them into the operating system with the system software, and the operating system in the automatic test system drives the instrument (such as instrument one, instrument two, etc. shown in the figure) to be applied to the object under test according to the demand signal information in the test process, and the object under test of the functional test runs the BIT program of the device under test under the test stimulus conditions according to the corresponding instructions and determines the functional status result of the object under test; the automatic test system is designed based on the ATML standard to meet the requirements of configurable and portable test information, and the test is completed through the cooperation between the instrument system on the automatic test equipment and the device under test.

[0034] The 1553B communication interface in the electronic information equipment under test is used as the communication interface for sending system test instructions and receiving results. When 1553B data communication is in progress, the test instrument with 1553B communication function in the automatic test system acts as the only BC (Bus Controller) of the bus system and communicates data with the 1553B communication module of the device under test as the RT (Remote Terminal) of the bus. The overall test process is controlled by the automatic test system based on the relevant test programs of ATML to centralize the test information to control the main control program, including the analysis of test information, the control of test items and test processes and action information; according to the specific needs of each test, the automatic test system controls the instrument to provide the demand signal to the electronic equipment under test, that is, sends the corresponding test instructions, and the electronic information equipment under test runs the BIT self-test program to perform independent tests or cooperate with related test demand signal tests, that is, the automatic test system sends other stimulus signals required for the test, and the object under test responds to the corresponding test after receiving the stimulus, and puts the test results into the buffer, and finally transmits the test results back to the automatic test system through data communication; if necessary, the automatic test system collects and measures the output signals of the electronic information equipment under test according to the project test, and the final result is transmitted back to the automatic test system according to the standard protocol for interpretation, and the wrong data is displayed and the fault is displayed on the system human-computer interaction interface, and the test result information is output to the standard test result file at the same time.

[0035] In the test process, 1553B communication is used to send test instructions and receive test result information. In the overall test process, the automatic test system first downloads the built-in test program to the object under test, and the object under test sends the corresponding test instructions. Secondly, the electronic information equipment under test runs the built-in test program or the automatic test system provides other stimulus signals to configure the test. After the verification program is completed, the test result information is stored in the output memory of the data communication. Finally, the automatic test system or equipment reads the data for the next step of external analysis.

[0036] The test is divided into self-test items and associated test items: the self-test items use the BIT technology of the electronic information equipment under test to send corresponding test instructions to the electronic information equipment under test through the automatic test system, and the electronic information equipment under test runs the self-test program to complete the corresponding test items; the associated test items use the excitation and measurement signals of the instruments and equipment in the automatic test system to cooperate with the BIT technology of the electronic information equipment under test to complete the corresponding test items. The automatic test system sends the corresponding test instructions according to the test requirements and cooperates to generate the corresponding test excitation signals. The electronic information equipment under test runs the self-test program, and the output signal is finally judged by the automatic test system through the self-test program judgment or the running program execution, and the test is completed. The associated tests include RS422 serial communication test, 1553B communication test, switch input test and image transmission test.

[0037] The test method further includes: the test control computer converts the test control command into a data stream and sends it to the electronic information equipment under test; (1) the controller of the test control computer receives the relevant test data value or control command through an input unit; (2) The control unit loads the test protocol from the test library unit to the application unit of the measurement and control computer; (3) searching and connecting the electronic information equipment under test through a search unit; (4) the search unit determines whether the control unit supports the test protocol of the electronic information equipment under test that is searched; (5) If the result of the determination in step (4) is that the found electronic information equipment under test supports the test protocol, the controller tests the found electronic information equipment under test; (6) Disconnect the electronic information equipment under test from the control unit; (7) the control unit unloads the test protocol from the test library unit; Step (5) is: (5-1) The control unit of the measurement and control computer calls the test application program interface through the test library unit, and provides the test application program interface to the application unit of the measurement and control computer; (5-2) The control unit converts the test control command into a data packet according to the test protocol through the abstract unit; (5-3) The control unit transmits data packets from the interface unit to the electronic information equipment under test through the drive unit; (5-4) analyzing, by the controller, data packets received from the electronic information equipment under test through the abstraction unit; (5-5) The control unit outputs the test result of the analyzed data packet through the output unit.

[0038] In summary, the present invention has the following advantages: (1) The module division of the electronic information equipment under test is realized, which increases the standardization and convenience of the test; (2) Use the automatic test system to reversely improve the electronic information equipment under test, thereby improving the convenience and standardization of automatic testing and improving the performance of the electronic information equipment under test.

[0039] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the invention may be implemented in other specific forms without departing from the spirit or essential features of the invention. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description, and it is intended that all variations falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be considered as limiting the claim to which it relates.

[0040] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any slight modification, equivalent substitution and improvement made to the above embodiment based on the technical essence of the present invention should be included in the protection scope of the technical solution of the present invention.

Claims

1. An automatic test system for electronic information equipment, comprising a measurement and control computer and an electronic information equipment to be tested, wherein the measurement and control computer converts a test control command into a data stream and sends the data stream to the electronic information equipment to be tested; the measurement and control computer comprises a controller, an input unit, a control unit, an application unit, and a search unit, wherein: The electronic information equipment under test is divided into modules, and the divided modules include a power supply module, an image transmission module, a RAM memory module, a data storage module, a network communication module, a 1553B communication module, an RS422 serial communication module, a switch quantity control module, and a DSP processor module.

2. An automatic test system for electronic information equipment as claimed in claim 1, characterized in that: The power supply module provides different voltage requirements for the electronic information equipment under test; the electronic information equipment under test needs to be provided with a 28V DC voltage externally during operation, and there are different voltage requirements inside the electronic information equipment under test, which needs to be converted into a corresponding working voltage through a secondary power supply in the electronic information equipment under test for the normal operation of related components, and the power supply module can be tested and monitored according to the voltage state of the secondary power supply; during the test, the power supply module includes two types of faults, one is undervoltage or power failure; the other is voltage instability caused by interference; The image transmission module is used to receive the data information of image transmission, and transmit the digital information of the image to the DSP processor module for operation and processing. The faults of the image transmission module include the following two types: one is that the image data information cannot be received and transmitted; the other is that the image data information is lost, and the wrong image processing result information is generated, so that the electronic information equipment under test cannot operate normally; The DSP processor module outputs correct instructions for the DSP to process corresponding data information during the operation of the electronic information equipment under test. Functional failures in the operation of the DSP processor module will directly affect the safe operation of the electronic information equipment under test. The RAM memory module and the DSP processor module perform direct and rapid data exchange to run an algorithm program for image data processing; Whether the data stored in the RAM memory module is correct or not is the key to whether the electronic information equipment under test can operate normally; The data storage module adopts NandFlash memory to store the algorithm program for data processing by DSP; Its failure will cause the processor to be unable to run the algorithm program normally to process data, and the system output result value will be abnormal, leading to a functional failure; if the data storage module is completely damaged, the image processing algorithm data cannot be stored, which will cause the system to have no output results, thereby causing a complete failure.

3. An automatic test system for electronic information equipment as claimed in claim 2, characterized in that: The network communication module is used to upload the in-machine test program of the electronic information equipment under test, and complete the upload of the reference map and related template file algorithm program before the system runs. If the module fails, it will cause errors in the uploaded data and fail to run normally; The 1553B communication module is used for transmitting and exchanging data information between the electronic information equipment under test and other control systems.

4. An automatic test system for electronic information equipment as claimed in any one of claims 1 to 3, characterized in that: The RS422 serial communication module is used for data communication between the electronic information equipment under test and the control system. The electronic information equipment sends the result instructions of information processing to the control unit at the rear using serial communication during operation. The module operates normally to ensure the correct transmission of instructions. When a fault occurs, its fault mode is communication data error or communication failure. The switch control module is used to control the power on and off of related components during the normal operation of the electronic information equipment under test. A functional failure of this module will cause the electronic information equipment under test to operate in a chaotic manner and fail to work normally, while outputting unstable data information, affecting normal operation.

5. A testing method using the electronic information equipment automatic testing system according to any one of claims 1 to 4, characterized in that: According to the functional fault modeling method, the electronic information equipment under test is divided into the following test objects according to modules: power module, image transmission module, RAM memory module, data storage module, network communication module, 1553B communication module, RS422 serial communication module, switch control module, DSP processor module, and according to the BIT technical analysis of the test object and the failure mode of each test object, the test object is divided, the built-in test scheme is selected, the built-in test verification is implemented, and the signal excitation and response between the test system and the electronic information equipment under test are completed; The electronic information equipment automatic test system is based on the combination of the ATML automatic test system and the BIT technology of the electronic information equipment under test. During the test, the automatic test system and the electronic information equipment under test send and receive test instructions through data communication. At the same time, the automatic test system drives the instrument to be applied to the object under test according to the demand signal information in the test process. The object under test of the functional test runs the BIT program of the device under test under the test stimulus conditions according to the corresponding instructions and determines the functional status result of the object under test.

6. The testing method according to claim 5, characterized in that: The communication interface of the 1553B communication module in the electronic information equipment under test is used as the communication interface for sending system test instructions and receiving test results. When the 1553B communication module performs data communication, the test instrument with the 1553B communication module test function in the automatic test system acts as the only bus controller of the bus system and performs data communication with the 1553B communication module under test as the remote terminal of the bus. The overall test process is controlled by the automatic test system based on the relevant test programs of ATML to centralize the test information to control the main control program, including the analysis of test information, test items, test process and control of action information; according to the specific needs of each test, the automatic test system controls the instrument to provide a demand signal to the electronic information equipment under test, that is, sends the corresponding test instructions, and the electronic information equipment under test runs the BIT self-test program to perform independent tests or cooperate with relevant test demand signals for testing, that is, the automatic test system sends other stimulus signals required for the test, and the object under test responds and performs corresponding tests after receiving the stimulus signals, and stores the test results in the buffer, and finally transmits the test results back to the automatic test system through data communication; if necessary, the automatic test system collects and measures the output signals of the electronic information equipment under test according to the project test, and the final results are transmitted back to the automatic test system according to the standard protocol for interpretation, and the erroneous data and faults are displayed on the system human-computer interaction interface, and the test result information is output to the standard test result file.

7. The testing method according to claim 5, characterized in that: In the test process, the 1553B communication module is used to send test instructions and receive test result information. In the overall test process, the automatic test system first downloads the built-in test program to the object under test, and the object under test sends the corresponding test instructions. Secondly, the electronic information equipment under test runs the built-in test program or the automatic test system provides other stimulus signals to configure the test. After the verification program is completed, the test result information is stored in the output memory of the data communication. Finally, the automatic test system or equipment reads the data for the next step of external analysis.

8. The testing method according to claim 7, characterized in that: The test is divided into self-test items and associated test items: the self-test items use the BIT technology of the electronic information equipment under test to send corresponding test instructions to the electronic information equipment under test through the automatic test system, and the electronic information equipment under test runs the self-test program to complete the corresponding test items; the associated test items use the excitation signals of the instruments and equipment in the automatic test system to cooperate with the BIT technology of the electronic information equipment under test to complete the corresponding test items. The automatic test system sends the corresponding test instructions and cooperates to generate the corresponding test excitation signals according to the test requirements. The electronic information equipment under test runs the self-test program, and the output signal is finally judged by the automatic test system through the self-test program judgment or the running program execution, and the test is completed; The associated tests include RS422 serial communication test, 1553B communication test, switch input test and image transmission test.

9. The testing method according to claim 5, characterized in that: The test method further includes that the test control computer converts the test control command into a data stream and sends the data stream to the electronic information equipment under test; specifically includes the following steps: (1) The controller of the measurement and control computer receives relevant test data values ​​or control commands through an input unit; (2) The control unit loads the test protocol from the test library unit to the application unit of the measurement and control computer; (3) searching and connecting the electronic information equipment under test through a search unit; (4) the search unit determines whether the control unit supports the test protocol of the electronic information equipment under test that is searched; (5) If the result of the determination is that the test protocol of the electronic information equipment under test is supported, the controller tests the electronic information equipment under test; (6) Disconnect the electronic information equipment under test from the control unit; (7) the control unit unloads the test protocol from the test library unit; Step (5) comprises: (5-1) The control unit of the measurement and control computer calls the test application program interface through the test library unit, and provides the test application program interface to the application unit of the measurement and control computer; (5-2) The control unit converts the test control command into a data packet according to the test protocol through the abstract unit; (5-3) The control unit transmits data packets from the interface unit to the electronic information equipment under test through the drive unit; (5-4) analyzing, by the controller, data packets received from the electronic information equipment under test through the abstraction unit; (5-5) The control unit outputs the test result of the analyzed data packet through the output unit.

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