Method for testing contact resistance of high-voltage switch cabinet

By measuring the overall conductive circuit of the high-voltage switch cabinet, including insulation testing and loop resistance measurement, the contact resistance testing problem of the existing technology that cannot cover the entire conductive circuit is solved, and the comprehensive detection of the contact resistance of the conductive circuit in the high-voltage switch cabinet is achieved, which improves the accuracy of the test and operation stability.

CN119643964APending Publication Date: 2025-03-18CHINA MCC20 GRP CORP LTD +1
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Patent Information

Application Number
CN202411763718.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-03
Publication Date
2025-03-18

AI Technical Summary

Technical Problem

The prior art can only test the contact resistance of the vacuum circuit breaker in a closed state, and cannot cover the entire conductive circuit, and cannot confirm the advantages and disadvantages of the contact resistance of the entire conductive circuit in the high-voltage switch cabinet.

Method used

A high-voltage megohmmeter is used to insulating the A-phase, B-phase and C-phase conductive loops. The loop resistance tester is used to measure the overall conductive loop resistance of A-phase, B-phase and C-phase respectively, and compare the test data. If there is no difference, the contact will be good.

Benefits of technology

By measuring the overall conductive circuit resistance of the high-voltage switch cabinet, in addition to detecting the contact resistance of the vacuum circuit breaker, the connections of the overall conductive circuit, the bolt fastening points and the dynamic and static contacts of the vacuum circuit breaker and the busbar are also tested, which improves the accuracy and operating stability of the test, and avoids hidden dangers of heat generation and power supply failures caused by poor contact.

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Abstract

The invention relates to a method for testing contact resistance of a high-voltage switch cabinet. The method comprises the following steps of: performing insulation testing on an A-phase conductive loop, a B-phase conductive loop and a C-phase conductive loop by adopting a high-voltage megohmmeter; respectively testing the integral conductive loop resistance of the phase A, the integral conductive loop resistance of the phase B and the integral conductive loop resistance of the phase C by adopting a loop resistance tester; comparing test data obtained by testing the integral conductive loop resistance of the phase A, the integral conductive loop resistance of the phase B and the integral conductive loop resistance of the phase C; by measuring the overall conductive loop resistance of the high-voltage switch cabinet, the accuracy of the overall conductive loop resistance test of the high-voltage switch cabinet and the stability of the operation process are improved, and heating hidden dangers and larger power supply faults caused by poor contact at the joints of main loops in the operation process are effectively avoided.
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Description

Technical Field

[0001] The invention relates to the field of electrical technology, and in particular to a method for testing contact resistance of a high-voltage switch cabinet. Background Art

[0002] At present, when conducting the acceptance test of 10kV high-voltage switchgear, it is necessary to conduct a contact resistance test on the vacuum circuit breaker in the high-voltage switchgear in the closed state. By detecting the contact resistance, problems such as poor contact can be discovered, thereby reducing energy loss during power transmission and improving power transmission efficiency.

[0003] However, the prior art only tests the contact resistance of the vacuum circuit breaker in the closed state, and the test data of the contact resistance cannot cover the entire conductive circuit, so it is impossible to confirm the quality of the contact resistance of the entire conductive circuit in the high-voltage switch cabinet. Summary of the invention

[0004] In view of the shortcomings of the prior art, the purpose of the present invention is to provide a contact resistance testing method for a high-voltage switch cabinet, which has the advantage of being able to confirm the quality of the contact resistance of the entire conductive circuit in the high-voltage switch cabinet, ensuring the accuracy of the overall contact resistance and the stability of the conductive performance, and effectively avoiding the hidden dangers of heat and greater power supply failures caused by poor contact at the connections of the main circuits during operation.

[0005] The above-mentioned invention object of the present invention is achieved through the following technical scheme: A method for testing the contact resistance of a high-voltage switch cabinet comprises the following steps:

[0006] Use a high-voltage megohmmeter to perform insulation tests on the A-phase conductive circuit, the B-phase conductive circuit, and the C-phase conductive circuit respectively;

[0007] A loop resistance tester is used to test the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B, and the overall conductive loop resistance of phase C respectively;

[0008] The test data obtained by testing the overall conductive loop resistance of the phase A, the overall conductive loop resistance of the phase B, and the overall conductive loop resistance of the phase C are compared. If there is no difference, the contact is good.

[0009] Preferably, the method for testing the contact resistance of a high-voltage switch cabinet provided by the present invention, wherein the insulation test is performed on the A-phase conductive circuit, the B-phase conductive circuit, and the C-phase conductive circuit respectively using a high-voltage megohmmeter, comprises:

[0010] The high-voltage megohmmeter is used to perform insulation test on the A-phase conductive loop, wherein the BC phases are grounded;

[0011] After the test, record the insulation data of the A-phase conductive circuit and fully discharge it;

[0012] Insulation tests are performed on the B-phase conductive circuit and the C-phase conductive circuit respectively in the same manner as the insulation test is performed on the A-phase conductive circuit, and insulation test data of the B-phase and C-phase conductive circuits are recorded.

[0013] Preferably, the method for testing the contact resistance of a high-voltage switch cabinet provided by the present invention uses a loop resistance tester to test the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B, and the overall conductive loop resistance of phase C respectively, including:

[0014] The loop resistance tester is used to test the overall conductive loop resistance of phase A;

[0015] After the test is completed, record the overall conductive loop resistance data of phase A;

[0016] The overall conductive loop resistance of phase B and the overall conductive loop resistance of phase C are tested in the same manner as the overall conductive loop resistance of phase A, and the overall conductive loop resistance data of phases B and C are recorded.

[0017] Preferably, the method for testing the contact resistance of a high-voltage switch cabinet provided by the present invention, wherein the loop resistance tester is used to test the overall conductive loop resistance of phase A, comprises:

[0018] One test wire clamp of the loop resistance tester is fixed to the A-phase main bus side of the main bus compartment, and the other test wire clamp of the loop resistance tester is fixed to the A-phase outgoing copper bus side of the high-voltage outgoing line compartment. Turn on the loop resistance tester and perform a conductive loop test on the overall conductive loop resistance of phase A.

[0019] Preferably, the high-voltage switchgear contact resistance testing method provided by the present invention and the conductive circuit testing method of the overall conductive circuit resistance of the three-phase ABC can measure the contact resistance of the main busbar bolt fastening point, the engagement of the moving contact of the vacuum circuit breaker and the static contact in the high-voltage switchgear, the main circuit contact inside the vacuum circuit breaker, the primary side fastening bolts of the current transformer, and the sum of the DC resistance of the primary side of the current transformer.

[0020] Preferably, the method for testing the contact resistance of a high-voltage switch cabinet provided by the present invention, wherein the test data obtained by testing the overall conductive loop resistance of the phase A, the overall conductive loop resistance of the phase B, and the overall conductive loop resistance of the phase C are compared, comprises:

[0021] The contact resistance of the three phases ABC of the vacuum circuit breaker is tested by the loop resistance tester to obtain the contact resistance data of the three phases ABC of the vacuum circuit breaker. By comparing the contact resistance data of the three phases ABC of the vacuum circuit breaker, there is no significant difference between the three phases and there is no significant difference compared with the factory data.

[0022] The DC resistance tester is used to test the primary DC resistance of the ABC three-phase current transformer, and the primary DC resistance data of the ABC three-phase current transformer is obtained. Compared with the primary DC resistance data of the ABC three-phase current transformer, there is no significant difference between the three phases and there is no significant difference compared with the factory data;

[0023] The measured overall conductive circuit resistance data of each phase were compared with each other, and there was no significant difference. The overall conductive circuit resistance of each phase was subtracted from the contact resistance of the vacuum circuit breaker of that phase and the primary DC resistance of the current transformer to obtain the resistance data. The resistance data of the three phases were compared, and there was no significant difference.

[0024] Preferably, the high-voltage switchgear contact resistance testing method provided by the present invention, after comparing the test data obtained from the tests on the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B and the overall conductive loop resistance of phase C, and if there is no difference, the contact is good, also includes: opening the vacuum circuit breaker and pushing it to the test position, and switching the grounding knife switch of the high-voltage switchgear to the grounding closed position.

[0025] Preferably, the high-voltage switch cabinet contact resistance testing method provided by the present invention, before using a high-voltage megohmmeter to perform insulation tests on the A-phase conductive circuit, the B-phase conductive circuit and the C-phase conductive circuit respectively, also includes: switching the grounding knife switch of the high-voltage switch cabinet to the grounding disconnect position, pushing the vacuum circuit breaker trolley into the working position, and closing the vacuum circuit breaker.

[0026] In summary, the beneficial technical effects of the present invention are as follows: the contact resistance testing method of the high-voltage switch cabinet provided in the present application comprises the following steps: using a high-voltage megohmmeter to perform insulation tests on the conductive circuit of phase A, the conductive circuit of phase B and the conductive circuit of phase C respectively; using a loop resistance tester to test the overall conductive circuit resistance of phase A, the overall conductive circuit resistance of phase B and the overall conductive circuit resistance of phase C respectively; comparing the test data obtained from the tests of the overall conductive circuit resistance of phase A, the overall conductive circuit resistance of phase B and the overall conductive circuit resistance of phase C, if there is no difference, the contact is good; by measuring the overall conductive circuit resistance of the high-voltage switch cabinet, in addition to detecting the contact resistance of the vacuum circuit breaker, the various connections of the overall conductive circuit, the bolt fastening points and the bite contact between the vacuum circuit breaker and the moving and static contacts of the busbar are also tested, thereby improving the accuracy of the overall conductive circuit resistance test of the high-voltage switch cabinet and the stability of the operation process, and effectively avoiding the heating hazards and greater power supply failures caused by poor contact at the main circuit connections during operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a flow chart of a high-voltage switch cabinet contact resistance testing method provided by an embodiment of the present invention.

[0028] Figure 2 It is a structural schematic diagram of the insulation resistance test process in the high-voltage switch cabinet contact resistance test method provided by an embodiment of the present invention.

[0029] Figure 3 It is a structural schematic diagram of a conductive loop resistance testing process in a high-voltage switch cabinet contact resistance testing method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0030] The present invention is further described in detail below in conjunction with the accompanying drawings.

[0031] Reference Figures 1 to 3 , which is a high-voltage switch cabinet contact resistance testing method disclosed in the present invention. It should be noted that the testing method can test the contact resistance of 10kV high-voltage switch cabinets, and can also test the contact resistance of high-voltage switch cabinets of other specifications. This embodiment does not limit this.

[0032] For ease of description, the following takes the test of the contact resistance of a 10kV high-voltage switchgear as an example for explanation.

[0033] The high-voltage switch cabinet contact resistance testing method comprises the following steps:

[0034] S101. Use a high-voltage megohmmeter to perform insulation tests on the A-phase conductive circuit, the B-phase conductive circuit, and the C-phase conductive circuit respectively.

[0035] The high-voltage megohmmeter may be a 2500V high-voltage megohmmeter. Of course, the high-voltage megohmmeter may also be of other specifications, which is not limited in this embodiment.

[0036] Among them, Figure 2 As shown, S101 uses a high-voltage megohmmeter to perform insulation tests on the A-phase conductive circuit, the B-phase conductive circuit, and the C-phase conductive circuit, including:

[0037] S1011. Use a high-voltage megohmmeter to perform insulation test on the A-phase conductive circuit, where phases BC are grounded, to test the phase-to-phase insulation of phase A to phase BC and the insulation of phase A to ground.

[0038] Specifically, use a 2500V high-voltage megohmmeter to perform insulation testing on the A-phase conductive circuit in the high-voltage switch cabinet. During the test, phases BC must be reliably grounded.

[0039] S1012. After the test, record the insulation data of the A-phase conductive circuit and fully discharge it.

[0040] S1013. Perform insulation tests on the B-phase conductive circuit and the C-phase conductive circuit respectively in the same manner as the insulation test on the A-phase conductive circuit, and record the insulation test data of the B-phase and C-phase conductive circuits.

[0041] It should be noted that the insulation resistance of each phase should meet the relevant requirements of the "Electrical Equipment Acceptance Test Standard GB50150-2016 for Electrical Installation Engineering".

[0042] Among them, in this embodiment, before S101, using a high-voltage megohmmeter to perform insulation tests on the A-phase conductive circuit, the B-phase conductive circuit and the C-phase conductive circuit respectively, it also includes: switching the grounding knife switch of the high-voltage switch cabinet to the "grounding disconnect" position, pushing the vacuum circuit breaker trolley into the "working position", and closing the vacuum circuit breaker.

[0043] S102. Use a loop resistance tester to test the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B, and the overall conductive loop resistance of phase C respectively.

[0044] Among them, S102, the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B and the overall conductive loop resistance of phase C are tested respectively using a loop resistance tester, including

[0045] S1021. Use a loop resistance tester to test the overall conductive loop resistance of phase A.

[0046] Specifically, Figure 3 As shown, a loop resistance tester is used to test the overall conductive loop resistance of phase A, including: one test wire clamp of the loop resistance tester is fixed to the main bus side of phase A in the main bus compartment, and the other test wire clamp of the loop resistance tester is fixed to the copper bus side of phase A in the high-voltage outlet compartment. The loop resistance tester is turned on to perform a conductive loop test on the overall conductive loop resistance of phase A.

[0047] S1022. After the test is completed, record the overall conductive loop resistance data of phase A.

[0048] S1023. Test the overall conductive loop resistance of phase B and the overall conductive loop resistance of phase C respectively in the same manner as the overall conductive loop resistance of phase A, and record the overall conductive loop resistance data of phases B and C.

[0049] Among them, in this embodiment, the conductive circuit test method of the overall conductive circuit resistance of the three-phase ABC can measure the contact resistance of the main busbar bolt fastening point, the engagement of the moving contact of the vacuum circuit breaker and the static contact in the high-voltage switch cabinet, the main circuit contact inside the vacuum circuit breaker, the primary side fastening bolt of the current transformer, and the sum of the DC resistance of the primary side of the current transformer; thereby, the accuracy of the overall contact resistance and the stability of the conductive performance are guaranteed, and the heating hazards and greater power supply failures caused by poor contact at the main circuit connections during operation are effectively avoided.

[0050] S103, comparing the test data obtained from the overall conductive loop resistance test of phase A, the overall conductive loop resistance of phase B, and the overall conductive loop resistance of phase C. If there is no difference in the test data of each phase, the contact is good.

[0051] Among them, S103, comparing the test data obtained by testing the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B, and the overall conductive loop resistance of phase C, including:

[0052] S1031. Use a loop resistance tester to test the contact resistance of the three phases ABC of the vacuum circuit breaker to obtain the contact resistance data of the three phases ABC of the vacuum circuit breaker. Comparing the contact resistance data of the three phases ABC of the vacuum circuit breaker, there is no significant difference between the three phases and there is no significant difference compared with the factory data.

[0053] S1032. Use a DC resistance tester to test the primary side DC resistance of the ABC three-phase current transformer to obtain the primary side DC resistance data of the ABC three-phase current transformer. Comparing the primary side DC resistance data of the ABC three-phase current transformer, there is no significant difference between the three phases and there is no significant difference compared with the factory data.

[0054] S1033. The measured resistance data of the overall conductive circuit of each phase were compared with each other, and there was no significant difference. The resistance data was obtained by subtracting the contact resistance of the vacuum circuit breaker of each phase and the primary DC resistance of the current transformer from the overall conductive circuit resistance of each phase. The resistance data of the three phases were compared, and there was no significant difference.

[0055] Among them, in this embodiment, after S103, the test data obtained from the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B and the overall conductive loop resistance of phase C are compared, and if there is no difference, the contact is good, it also includes: opening the vacuum circuit breaker and pushing it to the test position, and switching the grounding knife switch of the high-voltage switch cabinet to the grounding closed position.

[0056] The present application provides a method for testing the contact resistance of a high-voltage switch cabinet, comprising the following steps: using a high-voltage megohmmeter to perform insulation tests on a phase A conductive circuit, a phase B conductive circuit, and a phase C conductive circuit respectively; using a circuit resistance tester to test the overall conductive circuit resistance of phase A, the overall conductive circuit resistance of phase B, and the overall conductive circuit resistance of phase C respectively; comparing the test data obtained from the tests of the overall conductive circuit resistance of phase A, the overall conductive circuit resistance of phase B, and the overall conductive circuit resistance of phase C, and if there is no difference, the contact is good; by measuring the overall conductive circuit resistance of the high-voltage switch cabinet, in addition to detecting the contact resistance of the vacuum circuit breaker, the connection points of the overall conductive circuit, the bolt fastening points, and the bite contact between the vacuum circuit breaker and the moving and static contacts of the busbar are also tested, thereby improving the accuracy of the overall conductive circuit resistance test of the high-voltage switch cabinet and the stability of the operation process, and effectively avoiding the heating hazards and greater power supply failures caused by poor contact at the main circuit connections during operation.

[0057] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the statement "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0058] Finally, it should be noted that: Obviously, the above embodiments are only examples for clearly explaining the present invention, and are not intended to limit the implementation methods. For ordinary technicians in the relevant field, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation methods here. The obvious changes or modifications derived from this are still within the scope of protection of the present invention.

Claims

1. A method for testing contact resistance of a high-voltage switch cabinet, characterized in that: The steps include: Use a high-voltage megohmmeter to perform insulation tests on the A-phase conductive circuit, the B-phase conductive circuit, and the C-phase conductive circuit respectively; A loop resistance tester is used to test the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B, and the overall conductive loop resistance of phase C respectively; The test data obtained by testing the overall conductive loop resistance of the phase A, the overall conductive loop resistance of the phase B, and the overall conductive loop resistance of the phase C are compared. If there is no difference, the contact is good.

2. The method for testing contact resistance of a high-voltage switch cabinet according to claim 1, characterized in that: The use of a high-voltage megohmmeter to perform insulation tests on the A-phase conductive circuit, the B-phase conductive circuit, and the C-phase conductive circuit respectively includes: The high-voltage megohmmeter is used to perform insulation test on the A-phase conductive loop, wherein the BC phases are grounded; After the test, record the insulation data of the A-phase conductive circuit and fully discharge it; Insulation tests are performed on the B-phase conductive circuit and the C-phase conductive circuit respectively in the same manner as the insulation test is performed on the A-phase conductive circuit, and insulation test data of the B-phase and C-phase conductive circuits are recorded.

3. The method for testing contact resistance of a high-voltage switch cabinet according to claim 1, characterized in that: The loop resistance tester is used to test the overall conductive loop resistance of phase A, the overall conductive loop resistance of phase B and the overall conductive loop resistance of phase C respectively, including The loop resistance tester is used to test the overall conductive loop resistance of phase A; After the test is completed, record the overall conductive loop resistance data of phase A; The overall conductive loop resistance of phase B and the overall conductive loop resistance of phase C are tested in the same manner as the overall conductive loop resistance of phase A, and the overall conductive loop resistance data of phases B and C are recorded.

4. The method for testing contact resistance of a high-voltage switch cabinet according to claim 3, characterized in that: The method of using the loop resistance tester to test the overall conductive loop resistance of phase A includes: One test wire clamp of the loop resistance tester is fixed to the A-phase main bus side of the main bus compartment, and the other test wire clamp of the loop resistance tester is fixed to the A-phase outgoing copper bus side of the high-voltage outgoing line compartment. Turn on the loop resistance tester and perform a conductive loop test on the overall conductive loop resistance of phase A.

5. The method for testing contact resistance of a high-voltage switch cabinet according to claim 4, characterized in that: The conductive circuit test method of the overall conductive circuit resistance of the ABC three-phase can measure the contact resistance of the main busbar bolt fastening point, the moving contact of the vacuum circuit breaker and the static contact engagement in the high-voltage switch cabinet, the main circuit contact inside the vacuum circuit breaker, the primary side fastening bolts of the current transformer, and the sum of the primary side DC resistance of the current transformer.

6. The method for testing contact resistance of a high-voltage switch cabinet according to claim 1, characterized in that: The comparison of the test data obtained from the tests of the overall conductive loop resistance of the phase A, the overall conductive loop resistance of the phase B, and the overall conductive loop resistance of the phase C includes: The contact resistance of the three phases ABC of the vacuum circuit breaker is tested by the loop resistance tester to obtain the contact resistance data of the three phases ABC of the vacuum circuit breaker. By comparing the contact resistance data of the three phases ABC of the vacuum circuit breaker, there is no significant difference between the three phases and there is no significant difference compared with the factory data. The DC resistance tester is used to test the primary DC resistance of the ABC three-phase current transformer, and the primary DC resistance data of the ABC three-phase current transformer is obtained. Compared with the primary DC resistance data of the ABC three-phase current transformer, there is no significant difference between the three phases and there is no significant difference compared with the factory data; The measured overall conductive circuit resistance data of each phase were compared with each other, and there was no significant difference. The overall conductive circuit resistance of each phase was subtracted from the contact resistance of the vacuum circuit breaker of that phase and the primary DC resistance of the current transformer to obtain the resistance data. The resistance data of the three phases were compared, and there was no significant difference.

7. The method for testing contact resistance of a high-voltage switch cabinet according to claim 1, characterized in that: After comparing the test data obtained from the overall conductive loop resistance of the phase A, the overall conductive loop resistance of the phase B, and the overall conductive loop resistance of the phase C, if there is no difference, the contact is good, the method further includes: The vacuum circuit breaker is opened and pushed to the test position, and the grounding knife switch of the high-voltage switch cabinet is switched to the grounding closed position.

8. The method for testing contact resistance of a high-voltage switch cabinet according to claim 1, characterized in that: Before the high-voltage megohmmeter is used to perform insulation tests on the A-phase conductive circuit, the B-phase conductive circuit, and the C-phase conductive circuit respectively, the method further includes: Switch the grounding knife switch of the high-voltage switch cabinet to the grounding disconnect position, push the vacuum circuit breaker trolley into the working position, and close the vacuum circuit breaker.