Transient electromagnetic response correction method, device, electronic device and readable storage medium

By calculating the correction coefficient and correcting the response in the large fixed source transient electromagnetic frame to the center point, the response distortion problem caused by uneven field distribution is solved, and the spatial consistency and reliability of transient electromagnetic data are achieved.

CN119644447BActive Publication Date: 2025-05-16INST OF GEOPHYSICAL & GEOCHEMICAL EXPLORATION CHINESE ACAD OF GEOLOGICAL SCI
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Patent Information

Application Number
CN202510169248.9
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-02-17
Publication Date
2025-05-16
Estimated Expiration
2045-02-17

AI Technical Summary

Technical Problem

The field distribution in the large fixed source transient electromagnetic frame is uneven, resulting in response distortion caused by the offset distance of the measurement point, causing data inconsistency, making it difficult to conduct accurate response analysis and abnormal positioning.

Method used

By calculating the correction coefficients for obtaining the transient electromagnetic responses at different measurement points, these correction coefficients are used to correct the in-frame response to the center point, eliminating the response distortion caused by the measurement point offset.

Benefits of technology

It has achieved the elimination of data inconsistency between measurement points caused by transient electromagnetic field inhomogeneity, and provided reliable and spatially consistent data for transient electromagnetic response analysis.

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Abstract

The present invention provides a transient electromagnetic response correction method, device, electronic device and readable storage medium, which are applied to a large fixed source transient electromagnetic frame response correction system, and relate to the field of electromagnetic detection technology. The method includes: obtaining transient electromagnetic measured response data, constructing a background resistivity sequence, then determining the response data of the background resistivity model, and further determining the deviation sequence; determining the correction coefficient based on the transient electromagnetic measured response data and the resistivity model corresponding to the minimum deviation value in the deviation sequence; correcting the transient electromagnetic measured response data; obtaining the correction coefficient of the transient electromagnetic response at different measuring point positions by calculation, and using the correction coefficient to correct the frame response to the center point, eliminating the response distortion caused by the measuring point offset, solving the problem of inconsistent data between measuring points caused by the inhomogeneity of the transient electromagnetic field, and providing reliable transient electromagnetic data with spatial consistency for transient electromagnetic response analysis and subsequent quantitative interpretation.
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Description

Technical Field

[0001] The present invention relates to the field of electromagnetic detection technology, and in particular to a transient electromagnetic response correction method, device, electronic equipment and readable storage medium. Background Art

[0002] Large fixed source transient electromagnetic is a commonly used device in transient electromagnetic detection. This device generally lays a large transmitting loop on the ground, feeds transient current into the transmitting loop, and conducts transient electromagnetic measurements inside or outside the transmitting loop frame.

[0003] Although the field distribution in the large fixed source transient electromagnetic frame is relatively uniform, it still changes with the offset distance from the center of the transmitting frame. This change may mask or amplify the abnormal response, causing difficulties in response analysis and abnormal location. Although the global apparent resistivity definition and inversion technology can handle the impact of this offset distance, it naturally has transitional effects and multiple solutions, and cannot fully and faithfully reflect all the information of the original response. Summary of the invention

[0004] The purpose of the present invention is to provide a transient electromagnetic response correction method, device, electronic device and readable storage medium, which obtains the correction coefficient of the transient electromagnetic response at different measuring point positions by calculation, uses the correction coefficient to correct the response within the frame to the center point, eliminates the response distortion caused by the measuring point offset, solves the problem of inconsistent data between measuring points caused by the transient electromagnetic field inhomogeneity, and provides reliable transient electromagnetic data with spatial consistency for transient electromagnetic response analysis and subsequent quantitative interpretation.

[0005] In a first aspect, the present invention provides a transient electromagnetic response correction method, which is applied to a large fixed source transient electromagnetic frame response correction system, and the method comprises:

[0006] Acquire transient electromagnetic measured response data in the working area; wherein the transient electromagnetic measured response data includes transient electromagnetic response vectors of multiple measuring points; the transient electromagnetic response vectors include transient electromagnetic response values ​​corresponding to multiple time channels;

[0007] Constructing a background resistivity sequence within a preset resistivity range; wherein the background resistivity sequence includes a plurality of background resistivities;

[0008] Determine the background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence;

[0009] Determine the deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data;

[0010] Determine the target background resistivity model corresponding to the minimum deviation value in the deviation sequence;

[0011] Determine the correction coefficient based on transient electromagnetic measured response data and target background resistivity model;

[0012] The transient electromagnetic measured response data is corrected based on the correction coefficient to obtain the corrected transient electromagnetic measured response data.

[0013] In some preferred embodiments of the present invention, the step of constructing a background resistivity sequence within a preset resistivity range includes:

[0014] A background resistivity sequence is constructed in a preset resistivity range at logarithmic intervals.

[0015] In some preferred embodiments of the present invention, the step of determining the background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence includes: determining the background resistivity model response data by the following formula:

[0016] ;

[0017] in, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model. The superscript b indicates that this data is the response data of the background resistivity model. F() is the transient electromagnetic response function. is the position of the i-th measuring point, is the jth time channel, is the resistivity of the kth background resistivity model.

[0018] In some preferred embodiments of the present invention, the step of determining the deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data includes: determining the deviation value of the background resistivity model response data and the transient electromagnetic measured response data by the following formula:

[0019] ;

[0020] in, is the transient electromagnetic response value of the jth time channel at the ith measuring point, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model. The superscript b indicates that this data is the response data of the background resistivity model. is the deviation value of the i-th measuring point under the k-th background resistivity model.

[0021] In some preferred embodiments of the present invention, the step of determining the correction coefficient based on the transient electromagnetic measured response data and the target background resistivity model includes: determining the correction coefficient by the following formula:

[0022] ;

[0023] in, is the correction coefficient, F() is the transient electromagnetic response function, O is the position of the central measuring point, is the position of the i-th measuring point, is the jth time channel, is the resistivity of the target background resistivity model.

[0024] In some preferred embodiments of the present invention, the transient electromagnetic response function is constrained by an electric dipole transient electromagnetic response analytical solution and a dipole superposition method.

[0025] In a second aspect, the present invention provides a transient electromagnetic response correction device, which is applied to a large fixed source transient electromagnetic frame response correction system, and the device includes:

[0026] The measured response data determination module is used to obtain transient electromagnetic measured response data in the working area; wherein the transient electromagnetic measured response data includes transient electromagnetic response vectors of multiple measuring points; the transient electromagnetic response vectors include transient electromagnetic response values ​​corresponding to multiple time channels;

[0027] A background resistivity sequence determination module is used to construct a background resistivity sequence within a preset resistivity range; wherein the background resistivity sequence includes a plurality of background resistivities;

[0028] A background resistivity model response data determination module, used to determine background resistivity model response data based on transient electromagnetic measured response data and background resistivity sequence;

[0029] A deviation sequence determination module is used to determine the deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data;

[0030] A target background resistivity model determination module is used to determine the target background resistivity model corresponding to the minimum deviation value in the deviation sequence;

[0031] A correction coefficient determination module, used to determine the correction coefficient based on transient electromagnetic measured response data and a target background resistivity model;

[0032] The data correction module is used to correct the transient electromagnetic measured response data based on the correction coefficient to obtain the corrected transient electromagnetic measured response data.

[0033] In some preferred embodiments of the present invention, the background resistivity sequence determination module is used to construct a background resistivity sequence in a preset resistivity range at logarithmic equal intervals.

[0034] In a third aspect, the present invention provides an electronic device including a processor and a memory, wherein the memory stores computer executable instructions that can be executed by the processor, and the processor executes the computer executable instructions to implement the transient electromagnetic response correction method provided in the first aspect.

[0035] In a fourth aspect, the present invention provides a readable storage medium, which stores computer-executable instructions. When the computer-executable instructions are called and executed by a processor, the computer-executable instructions prompt the processor to implement the transient electromagnetic response correction method provided in the first aspect.

[0036] The present invention brings the following beneficial effects:

[0037] The present invention provides a transient electromagnetic response correction method, device, electronic device and readable storage medium, which are applied to a large fixed source transient electromagnetic frame response correction system. The method comprises: obtaining transient electromagnetic measured response data in a working area; wherein the transient electromagnetic measured response data comprises transient electromagnetic response vectors of multiple measuring points; the transient electromagnetic response vector comprises transient electromagnetic response values ​​corresponding to multiple time channels; constructing a background resistivity sequence within a preset resistivity range; wherein the background resistivity sequence comprises multiple background resistivities; determining background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence; and determining background resistivity model response data based on the background resistivity model response data and the transient electromagnetic measured response data. The deviation sequence is determined based on the measured response data; the target background resistivity model corresponding to the minimum deviation value in the deviation sequence is determined; the correction coefficient is determined based on the transient electromagnetic measured response data and the target background resistivity model; the transient electromagnetic measured response data is corrected based on the correction coefficient to obtain the corrected transient electromagnetic measured response data; the correction coefficient of the transient electromagnetic response at different measuring points is obtained by calculation, and the response in the frame is corrected to the center point using the correction coefficient to eliminate the response distortion caused by the offset distance of the measuring point, solve the problem of inconsistent data between measuring points caused by the inhomogeneity of the transient electromagnetic field, and provide reliable and spatially consistent transient electromagnetic data for transient electromagnetic response analysis and subsequent quantitative interpretation. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0039] Figure 1 A flowchart of a transient electromagnetic response correction method provided by an embodiment of the present invention;

[0040] Figure 2A schematic diagram of the location of an underground abnormal body provided by an embodiment of the present invention;

[0041] Figure 3 A schematic diagram of the response plane contour lines within a transient electromagnetic source-fixed loop frame provided by an embodiment of the present invention;

[0042] Figure 4 A schematic diagram of a uniformity correction coefficient provided by an embodiment of the present invention;

[0043] Figure 5 A schematic diagram of a corrected transient electromagnetic response plane contour line provided by an embodiment of the present invention;

[0044] Figure 6 A schematic structural diagram of a transient electromagnetic response correction device provided by an embodiment of the present invention;

[0045] Figure 7 A schematic diagram of the structure of an electronic device provided by an embodiment of the present invention.

[0046] Icons: 310 - measured response data determination module; 320 - background resistivity sequence determination module; 330 - background resistivity model response data determination module; 340 - deviation sequence determination module; 350 - target background resistivity model determination module; 360 - correction coefficient determination module; 370 - data correction module; 400 - memory; 401 - processor; 402 - bus; 403 - communication interface. DETAILED DESCRIPTION

[0047] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0048] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0049] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0050] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inside", "outside", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or the positions or positional relationships in which the product of the invention is usually placed when in use. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific position, be constructed and operated in a specific position, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0051] In addition, the terms "horizontal", "vertical", "overhanging" and the like do not mean that the components are required to be absolutely horizontal or overhanging, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0052] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0053] Transient Electromagnetic Method (TEM) is a geophysical exploration technology that is mainly used to detect the electrical characteristics of underground materials. Its basic principle is based on the electromagnetic induction phenomenon. It generates a changing electromagnetic field by emitting transient currents, and then analyzes the reflected or transmitted electromagnetic signals to obtain electrical information of underground media. The main feature of the transient electromagnetic method is that it can detect underground structures at different depths and sensitively identify changes in conductivity. With its sensitivity and efficiency, the transient electromagnetic method plays an important role in many fields such as resource exploration, water resource exploration, archaeology, environmental protection and engineering construction. With the continuous development of technology, its application scope and accuracy are expected to be further improved.

[0054] Large fixed source transient electromagnetic is a commonly used device in transient electromagnetic detection. This device generally lays a large transmitting loop on the ground, feeds a transient current into the transmitting loop, and conducts transient electromagnetic measurement inside or outside the transmitting loop wire frame. The response measured inside the transmitting loop is called the in-frame response, and the response measured outside the transmitting loop is called the out-frame response. The in-frame response is widely used in practical applications because of its simple response form and intuitive response to underground abnormal bodies. Compared with the central loop device, the large fixed source transient electromagnetic in-frame measurement method has the advantages of no need to repeatedly lay out the transmitting source, adapt to complex geological conditions, fast acquisition speed, and low cost, and has important application prospects in transient electromagnetic detection. However, there are also certain problems and limitations: although the field distribution in the large fixed source transient electromagnetic frame is relatively uniform, it still changes with the offset distance from the center of the transmitting frame. This change may mask or amplify the abnormal response, causing difficulties in response analysis and abnormal location. Although the global apparent resistivity definition and inversion technology can handle the impact of this offset, it naturally has transition effects and multiple solutions and cannot fully and faithfully reflect all the information of the original response.

[0055] The purpose of the present invention is to provide a transient electromagnetic response correction method, which obtains the correction coefficient of the transient electromagnetic response at different measuring point positions by calculation, uses the correction coefficient to correct the response in the frame to the center point, eliminates the response distortion caused by the measuring point offset, solves the problem of inconsistent data between measuring points caused by the transient electromagnetic field inhomogeneity, and provides reliable transient electromagnetic data with spatial consistency for transient electromagnetic response analysis and subsequent quantitative interpretation.

[0056] Some embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0057] Embodiment 1

[0058] The present invention provides a transient electromagnetic response correction method, which is applied to a large fixed source transient electromagnetic frame response correction system, see Figure 1 The flowchart of a transient electromagnetic response correction method provided by an embodiment of the present invention is shown, and the method includes:

[0059] Step S102, obtaining transient electromagnetic measured response data in the working area; wherein the transient electromagnetic measured response data includes transient electromagnetic response vectors of multiple measuring points; and the transient electromagnetic response vectors include transient electromagnetic response values ​​corresponding to multiple time channels.

[0060] Specifically, prepare all measurement points in the work area to Transient electromagnetic measured response data Where m is the number of measurement points, is the position of the i-th measuring point, , is the transient electromagnetic response vector of the i-th measuring point, n is the number of time channels for each measuring point, is the i-th measuring point The jth time channel The transient electromagnetic response value.

[0061] For example, see Figure 2 The schematic diagram of the location of an underground anomaly provided by an embodiment of the present invention is shown. For the anomaly buried underground, the background resistivity of the earth is 100Ω·m, the geometric size of the anomaly is 100m×100m×30m, the center is located at (-100m, -100m, -100m), and the resistivity is 10Ω·m. A transmitting loop with a side length of 600m×600m, a transmitting current of 18 amperes, and a falling edge of 10μs are used. According to the measurement method within the large fixed source loop frame, the measurement is completed with a point spacing and line spacing of 25 meters, and the response plane contour map at the 10th time channel t=0.5ms is drawn, see Figure 3 The schematic diagram of the response plane contour lines within a transient electromagnetic source fixed loop frame provided by an embodiment of the present invention is shown. It can be seen that, affected by the offset distance, the response contour line diagram is obviously inconsistent with the position of the anomaly, and the center point of the anomaly is located at approximately (30m, 30m), which deviates greatly from the actual model.

[0062] Step S104, constructing a background resistivity sequence within a preset resistivity range; wherein the background resistivity sequence includes a plurality of background resistivities.

[0063] Specifically, background resistivity refers to the resistivity of the underground medium. The principles for constructing background resistivity sequences within a preset resistivity range generally include: Logarithmic equal interval principle: constructing a sequence by selecting resistivity values ​​at equal intervals on a logarithmic scale. This method is particularly suitable for situations where the resistivity variation range is large, because it can keep each resistivity value at the same interval on a logarithmic scale, thereby better reflecting the resistivity variation trend; Linear equal interval principle: selecting resistivity values ​​at equal intervals on a linear scale. This method is suitable for situations where the resistivity variation range is relatively small, or when it is desired to maintain uniform resolution throughout the resistivity range; Geometric equal interval principle: constructing a sequence by selecting resistivity values ​​at equal intervals on a geometric scale. This method is between linear equal interval and logarithmic equal interval, and is suitable for situations where the resistivity variation range is moderate and it is desired to maintain a certain geometric ratio throughout the range; Custom interval principle: customize the interval of the resistivity sequence according to specific application requirements and data characteristics. For example, in some specific geological exploration or scientific research, it may be necessary to customize the resistivity sequence based on known geological conditions, rock types, or electromagnetic properties.

[0064] In some preferred embodiments of the present invention, the step of constructing a background resistivity sequence within a preset resistivity range includes: constructing a background resistivity sequence within the preset resistivity range at logarithmic equal intervals.

[0065] Specifically, a background resistivity series is constructed in the range of 0.1 to 100,000 Ω·m at logarithmic intervals. Wherein, l is the number of background resistivity, and an exemplary value of l may be 601.

[0066] Step S106, determining background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence.

[0067] Specifically, according to transient electromagnetic theory, the resistivity is taken as the kth background resistivity The uniform half space of is taken as the background model, and the responses of l background models at different measuring points and different time channels are calculated respectively.

[0068] Furthermore, in some preferred embodiments of the present invention, the step of determining the background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence includes: determining the background resistivity model response data by the following formula:

[0069] ;

[0070] in, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model. The superscript b indicates that this data is the response data of the background resistivity model. F() is the transient electromagnetic response function. is the position of the i-th measuring point, is the jth time channel, is the resistivity of the kth background resistivity model.

[0071] Furthermore, in some preferred embodiments of the present invention, the transient electromagnetic response function is constrained by an electric dipole transient electromagnetic response analytical solution and a dipole superposition method.

[0072] Step S108, determining a deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data.

[0073] Specifically, for the jth time channel , calculate the deviation between the background resistivity model response and the measured response, and form a deviation sequence .

[0074] The following methods are usually used to calculate the deviation between the background resistivity model response and the measured response:

[0075] Error analysis method: Perform error analysis on the model response data and the measured response data, and calculate the residual or standard deviation between the two to evaluate the size and distribution of the deviation. This method can provide more detailed deviation information and help to deeply understand the differences between the data.

[0076] Correlation coefficient method: By calculating the correlation coefficient between the model response data and the measured response data, the correlation between the two can be evaluated. If the correlation coefficient is close to 1, it means that the deviation between the two is small; if the correlation coefficient is small, it means that there is a large deviation between the two.

[0077] Bessel function expansion method: For the transient electromagnetic response of large loop sources, the Bessel function expansion method can be used to calculate the electromagnetic response of the vertical and horizontal components of the non-center point, so as to more accurately evaluate the deviation between the model and the measured data.

[0078] Further, in some preferred embodiments of the present invention, the step of determining the deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data includes: determining the deviation value of the background resistivity model response data and the transient electromagnetic measured response data by the following formula:

[0079] ;

[0080] in, is the transient electromagnetic response value of the jth time channel at the ith measuring point, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model. The superscript b indicates that this data is the response data of the background resistivity model. is the deviation value of the i-th measuring point under the k-th background resistivity model.

[0081] Exemplarily, the deviation sequence obtains the background resistivity model number with the smallest deviation value , the corresponding deviation value is 10.69%.

[0082] Step S110, determining the target background resistivity model corresponding to the minimum deviation value in the deviation sequence.

[0083] Specifically, the background resistivity model number with the smallest deviation value is obtained according to the deviation sequence. .

[0084] Step S112, determining a correction coefficient based on the transient electromagnetic measured response data and the target background resistivity model.

[0085] For details, see Figure 4The schematic diagram of a homogenization correction coefficient provided by an embodiment of the present invention is shown. In some preferred embodiments of the present invention, the step of determining the correction coefficient based on the transient electromagnetic measured response data and the target background resistivity model includes: determining the correction coefficient by the following formula:

[0086] ;

[0087] in, is the correction coefficient, F() is the transient electromagnetic response function, O is the position of the central measuring point, is the position of the i-th measuring point, is the jth time channel, is the resistivity of the target background resistivity model.

[0088] In some preferred embodiments of the present invention, the transient electromagnetic response function is constrained by an electric dipole transient electromagnetic response analytical solution and a dipole superposition method.

[0089] Step S114, correcting the transient electromagnetic measured response data based on the correction coefficient to obtain corrected transient electromagnetic measured response data.

[0090] Specifically, all transient electromagnetic responses on the jth time channel are corrected using a correction coefficient, and the correction formula is:

[0091] ;

[0092] in, is the corrected transient electromagnetic response value of the jth time channel at the ith measuring point. The superscript r indicates that this data is corrected data. is the correction factor, is the transient electromagnetic response value of the jth time channel at the ith measuring point.

[0093] For example, see Figure 5 The illustrated embodiment of the present invention provides a schematic diagram of a corrected transient electromagnetic response plane contour line. The corrected response contour line diagram clearly shows the position of the anomaly, and the center of the anomaly is located at approximately (-100m, -100m), which is consistent with the position of the anomaly in the real model.

[0094] The transient electromagnetic response correction method provided by the embodiment of the present invention is based on transient electromagnetic raw data, realizes the homogenization correction of the transient electromagnetic in-frame response, eliminates the response deviation caused by the measuring point offset, and the correction does not rely on prior information such as geological data and drilling data. The result is unique and the calculation speed is fast. It can play a practical role in actual detection work, and can effectively solve the problem of in-frame response distortion caused by the measuring point offset, improve the consistency of the transient electromagnetic in-frame response, and the corrected data largely eliminates the geometric position effect of the transient electromagnetic response, can directly indicate the abnormal position, and lays a good foundation for subsequent data analysis and interpretation.

[0095] The present invention provides a transient electromagnetic response correction method, which is applied to a large fixed source transient electromagnetic frame response correction system. The method comprises: obtaining transient electromagnetic measured response data in a working area; wherein the transient electromagnetic measured response data comprises transient electromagnetic response vectors of multiple measuring points; the transient electromagnetic response vector comprises transient electromagnetic response values ​​corresponding to multiple time channels; constructing a background resistivity sequence within a preset resistivity range; wherein the background resistivity sequence comprises multiple background resistivities; determining background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence; determining the background resistivity model response data based on the background resistivity model response data and the transient electromagnetic measured response data. Deviation sequence; determine the target background resistivity model corresponding to the minimum deviation value in the deviation sequence; determine the correction coefficient based on the transient electromagnetic measured response data and the target background resistivity model; correct the transient electromagnetic measured response data based on the correction coefficient to obtain the corrected transient electromagnetic measured response data; obtain the correction coefficient of the transient electromagnetic response at different measuring points by calculation, use the correction coefficient to correct the response in the frame to the center point, eliminate the response distortion caused by the measuring point offset, solve the problem of inconsistent data between measuring points caused by the inhomogeneity of the transient electromagnetic field, and provide reliable and spatially consistent transient electromagnetic data for transient electromagnetic response analysis and subsequent quantitative interpretation.

[0096] Embodiment 2

[0097] Based on the above embodiments, the present invention provides a transient electromagnetic response correction device, which is applied to a large fixed source transient electromagnetic frame response correction system. Figure 6 The structure diagram of a transient electromagnetic response correction device provided by an embodiment of the present invention is shown, and the device includes:

[0098] The measured response data determination module 310 is used to obtain transient electromagnetic measured response data in the working area; wherein the transient electromagnetic measured response data includes transient electromagnetic response vectors of multiple measuring points; the transient electromagnetic response vectors include transient electromagnetic response values ​​corresponding to multiple time channels;

[0099] A background resistivity sequence determination module 320 is used to construct a background resistivity sequence within a preset resistivity range; wherein the background resistivity sequence includes a plurality of background resistivities;

[0100] A background resistivity model response data determination module 330 is used to determine background resistivity model response data based on transient electromagnetic measured response data and background resistivity sequence;

[0101] A deviation sequence determination module 340 is used to determine a deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data;

[0102] A target background resistivity model determination module 350 is used to determine a target background resistivity model corresponding to a minimum deviation value in a deviation sequence;

[0103] A correction coefficient determination module 360 ​​is used to determine the correction coefficient based on the transient electromagnetic measured response data and the target background resistivity model;

[0104] The data correction module 370 is used to correct the transient electromagnetic measured response data based on the correction coefficient to obtain the corrected transient electromagnetic measured response data.

[0105] Furthermore, in some preferred embodiments of the present invention, the background resistivity sequence determination module 320 is used to construct a background resistivity sequence in a preset resistivity range at logarithmic equal intervals.

[0106] Furthermore, in some preferred embodiments of the present invention, the background resistivity model response data determination module 330 is used to determine the background resistivity model response data by the following formula:

[0107] ;

[0108] in, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model. The superscript b indicates that this data is the response data of the background resistivity model. F() is the transient electromagnetic response function. is the position of the i-th measuring point, is the jth time channel, is the resistivity of the kth background resistivity model.

[0109] Furthermore, in some preferred embodiments of the present invention, the deviation sequence determination module 340 is used to determine the deviation value between the background resistivity model response data and the transient electromagnetic measured response data by the following formula:

[0110] ;

[0111] in, is the transient electromagnetic response value of the jth time channel at the ith measuring point, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model. The superscript b indicates that this data is the response data of the background resistivity model. is the deviation value of the i-th measuring point under the k-th background resistivity model.

[0112] Furthermore, in some preferred embodiments of the present invention, the correction coefficient determination module 360 ​​is used to determine the correction coefficient by the following formula:

[0113] ;

[0114] in, is the correction coefficient, F() is the transient electromagnetic response function, O is the position of the central measuring point, is the position of the i-th measuring point, is the jth time channel, is the resistivity of the target background resistivity model.

[0115] Furthermore, in some preferred embodiments of the present invention, the transient electromagnetic response function is constrained by an electric dipole transient electromagnetic response analytical solution and a dipole superposition method.

[0116] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the transient electromagnetic response correction device described above can refer to the corresponding process in the aforementioned embodiment of the transient electromagnetic response correction method, and will not be repeated here.

[0117] Embodiment 3

[0118] The embodiment of the present invention also provides an electronic device for executing the transient electromagnetic response correction method; see Figure 7 The structural schematic diagram of an electronic device provided by an embodiment of the present invention is shown, and the electronic device includes a memory 400 and a processor 401, wherein the memory 400 is used to store one or more computer instructions, and the one or more computer instructions are executed by the processor 401 to implement the above-mentioned transient electromagnetic response correction method.

[0119] Further, Figure 7 The electronic device shown further includes a bus 402 and a communication interface 403 , and the processor 401 , the communication interface 403 and the memory 400 are connected via the bus 402 .

[0120] The memory 400 may include a high-speed random access memory (RAM), and may also include a non-volatile memory, such as at least one disk storage. The communication connection between the system network element and at least one other network element is realized through at least one communication interface 403 (which may be wired or wireless), and the Internet, wide area network, local area network, metropolitan area network, etc. may be used. The bus 402 may be an ISA bus, a PCI bus, or an EISA bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 7 Only one bidirectional arrow is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0121] The processor 401 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the hardware integrated logic circuit or software instructions in the processor 401. The above processor 401 can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components. The methods, steps and logic block diagrams disclosed in the embodiments of the present invention can be implemented or executed. The general processor can be a microprocessor or the processor can also be any conventional processor, etc. The steps of the method disclosed in the embodiment of the present invention can be directly embodied as a hardware decoding processor for execution, or a combination of hardware and software modules in the decoding processor for execution. The software module may be located in a storage medium mature in the art, such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc. The storage medium is located in the memory 400, and the processor 401 reads the information in the memory 400 and completes the steps of the method of the above embodiment in combination with its hardware.

[0122] An embodiment of the present invention further provides a readable storage medium, which stores computer executable instructions. When the computer executable instructions are called and executed by a processor, the computer executable instructions prompt the processor to implement the above-mentioned transient electromagnetic response correction method. The specific implementation can be found in the method embodiment, which will not be repeated here.

[0123] The computer program product of the transient electromagnetic response correction method, device and electronic device provided in the embodiments of the present invention includes a readable storage medium storing program code. The instructions included in the program code can be used to execute the method in the previous method embodiment. The specific implementation can be found in the method embodiment, which will not be repeated here.

[0124] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the system and / or device described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0125] In addition, in the description of the embodiments of the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0126] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc., which can store program codes.

[0127] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A transient electromagnetic response correction method, characterized in that: Applied to a large fixed source transient electromagnetic frame response correction system, the method comprises: Acquire transient electromagnetic measured response data in the working area; wherein the transient electromagnetic measured response data includes transient electromagnetic response vectors of multiple measuring points; the transient electromagnetic response vectors include transient electromagnetic response values ​​corresponding to multiple time channels; Constructing a background resistivity sequence within a preset resistivity range; wherein the background resistivity sequence includes a plurality of background resistivities; Determining background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence; Determining a deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data; Determine a target background resistivity model corresponding to a minimum deviation value in the deviation sequence; Determining a correction coefficient based on the transient electromagnetic measured response data and the target background resistivity model; Correcting the transient electromagnetic measured response data based on the correction coefficient to obtain the corrected transient electromagnetic measured response data; The step of determining background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence includes: determining the background resistivity model response data by the following formula: in, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model, the superscript b indicates that this data is the response data of the background resistivity model, F() is the transient electromagnetic response function, P i is the position of the i-th measuring point, t j is the jth time channel, ρ k is the resistivity of the kth background resistivity model; The step of determining the deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data comprises: determining the deviation value between the background resistivity model response data and the transient electromagnetic measured response data by the following formula: Among them, d ij is the transient electromagnetic response value of the jth time channel at the ith measuring point, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model. The superscript b indicates that this data is the response data of the background resistivity model. ij is the deviation value of the i-th measuring point under the k-th background resistivity model; The step of determining the correction coefficient based on the transient electromagnetic measured response data and the target background resistivity model includes: determining the correction coefficient by the following formula: Among them, c ij is the correction coefficient, F() is the transient electromagnetic response function, O is the position of the central measuring point, P i is the position of the i-th measuring point, t j is the jth time channel, is the resistivity of the target background resistivity model.

2. The transient electromagnetic response correction method according to claim 1, characterized in that: The steps of constructing a background resistivity sequence within a preset resistivity range include: A background resistivity sequence is constructed in a preset resistivity range at logarithmic intervals.

3. The transient electromagnetic response correction method according to claim 1, characterized in that: The transient electromagnetic response function is constrained by an electric dipole transient electromagnetic response analytical solution and a dipole superposition method.

4. A transient electromagnetic response correction device, characterized in that: Applied to a large fixed source transient electromagnetic frame response correction system, the device comprises: A measured response data determination module is used to obtain transient electromagnetic measured response data in the working area; wherein the transient electromagnetic measured response data includes transient electromagnetic response vectors of multiple measuring points; the transient electromagnetic response vectors include transient electromagnetic response values ​​corresponding to multiple time channels; A background resistivity sequence determination module is used to construct a background resistivity sequence within a preset resistivity range; wherein the background resistivity sequence includes a plurality of background resistivities; A background resistivity model response data determination module, used to determine background resistivity model response data based on the transient electromagnetic measured response data and the background resistivity sequence; A deviation sequence determination module, used to determine a deviation sequence based on the background resistivity model response data and the transient electromagnetic measured response data; A target background resistivity model determination module is used to determine the target background resistivity model corresponding to the minimum deviation value in the deviation sequence; A correction coefficient determination module, used to determine the correction coefficient based on the transient electromagnetic measured response data and the target background resistivity model; A data correction module, used for correcting the transient electromagnetic measured response data based on the correction coefficient to obtain the corrected transient electromagnetic measured response data; The background resistivity model response data determination module is used to determine the background resistivity model response data by the following formula: in, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model, the superscript b indicates that this data is the response data of the background resistivity model, F() is the transient electromagnetic response function, P i is the position of the i-th measuring point, t j is the jth time channel, ρ k is the resistivity of the kth background resistivity model; The deviation sequence determination module is used to determine the deviation value between the background resistivity model response data and the transient electromagnetic measured response data by the following formula: Among them, d ij is the transient electromagnetic response value of the jth time channel at the ith measuring point, is the response value of the jth time channel at the ith measuring point under the kth background resistivity model. The superscript b indicates that this data is the response data of the background resistivity model. ij is the deviation value of the i-th measuring point under the k-th background resistivity model; The target background resistivity model determination module is used to determine the correction coefficient by the following formula: Among them, c ij is the correction coefficient, F() is the transient electromagnetic response function, O is the position of the central measuring point, P i is the position of the i-th measuring point, t j is the jth time channel, is the resistivity of the target background resistivity model.

5. The transient electromagnetic response correction device according to claim 4, characterized in that: The background resistivity sequence determination module is used to construct a background resistivity sequence in a preset resistivity range at logarithmic equal intervals.

6. An electronic device, characterized in that: The invention comprises a processor and a memory, wherein the memory stores computer executable instructions that can be executed by the processor, and the processor executes the computer executable instructions to implement the transient electromagnetic response correction method according to any one of claims 1 to 3.

7. A readable storage medium, characterized in that: The readable storage medium stores computer executable instructions. When the computer executable instructions are called and executed by a processor, the computer executable instructions prompt the processor to implement the transient electromagnetic response correction method according to any one of claims 1 to 3.

Citation Information

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