Project evaluation method, device and equipment and storage medium

Abstract

The invention provides a project evaluation method and device, equipment and a storage medium, and the method comprises the steps: responding to a project evaluation request for a target project, and collecting the abnormal test data of the target project; determining an abnormal evaluation parameter corresponding to the abnormal test data according to the number of abnormal devices, the total sampling number and the total number of abnormal times in the abnormal test data; determining project evaluation parameters of the target project according to an abnormal state coefficient corresponding to the abnormal test data, a repair time coefficient and the abnormal evaluation parameters; and outputting a project evaluation result corresponding to the target project based on the project evaluation parameter. The quality evaluation index of the target project is systematically and automatically generated, so that the project management efficiency and accuracy are improved.

Description

Technical Field

[0001] The present application relates to the field of computer technology, and in particular to a project evaluation method, device, equipment and storage medium. Background Art

[0002] At present, in the process of project development management such as software applications, accurate assessment of project quality is an important link to ensure the successful completion of the project. The traditional project evaluation method usually uses manpower to evaluate designated projects. This project evaluation method relies on manual experience and subjective judgment, and has problems such as low project evaluation efficiency and insufficient accuracy, which seriously affects project management efficiency and cannot meet existing project management needs. Summary of the invention

[0003] The embodiments of the present application provide a project evaluation method, device, equipment and storage medium, aiming to solve the technical problems of low efficiency and insufficient accuracy of project evaluation in the prior art.

[0004] On the one hand, an embodiment of the present application provides a project evaluation method, the project evaluation method comprising the following steps:

[0005] In response to a project evaluation request for a target project, collect abnormal test data of the target project;

[0006] Determine the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0007] Determine the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data;

[0008] The project evaluation result corresponding to the target project is output based on the project evaluation parameter.

[0009] In a possible implementation of the present application, determining the abnormal evaluation parameter corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data includes:

[0010] Obtain the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0011] Calculate the abnormal rate of the item corresponding to the abnormal test data according to the number of abnormal devices and the total number of samples;

[0012] Calculate the abnormal frequency coefficient corresponding to the abnormal test data according to the number of abnormal devices and the total number of abnormalities;

[0013] An abnormality evaluation parameter corresponding to the abnormal test data is determined according to the item abnormality rate and the abnormal frequency coefficient.

[0014] In a possible implementation of the present application, determining the abnormal frequency coefficient corresponding to the abnormal test data according to the number of abnormal devices and the total number of abnormalities includes:

[0015] Calculate the average number of abnormalities according to the number of abnormal devices and the total number of abnormalities;

[0016] If the average number of abnormalities is less than a preset abnormality threshold, the first frequency coefficient is determined as the abnormal frequency coefficient corresponding to the abnormal test data;

[0017] If the average number of abnormal times is greater than or equal to the abnormal number threshold, a second frequency coefficient is calculated according to the average number of abnormal times and a preset frequency coefficient, and the second frequency coefficient is determined as the abnormal frequency coefficient corresponding to the abnormal test data.

[0018] In a possible implementation of the present application, determining the abnormality evaluation parameter corresponding to the abnormal test data according to the item abnormality rate and the abnormal frequency coefficient includes:

[0019] Obtaining the product of the item abnormality rate and the abnormal frequency coefficient to obtain an abnormal fault score corresponding to the abnormal test data;

[0020] Accessing a preset abnormality database to determine the abnormal fault type corresponding to the abnormal test data;

[0021] The abnormal evaluation parameters corresponding to the abnormal test data are determined according to the abnormal fault score and the fault evaluation threshold corresponding to the abnormal fault type, wherein the abnormal evaluation parameters include an abnormal evaluation level and an abnormal evaluation score corresponding to the abnormal evaluation level.

[0022] In a possible implementation of the present application, determining the project evaluation parameter of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data includes:

[0023] Acquire the abnormal processing status corresponding to the abnormal test data and the expected repair time of the abnormal test data;

[0024] Acquire an abnormal state coefficient corresponding to the abnormal processing state and a repair time coefficient corresponding to the expected repair time;

[0025] The project evaluation parameters of the target project are determined according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data.

[0026] In a possible implementation of the present application, the acquiring the abnormal state coefficient corresponding to the abnormal processing state and the repair time coefficient corresponding to the expected repair time includes:

[0027] Access the preset exception database to obtain the processing status and repair time of each candidate;

[0028] If the abnormal processing state is the same as the target processing state in each candidate processing state, the target state coefficient corresponding to the target processing state is determined as the abnormal state coefficient of the abnormal processing state;

[0029] If the expected repair time and the target repair time in each candidate repair time are the same, the target time coefficient corresponding to the target repair time is determined as the repair time coefficient corresponding to the expected repair time.

[0030] In a possible implementation of the present application, determining the project evaluation parameter of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data includes:

[0031] Obtaining the product of the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data to obtain the abnormal quality parameter;

[0032] The sum of the abnormal quality parameters corresponding to each abnormal test data is calculated to obtain the project evaluation parameters of the target project.

[0033] On the other hand, the present application provides a project evaluation device, the project evaluation device comprising:

[0034] A data acquisition module is configured to respond to a project evaluation request for a target project and collect abnormal test data of the target project;

[0035] An abnormality evaluation module is configured to determine an abnormality evaluation parameter corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0036] A project evaluation module, configured to determine the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data;

[0037] The evaluation output module is configured to output the project evaluation result corresponding to the target project based on the project evaluation parameters.

[0038] On the other hand, the present application also provides a project evaluation device, the project evaluation device comprising:

[0039] one or more processors;

[0040] Memory; and

[0041] One or more applications, wherein the one or more applications are stored in the memory and configured to be executed by the processor to implement the steps of the project evaluation method.

[0042] On the other hand, the present application also provides a computer-readable storage medium on which a computer program is stored, and the computer program is loaded by a processor to execute the steps in the project evaluation method.

[0043] In this application, by responding to a project evaluation request for a target project, abnormal test data of the target project is collected; the abnormal evaluation parameters corresponding to the abnormal test data are determined according to the number of abnormal devices, the total number of samples, and the total number of abnormalities in the abnormal test data; the project evaluation parameters of the target project are determined according to the abnormal state coefficient, the repair time coefficient, and the abnormal evaluation parameters corresponding to the abnormal test data; and the project evaluation results corresponding to the target project are output based on the project evaluation parameters. The abnormal test data corresponding to each project abnormality in the target project is collected, and the abnormal evaluation parameters of the abnormal test data are automatically calculated according to the abnormal parameters in the abnormal test data, and the weight coefficient is set according to the processing state and the expected processing time corresponding to the abnormal test data, and the abnormal evaluation parameters are weighted by using the weight coefficient, and the project evaluation parameters of the target project are determined according to each weighted abnormal evaluation coefficient. The quality evaluation indicators of the target project are generated systematically and automatically to improve the efficiency and accuracy of project management. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0045] Figure 1 A schematic diagram of a scenario of a project evaluation method according to an embodiment of the present application;

[0046] Figure 2 A flowchart of an embodiment of a project evaluation method in an embodiment of the present application;

[0047] Figure 3 A flow chart of an embodiment of determining an abnormal frequency coefficient in a project evaluation method provided in an embodiment of the present application;

[0048] Figure 4A flow chart of an embodiment of determining an abnormality coefficient and a repair time coefficient in a project evaluation method provided in an embodiment of the present application;

[0049] Figure 5 A schematic diagram of the structure of an embodiment of a project evaluation device provided in an embodiment of the present application;

[0050] Figure 6 A schematic diagram of the structure of an embodiment of a project evaluation device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0051] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0052] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, which are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0053] In this application, the word "exemplary" is used to mean "serving as an example, illustration, or illustration." Any embodiment described in this application as "exemplary" is not necessarily to be construed as being preferred or advantageous over other embodiments. The following description is given to enable any person skilled in the art to implement and use the invention. In the following description, details are listed for the purpose of explanation. It should be understood that a person of ordinary skill in the art can recognize that the invention can be implemented without using these specific details. In other instances, well-known structures and processes are not elaborated in detail to avoid obscuring the description of the invention with unnecessary details. Therefore, the present invention is not intended to be limited to the embodiments shown, but is consistent with the widest scope consistent with the principles and features disclosed in this application.

[0054] At present, in the process of project development management such as software applications, accurate assessment of project quality is an important link to ensure the successful completion of the project. The traditional project evaluation method usually uses manpower to evaluate designated projects. This project evaluation method relies on manual experience and subjective judgment, and has problems such as low project evaluation efficiency and insufficient accuracy, which seriously affects project management efficiency and cannot meet existing project management needs.

[0055] Based on this, the present application proposes a project evaluation method, device, equipment and computer-readable storage medium to solve the technical problems of low efficiency and insufficient accuracy of project evaluation in the prior art.

[0056] The project evaluation method in the embodiment of the present invention is applied to a project evaluation apparatus, which is arranged in a project evaluation device. The project evaluation device is provided with one or more processors, a memory, and one or more application programs, wherein the one or more application programs are stored in the memory and configured to be executed by the processor to implement the project evaluation method; wherein the project evaluation device can be an intelligent terminal, such as a mobile phone, a tablet computer, a network device, and a smart computer; optionally, the project evaluation device can also be a server, or a service cluster composed of multiple servers.

[0057] like Figure 1 As shown, Figure 1 This is a scenario diagram of the project evaluation method in the embodiment of the present application. The project evaluation scenario in the embodiment of the present invention includes a project evaluation device 100 (a project evaluation apparatus is integrated in the project evaluation device 100), and a computer-readable storage medium corresponding to the project evaluation method runs in the project evaluation device 100 to execute the steps of the project evaluation method.

[0058] Understandably, Figure 1 The project evaluation equipment in the project evaluation method scenario shown, or the devices included in the project evaluation equipment, do not constitute a limitation on the embodiments of the present invention. That is, the number of devices and types of devices in the project evaluation equipment included in the project evaluation method scenario, or the number of devices and types of devices included in each device, do not affect the overall implementation of the technical solution in the embodiments of the present invention, and can all be regarded as equivalent replacements or derivatives of the technical solution claimed to be protected by the embodiments of the present invention.

[0059] The project evaluation device 100 in the embodiment of the present invention is mainly used to: respond to a project evaluation request for a target project and collect abnormal test data of the target project;

[0060] Determine the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0061] Determine the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data;

[0062] The project evaluation result corresponding to the target project is output based on the project evaluation parameter.

[0063] The project evaluation device 100 in the embodiment of the present invention can be an independent project evaluation device, such as a smart terminal such as a mobile phone, a tablet computer, a network device, a server, and a smart computer, or it can be a project evaluation network or a project evaluation cluster composed of multiple project evaluation devices.

[0064] The embodiments of the present application provide a project evaluation method, apparatus, device, and computer-readable storage medium, which are described in detail below.

[0065] It can be understood by those skilled in the art that Figure 1 The application environment shown in is only one of the application scenarios related to the present application solution and does not constitute a limitation on the application scenario of the present application solution. Other application environments may also include Figure 1 More or fewer project evaluation devices, or project evaluation network connection relationships shown, such as Figure 1 Only one project evaluation device is shown. It can be understood that the scenario of the project evaluation method can also include one or more project evaluation devices, which is not limited here. The project evaluation device 100 can also include a memory for storing test data and other data.

[0066] It should be noted that Figure 1 The scenario diagram of the project evaluation method shown is only an example. The scenario of the project evaluation method described in the embodiment of the present invention is to more clearly illustrate the technical solution of the embodiment of the present invention, and does not constitute a limitation on the technical solution provided by the embodiment of the present invention.

[0067] Based on the scenario of the above-mentioned project evaluation method, various embodiments of the project evaluation method disclosed in the present invention are proposed.

[0068] like Figure 2 As shown, Figure 2 This is a flow chart of an embodiment of a project evaluation method in an embodiment of the present application. The project evaluation method includes the following steps 201 to 204:

[0069] 201. Responding to a project evaluation request for a target project, collecting abnormal test data of the target project;

[0070] The project evaluation method in this embodiment is applied to a project evaluation device, and the type and quantity of the project evaluation device are not specifically limited, that is, the project evaluation device can be one or more intelligent terminals or servers for project evaluation of the target project. In a specific embodiment, the project evaluation device is an intelligent computer. The target project can be a software development project to be evaluated.

[0071] Specifically, during operation, the project evaluation device can respond to a project evaluation request for a target project. The project evaluation request is an operation request that drives the project evaluation device to perform a project evaluation on the target project based on the abnormal test data of the target project. Optionally, the triggering method of the project evaluation request is not specifically limited here, that is, the project evaluation request can be actively triggered by the user. For example, the user is a developer of the target project, and actively triggers the project evaluation request by clicking a project evaluation button in the project evaluation device. In addition, the project evaluation request can also be actively triggered by the project evaluation device. For example, the project evaluation device is set up with a project evaluation process, which actively triggers the project evaluation request for the target project after obtaining the abnormal test data corresponding to the target project, thereby realizing automatic project evaluation of the target project.

[0072] Specifically, when or before obtaining a project evaluation request for a target project, the project evaluation device can collect abnormal test data of the target project through a variety of channels. For example, the project evaluation device can perform automated testing on the target project in advance to execute the test cases corresponding to the target project, and automatically capture and record the abnormal test data associated with the target project during the test process. Optionally, in other embodiments, the project evaluation device can also record abnormal test data that occurs when the user uses it by arranging a point-tracking process in the terminal corresponding to the target project. Optionally, in other embodiments, the project evaluation device can also receive abnormal test data obtained by actively testing and feedback bills of lading by users or engineers. Among them, the abnormal test data is abnormal problem data or project bug data detected by the device during the development or operation of the target project or uploaded by relevant personnel. That is, the abnormal test data is project failure data that may have a certain degree of impact on the user's development or use of the target project.

[0073] For example, in a specific embodiment, if the project evaluation device collects abnormal test data corresponding to the target project that has a significant impact on a single user and requires a long time to recover or is unrecoverable, the abnormal test data is determined as abnormal test data. For example, the abnormal test data can be project failure data such as a crash restart, abnormal startup, etc.

[0074] For example, in another specific embodiment, if the project evaluation device collects abnormal test data corresponding to the target project that has a perceptible impact on a single user but can be quickly recovered, the abnormal test data is determined as abnormal test data. For example, the abnormal test data can be project failure data such as system module and / or core module failure, application crash, and application restart.

[0075] For example, in another specific embodiment, if the project evaluation device collects abnormal test data corresponding to the target project that is imperceptible to the user and has no other impact, the abnormal test data is determined as abnormal test data.

[0076] For example, in another specific embodiment, the project evaluation device further obtains suggestion information associated with the target project proposed by the tester, and determines abnormal test data based on the suggestion information.

[0077] 202. Determine an abnormal evaluation parameter corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0078] Specifically, after obtaining the abnormal test data corresponding to the target project, the project evaluation device also determines the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data. The abnormal evaluation parameters are evaluation parameters corresponding to a certain project failure in the target project, and the abnormal evaluation parameters include abnormal evaluation levels and abnormal evaluation scores.

[0079] Specifically, after obtaining the abnormal test data, the project evaluation device also parses the abnormal test data to obtain the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data. Among them, the number of abnormal devices is the number of devices with abnormal project failures in the target project. The total number of samples is the total number of detection devices corresponding to the specific project failures in the target project. The total number of abnormalities is the total number of times the specific project failures in the target project occur.

[0080] Specifically, after obtaining the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data, the project evaluation device also calculates the project abnormality rate corresponding to the abnormal test data according to the number of abnormal devices and the total number of samples. The project abnormality rate is the probability of the target project having a project failure corresponding to the abnormal test data.

[0081] That is, the project evaluation device obtains the project abnormality rate corresponding to the abnormal test data by dividing the number of abnormal devices by the total number of samples. Specifically, the calculation formula of the project abnormality rate is as follows:

[0082] Er=Dc / Sp

[0083] Among them, Er is the project abnormality rate, Dc is the number of abnormal devices, and Sp is the total number of samples.

[0084] Specifically, the project evaluation device also calculates the abnormal frequency coefficient corresponding to the abnormal test data according to the number of abnormal devices and the total number of abnormalities, wherein the abnormal frequency coefficient is a coefficient representing the frequency of occurrence of the abnormal fault.

[0085] Specifically, the project evaluation device divides the total number of abnormalities obtained by the number of abnormal devices to obtain the average number of abnormalities corresponding to the fault of the target project, and determines the abnormal frequency coefficient of the fault corresponding to the target project based on the average number of abnormalities and the preset number of abnormalities threshold.

[0086] Specifically, after obtaining the abnormal frequency coefficient of the fault corresponding to the target project, the project evaluation device also determines the abnormal evaluation parameters corresponding to the abnormal test data according to the abnormal rate of the project and the abnormal coefficient of the project. That is, after obtaining the abnormal frequency coefficient, the project evaluation device calculates the product between the abnormal rate of Xiamen Bang and the abnormal frequency coefficient to obtain the abnormal fault score corresponding to the abnormal test data. Among them, the abnormal fault score is an evaluation parameter used to evaluate the severity of the project fault corresponding to the abnormal test data. In a specific embodiment, the calculation formula of the abnormal fault score is as follows:

[0087] Es=Er*f

[0088] Among them, Es is the abnormal fault score, Er is the project abnormality rate, and f is the abnormal frequency coefficient.

[0089] Specifically, the project evaluation device also accesses a preset abnormal database to obtain the abnormal fault type corresponding to the abnormal test data stored in the abnormal database. The abnormal fault type is a fault type that characterizes the fault corresponding to the abnormal test data. Optionally, in a specific embodiment, the abnormal fault type includes a first fault type, a second fault type, a third fault type, a fourth fault type, and a fifth fault type.

[0090] The first fault type is an abnormal fault type corresponding to abnormal test data that represents a target project and has a significant impact on a single user and requires a long time to recover or is unrecoverable.

[0091] The second fault type is an abnormal fault type corresponding to abnormal test data caused by key system modules or core services that characterizes the target project and has a perceptible impact on a single user but can be quickly recovered.

[0092] The third fault type is an abnormal fault type corresponding to abnormal test data that represents an application fault corresponding to the target project that has a perceptible impact on a single user but can be quickly recovered.

[0093] The fourth fault type is an abnormal fault type corresponding to abnormal test data that is imperceptible to users of the target project and has no other impact.

[0094] The fifth fault type is an abnormal fault type corresponding to abnormal test data corresponding to the suggestion information associated with the target project proposed by the tester.

[0095] Specifically, after obtaining the abnormal fault score and abnormal fault type corresponding to the abnormal test data, the project evaluation device also determines the abnormal evaluation parameters corresponding to the abnormal test data according to the fault evaluation thresholds corresponding to the abnormal fault score and the abnormal fault type. That is, the project evaluation device compares the abnormal fault score with the fault evaluation thresholds corresponding to the abnormal fault type to determine the abnormal evaluation level corresponding to the abnormal fault score, and determines the abnormal evaluation level and the corresponding abnormal evaluation score as the abnormal evaluation parameters corresponding to the abnormal test data corresponding to the abnormal fault score.

[0096] Specifically, the project evaluation device pre-sets different fault evaluation thresholds according to different abnormal fault types, and compares the fault evaluation threshold with the abnormal fault score to determine the abnormal evaluation level corresponding to the abnormal fault score.

[0097] Specifically, the project evaluation device can set a first fault evaluation threshold and a second evaluation threshold for different abnormal fault types, and determine the abnormal fault type corresponding to the abnormal test data through the first fault evaluation threshold and / or. Among them, the first fault evaluation threshold is greater than the second fault evaluation threshold. For example, in a specific embodiment, the first fault evaluation threshold and the second fault evaluation threshold set in the first fault type are 0.05% and 0.02%, respectively. The first fault evaluation threshold and the second fault evaluation threshold set in the second fault type are 0.2% and 0.1%, respectively; the first fault evaluation threshold and the second fault evaluation threshold set in the third fault type are 1% and 0.5%, respectively. The first fault evaluation threshold, the second fault evaluation threshold and the third fault evaluation threshold set in the third fault type are 1%, 0.5% and 0.2%, respectively.

[0098] Optionally, in a specific embodiment, the abnormality evaluation level is divided into several evaluation levels according to the severity of the fault, including a first evaluation level, a second evaluation level, a third evaluation level, a fourth evaluation level and a fifth evaluation level. Optionally, in other embodiments, the abnormality evaluation level can also be divided at other granularities, thereby obtaining more or fewer abnormality evaluation levels than in this embodiment, which is not specifically limited in this embodiment.

[0099] Among them, the first evaluation level is a fatal failure level that represents device freeze, crash, system suspension and complete data loss.

[0100] The second evaluation level is a serious fault level that represents the failure to implement functions and features, resulting in module function failure or abnormal exit, as well as program interface errors or data flow errors.

[0101] The third evaluation level is a general fault level that affects the realization of system requirements or basic functions and causes the system to prompt an error, but there are reasonable correction methods.

[0102] The fourth evaluation level is a minor fault level that causes inconvenience or trouble to the operator but does not affect the execution of work functions or important functions.

[0103] The fifth evaluation level is an abnormal evaluation level corresponding to the suggestions put forward by the tester.

[0104] Optionally, if the abnormal fault score is greater than or equal to the first fault evaluation threshold of the corresponding abnormal fault type, the abnormal evaluation level of the abnormal test data corresponding to the abnormal fault score is determined to be the most serious first evaluation level. If the abnormal fault score is less than the first fault evaluation threshold and greater than or equal to the second fault evaluation threshold, the abnormal evaluation level of the abnormal test data corresponding to the abnormal fault score is determined to be the second evaluation level. If the abnormal fault score is less than the second fault score threshold, the abnormal evaluation level of the abnormal test data is determined to be the third evaluation level.

[0105] Specifically, after obtaining the abnormal evaluation level corresponding to the abnormal test data, the project evaluation device also obtains the abnormal evaluation score preset for the abnormal evaluation level, and determines the abnormal evaluation score as the abnormal evaluation score corresponding to the abnormal test data. Optionally, in a specific embodiment, the abnormal evaluation score is obtained as follows:

[0106]

[0107] Among them, bugDI is the abnormal evaluation score, and S~D are the first to fifth evaluation levels respectively.

[0108] Specifically, after obtaining the abnormal evaluation level and the abnormal evaluation score corresponding to the abnormal test data, the project evaluation device determines the abnormal evaluation level and the abnormal evaluation score as the abnormal evaluation parameters corresponding to the abnormal test data.

[0109] 203. Determine the project evaluation parameter of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data;

[0110] Specifically, after obtaining the abnormal evaluation parameters, the project evaluation device further obtains the abnormal state coefficient and repair time coefficient corresponding to the abnormal test data, and determines the project evaluation parameters of the target project based on the abnormal state coefficient, repair time coefficient and abnormal evaluation parameters corresponding to the abnormal test data.

[0111] Specifically, after obtaining the abnormal evaluation parameters, the project evaluation device also obtains the abnormal processing status corresponding to the abnormal test data and the expected repair time of the abnormal test data. Among them, the abnormal processing status reflects the current processing progress of the project failure corresponding to the abnormal test data. The expected repair time reflects the expected repair time / speed of the project failure corresponding to the abnormal test data. In a specific embodiment, the abnormal processing status includes processing allocation status, processing status, preparation test status, preparation release status and processing completion status. The expected repair time includes early processing time status, on-time processing time status and delayed processing time status.

[0112] Specifically, after obtaining the exception handling status and the expected repair time, the project evaluation device also obtains the exception status coefficient corresponding to the exception handling status and the repair time coefficient corresponding to the expected repair time, and determines the project evaluation parameters of the target project based on the exception status parameters, repair time coefficient and exception evaluation parameters.

[0113] Specifically, after obtaining the abnormal state parameter, repair time coefficient and abnormal evaluation parameter corresponding to each abnormal test data, the project evaluation device calculates the product of the abnormal state coefficient, repair time coefficient and abnormal evaluation parameter corresponding to each abnormal test data to obtain the abnormal quality parameter, and calculates the sum of the abnormal quality parameters corresponding to each abnormal test data to obtain the project evaluation parameter of the target project. The calculation formula of the project evaluation parameter is as follows:

[0114]

[0115] Among them, di is the project evaluation parameter, bugDi is the abnormal quality parameter, S f is the abnormal state coefficient and t is the repair time coefficient.

[0116] 204. Output a project evaluation result corresponding to the target project based on the project evaluation parameters.

[0117] Specifically, after obtaining the project evaluation parameters, the project evaluation device can also form a corresponding visualization chart of the project evaluation parameters according to time changes, thereby forming a project evaluation result reflecting the quality of the target project based on the visualization chart, and output the project evaluation result in the corresponding display module.

[0118] In this embodiment, the project evaluation device collects abnormal test data of the target project by responding to the project evaluation request for the target project; determines the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data; determines the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data; and outputs the project evaluation result corresponding to the target project based on the project evaluation parameters. The abnormal test data corresponding to each project abnormality in the target project is collected, and the abnormal evaluation parameters of the abnormal test data are automatically calculated according to the abnormal parameters in the abnormal test data, and the weight coefficient is set according to the processing state and the expected processing time corresponding to the abnormal test data, and the abnormal evaluation parameters are weighted by using the weight coefficient, and the project evaluation parameters of the target project are determined according to each weighted abnormal evaluation coefficient. The quality evaluation indicators of the target project are generated systematically and automatically to improve the efficiency and accuracy of project management.

[0119] like Figure 3 As shown, Figure 3 This is a flow chart of an embodiment of determining an abnormal frequency coefficient in a project evaluation method provided in an embodiment of the present application. Specifically, in this embodiment, the project evaluation method further includes steps 301 to 303:

[0120] 301. Calculate an average number of abnormal times according to the number of abnormal devices and the total number of abnormal times;

[0121] 302. If the average number of abnormalities is less than a preset abnormality threshold, determine the first frequency coefficient as the abnormal frequency coefficient corresponding to the abnormal test data;

[0122] 303. If the average number of abnormal times is greater than or equal to the abnormal number threshold, calculate a second frequency coefficient according to the average number of abnormal times and a preset frequency coefficient, and determine the second frequency coefficient as the abnormal frequency coefficient corresponding to the abnormal test data.

[0123] Based on the above embodiment, in this embodiment, after obtaining the number of abnormal devices and the total number of abnormalities, the abnormal frequency coefficient corresponding to the abnormal test data is calculated according to the number of abnormal devices and the total number of abnormalities. The abnormal frequency coefficient is a coefficient that characterizes the frequency of the abnormal fault.

[0124] Specifically, the project evaluation device divides the total number of abnormalities obtained by the number of abnormal devices to obtain the average number of abnormalities corresponding to the fault of the target project, and determines the abnormal frequency coefficient of the fault corresponding to the target project based on the average number of abnormalities and a preset abnormality threshold.

[0125] Specifically, the project evaluation device pre-sets an abnormal number threshold for evaluating the frequency of abnormal failures in the target project, and determines the abnormal frequency coefficient corresponding to the abnormal test data by comparing the average abnormal number with the abnormal number threshold. Optionally, in a specific embodiment, the abnormal number threshold is 4.

[0126] Optionally, if the average number of abnormalities is less than the abnormal number threshold, the project evaluation device determines the first frequency coefficient as the abnormal frequency coefficient corresponding to the abnormal test data. The first frequency coefficient is 1.

[0127] Optionally, if the average number of abnormalities is greater than or equal to the abnormality threshold, the project evaluation device also calculates a second frequency coefficient based on the average number of abnormalities and a preset frequency coefficient, and determines the second frequency coefficient as the abnormal frequency coefficient corresponding to the abnormal test data. The preset frequency coefficient has a value range of [1, 2, 3, 4]. The calculation formula corresponding to the abnormal frequency coefficient is as follows:

[0128]

[0129] Where f is the abnormal frequency coefficient, is the average number of abnormalities, and L is the preset frequency coefficient.

[0130] In this embodiment, the project evaluation device calculates the average number of abnormalities according to the number of abnormal devices and the total number of abnormalities; if the average number of abnormalities is less than the preset number of abnormalities threshold, the first frequency coefficient is determined as the abnormal frequency coefficient corresponding to the abnormal test data; if the average number of abnormalities is greater than or equal to the abnormal number threshold, the second frequency coefficient is calculated according to the average number of abnormalities and the preset frequency coefficient, and the second frequency coefficient is determined as the abnormal frequency coefficient corresponding to the abnormal test data. The degree of abnormal frequency in the target project is determined through multiple dimensions, providing a data basis for the subsequent evaluation of the fault of the target project.

[0131] like Figure 4 As shown, Figure 4 This is a flow chart of an embodiment of determining an abnormality coefficient and a repair time coefficient in a project evaluation method provided in an embodiment of the present application. Specifically, in this embodiment, the project evaluation method further includes steps 401 to 403:

[0132] 401. Access a preset exception database to obtain each candidate processing status and candidate repair time;

[0133] 402. If the abnormal processing state is the same as a target processing state in each candidate processing state, determine the target state coefficient corresponding to the target processing state as the abnormal state coefficient of the abnormal processing state;

[0134] 403. If the expected repair time and the target repair time in each candidate repair time are the same, the target time coefficient corresponding to the target repair time is determined as the repair time coefficient corresponding to the expected repair time.

[0135] Based on the above embodiments, in this embodiment, after obtaining the exception handling status and the expected repair time, the project evaluation device further obtains the exception status parameter corresponding to the exception handling status and the repair time coefficient corresponding to the expected repair time.

[0136] Specifically, the project evaluation device accesses the preset anomaly database to obtain candidate processing states and candidate repair times. The candidate processing state is a state parameter corresponding to different fault repair states. The candidate repair time is a repair time parameter representing different expected repair times.

[0137] Specifically, the project evaluation device compares the exception processing state with each candidate processing state, thereby screening out the target processing state that is the same as the exception processing state in the candidate processing state, and determining the target state coefficient corresponding to the target processing state as the exception state coefficient corresponding to the exception processing state. In a specific embodiment, each candidate processing state includes a processing allocation state, a processing in progress state, a ready-to-test state, a ready-to-release state, and a processing completed state. Different candidate processing states correspond to different target state coefficients. For example, in a specific embodiment, the target state coefficient corresponding to the processing allocation state and the processing in progress state is 1; the target state coefficient corresponding to the ready-to-test state and the ready-to-release state is 0.5; and the state coefficient corresponding to the processing completed state is 0.1.

[0138] Specifically, the project evaluation device also compares the expected repair time with each candidate repair time, thereby determining the target repair time that is the same as the expected repair time among the candidate repair times, and determines the waiting target time coefficient corresponding to the target repair time that is the same as the expected repair time as the repair time coefficient corresponding to the expected repair time. Different candidate repair times correspond to different target time coefficients. For example, in a specific embodiment, the target time coefficient corresponding to the advance processing time state is 0.5, the target time coefficient corresponding to the on-time processing time state is 1, and the target time coefficient corresponding to the delayed processing time state is 2. Optionally, in other embodiments, the project evaluation device can also set different target time coefficients according to actual application requirements.

[0139] In this embodiment, the project evaluation device obtains each candidate processing state and candidate repair time by accessing a preset abnormality database; if the abnormal processing state is the same as the target processing state in each candidate processing state, the target state coefficient corresponding to the target processing state is determined as the abnormal state coefficient of the abnormal processing state; if the expected repair time is the same as the target repair time in each candidate repair time, the target time coefficient corresponding to the target repair time is determined as the repair time coefficient corresponding to the expected repair time. Accurately obtain the abnormal state coefficient and repair time coefficient that characterize the fault state, and provide data support for subsequent evaluation of target projects.

[0140] In order to better implement the project evaluation method in the embodiment of the present application, based on the project evaluation method, the embodiment of the present application also provides a project evaluation device, such as Figure 5 As shown, Figure 5 The schematic diagram of the structure of the project evaluation device provided in the embodiment of the present application is as follows. Specifically, the project evaluation device 500 includes:

[0141] The data acquisition module 501 is configured to respond to a project evaluation request for a target project and collect abnormal test data of the target project;

[0142] The abnormality evaluation module 502 is configured to determine the abnormality evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0143] A project evaluation module 503 is configured to determine the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data;

[0144] The evaluation output module 504 is configured to output the project evaluation result corresponding to the target project based on the project evaluation parameters.

[0145] In a possible implementation of this embodiment, the project evaluation device determines the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples, and the total number of abnormalities in the abnormal test data, including:

[0146] Obtain the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0147] Calculate the abnormal rate of the item corresponding to the abnormal test data according to the number of abnormal devices and the total number of samples;

[0148] Calculate the abnormal frequency coefficient corresponding to the abnormal test data according to the number of abnormal devices and the total number of abnormalities;

[0149] An abnormality evaluation parameter corresponding to the abnormal test data is determined according to the item abnormality rate and the abnormal frequency coefficient.

[0150] In a possible implementation of this embodiment, the project evaluation device determines the abnormal frequency coefficient corresponding to the abnormal test data according to the number of abnormal devices and the total number of abnormalities, including:

[0151] Calculate the average number of abnormalities according to the number of abnormal devices and the total number of abnormalities;

[0152] If the average number of abnormalities is less than a preset abnormality threshold, the first frequency coefficient is determined as the abnormal frequency coefficient corresponding to the abnormal test data;

[0153] If the average number of abnormal times is greater than or equal to the abnormal number threshold, a second frequency coefficient is calculated according to the average number of abnormal times and a preset frequency coefficient, and the second frequency coefficient is determined as the abnormal frequency coefficient corresponding to the abnormal test data.

[0154] In a possible implementation of this embodiment, the project evaluation device determines the abnormal evaluation parameter corresponding to the abnormal test data according to the project abnormality rate and the abnormal frequency coefficient, including:

[0155] Obtaining the product of the item abnormality rate and the abnormal frequency coefficient to obtain an abnormal fault score corresponding to the abnormal test data;

[0156] Accessing a preset abnormality database to determine the abnormal fault type corresponding to the abnormal test data;

[0157] The abnormal evaluation parameters corresponding to the abnormal test data are determined according to the abnormal fault score and the fault evaluation threshold corresponding to the abnormal fault type, wherein the abnormal evaluation parameters include an abnormal evaluation level and an abnormal evaluation score corresponding to the abnormal evaluation level.

[0158] In a possible implementation of this embodiment, the project evaluation device determines the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data, including:

[0159] Acquire the abnormal processing status corresponding to the abnormal test data and the expected repair time of the abnormal test data;

[0160] Acquire an abnormal state coefficient corresponding to the abnormal processing state and a repair time coefficient corresponding to the expected repair time;

[0161] The project evaluation parameters of the target project are determined according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data.

[0162] In a possible implementation of this embodiment, the project evaluation device obtains the abnormal state coefficient corresponding to the abnormal processing state and the repair time coefficient corresponding to the expected repair time, including:

[0163] Access the preset exception database to obtain the processing status and repair time of each candidate;

[0164] If the abnormal processing state is the same as the target processing state in each candidate processing state, the target state coefficient corresponding to the target processing state is determined as the abnormal state coefficient of the abnormal processing state;

[0165] If the expected repair time and the target repair time in each candidate repair time are the same, the target time coefficient corresponding to the target repair time is determined as the repair time coefficient corresponding to the expected repair time.

[0166] In a possible implementation of this embodiment, the project evaluation device determines the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data, including:

[0167] Obtaining the product of the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data to obtain the abnormal quality parameter;

[0168] The sum of the abnormal quality parameters corresponding to each abnormal test data is calculated to obtain the project evaluation parameters of the target project.

[0169] In this embodiment, the project evaluation device collects abnormal test data of the target project by responding to the project evaluation request for the target project; determines the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data; determines the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data; and outputs the project evaluation result corresponding to the target project based on the project evaluation parameters. The abnormal test data corresponding to each project abnormality in the target project is collected, and the abnormal evaluation parameters of the abnormal test data are automatically calculated according to the abnormal parameters in the abnormal test data, and the weight coefficient is set according to the processing state and the expected processing time corresponding to the abnormal test data, and the abnormal evaluation parameters are weighted by using the weight coefficient, and the project evaluation parameters of the target project are determined according to each weighted abnormal evaluation coefficient. The quality evaluation indicators of the target project are generated systematically and automatically to improve the efficiency and accuracy of project management.

[0170] The embodiment of the present invention also provides a project evaluation device, such as Figure 6 As shown, Figure 6 This is a schematic diagram of the structure of an embodiment of the project evaluation device provided in the embodiments of the present application.

[0171] The project evaluation device integrates any one of the project evaluation devices provided in the embodiments of the present invention, and the project evaluation device includes:

[0172] one or more processors;

[0173] Memory; and

[0174] One or more applications, wherein the one or more applications are stored in the memory and are configured to be executed by the processor to perform the steps of the project evaluation method described in any of the above project evaluation method embodiments.

[0175] Specifically, the project evaluation device may include one or more processing core processors 601, one or more computer-readable storage media memories 602, a power supply 603, an input unit 604, and other components. Those skilled in the art will understand that Figure 6 The project evaluation device structure shown in the figure does not constitute a limitation on the project evaluation device, and may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently.

[0176] The processor 601 is the control center of the project evaluation device. It uses various interfaces and lines to connect various parts of the entire project evaluation device. By running or executing software programs and / or modules stored in the memory 602, and calling data stored in the memory 602, it performs various functions of the project evaluation device and processes data, thereby monitoring the project evaluation device as a whole. Optionally, the processor 601 may include one or more processing cores; preferably, the processor 601 may integrate an application processor and a modem processor, wherein the application processor mainly processes the operating system, user interface, and application programs, and the modem processor mainly processes wireless communications. It is understandable that the above-mentioned modem processor may not be integrated into the processor 601.

[0177] The memory 602 can be used to store software programs and modules. The processor 601 executes various functional applications and data processing by running the software programs and modules stored in the memory 602. The memory 602 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required for at least one function (such as a sound playback function, an image playback function, etc.), etc.; the data storage area may store data created according to the use of the project evaluation device, etc. In addition, the memory 602 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other volatile solid-state storage devices. Accordingly, the memory 602 may also include a memory controller to provide the processor 601 with access to the memory 602.

[0178] The project evaluation device also includes a power supply 603 for supplying power to each component. Preferably, the power supply 603 can be logically connected to the processor 601 through a power management system, so as to manage charging, discharging, and power consumption through the power management system. The power supply 603 can also include any components such as one or more DC or AC power supplies, recharging systems, power failure detection circuits, power converters or inverters, and power status indicators.

[0179] The project evaluation device may also include an input unit 604, which can be used to receive input digital or character information and generate keyboard, mouse, joystick, optical or trackball signal input related to user settings and function control.

[0180] Although not shown, the project evaluation device may also include a display unit, etc., which will not be described in detail here. Specifically in this embodiment, the processor 601 in the project evaluation device will load the executable files corresponding to the processes of one or more application programs into the memory 602 according to the following instructions, and the processor 601 will run the application programs stored in the memory 602, thereby realizing various functions, as follows:

[0181] In response to a project evaluation request for a target project, collect abnormal test data of the target project;

[0182] Determine the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0183] Determine the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data;

[0184] The project evaluation result corresponding to the target project is output based on the project evaluation parameter.

[0185] To this end, an embodiment of the present invention provides a computer-readable storage medium, which may include: a read-only memory (ROM), a random access memory (RAM), a disk or an optical disk, etc. A computer program is stored thereon, and the computer program is loaded by a processor to execute the steps in any project evaluation method provided in an embodiment of the present invention. For example, the computer program may be loaded by a processor to execute the following steps:

[0186] In response to a project evaluation request for a target project, collect abnormal test data of the target project;

[0187] Determine the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data;

[0188] Determine the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data;

[0189] The project evaluation result corresponding to the target project is output based on the project evaluation parameter.

[0190] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, please refer to the detailed description of other embodiments above, and will not be repeated here.

[0191] In specific implementation, the above units or structures can be implemented as independent entities, or can be arbitrarily combined to be implemented as the same or several entities. The specific implementation of the above units or structures can refer to the previous method embodiments, which will not be repeated here.

[0192] The specific implementation of the above operations can be found in the previous embodiments, which will not be described in detail here.

[0193] The above is a detailed introduction to a project evaluation method provided in an embodiment of the present application. Specific embodiments are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea. At the same time, for those skilled in the art, according to the idea of ​​the present invention, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims

1. A project evaluation method, characterized in that: The project evaluation method includes: In response to a project evaluation request for a target project, collect abnormal test data of the target project; Determine the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data; Determine the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data; The project evaluation result corresponding to the target project is output based on the project evaluation parameter.

2. The project evaluation method according to claim 1, characterized in that: The determining of the abnormal evaluation parameters corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data includes: Obtain the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data; Calculate the abnormal rate of the item corresponding to the abnormal test data according to the number of abnormal devices and the total number of samples; Calculate the abnormal frequency coefficient corresponding to the abnormal test data according to the number of abnormal devices and the total number of abnormalities; An abnormality evaluation parameter corresponding to the abnormal test data is determined according to the item abnormality rate and the abnormal frequency coefficient.

3. The project evaluation method according to claim 2, characterized in that: The determining the abnormal frequency coefficient corresponding to the abnormal test data according to the number of abnormal devices and the total number of abnormalities includes: Calculate the average number of abnormalities according to the number of abnormal devices and the total number of abnormalities; If the average number of abnormalities is less than a preset abnormality threshold, the first frequency coefficient is determined as the abnormal frequency coefficient corresponding to the abnormal test data; If the average number of abnormal times is greater than or equal to the abnormal number threshold, a second frequency coefficient is calculated according to the average number of abnormal times and a preset frequency coefficient, and the second frequency coefficient is determined as the abnormal frequency coefficient corresponding to the abnormal test data.

4. The project evaluation method according to claim 2, characterized in that: The determining of the abnormality evaluation parameter corresponding to the abnormal test data according to the project abnormality rate and the abnormal frequency coefficient includes: Obtaining the product of the item abnormality rate and the abnormal frequency coefficient to obtain an abnormal fault score corresponding to the abnormal test data; Accessing a preset abnormality database to determine the abnormal fault type corresponding to the abnormal test data; The abnormal evaluation parameters corresponding to the abnormal test data are determined according to the abnormal fault score and the fault evaluation threshold corresponding to the abnormal fault type, wherein the abnormal evaluation parameters include an abnormal evaluation level and an abnormal evaluation score corresponding to the abnormal evaluation level.

5. The project evaluation method according to any one of claims 1 to 4, characterized in that: The determining the project evaluation parameter of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data includes: Acquire the abnormal processing status corresponding to the abnormal test data and the expected repair time of the abnormal test data; Acquire an abnormal state coefficient corresponding to the abnormal processing state and a repair time coefficient corresponding to the expected repair time; The project evaluation parameters of the target project are determined according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data.

6. The project evaluation method according to claim 5, characterized in that: The acquiring the abnormal state coefficient corresponding to the abnormal processing state and the repair time coefficient corresponding to the expected repair time includes: Access the preset exception database to obtain the processing status and repair time of each candidate; If the abnormal processing state is the same as the target processing state in each candidate processing state, the target state coefficient corresponding to the target processing state is determined as the abnormal state coefficient of the abnormal processing state; If the expected repair time and the target repair time in each candidate repair time are the same, the target time coefficient corresponding to the target repair time is determined as the repair time coefficient corresponding to the expected repair time.

7. The project evaluation method according to claim 5, characterized in that: The determining the project evaluation parameter of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data includes: Obtaining the product of the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameter corresponding to the abnormal test data to obtain the abnormal quality parameter; The sum of the abnormal quality parameters corresponding to each abnormal test data is calculated to obtain the project evaluation parameters of the target project.

8. A project evaluation device, characterized in that: The project evaluation device comprises: A data acquisition module is configured to respond to a project evaluation request for a target project and collect abnormal test data of the target project; An abnormality evaluation module is configured to determine an abnormality evaluation parameter corresponding to the abnormal test data according to the number of abnormal devices, the total number of samples and the total number of abnormalities in the abnormal test data; A project evaluation module, configured to determine the project evaluation parameters of the target project according to the abnormal state coefficient, the repair time coefficient and the abnormal evaluation parameters corresponding to the abnormal test data; The evaluation output module is configured to output the project evaluation result corresponding to the target project based on the project evaluation parameters.

9. A project evaluation device, characterized in that: The project evaluation equipment includes: one or more processors; Memory; and One or more applications, wherein the one or more applications are stored in the memory and are configured to be executed by the processor to implement the steps of the project evaluation method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and the computer program is loaded by a processor to execute the steps of the project evaluation method according to any one of claims 1 to 7.

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