An apparatus and method for measuring the actual occurrence and thickness of field strata

By providing a device including a directional measuring disc, a transparent ball, an angle measuring disc, an incline measuring column and an alcohol ether mixture, the problems of poor portability, complex operation and inaccurate measurement of field formation shapes and thicknesses in the prior art are solved, and the measurement of formation formation shapes and thicknesses in high-precision and good portability are achieved.

CN119666063BActive Publication Date: 2025-06-17OIL & GAS SURVEY CGS
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Patent Information

Application Number
CN202411786687.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-12-06
Publication Date
2025-06-17
Estimated Expiration
2044-12-06

AI Technical Summary

Technical Problem

In the prior art, the device for measuring the shape and thickness of the field formation is poor in portability, complex operation, and has a great influence on human operation, resulting in inaccurate measurement results and is not suitable for long-term field operations.

Method used

A device including a directional measuring disc, a transparent ball, an angle measuring disc, an inclination measuring column and an alcohol ether mixture is provided, and the formation inclination, direction, inclination and true thickness are directly read through simplified operational steps and streamlined parameters acquisition.

Benefits of technology

It improves the accuracy of stratigraphic parameter measurement, simplifies operation, reduces labor and material costs, is suitable for long-term field operations, and significantly improves the measurement convenience in complex environments.

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Abstract

The present invention discloses a device and method for measuring the actual occurrence and thickness of field strata, including a direction measurement disk and a transparent ball installed inside the direction measurement disk; an angle measurement disk is installed on the disk surface of the direction measurement disk through a rotary connection disk, and the angle measurement disk can freely rotate around the central position of the direction measurement disk. An inclination measurement column is installed on the rotary connection disk through a measurement column fixing rotary knob. The lower end of the inclination measurement column can rotate around the measurement column fixing rotary knob, and the inclination measurement column can rotate synchronously with the angle measurement disk; an alcohol-ether mixture is arranged inside the inclination measurement column. A horizontal marking line is arranged along the longitudinal center position of the inclination measurement column, and a vertical marking line is arranged along the transverse center position of the inclination measurement column. A compass is arranged at the top of the inclination measurement column; the present invention improves the measurement accuracy of strata occurrence parameters and can significantly improve the operation difficulty during occurrence measurement in a complex environment.
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Description

Technical Field

[0001] The present invention relates to the technical field of geological surveying instruments, and particularly relates to a device and method for measuring the actual occurrence and thickness of field strata. Background Art

[0002] The dip, strike, dip angle, and thickness of strata are core parameters that need to be obtained in field geological work, and are also essential tasks in geological section measurement, establishment of stratigraphic comprehensive columnar diagrams, sequence stratigraphy, and stratigraphic division and correlation.

[0003] Currently, for obtaining the occurrence of field strata, a geological compass is mainly relied on to measure the dip, strike, and dip angle of the strata. In the actual operation of measuring the strike and dip of the strata, the surveyor needs to first place the short side of the compass close to the rock surface, slowly adjust the compass to make the bubble in the circular bubble level centered. At this time, the reading of the north-seeking needle (10) is the strike of the strata, and the direction perpendicular to the long side of the compass is defined as the dip; then place the compass flat along the dip, and then flip it along the long side to make the compass scale perpendicular to the rock surface. During this process, the compass cannot be displaced, and then manually adjust the rectangular bubble level to make the bubble centered. At this time, the reading of the dip scale is the dip angle. During the process of adjusting the bubble and the reading, the surveyor needs to keep the face as parallel to the scale as possible. For measuring the true thickness of field strata, the traverse method is mainly used. At this time, two observers are required to measure parameters such as the traverse length, azimuth, slope angle, and the angle between the traverse line and the strike line of the traverse, and then obtain the apparent thickness and apparent dip angle through secondary projection, and finally calculate the true thickness of the rock layer according to the true dip angle.

[0004] During the above process of using various compasses to measure the strike and dip of strata, the surveyor needs to repeatedly adjust the position of the compass to make the bubble in the circular bubble level centered. For subsequent measurement of the dip angle, the compass needs to be flipped in place, and the rectangular bubble level and the reading are adjusted laterally. This process is complex in operation, inconvenient for the surveyor to operate and read, and the manual operation fineness directly affects the accuracy of the measurement result. It is extremely inconvenient for measuring positions with large dip angles of strata, limited bottom surfaces of rock layers, and restricted human activities, and the measurement result is prone to errors.

[0005] During the process of using the traverse method to measure the true thickness of strata, it is necessary to measure various parameters such as the azimuth before and after the traverse, traverse length, slope angle, and the angle between the traverse line and the strike. Multiple steps of operation are required, and the acquisition of each parameter is greatly affected by topography, measurement methods, and human operations. It is not easy to obtain accurate and effective parameters, which in turn affects the calculated result of the true thickness of the strata.

[0006] Although improved geological compasses with modified structures have been developed to address the above problems, they have not fundamentally changed the way of parameter acquisition and accuracy. In addition, there are digital compasses based on GPS positioning and electronic compasses based on gravity and magnetism, etc. However, most of them have complex structures, high costs, are greatly affected by factors such as satellite signals, battery life, and magnetic field stability, and have poor portability, making them unsuitable for long-term field operations. Summary of the Invention

[0007] The object of the present invention is to provide a device and method for measuring the actual occurrence and thickness of field strata, so as to solve the technical problems in the prior art, such as poor portability, great influence of manual operation, difficulty in obtaining accurate and effective parameters, easy generation of errors in measurement results, and unsuitability for long-term field operations.

[0008] To solve the above technical problems, the present invention specifically provides the following technical solutions:

[0009] A device for measuring the actual occurrence and thickness of field strata, comprising:

[0010] A direction measurement disk, the disk surface of which is marked with scales from 0° to 360°;

[0011] A transparent ball, installed in the inner cavity of the direction measurement disk, capable of freely rolling along the side surface of the direction measurement disk. The tangent point of the transparent ball and the upper disk surface of the direction measurement disk is the formation dip line;

[0012] An angle measurement disk, movably installed on the disk surface of the direction measurement disk through a rotary connection disk. The angle measurement disk can freely rotate around the center position of the direction measurement disk. The disk surface of the angle measurement disk is marked with bilateral scales from 0° to 90°, and the 0° scale line is located in the middle of the disk surface of the angle measurement disk;

[0013] An inclination measurement column, installed on the rotary connection disk through a measurement column fixing rotary knob. The lower end of the inclination measurement column can rotate around the measurement column fixing rotary knob, and the inclination measurement column can rotate synchronously with the angle measurement disk;

[0014] A mixture of alcohol and ether, arranged inside the inclination measurement column. A horizontal reference line is arranged along the longitudinal center position of the inclination measurement column, and a vertical reference line is arranged along the transverse center position of the inclination measurement column. The vertical reference line is perpendicular to the horizontal scale line;

[0015] A compass, built into the top end of the inclination measurement column.

[0016] As a preferred solution of the present invention, the diameter of the transparent ball is equal to the inner diameter of the cavity of the dip measurement disk, and the transparent ball is arranged in the inner cavity of the direction measurement disk and can roll freely.

[0017] As a preferred embodiment of the present invention, the lower end of the rotary connection disk is movably connected to the direction measurement disk, and the angle measurement disk is fixedly installed at the upper end of the rotary connection disk, and the angle measurement disk is perpendicularly installed with respect to the direction measurement disk.

[0018] As a preferred embodiment of the present invention, the measuring column fixing rotary knob is fixedly installed on the upper end surface of the rotary connection disk, so that the inclination measuring column can rotate synchronously with the rotary connection disk;

[0019] The lower end of the inclination measuring column is installed on the measuring column fixing rotary knob by a rivet, and the inclination measuring column rotates within the range of 0° to 180° along the angle measurement disk with the rivet as the fixed point.

[0020] As a preferred embodiment of the present invention, the liquid volume of the alcohol-ether mixture is 50% of the cavity volume of the inclination measuring column. When the inclination measuring column is in a plumb state, the liquid level of the alcohol-ether mixture completely coincides with the horizontal scale line.

[0021] In addition, the present invention also provides a measuring method for a device for measuring the actual occurrence and thickness of field strata, including:

[0022] Step 100, measuring instrument operation: Press the direction measurement disk of the measuring instrument against the top surface or the bottom surface of the rock stratum. After the transparent ball is completely stationary, rotate the angle measurement disk to rotate the disk surface of the angle measurement disk so that the alcohol-ether mixture completely coincides with the horizontal reference line. After the liquid level of the alcohol-ether mixture is stable, adjust the direction measurement disk so that its 0° scale line is exactly opposite to the north direction of the compass.

[0023] Step 200, reading the formation occurrence parameters: Keep the instrument stationary and stable. Define the scale line value where the transparent ball is tangent to the upper disk surface of the direction measurement disk as the formation dip, recorded as a; the formation strike is the formation dip ± 90°, recorded as b; read the scale value corresponding to the vertical reference line on the disk surface of the angle measurement disk as the formation dip angle, recorded as α;

[0024] Step 300, calculating the true thickness of a single layer: Place the direction measurement disk of the measuring instrument at point A on any convenient rock stratum surface at the bottom boundary of the formation, select the lithologic stratification boundary point B convenient for the next measurement, and use the calculation formula to calculate the true thickness H1 from point A to point B;

[0025] Step 400, calculating the total true thickness of the formation: Repeat step 300, change the positions of points A and B in the order of the old and new formation time, and successively and continuously measure the true thickness Hi of each single-layer lithologic section in the formation until the formation boundary is measured and the measurement ends. Automatically calculate the total true thickness H of the formation according to the formula H = H1 + H2 + H3 +... + Hi.

[0026] As a preferred embodiment of the present invention, in the step 300, for the measurement of the single-layer thickness parameter, the geological parameters required for calculating the true thickness H1 from point A to point B are measured. The specific implementation steps are as follows:

[0027] Use laser ranging to measure the straight-line distance from point A to point B, and record it as L;

[0028] Rotate the direction measurement disk so that its 0° scale line coincides with the tangent line of the top surface of the transparent sphere and the direction measurement disk; rotate the angle measurement disk so that its disk surface is parallel to the AB direction line, and read the scale value corresponding to the disk surface of the angle measurement disk on the direction measurement disk, and record it as γ;

[0029] Keep the angle measurement disk stationary, rotate the tilt measurement column so that the vertical marking line is parallel to the AB direction line, and read the scale value corresponding to the vertical marking line on the disk surface of the angle measurement disk, and record it as β.

[0030] As a preferred embodiment of the present invention, in step 300, the formula for calculating the true thickness of a single layer is:

[0031] L1 = L × sinβ;

[0032] L2 = L × cosβ;

[0033] L3 = L2 × cosγ = L × cosβcosγ;

[0034] L4 = L2 × sinγ = L × cosβsinγ;

[0035]

[0036] According to the formula:

[0037] Calculate the true thickness H1 between A and B.

[0038] As a preferred embodiment of the present invention, when selecting the lithological stratification boundary point B that is convenient for the next measurement, it is selected along the direction of the stratigraphic age from old to new, or along the direction of the stratigraphic age from new to old.

[0039] The present invention has the following beneficial effects compared with the prior art:

[0040] The present invention can overcome the disadvantages of the existing commonly used geological compass, such as complex operation and large reading errors, improve the measurement accuracy of stratigraphic attitude parameters, and compared with the existing devices, it can significantly improve the operation difficulty when measuring the attitude in complex environments such as along the bottom interface of rock layers and large dip angle strata, and only one reading is required to directly obtain the attitude parameter value without conversion.

[0041] Using this device for measuring the true thickness of the formation, compared with the traditional wire method, significantly reduces the labor and material costs. There is no need for front and back surveyors, front and back compasses, survey ropes, tape measures, etc. It can be completed with only one person and one device.

[0042] Moreover, this device has a simple structure, low material cost, good portability, and is completely unaffected by factors such as weather conditions, topography, battery power, and magnetic field distribution.

[0043] And the methods for measuring the formation dip and dip angle are simple and convenient. Compared with the traditional method, the true thickness calculation method requires significantly fewer parameters, only 3 parameters, which are easy to obtain using this device, with high measurement accuracy, a refined calculation process, and more accurate true thickness measurement. Brief Description of the Drawings

[0044] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only exemplary, and for those of ordinary skill in the art, without creative efforts, other implementation drawings can also be obtained based on the provided drawings.

[0045] Figure 1 It is a schematic structural diagram of the measuring instrument according to an embodiment of the present invention;

[0046] Figure 2 It is a schematic side view structure diagram when the measuring instrument is placed on the rock layer according to an embodiment of the present invention;

[0047] Figure 3 It is a schematic top view structure diagram when the measuring instrument is placed on the rock layer according to an embodiment of the present invention;

[0048] Figure 4 It is a schematic top view structure diagram when the disk surface of the angle measuring disk coincides with the tangent line of the top surface of the transparent ball and the direction measuring disk according to an embodiment of the present invention;

[0049] Figure 5 It is a schematic structural diagram when the tilt measuring column is tilted according to an embodiment of the present invention;

[0050] Figure 6 It is a schematic principle diagram of the single-layer thickness of the formation according to an embodiment of the present invention;

[0051] The reference numerals in the drawings are respectively represented as follows:

[0052] 1 - Direction measuring disk; 2 - Glass ball; 3 - Angle measuring disk; 4 - Rotating connection disk; 5 - Tilt measuring column; 6 - Measuring column fixing rotation knob; 7 - Alcohol-ether mixture; 8 - Horizontal reference line; 9 - Vertical reference line; 10 - Compass. Detailed Embodiments

[0053] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0054] As Figure 1 shown, the present invention provides a device for measuring the actual attitude and thickness of field strata, including: a direction measurement disk 1, a transparent sphere 2, an angle measurement disk 3, a rotating connection disk 4, an inclination measurement column 5, a measurement column fixing rotation knob 6, an alcohol-ether mixture 7, a horizontal marking line 8, a vertical marking line 9, and a compass 10.

[0055] The direction measurement disk 1 has scales of 0° to 360° marked on its disk surface.

[0056] The transparent sphere 2 is installed in the internal cavity of the direction measurement disk 1. The diameter of the transparent sphere 2 is equal to the inner diameter of the cavity of the direction measurement disk, and the transparent sphere 2 can freely roll along the side curved surface of the direction measurement disk 1.

[0057] The angle measurement disk 3 is movably installed on the disk surface of the direction measurement disk 1 through the rotating connection disk 4. The angle measurement disk 3 can freely rotate around the central position of the direction measurement disk 1. The disk surface of the angle measurement disk 3 is marked with bilateral scales of 0° to 90°, and the 0° scale line is located in the middle of the disk surface of the angle measurement disk 3.

[0058] The inclination measurement column 5 is installed on the rotating connection disk 4 through the measurement column fixing rotation knob 6. The lower end of the inclination measurement column 5 can rotate around the measurement column fixing rotation knob 6, and the inclination measurement column 5 can rotate synchronously with the angle measurement disk 3.

[0059] Specifically, the lower end of the rotating connection disk 4 is movably connected to the direction measurement disk 1, and the angle measurement disk 3 is fixedly installed at the upper end of the rotating connection disk 4. The angle measurement disk 3 is perpendicularly installed to the direction measurement disk 1.

[0060] The measurement column fixing rotation knob 6 is fixedly installed on the upper end surface of the rotating connection disk 4, so that the inclination measurement column 5 can rotate synchronously with the rotating connection disk 4. The lower end of the inclination measurement column 5 is installed on the measurement column fixing rotation knob 6 through a rivet, and the inclination measurement column 5 rotates within the range of 0° to 180° along the angle measurement disk 3 with the rivet as the fixed point.

[0061] The alcohol-ether mixture 7 is arranged inside the inclination measurement column 5. A horizontal marking line 8 is arranged along the longitudinal center position of the inclination measurement column 5, and a vertical marking line 9 is arranged along the transverse center position of the inclination measurement column 5. The vertical marking line 9 is perpendicular to the horizontal scale line.

[0062] The compass 10 is built into the top end of the inclination measuring column 5.

[0063] The liquid volume of the alcohol-ether mixture 7 is 50% of the cavity volume of the inclination measuring column 5. When the inclination measuring column 5 is in the vertical state, the liquid level of the alcohol-ether mixture 7 completely coincides with the horizontal scale line.

[0064] In this embodiment, the direction measuring disk 1 is a hollow transparent cylinder made of plexiglass, the angle measuring disk 3 is a transparent semi-disk made of plexiglass, and the inclination measuring column 5 is a hollow transparent columnar body made of plexiglass.

[0065] Plexiglass is commonly known as acrylic, Zhongxuan acrylic, or acryl. Plexiglass has good transparency, chemical stability, mechanical properties, and weather resistance, so it can extend the service life of the measuring instrument in this embodiment.

[0066] This device can overcome the shortcomings of existing commonly used geological compasses, such as complex operation and large reading errors, improve the measurement accuracy of formation attitude parameters, and compared with existing devices, it can significantly improve the operation difficulty when measuring the attitude in complex environments such as along the bottom interface of rock layers and large dip angle formations, and only needs one reading to directly obtain the attitude parameter value without conversion.

[0067] When using this device to measure the true thickness of the formation, compared with the traditional traverse method, it significantly reduces the labor and material costs, and does not require front and back surveyors, front and back compasses, survey ropes, tape measures, etc. It can be completed with only one person and one device.

[0068] Moreover, this device has a simple structure, low material cost, good portability, and is completely unaffected by factors such as weather conditions, topography, battery power, and magnetic field distribution.

[0069] The measurement method of the above device for measuring the actual attitude and thickness of the outcrop formation includes:

[0070] Step 100, operating the measuring instrument: As Figure 2 and Figure 3 shown, press the direction measuring disk of the measuring instrument tightly against the top or bottom surface of the rock layer, and wait until the transparent ball stops completely; as Figure 4 shown, rotate the angle measuring disk to make the disk surface of the angle measuring disk coincide with the tangent line of the transparent ball and the top surface of the direction measuring disk; as Figure 5 and Figure 2 shown, rotate the inclination measuring column along the disk surface of the angle measuring disk to make the alcohol-ether mixture completely coincide with the horizontal marking line. After the liquid level of the alcohol-ether mixture stabilizes, adjust the direction measuring disk so that its 0° scale line is exactly facing the north direction of the compass.

[0071] Step 200: Read formation attitude parameters: Keep the instrument stationary and stable. Define the scale line value where the transparent sphere is tangent to the upper surface of the direction measurement disk as the formation dip, and record it as a. The formation strike is the formation dip plus or minus 90°, and record it as b. As Figure 5 and Figure 2 shown, read the scale value corresponding to the vertical reference line on the surface of the angle measurement disk as the formation dip angle, and record it as α.

[0072] Step 300: Calculate the single-layer thickness of the formation: As Figure 6 shown, place the direction measurement disk of the measuring instrument at point A on any convenient rock layer surface at the bottom boundary of the formation. Select the lithological stratification boundary point B convenient for the next measurement, obtain the single-layer thickness calculation parameters, and use the calculation formula to calculate the true thickness H1 from point A to point B.

[0073] When selecting the lithological stratification boundary point B convenient for the next measurement, select it along the direction of the formation age from old to new or along the direction of the formation age from new to old. The formation from old to new mainly depends on the comprehensive judgment of the regional geological map and the comprehensive lithological columnar section of the working area collected. In addition, whether from old to new or from new to old does not affect the calculation of the true thickness.

[0074] Step 400: Calculate the total true thickness of the formation: Repeat Step 300. Replace the positions of point A and B in the order of the formation time from old to new, and successively and continuously measure the true thickness Hi of each single-layer lithological section in the formation until the formation boundary is measured and the measurement ends. Automatically calculate the total true thickness H of the formation according to the formula H = H1 + H2 + H3 + …… + Hi.

[0075] In Step 300, for the measurement of the single-layer thickness parameters, measure the geological parameters required for the calculation formula to calculate the true thickness H1 from point A to point B. The specific implementation steps are as follows:

[0076] Use laser ranging to measure the straight-line distance from point A to point B, and record it as L.

[0077] Rotate the direction measurement disk so that its 0° scale line coincides with the tangent line of the transparent sphere and the upper surface of the direction measurement disk; rotate the angle measurement disk so that its disk surface is parallel to the AB direction line, and read the scale value on the disk surface of the angle measurement disk corresponding to the direction measurement disk, and record it as γ.

[0078] In this step, since the transparent sphere is not fixedly installed on the direction measurement disk, but is built into the cavity of the direction measurement disk and can roll freely, which is equivalent to a lead ball, it is possible to rotate the direction measurement disk so that its 0° scale line coincides with the tangent line of the transparent sphere and the upper surface of the direction measurement disk.

[0079] Keep the angle measurement disc stationary, rotate the tilt measurement column to make the vertical reference line parallel to the AB direction line, and read the scale value corresponding to the vertical reference line on the surface of the angle measurement disc, and record it as β.

[0080] In step 300, the calculation formula for the true thickness of a single layer is:

[0081] L1 = L × sinβ;

[0082] L2 = L × cosβ;

[0083] L3 = L2 × cosγ = L × cosβcosγ;

[0084] L4 = L2 × sinγ = L × cosβsinγ;

[0085]

[0086] According to the formula:

[0087] Calculate the true thickness H1 between AB.

[0088] The above-mentioned formation dip and dip angle measurement method is simple and convenient. Compared with the traditional method, the true thickness calculation method requires significantly fewer parameters, only 3 parameters, which are easy to obtain using this device, with high measurement accuracy, a refined calculation process, and more accurate true thickness measurement.

[0089] The above embodiments are only exemplary embodiments of the present application and are not used to limit the present application. The protection scope of the present application is defined by the claims. Those skilled in the art can make various modifications or equivalent replacements within the essence and protection scope of the present application, and such modifications or equivalent replacements should also be regarded as falling within the protection scope of the present application.

Claims

1. A device for measuring the actual occurrence and thickness of a stratum in the field, characterized in that: include: A direction measuring disc (1), the disc surface of which is marked with 0° to 360° scales; A transparent ball (2) is installed inside the side curved surface of the direction measuring disc (1), and the transparent ball can roll freely and independently inside the direction measuring disc (1), and the tangent point between the transparent ball (2) and the upper disc surface of the direction measuring disc (1) is the formation inclination line; An angle measuring disc (3) is movably mounted on the disc surface of the direction measuring disc (1) by means of a rotating connecting disc (4), and the angle measuring disc (3) can freely rotate around the center position of the direction measuring disc (1); An inclination measuring column (5) is mounted on the rotating connection disk (4) via a measuring column fixing rotating button (6), wherein the lower end of the inclination measuring column (5) can rotate around the measuring column fixing rotating button (6), and the inclination measuring column (5) can rotate synchronously with the angle measuring disk (3); An alcohol-ether mixture (7) is arranged inside the tilt measuring column (5), a horizontal marking line (8) is arranged along the longitudinal center of the tilt measuring column (5), and a vertical marking line (9) is arranged along the transverse center of the tilt measuring column (5), and the vertical marking line (9) is perpendicular to the horizontal marking line (8); A compass (10) is built into the top end of the tilt measurement column (5).

2. The device for measuring the actual occurrence and thickness of a field stratum according to claim 1, characterized in that: The diameter of the transparent ball (2) is equal to the inner diameter of the cavity of the direction measuring wheel (1), and the transparent ball (2) can roll freely along the side curved surface of the direction measuring wheel (1) according to the change of gravity direction.

3. The device for measuring the actual occurrence and thickness of a field stratum according to claim 1, characterized in that: The angle measuring disk (3) has scales on both sides ranging from 0° to 90°, and the 0° scale line is located in the middle of the angle measuring disk (3).

4. The device for measuring the actual occurrence and thickness of a field stratum according to claim 1, characterized in that: The lower end of the rotating connection disk (4) is movably connected to the direction measuring disk (1), and the angle measuring disk (3) is fixedly mounted on the upper end of the rotating connection disk (4), and the angle measuring disk (3) is vertically mounted to the direction measuring disk (1).

5. The device for measuring the actual occurrence and thickness of a field stratum according to claim 1, characterized in that: The measuring column fixing rotating knob (6) is fixedly mounted on the upper end surface of the rotating connecting disk (4), so that the tilt measuring column (5) can rotate synchronously with the rotating connecting disk (4); The lower end of the tilt measuring column (5) is mounted on the measuring column fixed rotating button (6) via a rivet, and the tilt measuring column (5) rotates along the angle measuring disk (3) within a range of 0° to 180° with the rivet as a fixed point.

6. The device for measuring the actual occurrence and thickness of a field stratum according to claim 1, characterized in that: The liquid volume of the alcohol-ether mixture (7) is 50% of the cavity volume of the tilt measuring column (5). When the tilt measuring column (5) is in a vertical state, the liquid surface of the alcohol-ether mixture (7) completely coincides with the horizontal marking line (8).

7. A measuring method based on the device for measuring the actual occurrence and thickness of field strata according to any one of claims 1 to 6, characterized in that: include: Step 100, initially placing the measuring instrument: placing the direction measuring disk of the measuring instrument close to the top or bottom surface of the rock layer, waiting for the transparent ball to be completely still, rotating the angle measuring disk so that the disk surface of the angle measuring disk overlaps with the tangent line of the transparent ball and the top surface of the direction measuring disk, rotating the tilt measuring column along the disk surface of the angle measuring disk so that the alcohol ether mixture completely overlaps with the horizontal marking line, and after the liquid level of the alcohol ether mixture is stable, adjusting the direction measuring disk so that its 0° scale line is directly opposite to the north direction of the compass; Step 200, reading formation dip parameters: keeping the instrument still and stable, setting the scale line value where the transparent ball is tangent to the upper surface of the direction measuring disk as the formation dip, recorded as a; The formation dip ±90° is the formation strike, recorded as b; The scale value corresponding to the vertical mark line on the angle measuring disk is the formation dip angle, which is recorded as α; Step 300, calculate the single layer thickness: place the direction measuring disk of the measuring instrument at any rock layer point A at the bottom boundary of the stratum that is convenient for measurement, select the lithology layer boundary point B that is convenient for the next measurement, and use the calculation formula to calculate the true thickness H1 from point A to point B; Step 400, calculate the total true thickness of the formation: repeat step 300, replace the positions of point A and point B according to the order of the formation time, and continuously measure the true thickness Hi of each single-layer lithology segment in the formation in turn until the top boundary of the formation is measured, and end the measurement. According to the formula H=H1+H2+H3+…+Hi, the total true thickness H of the formation is automatically calculated.

8. The measuring method of the device for measuring the actual occurrence and thickness of field strata according to claim 7, characterized in that: In step 300, the single layer thickness parameters are measured to obtain the geological parameters required by the calculation formula for calculating the true thickness H1 from point A to point B. The specific implementation steps are: Use laser ranging to measure the straight-line distance from point A to point B, and record it as L; Rotate the direction measuring disk so that its 0° scale line coincides with the tangent line between the transparent ball and the top surface of the direction measuring disk; Rotate the angle measuring disk so that its disk surface is parallel to the AB direction line, read the scale value on the disk surface of the angle measuring disk corresponding to the direction measuring disk, and record it as γ; Keep the angle measuring disk still, rotate the tilt measuring column to make the vertical mark line parallel to the AB direction line, read the scale value corresponding to the vertical mark line on the disk surface of the angle measuring disk, and record it as β.

9. The measuring method of the device for measuring the actual occurrence and thickness of field strata according to claim 8, characterized in that: In step 300, the calculation formula for calculating the true thickness of a single layer is: L1 = L × sinβ; L2 = L × cosβ; L3=L2×cosγ=L×cosβcosγ; L4=L2×sinγ=L×cosβsinγ; According to the formula: Calculate the true thickness H1 between AB.

10. The measuring method of the device for measuring the actual occurrence and thickness of field strata according to claim 7, characterized in that: When selecting the lithologic stratification boundary point B for the next measurement, it is selected along the direction from old to new in the stratigraphic age, or along the direction from new to old in the stratigraphic age.

Citation Information

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