Electronic equipment aging test device

Abstract

The invention discloses an electronic equipment aging test device, and relates to the technical field of aging test, the electronic equipment aging test device comprises a test tool, the test tool comprises a machine body, a roller, a bolt, a trunnion, a connecting rod, a slot, a slope, a connecting terminal, a spring push rod and a trigger rod, and the roller is rotatably installed at the bottom of the front end of the machine body. In the using process, if performance defects exist in the electronic equipment to be tested in the testing process, the testing rod presses the triggering rod downwards, the socket of the electronic equipment is stripped from the interior of the corresponding connecting terminal, and discharging of the electronic equipment is completed in an auxiliary mode through the slope formed in the front end of the inserting groove. According to the device, unqualified products can be actively recognized and discharged in the aging test process, screening and discharging of the unqualified products are independently arranged independent of the feeding and discharging process of qualified products, and screening and sorting of the unqualified products by a user can be effectively facilitated; the defect that unqualified products are mixed in qualified products and are difficult to identify and screen in the prior art is overcome.

Description

Technical Field

[0001] The invention relates to the technical field of aging testing, in particular to an aging testing device for electronic equipment. Background Art

[0002] With the increasing popularity of power tools and small household appliances, the standards of various countries have higher and higher requirements for the reliability of power tools and small household appliances. During the testing phase, power tools or small household appliances are usually subjected to aging tests to eliminate products with early failures and poor stability, thereby ensuring the reliability of product use.

[0003] The existing aging test bench is arranged in a straight line, and the more workstations there are, the larger the space they occupy. In the case of limited site space, it cannot meet the needs of miniaturized production. In view of this, the existing structural deficiencies are studied and improved, and an electronic equipment aging test device is proposed. Summary of the invention

[0004] The purpose of the present invention is to provide an electronic equipment aging test device to solve the problems raised in the above background technology.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: an electronic equipment aging test device, comprising a test tool, the test tool comprising a body, a roller, a latch, an ear shaft, a connecting rod, a slot, a ramp, a connecting terminal, a spring push rod and a trigger rod, a roller is rotatably installed at the bottom of the front end of the body, and a latch is fixedly installed at the bottom of the rear end of the body located in the first position, ear shafts are symmetrically fixed on both sides of the rear end of the body, and connecting rods are rotatably installed on the ear shafts, and adjacent bodies are connected end to end through the connecting rods, a slot with a front end opening is provided on the top of the body, and a ramp is provided at the bottom of the front end of the slot, connecting terminals are arranged on both sides of the rear end of the slot, and the connecting terminals consist of a power supply port and a test port, a spring push rod is slidably installed in the middle of the rear end of the slot, and a trigger rod is plugged into and matched with the top of the inclined groove at the rear end of the spring push rod.

[0006] Furthermore, the bodies are arranged in a circular array on the surface of the test turntable, a transparent heat-insulating cover is buckled on the top of the test turntable, and a driven gear is coaxially fixed on the bottom of the test turntable.

[0007] Furthermore, the driven gear is rotatably matched with the controller through a slewing bearing, and a test rod is connected to the top control of the controller. The test rod protrudes from the middle hole of the test turntable after passing through the driven gear, and the test rod is transmission-connected to the spring top rod through the trigger rod.

[0008] Furthermore, the test turntable is rotatably installed on the end side of the driving assembly, and the driving assembly includes a transplanting platform, a Y-axis slide rail, a Y-axis slider, a first cylinder and an end plate. The Y-axis slide rail is fixed to the top side end of the transplanting platform, and the Y-axis slider is slidably installed on the top of the Y-axis slide rail. The side end of the Y-axis slider is fixedly connected to the output end of the first cylinder, and the first cylinder is bolted to the outer side of the end plate at one end of the transplanting platform.

[0009] Furthermore, the driving assembly also includes a transmission rack, the side end of the Y-axis slider is fixedly connected with the transmission rack, and the transmission rack is rotated toward the test turntable through engagement with the driven gear, and the transmission rack is arranged parallel to the adjacent body linear array.

[0010] Furthermore, the driving assembly also includes an X-axis slide rail and an X-axis slider, the X-axis slide rail is fixed to the top of the Y-axis slider, and the X-axis slider is slidably installed on the top of the X-axis slide rail.

[0011] Furthermore, the driving assembly also includes a connecting pin, the side end of the X-axis slider is fixedly connected with the connecting pin, and the connecting pin is connected to the body in the last position through a connecting rod.

[0012] Furthermore, a pick-and-place assembly is fixedly installed on the side end of the transplanting table, and the pick-and-place assembly includes a feeding table, an L-shaped groove plate, guide bars and a slide seat. L-shaped groove plates are symmetrically fixed at both ends of the feeding table, and guide bars are arranged at equal intervals in the middle of the feeding table, and a slide seat is slidably installed on the top of the guide bar.

[0013] Furthermore, the pick-and-place assembly also includes a connecting plate, a second cylinder, a rod and an L-shaped pin. The rear end of the slide is fixedly connected to the connecting plate, and the connecting plate is fixedly connected to the output end of the second cylinder. A rod is connected in series between adjacent slides, and the L-shaped pins at both ends of the rod are slidably matched with the L-shaped slot plate.

[0014] Furthermore, the pick-and-place assembly also includes a mounting seat and a pick-and-place clamp, a mounting seat is coaxially fixed to the middle of the rod corresponding to the adjacent slide, and a pick-and-place clamp is bolted to the top of the mounting seat, and the pick-and-place clamp corresponds to the number of bodies connected end to end.

[0015] The present invention provides an electronic equipment aging test device, which has the following beneficial effects:

[0016] 1. During the use of the present invention, that is, during the testing process, if performance defects are found in the electronic device to be tested, the test rod presses down the trigger rod to peel off the socket of the electronic device from the corresponding connection terminal, and the slope provided at the front end of the slot assists in the discharge of the electronic device, so that the present application can actively identify and discharge unqualified products during the aging test, and the screening and discharge of unqualified products is set separately from the loading and unloading process of qualified products, which can effectively facilitate users to screen and sort unqualified products, and solve the problem of the prior art that unqualified products are mixed with qualified products and are difficult to identify and screen.

[0017] 2. During the use of the present invention, after the loading of the component to be picked up and placed is completed, the first cylinder pushes the test fixture in the last position and drives the entire body arranged in a straight line to move forward synchronously. The present application provides a pin at the bottom of the rear end of the test fixture in the first position, which is plugged into the socket on the test turntable. At the same time, the transmission rack fixedly connected to the side end of the Y-axis slider is also meshed with the driven gear coaxial with the bottom of the test turntable for transmission. In this way, as the test turntable rotates, the test fixtures arranged in a straight line change their pitch to a ring array on the disk surface of the test turntable during the forward movement. Through the above-mentioned linear variable pitch circular arrangement structure setting, multiple test fixtures can complete loading and unloading in a linear arrangement state and complete aging test in a circular arrangement state. The multi-station setting not only effectively improves the aging test efficiency, but also further reduces the space usage area occupied by the multiple stations, which is more suitable for the needs of miniaturized production.

[0018] 3. During the use of the present invention, the aging test device has rods connected in series between multiple slides. During the forward movement of the slide, along with the turning of the L-shaped pin, the pick-and-place clamping claw that has completed the material picking is transformed from a vertical material picking state to a horizontal material feeding state, and the clamped electronic device to be tested is transferred to the corresponding top slot of the body, and in the process of horizontal pushing, the socket at the end of the electronic device to be tested is plugged and electrically connected with the corresponding power supply port and test port. The same pick-and-place assembly can also be used for the unloading and transfer of qualified electronic equipment. While realizing multiple uses of one machine, it only needs to be powered by a second cylinder to realize batch loading and unloading operations of the electronic equipment to be tested, and it has high repeatability, precise loading and unloading positions, and strong applicability. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram of the overall feeding state of the device of the present invention;

[0020] Figure 2 It is a schematic diagram of a partial test state of the device of the present invention;

[0021] Figure 3 This is a schematic diagram of the structure of the drive assembly of the present invention;

[0022] Figure 4This is a schematic diagram of the external structure of the test tooling of the present invention;

[0023] Figure 5 This is a schematic diagram of the internal structure of the test tooling of the present invention;

[0024] Figure 6 It is a schematic diagram of the overall structure of the pick-and-place assembly of the present invention;

[0025] Figure 7 It is a partial structural schematic diagram of the pick-and-place component of the present invention.

[0026] In the figure: 1. Test fixture; 101. Machine body; 102. Roller; 103. Latch; 104. Ear shaft; 105. Connecting rod; 106. Slot; 107. Ramp; 108. Connecting terminal; 109. Spring push rod; 110. Trigger rod; 2. Test turntable; 3. Driven gear; 4. Controller; 5. Test rod; 6. Drive assembly; 601. Transplanting table; 602. Y-axis slide rail; 603. Y-axis Slider; 604, first cylinder; 605, end plate; 606, transmission rack; 607, X-axis slide rail; 608, X-axis slider; 609, connecting pin; 7, pick-up and place assembly; 701, feed table; 702, L-shaped groove plate; 703, guide bar; 704, slide seat; 705, connecting plate; 706, second cylinder; 707, rod; 708, L-shaped pin; 709, mounting seat; 710, pick-up and place clamp. DETAILED DESCRIPTION

[0027] The following embodiments of the present invention are described in further detail with reference to the accompanying drawings and examples. The following embodiments are used to illustrate the present invention but are not intended to limit the scope of the present invention.

[0028] See also Figures 1 to 5The present invention provides a technical solution: an electronic equipment aging test device, comprising a test fixture 1, the test fixture 1 comprising a body 101, a roller 102, a latch 103, an ear shaft 104, a connecting rod 105, a slot 106, a ramp 107, a connecting terminal 108, a spring top rod 109 and a trigger rod 110, the roller 102 is rotatably installed at the bottom of the front end of the body 101, and the latch 103 is fixedly installed at the bottom of the rear end of the body 101 located in the first position, ear shafts 104 are symmetrically fixed on both sides of the rear end of the body 101, and the ear shafts 104 are rotatably installed with connecting rods 105, and adjacent bodies 101 are connected end to end through the connecting rods 105, a slot 106 with a front end opening is opened on the top of the body 101, and the slot 106 has a front end opening at the bottom. A ramp 107 is provided, connection terminals 108 are provided on both sides of the rear end of the slot 106, and the connection terminals 108 are composed of a power supply port and a test port, a spring push rod 109 is slidably installed in the middle of the rear end of the slot 106, and a trigger rod 110 is plugged and matched at the top of the inclined groove at the rear end of the spring push rod 109, the body 101 is arranged in a circular array on the disk surface of the test turntable 2, and a transparent heat insulation cover is buckled on the top of the test turntable 2, and a driven gear 3 is coaxially fixed to the bottom of the test turntable 2, the driven gear 3 is rotatably matched with the controller 4 through a slewing bearing, and a test rod 5 is control-connected to the top of the controller 4, the test rod 5 passes through the driven gear 3 and protrudes from the through hole in the middle of the test turntable 2, and the test rod 5 is transmission-connected to the spring push rod 109 through the trigger rod 110;

[0029] The specific operation is as follows. During the test, under the command control of the controller 4, the test rod 5 is rotated and extended to perform performance tests on the test fixtures 1 arranged in a circular array on the test turntable 2 in turn. During the test, a transparent heat insulation cover is buckled on the top of the test turntable 2 and an aging test is performed under a preset temperature environment. If performance defects are found in the electronic device to be tested, the test rod 5 presses down the trigger rod 110, and further squeezes the rear end inclined groove of the spring push rod 109 through the cone surface of the bottom of the trigger rod 110, so that the spring push rod 109 is located at the middle of the rear end of the slot 106 and protrudes forward, and the socket of the electronic device is peeled off from the corresponding connection terminal 108, and the slope 107 opened at the front end of the slot 106 assists in completing the discharge of the electronic device, so that the present application can actively identify and discharge unqualified products during the aging test, and the screening and discharge of unqualified products is set separately from the loading and unloading process of qualified products, which can effectively facilitate users to screen and sort unqualified products, and solve the existing technical deficiencies that unqualified products are mixed with qualified products and are difficult to identify and screen;

[0030] See also Figures 1 to 3The test turntable 2 is rotatably mounted on the end side of the driving component 6. The driving component 6 includes a transplanting platform 601, a Y-axis slide rail 602, a Y-axis slider 603, a first cylinder 604 and an end plate 605. The Y-axis slide rail 602 is fixed to the top side of the transplanting platform 601, and the Y-axis slider 603 is slidably mounted on the top of the Y-axis slide rail 602. The side end of the Y-axis slider 603 is fixedly connected to the output end of the first cylinder 604, and the first cylinder 604 is bolted to the outer side of the end plate 605 at one end of the transplanting platform 601. The driving component 6 also includes a transmission rack 606. The side end of the Y-axis slider 603 is fixedly connected to the transmission rack The driving rack 606 is a movable rack 606, and the transmission rack 606 is rotated and transmitted to the test turntable 2 by meshing with the driven gear 3, and the transmission rack 606 is arranged in parallel with the adjacent body 101 linear array, the driving assembly 6 also includes an X-axis slide rail 607 and an X-axis slider 608, the top of the Y-axis slider 603 is fixed with the X-axis slide rail 607, and the top of the X-axis slide rail 607 is slidably installed with the X-axis slider 608, the driving assembly 6 also includes a connecting pin 609, the side end of the X-axis slider 608 is fixedly connected with the connecting pin 609, and the connecting pin 609 is connected to the body 101 in the last position through the connecting rod 105;

[0031] The specific operation is as follows: after the loading of the pick-and-place component 7 is completed, the first cylinder 604 pushes the Y-axis slider 603 to slide on the corresponding Y-axis slide rail 602, and further pushes the test fixture 1 in the last position through the connecting pin 609 fixedly connected to the end of the X-axis slider 608, and drives the entire linearly arranged body 101 to move forward synchronously. The present application provides a latch 103 at the bottom of the rear end of the test fixture 1 in the first position, and the latch 103 is plugged into the socket on the test turntable 2. At the same time, the transmission rack 606 fixedly connected to the side end of the Y-axis slider 603 is also connected to the test The driven gear 3 coaxial at the bottom of the turntable 2 is meshed for transmission. Thus, along with the rotation of the test turntable 2, the test fixtures 1 arranged in a straight line change their pitch to become a circular array on the disk surface of the test turntable 2 during the forward movement. Through the above-mentioned linear variable pitch circular arrangement structure setting, multiple test fixtures 1 can complete loading and unloading in a linear arrangement state and complete aging test in a circular arrangement state. The multi-station setting not only effectively improves the aging test efficiency, but also further reduces the space occupied by the multi-station, which is more suitable for the needs of miniaturized production.

[0032] See also Figure 6 to Figure 7The side end of the transplanting platform 601 is fixedly installed with a pick-up and placement component 7, which includes a feeding platform 701, an L-shaped slot plate 702, a guide bar 703 and a slide seat 704. The L-shaped slot plates 702 are symmetrically fixed at both ends of the feeding platform 701, and the guide bars 703 are arranged at equal intervals in the middle of the feeding platform 701, and the slide seat 704 is slidably installed on the top of the guide bar 703. The pick-up and placement component 7 also includes a connecting plate 705, a second cylinder 706, a rod 707 and an L-shaped pin 708. The rear end of the slide seat 704 is fixedly connected to the connecting plate 7 05, and the connecting plate 705 is fixedly connected to the output end of the second cylinder 706, a rod 707 is connected in series between adjacent slides 704, and the L-shaped pins 708 at both ends of the rod 707 are slidably matched with the L-shaped slot plate 702, the pick-and-place assembly 7 also includes a mounting seat 709 and a pick-and-place clamping claw 710, a mounting seat 709 is coaxially fixed to the middle of the rod 707 corresponding to the adjacent slide 704, and a pick-and-place clamping claw 710 is bolted to the top of the mounting seat 709, and the number of the pick-and-place clamping claws 710 corresponds to the number of the bodies 101 connected end to end;

[0033] The specific operation is as follows: the second cylinder 706 pushes multiple slides 704 to slide on the corresponding guide strips 703 at one time through the connecting plate 705. In the present application, a rod 707 is connected in series between multiple slides 704. During the forward movement of the slide 704, the L-shaped pins 708 at both ends of the rod 707 slide in the corresponding L-shaped slot plate 702. With the turning of the L-shaped pin 708, the pick-and-place clamp 710 that has completed the material picking is transformed from a vertical material picking state to a horizontal material feeding state, and the clamped electronic device to be tested is transferred to the corresponding top slot 106 of the body 101. In the process of horizontal pushing, the socket at the end of the electronic device to be tested is plugged and electrically connected with the corresponding power supply port and test port. The same pick-and-place component 7 can also be used for the unloading and transfer of qualified electronic devices. While realizing one machine with multiple uses, it only needs to be powered by a second cylinder 706 to realize batch loading and unloading operations of the electronic devices to be tested, and it has high repeatability, precise loading and unloading positions, and strong applicability.

[0034] In summary, when using the electronic equipment aging test device, the second cylinder 706 pushes multiple slides 704 to slide on the corresponding guide strips 703 at one time through the connecting plate 705. In the present application, a rod 707 is connected in series between the multiple slides 704. During the forward movement of the slide 704, the L-shaped pins 708 at both ends of the rod 707 slide in the corresponding L-shaped slot plate 702. With the turning of the L-shaped pin 708, the picking and placing clamp 710 that has completed the material picking is transformed from a vertical material picking state to a horizontal material feeding state, and the clamped electronic equipment to be tested is transferred to the corresponding top slot 106 of the body 101. In the process of horizontal pushing, the socket at the end of the electronic equipment to be tested is plugged and electrically connected with the corresponding power supply port and test port. The same picking and placing Component 7 can also be used for unloading and transferring qualified electronic equipment. While realizing one machine with multiple uses, it only needs to be powered by a second cylinder 706 to realize batch loading and unloading operations of the electronic equipment to be tested, and it has high repetition accuracy and accurate loading and unloading positions, and is highly applicable. After the loading of the to-be-picked component 7 is completed, the first cylinder 604 pushes the Y-axis slider 603 to slide on the corresponding Y-axis slide rail 602, and further pushes the test fixture 1 in the last position through the connecting pin 609 fixedly connected to the end of the X-axis slider 608, and drives the entire linearly arranged body 101 to move forward synchronously. The present application is provided with a latch 103 at the bottom of the rear end of the test fixture 1 in the first position, and the latch 103 is plugged into the socket on the test turntable 2, and at the same time, the side end of the Y-axis slider 603 The fixed transmission rack 606 is also meshed with the driven gear 3 coaxial with the bottom of the test turntable 2 for transmission. In this way, along with the rotation of the test turntable 2, the test fixtures 1 arranged in a straight line change their pitch to a circular array on the disk surface of the test turntable 2 during the forward movement. Through the above-mentioned linear variable pitch circular arrangement structural setting, multiple test fixtures 1 can complete loading and unloading in a linear arrangement state and complete aging test in a circular arrangement state. The multi-station setting not only effectively improves the aging test efficiency, but also further reduces the space occupied by the multi-station, which is more suitable for the needs of miniaturized production. During the test, under the command of the controller 4, the test rod 5 is rotated and extended to move the test fixtures arranged in a circular array on the test turntable 2 in turn. 1 to perform a performance test. During the test, a transparent heat-insulating cover is buckled on the top of the test turntable 2 and an aging test is performed under a preset temperature environment. If a performance defect is found in the electronic device to be tested, the test rod 5 presses down the trigger rod 110, and further squeezes the rear end inclined groove of the spring push rod 109 through the cone surface of the bottom of the trigger rod 110, so that the spring push rod 109 is located in the middle of the rear end of the slot 106 and protrudes forward, and the socket of the electronic device is peeled off from the corresponding connection terminal 108, and the slope 107 opened at the front end of the slot 106 assists in completing the discharge of the electronic device, so that the present application can actively identify and discharge unqualified products during the aging test, and the screening and discharge of unqualified products is set separately from the loading and unloading process of qualified products.It can effectively facilitate users to sort out unqualified products, and solve the existing technical deficiencies that unqualified products are difficult to identify and screen because they are mixed with qualified products.

[0035] The embodiments of the present invention are given for the purpose of illustration and description, and are not intended to be exhaustive or to limit the invention to the disclosed forms. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiments are selected and described in order to better illustrate the principles and practical applications of the present invention and to enable those of ordinary skill in the art to understand the present invention and thereby design various implementations with various modifications suitable for specific uses.

Claims

1. An electronic equipment aging test device, comprising a test tool (1), characterized in that: The testing tool (1) comprises a body (101), a roller (102), a latch (103), an ear shaft (104), a connecting rod (105), a slot (106), a ramp (107), a connecting terminal (108), a spring top rod (109) and a trigger rod (110), wherein the roller (102) is rotatably mounted on the bottom of the front end of the body (101), and the latch (103) is fixedly mounted on the bottom of the rear end of the body (101) located at the first position, and ear shafts (104) are symmetrically fixed on both sides of the rear end of the body (101), and the ear shafts (104) are rotatably mounted. A connecting rod (105) is provided, and adjacent bodies (101) are connected end to end via the connecting rod (105); a slot (106) with a front opening is provided on the top of the body (101), and a slope (107) is provided at the bottom of the front end of the slot (106); connection terminals (108) are provided on both sides of the rear end of the slot (106), and the connection terminals (108) are composed of a power supply port and a test port; a spring push rod (109) is slidably installed in the middle of the rear end of the slot (106), and a trigger rod (110) is plugged and matched at the top of the inclined groove at the rear end of the spring push rod (109).

2. The electronic equipment aging test device according to claim 1, characterized in that: The bodies (101) are arranged in a circular array on the surface of the test turntable (2), a transparent heat-insulating cover is buckled on the top of the test turntable (2), and a driven gear (3) is coaxially fixed on the bottom of the test turntable (2).

3. The electronic equipment aging test device according to claim 2, characterized in that: The driven gear (3) is rotatably matched with the controller (4) via a slewing bearing, and a test rod (5) is control-connected to the top of the controller (4). The test rod (5) protrudes from a through hole in the middle of the test turntable (2) after passing through the driven gear (3), and the test rod (5) is transmission-connected to a spring top rod (109) via a trigger rod (110).

4. The electronic equipment aging test device according to claim 3, characterized in that: The test turntable (2) is rotatably mounted on the end side of a driving assembly (6); the driving assembly (6) comprises a transplanting platform (601), a Y-axis slide rail (602), a Y-axis slider (603), a first cylinder (604) and an end plate (605); the Y-axis slide rail (602) is fixed to the top side of the transplanting platform (601); the Y-axis slider (603) is slidably mounted on the top of the Y-axis slide rail (602); the side end of the Y-axis slider (603) is fixedly connected to the output end of the first cylinder (604); and the first cylinder (604) is bolted to the outer side of the end plate (605) at one end of the transplanting platform (601).

5. The electronic equipment aging test device according to claim 4, characterized in that: The driving assembly (6) further comprises a transmission rack (606), the side end of the Y-axis slider (603) being fixedly connected with the transmission rack (606), and the transmission rack (606) is rotated toward the test turntable (2) by meshing with the driven gear (3), and the transmission rack (606) is arranged in parallel with the adjacent machine body (101) linear array.

6. The electronic equipment aging test device according to claim 5, characterized in that: The driving assembly (6) further comprises an X-axis slide rail (607) and an X-axis slider (608); the X-axis slide rail (607) is fixed to the top of the Y-axis slider (603), and the X-axis slider (608) is slidably mounted on the top of the X-axis slide rail (607).

7. The electronic equipment aging test device according to claim 6, characterized in that: The driving assembly (6) further comprises a connecting pin (609), the side end of the X-axis slider (608) is fixedly connected with the connecting pin (609), and the connecting pin (609) is connected to the machine body (101) in the final position via a connecting rod (105).

8. The electronic equipment aging test device according to claim 7, characterized in that: A pick-and-place assembly (7) is fixedly installed at the side end of the transplanting platform (601), and the pick-and-place assembly (7) comprises a feeding platform (701), an L-shaped slot plate (702), a guide bar (703) and a slide seat (704). L-shaped slot plates (702) are symmetrically fixed at both ends of the feeding platform (701), and guide bars (703) are arranged at equal intervals in the middle of the feeding platform (701), and a slide seat (704) is slidably installed on the top of the guide bar (703).

9. The electronic equipment aging test device according to claim 8, characterized in that: The pick-and-place assembly (7) further comprises a connecting plate (705), a second cylinder (706), a rod (707) and an L-shaped pin (708); the rear end of the slide seat (704) is fixedly connected to the connecting plate (705), and the connecting plate (705) is fixedly connected to the output end of the second cylinder (706); adjacent slide seats (704) are connected in series with rods (707), and the L-shaped pins (708) at both ends of the rod (707) are slidably matched with the L-shaped slot plate (702).

10. The electronic equipment aging test device according to claim 9, characterized in that: The pick-and-place assembly (7) further comprises a mounting seat (709) and a pick-and-place clamp (710); the mounting seat (709) is coaxially fixed to the middle of the rod (707) corresponding to the adjacent slide seat (704); the pick-and-place clamp (710) is bolted to the top of the mounting seat (709); and the number of the pick-and-place clamps (710) corresponds to the number of the bodies (101) connected end to end.

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