Troubleshooting method of sealed electromagnetic relay and related equipment
Through a variety of detection and testing methods, the fault data and images of the sealed electromagnetic relay are obtained, and the fault database is combined for troubleshooting, which solves the problem of inaccurate fault positioning in the existing technology, and achieves a comprehensive and accurate inspection of the faults of the sealed electromagnetic relay.
Patent Information
- Application Number
- CN202411701416.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-26
- Publication Date
- 2025-03-21
AI Technical Summary
The prior art is difficult to accurately locate the fault of the sealed electromagnetic relay, especially in the power-on state, which cannot be verified, resulting in inaccurate fault positioning.
Through a variety of predetermined non-disassembly detections, radiating and power-on photography, multiple test tests and disassembly detection, multiple fault data and images are obtained, and troubleshooting is carried out in combination with the fault database.
A comprehensive and accurate inspection of sealed electromagnetic relay faults has been achieved, and the problem of inaccurate fault positioning in the existing technology has been overcome.
Smart Images

Figure CN119667461A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of quality inspection, and in particular to a method for troubleshooting a sealed electromagnetic relay and related equipment. Background Art
[0002] At present, sealed electromagnetic relays are strictly screened after production and then delivered to users for use. However, failures occur from time to time during use. For example, some of them are manifested as abnormal conduction of normally open or normally closed contacts. During the actual fault location analysis process, it was found that the electromagnetic relay is encapsulated in a metal shell and the internal structure cannot be directly observed. It is necessary to check the internal structure of the electromagnetic relay. Since the normally closed contacts of the electromagnetic relay are closed in the natural state (non-powered state), only the internal structure in the natural state can be observed. The fault state of the electromagnetic device after power-on cannot be verified, and the observation results are not accurate, which makes the fault location of the electromagnetic relay inaccurate.
[0003] In addition, in the prior art, there is a lack of relevant methods for testing and verifying the electrical performance and locating the fault of the electromagnetic relay after disassembly, which makes it impossible to provide accurate test data after disassembly for locating the fault of the electromagnetic relay. Summary of the invention
[0004] In view of this, the purpose of the present application is to provide a sealed electromagnetic relay fault troubleshooting method and related equipment to overcome all or part of the deficiencies in the prior art.
[0005] Based on the above-mentioned purpose, the present application provides a method for troubleshooting a sealed electromagnetic relay, comprising: in response to determining that the electromagnetic relay has a fault, performing multiple predetermined non-disassembly tests on the electromagnetic relay to obtain multiple first fault data; irradiating the electromagnetic relay with rays, and controlling the electromagnetic relay to be energized within a predetermined voltage range, in response to determining that the fault recurs, taking pictures of the internal structure of the electromagnetic relay when the fault occurs to obtain multiple first fault images; performing multiple first test experiments on the electromagnetic relay to obtain multiple second fault data; disassembling the electromagnetic relay for inspection to obtain multiple second fault images and multiple third fault data; and troubleshooting the electromagnetic relay based on the multiple first fault data, the multiple first fault images, the multiple second fault data, the multiple second fault images, and the multiple third fault data.
[0006] Optionally, the multiple second fault images include multiple first sub-fault images and multiple second sub-fault images, and the multiple third fault data include multiple first sub-fault data and second sub-fault data; the disassembling and testing the electromagnetic relay to obtain the multiple second fault images and multiple third fault data includes: unsealing the electromagnetic relay and taking photos of the electromagnetic relay after unsealing to obtain the multiple first sub-fault images; performing multiple second tests on the electromagnetic relay after unsealing to obtain the multiple first sub-fault data; disassembling the electromagnetic relay after unsealing, scanning the disassembled electromagnetic relay to obtain the multiple second sub-fault images, and performing an energy spectrum test on the disassembled electromagnetic relay to obtain the second sub-fault data.
[0007] Optionally, the multiple second test experiments include a first voltage test, a force test and an over-travel test, and the multiple first sub-fault data include first data, second data and third data; the multiple second test experiments are performed on the electromagnetic relay after the unsealing to obtain the multiple first sub-fault data, including: performing the first voltage test on the electromagnetic relay after the unsealing to obtain the first data, performing the force test on the electromagnetic relay after the unsealing to obtain the second data, and performing the over-travel test on the electromagnetic relay after the unsealing to obtain the third data.
[0008] Optionally, the predetermined voltage range includes a first predetermined voltage set and a second predetermined voltage set; the step of utilizing radiation to irradiate the electromagnetic relay and simultaneously controlling the electromagnetic relay to be energized within the predetermined voltage range includes: for each first voltage within the first predetermined voltage set, utilizing the radiation to irradiate the electromagnetic relay and simultaneously controlling the electromagnetic relay to receive the first voltage; for each second voltage within the second predetermined voltage set, utilizing the radiation to irradiate the electromagnetic relay and simultaneously controlling the electromagnetic relay to receive the second voltage.
[0009] Optionally, the multiple first test experiments include a second voltage test, a noise test and a sealing test, and the multiple second fault data include fourth data, fifth data and sixth data; the multiple first test experiments are performed on the electromagnetic relay to obtain multiple second fault data, including: performing the second voltage test on the electromagnetic relay to obtain the fourth data, performing the noise test on the electromagnetic relay to obtain the fifth data, and performing the sealing test on the electromagnetic relay to obtain the sixth data.
[0010] Optionally, the troubleshooting of the electromagnetic relay based on the multiple first fault data, the multiple first fault images, the multiple second fault data, the multiple second fault images and the multiple third fault data includes: in response to determining that there is at least one first predetermined fault data among the multiple first fault data, for each first predetermined fault data, searching a pre-constructed fault database for a first suspected fault corresponding to the first predetermined fault data; in response to determining that there is at least one second predetermined fault data among the multiple second fault data, for each second predetermined fault data, searching the fault database for a second suspected fault corresponding to the second predetermined fault data; in response to determining that there is at least one third predetermined fault data among the multiple third fault data, for each third predetermined fault data, searching the fault database for a third suspected fault corresponding to the third predetermined fault data; and locating the fault of the electromagnetic relay based on all first suspected faults, all second suspected faults, all third suspected faults, the multiple first fault images and the multiple second fault images.
[0011] Optionally, the plurality of predetermined non-disassembly tests include: appearance test, resistance test and radiation test.
[0012] Based on the same inventive concept, the present application also provides a troubleshooting device for a sealed electromagnetic relay, comprising: a first detection module, configured to, in response to determining that the electromagnetic relay has a fault, perform a plurality of predetermined non-disassembly detections on the electromagnetic relay to obtain a plurality of first fault data; a photographing module, configured to irradiate the electromagnetic relay with rays, and at the same time control the electromagnetic relay to be energized within a predetermined voltage range, and in response to determining that the fault recurs, take a photograph of the internal structure of the electromagnetic relay when the fault occurs to obtain a plurality of first fault images; a testing module, configured to perform a plurality of first test experiments on the electromagnetic relay to obtain a plurality of second fault data; a second detection module, configured to disassemble the electromagnetic relay for detection to obtain a plurality of second fault images and a plurality of third fault data; a troubleshooting module, configured to troubleshoot the electromagnetic relay based on the plurality of first fault data, the plurality of first fault images, the plurality of second fault data, the plurality of second fault images and the plurality of third fault data.
[0013] Based on the same inventive concept, the present application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable by the processor, wherein the processor implements the method as described above when executing the computer program.
[0014] Based on the same inventive concept, the present application also provides a non-transitory computer-readable storage medium, which stores computer instructions, and the computer instructions are used to enable a computer to execute the method as described above.
[0015] As can be seen from the above, the method and related equipment for troubleshooting a sealed electromagnetic relay provided by the present application include: in response to determining that the electromagnetic relay has a fault, performing a plurality of predetermined non-disassembly tests on the electromagnetic relay to obtain a plurality of first fault data, so as to achieve the purpose of preliminary and accurate troubleshooting of the electromagnetic relay fault. The electromagnetic relay is irradiated with rays, and the electromagnetic relay is controlled to be energized according to a predetermined voltage range at the same time. In response to determining that the fault reappears, the internal structure of the electromagnetic relay when the fault occurs is photographed to obtain a plurality of first fault images, and the internal structure of the electromagnetic relay in the working state is accurately obtained. The electromagnetic relay is subjected to a plurality of first test experiments to obtain a plurality of second fault data, so as to achieve the purpose of further accurate troubleshooting of the electromagnetic relay fault. The electromagnetic relay is disassembled for testing to obtain a plurality of second fault images and a plurality of third fault data, which can intuitively and accurately reflect the faults existing in the internal structure of the electromagnetic relay. Based on the multiple first fault data, the multiple first fault images, the multiple second fault data, the multiple second fault images and the multiple third fault data, the electromagnetic relay is troubleshooted to achieve the purpose of comprehensive and accurate troubleshooting of the electromagnetic relay. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] In order to more clearly illustrate the technical solutions in the present application or related technologies, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0017] Figure 1 A schematic flow chart of a method for troubleshooting a sealed electromagnetic relay according to an embodiment of the present application;
[0018] Figure 2 A schematic structural diagram of a sealed electromagnetic relay fault troubleshooting device according to an embodiment of the present application;
[0019] Figure 3 This is a schematic diagram of the hardware structure of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION
[0020] In order to make the objectives, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in combination with specific embodiments and with reference to the accompanying drawings.
[0021] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present application should be the usual meanings understood by people with ordinary skills in the field to which the present application belongs. The "first", "second" and similar words used in the embodiments of the present application do not represent any order, quantity or importance, but are only used to distinguish different components. "Including" or "comprising" and similar words mean that the elements or objects appearing in front of the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.
[0022] As described in the background technology section, currently sealed electromagnetic relays are produced and strictly screened before being handed over to users for use. However, electromagnetic relay failures occur from time to time during use. For example, some of them are manifested as abnormal conduction of normally open or normally closed contacts. In general, each normally open or normally closed contact group of an electromagnetic relay is mainly used to switch on and off various signals to achieve electrical switch control. Especially for electromagnetic relays controlled by small signal switches, their actual rated current is small, no obvious arcing will be generated during the opening or closing of the contacts, and the contact heating is small. Therefore, the contacts are more sensitive to pollution, excess matter, water vapor, etc., and abnormal conduction of the contacts after power-on often occurs. The abnormal conduction of the contacts is mainly manifested in the following aspects:
[0023] 1) The electromagnetic relay does not switch normally, causing the contacts to fail to close or open.
[0024] 2) The electromagnetic relay switches normally, but the contacts do not close normally and the contacts cannot conduct.
[0025] 3) The electromagnetic relay switches normally and the contacts close normally, but the contacts cannot conduct.
[0026] The above fault conditions may be related to multiple factors such as the electromagnetic relay coil, armature switching, contact pressure, etc. This situation may involve problems with the product's own process or may involve improper use and other reasons.
[0027] However, during the actual fault location analysis process, it was found that the electromagnetic relay was encapsulated in a metal shell and the internal structure could not be directly observed, so X-rays were required to inspect the internal structure. Since the normally closed contacts of the electromagnetic relay are closed in the natural state (non-powered state), X-rays can only observe the internal structure in the natural state, while the normally open contacts are closed and the armature is switched. Power needs to be turned on according to the working characteristics of the electromagnetic relay. Existing X-rays do not have a built-in power supply and cannot power on the test product. Therefore, it is impossible to observe the changes in the internal structure of the electromagnetic relay before and after the switching in real time through X-rays, and it is impossible to monitor whether the electromagnetic relay is switched in place and the contact conduction status, and thus it is impossible to judge the possible cause of the fault before unsealing. The fault state of the electromagnetic device after power-on cannot be verified, and the observation results are not accurate, which makes the fault location of the electromagnetic relay inaccurate.
[0028] In addition, non-destructive analysis (appearance, X-ray inspection, electrical performance test, particle collision noise detection, and sealing test) must be performed first during the actual failure analysis. In this non-destructive analysis, particle collision noise detection will cause the relay to vibrate, which may cause microscopic changes in the internal structure of the electromagnetic relay, resulting in the disappearance of the fault, which may cause deviations in subsequent analysis and inaccurate fault location. Therefore, X-ray inspection before and after the relay is powered on is particularly important for fault location of the electromagnetic relay.
[0029] At present, the main method for relay failure analysis is to first perform nondestructive inspection and then perform destructive analysis on the relay. However, the current X-ray inspection of electromagnetic relays mainly inspects the internal structure in the non-powered state. Since the electromagnetic relay cannot be powered on in real time during the X-ray equipment inspection process, the fault state of the electromagnetic relay cannot be verified after power is turned on. In addition, in the prior art, there is a lack of relevant methods for testing and verifying the electrical performance and locating the fault of the electromagnetic relay after disassembly, which makes it impossible to provide accurate test data for the fault location of the electromagnetic relay after disassembly.
[0030] In view of this, the present application embodiment proposes a method for troubleshooting a sealed electromagnetic relay, referring to Figure 1 , including the following steps:
[0031] Step 101: in response to determining that the electromagnetic relay has a fault, performing a plurality of predetermined non-disassembly tests on the electromagnetic relay to obtain a plurality of first fault data.
[0032] In this step, when it is determined that the electromagnetic relay has a fault, it is necessary to troubleshoot the electromagnetic relay. Exemplarily, the electromagnetic relay has multiple contacts, and it is necessary to specifically determine which contact has a fault. The electromagnetic relay in the present application is a sealed electromagnetic relay, which is encapsulated in a metal shell and whose internal structure cannot be directly observed. Therefore, in order to more accurately determine the fault of the electromagnetic relay, the electromagnetic relay needs to be disassembled and tested. Before disassembling the electromagnetic relay for testing, it is necessary to perform a variety of predetermined non-disassembly tests on the electromagnetic relay to obtain a plurality of first fault data. A variety of predetermined non-disassembly tests are relatively simple, which not only ensures that a plurality of first fault data are obtained, but also has a relatively small impact on subsequent tests or tests, thereby achieving the purpose of initially and accurately troubleshooting the fault of the electromagnetic relay.
[0033] Step 102, irradiating the electromagnetic relay with radiation, and controlling the electromagnetic relay to be energized within a predetermined voltage range. In response to determining that the fault has reappeared, photographing the internal structure of the electromagnetic relay when the fault occurs, to obtain a plurality of first fault images.
[0034] In this step, in the prior art, the internal structure of the electromagnetic relay is usually checked by using radiation in a natural state (non-powered state), but the fault of the electromagnetic relay may only be fully manifested in a working state (powered state). Therefore, the present application uses radiation to irradiate the electromagnetic relay while controlling the electromagnetic relay to be energized within a predetermined voltage range, wherein the radiation is X-rays. Observe the changes in the internal structure of the electromagnetic relay during the voltage change process. When the fault reappears, maintain the coil voltage and take photos of the internal structure of the relay from multiple angles using an X-ray detector. It should be noted that in order to make the fault location more accurate, the internal structure of the electromagnetic relay in the powered state can also be photographed, and the contact on-resistance and the pull-in voltage can be recorded as fault data at the same time, and the photos and fault data in the above-mentioned dotted state are used together for subsequent electromagnetic relay fault troubleshooting. By obtaining multiple first fault images of the electromagnetic relay in the working state, the internal structure of the electromagnetic relay in the working state is accurately obtained.
[0035] The present application can simulate the working state of the electromagnetic relay before the electromagnetic relay is unsealed, and observe and analyze the internal structure through X-rays. On the one hand, the fault phenomenon can be reproduced, and on the other hand, whether the internal structure of the device is abnormal can be comprehensively judged in real time. Among the various predetermined non-disassembly tests on the electromagnetic relay, radiation detection is included. Through radiation detection, image data of the internal structure of the electromagnetic relay when it is not powered can be obtained. By comparing the internal structure of the X-ray in the non-powered and powered states, and comparing and analyzing it with the contact conduction state of the real-time test, the possible cause of the electromagnetic relay failure can be preliminarily judged.
[0036] Step 103: Perform a plurality of first test experiments on the electromagnetic relay to obtain a plurality of second fault data.
[0037] In this step, since the electromagnetic relay will vibrate when it is disassembled, the vibration may cause microscopic changes in the internal structure of the electromagnetic relay, which may change the fault of the electromagnetic relay. Therefore, after photographing the internal structure of the electromagnetic relay in the working state, it is necessary to perform multiple first tests on the electromagnetic relay to obtain multiple second fault data. Through the multiple second fault data, it can be verified whether the internal structure of the electromagnetic relay has changed. In the case that the internal structure of the electromagnetic relay has not changed, the multiple second fault data can also reflect the fault of the electromagnetic relay, so as to achieve the purpose of further accurately troubleshooting the fault of the electromagnetic relay.
[0038] Step 104: disassemble and inspect the electromagnetic relay to obtain a plurality of second fault images and a plurality of third fault data.
[0039] In this step, nondestructive testing alone cannot accurately determine the fault of the electromagnetic relay. Therefore, the electromagnetic relay needs to be disassembled for testing to obtain multiple second fault images and multiple third fault data. Disassembly testing can fully expose the internal structure of the electromagnetic relay and can intuitively and accurately reflect the faults in the internal structure of the electromagnetic relay.
[0040] Step 105 , troubleshooting the electromagnetic relay based on the multiple pieces of first fault data, the multiple pieces of first fault images, the multiple pieces of second fault data, the multiple pieces of second fault images and the multiple pieces of third fault data.
[0041] In this step, based on a plurality of first fault data, a plurality of first fault images, a plurality of second fault data, a plurality of second fault images and a plurality of third fault data, the electromagnetic relay is troubleshooted. The above fault data and the above fault images are obtained through a variety of tests and experiments, so as to achieve the purpose of comprehensive and accurate troubleshooting of the electromagnetic relay.
[0042] After unsealing, the electrical performance of the electromagnetic relay is retested and the image is recorded, and the device can be verified for fault again. The combination of non-destructive analysis and destructive analysis can be used to troubleshoot the electromagnetic relay, making the troubleshooting more accurate. By using special devices and analysis processes in the non-destructive testing stage and the destructive testing stage, the non-destructive testing results are matched with the failure mechanism of the destructive testing results to ensure the consistency of the data analysis results before and after, and to achieve accurate fault location. The images and data of each part of the non-destructive test and the destructive test are summarized and analyzed, the fault phenomenon is correlated with the test results, and a failure analysis fault tree is established to locate the failure and analyze the cause of the failure.
[0043] Through the above scheme, in response to determining that the electromagnetic relay has a fault, the electromagnetic relay is subjected to multiple predetermined non-disassembly tests to obtain multiple first fault data, thereby achieving the purpose of initially and accurately troubleshooting the fault of the electromagnetic relay. The electromagnetic relay is irradiated with radiation, and the electromagnetic relay is controlled to be energized according to a predetermined voltage range. In response to determining that the fault is recurring, the internal structure of the electromagnetic relay when the fault occurs is photographed to obtain multiple first fault images, and the internal structure of the electromagnetic relay in the working state is accurately obtained. The electromagnetic relay is subjected to multiple first test experiments to obtain multiple second fault data, thereby achieving the purpose of further accurately troubleshooting the fault of the electromagnetic relay. The electromagnetic relay is disassembled for testing to obtain multiple second fault images and multiple third fault data, which can intuitively and accurately reflect the faults existing in the internal structure of the electromagnetic relay. Based on the multiple first fault data, the multiple first fault images, the multiple second fault data, the multiple second fault images and the multiple third fault data, the electromagnetic relay is troubleshooted to achieve the purpose of comprehensively and accurately troubleshooting the fault of the electromagnetic relay.
[0044] In some embodiments, the multiple second fault images include multiple first sub-fault images and multiple second sub-fault images, and the multiple third fault data include multiple first sub-fault data and second sub-fault data; the disassembling and testing the electromagnetic relay to obtain the multiple second fault images and multiple third fault data includes: unsealing the electromagnetic relay and taking photos of the electromagnetic relay after unsealing to obtain the multiple first sub-fault images; performing multiple second tests on the electromagnetic relay after unsealing to obtain the multiple first sub-fault data; disassembling the electromagnetic relay after unsealing, scanning the disassembled electromagnetic relay to obtain the multiple second sub-fault images, and performing an energy spectrum test on the disassembled electromagnetic relay to obtain the second sub-fault data.
[0045] In this embodiment, the electromagnetic relay is unsealed, and only the outer shell is removed to expose the internal structure. When unsealing, avoid bumping or vibrating the device, and try to ensure that the fault still exists after removing the outer shell. The unsealed electromagnetic relay is observed under a microscope, and the unsealed electromagnetic relay is photographed to obtain multiple first sub-fault images, which at least include abnormal parts of the electromagnetic relay, matching clearances of various components of the electromagnetic relay, etc. Before the electromagnetic relay is disassembled, it is necessary to perform multiple second test tests on the electromagnetic relay to obtain multiple first sub-fault data. The unsealed electromagnetic relay is disassembled, and attention should be paid to: exposing the reed contacts, armature shaft, etc., to avoid scratches caused by disassembly. The disassembled electromagnetic relay is scanned using a scanning electron microscope to obtain multiple second sub-fault images, which at least include images of the normally open and normally closed contacts of the electromagnetic relay, images of the armature shaft of the electromagnetic relay, images of abnormal materials of the electromagnetic relay, etc. The disassembled electromagnetic relay is subjected to an energy spectrum test, and the specific test process of the energy spectrum test can adopt the energy spectrum test process in the prior art. Energy spectrum test is a more advanced and accurate detection method, usually used for material composition analysis or failure analysis. In the fault analysis of electromagnetic relays, energy spectrum test is used to analyze the composition of the internal materials or contacts of the electromagnetic relay to help determine the cause of failure. After the electromagnetic relay has been disassembled, the energy spectrum test can be performed on the electromagnetic relay to analyze the composition of the internal materials or contacts of the electromagnetic relay.
[0046] This embodiment determines each step in the disassembly test, and the above steps have a certain degree of connectivity. First, the electromagnetic relay is unsealed, and multiple first sub-fault images are observed after unsealing. The electromagnetic relay cannot work normally after disassembly. Therefore, before disassembling the electromagnetic relay, multiple second test experiments need to be performed on the electromagnetic relay. The electromagnetic relay is disassembled, and multiple second sub-fault images are observed after disassembly. Finally, an energy spectrum test is performed on the disassembled electromagnetic relay to analyze the components of the electromagnetic relay. The disassembly detection of the electromagnetic relay includes multiple observations and multiple experiments on the electromagnetic relay, and all the steps in the disassembly detection ensure that the electromagnetic relay is fully tested, and the electromagnetic relay will not be inaccurate due to the lack of fault data or fault images.
[0047] In some embodiments, the multiple second test experiments include a first voltage test, a force test and an over-travel test, and the multiple first sub-fault data include first data, second data and third data; the multiple second test experiments are performed on the electromagnetic relay after the unsealing to obtain the multiple first sub-fault data, including: performing the first voltage test on the electromagnetic relay after the unsealing to obtain the first data, performing the force test on the electromagnetic relay after the unsealing to obtain the second data, and performing the over-travel test on the electromagnetic relay after the unsealing to obtain the third data.
[0048] In this embodiment, the first voltage test is performed on the electromagnetic relay after being unsealed. The specific steps of the first voltage test are: applying a predetermined voltage to the coil of the electromagnetic relay and observing the action of the electromagnetic relay. Repeat the above steps many times and record them as the first data. It should be noted that in order to make the first voltage test more accurate, the electromagnetic relay with a fault can also be photographed when the electromagnetic relay fails, and the fault photo of the electromagnetic relay in the first voltage test is used for subsequent troubleshooting of the electromagnetic relay. The electromagnetic relay after being unsealed is subjected to a force test. The specific steps of the force test are: testing the static pressure of the normally closed contact through a force measuring device and recording the second data. The electromagnetic relay after being unsealed is subjected to an overtravel test. The specific steps of the overtravel test are: placing metal sheets of different specifications between the armature and the magnetic steel, measuring the contact conduction, and recording the corresponding metal sheet thickness. The above corresponding metal sheet thickness is the third data. A variety of second test tests are performed on the electromagnetic relay after being unsealed, and the electromagnetic relay after being unsealed is comprehensively tested from multiple angles to obtain comprehensive multiple first sub-fault data.
[0049] In some embodiments, the predetermined voltage range includes a first predetermined voltage set and a second predetermined voltage set; the utilizing radiation to irradiate the electromagnetic relay and simultaneously control the electromagnetic relay to be energized within the predetermined voltage range includes: for each first voltage within the first predetermined voltage set, utilizing the radiation to irradiate the electromagnetic relay and simultaneously control the electromagnetic relay to receive the first voltage; for each second voltage within the second predetermined voltage set, utilizing the radiation to irradiate the electromagnetic relay and simultaneously control the electromagnetic relay to receive the second voltage.
[0050] In this embodiment, a control device is used to connect the positive and negative poles of the output voltage to the positive and negative poles of the relay coil, and the resistance test circuit is connected to the normally open and normally closed contact groups of the relay. The control device can adjust the output voltage change in real time according to the first predetermined voltage set by wireless control, and the control device can test and record the contact on-resistance in real time. During the X-ray irradiation process, the relay coil is slowly energized by the control device, illustratively from 0V to the rated voltage. Thereafter, the relay coil is slowly de-energized by the control device according to the second predetermined voltage, illustratively, the coil voltage gradually decreases from the rated voltage to 0V. The electromagnetic relay is energized to cause the voltage to undergo a variety of changes, laying the foundation for troubleshooting the electromagnetic relay after energization.
[0051] In some embodiments, the multiple first test experiments include a second voltage test, a noise test and a sealing test, and the multiple second fault data include fourth data, fifth data and sixth data; the multiple first test experiments are performed on the electromagnetic relay to obtain multiple second fault data, including: performing the second voltage test on the electromagnetic relay to obtain the fourth data, performing the noise test on the electromagnetic relay to obtain the fifth data, and performing the sealing test on the electromagnetic relay to obtain the sixth data.
[0052] In this embodiment, the electromagnetic relay is subjected to a second voltage test, and the specific process of the second voltage test is: the electromagnetic relay device is subjected to a room temperature electrical performance test (high temperature and low temperature tests are performed if necessary), and the device electrical parameters under the rated working voltage are recorded, and the above-mentioned device electrical parameters are the fourth data. It should be noted that if a low temperature test is performed and the electromagnetic relay fails at low temperature, the water vapor content inside the electromagnetic relay can be tested according to actual needs. The electromagnetic relay is subjected to a noise test, and the specific implementation process of the noise test is performed with reference to the existing noise test of the electromagnetic relay to obtain the fifth data. The electromagnetic relay is subjected to a sealing test, and the specific implementation process of the sealing test is performed with reference to the existing sealing test of the electromagnetic relay to obtain the sixth data.
[0053] Before the electromagnetic relay is disassembled for testing, it is also necessary to conduct a comprehensive test on the electromagnetic relay. On the one hand, since the internal structure of the electromagnetic relay may be changed when the electromagnetic relay is disassembled, it is necessary to conduct multiple second tests on the electromagnetic relay after taking photos of the internal structure of the electromagnetic relay and before the electromagnetic relay is disassembled to verify whether the internal structure of the electromagnetic relay has changed, so that the fault detection of the electromagnetic relay is rigorous. On the other hand, multiple first tests are conducted on the electromagnetic relay to obtain comprehensive multiple second fault data, which lays a data foundation for subsequent fault detection of the electromagnetic relay.
[0054] In some embodiments, the troubleshooting of the electromagnetic relay based on the multiple first fault data, the multiple first fault images, the multiple second fault data, the multiple second fault images and the multiple third fault data includes: in response to determining that there is at least one first predetermined fault data among the multiple first fault data, for each first predetermined fault data, searching a pre-constructed fault database for a first suspected fault corresponding to the first predetermined fault data; in response to determining that there is at least one second predetermined fault data among the multiple second fault data, for each second predetermined fault data, searching the fault database for a second suspected fault corresponding to the second predetermined fault data; in response to determining that there is at least one third predetermined fault data among the multiple third fault data, for each third predetermined fault data, searching the fault database for a third suspected fault corresponding to the third predetermined fault data; and locating the fault of the electromagnetic relay based on all first suspected faults, all second suspected faults, all third suspected faults, the multiple first fault images and the multiple second fault images.
[0055] In this embodiment, when the electromagnetic relay has a fault, the fault of the electromagnetic relay can be reflected by the fault data. The fault data is matched with the predetermined fault data. When the predetermined fault data exists in the fault data, the fault of the electromagnetic relay can be determined according to the predetermined fault data in the fault data. The specific process is as follows: when there is at least one first predetermined fault data among multiple first fault data, for each first predetermined fault data, the first suspected fault corresponding to the first predetermined fault data is searched in the fault database. The fault database is pre-constructed, and stores the predetermined fault data and the association relationship corresponding to the above predetermined fault data. It should be noted that, for the sake of search efficiency, the predetermined fault data and the association relationship corresponding to the above predetermined fault data can also be stored in the fault database according to the name of the test or test. When there is at least one second predetermined fault data among multiple second fault data, for each second predetermined fault data, the second suspected fault corresponding to the second predetermined fault data is searched in the fault database. When there is at least one third predetermined fault data among multiple third fault data, for each third predetermined fault data, the third suspected fault corresponding to the third predetermined fault data is searched in the fault database.
[0056] After all suspected faults are found, multiple first fault images and multiple second fault images are combined for analysis. For each suspected fault, the position corresponding to the suspected fault is found in the multiple first fault images and the multiple second fault images. In response to determining that the image corresponding to the position is a predetermined fault image, the structure of the electromagnetic relay corresponding to the predetermined fault image is determined as the location of the fault. Exemplarily, the electromagnetic relay includes multiple contacts, and the faulty contacts can be located by the above method. In addition, in response to determining that multiple suspected faults are the same fault, the suspected fault is determined to be a fault of the electromagnetic relay, and the position corresponding to the fault is found in the multiple first fault images and the multiple second fault images. The fault image is observed using an optical microscope. Through multiple suspected faults and multiple fault images, the purpose of accurately locating the fault of the electromagnetic relay is achieved.
[0057] It should be added that if the second fault data reflects that the internal structure of the electromagnetic relay has changed, and the fault data obtained when the electromagnetic relay was disassembled and inspected did not find any suspected faults, it means that the noise test in the various first test tests will cause the relay to vibrate, and the vibration may cause microscopic changes in the internal structure of the electromagnetic relay, resulting in the disappearance of the fault. In this case, it is determined that the fault of the electromagnetic relay is caused by the vibration of the external environment.
[0058] In some embodiments, the plurality of predetermined non-disassembly tests include: appearance test, resistance test and radiation test.
[0059] In this embodiment, the appearance of the electromagnetic relay is first inspected, mainly the housing, glass insulator, etc. are inspected, and whether the housing, glass insulator, etc. are damaged, cracked, or other abnormal phenomena are checked. If the above phenomena exist, they are recorded as the first fault data. The conduction condition and on-resistance between the contacts of the electromagnetic relay are tested, and the resistance and IV characteristic curve of the coil resistance and the rectifier bridge (if any) are tested, and the test results are recorded as the first fault data to verify its electrical performance. X-ray inspection is performed on each part of the relay in a natural state (non-powered), and photos are taken to record whether the coordination and structure of each component are abnormal. If the above abnormalities exist, they are recorded as the first fault data. When troubleshooting the electromagnetic relay, a relatively simple troubleshooting is first performed on the electromagnetic relay to avoid subsequent tests affecting the test results of various non-predetermined disassembly tests, which not only ensures the accuracy of the test results of various predetermined non-disassembly tests, but also comprehensively performs various tests, laying a data foundation for subsequent troubleshooting of the electromagnetic relay.
[0060] It should be noted that the method of the embodiment of the present application can be performed by a single device, such as a computer or server. The method of this embodiment can also be applied to a distributed scenario and completed by multiple devices cooperating with each other. In the case of such a distributed scenario, one of the multiple devices can only perform one or more steps in the method of the embodiment of the present application, and the multiple devices will interact with each other to complete the described method.
[0061] It should be noted that the above describes some embodiments of the present application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the above embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
[0062] Based on the same inventive concept, corresponding to any of the above-mentioned embodiment methods, the present application also provides a fault troubleshooting device for a sealed electromagnetic relay.
[0063] refer to Figure 2 , the sealed electromagnetic relay troubleshooting device comprises:
[0064] The first detection module 10 is configured to, in response to determining that the electromagnetic relay has a fault, perform a plurality of predetermined non-disassembly tests on the electromagnetic relay to obtain a plurality of first fault data.
[0065] The photographing module 20 is configured to irradiate the electromagnetic relay with radiation and control the electromagnetic relay to be energized within a predetermined voltage range. In response to determining that the fault has reappeared, the internal structure of the electromagnetic relay when the fault occurs is photographed to obtain multiple first fault images.
[0066] The test module 30 is configured to perform a plurality of first test tests on the electromagnetic relay to obtain a plurality of second fault data.
[0067] The second detection module 40 is configured to disassemble and detect the electromagnetic relay to obtain a plurality of second fault images and a plurality of third fault data.
[0068] The troubleshooting module 50 is configured to perform troubleshooting on the electromagnetic relay based on the multiple first fault data, the multiple first fault images, the multiple second fault data, the multiple second fault images and the multiple third fault data.
[0069] Through the above device, in response to determining that the electromagnetic relay has a fault, the electromagnetic relay is subjected to multiple predetermined non-disassembly tests to obtain multiple first fault data, thereby achieving the purpose of initially and accurately troubleshooting the electromagnetic relay fault. The electromagnetic relay is irradiated with radiation, and the electromagnetic relay is controlled to be energized according to a predetermined voltage range. In response to determining that the fault is recurring, the internal structure of the electromagnetic relay when the fault occurs is photographed to obtain multiple first fault images, and the internal structure of the electromagnetic relay in the working state is accurately obtained. The electromagnetic relay is subjected to multiple first test experiments to obtain multiple second fault data, thereby achieving the purpose of further accurately troubleshooting the electromagnetic relay fault. The electromagnetic relay is disassembled for testing to obtain multiple second fault images and multiple third fault data, which can intuitively and accurately reflect the faults existing in the internal structure of the electromagnetic relay. Based on the multiple first fault data, the multiple first fault images, the multiple second fault data, the multiple second fault images and the multiple third fault data, the electromagnetic relay is troubleshooted to achieve the purpose of comprehensively and accurately troubleshooting the electromagnetic relay fault.
[0070] In some embodiments, the second detection module 40 is further configured such that the multiple second fault images include multiple first sub-fault images and multiple second sub-fault images, and the multiple third fault data include multiple first sub-fault data and second sub-fault data; the electromagnetic relay is unsealed, and the electromagnetic relay after being unsealed is photographed to obtain the multiple first sub-fault images; multiple second test experiments are performed on the electromagnetic relay after being unsealed to obtain the multiple first sub-fault data; the electromagnetic relay after being unsealed is disassembled, the electromagnetic relay after being disassembled is scanned to obtain the multiple second sub-fault images, and the electromagnetic relay after being disassembled is subjected to an energy spectrum test to obtain the second sub-fault data.
[0071] In some embodiments, the second detection module 40 is further configured such that the multiple second test experiments include a first voltage test, a force test and an over-travel test, and the multiple first sub-fault data include first data, second data and third data; the first voltage test is performed on the electromagnetic relay after the unsealing to obtain the first data, the force test is performed on the electromagnetic relay after the unsealing to obtain the second data, and the over-travel test is performed on the electromagnetic relay after the unsealing to obtain the third data.
[0072] In some embodiments, the camera module 20 is further configured so that the predetermined voltage range includes a first predetermined voltage set and a second predetermined voltage set; for each first voltage in the first predetermined voltage set, the electromagnetic relay is irradiated with the radiation, and the electromagnetic relay is controlled to receive the first voltage; for each second voltage in the second predetermined voltage set, the electromagnetic relay is irradiated with the radiation, and the electromagnetic relay is controlled to receive the second voltage.
[0073] In some embodiments, the test module 30 is also configured such that the multiple first test tests include a second voltage test, a noise test and a sealing test, and the multiple second fault data include fourth data, fifth data and sixth data; the second voltage test is performed on the electromagnetic relay to obtain the fourth data, the noise test is performed on the electromagnetic relay to obtain the fifth data, and the sealing test is performed on the electromagnetic relay to obtain the sixth data.
[0074] In some embodiments, the troubleshooting module 50 is also configured to, in response to determining that there is at least one first predetermined fault data among the multiple first fault data, search for a first suspected fault corresponding to the first predetermined fault data in a pre-built fault database for each first predetermined fault data; in response to determining that there is at least one second predetermined fault data among the multiple second fault data, search for a second suspected fault corresponding to the second predetermined fault data in the fault database for each second predetermined fault data; in response to determining that there is at least one third predetermined fault data among the multiple third fault data, search for a third suspected fault corresponding to the third predetermined fault data in the fault database for each third predetermined fault data; and locate the fault of the electromagnetic relay based on all the first suspected faults, all the second suspected faults, all the third suspected faults, the multiple first fault images and the multiple second fault images.
[0075] In some embodiments, the first detection module 10 is further configured so that the plurality of predetermined non-disassembly detections include: appearance detection, resistance detection and radiation detection.
[0076] For the convenience of description, the above device is described in terms of functions divided into various modules. Of course, when implementing the present application, the functions of each module can be implemented in the same or multiple software and / or hardware.
[0077] The device of the above embodiment is used to implement the corresponding sealed electromagnetic relay fault troubleshooting method in any of the above embodiments, and has the beneficial effects of the corresponding method embodiment, which will not be described in detail here.
[0078] Based on the same inventive concept, corresponding to any of the above-mentioned embodiments and methods, the present application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the sealed electromagnetic relay troubleshooting method as described in any of the above embodiments is implemented.
[0079] Figure 3 A more specific schematic diagram of the hardware structure of an electronic device provided in this embodiment is shown, and the device may include: a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040 are connected to each other through the bus 1050 in the device.
[0080] The processor 1010 can be implemented by a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.
[0081] The memory 1020 may be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 may store an operating system and other application programs. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program codes are stored in the memory 1020 and are called and executed by the processor 1010.
[0082] The input / output interface 1030 is used to connect the input / output module to realize information input and output. The input / output module can be configured in the device as a component (not shown in the figure), or it can be externally connected to the device to provide corresponding functions. The input device may include a keyboard, a mouse, a touch screen, a microphone, various sensors, etc., and the output device may include a display, a speaker, a vibrator, an indicator light, etc.
[0083] The communication interface 1040 is used to connect a communication module (not shown) to realize communication interaction between the device and other devices. The communication module can realize communication through a wired mode (such as USB, network cable, etc.) or a wireless mode (such as mobile network, WIFI, Bluetooth, etc.).
[0084] The bus 1050 includes a path that transmits information between the various components of the device (eg, the processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040).
[0085] It should be noted that, although the above device only shows the processor 1010, the memory 1020, the input / output interface 1030, the communication interface 1040 and the bus 1050, in the specific implementation process, the device may also include other components necessary for normal operation. In addition, it can be understood by those skilled in the art that the above device may also only include the components necessary for implementing the embodiments of the present specification, and does not necessarily include all the components shown in the figure.
[0086] The electronic device of the above embodiment is used to implement the corresponding sealed electromagnetic relay fault troubleshooting method in any of the above embodiments, and has the beneficial effects of the corresponding method embodiment, which will not be described in detail here.
[0087] Based on the same inventive concept, corresponding to any of the above-mentioned embodiment methods, the present application also provides a non-transitory computer-readable storage medium, wherein the non-transitory computer-readable storage medium stores computer instructions, and the computer instructions are used to enable the computer to execute the sealed electromagnetic relay troubleshooting method as described in any of the above embodiments.
[0088] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, read-only compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, tape disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device.
[0089] The computer instructions stored in the storage medium of the above embodiment are used to enable the computer to execute the troubleshooting method for the sealed electromagnetic relay as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0090] Based on the same concept, corresponding to any of the above-mentioned embodiment methods, the present application also provides a computer program product, including computer program instructions. When the computer program instructions are run on a computer, the computer executes the sealed electromagnetic relay troubleshooting method as described in any of the above embodiments, which has the beneficial effects of the corresponding method embodiments and will not be repeated here.
[0091] It should be noted that the embodiments of the present application can be further described in the following manner:
[0092] It is understandable that before using the technical solutions of each embodiment of the present disclosure, the type, scope of use, usage scenarios, etc. of the personal information involved will be informed to the user in an appropriate manner, and the user's authorization will be obtained.
[0093] For example, in response to receiving an active request from a user, a prompt message is sent to the user to clearly remind the user that the operation requested to be performed will require obtaining and using the user's personal information. Thus, the user can independently choose whether to provide personal information to software or hardware such as an electronic device, application, server, or storage medium that performs the operation of the technical solution of the present disclosure according to the prompt message.
[0094] As an optional but non-limiting implementation, in response to receiving the user's active request, the prompt information may be sent to the user in the form of a pop-up window, in which the prompt information may be presented in text form. In addition, the pop-up window may also carry a selection control for the user to choose "agree" or "disagree" to provide personal information to the electronic device.
[0095] It is understandable that the above notification and the process of obtaining user authorization are merely illustrative and do not constitute a limitation on the implementation of the present disclosure. Other methods that meet relevant laws and regulations may also be applied to the implementation of the present disclosure.
[0096] A person skilled in the art should understand that the discussion of any of the above embodiments is merely illustrative and is not intended to imply that the scope of the present application is limited to these examples. In line with the concept of the present application, the technical features in the above embodiments or different embodiments may be combined, the steps may be implemented in any order, and there are many other variations of the different aspects of the embodiments of the present application as described above, which are not provided in detail for the sake of simplicity.
[0097] In addition, to simplify the description and discussion, and in order not to make the embodiments of the present application difficult to understand, the known power supply / ground connection with the integrated circuit (IC) chip and other components may or may not be shown in the provided drawings. In addition, the device can be shown in the form of a block diagram to avoid making the embodiments of the present application difficult to understand, and this also takes into account the fact that the details of the implementation of these block diagram devices are highly dependent on the platform to be implemented in the embodiments of the present application (that is, these details should be fully within the scope of understanding of those skilled in the art). In the case of elaborating specific details (e.g., circuits) to describe exemplary embodiments of the present application, it is obvious to those skilled in the art that the embodiments of the present application can be implemented without these specific details or when these specific details are changed. Therefore, these descriptions should be considered to be illustrative rather than restrictive.
[0098] Although the present application has been described in conjunction with specific embodiments of the present application, many replacements, modifications and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may use the embodiments discussed.
[0099] The embodiments of the present application are intended to cover all such substitutions, modifications and variations that fall within the broad scope of the present application. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the embodiments of the present application should be included in the protection scope of the present application.
Claims
1. A method for troubleshooting a sealed electromagnetic relay, characterized in that: include: In response to determining that the electromagnetic relay is faulty, performing a plurality of predetermined non-disassembly tests on the electromagnetic relay to obtain a plurality of first fault data; irradiating the electromagnetic relay with radiation, and controlling the electromagnetic relay to be energized within a predetermined voltage range, and in response to determining that the fault has reappeared, photographing the internal structure of the electromagnetic relay when the fault occurs, to obtain a plurality of first fault images; Performing a plurality of first test experiments on the electromagnetic relay to obtain a plurality of second fault data; Disassembling and testing the electromagnetic relay to obtain a plurality of second fault images and a plurality of third fault data; Based on the multiple pieces of first fault data, the multiple pieces of first fault images, the multiple pieces of second fault data, the multiple pieces of second fault images and the multiple pieces of third fault data, troubleshooting is performed on the electromagnetic relay.
2. The method according to claim 1, characterized in that The plurality of second fault images include a plurality of first sub-fault images and a plurality of second sub-fault images, and the plurality of third fault data include a plurality of first sub-fault data and second sub-fault data; The electromagnetic relay is disassembled for testing to obtain a plurality of second fault images and a plurality of third fault data, including: Unsealing the electromagnetic relay and photographing the unsealed electromagnetic relay to obtain the plurality of first sub-fault images; Performing a plurality of second test experiments on the unsealed electromagnetic relay to obtain the plurality of first sub-fault data; The unsealed electromagnetic relay is disassembled, the disassembled electromagnetic relay is scanned to obtain the plurality of second sub-fault images, and an energy spectrum test is performed on the disassembled electromagnetic relay to obtain the second sub-fault data.
3. The method according to claim 2, characterized in that The plurality of second test experiments include a first voltage test, a stress test and an over-travel test, and the plurality of first sub-fault data include first data, second data and third data; The performing of a plurality of second test experiments on the unsealed electromagnetic relay to obtain the plurality of first sub-fault data includes: The first voltage test is performed on the unsealed electromagnetic relay to obtain the first data, the force test is performed on the unsealed electromagnetic relay to obtain the second data, and the overtravel test is performed on the unsealed electromagnetic relay to obtain the third data.
4. The method according to claim 1, characterized in that: The predetermined voltage range includes a first predetermined voltage set and a second predetermined voltage set; The method of irradiating the electromagnetic relay with radiation and controlling the electromagnetic relay to be energized within a predetermined voltage range includes: For each first voltage in the first predetermined voltage set, irradiating the electromagnetic relay with the radiation, and controlling the electromagnetic relay to receive the first voltage; For each second voltage in the second predetermined voltage set, the electromagnetic relay is irradiated with the radiation, and the electromagnetic relay is controlled to receive the second voltage.
5. The method according to claim 1, characterized in that The plurality of first test experiments include a second voltage test, a noise test and a sealing test, and the plurality of second fault data include fourth data, fifth data and sixth data; The electromagnetic relay is subjected to a plurality of first test experiments to obtain a plurality of second fault data, including: The second voltage test is performed on the electromagnetic relay to obtain the fourth data, the noise test is performed on the electromagnetic relay to obtain the fifth data, and the sealing test is performed on the electromagnetic relay to obtain the sixth data.
6. The method according to claim 1, characterized in that The method of troubleshooting the electromagnetic relay based on the plurality of first fault data, the plurality of first fault images, the plurality of second fault data, the plurality of second fault images and the plurality of third fault data includes: In response to determining that at least one first predetermined fault data exists among the plurality of first fault data, searching, for each first predetermined fault data, a first suspected fault corresponding to the first predetermined fault data in a pre-built fault database; In response to determining that at least one second predetermined fault data exists among the plurality of second fault data, searching, for each second predetermined fault data, in the fault database for a second suspected fault corresponding to the second predetermined fault data; In response to determining that at least one third predetermined fault data exists among the plurality of third fault data, searching, for each third predetermined fault data, in the fault database for a third suspected fault corresponding to the third predetermined fault data; Based on all the first suspected faults, all the second suspected faults, all the third suspected faults, the multiple first fault images and the multiple second fault images, the fault of the electromagnetic relay is located.
7. The method according to claim 1, characterized in that The plurality of predetermined non-disassembly tests include: appearance test, resistance test and radiation test.
8. A sealed electromagnetic relay troubleshooting device, characterized in that: include: A first detection module is configured to, in response to determining that the electromagnetic relay is faulty, perform a plurality of predetermined non-disassembly detections on the electromagnetic relay to obtain a plurality of first fault data; a photographing module configured to irradiate the electromagnetic relay with radiation and control the electromagnetic relay to be energized within a predetermined voltage range, and in response to determining that the fault is recurring, photograph the internal structure of the electromagnetic relay when the fault occurs to obtain a plurality of first fault images; A test module, configured to perform a plurality of first test tests on the electromagnetic relay to obtain a plurality of second fault data; A second detection module is configured to disassemble and detect the electromagnetic relay to obtain a plurality of second fault images and a plurality of third fault data; The troubleshooting module is configured to perform troubleshooting on the electromagnetic relay based on the multiple first fault data, the multiple first fault images, the multiple second fault data, the multiple second fault images and the multiple third fault data.
9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the program, the method according to any one of claims 1 to 7 is implemented.
10. A non-transitory computer-readable storage medium storing computer instructions, characterized in that: The computer instructions are used to enable a computer to execute the method according to any one of claims 1 to 7.