Microscanning system and rapid focusing method thereof

Abstract

The invention provides a microscopic scanning system and a rapid focusing method of the microscopic scanning system. The microscopic scanning system comprises an objective table, a top block camera and a light source, an accommodating groove is formed in the objective table; the top block is slidably arranged on the objective table, and an object can be in contact with the inclined surface; an identification part is arranged on the top block; when the object enables the identification part of the top block to be located at the second position, a second posture of the object is obtained according to the second position of the identification part of the top block; the camera is used for obtaining the position of the identification part of the top block. The microscopic scanning system provided by the invention is not limited by a sample condition, and can realize the measurement of the inclination angle of the glass slide no matter whether a sample exists on the glass slide or not and how the height difference of the sample exists, so that the measurement stability is improved. In addition, under the condition that no extra measuring device is added, the inclination angle of the glass slide is measured through a visual algorithm by means of existing resources (a camera, an objective table, a light source and a top block) of a microscopic scanning system, and the system cost and the debugging cost are saved.

Description

Technical Field

[0001] The present invention relates to a microscopic scanning system and a fast focusing method of the microscopic scanning system. Background Art

[0002] Glass slides are widely used in biology, medicine, geology and other fields, such as making tissue sections, cell smears, mineral rock slices, etc. In the prior art, the glass slide is positioned by a limit groove when it is placed. In the process of placing the glass slide, due to operator errors or impurities such as oil stains and dyes on the bottom of the glass slide, the glass slide may tilt in the limit groove. Since the focus range of the tilted area exceeds the threshold, the image is out of focus, affecting the imaging quality.

[0003] The current solution to this problem is to measure the tilt angle of the slide and obtain the slide reference plane, thereby dynamically adjusting the focus range of the slide to achieve fast focusing.

[0004] The prior art US20210341281A1 obtains the inclination of the glass slide by measuring the distance between the glass slide and the objective lens at three different points on the surface of the glass slide. That is, by calculating the average value of these distances, the inclination of the glass slide can be determined, so as to dynamically adjust the focus range and achieve fast focusing. However, this method takes a long time to measure, and requires samples of uniform thickness at all three points. If the sample on the glass slide is thin or the height difference of the sample is large, the inclination of the glass slide cannot be effectively measured, and the stability of this method is poor.

[0005] In the prior art US10317663B2, a laser autofocus device is used to measure the plane tilt of a slide on a microscope. Regardless of whether a tissue sample is present, an autofocus measurement value can be obtained at a fixed position, a surface can be fitted based on the autofocus measurement value, and the tilt of the slide relative to the slide holder can be obtained based on the surface fitting, thereby reducing the subsequent focusing time. However, this method requires adding an additional laser autofocus device to the system, which increases the system cost and debugging cost.

[0006] Generally speaking, the commonly used methods for detecting the inclination of slides include: ① Use the autofocus algorithm to measure the distance between three different points on the surface of the slide and the objective lens, and measure the inclination of the slide by fitting the plane. However, this method takes a long time to measure and requires samples of uniform thickness at all three points, which places high demands on the sample. Therefore, the measurement stability is poor and it is not universal.

[0007] ② Use a laser measuring device to measure the slide inclination. This method requires adding an additional laser measuring device to the system, which increases the system cost.

[0008] Both of the above methods have their own shortcomings. Therefore, it is urgent to develop a slide inclination measurement device and method with good stability, short measurement time and no additional cost, so as to obtain the slide reference plane according to the slide inclination, dynamically adjust the slide focus range, and achieve fast focusing. Summary of the invention

[0009] The present invention provides a microscopic scanning system and a fast focusing method for the microscopic scanning system.

[0010] According to one aspect of the present disclosure, there is provided a microscopic scanning system, comprising: A loading platform, wherein a receiving groove is formed on the loading platform; the object can be placed in the receiving groove and positioned by the receiving groove; A top block, the top block is slidably disposed on the stage, and the top block includes an inclined surface, and the object can contact the inclined surface; the top block is provided with an identification portion; when the object is positioned in the accommodating groove and is in a first posture, the identification portion of the top block is located in a first position; when the object is positioned in the accommodating groove and the identification portion of the top block is located in a second position, a second posture of the object is obtained according to the second position of the identification portion of the top block; A camera, wherein the camera is used to obtain an image of the top block, so as to obtain a position of the identification portion of the top block through the image of the top block; A light source is used to provide light, wherein the light source and the camera are respectively located on both sides of the top block; wherein the identification portion is formed as a hollow gap, and the hollow gap is used for light to pass through, so that the light passing through the hollow gap can illuminate the camera.

[0011] According to the microscopic scanning system of one embodiment of the present disclosure, the receiving groove has a length direction, and the object is positioned by a surface in the length direction of the receiving groove.

[0012] According to one embodiment of the present disclosure, the microscopic scanning system further includes: A seat component is arranged on the loading platform, and the top block is slidably arranged on the seat component. When the top block slides on the seat component, the top block can approach or move away from the object.

[0013] According to a microscopic scanning system of one embodiment of the present disclosure, the hollow gap includes a length direction, and the length direction of the hollow gap is perpendicular or approximately perpendicular to the length direction of the accommodating groove.

[0014] According to the microscopic scanning system of one embodiment of the present disclosure, the inclined surface is inclined downward in a direction away from the object along the length direction of the accommodating groove.

[0015] According to the microscopic scanning system of one embodiment of the present disclosure, when the stage is disposed approximately horizontally, the angle between the inclined surface and the horizontal plane is 20-30°.

[0016] According to another aspect of the present disclosure, a fast focusing method of a microscopic scanning system is provided, comprising: Obtaining a first position of the identification portion of the top block of the object in a first posture; Placing the object in the receiving groove of the stage and positioning the object in the receiving groove; The top block is driven to move so that the identification portion of the top block is located at a second position, wherein when the identification portion of the top block is located at the second position, the inclined surface of the top block contacts the object; Obtaining a second posture of the object according to the first position and the second position of the identification portion of the top block, wherein the second posture of the object includes a tilt angle of the object; N scanning areas are set along the length direction of the object, where N is an integer greater than or equal to 1; each scanning area includes M scanning fields of view, where M is an integer greater than or equal to 1; According to the left end position of the object and the inclination angle of the object, the Z-axis coordinate of the center of the first scanning field of the first scanning area of ​​the object is calculated, and the first starting position of the camera in the height direction is obtained according to the Z-axis coordinate of the center of the first scanning field of the first scanning area of ​​the object. ; Starting from the first scanning field of view of the first scanning area, the camera or the stage is controlled to move so that the camera moves from the first starting position relative to the stage. Move up a distance h, and during the upward movement of the camera, collect images with a fixed step length S1, find the image with the highest clarity among the images collected during the entire movement process through the clarity evaluation algorithm, and obtain the second starting position in the height direction of the image with the highest clarity ; Control the movement of the camera or stage so that the camera is within the coordinate range relative to the stage. ±k movement, during the camera movement, the image is collected with a fixed step length S2, and the image with the highest clarity among the images collected during the entire camera movement process is found through the clarity evaluation algorithm to complete the scanning of the first scanning field of view of the first scanning area; and the Z-axis coordinate of the image with the highest clarity in the first scanning field of view is recorded ; Where k is the deviation value; Among them, for the jth scanning field of view in the first scanning area, the height difference △ between the center of the jth scanning field of view in the first scanning area of ​​the object and the center of the j-1th scanning field of view is obtained according to the inclination angle of the object 1，j-1，j; Get the Z-axis coordinate of the image with the highest definition in the j-1th scanning field of the first scanning area ; According to the height difference between the jth scanning field of view and the j-1th scanning field of view △ 1，j-1，j and Z-axis coordinate Get the second starting position of the jth scanning field of view ; Control the movement of the camera or stage so that the camera is within the coordinate range relative to the stage ±k movement, during the camera movement, collect images with a fixed step size S2, find the image with the highest clarity among the images collected during the entire camera movement process through the clarity evaluation algorithm, so as to complete the scanning of the jth scanning field of the first scanning area, and record the Z-axis coordinate of the image with the highest clarity in the jth scanning field of view ; where j is greater than or equal to 2 and less than or equal to M.

[0017] According to an embodiment of the present disclosure, a fast focusing method for a microscopic scanning system further includes: For the first scanning field of the i-th scanning area of ​​the object, the height difference between the center of the first scanning field of the i-th scanning area of ​​the object and the center of the first scanning field of the i-1-th scanning area is obtained according to the inclination angle of the object. i-1，i ; Wherein, i is greater than or equal to 2 and less than or equal to N; During the scanning process of the first scanning field of view of the i-1th scanning area, the camera is in the coordinate range The height coordinate corresponding to the image with the highest definition obtained when moving ±k ; According to the height coordinate And the height difference i-1，i ; Get the second starting position of the first scanning field of view of the i-th scanning area ; Control the camera within the coordinate range ±k movement, during the camera movement, collect images with a fixed step size S2, find the image with the highest clarity among the images collected during the entire camera movement process through the clarity evaluation algorithm, so as to complete the scanning of the first scanning field of the i-th scanning area; record the Z-axis coordinate of the image with the highest clarity of the first scanning field of the i-th scanning area ; For the jth scanning field of the i-th scanning area of ​​the object, control the camera or stage to move, and obtain the height difference between the jth scanning field of the i-th scanning area of ​​the object and the j-1th scanning field according to the inclination angle of the object. i，j-1，j ; Obtain the Z-axis coordinate of the image with the highest definition in the j-1th scanning field of the i-th scanning area ; According to the height difference between the jth scanning field of view and the j-1th scanning field of view △ i，j-1，j and Z-axis coordinate Get the second starting position of the jth scanning field of view ; Control the movement of the camera or stage so that the camera is within the coordinate range relative to the stage ±k moves, during the camera movement, images are collected with a fixed step size S2, and the image with the highest clarity among the images collected during the entire camera movement process is found through the clarity evaluation algorithm to complete the scanning of the jth scanning field of view in the ith scanning area, where j is greater than or equal to 2 and less than or equal to M.

[0018] According to a fast focusing method of a microscopic scanning system in one embodiment of the present disclosure, obtaining a first position of a marking portion of a top block of an object in a first posture includes: Keep the stage level; Placing the object on the stage so that the object is in a horizontal state and one end of the object is positioned by one end of the receiving groove of the stage in the length direction; Controlling the top block to move so that the inclined surface of the top block contacts the other end of the object; According to the current position of the top block, the first position of the identification portion of the top block is obtained.

[0019] According to a fast focusing method of a microscopic scanning system in one embodiment of the present disclosure, the first position and the second position of the identification portion of the top block are obtained by photographing the top block with a camera to obtain an image of the top block.

[0020] The technical solution of the present invention has the following beneficial effects: the present invention measures the pixel position of the hollow gap of the top block, without adding additional measuring devices, relying on the existing resources of the microscopic scanning system (camera, stage, light source, top block), and measures the tilt angle of the glass slide through a visual algorithm, thereby saving system cost and debugging cost. Moreover, the present invention is not subject to the sample situation, and can achieve stable measurement regardless of whether there is a sample on the slide or how the height difference of the sample is, thereby improving the stability of the measurement. In addition, the present invention does not need to take multiple images to calculate the distance between the slide and the objective lens, and only a single photo is needed to analyze the tilt angle of the slide, thereby realizing rapid measurement of the tilt angle of the slide. The present invention can realize rapid measurement without sample focusing, solves the problem of image defocusing and blurred imaging quality caused by slide tilt, and realizes rapid focusing by measuring the slide tilt angle, calculating the slide reference plane, and dynamically adjusting the focus range. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The accompanying drawings illustrate exemplary embodiments of the present disclosure and together with the description serve to explain the principles of the present disclosure. These drawings are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification.

[0022] Figure 1 It is a schematic structural diagram of a microscopic scanning system according to one embodiment of the present disclosure.

[0023] Figure 2 The present invention relates to a structure of a stage and a top block according to an embodiment of the present invention.

[0024] Figure 3 It is a schematic structural diagram of a top block according to an embodiment of the present disclosure.

[0025] Figure 4 It is a schematic structural diagram of a top block from another angle according to an embodiment of the present disclosure.

[0026] Figure 5 It is a working principle diagram of a microscopic scanning system according to one embodiment of the present disclosure.

[0027] Figure 6 is a flow chart of a fast focusing method of a microscopic scanning system according to one embodiment of the present disclosure.

[0028] The specific reference numerals in the figure are: 10 Stage 11 Accommodating groove 20 Objects 30 Top Block 31 Inclined Surface 32 Logo Department 40 Seat Components 50 Camera 60 light sources. DETAILED DESCRIPTION

[0029] The present disclosure is further described in detail below in conjunction with the accompanying drawings and implementations. It is understood that the specific implementations described herein are only used to explain the relevant content, rather than to limit the present disclosure. It should also be noted that, for ease of description, only the parts related to the present disclosure are shown in the accompanying drawings.

[0030] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments in the present disclosure can be combined with each other. The technical solution of the present disclosure will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0031] Unless otherwise specified, the exemplary embodiments / embodiments shown will be understood as providing exemplary features of various details of some ways in which the technical concept of the present disclosure can be implemented in practice. Therefore, unless otherwise specified, the features of the various embodiments / embodiments can be combined, separated, interchanged and / or rearranged without departing from the technical concept of the present disclosure.

[0032] The use of cross-hatching and / or shading in the accompanying drawings is generally used to make the boundaries between adjacent components clear. As such, unless otherwise specified, the presence or absence of cross-hatching or shading does not convey or indicate any preference or requirement for the specific materials, material properties, dimensions, proportions, commonalities between the components shown, and / or any other characteristics, attributes, properties, etc. of the components. In addition, in the accompanying drawings, the sizes and relative sizes of the components may be exaggerated for clarity and / or descriptive purposes. When the exemplary embodiments can be implemented differently, the specific process sequence can be performed in a different order than described. For example, two successively described processes can be performed substantially simultaneously or in an order opposite to the described order. In addition, the same figure numbers represent the same components.

[0033] When a component is referred to as being "on" or "over," "connected to," or "coupled to" another component, the component may be directly on, directly connected to, or directly coupled to the other component, or intervening components may be present. However, when a component is referred to as being "directly on," "directly connected to," or "directly coupled to" another component, there are no intervening components. For this purpose, the term "connected" may refer to a physical connection, an electrical connection, etc., with or without intervening components.

[0034] For descriptive purposes, the present disclosure may use spatially relative terms such as "under," "beneath," "under," "down," "over," "upper," "above," "higher," and "side (e.g., as in "sidewall")," to describe the relationship of one component to another (other) component as shown in the accompanying drawings. The spatially relative terms are intended to encompass different orientations of the device in use, operation, and / or manufacture in addition to the orientation depicted in the accompanying drawings. For example, if the device in the accompanying drawings is turned over, components described as "under" or "beneath" other components or features would subsequently be positioned "over" the other components or features. Thus, the exemplary term "under" can encompass both the "above" and "below" orientations. Furthermore, the device may be otherwise oriented (e.g., rotated 90 degrees or at other orientations), and the spatially relative descriptors used herein should be interpreted accordingly.

[0035] The terms used here are for the purpose of describing specific embodiments, and are not intended to be restrictive. As used here, unless the context clearly indicates otherwise, the singular forms "one (kind, person)" and "said (the)" are also intended to include plural forms. In addition, when the terms "comprise" and / or "include" and their variations are used in this specification, it is explained that there are stated features, integral bodies, steps, operations, parts, assemblies and / or their groups, but it is not excluded that there are or add one or more other features, integral bodies, steps, operations, parts, assemblies and / or their groups. It should also be noted that, as used here, the terms "substantially", "approximately" and other similar terms are used as approximate terms and not as degree terms, so that they are used to explain the inherent deviations of the measured values, calculated values ​​and / or the values ​​provided that will be recognized by those of ordinary skill in the art.

[0036] Figure 1 It is a schematic structural diagram of a microscopic scanning system according to one embodiment of the present disclosure. Figure 2 Detailed Description of the Preferred Embodiments The present invention relates to a structure of a stage 10 and a top block 30 according to an embodiment of the present disclosure.

[0037] like Figure 1 and Figure 2 As shown, the microscopic scanning system of the present disclosure may include components such as a stage 10 and a top block 30 .

[0038] The stage 10 of the present disclosure may also be referred to as a slide holder, and accordingly, the object 20 may be a slide, thereby the slide can be positioned in the slide holder.

[0039] Specifically, the stage 10 of the present disclosure is formed into a flat plate structure, and a receiving groove 11 is opened on the stage 10. The receiving groove 11 is substantially rectangular in shape. At this time, the receiving groove 11 includes a length direction and a width direction.

[0040] The object 20 is formed into a rectangular shape. At this time, the length of the object 20 is smaller than the length of the accommodating groove 11, and the width of the object 20 is substantially the same as the width of the accommodating groove 11, so that the object 20 can be placed in the accommodating groove 11 and positioned by the accommodating groove 11.

[0041] When the object 20 is placed in the receiving groove 11, the width direction of the object 20 will be positioned by the two side walls in the width direction of the receiving groove 11, and one end of the object 20 in the length direction will be positioned by a side wall (surface) in the length direction of the receiving groove 11; Figure 1 In the direction shown, the left end of the object 20 will be positioned by the side wall (surface) of the left end of the accommodating groove 11 .

[0042] The top block 30 is slidably disposed on the stage 10, that is, the top block 30 can change its position relative to the stage 10. In one embodiment, the top block 30 can directly contact the stage 10 and can slide relative to the stage 10. In another embodiment, the seat 40 is disposed on the stage 10, and the top block 30 is slidably disposed on the seat 40, so that the top block 30 can change its position relative to the stage 10.

[0043] In the present disclosure, when the top block 30 changes position relative to the stage 10, the top block 30 can approach or move away from the object 20. In a preferred embodiment, the moving direction of the top block 30 is the length direction of the accommodating groove 11.

[0044] Figure 3 is a schematic structural diagram of a top block 30 according to an embodiment of the present disclosure. Figure 4 3 is a schematic structural diagram of the top block 30 at another angle according to an embodiment of the present disclosure.

[0045] like Figure 3 and Figure 4 As shown, the top block 30 of the present disclosure includes an inclined surface 31, and the object 20 can contact the inclined surface 31; in a specific embodiment, the inclined surface 31 is inclined downward along the length direction of the accommodating groove 11 away from the object 20, so that the upper right corner of the object 20 of the present disclosure can contact the inclined surface 31.

[0046] In the present disclosure, when the stage 10 is arranged roughly horizontally, the angle β between the inclined surface 31 and the horizontal plane is 20-30°, thereby, the top block 30 of the present disclosure can achieve a balance in volume and moving distance, and has a better use effect. In other words, when the angle is less than 20°, the top block 30 will have a large volume and be inconvenient to use. When the angle is greater than 30°, the position change caused by the inclination of the object 20 cannot obviously cause the top block 30 to change its position, and therefore, the measurement accuracy of the inclination angle of the object 20 is poor.

[0047] Refer to Figure 3 and Figure 4, the top block 30 of the present disclosure is provided with an identification portion 32; in a preferred embodiment, the identification portion 32 is formed as a hollow slit, which is used for light to pass through, so that the light can be irradiated to the camera 50, thereby the camera 50 can obtain a clear image of the hollow slit, so that the camera 50 can accurately detect the position of the top block 30. In a preferred embodiment, the hollow slit includes a length direction, and the length direction of the hollow slit is perpendicular or substantially perpendicular to the length direction of the accommodating groove 11, thereby, the bright area will move in the width direction of the bright area, thereby the calculation process of the moving distance of the top block 30 will be simpler and more accurate.

[0048] In other words, the camera 50 of the present disclosure is used to obtain an image of the top block 30 , so as to obtain the position of the identification portion 32 of the top block 30 through the image of the top block 30 .

[0049] Refer to Figure 1 The microscopic scanning system of the present invention further includes a light source 60, which is used to provide light, wherein the light source 60 and the camera 50 are respectively located on both sides of the top block 30, thereby, the light emitted by the light source 60 can directly pass through the hollow gap and illuminate the camera 50, so that in the image obtained by the camera 50, there is a bright area about the hollow gap, and further, the position of the top block 30 can be determined according to the position of the bright area in the image, and accordingly, the position change of the top block 30 can also be obtained.

[0050] The bottom of the receiving groove 11 of the present disclosure is formed as a through-hole structure, and accordingly, the light emitted by the light source 60 can pass through the through-hole of the stage 10 and then pass through the hollow slit. Moreover, the through-hole of the receiving groove 11 has a certain length, so that the hollow slit of the top block 30 can always be connected with the through-hole of the receiving groove 11 during the entire moving path of the top block 30.

[0051] Specifically, the camera 50 of the present disclosure can be in a fixed position (a preset position) relative to the stage 10, so that the position change of the top block 30 can be reflected as a pixel change of the bright area in the image obtained by the camera 50. That is, when the first position and the second position of the top block 30 are obtained, the camera 50 is in the same position.

[0052] Figure 5 It is a working principle diagram of a microscopic scanning system according to one embodiment of the present disclosure.

[0053] When the object 20 is positioned in the receiving groove 11 and is in a first posture, the identification portion 32 of the top block 30 is located at a first position; when the object 20 is positioned in the receiving groove 11 and the identification portion 32 of the top block 30 is located at a second position, the second posture of the object 20 is obtained according to the second position of the identification portion 32 of the top block 30, wherein the second posture of the object 20 includes the tilt angle of the object 20 relative to the stage 10. That is, when the stage 10 is placed horizontally, the second posture of the object 20 includes the tilt angle of the object 20 relative to the horizontal plane.

[0054] Specifically, when the microscopic scanning system of the present disclosure is used for the first time, the microscopic scanning system can be calibrated. At this time, the object 20 can be placed in the receiving groove 11, and the object 20 is positioned by the receiving groove 11. That is, the left end of the object 20 contacts the surface of the left end of the length direction of the receiving groove 11. At this time, the object 20 can be positioned by the stage 10, and the object 20 and the stage 10 are both in a horizontal state (first posture), and the image of the top block 30 is captured by the camera 50, and the position of the identification part 32 of the top block 30 in the image is recorded (first position); at this time, the calibration of the microscopic scanning system is completed.

[0055] Those skilled in the art should know that the first posture may also be a non-horizontal state. That is to say, after knowing the corresponding relationship between the angle of an object 20 and the position of the top block 30, the microscopic scanning system of the present disclosure can obtain the tilt angle of the object 20 through the position of the top block 30.

[0056] Specifically, if Figure 5 As shown, when the object 20 and the stage 10 are arranged approximately in parallel (for example, the object 20 and the stage 10 are both arranged horizontally), the identification portion 32 of the top block 30 is located at the first position (or the top block 30 is located at the first position); that is, when the glass slide is placed normally, the glass slide contacts the top block 30 at point M, the hollow gap on the top block 30 is located at position X0, and the pixel coordinate corresponding to the X0 position is marked as the reference position; when the glass slide is tilted, the glass slide contacts the top block 30 at point N, the top block 30 moves to the right, and the hollow gap is located at position X1. It is verified by experiments that there is a fixed functional relationship between the tilt angle α of the glass slide and the pixel coordinate change ∆X of the gap (∆X = abs(X0-X1)), that is, the tilt angle α=F(∆X).

[0057] Generally speaking, the left end of the glass slide disclosed in the present invention is fixed in the receiving groove 11 (positioning slot) of the glass slide clamp, and the left end of the top block 30 is a bevel with a fixed angle. When the glass slide is tilted due to improper placement, impurities, etc., the right end of the glass slide contacts the inclined surface 31 of the top block 30 at different positions, resulting in the hollow gaps being in different positions. Therefore, the microscopic scanning system disclosed in the present invention can accurately obtain the tilt angle of the glass slide by moving the top block 30, thereby solving the technical problems mentioned in the background technology.

[0058] The microscopic scanning system disclosed in the present invention can use the existing resources of the microscopic scanning system (including the camera 50, the stage 10, the light source 60, etc.) to achieve efficient and rapid measurement of the slide tilt angle. Furthermore, the present invention also obtains the slide reference plane according to the slide tilt angle, narrows the slide focus range, and thus achieves rapid focusing.

[0059] Specifically, the microscopic scanning system disclosed in the present invention achieves stable measurement of the slide tilt angle without adding additional measuring devices, thus saving system costs.

[0060] Figure 6 is a flow chart of a fast focusing method of a microscopic scanning system according to one embodiment of the present disclosure.

[0061] like Figure 6 As shown, the present disclosure also provides a fast focusing method for a microscopic scanning system, which can be implemented by the above-mentioned microscopic scanning system. The fast focusing method for the microscopic scanning system may include: S110, obtaining a first position of an identification portion 32 of a top block 30 when the object 20 is in a first posture; S120, placing the object 20 in a receiving groove 11 of a stage 10, and positioning the object 20 in the receiving groove 11; S130, the top block 30 is driven to move so that the identification portion 32 of the top block 30 is located in a second position, wherein when the identification portion 32 of the top block 30 is located in the second position, the inclined surface 31 of the top block 30 is in contact with the object 20; S140, obtaining a first position of the identification portion 32 of the top block 30 according to the first position and the second position of the identification portion 32 of the top block 30; The second posture of the object 20 is obtained, wherein the second posture of the object 20 includes the tilt angle of the object 20; S150, N scanning areas are set along the length direction of the object 20, wherein N is an integer greater than or equal to 1; each scanning area includes M scanning fields of view, wherein M is an integer greater than or equal to 1; S160, according to the left end position of the object 20 and the tilt angle of the object 20, the Z-axis coordinate of the center of the first scanning field of view of the first scanning area of ​​the object 20 is calculated, and the first starting position of the camera 50 in the height direction is obtained according to the Z-axis coordinate of the center of the first scanning field of view of the first scanning area of ​​the object 20 S170, starting from the first scanning field of view of the first scanning area, control the camera 50 or the stage 10 to move so that the camera 50 moves relative to the stage 10 from the first starting position Move upward by a distance h, and during the upward movement of the camera 50, collect images with a fixed step length S1, find the image with the highest clarity among the images collected during the entire movement process through a clarity evaluation algorithm, and obtain the second starting position in the height direction of the image with the highest clarity S180, control the camera 50 or the stage 10 to move so that the camera 50 is within the coordinate range relative to the stage 10 ±k movement, during the movement of the camera 50, the image is collected with a fixed step length S2, and the image with the highest clarity among the images collected during the entire movement of the camera 50 is found through the clarity evaluation algorithm to complete the scanning of the first scanning field of view of the first scanning area; and the Z-axis coordinate of the image with the highest clarity in the first scanning field of view is recorded ; Wherein, for the jth scanning field of view in the first scanning area, the height difference △ between the jth scanning field of view and the j-1th scanning field of view in the first scanning area of ​​the object 20 is obtained according to the inclination angle of the object 20 1，j-1，j ; Get the Z-axis coordinate of the image with the highest definition in the j-1th scanning field of the first scanning area ; According to the height difference between the jth scanning field of view and the j-1th scanning field of view △ 1，j-1，j and Z-axis coordinate Get the second starting position of the jth scanning field of view ; Control the camera 50 or the stage 10 to move so that the camera 50 is within the coordinate range relative to the stage 10 ±k movement, during the movement of the camera 50, the image is collected with a fixed step length S2, and the image with the highest clarity among the images collected during the entire movement of the camera 50 is found through the clarity evaluation algorithm to complete the scanning of the jth scanning field of the first scanning area, and the Z-axis coordinate of the image with the highest clarity of the jth scanning field of view is recorded ; where j is greater than or equal to 2 and less than or equal to M.

[0062] The fast focusing method of the microscopic scanning system disclosed in the present invention will be described in detail below in combination with specific implementation forms.

[0063] S110 , obtaining a first position of the marking portion 32 of the top block 30 when the object 20 is in a first posture.

[0064] Specifically, obtaining the first position of the identification portion 32 of the top block 30 when the object 20 is in the first posture includes: S111, keeping the stage 10 in a horizontal state; S112, placing the object 20 in the stage 10, and making the object 20 in a horizontal state, and one end of the object 20 is positioned by one end in the length direction of the accommodating groove 11 of the stage 10; S113, controlling the movement of the top block 30 so that the inclined surface 31 of the top block 30 contacts the other end of the object 20; S114, obtaining the first position of the identification portion 32 of the top block 30 according to the current position of the top block 30.

[0065] S120 , placing the object 20 in the receiving groove 11 of the stage 10 , and positioning the object 20 in the receiving groove 11 .

[0066] In the present disclosure, when the object 20 is placed in the receiving groove 11 of the stage 10, the width direction of the object 20 will be positioned by the two side walls in the width direction of the receiving groove 11, and one end of the object 20 in the length direction will be positioned by a side wall (surface) in the length direction of the receiving groove 11; Figure 1 In the direction shown, the left end of the object 20 will be positioned by the side wall (surface) of the left end of the accommodating groove 11 .

[0067] S130 , the top block 30 is driven to move so that the identification portion 32 of the top block 30 is located at a second position, wherein when the identification portion 32 of the top block 30 is located at the second position, the inclined surface 31 of the top block 30 contacts the object 20 .

[0068] In the present disclosure, the top block 30 is driven to move, which may include two aspects: on the one hand, when the top block 30 is in the first position, when the object 20 is placed, the object 20 will drive the top block 30 to move; on the other hand, when the top block 30 is not in the first position, after the object 20 is placed in the accommodating groove 11, the top block 30 can be driven to move and make the top block 30 close to the object 20, so that the top block 30 can be located in the second position.

[0069] S140 , obtaining a second posture of the object 20 according to the first position and the second position of the identification portion 32 of the top block 30 .

[0070] In the present disclosure, the first position and the second position of the identification portion 32 of the top block 30 are obtained by photographing the top block 30 with the camera 50 to obtain an image of the top block 30 .

[0071] Specifically, the first position X0 and the second position X1 of the identification portion 32 of the top block 30 can be obtained by the following steps: S141, grayscale processing is performed on the image to obtain a grayscale image; and the grayscale image is processed using the OTSU algorithm to obtain a foreground area in the image, wherein the foreground area is a brighter area in the grayscale image. According to the shape and area of ​​the hollow gap, small areas and noise interference in the foreground area of ​​the image are eliminated.

[0072] S142. Set an area threshold according to the area of ​​the hollow gap, calculate the area of ​​at least one foreground area, and obtain the foreground area corresponding to the hollow gap according to the relationship between the area of ​​the at least one foreground area and the area threshold.

[0073] S143. For each row of pixels in the image, calculate the grayscale change value of adjacent pixels; when the grayscale change value is greater than a preset threshold, record the pixel on the right side of the adjacent pixels as a feature point Xk; wherein k is greater than or equal to 1 and less than or equal to P; and P is the number of rows in the foreground area corresponding to the hollow gap.

[0074] S144: When the number of feature points Xk is greater than a preset number threshold, calculate the average X coordinate of the feature points and obtain the first position X0 or the second position X1.

[0075] Then, the tilt angle α of the object 20 can be obtained according to the first position X0 and the second position X1.

[0076] S150, setting N scanning areas along the length direction of the object 20, where N is an integer greater than or equal to 1; each scanning area includes M scanning fields of view, where M is an integer greater than or equal to 1.

[0077] In the present disclosure, when the object 20 is a glass slide, the scanning area can be set according to the position of the tissue on the glass slide; in addition, these scanning areas can also be preset areas; the scanning areas of the present disclosure can be adjacent or non-adjacent, and the present disclosure does not limit this. Generally speaking, the scanning area is set to multiple.

[0078] In addition, considering the imaging parameters of the camera 50, the scanning field of view of the camera 50 for imaging one image is approximately 0.3 mm*0.2 mm; based on this, the scanning area can be divided into multiple adjacent scanning fields of view according to the size of the scanning area. In other words, in a scanning area, except for the case where the scanning area has only one scanning field of view, the scanning area has multiple adjacent scanning fields of view, and these scanning fields of view can be arranged in multiple rows and columns.

[0079] The scanning process of the first scanning area and other scanning areas will be described below in detail.

[0080] For the first scanning area, the fast focusing method of the microscopic scanning system disclosed in the present invention includes: S160, calculating the Z-axis coordinate of the center of the first scanning field of view of the first scanning area of ​​the object 20 according to the left end position of the object 20 and the tilt angle of the object 20, and obtaining the first starting position of the camera 50 in the height direction according to the Z-axis coordinate of the center of the first scanning field of view of the first scanning area of ​​the object 20 .

[0081] Specifically, for a microscopic scanning system, the left end position of the object 20 is a fixed data, and the left end position of the object 20 can be represented by a three-dimensional coordinate.

[0082] When the first scanning area of ​​the object 20 is determined, the position of the first scanning area on the object 20 will be determined. At this time, the Z-axis coordinate of the center of the first scanning field of view of the first scanning area can be calculated based on the left end position of the object 20 and the tilt angle of the object 20. In other words, the center of the first scanning field of view of the first scanning area can be represented by three-dimensional coordinates, wherein the X-coordinate and the Y-coordinate of the three-dimensional coordinates correspond to the position that the camera 50 needs to reach in the horizontal plane (at this time, the stage 10 can be controlled to move so that the camera 50 is located directly above the first scanning field of view of the first scanning area). The Z-axis coordinate of the three-dimensional coordinate is the Z-axis coordinate of the center of the first scanning field of view of the first scanning area.

[0083] In the present disclosure, the first scanning field of view may be any scanning field of view in the first scanning area. Preferably, it may be the scanning field of view at the center of the first scanning area. Of course, the first scanning field of view may also be the scanning field of view at the corner of the first scanning area.

[0084] Accordingly, since the distance between the camera 50 and the object 20 is a constant, the first starting position of the camera 50 in the height direction is obtained according to the Z-axis coordinate of the center of the first scanning field of view of the first scanning area of ​​the object 20. .

[0085] S170, starting from the first scanning field of view of the first scanning area, controlling the camera 50 or the stage 10 to move so that the camera 50 moves from a first starting position relative to the stage 10 Move upward by a distance h, during the upward movement of the camera 50 (i.e., the camera 50 moves from the first starting position Move up to +h process, which can also be called the coarse sampling process), collects images with a fixed step size S1, finds the image with the highest clarity among the images collected during the entire moving process through the clarity evaluation algorithm, and obtains the second starting position in the height direction of the image with the highest clarity . Where h is the theoretical height difference between the sample and the slide.

[0086] When the camera 50 is driven to move to a position directly above the center of the first scanning field of view of the first scanning area, the height of the camera 50 can be controlled to be at the first starting position. , and controls the camera 50 from a first starting position Move upward by a distance h, so that the clearest image can be quickly located, and this location is the second starting position. The fast focusing method of the microscopic scanning system disclosed in the present invention will start from the second starting position Reacquire the image.

[0087] S180, controlling the camera 50 or the stage 10 to move so that the camera 50 is within the coordinate range relative to the stage 10 ±k movement, in the process of camera 50 moving (also called fine sampling process movement process), collect images with a fixed step size S2, find the image with the highest clarity among the images collected during the entire camera 50 movement process through the clarity evaluation algorithm, so as to complete the scanning of the first scanning field of view of the first scanning area; and record the Z-axis coordinate of the image with the highest clarity in the first scanning field of view , at this time, the scanning of the first scanning field of the first scanning area is completed. Among them, S2 is smaller than S1.

[0088] In the present disclosure, the scanning of other scanning fields of the first scanning area can be achieved by adopting the following steps: For the j-th scanning field of the first scanning area, the height difference △ between the center of the j-th scanning field of the first scanning area of ​​the object 20 and the center of the j-1-th scanning field of the object 20 is obtained according to the inclination angle of the object 20 1，j-1，j ; Obtain the Z-axis coordinate of the highest definition image of the j-1th scanning field of the first scanning area (the highest definition image during the fine sampling movement) ; According to the height difference between the jth scanning field of view and the j-1th scanning field of view △ 1，j-1，j and Z-axis coordinate Get the second starting position of the jth scanning field of view ; Control the camera 50 or the stage 10 to move so that the camera 50 is within the coordinate range relative to the stage 10 ±k movement, during the movement of the camera 50, the image is collected with a fixed step length S2, and the image with the highest clarity among the images collected during the entire movement of the camera 50 is found through the clarity evaluation algorithm to complete the scanning of the j-th scanning field of view in the first scanning area, and the Z-axis coordinate of the image with the highest clarity of the j-th scanning field of view (the image with the highest clarity during the fine sampling movement process) is recorded ; where j is greater than or equal to 2 and less than or equal to M.

[0089] That is, when the first scanning area includes a plurality of scanning fields arranged in an array, the stage 10 can be controlled to move in a two-dimensional zigzag manner so that the j-1th scanning field and the j-th scanning field are adjacent to each other. At this time, when the center of the j-1th scanning field and the center of the j-th scanning field are distributed along the width direction of the stage 10 (i.e., along the length direction of the stage 10, there is no difference between the center of the j-1th scanning field and the center of the j-1th scanning field), the height difference △ between the center of the j-1th scanning field of the first scanning area and the center of the j-1th scanning field of the first scanning area is 1，j-1，j is 0.

[0090] In addition, along the length direction of the stage 10, when there is a difference between the center of the j-1th scanning field of view and the center of the j-1th scanning field of view, the height difference △ between the center of the j-1th scanning field of view in the first scanning area 1，j-1，j Not 0; at this time, the second starting position of the jth scanning field of view can be obtained ; and based on the second starting position, complete the scanning of the j-th scanning field of view.

[0091] In the fast focusing method of the microscopic scanning system disclosed in the present invention, when it is necessary to scan the i-th scanning area of ​​the object 20, it can be implemented by the following steps: S210, for the first scanning field of view of the i-th scanning area of ​​the object 20, according to the inclination angle of the object 20, obtain the height difference △ between the center of the first scanning field of view of the i-th scanning area of ​​the object 20 and the center of the first scanning field of view of the i-1-th scanning area i-1，i ; Wherein, i is greater than or equal to 2 and less than or equal to N; S220, during the scanning process of obtaining the first scanning field of view of the i-1th scanning area, the camera 50 is within the coordinate range The height coordinate corresponding to the image with the highest resolution obtained during ±k movement (fine sampling movement process) ; S230, according to the height coordinate And the height difference i-1，i ; Get the second starting position of the first scanning field of view of the i-th scanning area ; S240, control the camera 50 within the coordinate range ±k movement, during the movement of the camera 50, the image is collected with a fixed step size S2, and the image with the highest clarity among the images collected during the entire movement process of the camera 50 (fine sampling movement process) is found through the clarity evaluation algorithm to complete the scanning of the first scanning field of the i-th scanning area; the Z-axis coordinate of the image with the highest clarity of the first scanning field of the i-th scanning area is recorded S250, for the jth scanning field of the i-th scanning area of ​​the object 20, control the camera 50 or the stage 10 to move, and obtain the height difference between the jth scanning field of the i-th scanning area of ​​the object 20 and the j-1th scanning field according to the inclination angle of the object 20 △ i，j-1，j ; Obtain the Z-axis coordinate of the image with the highest definition in the j-1th scanning field of the i-th scanning area ; According to the height difference between the jth scanning field of view and the j-1th scanning field of view △ i，j-1，j and Z-axis coordinate Get the second starting position of the jth scanning field of view ; Control the camera 50 or the stage 10 to move so that the camera 50 is within the coordinate range relative to the stage 10 ±k movements, during the movement process of the camera 50 (fine sampling movement process), images are collected with a fixed step size S2, and the image with the highest clarity among the images collected during the entire movement process of the camera 50 is found through the clarity evaluation algorithm to complete the scanning of the jth scanning field of view of the ith scanning area, where j is greater than or equal to 2 and less than or equal to M.

[0092] In the present disclosure, when the i-th scanning area is scanned, it can be implemented based on the data in the previous scanning process, thereby greatly improving the operating speed of the fast focusing method of the microscopic scanning system of the present disclosure.

[0093] Specifically, when the positional relationship between the i-1th scanning area and the i-th scanning area is known, the center coordinates of the first scanning field of view of the i-th scanning area of ​​the object 20 can be obtained according to the tilt angle of the object 20. Similar to the scanning process of the first scanning area, the X coordinate and Y coordinate of the center coordinate of the first scanning field of view of the i-th scanning area are used to indicate the position that the camera 50 needs to reach in the horizontal plane, and accordingly, the height difference Δ can be obtained according to the Z coordinate of the center coordinate of the first scanning field of view of the i-th scanning area and the Z coordinate of the center coordinate of the first scanning field of view of the i-1th scanning area. i-1，i .

[0094] Similar to the scanning process of the first scanning area, during the scanning process of the i-1th scanning area, the coordinates of the camera 50 in the coordinate range can be obtained. The height coordinate corresponding to the image with the highest definition obtained when moving ±k .

[0095] Then, the fast focusing method of the microscopic scanning system disclosed in the present invention can be based on the height coordinate To obtain the second starting position of the i-th scanning area , and according to the second starting position By controlling the camera 50 to move once, the scanning operation of the first scanning field of the i-th scanning area can be completed. Therefore, the fast focusing method of the microscope scanning system disclosed in the present invention can quickly complete the scanning operation of multiple scanning areas, reducing the time of the entire scanning process.

[0096] In general, the present invention measures the pixel position of the hollow gap of the top block 30, without adding additional measuring devices, relying on the existing resources of the microscopic scanning system (camera, stage, light source, top block), and measures the tilt angle of the slide through a visual algorithm, thereby saving system cost and debugging cost. Moreover, the present invention is not subject to the sample situation, and can achieve stable measurement regardless of whether there is a sample on the slide or how the height difference of the sample is, thereby improving the stability of the measurement. In addition, the present invention does not need to take multiple images to calculate the distance between the slide and the objective lens, but only needs a single photo to analyze the inclination of the slide, thereby realizing rapid measurement of the inclination of the slide. The present invention can achieve rapid measurement without sample focusing, solves the problem of image defocusing and blurred imaging quality caused by slide tilt, and realizes rapid focusing by measuring the slide inclination, calculating the slide reference plane, and dynamically adjusting the focus range.

[0097] In the description of this specification, the description with reference to the terms "one embodiment / method", "some embodiments / methods", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment / method or example are included in at least one embodiment / method or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment / method or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments / methods or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments / methods or examples described in this specification and the features of the different embodiments / methods or examples, unless they are contradictory.

[0098] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0099] Those skilled in the art should understand that the above embodiments are only for the purpose of clearly illustrating the present disclosure, and are not intended to limit the scope of the present disclosure. For those skilled in the art, other changes or modifications may be made based on the above disclosure, and these changes or modifications are still within the scope of the present disclosure.

Claims

1. A microscopic scanning system, characterized in that: include: A loading platform, wherein a receiving groove is formed on the loading platform; the object can be placed in the receiving groove and positioned by the receiving groove; a top block slidably disposed on the stage and comprising an inclined surface with which the object can contact; a marking portion being disposed on the top block; when the object is positioned in the accommodating recess and is in a first posture, the marking portion of the top block is located in a first position; when the object is positioned in the accommodating recess and the marking portion of the top block is located in a second position, a second posture of the object is obtained according to the second position of the marking portion of the top block; a camera, the camera being used to obtain an image of the top block, so as to obtain a position of the identification portion of the top block through the image of the top block; A light source is used to provide light, wherein the light source and the camera are respectively located on both sides of the top block; wherein the identification portion is formed as a hollow gap, and the hollow gap is used for light to pass through, so that the light passing through the hollow gap can illuminate the camera.

2. The microscopic scanning system according to claim 1, characterized in that: The receiving groove has a length direction, and the object is positioned by a surface in the length direction of the receiving groove.

3. The microscopic scanning system according to claim 1, characterized in that: Also includes: A seat component is provided on the loading platform, and the top block is slidably provided on the seat component. When the top block slides on the seat component, the top block can approach or move away from the object.

4. The microscopic scanning system according to claim 1, characterized in that: The hollow slit includes a length direction, and the length direction of the hollow slit is perpendicular or substantially perpendicular to the length direction of the accommodating groove.

5. The microscopic scanning system according to claim 1, characterized in that: The inclined surface is inclined downward along a direction away from the object in the length direction of the accommodating groove.

6. The microscopic scanning system according to claim 5, characterized in that: When the stage is arranged substantially horizontally, the angle between the inclined surface and the horizontal plane is 20-30°.

7. A fast focusing method for a microscopic scanning system, characterized in that: include: obtaining a first position of the identification portion of the top block of the object in a first posture; Placing the object in the receiving groove of the stage and positioning the object in the receiving groove; The top block is driven to move so that the identification portion of the top block is located at a second position, wherein when the identification portion of the top block is located at the second position, the inclined surface of the top block contacts the object; Obtaining a second posture of the object according to the first position and the second position of the identification portion of the top block, wherein the second posture of the object includes a tilt angle of the object; N scanning areas are set along the length direction of the object, where N is an integer greater than or equal to 1; each scanning area includes M scanning fields of view, where M is an integer greater than or equal to 1; According to the left end position of the object and the tilt angle of the object, the Z-axis coordinate of the center of the first scanning field of the first scanning area of ​​the object is calculated, and the first starting position of the camera in the height direction is obtained according to the Z-axis coordinate of the center of the first scanning field of the first scanning area of ​​the object. ; Starting from the first scanning field of view of the first scanning area, the camera or the stage is controlled to move so that the camera moves from the first starting position relative to the stage. Move up a distance h, and capture images with a fixed step size S1 during the upward movement of the camera. Use the clarity evaluation algorithm to find the image with the highest clarity among the images captured during the entire movement process, and obtain the second starting position in the height direction of the image with the highest clarity ; Control the movement of the camera or stage so that the camera is within the coordinate range relative to the stage ±k movement, during the camera movement process, collect images with a fixed step size S2, and use the clarity evaluation algorithm to find the image with the highest clarity among the images collected during the entire camera movement process to complete the scanning of the first scanning field of view in the first scanning area; and record the Z-axis coordinate of the image with the highest clarity in the first scanning field of view ; Where k is the deviation value; Among them, for the jth scanning field of view in the first scanning area, the height difference △ between the center of the jth scanning field of view in the first scanning area of ​​the object and the center of the j-1th scanning field of view is obtained according to the inclination angle of the object 1，j-1，j ; Get the Z-axis coordinate of the image with the highest resolution in the j-1th scanning field of the first scanning area ; According to the height difference between the jth scanning field of view and the j-1th scanning field of view △ 1，j-1，j and Z-axis coordinates Get the second starting position of the jth scanning field of view ; Control the movement of the camera or stage so that the camera is within the coordinate range relative to the stage ±k movement, during the camera movement, collect images with a fixed step size S2, find the image with the highest clarity among the images collected during the entire camera movement through the clarity evaluation algorithm, to complete the scanning of the j-th scanning field of the first scanning area, and record the Z-axis coordinate of the image with the highest clarity of the j-th scanning field of view ; where j is greater than or equal to 2 and less than or equal to M.

8. The fast focusing method of a microscopic scanning system according to claim 7, characterized in that: Also includes: For the first scanning field of the i-th scanning area of ​​the object, the height difference △ between the center of the first scanning field of the i-th scanning area of ​​the object and the center of the first scanning field of the i-1-th scanning area is obtained according to the inclination angle of the object i-1，i ; Wherein, i is greater than or equal to 2 and less than or equal to N; During the scanning process of the first scanning field of the i-1th scanning area, the camera is in the coordinate range The height coordinate corresponding to the image with the highest definition obtained when ±k is moved ; According to the height coordinate and height difference i-1，i ; Get the second starting position of the first scanning field of view of the i-th scanning area ; Control the camera within the coordinate range ±k movement, during the camera movement process, collect images with a fixed step size S2, and use the clarity evaluation algorithm to find the image with the highest clarity among the images collected during the entire camera movement process to complete the scanning of the first scanning field of the i-th scanning area; record the Z-axis coordinate of the image with the highest clarity in the first scanning field of the i-th scanning area ; For the jth scanning field of the i-th scanning area of ​​the object, control the movement of the camera or stage, and obtain the height difference between the jth scanning field of the i-th scanning area of ​​the object and the j-1th scanning field according to the tilt angle of the object. i，j-1，j ; Get the Z-axis coordinate of the image with the highest definition in the j-1th scanning field of the i-th scanning area ; According to the height difference between the jth scanning field of view and the j-1th scanning field of view △ i，j-1，j and Z-axis coordinates Get the second starting position of the jth scanning field of view ; Control the movement of the camera or stage so that the camera is within the coordinate range relative to the stage ±k moves, during the camera movement, images are collected with a fixed step size S2, and the image with the highest clarity among the images collected during the entire camera movement process is found through the clarity evaluation algorithm to complete the scanning of the jth scanning field of the i-th scanning area, where j is greater than or equal to 2 and less than or equal to M.

9. The fast focusing method of a microscopic scanning system according to claim 7, characterized in that: Obtaining a first position of the identification portion of the top block of the object in the first posture includes: Keep the stage level; Placing the object on the stage so that the object is in a horizontal state and one end of the object is positioned by one end of the receiving groove of the stage in the length direction; Controlling the movement of the top block so that the inclined surface of the top block contacts the other end of the object; According to the current position of the top block, a first position of the identification portion of the top block is obtained.

10. The fast focusing method of a microscopic scanning system according to claim 7, characterized in that: The first position and the second position of the identification portion of the top block are obtained by photographing the top block with a camera to obtain an image of the top block.

Images