Service life prediction method and device of eMMC equipment and electronic equipment

By obtaining the life change speed of the eMMC device and predicting the remaining life based on the correspondence between the life index parameters and the amount of written data, the problem of inaccurate life prediction in the prior art is solved, and higher life prediction accuracy and early alarm capability are achieved.

CN119673265APending Publication Date: 2025-03-21XINHUASAN INFORMATION TECH CO LTD
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Patent Information

Application Number
CN202411719144.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-27
Publication Date
2025-03-21

AI Technical Summary

Technical Problem

The life prediction method of existing eMMC devices relies on the inaccurate life index parameters in the EXT_CSD register, resulting in insufficient accuracy of life prediction and ineffective storage exception problems.

Method used

By obtaining the life change speed of the eMMC device, the remaining life is predicted based on the correspondence between the life index parameters and the amount of written data, and the accuracy of life prediction is improved.

Benefits of technology

It improves the accuracy of eMMC device life prediction, can alert in advance and avoid storage abnormalities caused by the use of eMMC device life.

✦ Generated by Eureka AI based on patent content.

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Patent Text Reader

Abstract

The embodiment of the invention provides a life prediction method and device of eMMC equipment and electronic equipment. In the embodiment of the invention, the service life prediction of the eMMC equipment does not need to be carried out by acquiring inaccurate service life index parameters used for indicating the used service life of the eMMC equipment from an EXTCSD register of the eMMC equipment; instead, the service life change speed of the eMMC equipment is obtained firstly, the service life change speed of the eMMC equipment is used for indicating the service life change of the eMMC equipment written with the data of the first unit data volume in the unit time, and then the service life change speed of the eMMC equipment can be used for predicting the remaining service life of the eMMC equipment. In this way, the accuracy of life prediction of the eMMC equipment can be improved to ensure that an alarm can be given in advance when the life of the eMMC equipment is about to be used up, so that the problem of storage abnormality caused by the fact that the life of the eMMC equipment is used up is effectively avoided.
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Description

Technical Field

[0001] The present application relates to the field of communication technology, and in particular to a life prediction method, device and electronic device for an eMMC device. Background Art

[0002] Embedded Multi Media Card (eMMC) devices are usually deployed as a storage medium in electronic devices such as smartphones, computers, and servers. As a storage medium based on flash memory technology, eMMC devices have a limited service life; once the life of an eMMC device is used up, the eMMC device will become an unusable eMMC device, and the electronic device will have storage anomalies.

[0003] At present, in practical applications, it is usually necessary to regularly obtain a life indicator parameter indicating the service life of the eMMC device from the EXT_CSD register of the eMMC device, so as to realize the monitoring of the remaining life of the eMMC device based on this, and avoid the storage abnormality problem caused by the life of the eMMC device being used up. Among them, EXT_CSD is the abbreviation of Extended Card-Specific Data. However, the life indicator parameter recorded in the EXT_CSD register of the above-mentioned eMMC device is based on a granularity of 10%, such as 10%, 20% or 30%, etc., which will cause the service life indicated by the life indicator parameter obtained each time to be inconsistent with the actual service life of the current eMMC device. In other words, the life indicator parameter obtained from the EXT_CSD register is not accurate, which reduces the accuracy of the life prediction of the eMMC device, thereby failing to effectively avoid the storage abnormality problem caused by the life of the eMMC device being used up. Summary of the invention

[0004] In view of this, the present application provides a life prediction method, apparatus and electronic device for an eMMC device to improve the accuracy of life prediction of an eMMC device.

[0005] The present application embodiment provides a method for predicting the life of an eMMC device, the method comprising:

[0006] Based on the currently received life prediction trigger, the life change speed of the eMMC device is obtained; the life change speed of the eMMC device is used to indicate the life change of the data written into the eMMC device by the first unit data amount within the unit time; the life change speed of the eMMC device is predicted based on the obtained correspondence between the life index parameter of the eMMC device and the amount of written data; the correspondence between the life index parameter of the eMMC device and the amount of written data is used to indicate the relationship between the life index parameter of the eMMC device and the amount of written data;

[0007] Predict the remaining life of the eMMC device based on the life change rate of the eMMC device.

[0008] The embodiment of the present application also provides a life prediction device for an eMMC device, the device comprising:

[0009] An acquisition module, used to obtain a life change rate of an eMMC device based on a currently received life prediction trigger; the life change rate of an eMMC device is used to indicate a life change of data written to the eMMC device by a first unit of data in a unit time; the life change rate of an eMMC device is predicted based on a correspondence between an obtained life index parameter of the eMMC device and the amount of written data; the correspondence between the life index parameter of an eMMC device and the amount of written data is used to indicate a relationship between a life index parameter of an eMMC device and the amount of written data;

[0010] The prediction module is used to predict the remaining life of the eMMC device based on the life change speed of the eMMC device.

[0011] The present application also provides an electronic device, the electronic device comprising:

[0012] Processor; and

[0013] A computer-readable storage medium stores computer program instructions, which, when executed by a processor, cause the processor to execute the steps of the above method.

[0014] An embodiment of the present application further provides a computer-readable storage medium, on which computer program instructions are stored. When the computer program instructions are executed by a processor, the processor executes the steps in the above method.

[0015] It can be seen from the above technical solution that in the embodiment of the present application, when a life prediction trigger is received, it is not necessary to obtain an inaccurate life indicator parameter indicating the service life of the eMMC device from the EXT_CSD register of the eMMC device to predict the life of the eMMC device; instead, the life change rate of the eMMC device is first obtained, where the life change rate of the eMMC device is predicted based on the corresponding relationship between the life indicator parameter of the obtained eMMC device and the amount of written data, which is used to indicate the life change of the data written to the first unit of data in the eMMC device within a unit time, and then the life change rate of the eMMC device can be used to predict the remaining life of the eMMC device. This can improve the accuracy of the life prediction of the eMMC device to ensure that an advance warning can be issued when the life of the eMMC device is about to be used up, thereby effectively avoiding storage abnormalities caused by the life of the eMMC device being used up. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The accompanying drawings, which are incorporated in the specification and constitute a part of this application, illustrate embodiments consistent with the application and, together with the description, serve to explain the principles of the application.

[0017] Figure 1 A schematic diagram of the method flow provided in an embodiment of the present application.

[0018] Figure 2 Another method flow chart provided in the embodiment of the present application.

[0019] Figure 3 A flowchart of another method provided in an embodiment of the present application.

[0020] Figure 4 A schematic diagram of the device structure provided in an embodiment of the present application.

[0021] Figure 5 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0022] In order to enable those skilled in the art to better understand the technical solutions provided by the embodiments of the present application and to make the above-mentioned purposes, features and advantages of the embodiments of the present application more obvious and understandable, the technical solutions in the embodiments of the present application are further described in detail below in conjunction with the accompanying drawings.

[0023] See also Figure 1 , Figure 1 The method flow chart provided in the embodiment of the present application. As an embodiment, the method can be applied to a baseboard management controller (BMC) in an electronic device. Figure 1As shown, the process may include the following steps:

[0024] Step 101, based on the currently received life prediction trigger, obtain the life change speed of the eMMC device; wherein the life change speed of the eMMC device is used to indicate the life change of data written to the eMMC device by a first unit data amount within a unit time.

[0025] In this embodiment, as an embodiment, a timer can be set in advance in the electronic device based on actual application requirements to trigger the life prediction of the eMMC device at a regular time. For example, the time interval indicated by the timer can be one hour, one day, or one week, etc., which is not specifically limited here. Based on this, the above life prediction trigger can be triggered regularly. As another embodiment, the above life prediction trigger can be manually triggered.

[0026] In this embodiment, the life change rate of the above-mentioned eMMC device is used to indicate the life change of the data written to the first unit data volume of the eMMC device within the unit time. Here, the unit time can be 1 second, one hour, one day, or one week, etc., which is not specifically limited in this embodiment. The first unit data volume is associated with the unit time, and the first unit data volume refers to the data volume of the data written to the eMMC device within the unit time; for example, the unit time is one hour, and the data volume written to the eMMC device within one hour is 1 gigabyte (Gigabyte, GB), then the corresponding first unit data volume is 1GB; and so on, which will not be repeated here.

[0027] As an embodiment, the life change rate of the eMMC device is obtained in step 101. In a specific implementation, for example, the following can be done: first, the corresponding relationship between the life index parameter of the eMMC device and the amount of written data is obtained; the corresponding relationship between the life index parameter of the eMMC device and the amount of written data is used to indicate the relationship between the life index parameter of the eMMC device and the amount of written data. The life index parameter here refers to an index parameter used to indicate the life of the eMMC device; for example, the life index parameter can be expressed as a percentage, such as 10%, etc., which is not specifically limited here.

[0028] Afterwards, based on the corresponding relationship between the life indicator parameters of the eMMC device and the amount of written data, the life change speed of the eMMC device is predicted.

[0029] In this embodiment, during the test phase of the eMMC device, a write stress test can be performed on the eMMC device to obtain the correspondence between the life indicator parameters of the eMMC device and the amount of written data; thereafter, the correspondence between the life indicator parameters of the eMMC device and the amount of written data can be stored in a designated storage space. Based on this, as an embodiment, the above-mentioned acquisition of the life change rate of the eMMC device may include, for example, obtaining the correspondence between the life indicator parameters of the eMMC device and the amount of written data from the designated storage space during specific implementation. The designated storage space here may be, for example, the local storage space of the BMC mentioned above, etc., which is not specifically limited in this embodiment.

[0030] As for how to determine the correspondence between the life indicator parameters of the above-mentioned eMMC device and the amount of written data, and how to predict the life change rate of the eMMC device based on the correspondence between the life indicator parameters of the eMMC device and the amount of written data, the following will give examples and will not be repeated here.

[0031] Step 102: predict the remaining life of the eMMC device based on the life change rate of the eMMC device.

[0032] In this embodiment, based on the above description, it can be known that the life change rate of the above-mentioned eMMC device is used to indicate the life change of data of the first unit data amount written to the eMMC device within unit time; it can also be understood that the life change rate of the eMMC device indicates the change of the life indicator parameter of the data of the first unit data amount written to the eMMC device within unit time.

[0033] Based on this, this embodiment can first obtain a life indicator parameter for indicating the remaining life of the eMMC device, and then use the obtained life indicator parameter for indicating the remaining life of the eMMC device and the life change rate value of the eMMC device to obtain the remaining life of the eMMC device. In this way, the life prediction of the eMMC device is realized.

[0034] So far, completed Figure 1 The process shown.

[0035] pass Figure 1It can be seen from the process shown that in the embodiment of the present application, when a life prediction trigger is received, it is not necessary to obtain an inaccurate life indicator parameter indicating the service life of the eMMC device from the EXT_CSD register of the eMMC device to predict the life of the eMMC device; instead, the life change rate of the eMMC device is first obtained, where the life change rate of the eMMC device is predicted based on the corresponding relationship between the obtained life indicator parameter of the eMMC device and the amount of written data, which is used to indicate the life change of the data written to the first unit of data in the eMMC device within a unit time, and then the life change rate of the eMMC device can be used to predict the remaining life of the eMMC device. This can improve the accuracy of the life prediction of the eMMC device to ensure that an advance warning can be issued when the life of the eMMC device is about to be used up, thereby effectively avoiding storage abnormalities caused by the life of the eMMC device being used up.

[0036] The above step 101 is further described below:

[0037] First, how to determine the corresponding relationship between the life indicator parameters of the above-mentioned eMMC device and the amount of written data is described:

[0038] As an example, see Figure 2 As shown, during the test phase of the eMMC device, the corresponding relationship between the life indicator parameter of the eMMC device and the amount of written data can be determined by the following steps:

[0039] Step 201: Based on the received test trigger, obtain a life indicator parameter for indicating the service life of the eMMC device.

[0040] In this embodiment, as an embodiment, the test trigger can be manually triggered. For example, it can be manually triggered when the eMMC device is just started; this embodiment does not specifically limit the triggering time of the test trigger, and can be flexibly set based on actual application requirements.

[0041] As described above, the designated register of the eMMC device, such as the EXT_CSD register, records the service life of the eMMC device, and the recorded service life is in 10% granularity, such as 10%, 20% or 30%, etc. Based on this, the above-mentioned life indicator parameter for indicating the service life of the eMMC device can be obtained, for example, in a specific implementation, by obtaining the life indicator parameter for indicating the service life of the eMMC device from the designated register of the eMMC device.

[0042] Step 202, if it is found that the obtained life indicator parameter is different from the latest recorded life indicator parameter for indicating the service life of the eMMC device, the obtained life indicator parameter is used as a reference life indicator parameter; otherwise, the obtained life indicator parameter is recorded, and the step of obtaining the life indicator parameter for measuring the service life of the eMMC device is returned.

[0043] In this embodiment, since the life indicator parameter used to indicate the service life of the eMMC device recorded in the designated register of the eMMC device is in a granularity of 10%, in order to obtain a relatively accurate life indicator parameter used to indicate the service life of the eMMC device as a reference life indicator parameter, after receiving a test trigger, it is possible to periodically obtain the life indicator parameter used to indicate the service life of the eMMC device from the designated register of the eMMC device.

[0044] Specifically, for each obtained life indicator parameter, if it is found that the obtained life indicator parameter is the same as the latest recorded life indicator parameter indicating the service life of the eMMC device, such as the latest recorded life indicator parameter indicating the service life of the eMMC device is 0%, it means that the life indicator parameter indicating the actual service life of the eMMC device should be between 0% and 10% (including 0%), then the obtained life indicator parameter is recorded locally to the BMC;

[0045] If it is found that the life indicator parameter obtained this time is different from the latest recorded life indicator parameter used to indicate the service life of the eMMC device, such as the life indicator parameter obtained this time is 10%, and the latest recorded life indicator parameter used to indicate the service life of the eMMC device is 0%, then it means that the life indicator parameter used to indicate the actual service life of the eMMC device is the same as the life indicator parameter obtained this time, which indicates that the life indicator parameter obtained this time is an accurate life indicator parameter. At this time, the life indicator parameter obtained this time can be used as a reference life indicator parameter.

[0046] Step 203, based on the ratio of the reference life indicator parameter to the first total data volume of the data written to the eMMC device in the first time period, determine the life indicator parameter used to indicate the life required for the eMMC device to have a second unit data volume written thereto, as a correspondence between the life indicator parameter of the eMMC device and the amount of written data.

[0047] The first time period refers to the time period between the receiving time of the test trigger and the determining time of the reference life indicator parameter. The determining time of the reference life indicator parameter here can be understood as the time when the obtained life indicator parameter is used as the reference life indicator parameter.

[0048] In this embodiment, as an example, the second unit data amount here may be the same as or different from the above-mentioned first unit data amount, and this embodiment does not specifically limit it.

[0049] In this embodiment, as an embodiment, the above-mentioned life indicator parameter used to indicate the life required for the eMMC device to be written with the second unit amount of data is determined based on the ratio of the reference life indicator parameter to the first total data amount of data written to the eMMC device in the first time period. In the specific implementation, for example, it can be: the ratio of the reference life indicator parameter to the above-mentioned first total data amount is determined as the life indicator parameter used to indicate the life required for the eMMC device to be written with the second unit amount of data.

[0050] Exemplarily, it is assumed that the first time period is represented by T; the total amount of data written to the eMMC device at the start time of T is represented by Data_sum_start; the total amount of data written to the eMMC device at the end time of T is represented by Data_sum_end; the life indicator parameter obtained for the service life of the eMMC device at the start time of T is represented by Life_used_start; the life indicator parameter obtained for indicating the service life of the eMMC device at the end time of T is represented by Life_used_end;

[0051] Based on the information obtained above, the corresponding relationship between the life index parameter of the eMMC device and the amount of written data can be obtained, that is, the life index parameter (which can be recorded as RL-D) used to indicate the life consumed by the amount of second unit data written to the eMMC device, which can be calculated by the following formula, for example:

[0052] RL-D=(Life_used_end-Life_used_start) / (Data_sum_end-Data_sum_start).

[0053] The following describes how to obtain the first total amount of data written to the eMMC device within the first time period:

[0054] In this embodiment, as an embodiment, the BMC may monitor and record the amount of data written to the eMMC device. Specifically, when the BMC detects that a data write operation has occurred on the eMMC device, after the data write operation is executed, the target data amount is first determined based on the amount of data to be written indicated by the data write operation and the total amount of data written to the eMMC device recorded at the latest, and the target data amount is used as the total amount of data written to the eMMC device corresponding to the target timestamp. Optionally, the above-mentioned target timestamp may be, for example, the moment when the target data amount is determined, which is not limited in this embodiment. The total amount of data written to the eMMC device corresponding to the target timestamp refers to the total amount of data written to the eMMC device at the moment indicated by the target timestamp.

[0055] Afterwards, the target data volume and the target timestamp are stored in a designated storage space such as the BMC local.

[0056] Based on the above description, the first total amount of data written to the eMMC device in the first time period is obtained. In a specific implementation, for example, the total amount of data written to the eMMC device at the start time of the first time period is obtained from the designated storage space based on the start time of the first time period; correspondingly, the total amount of data written to the eMMC device at the end time of the first time period is obtained from the designated storage space based on the end time of the first time period. Afterwards, the first total amount of data written to the eMMC device in the first time period is determined based on the difference between the two total amounts of data obtained.

[0057] This completes the description of how to determine the corresponding relationship between the life indicator parameter of the above-mentioned eMMC device and the amount of written data.

[0058] The following describes how to predict the life change rate of the eMMC device based on the corresponding relationship between the life indicator parameter of the eMMC device and the amount of written data in the above step 101:

[0059] As an embodiment, the above-mentioned prediction of the life change rate of the eMMC device based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data may include the following steps in specific implementation:

[0060] First, a second total data volume of data written to the eMMC device within a specified time period is obtained.

[0061] In this embodiment, the specified time period refers to a time period pre-set based on actual application requirements; for example, the specified time period can be the time period between the moment when the eMMC device is initially started and the triggering moment of the current life prediction trigger; for another example, the specified time period can be the time period between the triggering moment of the last life prediction trigger and the triggering moment of the current life prediction trigger; and so on, this embodiment does not specifically limit this.

[0062] As for how to obtain the second total data volume of data written to the eMMC device within a specified time period, it is similar to the above-mentioned implementation method of obtaining the first total data volume of data written to the eMMC device within the first time period, and will not be repeated here.

[0063] Then, based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, the life indicator parameter of the eMMC device corresponding to the second total data amount is obtained; the life indicator parameter of the eMMC device corresponding to the second total data amount indicates the life required for the eMMC device to be written with the data of the second total data amount.

[0064] In this embodiment, based on the above description, it can be known that the correspondence between the life indicator parameter of the eMMC device and the amount of written data is a life indicator parameter used to indicate the lifespan consumed by the amount of the second unit data amount written to the eMMC device. Based on this, as an embodiment, based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, the life indicator parameter of the eMMC device corresponding to the second total data amount is obtained. In a specific implementation, for example, the product value of the second total data amount and the life indicator parameter used to indicate the lifespan consumed by the amount of the second unit data amount written to the eMMC device is determined as the life indicator parameter of the eMMC device corresponding to the second total data amount.

[0065] Finally, based on the ratio of the life indicator parameter of the eMMC device corresponding to the second total data volume to the specified time period, the life change speed of the eMMC device is obtained.

[0066] In this embodiment, as an embodiment, the ratio of the life indicator parameter of the eMMC device corresponding to the second total data volume to the specified time period can be used as the life change speed of the eMMC device.

[0067] So far, the further description of the above step 101 is completed. The above step 102 is further described below:

[0068] In this embodiment, as an embodiment, in the above step 102, based on the life change rate of the eMMC device, the remaining life of the eMMC device is predicted, and in specific implementation, for example, the following steps may be included:

[0069] First, a third total data volume of data written to the eMMC device within the second time period is obtained.

[0070] The second time period refers to the time period between the moment when the eMMC device is initially enabled and the moment when the life prediction is triggered.

[0071] As for how to obtain the third total data volume of the data written to the eMMC device in the second time period, please refer to the above related description, which will not be repeated here.

[0072] Then, based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, the life indicator parameter of the eMMC device corresponding to the third total data amount is obtained; the life indicator parameter of the eMMC device corresponding to the third total data amount indicates the life required for the eMMC device to be written with the data of the third total data amount.

[0073] In this embodiment, the specific implementation method of obtaining the life indicator parameter of the eMMC device corresponding to the second total data amount based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data is similar to the above-mentioned specific implementation method; in this embodiment, based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, the life indicator parameter of the eMMC device corresponding to the third total data amount is obtained. In the specific implementation, for example, the product value of the third total data amount and the life indicator parameter used to indicate the life span consumed by the amount of second unit data written to the eMMC device is determined as the life indicator parameter of the eMMC device corresponding to the third total data amount.

[0074] Finally, based on the life indicator parameter of the eMMC device corresponding to the third total data volume, the life indicator parameter used to indicate the remaining life of the eMMC device is determined; and based on the ratio of the life indicator parameter used to indicate the remaining life of the eMMC device to the life change rate of the eMMC device, the remaining life of the eMMC device is obtained.

[0075] In this embodiment, the life indicator parameter of the eMMC device corresponding to the third total data volume indicates the service life of the eMMC device; based on this, the difference between the total life indicator parameter of the eMMC device and the life indicator parameter of the eMMC device corresponding to the third total data volume can be determined as the life indicator parameter for indicating the remaining life of the eMMC device. Here, the total life indicator parameter of the eMMC device can be understood as a life indicator parameter for indicating the entire life of the eMMC device, for example, the total life indicator parameter can be 100%.

[0076] In this embodiment, as an embodiment, the remaining life of the eMMC device is obtained based on the ratio of the life indicator parameter used to indicate the remaining life of the eMMC device to the life change rate of the eMMC device. In a specific implementation, for example, the ratio of the life indicator parameter used to indicate the remaining life of the eMMC device to the life change rate of the eMMC device is determined as the remaining life of the eMMC device.

[0077] This completes the further description of the above step 102.

[0078] In order to facilitate understanding of the specific implementation process of the life prediction method of the above-mentioned eMMC device, an example description is given below through a specific embodiment.

[0079] See also Figure 3 The flowchart of the eMMC life prediction method is shown in FIG. Figure 3 As shown, the method includes:

[0080] Step 301, based on the currently received life prediction trigger, obtain the correspondence between the life indicator parameters of the eMMC device and the amount of written data from the specified storage space; the correspondence between the life indicator parameters of the eMMC device and the amount of written data is used to indicate the relationship between the life indicator parameters of the eMMC device and the amount of written data.

[0081] As described above, the designated storage space here may be, for example, a local storage space of the BMC.

[0082] Step 302, obtaining a first total data volume of data written to the eMMC device within a specified time period; and based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, obtaining a life indicator parameter of the eMMC device corresponding to the first total data volume.

[0083] Here, the life indicator parameter of the eMMC device corresponding to the first total data volume indicates the life of the eMMC device required to be consumed by the data written into the first total data volume;

[0084] Step 303: Obtain a life change rate of the eMMC device based on a ratio of a life indicator parameter of the eMMC device corresponding to the first total data volume to a specified time period.

[0085] Step 304, obtaining a second total data volume of data written to the eMMC device in a second time period; and based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, obtaining the life indicator parameter of the eMMC device corresponding to the second total data volume.

[0086] Here, the second time period refers to a time period between the moment when the eMMC device is initially enabled and the moment when the life prediction trigger is received.

[0087] The life indicator parameter of the eMMC device corresponding to the second total data volume indicates the life of the eMMC device required to be consumed by the data written into the second total data volume.

[0088] Step 305: Determine a life indicator parameter for indicating the remaining life of the eMMC device based on the life indicator parameter of the eMMC device corresponding to the second total data volume.

[0089] Step 306, obtaining the remaining life of the eMMC device according to the ratio of the life indicator parameter used to indicate the remaining life of the eMMC device to the life change speed of the eMMC device.

[0090] The following describes further processing of the method after predicting the remaining life of the eMMC device:

[0091] In this embodiment, in order to effectively avoid storage anomalies caused by the eMMC device's life being used up, this embodiment can use the predicted remaining life of the eMMC device to issue an advance warning when the eMMC device's life is about to be used up. Based on this, as an embodiment, after predicting the remaining life of the eMMC device, it can be checked whether the remaining life of the eMMC device reaches the set warning threshold;

[0092] If yes, an alarm indication that the remaining life of the eMMC device is about to be insufficient is output, so that relevant technicians can perform corresponding processing on the eMMC device, such as suspending the data writing operation on the eMMC device, clearing the data in the eMMC device after data migration or data backup, and resuming the data writing operation on the eMMC device. It should be noted that the processing of the eMMC device here is only an exemplary description, and this embodiment does not specifically limit this.

[0093] Of course, if not, return to the above step of obtaining the life change speed of the eMMC device based on the currently received life prediction trigger.

[0094] In this embodiment, there are many ways to implement the above-mentioned output of the warning indication that the remaining life of the eMMC device is about to be insufficient. For example, it can be: recording the information indicating the remaining life of the eMMC device in the form of a log, so as to facilitate subsequent log analysis by relevant technical personnel. Another example is: displaying the warning indication that the remaining life of the eMMC device is about to be insufficient on the display interface of relevant equipment such as operation and maintenance equipment; and so on.

[0095] As an embodiment, in order to ensure the persistence and reliability of data, after predicting the remaining life of the eMMC device, this embodiment can also store the specified life information of the eMMC device in the local storage space of the eMMC device, for example, the specified life information of the eMMC device can be stored in a specified database (such as a lightweight structured query language (SQLite) database) in the local storage space of the eMMC device; and the specified life information of the eMMC device can be stored in a specified storage space such as the local storage space of the BMC, for example, the specified life information of the eMMC device can be stored in a specified binary file in the local storage space of the BMC. In this way, the persistence of the specified life information of the eMMC device can be ensured, and when the data of the eMMC device is lost, the data of the eMMC device can be restored based on the specified life information of the eMMC device stored in the local storage space of the BMC.

[0096] In this embodiment, the above-mentioned designated storage space is different from the local storage space of the eMMC device. The above-mentioned designated life information of the eMMC device includes at least: the life change speed of the eMMC device, the corresponding relationship between the life indicator parameter of the eMMC device and the amount of written data, the first total data amount, the second total data amount, and / or the remaining life of the eMMC device, etc., which is not specifically limited in this embodiment.

[0097] At this point, the description of the method provided in the embodiment of the present application is completed. The following is a description of the device provided in the embodiment of the present application:

[0098] See also Figure 4 , Figure 4 A schematic diagram of the structure of a life prediction device for an eMMC device provided in an embodiment of the present application. Figure 4 As shown, the device 400 includes an acquisition module 401 and a prediction module 402;

[0099] Among them, the acquisition module 401 is used to obtain the life change speed of the eMMC device based on the currently received life prediction trigger; the life change speed of the eMMC device is used to indicate the life change of the data written to the eMMC device by the first unit data amount within the unit time; the life change speed of the eMMC device is predicted based on the obtained correspondence between the life index parameter of the eMMC device and the amount of written data; the correspondence between the life index parameter of the eMMC device and the amount of written data is used to indicate the relationship between the life index parameter of the eMMC device and the amount of written data;

[0100] The prediction module 402 is used to predict the remaining life of the eMMC device based on the life change rate of the eMMC device.

[0101] As an example,

[0102] The corresponding relationship between the life index parameter of the eMMC device and the amount of written data is determined by the following method:

[0103] In a test phase of the eMMC device, based on a received test trigger, a life indicator parameter indicating a used life of the eMMC device is obtained;

[0104] If it is found that the obtained life indicator parameter is different from the latest recorded life indicator parameter for indicating the service life of the eMMC device, the obtained life indicator parameter is used as the reference life indicator parameter; otherwise, the obtained life indicator parameter is recorded, and the step of obtaining the life indicator parameter for measuring the service life of the eMMC device is returned;

[0105] Based on the ratio of the reference life indicator parameter to the first total data amount of data written to the eMMC device in the first time period, a life indicator parameter for indicating the life required to consume the amount of second unit data written to the eMMC device is determined, as a correspondence between the life indicator parameter of the eMMC device and the amount of written data; the first time period refers to the time period between the reception moment of the test trigger and the determination moment of the reference life indicator parameter.

[0106] As an example,

[0107] The rate at which the life of an eMMC device changes is determined by:

[0108] Obtaining a second total amount of data written to the eMMC device within a specified time period;

[0109] Based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, the life indicator parameter of the eMMC device corresponding to the second total data amount is obtained; the life indicator parameter of the eMMC device corresponding to the second total data amount indicates the life of the eMMC device required to be consumed by the data written into the second total data amount;

[0110] Based on the ratio of the life indicator parameter of the eMMC device corresponding to the second total data volume to the specified time period, the life change speed of the eMMC device is obtained.

[0111] As an example,

[0112] Based on the life change rate of the eMMC device, the remaining life of the eMMC device is predicted as follows:

[0113] Obtaining a third total amount of data written to the eMMC device within a second time period; the second time period refers to a time period between a moment when the eMMC device is initially enabled and a moment when a life prediction trigger is received;

[0114] Based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, the life indicator parameter of the eMMC device corresponding to the third total data amount is obtained; the life indicator parameter of the eMMC device corresponding to the third total data amount indicates the life of the eMMC device required to be consumed by the data written into the third total data amount;

[0115] Based on the life indicator parameter of the eMMC device corresponding to the third total data volume, determine the life indicator parameter used to indicate the remaining life of the eMMC device; and obtain the remaining life of the eMMC device based on the ratio of the life indicator parameter used to indicate the remaining life of the eMMC device to the life change rate of the eMMC device.

[0116] As an embodiment, the device further comprises:

[0117] The alarm module is used to check whether the remaining life of the eMMC device reaches a set alarm threshold after predicting the remaining life of the eMMC device. If yes, output an alarm indication that the remaining life of the eMMC device is about to be insufficient.

[0118] As an embodiment, the device further comprises:

[0119] A storage module, used to store the life information of the eMMC device in the designated storage space and the local storage space of the eMMC device, respectively, so that when the life information of the eMMC device in the local storage space of the eMMC device is lost, data of the eMMC device is recovered based on the life information of the eMMC device in the designated storage space;

[0120] Among them, the local storage space of the eMMC device is different from the designated storage space; the life information of the eMMC device at least includes the life change rate of the eMMC device, the correspondence between the life indicator parameter of the eMMC device and the amount of written data, and / or the remaining life of the eMMC device.

[0121] So far, completed Figure 4 Structural description of the device shown.

[0122] The implementation process of the functions and effects of each module in the above-mentioned device is specifically described in the implementation process of the corresponding steps in the above-mentioned method, which will not be repeated here.

[0123] For the device embodiment, since it basically corresponds to the method embodiment, the relevant parts can refer to the partial description of the method embodiment. The device embodiment described above is only schematic, wherein the modules described as separate components may or may not be physically separated, and the components displayed as modules may or may not be physical modules, that is, they may be located in one place, or they may be distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the present application scheme. A person of ordinary skill in the art can understand and implement it without paying creative labor.

[0124] See also Figure 5 , is a schematic diagram of the hardware structure of an electronic device provided by an exemplary embodiment of the present application. The electronic device may include a processor 501, a communication interface 502, a computer-readable storage medium 503 and a communication bus 504. The processor 501, the communication interface 502 and the computer-readable storage medium 503 communicate with each other through the communication bus 504. Among them, computer program instructions are stored on the computer-readable storage medium 503; the processor 501 can execute the steps of the method described in the above embodiment by executing the computer program instructions stored on the computer-readable storage medium 503. The electronic device may also include other hardware according to the actual function of the electronic device, which will not be described in detail.

[0125] Correspondingly, an embodiment of the present application further provides a computer-readable storage medium, on which a number of computer program instructions are stored. When the computer program instructions are executed by a processor, the method disclosed in the above example of the present application can be implemented.

[0126] Exemplarily, the computer-readable storage medium may be any electronic, magnetic, optical or other physical storage device that may contain or store information, such as executable instructions, data, etc. For example, the computer-readable storage medium may be: RAM (Radom Access Memory), volatile memory, non-volatile memory, flash memory, storage drive (such as hard disk drive), solid state drive, any type of storage disk (such as optical disk, DVD, etc.), or similar storage medium, or a combination thereof. The processor and memory may be supplemented by or incorporated into a dedicated logic circuit.

[0127] The above are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A life prediction method for an embedded multimedia card eMMC device, characterized in that: The method includes: Based on the currently received life prediction trigger, the life change speed of the eMMC device is obtained; the life change speed of the eMMC device is used to indicate the life change of data written to the eMMC device by a first unit of data in a unit time; the life change speed of the eMMC device is predicted based on the obtained correspondence between the life index parameter of the eMMC device and the amount of written data; the correspondence between the life index parameter of the eMMC device and the amount of written data is used to indicate the relationship between the life index parameter of the eMMC device and the amount of written data; Based on the life change rate of the eMMC device, the remaining life of the eMMC device is predicted.

2. The method according to claim 1, characterized in that The corresponding relationship between the life index parameter of the eMMC device and the amount of written data is determined in the following manner: In a test phase of the eMMC device, based on a received test trigger, a life indicator parameter indicating a used life of the eMMC device is obtained; If it is found that the obtained life indicator parameter is different from the latest recorded life indicator parameter for indicating the service life of the eMMC device, the obtained life indicator parameter is used as a reference life indicator parameter; otherwise, the obtained life indicator parameter is recorded, and the step of obtaining the life indicator parameter for measuring the service life of the eMMC device is returned; Based on the ratio of the reference life indicator parameter to the first total data amount of data written to the eMMC device within the first time period, a life indicator parameter for indicating the life required to consume the amount of second unit data written to the eMMC device is determined as a correspondence between the life indicator parameter of the eMMC device and the amount of written data; the first time period refers to the time period between the reception moment of the test trigger and the determination moment of the reference life indicator parameter.

3. The method according to claim 1, characterized in that The life change rate of the eMMC device is determined by: Obtaining a second total amount of data written to the eMMC device within a specified time period; Based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, the life indicator parameter of the eMMC device corresponding to the second total data amount is obtained; the life indicator parameter of the eMMC device corresponding to the second total data amount indicates the life of the eMMC device required to be consumed by the data written into the second total data amount; Based on the ratio of the life indicator parameter of the eMMC device corresponding to the second total data volume to the specified time period, the life change speed of the eMMC device is obtained.

4. The method according to claim 1, characterized in that: The predicting the remaining life of the eMMC device based on the life change rate of the eMMC device includes: Obtaining a third total amount of data written to the eMMC device within a second time period; the second time period refers to a time period between a moment when the eMMC device is initially enabled and a moment when the life prediction trigger is received; Based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, the life indicator parameter of the eMMC device corresponding to the third total data amount is obtained; the life indicator parameter of the eMMC device corresponding to the third total data amount indicates the life of the eMMC device required to be consumed by the data written into the third total data amount; Based on the life indicator parameter of the eMMC device corresponding to the third total data volume, determine the life indicator parameter used to indicate the remaining life of the eMMC device; and obtain the remaining life of the eMMC device based on the ratio of the life indicator parameter used to indicate the remaining life of the eMMC device to the life change rate of the eMMC device.

5. The method according to claim 1, characterized in that After predicting the remaining life of the eMMC device, the method further comprises: Check whether the remaining life of the eMMC device reaches a set alarm threshold, and if so, output an alarm indication that the remaining life of the eMMC device is about to be insufficient.

6. The method according to claim 1, characterized in that After predicting the remaining life of the eMMC device, the method further comprises: The life information of the eMMC device is stored in a designated storage space and a local storage space of the eMMC device respectively, so that when the life information of the eMMC device in the local storage space of the eMMC device is lost, data of the eMMC device is recovered based on the life information of the eMMC device in the designated storage space; Among them, the local storage space of the eMMC device is different from the designated storage space; the life information of the eMMC device at least includes the life change rate of the eMMC device, the correspondence between the life indicator parameter of the eMMC device and the amount of written data, and / or the remaining life of the eMMC device.

7. A life prediction device for an embedded multimedia card eMMC device, characterized in that: The device includes: An acquisition module, used to obtain a life change speed of an eMMC device based on a currently received life prediction trigger; the life change speed of the eMMC device is used to indicate a life change of data written to the eMMC device by a first unit of data in a unit time; the life change speed of the eMMC device is predicted based on the obtained correspondence between the life index parameter of the eMMC device and the amount of written data; the correspondence between the life index parameter of the eMMC device and the amount of written data is used to indicate the relationship between the life index parameter of the eMMC device and the amount of written data; The prediction module is used to predict the remaining life of the eMMC device based on the life change speed of the eMMC device.

8. The device according to claim 7, characterized in that The corresponding relationship between the life index parameter of the eMMC device and the amount of written data is determined in the following manner: In the test phase of the eMMC device, based on the received test trigger, a life indicator parameter for indicating the service life of the eMMC device is obtained; if it is found that the obtained life indicator parameter is different from the latest recorded life indicator parameter for indicating the service life of the eMMC device, the obtained life indicator parameter is used as a reference life indicator parameter; otherwise, the obtained life indicator parameter is recorded, and the step of obtaining the life indicator parameter for measuring the service life of the eMMC device is returned; According to the ratio of the reference life indicator parameter to the first total data amount of the data written to the eMMC device in the first time period, determine the life indicator parameter used to indicate the life required for the eMMC device to be written with the second unit data amount, as the corresponding relationship between the life indicator parameter of the eMMC device and the amount of written data; the first time period refers to the time period between the reception time of the test trigger and the determination time of the reference life indicator parameter; and / or, The life change speed of the eMMC device is determined by: obtaining a second total data volume of data written to the eMMC device within a specified time period; obtaining a life index parameter of the eMMC device corresponding to the second total data volume based on a correspondence between a life index parameter of the eMMC device and the amount of written data; the life index parameter of the eMMC device corresponding to the second total data volume indicates the life of the eMMC device required to consume the data written to the second total data volume; Obtaining a life change rate of the eMMC device based on a ratio of a life indicator parameter of the eMMC device corresponding to the second total data volume to the specified time period; and / or, The predicting of the remaining life of the eMMC device based on the life change speed of the eMMC device includes: obtaining a third total data volume of data written to the eMMC device within a second time period; the second time period refers to a time period between the moment when the eMMC device is initially enabled and the moment when the life prediction trigger is received; based on the correspondence between the life indicator parameter of the eMMC device and the amount of written data, obtaining the life indicator parameter of the eMMC device corresponding to the third total data volume; the life indicator parameter of the eMMC device corresponding to the third total data volume indicates the life required for the data written to the third total data volume to be consumed by the eMMC device; based on the life indicator parameter of the eMMC device corresponding to the third total data volume, determining a life indicator parameter for indicating the remaining life of the eMMC device; and obtaining the remaining life of the eMMC device according to the ratio of the life indicator parameter for indicating the remaining life of the eMMC device to the life change speed of the eMMC device; and / or, The device further comprises: an alarm module, configured to check whether the remaining life of the eMMC device reaches a set alarm threshold after predicting the remaining life of the eMMC device, and if so, output an alarm indication that the remaining life of the eMMC device is about to be insufficient; and / or, After predicting the remaining life of the eMMC device, the apparatus further includes: a storage module, used to store the life information of the eMMC device in a designated storage space and a local storage space of the eMMC device, respectively, so that when the life information of the eMMC device in the local storage space of the eMMC device is lost, data of the eMMC device is recovered based on the life information of the eMMC device in the designated storage space; wherein the local storage space of the eMMC device is different from the designated storage space; the life information of the eMMC device includes at least the life change speed of the eMMC device, the correspondence between the life indicator parameter of the eMMC device and the amount of written data, and / or the remaining life of the eMMC device.

9. An electronic device, characterized in that: The electronic device includes: Processor; and A computer-readable storage medium, wherein computer program instructions are stored in the computer-readable storage medium, and when the computer program instructions are executed by the processor, the processor executes the steps in any one of the methods of claims 1 to 6.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer program instructions, which, when executed by a processor, enable the processor to perform the steps of any one of the methods of claims 1 to 6.