Calibration method, apparatus, device, medium, x-ray generator, and ct device

Abstract

The present disclosure provides a filament calibration method, a filament calibration device, an electronic device, a storage medium, a program product, an X-ray generator and a CT device. The filament calibration method is used to correct a mapping relationship between a sampling current of a filament and a tube current of an X-ray generating tube in an X-ray generator, the mapping relationship comprising a filament correction coefficient, and the method comprises: turning on a high-voltage power supply and the X-ray generating tube, obtaining the sampling current of the X-ray generating tube as a first sampling current; when the first sampling current is equal to a preset set current, obtaining the sampling current of the filament as a second sampling current; and calibrating the filament correction coefficient according to the second sampling current and a preset filament preheating current, wherein the set current and the filament preheating current have a set relationship.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the technical field of security inspection, and more particularly, to a filament calibration method and device, an electronic device, a storage medium, a program product, an X-ray generator, and a CT device. BACKGROUND

[0002] An X-ray generator is a core component of a CT security inspection device. The X-ray generator includes a high-voltage power supply and an X-ray tube. The X-ray tube is an element for generating X-rays, and functions to convert electrical energy into X-rays. A filament and a ray generating tube are part of the X-ray tube. The high-voltage power supply generates a 300 V DC voltage, which is output to the filament via a push-pull circuit and a filament transformer. As shown in FIG. 1, the filament current and the tube current of the ray generating tube have a specific relationship, i.e., a filament characteristic curve. For a given filament, within a certain range, the greater the filament current, the greater the tube current. As shown in FIG. 2, the relationship between the tube current and the filament current is an exponential nonlinear relationship. Figure 7 Figure 7

[0003] Therefore, it can be understood that inaccurate sampling of the filament current can cause many problems. Compared with the sampled current of the filament, if the actual filament current is too small, the dynamic response of the tube current during beam emission will be slow; if the actual filament current is too large, the tube current will overshoot during beam emission, and the service life of the filament will also be affected. In the prior art, for the ray generator of a CT security inspection device, a filament tool is generally used to correct errors caused by sampling of the filament current.

[0004] Specifically, the principle of the filament tool is to use a resistor with a resistance close to that of the filament to simulate the filament. The filament tool includes an ammeter for measuring the actual filament current.

[0005] The filament current sampling formula is: I smp =k T ×k S ×k C ×I fila .

[0006] wherein I smp is the filament current sampling value, k T is the filament transformer ratio, k S is the filament current sensor ratio, k C is the filament current sampling signal conditioning circuit ratio, and I fila is the actual filament current.

[0007] ​​It can be seen from the filament current sampling formula that the filament current sampling error correction method based on the filament tool can correct the errors of the filament transformer, the filament current sensor and the filament current sampling signal conditioning circuit. This method needs to manually input the actual filament current in the ammeter into the upper computer software, so as to calibrate the filament current sampling error.

[0008] It can be understood that when the high-voltage power supply or the X-ray generator of the CT device is replaced, the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube needs to be calibrated, so as to facilitate accurate control of the tube current according to the sampling current of the filament. However, there are differences between the filament characteristics curves of different filaments and ray generating tubes, and the differences between the sampling current of the filament and the actual current caused by the current sampling error make the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube of different X-ray generators unstable, and the adjustment of the tube current of the ray generating tube according to the sampling current of the filament will have errors. The filament current sampling error correction method based on the filament tool can only correct the filament current sampling error and cannot correct the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube.

[0009] In addition, the filament current sampling error correction method based on the filament tool needs to rely on customized filament tools, which has high cost. When calibrating the CT device on site, not only the filament tool is needed, but also the X-ray bulb of the CT device needs to be disassembled, which is complicated. SUMMARY

[0010] Therefore, the present disclosure provides an efficient, accurate, low-cost and easy-to-operate filament calibration method, a calibration device, an electronic device, a storage medium, a program product, an X-ray generator and a CT device.

[0011] One aspect of the present disclosure provides a filament calibration method for correcting the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator, the mapping relationship including a filament correction coefficient, the method comprising: turning on the high-voltage power supply and the ray generating tube, obtaining the sampling current of the ray generating tube as a first sampling current; when the first sampling current is equal to a preset set current, obtaining the sampling current of the filament as a second sampling current; and calibrating the filament correction coefficient according to the second sampling current and a preset filament preheating current, wherein the set current and the filament preheating current have a set relationship.

[0012] According to the filament calibration method of the embodiment of the present disclosure, by turning on the high-voltage power supply and the ray generating tube, the sampling current of the ray generating tube can be obtained as a first sampling current; then when the first sampling current is equal to the preset set current, the sampling current of the filament can be obtained as a second sampling current; and according to the second sampling current and the preset filament preheating current, the filament correction coefficient can be calibrated, wherein the set current and the filament preheating current have a set relationship.

[0013] The method of the present disclosure has a set relationship between the set current and the filament preheating current by presetting a filament preheating current, so that the meaning of the filament preheating current is that when the tube current of the ray generating tube reaches a specific value, i.e. the set current, if the sampling value of the filament current, i.e. the second sampling current, is equal to the filament preheating current, it means that the sampling value of the filament current is close to the actual value. If the sampling value of the filament current is not equal to the filament preheating current, it means that the sampling value of the filament current deviates from the actual value. At this time, the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator can be corrected by correcting the filament correction coefficient according to the relationship between the second sampling current and the preset filament preheating current, so as to realize the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator. The mapping relationship comprehensively considers the filament current sampling error and the difference between the filament characteristic curves of different filaments and ray generating tubes, and realizes the efficient and accurate correction of the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator. In addition, the method of the present disclosure does not need to rely on customized filament tooling, and has low cost. Without disassembling the X-ray generator, the method is easy to operate.

[0014] In some embodiments, the step of calibrating the filament correction coefficient according to the second sampling current and the preset filament preheating current comprises: determining the current filament correction coefficient according to the second sampling current, the preset filament preheating current and the last filament correction coefficient, wherein when the current is the first time, the last filament correction coefficient is the initially set filament correction coefficient; and replacing the current filament correction coefficient with the last filament correction coefficient.

[0015] In some embodiments, the step of presetting the filament preheating current comprises: obtaining the sampling currents of m experimental ray generating tubes as m first experimental sampling currents, wherein m is an integer greater than or equal to 2; when the m first experimental sampling currents are all equal to the set current, obtaining the sampling currents of m experimental filaments corresponding to the m experimental ray generating tubes as m second experimental sampling currents; and calculating the average of the m second experimental sampling currents as the filament preheating current.

[0016] In some embodiments, the step of presetting the filament preheating current comprises: sampling a sampling current of an experimental ray generating tube as a first experimental sampling current; when the first experimental sampling current is equal to the preset current, sampling a sampling current of an experimental filament corresponding to the experimental ray generating tube as a second experimental sampling current; repeating the sampling of the sampling current of the experimental ray generating tube as the first experimental sampling current n times, and when the first experimental sampling current is equal to the preset current, sampling a sampling current of an experimental filament corresponding to the experimental ray generating tube as a second experimental sampling current, where n is an integer greater than or equal to 2; and calculating an average of the n second experimental sampling currents as the filament preheating current.

[0017] In some embodiments, the preset current is 10% of the rated current, 20% of the rated current, 30% of the rated current, 40% of the rated current, 50% of the rated current, 60% of the rated current, 70% of the rated current, 80% of the rated current, 90% of the rated current, or the rated current.

[0018] Another aspect of the present disclosure provides a filament calibration device for correcting a mapping relationship between a sampling current of a filament and a tube current of a ray generating tube in an X-ray generator, the mapping relationship comprising a filament correction coefficient, the device comprising: a first sampling module configured to turn on a high-voltage power supply and the ray generating tube, and obtain a sampling current of the ray generating tube as a first sampling current; a second sampling module configured to, when the first sampling current is equal to a preset current, obtain a sampling current of the filament as a second sampling current; and a calibration module configured to calibrate the filament correction coefficient according to the second sampling current and a preset filament preheating current, wherein the preset current and the filament preheating current have a preset relationship.

[0019] According to the filament calibration device of the present disclosure, by turning on a high-voltage power supply and a ray generating tube, a sampling current of the ray generating tube can be obtained as a first sampling current; then, when the first sampling current is equal to a preset current, a sampling current of the filament can be obtained as a second sampling current; and according to the second sampling current and a preset filament preheating current, the filament correction coefficient can be calibrated, wherein the preset current and the filament preheating current have a preset relationship.

[0020] The device of the present disclosure sets a filament preheating current in advance, and has a set relationship between the set current and the filament preheating current, so that the meaning of the filament preheating current is that when the tube current of the ray generating tube reaches a specific value, that is, the set current, if the sampling value of the filament current, that is, the second sampling current, is equal to the filament preheating current, it means that the sampling value of the filament current is close to the actual value. If the sampling value of the filament current is not equal to the filament preheating current, it means that the sampling value of the filament current deviates from the actual value. At this time, the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube can be corrected by correcting the filament correction coefficient according to the relationship between the second sampling current and the pre-set filament preheating current, which comprehensively considers the filament current sampling error and the difference between the filament characteristic curves of different filaments and ray generating tubes, and realizes the efficient and accurate correction of the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube. In addition, the method of the present disclosure does not need to rely on customized filament tooling, and the cost is low. Without disassembling the X-ray generator, it is easy to operate.

[0021] Another aspect of the present disclosure provides an electronic device comprising one or more processors and one or more memories, wherein the memories are configured to store executable instructions that, when executed by the processors, implement the method described above.

[0022] Another aspect of the present disclosure provides a computer-readable storage medium storing computer-executable instructions that, when executed, implement the method described above.

[0023] Another aspect of the present disclosure provides a computer program product comprising a computer program comprising computer-executable instructions that, when executed, implement the method described above.

[0024] Another aspect of the present disclosure provides an X-ray generator applying the filament calibration method described above, comprising: a ray generating tube, the ray generating tube comprising a tube shell with a vacuum inside and an anode and a cathode arranged in the tube shell; a high-voltage power supply for providing high voltage between the cathode and the anode; a filament, the filament being electrically connected to the cathode; a filament transformer, the filament transformer being electrically connected to the filament for providing voltage to the filament.

[0025] In some examples, after correction by the filament calibration method and the filament calibration device described above, the problem of slow dynamic response of the current of the ray generating tube during beam emission caused by the actual filament current being too small, or the problem of current overshoot of the ray generating tube during beam emission caused by the actual filament current being too large, can be avoided, and the service life of the filament is also affected.

[0026] Another aspect of the present disclosure provides a CT device including the X-ray generator as described above.

[0027] In some examples, after correction by the calibration method of the filament and the calibration device of the filament described above, the problem of slow dynamic response of the current of the ray generating tube during the beam-out process caused by the actual filament current being too small, or the problem of current overshoot of the ray generating tube during the beam-out caused by the actual filament current being too large, can be avoided, while the service life of the filament is affected. BRIEF DESCRIPTION OF DRAWINGS

[0028] The above and other objects, features and advantages of the present disclosure will become more apparent from the following description when taken in conjunction with the accompanying drawings, in which:

[0029] Figure 1 A flowchart of the calibration method of the filament according to an embodiment of the present disclosure is schematically shown.

[0030] Figure 2 A flowchart of the step of calibrating the filament correction coefficient according to the second sampling current and the pre-set filament preheating current according to an embodiment of the present disclosure is schematically shown.

[0031] Figure 3 A flowchart of the step of pre-setting the filament preheating current according to an embodiment of the present disclosure is schematically shown.

[0032] Figure 4 A flowchart of the calibration method of the filament according to an embodiment of the present disclosure is schematically shown.

[0033] Figure 5 A structural block diagram of the calibration device of the filament according to an embodiment of the present disclosure is schematically shown.

[0034] Figure 6 A block diagram of an electronic device according to an embodiment of the present disclosure is schematically shown.

[0035] Figure 7 A filament characteristic curve between the filament current and the tube current of the ray generating tube is schematically shown. DETAILED DESCRIPTION

[0036] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It is to be understood, however, that the description is merely exemplary and is not intended to limit the scope of the present disclosure. In the following detailed description of the embodiments of the present disclosure, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the present disclosure. However, it would be apparent to those skilled in the art that the embodiments of the present disclosure can be practiced without these specific details. In other instances, well-known structures and techniques have been described in detail in order to avoid obscuring aspects of the present disclosure.

[0037] In the technical solutions of the present disclosure, the acquisition, storage and application of user personal information comply with relevant laws and regulations, necessary security measures are taken, and the public order and good customs are not violated. In the technical solutions of the present disclosure, the acquisition, collection, storage, use, processing, transmission, provision, disclosure and application of data comply with relevant laws and regulations, necessary security measures are taken, and the public order and good customs are not violated.

[0038] The terms used herein are merely used to describe specific embodiments, and are not intended to limit the present disclosure. The terms "comprise", "contain", and the like used herein indicate the existence of the stated features, steps, operations and / or components, but do not exclude the presence or addition of one or more other features, steps, operations or components.

[0039] In the case of using expressions such as "at least one of A, B or C, etc.", in general, it should be interpreted according to the meaning understood by those skilled in the art as the expression generally (for example, "a system having at least one of A, B or C" should include but is not limited to a system having A alone, a system having B alone, a system having C alone, a system having both A and B, a system having both A and C, a system having both B and C, and / or a system having A, B, and C, etc.). The terms "first", "second" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features defined as "first", "second" can explicitly or implicitly include one or more of the features.

[0040] The X-ray generator is a core component of the CT security inspection equipment, and the X-ray generator includes a high-voltage power supply and an X-ray tube. The X-ray tube is an element for generating X-rays, and its function is to convert electrical energy into X-rays. The filament and the ray generating tube are part of the X-ray tube. The high-voltage power supply generates 300V DC voltage through a push-pull circuit to obtain ±150V AC voltage, which is then output to the filament through a filament transformer. Figure 7 As shown in the formula (1), there is a specific relationship between the filament current and the tube current, that is, the filament characteristic curve. For a given filament, within a certain range, the greater the filament current, the greater the tube current. Figure 7 As can be seen from the formula (2), the relationship between the tube current and the filament current is an exponential nonlinear relationship.

[0041] Therefore, it can be understood that inaccurate sampling of the filament current will cause many problems. Compared with the sampling current of the filament, if the actual filament current is too small, it will cause the tube current to respond slowly during the beam-out process; if the actual filament current is too large, it will cause the tube current to overshoot during the beam-out process, and also affect the service life of the filament. In the prior art, for the ray generator of the CT security inspection equipment, a filament tool is generally used to correct the error caused by the sampling of the filament current.

[0042] Specifically, the principle of the filament fixture is to use a resistor with a resistance value similar to that of the filament to simulate the filament. The filament fixture contains an ammeter to measure the actual filament current.

[0043] The formula for sampling filament current is: I smp =k T ×k S ×k C ×I fila .

[0044] Among them, I smp k is the sampled value of the filament current. T k is the turns ratio of the filament transformer. S For the filament current sensor turns ratio, k C For the filament current sampling signal conditioning circuit transformation ratio, I fila This represents the actual filament current.

[0045] As can be seen from the filament current sampling formula, the filament current sampling error correction method based on the filament fixture can correct the errors of the filament transformer, filament current sensor, and filament current sampling signal conditioning circuit. This method requires manually inputting the actual filament current from the ammeter into the host computer software to calibrate the filament current sampling error.

[0046] It is understandable that when replacing the high-voltage power supply or X-ray generator in a CT scanner, it is necessary to calibrate the mapping relationship between the filament sampling current and the tube current of the X-ray generating tube. This allows for precise control of the tube current based on the filament sampling current. However, different filaments and X-ray generating tubes have different filament characteristic curves. Furthermore, due to current sampling errors, there is a difference between the sampled filament current and the actual current. This makes the mapping relationship between the filament sampling current and the tube current of the X-ray generating tube unstable for different X-ray generators, leading to errors when adjusting the tube current based on the filament sampling current. The filament current sampling error correction method based on filament fixtures can only correct the filament current sampling error, but it cannot correct the mapping relationship between the filament sampling current and the tube current of the X-ray generating tube.

[0047] Furthermore, the filament current sampling error correction method based on filament fixtures requires customized filament fixtures, which is costly. On-site calibration of CT equipment not only requires filament fixtures but also necessitates the disassembly of the CT equipment's X-ray tube, making the process cumbersome.

[0048] The following is for reference. Figures 1-6 This disclosure describes a filament calibration method, calibration apparatus, electronic device, storage medium, program product, X-ray generator, and CT device according to embodiments of the present disclosure.

[0049] Figure 1 A flowchart of a filament calibration method according to an embodiment of the present disclosure is shown schematically. The filament calibration method is used to correct the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator, which includes a filament correction coefficient.

[0050] As shown in Figure 1 The filament calibration method of this embodiment includes operations S110-S130.

[0051] In operation S110, the high-voltage power supply and the ray generating tube are turned on, and the sampling current of the ray generating tube is obtained as a first sampling current.

[0052] It can be understood that the method of the present disclosure can be implemented on the premise that the high-voltage power supply and the ray generating tube have been calibrated. Therefore, the sampling current of the ray generating tube in the filament calibration method of the present disclosure is approximately equal to the actual current of the ray generating tube.

[0053] In operation S120, when the first sampling current is equal to a preset set current, the sampling current of the filament is obtained as a second sampling current.

[0054] In operation S130, the filament correction coefficient is calibrated according to the second sampling current and a preset filament preheating current, wherein the set current and the filament preheating current have a set relationship.

[0055] It should be noted that the filament preheating current can be understood as the actual current of the filament under the condition that the actual current of the ray generating tube is the set current. When implementing the method of the present disclosure, by presetting a filament preheating current, the set relationship between the set current and the filament preheating current is established, so that the meaning of the filament preheating current is that when the tube current of the ray generating tube reaches a specific value, i.e., the set current, if the sampling value of the filament current, i.e., the second sampling current, is equal to the filament preheating current, it means that the sampling value of the filament current is close to the actual value. If the sampling value of the filament current is not equal to the filament preheating current, it means that the sampling value of the filament current deviates from the actual value. At this time, the filament correction coefficient can be corrected according to the relationship between the second sampling current and the preset filament preheating current, so as to correct the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator.

[0056] According to the filament calibration method of the present disclosure, by turning on the high-voltage power supply and the ray generating tube, the sampling current of the ray generating tube can be obtained as a first sampling current. Then, when the first sampling current is equal to a preset set current, the sampling current of the filament can be obtained as a second sampling current. According to the second sampling current and a preset filament preheating current, the filament correction coefficient can be calibrated, wherein the set current and the filament preheating current have a set relationship.

[0057] The method of the present disclosure sets a filament preheating current in advance, and has a set relationship between the set current and the filament preheating current, so that the meaning of the filament preheating current is that when the tube current of the ray generating tube reaches a specific value, that is, the set current, if the sampling value of the filament current, that is, the second sampling current, is equal to the filament preheating current, it means that the sampling value of the filament current is closer to the actual value. If the sampling value of the filament current is not equal to the filament preheating current, it means that the sampling value of the filament current deviates from the actual value. At this time, the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube can be corrected by correcting the filament correction coefficient according to the relationship between the second sampling current and the pre-set filament preheating current, which comprehensively considers the filament current sampling error and the difference between the filament characteristic curves of different filaments and ray generating tubes, and realizes the efficient and accurate correction of the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube. In addition, the method of the present disclosure does not need to rely on customized filament tooling, and has low cost. Without disassembling the X-ray generator, it is easy to operate.

[0058] According to some embodiments of the present disclosure, as shown in Figure 2 Operation S130 calibrates the filament correction coefficient according to the second sampling current and the pre-set filament preheating current, which includes operation S131 and operation S132.

[0059] In operation S131, the current filament correction coefficient is determined according to the second sampling current, the pre-set filament preheating current and the last filament correction coefficient. When the current is the first time, the last filament correction coefficient is the initial set filament correction coefficient.

[0060] For example, the current filament correction coefficient can be determined by formula (1), and the current filament correction coefficient can be represented by k f .

[0061] k f = ×k f0 (1)

[0062] Where I f0 represents the filament preheating current, I f represents the second sampling current, and k f0 represents the last filament correction coefficient.

[0063] In operation S132, the current filament correction coefficient is replaced by the last filament correction coefficient.

[0064] The step of calibrating the filament correction coefficient according to the second sampling current and the preset filament preheating current can be facilitated by operation S131 and operation S132.

[0065] According to some embodiments of the present disclosure, as shown in Figure 3 The step of presetting the filament preheating current includes operation S310 to operation S330.

[0066] In operation S310, the sampling currents of the m experimental ray generating tubes are obtained as m first experimental sampling currents, where m is an integer greater than or equal to 2.

[0067] In operation S320, when the m first experimental sampling currents are all equal to the set current, the sampling currents of the m experimental filaments corresponding to the m experimental ray generating tubes are obtained as m second experimental sampling currents.

[0068] In operation S330, the average of the m second experimental sampling currents is calculated as the filament preheating current.

[0069] The step of setting a more accurate filament preheating current, in other words, the filament preheating current set by operation S310 to operation S330 can make the set relationship between the set current and the filament preheating current more accurate, so that when the tube current of the ray generating tube reaches the set current, the conclusion of whether the sampling value of the filament current, that is, the second sampling current, is close to the actual value compared with the filament preheating current is more accurate. At this time, the filament correction coefficient is corrected according to the relationship between the second sampling current and the preset filament preheating current, which is more accurate, so that the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator can be corrected more efficiently and accurately.

[0070] According to some embodiments of the present disclosure, the step of presetting the filament preheating current includes operation S410 and operation S440.

[0071] In operation S410, the sampling current of the experimental ray generating tube is obtained as the first experimental sampling current.

[0072] In operation S420, when the first experimental sampling current is equal to the set current, the sampling current of the experimental filament corresponding to the experimental ray generating tube is obtained as the second experimental sampling current.

[0073] At operation S430, the sampling current of the sampling experimental ray generating tube is repeatedly executed as a first experimental sampling current; when the first experimental sampling current is equal to the set current, the sampling current of the experimental filament corresponding to the experimental ray generating tube is obtained as a second experimental sampling current n times, obtaining n second experimental sampling currents, where n is an integer greater than or equal to 2.

[0074] At operation S440, the average of the n second experimental sampling currents is calculated as the filament preheating current.

[0075] Through operations S410 to S440, a more accurate filament preheating current can be set, in other words, the filament preheating current set through operations S410 to S440 can make the set relationship between the set current and the filament preheating current more accurate, so that when the tube current of the ray generating tube reaches the set current, the conclusion of whether the sampling value of the filament current, that is, the second sampling current, is close to the actual value is more accurate by comparing the second sampling current with the pre-set filament preheating current. At this time, the filament correction coefficient is corrected more accurately according to the relationship between the second sampling current and the pre-set filament preheating current, so that the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator can be corrected more efficiently and accurately.

[0076] According to some embodiments of the present disclosure, the pre-set set current can be: 10% of the rated current, 20% of the rated current, 30% of the rated current, 40% of the rated current, 50% of the rated current, 60% of the rated current, 70% of the rated current, 80% of the rated current, 90% of the rated current, or the rated current.

[0077] Of course, the pre-set set current can also be any set value, and the set current can be set according to actual needs.

[0078] Pre-setting a relatively reasonable set current corresponding to the demand can facilitate the set current as a threshold of the first sampling current, which can achieve better collection of the second sampling current and save resources when the first sampling current reaches the threshold, so as to collect the second sampling current under the premise of saving resources, and calibrate the filament correction coefficient according to the second sampling current and the pre-set filament preheating current.

[0079] The following refers to Figure 4 The calibration method of the filament according to the embodiments of the present disclosure is described in detail. It is worth understanding that the following description is only exemplary and is not a specific limitation of the present disclosure.

[0080] According to the filament calibration method, when the filament correction instruction is received, filament correction is started, the rated voltage of the high-voltage power supply is set to the ray generating tube, the threshold of the ray generating tube is set to the set current I mA0 , the high-voltage power supply and the ray generating tube are turned on, the ray generating tube emits a beam, the first sampling current I mA of the ray generating tube is read, when I mA = I mA0 , the second sampling current I f of the filament is read, the filament correction coefficient of this time is calculated: k f = ×k f0 , the filament correction coefficient of this time is updated to the filament calibration device, and the filament correction is completed.

[0081] Based on the above filament calibration method, the present disclosure further provides a filament calibration device. The filament calibration device will be described in detail below. Figure 5 The filament calibration device is used to correct the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube in the X-ray generator, and the mapping relationship includes a filament correction coefficient.

[0082] Figure 5 The structure block diagram of the filament calibration device according to the embodiment of the present disclosure is schematically shown.

[0083] The filament calibration device 10 includes a first sampling module 1, a second sampling module 2, and a calibration module 3.

[0084] Specifically, the first sampling module 1 is used to turn on the high-voltage power supply and the ray generating tube, obtain the sampling current of the ray generating tube as the first sampling current; the second sampling module 2 is used to obtain the sampling current of the filament as the second sampling current when the first sampling current is equal to the preset set current; and the calibration module 3 is used to calibrate the filament correction coefficient according to the second sampling current and the preset filament preheating current, wherein the set current and the filament preheating current have a set relationship.

[0085] According to the filament calibration device 10 of the embodiment of the present disclosure, by turning on the high-voltage power supply and the ray generating tube, the sampling current of the ray generating tube can be obtained as the first sampling current; then when the first sampling current is equal to the preset set current, the sampling current of the filament can be obtained as the second sampling current; and according to the second sampling current and the preset filament preheating current, the filament correction coefficient can be calibrated, wherein the set current and the filament preheating current have a set relationship.

[0086] The device 10 of the present disclosure sets a filament preheating current in advance, and has a set relationship between the set current and the filament preheating current, so that the meaning of the filament preheating current is that when the tube current of the ray generating tube reaches a specific value, that is, the set current, if the sampling value of the filament current, that is, the second sampling current, is equal to the filament preheating current, it means that the sampling value of the filament current is closer to the actual value. If the sampling value of the filament current is not equal to the filament preheating current, it means that the sampling value of the filament current deviates from the actual value. At this time, the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube can be corrected by correcting the filament correction coefficient according to the relationship between the second sampling current and the pre-set filament preheating current, so as to realize the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube. The mapping relationship comprehensively considers the filament current sampling error and the difference between the filament characteristic curves of different filaments and ray generating tubes, and realizes the efficient and accurate correction of the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube. In addition, the method of the present disclosure does not need to rely on customized filament tooling, and the cost is low. Without disassembling the X-ray generator, it is easy to operate.

[0087] In addition, according to the embodiments of the present disclosure, any one of the first sampling module 1, the second sampling module 2 and the calibration module 3 can be combined in one module, or any one of them can be split into multiple modules. Alternatively, at least part of the function of one or more of these modules can be combined with at least part of the function of other modules and implemented in one module.

[0088] According to the embodiments of the present disclosure, at least one of the first sampling module 1, the second sampling module 2 and the calibration module 3 can be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on chip, a system on substrate, a system on package, an application specific integrated circuit (ASIC), or any other reasonable way of integrating or packaging a circuit, etc. Hardware or firmware, or any one of the three implementation ways of software, hardware and firmware or a proper combination of any of them.

[0089] Alternatively, at least one of the first sampling module 1, the second sampling module 2 and the calibration module 3 can be at least partially implemented as a computer program module which can perform corresponding functions when the computer program module is run.

[0090] The present disclosure also provides an X-ray generator applying the filament calibration method as described above. According to some embodiments of the present disclosure, the X-ray generator comprises a ray generating tube, a high-voltage power supply, a filament and a filament transformer.

[0091] Specifically, the ray generating tube comprises a tube shell with vacuum inside and an anode and a cathode arranged in the tube shell; a high-voltage power supply is used to provide high voltage between the cathode and the anode; a filament is electrically connected with the cathode; and a filament transformer is electrically connected with the filament and used to provide voltage for the filament.

[0092] According to the X-ray generator of the present disclosure, after the calibration method of the filament and the calibration device of the filament are corrected, the problem of slow current dynamic response of the ray generating tube in the beam-out process caused by the actual filament current being too small or the problem of current overshoot of the ray generating tube when the beam is out caused by the actual filament current being too large, which simultaneously affects the service life of the filament, can be avoided.

[0093] The present disclosure also provides a CT device. According to some embodiments of the present disclosure, the CT device comprises the X-ray generator as described above. After the calibration method of the filament and the calibration device of the filament are corrected, the problem of slow current dynamic response of the ray generating tube in the beam-out process caused by the actual filament current being too small or the problem of current overshoot of the ray generating tube when the beam is out caused by the actual filament current being too large, which simultaneously affects the service life of the filament, can be avoided.

[0094] Figure 6 A block diagram of an electronic device suitable for implementing the above-described method according to an embodiment of the present disclosure is schematically shown.

[0095] As shown in Figure 6 The electronic device 900 according to an embodiment of the present disclosure includes a processor 901, which can perform various appropriate actions and processes according to programs stored in a read-only memory (ROM) 902 or loaded from a storage portion 908 into a random access memory (RAM) 903. The processor 901 can include, for example, a general-purpose microprocessor (e.g., a CPU), an instruction set processor, and / or a related chipset, and / or a special-purpose microprocessor (e.g., an application-specific integrated circuit (ASIC)), and / or the like. The processor 901 can also include an on-board memory for cache use. The processor 901 can include a single processing unit or a plurality of processing units for performing different actions of the method processes according to embodiments of the present disclosure.

[0096] In the RAM 903, various programs and data required for the operation of the electronic device 900 are stored. The processor 901, the ROM 902, and the RAM 903 are connected to each other through a bus 904. The processor 901 performs various operations of the method processes according to embodiments of the present disclosure by executing programs in the ROM 902 and / or the RAM 903. It should be noted that the programs can also be stored in one or more memories other than the ROM 902 and the RAM 903. The processor 901 can also perform various operations of the method processes according to embodiments of the present disclosure by executing programs stored in the one or more memories.

[0097] According to an embodiment of the present disclosure, the electronic device 900 can further include an input / output (I / O) interface 905 that is also connected to the bus 904. The electronic device 900 can further include one or more of the following components connected to the I / O interface 905: an input part 906 including, for example, a keyboard and a mouse; an output part 907 including, for example, a cathode ray tube (CRT), a liquid crystal display (LCD), and a speaker; a storage part 908 including, for example, a hard disk; and a communication part 909 including, for example, a LAN card, a modem, and the like. The communication part 909 performs communication processing via a network such as the Internet. A driver 910 is also connected to the input / output (I / O) interface 905 as necessary. A removable medium 911 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, and the like is mounted on the driver 910 as necessary, so that a computer program read therefrom is installed in the storage part 908 as necessary.

[0098] The present disclosure also provides a computer readable storage medium, which can be included in the device / apparatus / system described in the above embodiments, or can exist separately without being assembled into the device / apparatus / system. The above computer readable storage medium carries one or more programs, which, when executed, implement the method according to the embodiments of the present disclosure.

[0099] According to an embodiment of the present disclosure, the computer readable storage medium can be a non-volatile computer readable storage medium, for example, which can include, but is not limited to, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any appropriate combination thereof. In the present disclosure, the computer readable storage medium can be any tangible medium that contains or stores a program that can be used by or in connection with an instruction execution system, apparatus, or device. For example, according to an embodiment of the present disclosure, the computer readable storage medium can include one or more memories such as the ROM 902 and / or the RAM 903 described above and / or one or more memory other than the ROM 902 and the RAM 903.

[0100] Embodiments of the present disclosure also include a computer program product including a computer program containing program codes for executing the methods shown in the flowcharts. When the computer program product is run in a computer system, the program codes are used to make the computer system implement the methods of the embodiments of the present disclosure.

[0101] The above-described functions of the system / apparatus defined in the embodiments of the present disclosure are performed when the computer program is executed by the processor 901. According to the embodiments of the present disclosure, the system, apparatus, module, unit, etc. described above can be implemented by the computer program modules.

[0102] In one embodiment, the computer program can be stored in a tangible storage medium, such as an optical, magnetic, or other memory on a server, computer, or other computing device. In another embodiment, the computer program can be transmitted over a network, including the Internet, WAN, LAN, or other network, including a wireless network, between a server and a client (e.g., using a web server or other server) or between two client devices (e.g., using a peer-to-peer network), using signal(s) in the form of packets, electronic signals, electrical, optical, or other form.

[0103] In such an embodiment, the computer program can be downloaded and installed from a network, such as the Internet, WAN, LAN, or other network, including a wireless network, between a server and a client (e.g., using a web server or other server) or between two client devices (e.g., using a peer-to-peer network), using signal(s) in the form of packets, electronic signals, electrical, optical, or other form. The computer program can be downloaded and installed from a removable medium 911, such as a CD-ROM, DVD, memory stick, or other removable medium, using signal(s) in the form of packets, electronic signals, electrical, optical, or other form. When the computer program is executed by the processor 901, the above-described functions of the system defined in the embodiments of the present disclosure are performed. According to the embodiments of the present disclosure, the system, apparatus, device, module, unit, etc. described above can be implemented by the computer program modules.

[0104] According to the embodiments of the present disclosure, the program code for execution of the computer programs provided by the embodiments of the present disclosure can be written in any combination of one or more programming languages, and specifically, can be implemented using high-level procedural and / or object-oriented programming language, and / or assembly / machine language. The programming language includes, but is not limited to, such as Java, C++, python, “C” language, or similar programming languages. The program code can be executed entirely on a user computing device, partially on a user device, partially on a remote computing device, or entirely on a remote computing device or server. In the case involving a remote computing device, the remote computing device can be connected to the user computing device through any kind of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computing device (e.g., using an Internet service provider to connect through the Internet).

[0105] The computer program product of the first aspect can include one or more non-transitory computer-readable media storing instructions that, when executed, cause one or more processors to perform the operations of the first aspect. The one or more non-transitory computer-readable media can include, for example, magnetic media such as one or more magnetic disks, magnetic tapes or cassettes; optical media such as one or more compact discs (CD), optical discs or discs (for example, DVD, Blu-ray Disc®, digital video disc, ultra density disc, ultra-compact disc, any optical media, etc.); semiconductor media such as solid state hard drives (for example, flash memory, solid state USB drives, etc.); any other suitable medium; or any suitable combination of media.

[0106] Those skilled in the art will understand that features recited in various embodiments and / or claims of the present disclosure can be combined and / or interchanged, even if this is not explicitly stated in the present disclosure. In particular, features recited in various embodiments and / or claims of the present disclosure can be combined and / or interchanged, without departing from the spirit and teachings of the present disclosure. All such combinations and / or interchanges are within the scope of the present disclosure.

[0107] The above describes embodiments of the present disclosure. However, these embodiments are merely for illustrative purposes, and are not intended to limit the scope of the present disclosure. Although each embodiment is described above separately, this does not mean that the measures in each embodiment cannot be used advantageously in combination. The scope of the present disclosure is defined by the appended claims and their equivalents. Those skilled in the art can make various substitutions and modifications without departing from the scope of the present disclosure, and all such substitutions and modifications shall fall within the scope of the present disclosure.

Claims

1. A filament calibration method for correcting the mapping relationship between the sampling current of the filament and the tube current of the X-ray generating tube in an X-ray generator, the mapping relationship including a filament correction coefficient, the method comprising: Connect the high-voltage power supply to the X-ray generating tube and obtain the sampling current of the X-ray generating tube as the first sampling current; When the first sampling current is equal to the preset current, the sampling current of the filament is obtained and used as the second sampling current; The filament correction coefficient is calibrated based on the second sampling current and the preset filament preheating current, wherein the preset current and the filament preheating current have a predetermined relationship. The step of calibrating the filament correction coefficient based on the second sampling current and the preset filament preheating current includes: The filament correction coefficient for the current time is determined based on the second sampling current, the preset filament preheating current, and the previous filament correction coefficient. When the current time is the first time, the previous filament correction coefficient is the initially set filament correction coefficient. Replace the previous filament correction factor with the current filament correction factor.

2. The filament calibration method according to claim 1, characterized in that, The step of presetting the filament preheating current includes: Obtain the sampling currents of m experimental X-ray generating tubes, and use them as the m first experimental sampling currents, where m is an integer greater than or equal to 2; When all m first experimental sampling currents are equal to the set current, the sampling currents of m experimental filaments corresponding one-to-one with the m experimental ray generating tubes are obtained as m second experimental sampling currents; Calculate the average value of the m second experimental sampling currents as the filament preheating current.

3. The filament calibration method according to claim 1, characterized in that, The step of presetting the filament preheating current includes: The sampling current of the X-ray generator tube in the sampling experiment is used as the first experimental sampling current; When the first experimental sampling current is equal to the set current, the sampling current of the experimental filament corresponding to the experimental ray generating tube is obtained as the second experimental sampling current. The sampling current of the experimental X-ray generator tube is repeatedly sampled and used as the first experimental sampling current. When the first experimental sampling current is equal to the set current, the sampling current of the experimental filament corresponding to the experimental X-ray generator tube is obtained and used as the second experimental sampling current n times to obtain n second experimental sampling currents, where n is an integer greater than or equal to 2. The average value of the n second experimental sampling currents is calculated as the filament preheating current.

4. The filament calibration method according to claim 1, characterized in that, The set current is: 10% of the rated current, 20% of the rated current, 30% of the rated current, 40% of the rated current, 50% of the rated current, 60% of the rated current, 70% of the rated current, 80% of the rated current, 90% of the rated current, or the rated current.

5. A filament calibration device for correcting the mapping relationship between the sampling current of the filament and the tube current of the X-ray generating tube in an X-ray generator, the mapping relationship including a filament correction coefficient, the device comprising: The first sampling module is used to connect the high-voltage power supply to the X-ray generating tube and obtain the sampling current of the X-ray generating tube as the first sampling current. The second sampling module is used to obtain the sampling current of the filament as the second sampling current when the first sampling current is equal to the preset setting current. The calibration module is used to calibrate the filament correction coefficient based on the second sampling current and a preset filament preheating current, wherein the preset current and the filament preheating current have a predetermined relationship. The step of calibrating the filament correction coefficient based on the second sampling current and the preset filament preheating current includes: The filament correction coefficient for the current time is determined based on the second sampling current, the preset filament preheating current, and the previous filament correction coefficient. When the current time is the first time, the previous filament correction coefficient is the initially set filament correction coefficient. Replace the previous filament correction factor with the current filament correction factor.

6. An electronic device, comprising: One or more processors; One or more memories are provided for storing executable instructions that, when executed by the processor, implement the method according to any one of claims 1 to 4.

7. A computer-readable storage medium storing executable instructions that, when executed by a processor, implement the method according to any one of claims 1 to 4.

8. A computer program product comprising a computer program, the computer program including one or more executable instructions, which, when executed by a processor, implement the method according to any one of claims 1 to 4.

9. An X-ray generator employing the calibration apparatus of claim 5, comprising: A radiation generating tube, the radiation generating tube comprising a tube shell with an internal vacuum and an anode and a cathode disposed in the tube shell; A high-voltage power supply is used to provide high voltage between the cathode and the anode; A filament, which is electrically connected to the cathode; A filament transformer, which is electrically connected to the filament, is used to provide voltage to the filament.

10. A CT device, the CT device comprising the X-ray generator as claimed in claim 9.

Images