A defect detection system for capacitor metallized film processing
By setting a bent assembly on the transmission assembly of the metallized film, the film produces a bent part and detects it in combination with a beam transmitter and receiver, the problem of detecting blind spots in the prior art is solved, and a more comprehensive defect detection is achieved.
Patent Information
- Application Number
- CN202510199141.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-24
- Publication Date
- 2025-06-20
- Estimated Expiration
- 2045-02-24
AI Technical Summary
The prior art is prone to blind spots when detecting metallized films, especially in uneven thickness and depressions, which make it difficult to fully detect defects.
By providing a bending assembly on the transmission assembly, the metallized film produces a bending portion, combining a beam emitter and a beam receiver, the detection is performed using multiple incident angles provided by the bending portion to cover a wider detection area.
It effectively overcomes the blind spot problem, can more comprehensively detect defects on metallized films, and improves the accuracy and coverage of detection.
Smart Images

Figure CN119688594B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of defect detection, and particularly to a defect detection system for the processing of capacitor metallized films. Background Art
[0002] During the processing of metallized films, due to the influence of various factors, defects such as cracks, pits, rust, stains, impurities, insects, and holes may occur on the film surface. These defects not only affect the appearance and performance of the product but may also cause problems in subsequent processing or use of the product. For example, partial discharge in a metallized film capacitor is usually a discharge phenomenon that occurs under the action of an electric field due to the inability to penetrate the electrodes. When the partial discharge accumulates to a certain extent, it is very easy to have an insulation breakdown accident, directly affecting the normal operation of the capacitor. To solve the limitations of traditional detection methods, people have begun to study metallized film defect detection systems based on modern technologies such as machine vision and deep learning. These systems usually use high-resolution cameras and specific light sources to obtain images of the film surface, and then analyze and process the images through image processing and computer vision technologies to achieve defect recognition and positioning.
[0003] In the prior art, for example, Patent No. CN107917671A discloses a method for detecting the thickness error of a capacitor film, which detects the metallized film by collecting the reflection of a laser beam on the metallized film and judges whether there are defects on the metallized film according to the imaging of the laser beam. However, during the detection process of the laser beam, since the incident angle always remains a fixed value, it is easy to have dead angles when facing situations such as uneven thickness and depressions. Summary of the Invention
[0004] To solve the above problems, the present invention provides a defect detection system for the processing of capacitor metallized films, which can bend the metallized film to fully expose the defects and reduce the dead angles during the detection process.
[0005] To achieve the above object, the technical solution of the present invention is as follows: A defect detection system for the processing of capacitor metallized films, comprising:
[0006] A transmission component: used for conveying the metallized film. A bending component is provided on the transmission component, and the bending component is used to cause the metallized film to generate a bending portion. The bending portion is divided into a front bending portion and a rear bending portion. The front bending portion is a section of the metallized film that moves towards the vertex of the bending portion within the bending portion, and the rear bending portion is a section of the metallized film that moves away from the vertex of the bending portion within the bending portion;
[0007] A beam emitter: used for emitting a beam to the metallized film, and the beam covers at least the front bending portion and the rear bending portion;
[0008] Beam receiver: It is used to receive the beams reflected by the front bending part and the rear bending part, and respectively detect the defects on the front bending part and the rear bending part based on the change in the reflection angle caused by the defects in the received beams.
[0009] Adopting the above solution has the following beneficial effects:
[0010] 1. In this solution, the transmission component can transport the metallized film to continuously change the detection position, so as to detect the defects of the entire metallized film.
[0011] 2. In this solution, the bending component can bend the metallized film to form a bending part. Compared with the flat placement in conventional optical detection, the bending part can provide more incident angles, so that the beam can be incident at more angles, thus effectively overcoming the dead angle problem.
[0012] 3. In this solution, the bending part is divided into a front bending part and a rear bending part, and the moving directions of the metallized film segments in the front bending part and the rear bending part are opposite with respect to the vertex of the bending part. Therefore, by irradiating the bending part, the beam emitter can complete the multi-angle beam irradiation in front of the defect in the front bending part, and in the rear bending part, it can complete the multi-angle beam irradiation behind the defect, covering a wider range of beam incident angles, and the light source is unified, without the need to set light sources in multiple directions for the optical detection before and after the defect.
[0013] Furthermore, it further includes a pressing module, and the pressing module is used to control the tension of the metallized film in the bending part and smooth out the metallized film.
[0014] Beneficial effect: The pressing module can control the tension of the metallized film in the bending part, and reduce the influence of the shape change caused by uneven tension on the detection effect.
[0015] Furthermore, the pressing module includes a first pressing roller group and a second pressing roller group, and the first pressing roller and the second pressing roller are respectively located on both sides of the bending component.
[0016] Beneficial effect: Both the first pressing roller group and the second pressing roller group can control the transportation speed of the metallized film through roller transmission and press the metallized film. Among them, the first pressing roller group controls the entering speed of the metallized film going to the bending component, and the second pressing roller controls the leaving speed of the metallized film leaving the bending component. Therefore, the tension of the metallized film in the bending part can be controlled by controlling the entering speed and the leaving speed.
[0017] Furthermore, the bending component includes a transport roller, and the transport roller forms a triangular transport path with the first pressing roller group and the second pressing roller group.
[0018] Beneficial effect: The metallized film has good bending performance. Therefore, through the setting of the transport roller, the metallized film generates a bending part when passing through the transport roller.
[0019] Furthermore, the light beam receiver includes two CCD photosensitive plates, which are respectively used to receive the light beams reflected by the front bending part and the rear bending part;
[0020] The CCD photosensitive plate is used to receive the light beam reflected by the metallized film. When there is a floating area with a floating greater than the preset threshold in the light beam hitting point coordinates, it is determined that there is a defect in the light beam irradiation section of the metallized film.
[0021] Beneficial effects: The CCD photosensitive plate can read the hitting point coordinate information of the light beam hitting on the CCD photosensitive plate, and the defect on the metallized film will change the reflection angle of the light beam, thereby changing the position where the light beam hits on the CCD photosensitive plate. By reading the hitting point coordinates detected on the CCD photosensitive plate, it can be known whether there is a defect. The CCD photosensitive plates are located on one side of the transport roller close to the first pressing roller group and on one side of the transport roller close to the second pressing roller group, and can respectively detect the light beams reflected from the front bending part and the rear bending part.
[0022] Furthermore, it further includes an image acquisition module. The light beam emitter is used to form a grating grid on the metallized film through the light beam. The image acquisition module is used to acquire the grating grid image on the metallized film and analyze the continuity of the grating grid edge through image recognition, and judge the defect of the metallized film through the continuity of the grating grid edge.
[0023] Beneficial effects: After the metallized film is bent, the original depression can be exposed, so that the change of the edge line caused by the depression can be clearly observed in the asymptote direction of the bending part. The defect of the metallized film is judged by identifying the continuity of the grating grid edge in the image.
[0024] Furthermore, it further includes a thickness measuring component, which is used to measure the thickness of the metallized film after passing through the first pressing roller group.
[0025] Beneficial effects: The light beam emitter and the light beam receiver can only detect the surface defects, and the metallized film may have a situation where the whole section becomes thicker or thinner. The thickness measuring component can directly detect the thickness of the metallized film, so as to judge whether there is a section of the metallized film with a thickness increase.
[0026] Furthermore, the thickness measuring component includes two laser rangefinders, which are respectively located on both sides of the bottom and top of the metallized film.
[0027] Beneficial effects: By detecting the distances between the two laser rangefinders and the bottom and top of the metallized film, and comparing and calculating with the distance between the two laser rangefinders, the thickness of the metallized film can be obtained.
[0028] Further, it further includes a conversion processing module. The conversion processing module is used to preset the deformation information of the bending part. The conversion processing module is used to perform shape inversion on the defects detected by the beam receiver based on the deformation information of the bending part. The inversion includes the degree of bending, thickness, and length of the metallized film, and the inversion outputs the defect information when the metallized film is straightened.
[0029] Beneficial effects: Although the bending part can better expose the defects, due to the bending, both the metallized film and the defects have deformed. If it is necessary to analyze the process reasons, it is necessary to restore the shapes of the metallized film and the defects. The conversion processing module can restore the shapes of the metallized film and the defects based on the preset deformation information of the bending part, so as to convert the detection data into the scale when the metallized film is straightened.
[0030] Further, the conversion processing module is further used to classify the defects into pockmarks, burrs, bumps, depressions, and scratches based on the defect information and count the quantity and position.
[0031] Beneficial effects: The conversion processing module classifies the defects based on the defect information and records the positions, so as to facilitate subsequent process improvement according to the defect types and positions.
[0032] Additional aspects and advantages of the present invention will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present invention. Description of the Drawings
[0033] Figure 1 Isometric schematic diagram of an embodiment of the defect detection system for capacitor metallized film processing according to the present invention;
[0034] Figure 2 Front view schematic diagram of an embodiment of the defect detection system for capacitor metallized film processing according to the present invention;
[0035] Figure 3 Module schematic diagram of an embodiment of the defect detection system for capacitor metallized film processing according to the present invention.
[0036] Reference numerals in the drawings of the specification include: 1, metallized film; 2, front bending part; 3, rear bending part; 4, beam emitter; 5, beam receiver; 6, first pressing roller group; 7, second pressing roller group; 8, conveying roller; 9, camera; 10, laser rangefinder. Detailed Embodiments
[0037] The technical solution of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.
[0038] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention. In addition, the terms "first", "second", "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.
[0039] In the description of the present invention, it should be noted that unless otherwise clearly specified and defined, the terms "installed", "connected", "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.
[0040] The following will be further described in detail through specific embodiments:
[0041] As shown in the Figures 1 - 3 accompanying drawings: A defect detection system for the processing of capacitor metallized films, comprising:
[0042] A transmission component: used to convey the metallized film 1. The transmission component is a conveyor belt group or a conveyor wheel group. A bending component is provided on the transmission component. The bending component includes a transport roller 8. The transport roller 8 and the first pressing roller group 6 and the second pressing roller group 7 form a triangular transport path. The bending component is used to make the metallized film 1 generate a bending part. The bending part is divided into a front bending part 2 and a rear bending part 3. The front bending part 2 is a section of the metallized film 1 that moves towards the vertex of the bending part inside the bending part, and the rear bending part 3 is a section of the metallized film 1 that moves away from the vertex of the bending part inside the bending part. The vertex is the point where the middle part of the bending part folds back after the metallized film 1 generates bending. For example, if the metallized film 1 generates a downward bend, the vertex is the lowest point of the bending part; if the metallized film 1 generates an upward bend, the vertex is the highest point of the bending part.
[0043] Laminating module: The laminating module is used to control the tension of the metallized film 1 at the bending part and smooth out the metallized film 1. The laminating module includes a first laminating roller group 6 and a second laminating roller group 7. The first laminating roller and the second laminating roller are respectively located on both sides of the bending assembly.
[0044] Beam emitter 4: It is used to emit a beam to the metallized film 1, and the beam covers at least the front bending part 2 and the rear bending part 3.
[0045] Beam receiver 5: It is used to receive the beams reflected by the front bending part 2 and the rear bending part 3, and respectively detect the defects on the front bending part 2 and the rear bending part 3 based on the change in the reflection angle caused by the defects in the received beams. The beam receiver 5 includes two CCD photosensitive plates, and the CCD photosensitive plates are respectively used to receive the beams reflected by the front bending part 2 and the rear bending part 3. In this embodiment, the CCD photosensitive plates are respectively placed on the left and right sides of the transport roller 8.
[0046] Image acquisition module: The beam emitter 4 is used to form a grating grid on the metallized film 1 through the beam. The image acquisition module is used to acquire the grating grid image on the metallized film 1 and analyze the continuity of the grating grid edges through image recognition, and judge the defects of the metallized film 1 based on the continuity of the grating grid edges. The image acquisition module includes a camera 9, and the camera 9 is located on the side of the metallized film 1 close to the beam emitter 4.
[0047] Thickness measurement component: It is used to measure the thickness of the metallized film 1 after passing through the first laminating roller group 6. The thickness measurement component includes two laser rangefinders 10, and the laser rangefinders 10 are respectively located in the middle of the beam emitter 4 on both sides of the bottom and top of the metallized film 1.
[0048] Conversion and processing module: It is used to preset the deformation information of the bending part. The conversion and processing module is used to perform shape inversion on the defects detected by the beam receiver 5 based on the bending part deformation information. The inversion includes the bending degree, thickness and length of the metallized film 1. The inversion outputs the defect information of the metallized film 1 when it is straightened, and classifies the defects into pockmarks, burrs, bumps, depressions and scratches based on the defect information and counts the quantity and position.
[0049] During use, the metallized film 1 is transported relying on the transport component. The transport component can transport the metallized film 1 to continuously change the detection position, so as to detect defects in the whole metallized film 1. The metallized film 1 will enter the bending component area through the first pressing roller group 6. The first pressing roller group 6 and the second pressing roller group 7 can adjust the tension of the metallized film 1 by rotating speed. After the metallized film 1 passes through the first pressing roller group 6, the thickness measuring component will detect the thickness of the metallized film 1 through the laser rangefinder 10. By detecting the distances between the two laser rangefinders 10 and the bottom and top of the metallized film 1, and then comparing and calculating with the distance between the two laser rangefinders 10, the thickness of the metallized film 1 can be obtained, so as to judge whether there is a section of the metallized film 1 with increased or decreased thickness.
[0050] Subsequently, the metallized film 1 will enter the bending component. Through the setting of the transport roller 8, a bending part is generated when the metallized film 1 passes through the transport roller 8. Compared with the flat placement in the conventional optical detection, the bending part can provide more incident angles, so that the light beam can be incident at more angles, fully bounce into the defect, thus effectively overcoming the dead angle problem. The bending part is divided into a front bending part 2 and a rear bending part 3. The moving directions of the sections of the metallized film 1 in the front bending part 2 and the rear bending part 3 are opposite to the vertex of the bending part. Therefore, when the light beam emitter 4 irradiates on the bending part, it can complete the multi-angle light beam irradiation in front of the defect in the front bending part 2, and on the rear bending part 3, it can complete the multi-angle light beam irradiation behind the defect, covering a wider range of light beam incident angles, and the light source direction is unified, without setting light sources in multiple directions for the optical detection before and after the defect.
[0051] The pressing module can control the tension of the metallized film 1 in the bending part, reducing the influence of shape deformation caused by uneven tension on the detection effect. Both the first pressing roller group 6 and the second pressing roller group 7 can control the transport speed of the metallized film 1 through roller transmission and press the metallized film 1. Among them, the first pressing roller group 6 controls the entry speed of the metallized film 1 going to the bending component, and the second pressing roller controls the leaving speed of the metallized film 1 leaving the bending component. Therefore, the tension of the metallized film 1 in the bending part can be controlled by controlling the entry speed and the leaving speed.
[0052] The light beam receiver 5 includes two CCD photosensitive plates. The CCD photosensitive plates can read the strike point coordinate information of the light beam hitting on the CCD photosensitive plates. The defects on the metallized film 1 will change the reflection angle of the light beam, thus changing the position where the light beam hits on the CCD photosensitive plates. When there is a floating area with a floating greater than the preset threshold in the light beam strike coordinates, it is confirmed that there is a defect in this section of the metallized film 1. The CCD photosensitive plates are located on one side of the transport roller 8 close to the first pressing roller group 6 and on one side of the transport roller 8 close to the second pressing roller group 7, and can respectively detect the light beams reflected from the front bending part 2 and the rear bending part 3.
[0053] The conversion processing module is used to preset the deformation information of the bending part. Although the bending part can better expose the defects, due to the bending, both the metallized film 1 and the defects have deformed. If it is necessary to analyze the process reasons, it is necessary to restore the shapes of the metallized film 1 and the defects to obtain the actual defect images. The conversion processing module can restore the shapes of the metallized film 1 and the defects based on the preset deformation information of the bending part, so as to convert the detection data into the scale when the metallized film 1 is straightened, which is convenient for subsequent process optimization and reduces the generation of defects.
[0054] The conversion processing module is also used to classify the defects into pockmarks, burrs, bumps, depressions and scratches based on the defect information and count the quantity and location, which can facilitate the generation of a defect data table, enabling the user to understand the concentrated types and locations of the defects during the production process based on the defect data table.
[0055] Obviously, the above embodiments are only examples given for clear illustration and are not limitations on the implementation manners. For those of ordinary skill in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to enumerate all the implementation manners here. And the obvious changes or modifications derived therefrom are still within the protection scope of the present invention.
Claims
1. A defect detection system for capacitor metallization film processing, characterized in that: include: A transmission component: used for conveying a metallized film (1), the transmission component being provided with a bending component, the bending component being used for causing the metallized film (1) to produce a bending portion, the bending portion being a front bending portion (2) and a rear bending portion (3), the front bending portion (2) being a section of the metallized film (1) moving in the bending portion toward the vertex of the bending portion, and the rear bending portion (3) being a section of the metallized film (1) moving in the bending portion away from the vertex of the bending portion; A light beam emitter (4): used for emitting a light beam toward the metallized film (1), wherein the light beam at least covers the front curved portion (2) and the rear curved portion (3); A light beam receiver (5) is used to receive light beams reflected by the front curved portion (2) and the rear curved portion (3), and detect defects on the front curved portion (2) and the rear curved portion (3) based on changes in reflection angles of the received light beams caused by the defects; It also includes a conversion processing module, which is used to preset the deformation information of the bending part. The conversion processing module is used to perform shape inversion on the defects detected by the light beam receiver (5) based on the deformation information of the bending part, wherein the inversion includes the curvature, thickness and length of the metallized film (1), and the inversion outputs the defect information when the metallized film (1) is straightened.
2. The defect detection system for capacitor metallization film processing according to claim 1, characterized in that: It also comprises a pressing module, which is used to control the tension of the metallized film (1) at the bending portion and to stretch the metallized film (1).
3. The defect detection system for capacitor metallization film processing according to claim 2, characterized in that: The lamination module comprises a first lamination roller group (6) and a second lamination roller group (7), wherein the first lamination roller and the second lamination roller are respectively located on two sides of the bending component.
4. The defect detection system for capacitor metallization film processing according to claim 3, characterized in that: The bending assembly comprises a transport roller (8), wherein the transport roller (8) forms a triangular transport path with a first pressing roller group (6) and a second pressing roller group (7).
5. The defect detection system for capacitor metallization film processing according to claim 4, characterized in that: The light beam receiver (5) comprises two CCD photosensitive plates, and the CCD photosensitive plates are used to receive the light beams reflected by the front curved portion (2) and the rear curved portion (3) respectively; The CCD photosensitive plate is used to receive the light beam reflected by the metallized film (1). When a floating area with a floating value greater than a preset threshold value appears in the coordinates of the light beam striking point, it is determined that a defect exists in the light beam irradiation section of the metallized film (1).
6. The defect detection system for capacitor metallization film processing according to claim 5, characterized in that: It also includes an image acquisition module. The light beam emitter (4) is used to form a grating on the metallized film (1) through a light beam. The image acquisition module is used to obtain a grating image on the metallized film (1) and analyze the grating edge continuity through image recognition, and judge the defects of the metallized film (1) through the grating edge continuity.
7. The defect detection system for capacitor metallization film processing according to claim 6, characterized in that: It also includes a thickness measuring component, which is used to measure the thickness of the metallized film (1) after passing through the first lamination roller group (6).
8. The defect detection system for capacitor metallization film processing according to claim 7, characterized in that: The thickness measurement component comprises two laser distance meters (10), and the laser distance meters (10) are respectively located on both sides of the bottom and top of the metallized film (1).
9. The defect detection system for capacitor metallization film processing according to claim 8, characterized in that: The conversion processing module is also used to classify the defects into pits, burrs, bumps, depressions and scratches based on the defect information and count the number and position.
Citation Information
Patent Citations
Capacitor film thickness error detection method
CN107917671A
Film thickness detection apparatus of capacitor film
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Optical motion picture film inspection system
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