Test method and device, chip and storage medium
By acquiring and generating specific image data and outputting it to the display screen, the problem of cumbersome and time-consuming testing in the prior art is solved, and a method of directly deriving the display subpixel rearrangement rules without the need for an external test box is realized, which significantly saves test time and cost.
Patent Information
- Application Number
- CN202411867028.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-18
- Publication Date
- 2025-03-25
AI Technical Summary
In the prior art, it is necessary to manually draw test images and externally connect test boxes, which makes the test cumbersome and time-consuming, and it is impossible to directly output the test images to display the screen to deduce the sub-pixel rearrangement rules of the display screen.
A test method is provided, by obtaining at least one column of subpixels as the first image data of the test column, generating the second image data according to the target vertical resolution, and outputting it to a display screen for display, thereby realizing the subpixel rearrangement rules of the display screen without the need for an external test box.
This method does not require manual generation of test images and external test boxes, and directly receives and processes image data to the display screen for display, which significantly saves test time and testing costs.