Calculation reconstruction spectrum detection device and method based on metal particle scattering

By using metal particle scattering structure and two-dimensional photodetector in the computational reconstruction integrated photon spectrometer, the problem of limited number of effective sampling channels in the prior art is solved, and high-resolution and high-precision spectral reconstruction is achieved, reducing device volume and system complexity.

CN119714533AInactive Publication Date: 2025-03-28NANJING INST OF ASTRONOMICAL OPTICS & TECH NAT ASTRONOMICAL OBSE
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Patent Information

Application Number
CN202510002060.5
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-01-02
Publication Date
2025-03-28
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

In the application scenarios where the existing computational reconstruction integrated photon spectrometers require extreme miniaturization, the number of effective sampling channels is limited, resulting in insufficient spectral resolution, accuracy and detection range.

Method used

A computational reconstruction spectral detection device based on metal particle scattering is adopted. Through the combination of multimode waveguide and metal particles, a two-dimensional photodetector is used to detect the scattered light field to achieve high sensitivity spectral reconstruction.

Benefits of technology

High resolution and high precision spectral reconstruction is achieved, reducing the number of optical components required, reducing device volume and system complexity, and improving portability.

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Abstract

The invention discloses a calculation reconstruction spectrum detection device and method based on metal particle scattering. The device comprises an input system, a multi-mode waveguide, metal particles and a two-dimensional photoelectric detector, the input system is a single-mode waveguide, light is injected into the multi-mode waveguide after being stably transmitted in the input system, and the metal particles are randomly distributed on the upper surface of the multi-mode waveguide and can scatter and output the transmitted light in the multi-mode waveguide from the upper surface. Therefore, the incident light spectrum is detected by the two-dimensional photoelectric detector placed above the multimode waveguide, and high-precision and high-resolution reconstruction of the incident light spectrum can be realized. Compared with an existing defect scattering mode, metal nanoparticle scattering has more sensitive wavelength response, so that the method has better performance; in addition, processing of the device is more convenient than that of a defect scattering type device. Compared with a traditional commercial spectrograph, the device has the advantages of being few in device, compact in structure and small in size, the system complexity and cost of the spectrograph are effectively reduced, and the portability of the spectrograph is improved.
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