Detection device for temperature field of sliding friction contact area
By designing a sliding friction contact area temperature field detection device including a spring shock absorber, the problem of time delay and insufficient spatial resolution when measuring temperature distribution in the traditional method in the dry friction state is solved, and a more stable and accurate temperature field detection is achieved.
Patent Information
- Application Number
- CN202411903320.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-23
- Publication Date
- 2025-03-28
AI Technical Summary
Traditional temperature measurement methods have problems of time delay and insufficient spatial resolution when measuring the temperature distribution of friction contact areas. Especially in the dry friction state, high-frequency vibration causes deformation and distortion of the thermal image screen, which affects thermal image analysis and data acquisition.
A temperature field detection device for sliding friction contact areas is designed, including an optical breadboard, first and second driving mechanism, sample plate and lower sample mechanism, temperature measurement mechanism, etc., and flexible normal loading and vibration control are realized through a spring shock absorber to ensure a good contact state between the sample ball and the sample plate.
The equipment can effectively adjust the load load between the sample ball and the sample disk, control dry friction vibration, ensure the stability of the contact state, thereby improving the reliability of temperature field detection and the accuracy of data acquisition.
Smart Images

Figure CN119714554A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of tribology testing equipment, and in particular to a temperature field detection device for a sliding friction contact area. Background Art
[0002] The field of tribology has long focused on frictional heat and its effects on friction and wear. Researchers have studied the temperature distribution in the friction contact area through various experimental methods. However, traditional temperature measurement methods, such as embedded thermocouples and thin-film thermocouples, cannot provide temperature distribution in the entire area, or there are problems with time delay and insufficient spatial resolution during the measurement process. With the development of thermal imaging technology, the method of using thermal imagers to observe the temperature field of the surface interface of an object is being widely used due to its own advantages such as high spatial resolution, high thermal resolution, and high sampling range.
[0003] At present, the radiation from the friction interface can be collected by using a thermal imager that responds to a specific band and a macro lens that is sensitive to infrared radiation, and converted into a corresponding temperature value according to Planck's law, so as to achieve the purpose of in-situ observation of the temperature field in the sliding friction contact area. However, in the dry friction state without a lubricating medium, the high-frequency vibration caused by the surface finishing during the contact between the upper and lower samples will not only cause load fluctuations, but also affect the contact state, resulting in deformation and distortion of the thermal image, which in turn affects thermal image analysis and data collection. Summary of the invention
[0004] The purpose of the present invention is to provide a temperature field detection device for the sliding friction contact area, which can solve the technical problem that "the high-frequency vibration caused by surface finishing during the contact between the upper sample and the lower sample will not only cause load fluctuations, but will also affect the contact state, resulting in deformation and distortion of the thermal image, thereby affecting thermal image analysis and data acquisition."
[0005] To solve the above technical problems, the present invention is achieved through the following technical solutions:
[0006] The present invention provides a device for detecting a temperature field in a sliding friction contact area, comprising: an optical breadboard;
[0007] The first driving mechanism and the second driving mechanism are respectively fixed on the optical breadboard;
[0008] a sample plate connected to the first driving mechanism so as to rotate under the driving of the first driving mechanism;
[0009] a lower sample mechanism connected to the second driving mechanism, wherein the lower sample mechanism has a sample ball, and the sample ball contacts the sample plate under the driving of the second driving mechanism;
[0010] A temperature measuring mechanism, fixed on the optical breadboard, for detecting the temperature of the contact area between the sample ball and the upper sample mechanism;
[0011] Wherein, the lower sample mechanism also includes:
[0012] a force sensor connected to the sample ball and used to measure the pressure between the sample ball and the sample plate;
[0013] A spring shock absorber is connected to the second driving mechanism, and a movable end of the spring shock absorber is connected to the force sensor.
[0014] In one embodiment of the present invention, the lower sample mechanism further includes a limiter, and the limiter includes:
[0015] a connecting plate, fixedly connected to the movable end of the second driving mechanism;
[0016] A plurality of support columns are fixed on the connecting plate;
[0017] A limiting collar, fixed on the plurality of supporting columns, the limiting collar having a first opening, the force sensor passing through the first opening, and a shape of the first opening matching the force sensor;
[0018] Wherein, the fixed end of the spring shock absorber is connected to the connecting plate.
[0019] In one embodiment of the present invention, the inner side wall of the opening is provided with a lubricating coating.
[0020] In one embodiment of the present invention, the sample lowering mechanism further comprises:
[0021] A lower sample pressing rod is connected to the force sensor, and a slot is provided at the end of the lower sample pressing rod in a direction away from the force sensor, and the shape of the slot matches the shape of the sample ball;
[0022] The lower sample pressing seat is sleeved on the outer circumference of the lower sample pressing rod and the sample ball and connected to the lower sample pressing rod. The lower sample pressing seat has a second opening, and the sample ball partially extends outward from the second opening.
[0023] In one embodiment of the present invention, the first driving mechanism comprises:
[0024] A driving motor, fixedly connected to the optical breadboard;
[0025] A connecting component, the input end of which is connected to the rotating end of the driving motor;
[0026] A main shaft, rotatably connected to the optical breadboard, the main shaft being connected to an output end of the connecting assembly;
[0027] Wherein, the sample plate is fixedly connected to the main shaft.
[0028] In one embodiment of the present invention, the connection component includes:
[0029] A driving wheel, fixedly connected to the rotating shaft of the motor;
[0030] A driven wheel, fixedly connected to the main shaft;
[0031] A belt is connected between the driving wheel and the driven wheel.
[0032] In one embodiment of the present invention, the first driving mechanism further includes a bearing assembly, and the bearing assembly includes:
[0033] A bearing box is arranged on the outer side of the main shaft;
[0034] At least one bearing, the outer ring of the bearing is fixedly connected to the bearing box, and the inner ring of the bearing is fixedly connected to the main shaft.
[0035] In one embodiment of the present invention, the second driving mechanism comprises:
[0036] A first driving member, a fixed end of which is fixedly connected to the optical breadboard;
[0037] A second driving member, a fixed end of which is fixedly connected to the movable end of the first driving member, and the first driving member drives the second driving member to move toward the sample plate in the horizontal direction;
[0038] Wherein, the movable end of the second driving member is connected to the lower sample mechanism, and in the vertical direction, the second driving member drives the lower sample mechanism to move toward the sample plate.
[0039] In one embodiment of the present invention, the first driving member comprises:
[0040] An adjustment platform, fixed on the optical breadboard;
[0041] A first screw nut transmission structure, rotatably disposed on the adjustment platform;
[0042] a first adjusting motor connected to the lead screw in the first lead screw and nut transmission structure, and used to drive the nut in the first lead screw and nut transmission structure to move horizontally in the horizontal direction, so as to drive the second driving member to move horizontally toward the sample plate;
[0043] The second driving member comprises:
[0044] a second screw nut transmission structure, rotatably disposed on the first screw nut transmission structure;
[0045] The second adjusting motor is connected to the screw in the second screw-nut transmission structure. In the vertical direction, the second adjusting motor is used to drive the nut in the second screw-nut transmission structure to move, so as to drive the lower sample mechanism to move vertically toward the sample plate.
[0046] In one embodiment of the present invention, the temperature measuring mechanism comprises:
[0047] a third driving member, a fixed end of which is connected to the optical breadboard;
[0048] An adjusting lifting frame, wherein a fixed end of the adjusting lifting frame is connected to a movable end of the third driving member, and the third driving member drives the adjusting lifting frame to move in a horizontal direction;
[0049] The infrared thermal imager is connected to the movable end of the adjustable lifting frame.
[0050] As described above, the present invention provides a device for detecting the temperature field in the sliding friction contact area. In the process of adjusting the contact between the sample ball and the sample disk, the loading load between the sample ball and the sample disk can be adjusted, and in the process of loading, flexible normal loading can be achieved through structures such as spring shock absorbers. In addition, in the process of generating sliding friction between the sample ball and the sample disk, the dry friction vibration can be controlled through the spring shock absorber. The present application simultaneously achieves the effects of flexible normal loading and vibration control, ensures a good contact state between the sample ball and the sample disk during the detection process, and is further conducive to ensuring the reliability of the detection structure obtained by the temperature measurement mechanism.
[0051] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS
[0052] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for describing the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.
[0053] Figure 1 A three-dimensional diagram of a device for detecting a temperature field in a sliding friction contact area according to an embodiment of the present invention;
[0054] Figure 2 It is a schematic diagram of the connection structure between the lower sample mechanism and the second driving mechanism of the temperature field detection device of the sliding friction contact area in one embodiment of the present invention;
[0055] Figure 3 It is a three-dimensional schematic diagram of the connection structure between the upper sample plate and the first driving mechanism of the temperature field detection device of the sliding friction contact area in one embodiment of the present invention;
[0056] Figure 4 It is a schematic diagram of the connection structure between the upper sample plate and the main shaft of the temperature field detection device of the sliding friction contact area in one embodiment of the present invention;
[0057] Figure 5 It is a partial structural schematic diagram of a first driving mechanism of a device for detecting a temperature field in a sliding friction contact area in one embodiment of the present invention;
[0058] Figure 6 It is a schematic structural diagram of a temperature measuring mechanism of a device for detecting a temperature field in a sliding friction contact area in one embodiment of the present invention.
[0059] In the figure:
[0060] 100 - optical breadboard, 110 - board body, 120 - first support platform, 121 - motor support plate, 122 - first support leg, 130 - second support platform, 131 - bearing box support plate, 132 - second support leg;
[0061] 200-first driving mechanism, 210-driving motor, 220-connecting assembly, 221-driving wheel, 222-driven wheel, 230-spindle, 240-bearing assembly, 241-bearing box, 2411-first bearing cover, 2412-second bearing cover, 2413-box, 242-bearing;
[0062] 300 - second driving mechanism, 310 - first driving member, 320 - second driving member, 330 - adjustment platform, 340 - reinforcement plate;
[0063] 400-test plate, 410-locking nut;
[0064] 500-lower sample mechanism, 510-sample ball, 520-force sensor, 530-spring shock absorber, 540-limiting member, 541-connecting plate, 542-supporting column, 543-limiting collar, 550-lower sample pressure rod, 560-lower sample pressure seat, 570-first connecting column, 580-second connecting column;
[0065] 600-temperature measuring mechanism, 610-third driving member, 611-first manual translation stage, 612-second manual translation stage, 620-adjusting lifting frame, 621-adapter plate, 622-column base, 623-column, 624-adjustment plate, 630-infrared thermal imager, 631-host, 632-macro lens. DETAILED DESCRIPTION
[0066] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0067] See attached Figure 1-6 An exemplary description is given of a temperature field detection device for a sliding friction contact area according to a first embodiment of the present application. The temperature field detection device for a sliding friction contact area includes an optical breadboard 100, a first driving mechanism 200, a second driving mechanism 300, a sample plate 400, a lower sample mechanism 500, and a temperature measurement mechanism 600.
[0068] The first driving mechanism 200 and the second driving mechanism 300 are respectively fixed on the optical breadboard 100; the sample plate 400 is connected to the first driving mechanism 200 to rotate under the drive of the first driving mechanism 200; the lower sample mechanism 500 is connected to the second driving mechanism 300, and the lower sample mechanism 500 has a sample ball 510, and the sample ball 510 contacts the sample plate 400 under the drive of the second driving mechanism 300; the temperature measuring mechanism 600 is fixed on the optical breadboard 100, and is used to detect the temperature of the contact area between the sample ball 510 and the upper sample mechanism; wherein the lower sample mechanism 500 also includes a force sensor 520 and a spring shock absorber 530: the force sensor 520 is connected to the sample ball 510, and is used to measure the pressure between the sample ball 510 and the sample plate 400; the spring shock absorber 530 is connected to the second driving mechanism 300, and the movable end of the spring shock absorber 530 is connected to the force sensor 520.
[0069] In the embodiment of the present application, the optical breadboard 100 provides a highly stable, horizontal surface to provide a stable support for the installation of mechanisms and components. Figure 1 and Figure 3-Figure 5, the optical breadboard 100 also includes a first support platform 120 and a second support platform 130. Specifically, the first support platform 120 includes a motor support plate 121 and a plurality of first support legs 122. The motor support plate 121 is fixed to the plate body 110 of the optical breadboard 100 through the plurality of first support legs 122, wherein the motor support plate 121 is provided with a first through hole; the second support platform 130 includes a bearing box support plate 131 and a plurality of second support legs 132. The motor support plate 121 is fixed to the plate body 110 of the optical breadboard 100 through the plurality of second support legs 132, wherein the bearing box support plate 131 is provided with a second through hole. For example, the first support leg 122 and the second support leg 132 are respectively set to four. The number of the first support leg 122 and the second support leg 132 can be set to other appropriate numbers, and those skilled in the art can set it according to actual conditions.
[0070] In the embodiment of the present application, the first driving mechanism 200 is fixed on the optical breadboard 100. Specifically, the first driving mechanism 200 includes a driving motor 210, a connecting assembly 220 and a spindle 230, wherein the driving motor 210 is fixedly connected to the optical breadboard 100, and the connecting assembly 220 has an input end connected to the rotating end of the driving motor 210; the spindle 230 is rotatably arranged on the optical breadboard 100, and the spindle 230 is connected to the output end of the connecting assembly 220; wherein the sample plate 400 is fixedly connected to the spindle 230.
[0071] For example, see Figure 1 and Figure 3-Figure 5 The driving motor 210 can be fixed on the motor support plate 121 of the first support platform 120, and the rotating shaft of the driving motor 210 extends through the first through hole toward the board body 110 of the optical breadboard 100. The top end of the spindle 230 is fixedly connected to the sample plate 400, and the bottom end of the spindle 230 extends through the second through hole on the bearing box support plate 131 toward the board body 110 of the optical breadboard 100. The bottom end of the spindle 230 can be connected to the main body of the optical breadboard 100, or it can be not connected to the main body of the optical breadboard 100. Those skilled in the art can set it according to the actual situation.
[0072] In the embodiment of the present application, the connecting assembly 220 includes a driving wheel 221, a driven wheel 222 and a belt, the driving wheel 221 is fixedly connected to the rotating shaft of the motor, the driven wheel 222 is fixedly connected to the main shaft 230, and the belt is connected between the driving wheel 221 and the driven wheel 222. In some other embodiments, the connecting assembly 220 may include a driving gear, a driven gear and a chain, and the chain is connected between the driving gear and the driven gear to realize the transmission of the driven gear by the rotation of the driving gear. Those skilled in the art may also select other suitable transmission methods according to actual conditions, and this application does not make specific restrictions.
[0073] In the embodiment of the present application, the sample plate 400 is connected to the first driving mechanism 200 so as to rotate under the driving of the first driving mechanism 200. Figure 1 The sample plate 400 is a circular plate-shaped structure, and for example, commonly used materials include sapphire, single crystal silicon, calcium fluoride, etc. For example, the sample plate 400 can be fixed to the top of the spindle 230 by a locking nut 410 and a locking bolt structure. This connection and fixing method is a common connection method and will not be described in detail.
[0074] In an embodiment of the present application, the first drive mechanism 200 also includes a bearing assembly 240, the bearing assembly 240 includes a bearing box 241 and at least one bearing 242, the bearing box 241 is arranged on the outside of the main shaft 230, the outer ring of the bearing 242 is fixedly connected to the bearing box 241, and the inner ring of the bearing 242 is fixedly connected to the main shaft 230.
[0075] For example, see Figure 4 The number of bearings 242 is set to two, and the two bearings 242 are fixedly sleeved on the outer sides of both ends of the main shaft 230. In some other embodiments, the number of bearings 242 can also be set to three, four or more, and those skilled in the art can set it according to actual conditions.
[0076] For example, the bearing box 241 includes a box body 2413, a first bearing cover 2411 and a second bearing cover 2412. The first bearing cover 2411 and the second bearing cover 2412 are respectively fixedly sleeved on the outer sides of the corresponding bearings 242. On the side away from the optical breadboard 100, the first bearing cover 2411 is connected to the box body 2413, and on the side close to the optical panel board, the second bearing cover 2412 is connected to the box body 2413. In the present application, the main shaft 230 is connected to the inner ring of the bearing 242 in the bearing assembly 240, and the main shaft 230 is supported by the bearing assembly 240, thereby enhancing the stability of the sample plate 400 during rotation.
[0077] In the embodiment of the present application, the second driving mechanism 300 is fixed on the optical breadboard 100. Figure 1 and Figure 2 The second driving mechanism 300 includes a first driving member 310 and a second driving member 320. The fixed end of the first driving member 310 is fixedly connected to the optical breadboard 100; the fixed end of the second driving member 320 is fixedly connected to the movable end of the first driving member 310. In the horizontal direction, the first driving member 310 drives the second driving member 320 to move toward the sample plate 400; wherein the movable end of the second driving member 320 is connected to the lower sample mechanism 500, and in the vertical direction, the second driving member 320 drives the lower sample mechanism 500 to move toward the sample plate 400.
[0078] Specifically, the first driving member 310 includes an adjusting platform 330, a first lead screw and nut transmission structure and a first adjusting motor, the adjusting platform 330 is fixed on the optical breadboard 100; the first lead screw and nut transmission structure is rotatably arranged on the adjusting platform 330; the first adjusting motor is connected to the lead screw in the first lead screw and nut transmission structure, and in the horizontal direction, the first adjusting motor is used to drive the nut in the first lead screw and nut transmission structure to move, so as to drive the second driving member 320 to move horizontally toward the direction of the sample plate 400; the second driving member 320 includes a second lead screw and nut transmission structure and a second adjusting motor, and the second lead screw and nut transmission structure is rotatably arranged on the first lead screw and nut transmission structure; the second adjusting motor is connected to the lead screw in the second lead screw and nut transmission structure, and in the vertical direction, the second adjusting motor is used to drive the nut in the second lead screw and nut transmission structure to move, so as to drive the lower sample mechanism 500 to move vertically toward the direction of the sample plate 400.
[0079] See also Figure 2 The first lead screw nut transmission structure and the second lead screw nut transmission structure respectively include a lead screw and a nut, the nut is sleeved on the outside of the lead screw and is threadedly connected to the lead screw, and the first adjustment motor and the second adjustment motor can respectively drive the corresponding lead screw to rotate, so as to drive the corresponding nut to move linearly in the corresponding direction. It should be noted that a limiting groove is provided on the adjustment platform 330, and a limiting groove is provided on the nut of the first lead screw nut transmission structure, and each limiting groove is used to limit the corresponding nut so that it can only move linearly in the adapted direction.
[0080] In the examples of this application, see Figure 2 A reinforcing plate 340 is also fixed between the first driving member 310 and the second driving member 320 to enhance the stability of the connection between the first driving member 310 and the second driving member 320 .
[0081] In some other embodiments, the first driving member 310 and the second driving member 320 may adopt linear motion mechanisms such as electric push rods or cylinders, and those skilled in the art may make a selection according to actual conditions.
[0082] In the embodiment of the present application, the lower sample mechanism 500 is connected to the second driving mechanism 300, and the lower sample mechanism 500 has a sample ball 510, and the sample ball 510 contacts the sample plate 400 under the drive of the second driving mechanism 300. For example, the sample ball 510 can be a steel ball, and those skilled in the art can also select a sample ball 510 of other suitable materials according to actual conditions.
[0083] Among them, the lower sample mechanism 500 also includes a force sensor 520 and a spring shock absorber 530. The force sensor 520 is connected to the sample ball 510 and is used to measure the pressure between the sample ball 510 and the sample plate 400. The spring shock absorber 530 is connected to the second driving mechanism 300, and the movable end of the spring shock absorber 530 is connected to the force sensor 520. The spring shock absorber 530 can be connected to the force sensor 520 through a first connecting column 570, and connected to the lower sample pressure rod 550 through a second connecting column 580.
[0084] For example, the force sensor 520 uses a three-axis force sensor, which is used to control the normal load. For example, when the sample ball 510 and the sample plate 400 are not in contact, the three-axis force sensor Z direction reading is zero, and the spring in the spring shock absorber 530 is not compressed additionally, so that the ball sample ball 510 continues to move and contacts the sample plate 400. During this process, the Z direction reading of the three-axis force sensor increases, and the spring in the spring shock absorber 530 is additionally compressed. After reaching the required loading load, the ball sample ball 510 continues to move and stops moving, thereby achieving the purpose of flexible loading. In addition, it is necessary to measure the friction force, that is, the tangential force, in the process of generating sliding friction between the sample ball 510 and the sample plate 400, so as to obtain the real-time evolution relationship between the friction force (friction coefficient) and the temperature field later.
[0085] In the examples of this application, see Figure 2 The lower sample mechanism 500 further includes a stopper 540, which includes a connecting plate 541, a stopper collar 543 and a plurality of support columns 542: the connecting plate 541 is fixedly connected to the movable end of the second driving mechanism 300, and the connecting plate 541 can be set to a T shape; a plurality of support columns 542 are fixed on the connecting plate 541; the stopper collar 543 is fixed on the plurality of support columns 542, and the stopper collar 543 has a first opening, and the force sensor 520 passes through the first opening, and the shape of the first opening matches the force sensor 520; wherein the fixed end of the spring shock absorber 530 is connected to the connecting plate 541. The inner side wall of the first opening is provided with a lubricating coating, and the lubricating coating can be a DLC lubricating coating, i.e., a diamond-like carbon coating (DLC), which is a coating material with high hardness, low friction coefficient and good lubrication performance. When sliding friction occurs between the sample ball 510 and the sample plate 400 , the present application provides a stopper 540 to prevent radial movement of the force sensor 520 , thereby improving stability during the detection process.
[0086] In the embodiment of the present application, the lower sample mechanism 500 also includes a lower sample pressing rod 550 and a lower sample pressing seat 560. The lower sample pressing rod 550 is connected to the force sensor 520. In the direction away from the force sensor 520, a card slot is opened at the end of the lower sample pressing rod 550, and the shape of the card slot matches the shape of the sample ball 510. The lower sample pressing seat 560 is sleeved on the outer periphery of the lower sample pressing rod 550 and the sample ball 510, and is connected to the lower sample pressing rod 550. The lower sample pressing seat 560 has a second opening, and the sample ball 510 partially extends outward from the second opening.
[0087] For example, the inner wall of the lower sample pressure rod 550 is provided with an internal thread, and the outer wall of the lower sample pressure rod 550 is provided with an external thread. When the sample ball 510 is placed in the slot, the lower sample pressure seat 560 is sleeved on the outer side of the lower sample pressure rod 550 and the sample ball 510, and the lower sample pressure rod 550 and the lower sample pressure seat 560 are threadedly connected by external threads and internal threads to achieve a fixed connection between the lower sample pressure seat 560 and the lower sample pressure rod 550, thereby fixing the sample ball 510 to the top of the lower sample pressure rod 550. At the same time, when the sample ball 510 needs to be replaced, the sample ball 510 can be conveniently disassembled.
[0088] In the embodiment of the present application, the temperature measuring mechanism 600 includes a third driving member 610, an adjusting lifting frame 620 and an infrared thermal imager 630. The fixed end of the third driving member 610 is connected to the optical breadboard 100; the fixed end of the adjusting lifting frame 620 is connected to the movable end of the third driving member 610, and the third driving member 610 drives the adjusting lifting frame 620 to move in the horizontal direction; the infrared thermal imager 630 is connected to the movable end of the adjusting lifting frame 620.
[0089] Specifically, see Figure 6 The adjusting lifting frame 620 includes an adapter plate 621, a column base 622, a column 623 and an adjusting plate 624. The adapter plate 621 is fixed on the third driving member 610, the column base 622 is fixed on the adapter plate 621, the column 623 is fixed on the column base 622, the adjusting plate 624 is sleeved on the outer side of the column 623, and the adjusting plate 624 is threadedly connected with an adjusting bolt. In the vertical direction, when the position of the adjusting plate 624 needs to be adjusted, the adjusting bolt is loosened, and after adjusting to a suitable position, the adjusting bolt is tightened again to adjust the position of the adjusting plate 624, thereby realizing the adjustment of the position of the infrared thermal imager 630.
[0090] Specifically, the infrared thermal imager 630 is used to detect the temperature of the contact area between the sample ball 510 and the upper sample mechanism. The infrared thermal imager 630 includes an infrared thermal imager host 631 and a macro lens 632. The structure of the infrared thermal imager 630 is a common existing structure and will not be described in detail in this application.
[0091] For example, the third driving member 610 includes a first manual translation member and a second manual translation member, the first manual translation member is fixed on the optical breadboard 100, and the second manual translation member is arranged on the first manual translation member. In the horizontal direction, the first manual translation member is used to drive the second manual translation member to move, and the second manual translation member is used to drive the adjustment lifting frame 620 to move, so as to move the infrared thermal imager 630 to a position close to the contact area between the sample ball 510 and the sample plate 400. The first manual translation member and the second manual translation member can respectively adopt a micrometer head driving structure, and the micrometer head includes a measuring seat, a measuring head, a locking nut 410 and a micrometer screw, etc., and its structure belongs to a common technical structure in this field, so it will not be described in detail. In some other embodiments, the first manual translation member and the second manual translation member can respectively adopt structures such as electric push rods, cylinders or ball screw structures, and those skilled in the art can choose according to actual conditions.
[0092] The workflow of this application is:
[0093] Before the test begins, the first driving member 310 is controlled according to the required rotation radius to move the sample ball 510 horizontally to the specified radius of the sample plate 400. According to the required loading load, the second driving member 320 is controlled to move the sample ball 510 vertically until it contacts the sample plate 400. At this time, the indication of the three-axis force sensor in the Z direction is zero, and the spring in the spring shock absorber 530 is not additionally compressed. At this time, the second driving member 320 continues to work, the sample ball 510 continues to move vertically, the indication of the three-axis force sensor in the Z direction increases, and the spring in the spring shock absorber 530 is additionally compressed. After reaching the required loading load, the second driving member 320 stops working, thereby achieving the purpose of flexible loading.
[0094] After the position of the sample ball 510 relative to the sample plate 400 and the loading load are determined, the temperature measuring mechanism 600 is adjusted. First, turn on the infrared thermal imager host 631 and observe the thermal image in the thermal image analysis software. Operate the first manual translation member and the second manual translation member to control the infrared thermal imager host 631 and the macro lens 632 to adjust the horizontal position. By continuously adjusting the position of the thermal imager host 631 and the macro lens 632 until the sample ball 510 is located near the center of the picture, and then by rotating the adjustment bolt clockwise and counterclockwise, the vertical height of the macro lens 632 mirror to the sample plate 400 is controlled, thereby achieving the purpose of manual focusing.
[0095] After the temperature measuring mechanism 600 is adjusted, the driving motor 210 is started to drive the driving wheel 221 to rotate, and the rotational motion is transmitted to the driven wheel 222 through the synchronous belt. At the same time, the rotational motion of the driven wheel 222 is transmitted to the sample plate 400 through the main shaft 230, thereby realizing the rotation of the sample plate 400.
[0096] After the sample plate 400 starts to rotate, the linear speed of the contact position between the sample plate 400 and the sample ball 510 can be adjusted by adjusting the rotation speed of the drive motor 210. At the same time, through the three-axis force sensor, the thermal imager host 631 and the macro lens 632, the measurement and recording of parameters including friction, applied load, and contact area temperature can be achieved.
[0097] The contact interface between the sample plate 400 and the ball sample generates friction due to the load and the movement of the sample plate 400. The thermal effect caused by the friction generates a certain amount of heat at the interface, and the accumulation of heat generates a corresponding friction temperature field at the interface contact. At this time, the infrared thermal imager 630 adjusted to the corresponding position can generate a stable, in-situ, full-time, high-frame-rate thermal image of the friction interface, and then obtain real-time full-field temperature data within the contact boundary range, providing data support for revealing the influence mechanism of thermal effect on sliding friction wear.
[0098] The embodiments of the present invention disclosed above are only used to help illustrate the present invention. The embodiments do not describe all the details in detail, nor do they limit the invention to the specific embodiments described. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.
Claims
1. A device for detecting the temperature field of a sliding friction contact area, characterized in that: include: Optical breadboard; The first driving mechanism and the second driving mechanism are respectively fixed on the optical breadboard; a sample plate connected to the first driving mechanism so as to rotate under the driving of the first driving mechanism; a lower sample mechanism connected to the second driving mechanism, wherein the lower sample mechanism has a sample ball, and the sample ball contacts the sample plate under the driving of the second driving mechanism; A temperature measuring mechanism, fixed on the optical breadboard, for detecting the temperature of the contact area between the sample ball and the upper sample mechanism; Wherein, the lower sample mechanism also includes: a force sensor connected to the sample ball and used to measure the pressure between the sample ball and the sample plate; A spring shock absorber is connected to the second driving mechanism, and a movable end of the spring shock absorber is connected to the force sensor.
2. The device for detecting the temperature field of the sliding friction contact area according to claim 1, characterized in that: The lower sample mechanism further includes a limiting member, and the limiting member includes: a connecting plate, fixedly connected to the movable end of the second driving mechanism; A plurality of support columns are fixed on the connecting plate; A limiting collar, fixed on the plurality of supporting columns, the limiting collar having a first opening, the force sensor passing through the first opening, and a shape of the first opening matching the force sensor; Wherein, the fixed end of the spring shock absorber is connected to the connecting plate.
3. The device for detecting the temperature field of the sliding friction contact area according to claim 2, characterized in that: The inner side wall of the opening is provided with a lubricating coating.
4. The device for detecting the temperature field of the sliding friction contact area according to claim 1, characterized in that: The lower sample mechanism also includes: A lower sample pressing rod is connected to the force sensor, and a slot is provided at the end of the lower sample pressing rod in a direction away from the force sensor, and the shape of the slot matches the shape of the sample ball; The lower sample pressing seat is sleeved on the outer circumference of the lower sample pressing rod and the sample ball and connected to the lower sample pressing rod. The lower sample pressing seat has a second opening, and the sample ball partially extends outward from the second opening.
5. The device for detecting the temperature field of the sliding friction contact area according to claim 1, characterized in that: The first driving mechanism comprises: A driving motor, fixedly connected to the optical breadboard; A connecting component, the input end of which is connected to the rotating end of the driving motor; A main shaft, rotatably connected to the optical breadboard, the main shaft being connected to an output end of the connecting assembly; Wherein, the sample plate is fixedly connected to the main shaft.
6. The device for detecting the temperature field of the sliding friction contact area according to claim 1, characterized in that: The connection component comprises: A driving wheel, fixedly connected to the rotating shaft of the motor; A driven wheel, fixedly connected to the main shaft; A belt is connected between the driving wheel and the driven wheel.
7. The device for detecting the temperature field of the sliding friction contact area according to claim 6, characterized in that: The first driving mechanism further comprises a bearing assembly, wherein the bearing assembly comprises: A bearing box is arranged on the outer side of the main shaft; At least one bearing, the outer ring of the bearing is fixedly connected to the bearing box, and the inner ring of the bearing is fixedly connected to the main shaft.
8. The device for detecting the temperature field of the sliding friction contact area according to claim 1, characterized in that: The second driving mechanism comprises: A first driving member, a fixed end of which is fixedly connected to the optical breadboard; A second driving member, a fixed end of which is fixedly connected to the movable end of the first driving member, and the first driving member drives the second driving member to move toward the sample plate in the horizontal direction; Wherein, the movable end of the second driving member is connected to the lower sample mechanism, and in the vertical direction, the second driving member drives the lower sample mechanism to move toward the sample plate.
9. The device for detecting the temperature field of the sliding friction contact area according to claim 1, characterized in that: The first driving member comprises: An adjustment platform, fixed on the optical breadboard; A first screw nut transmission structure, rotatably disposed on the adjustment platform; a first adjusting motor connected to the lead screw in the first lead screw and nut transmission structure, and used to drive the nut in the first lead screw and nut transmission structure to move horizontally in the horizontal direction, so as to drive the second driving member to move horizontally toward the sample plate; The second driving member comprises: a second screw nut transmission structure, rotatably disposed on the first screw nut transmission structure; The second adjusting motor is connected to the screw in the second screw-nut transmission structure. In the vertical direction, the second adjusting motor is used to drive the nut in the second screw-nut transmission structure to move, so as to drive the lower sample mechanism to move vertically toward the sample plate.
10. The device for detecting the temperature field of the sliding friction contact area according to claim 1, characterized in that: The temperature measuring mechanism comprises: a third driving member, a fixed end of which is connected to the optical breadboard; An adjusting lifting frame, wherein a fixed end of the adjusting lifting frame is connected to a movable end of the third driving member, and the third driving member drives the adjusting lifting frame to move in a horizontal direction; The infrared thermal imager is connected to the movable end of the adjustable lifting frame.