Optical detection device and sample analyzer

Abstract

The invention discloses an optical detection device and a sample analyzer. The optical detection device comprises an illumination assembly, a dark field optical assembly, an objective table, an objective lens and an imaging receiving assembly. Wherein the illumination assembly comprises an illumination light source, a collimation piece and a light condensation piece, the dark field optical assembly comprises a dark field ring and a dark field auxiliary piece, the dark field ring is arranged between the collimation piece and the light condensation piece, the dark field ring is used for shielding an illumination light beam in a preset range, and the dark field auxiliary piece is arranged on a light emitting path of the light condensation piece and used for increasing the deflection degree of the illumination light beam; the objective table is used for bearing a to-be-detected sample, and the objective table is located on a light emitting path of the dark field auxiliary part; the objective lens is positioned on one side, deviating from the dark field auxiliary part, of the objective table and is at least used for imaging a to-be-tested sample in a dark field to form a dark field imaging light beam; and the imaging receiving assembly is used for receiving the dark field imaging light beam. According to the optical detection device, dark field imaging of an objective lens with a large numerical aperture can be realized, and the definition of optical imaging is improved.

Description

Technical Field

[0001] The present application relates to the technical field of medical equipment, and in particular to an optical detection device and a control method thereof, and a sample analyzer. Background Art

[0002] Blood component testing mainly includes red blood cell testing, white blood cell testing and platelet testing. Blood component testing is an important clinical medical indicator. Optical testing is a common method for testing blood components. Different optical testing devices are generally used for different testing items.

[0003] In the related art, the optical detection device of the sample analyzer has a high cost and the imaging is not clear enough, which affects the accuracy of sample detection. Summary of the invention

[0004] The present application provides an optical detection device and a control method thereof, and a sample analyzer to solve the technical problems in the related art that the optical detection device has a high cost and the imaging is not clear enough, which affects the accuracy of sample detection.

[0005] In order to solve the above technical problems, a technical solution adopted by the present application is: to provide an optical detection device, which includes: an illumination component, a dark field optical component, a stage, an objective lens and an imaging receiving component, wherein the illumination component includes an illumination light source, a collimator and a condenser, wherein the illumination light source is used to emit an illumination light beam, the collimator is located on the light output path of the illumination light source, and is used to collimate the illumination light beam, and the condenser is located on the light output path of the collimator, and is used to focus the illumination light beam; the dark field optical component includes a dark field The dark field ring is arranged between the collimating part and the focusing part, the dark field ring is used to block the illumination light beam within a preset range, the dark field auxiliary part is arranged on the light output path of the focusing part, and is used to increase the degree of deflection of the illumination light beam; the stage is used to carry the sample to be detected, and the stage is located on the light output path of the dark field auxiliary part; the objective lens is located on the side of the stage away from the dark field auxiliary part, and is at least used to image the sample to be detected under the dark field to form a dark field imaging light beam; the imaging receiving component is located on the light output path of the objective lens, and is used to receive the dark field imaging light beam.

[0006] Furthermore, the dark field auxiliary component includes a condenser lens, the focal length of the condenser lens is less than or equal to the focal length of the condenser, and the condenser lens is used to further focus the illumination light beam emitted by the condenser to increase the deflection angle of the illumination light beam.

[0007] Furthermore, the dark field auxiliary component includes: a dark field condenser, which is a hollow structure, a reflective layer is provided on the inner wall of the dark field condenser, and the inclination angle of the side of the truncated cone is greater than the cone angle of the illumination light beam emitted by the condenser.

[0008] Furthermore, the dark field condenser is in the shape of a hollow frustum.

[0009] Further, the dark field aid is configured to focus the illumination beam onto the sample to be inspected.

[0010] Furthermore, the dark field optical component can be movably arranged so that the dark field optical component has a first state and a second state. In the first state, the dark field ring is arranged between the collimating component and the focusing component, and the dark field auxiliary component is arranged on the light output path of the focusing component; in the second state, the dark field optical component is arranged away from the lighting component.

[0011] Furthermore, the lighting assembly is movably disposed on one side of the stage in the vertical direction so that the lighting assembly has a bright field state and a dark field state. In the bright field state, the dark field optical assembly is in the second state, and the focusing element is used to focus the collimated illumination light beam on the pupil of the objective lens; in the dark field state, the dark field optical assembly is in the first state, and the dark field auxiliary element is used to focus the illumination light beam on the sample to be detected.

[0012] Furthermore, a first aperture stop is provided between the illumination light source and the collimating element, and / or a second aperture stop is provided between the focusing element and the dark field auxiliary element.

[0013] Furthermore, the first aperture stop and the second aperture stop have the same size.

[0014] In order to solve the above technical problems, a technical solution adopted in the present application is: to provide a sample analyzer, which includes: a sample preparation device and an optical detection device of any of the above embodiments, the sample preparation device is used to prepare the sample to obtain a sample to be detected; the optical detection device is used to perform optical detection on the sample to be detected.

[0015] Beneficial effects of the present application: Different from the prior art, the optical detection device provided by the present application includes: an illumination component, a dark field optical component, a stage, an objective lens and an imaging receiving component. The illumination component and the dark field optical component constitute a dark field illumination system. The objective lens can image the sample to be detected in a dark field environment to form a dark field imaging beam. The imaging receiving component is used to receive the dark field imaging beam to obtain an image of the sample to be detected. The present application adopts a finite distance microscope system for imaging, which has a simple structure and low cost; and the dark field optical component includes a dark field ring and a dark field auxiliary component, which can not only provide a dark field environment for the sample to be tested, but also increase the numerical aperture of the dark field illumination system. This optimized dark field can realize dark field imaging of an objective lens with a larger numerical aperture, improve the clarity of optical imaging, and thus improve the accuracy of sample detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work, among which:

[0017] Figure 1 is a structural schematic diagram of an embodiment of an optical detection device provided by the present application;

[0018] Figure 2 yes Figure 1 A schematic structural diagram of an embodiment of a first aperture stop in an optical detection device shown;

[0019] Figure 3 yes Figure 1 A schematic structural diagram of an embodiment of a dark field ring in an optical detection device shown;

[0020] Figure 4 yes Figure 1 A schematic structural diagram of an embodiment of a dark field auxiliary component in an optical detection device shown;

[0021] Figure 5 yes Figure 1 A schematic structural diagram of another embodiment of a dark field auxiliary component in an optical detection device shown;

[0022] Figure 6 is a structural schematic diagram of another embodiment of the optical detection device provided by the present application;

[0023] Figure 7 It is a structural schematic diagram of an embodiment of a sample analyzer provided by the present application. DETAILED DESCRIPTION

[0024] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. It is to be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some structures related to the present application are shown in the accompanying drawings, rather than all structures. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0025] The terms "first", "second", etc. in this application are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0026] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0027] The present application provides an optical detection device, which can detect samples to be detected in a dark field environment and can also detect samples to be detected in a bright field environment, thereby expanding the detection range of the optical detection device. In the optical detection device of the present application, the numerical aperture of the dark field illumination system is relatively large, and this optimized dark field can realize dark field imaging of an objective lens with a relatively large numerical aperture, thereby improving the clarity of optical imaging and thus improving the accuracy of sample detection.

[0028] See also Figure 1 As shown, Figure 1 1 is a schematic diagram of the structure of an embodiment of the optical detection device provided by the present application. Specifically, the optical detection device 10 includes: an illumination component 11, a dark field optical component 12, a stage 13, an objective lens 14 and an imaging receiving component 15. The illumination component 11 and the dark field optical component 12 constitute a dark field illumination system to provide a dark field environment for imaging of the sample to be detected.

[0029] The stage 13 is used to carry the sample to be tested (not shown in the figure), and the sample to be tested can be a blood sample, a sweat sample, or a saliva sample that has been specifically treated. In a specific embodiment, when optically testing a blood sample, the blood sample is first subjected to a specific treatment, for example, the blood sample is mixed with a chemical dye in a certain proportion and stained for 2 minutes, and then 10ul of the mixed solution is sucked with a pipette and dropped on a blood cell counting plate to make the droplets spread evenly. After the diffusion is completed, the sample slide is placed on the stage 13 to be imaged by the optical detection device 10. In other embodiments, the sample can also be subjected to other treatments according to the requirements of the test items to obtain the sample to be tested, such as diluting with a diluent, etc., which are not listed here one by one.

[0030] like Figure 1 As shown, the lighting assembly 11 includes: an illumination light source 111, a collimating member 112, and a focusing member 113, which are arranged in sequence. Optionally, the lighting assembly 11 may further include a first aperture stop 114 and a second aperture stop 115.

[0031] The illumination light source 111 is used to emit an illumination light beam, and the illumination light source 111 may be a white light emitting diode. The white light emitting diode may be an illumination light source with a larger divergence angle. In other embodiments, the illumination light source 111 may also be a yellow light emitting diode, a red light emitting diode, or a green light emitting diode.

[0032] The collimator 112 is located on the light path of the illumination light source 111. The illumination light beam emitted by the illumination light source 111 becomes parallel light after passing through the collimator, that is, the collimator 112 is used to collimate the illumination light beam. The collimator 112 can be a single collimator lens or a collimator lens group.

[0033] The condenser 113 is located on the light-emitting path of the collimator 112, and is used to focus the collimated illumination light beam. The condenser 113 may be a single condenser lens or a condenser lens group.

[0034] Alternatively, if Figure 1 As shown, the lighting assembly 11 may further include: a first aperture stop 114 and a second aperture stop 115. The first aperture stop 114 is located between the lighting source 111 and the collimating member 112, and the second aperture stop 115 is located on the light path of the light condensing member 113. Figure 2 As shown, the first aperture diaphragm 114 is formed with an empty hole 1141 of a specific size, and the empty hole 1141 is used to allow the illumination light beam to pass through. The first aperture diaphragm 114 and the second aperture diaphragm 115 are used to reduce the divergence angle of the light beam and block stray light. The first aperture diaphragm 114 and the second aperture diaphragm 115 can be aperture diaphragms of the same specification. Compared with using a single aperture diaphragm, the advantage of using a double aperture diaphragm is that the diffraction ring caused by the single aperture diaphragm can be eliminated. The light transmission diameter of the first aperture diaphragm 114 and the second aperture diaphragm 115 can be 1.5 mm, 2 mm or 3 mm. It can be understood that in other embodiments, the lighting assembly 11 can only include the above-mentioned first aperture diaphragm 114 or the above-mentioned second aperture diaphragm 115, which can be selected and set according to needs.

[0035] like Figure 1 As shown, the dark field optical assembly 12 includes a dark field ring 121 and a dark field auxiliary member 122, and the dark field ring 121 is arranged between the collimating member 112 and the focusing member 113. Figure 3 As shown, Figure 3 yes Figure 1Schematic structural diagram of an embodiment of a dark field ring in the optical detection device shown. The dark field ring 121 is used to block the illumination beam within a preset range. In the dark field optical path, the illumination beam emitted by the illumination light source 111 is collimated by the collimator 112, then passes through the dark field ring 121, and then is focused by the condenser 113 and irradiated on the sample to be detected, providing a dark field environment for the dark field imaging of the sample to be detected. The scattered light cannot enter the field of view of the objective lens 14. The scattered light of the illuminated sample to be detected is received and imaged by the objective lens 14 to form a dark field imaging beam. The imaging receiving component 15 receives the dark field imaging beam to observe the sample to be detected.

[0036] In this application, by arranging the dark field ring 121 between the collimator 112 and the condenser 113, dark field imaging with the numerical aperture NA of the objective lens 14 satisfying 0 < NA ≤ 0.3 can be achieved.

[0037] To match the dark field imaging of the objective lens 14 with a large numerical aperture, as Figure 1 shown, in this application, a dark field auxiliary member 122 is arranged on the light output optical path of the condenser 113. The dark field auxiliary member 122 is used to increase the deflection degree of the illumination beam emitted by the condenser 113, thereby increasing the numerical aperture of the dark field illumination system.

[0038] Optionally, as Figure 4 shown, Figure 4 is Figure 1 Schematic structural diagram of an embodiment of the dark field auxiliary member in the optical detection device shown. The dark field auxiliary member 122 may include a condenser lens. The condenser lens is arranged on the light output optical path of the condenser 113, and the focal length of the condenser lens is less than or equal to the focal length of the condenser 113. The condenser lens is used to increase the deflection degree of the illumination beam emitted by the condenser 113, thereby increasing the numerical aperture of the dark field illumination system. For example, a condenser lens with a numerical aperture of 0.5 is added behind the condenser 113 to increase the deflection degree of the dark field outgoing light, so that the numerical aperture of the dark field illumination system can reach 0.5. By the above method, the numerical aperture of the dark field illumination system can be increased. Therefore, it can match the dark field imaging of the objective lens 14 with a larger numerical aperture and improve the imaging clarity.

[0039] Optionally, as Figure 5 shown, the dark field auxiliary member 122 may include a dark field condenser lens with a hollow (hollow) structure, and a reflective layer is arranged on the inner wall of the dark field condenser lens. The inclination angle α of the inner wall of the dark field condenser lens is greater than the cone angle of the illumination beam condensed by the condenser 113. Specifically, the size of the inner diameter of the dark field condenser lens gradually decreases in the direction close to the stage 13. The inclination angle of the inner wall of the dark field condenser lens refers to the angle between the inner wall of the dark field condenser lens and the central axis of the dark field condenser lens, as Figure 5The indicated angle α therein. The cone angle of the illumination light beam after being concentrated by the concentrator 113 refers to the included angle between the illumination light beam after being concentrated by the concentrator 112 and the central axis of the illumination light beam.

[0040] Further, the dark-field auxiliary member 122 can be in the shape of a hollow frustum of a cone, and the cone angle (tilt angle) of the inner side wall of the frustum is greater than the cone angle of the light beam after being concentrated by the concentrator 113. Among them, the greater the tilt angle of the dark-field condenser, the stronger the light-shielding ability, and the larger the numerical aperture of the entire dark-field illumination system. For example, when the cone angle of the frustum reaches 80 degrees, the numerical aperture of the dark-field illumination system can reach 0.8, and the range of the numerical aperture NA of the objective lens 14 that can be matched is: 0 < NA ≤ 0.75. The cone angle of the side surface of the frustum of the dark-field condenser can be selected according to the dark-field imaging requirements, and the optional range of the cone angle is: 45 degrees - 80 degrees.

[0041] Further, the dark-field auxiliary member 122 is configured to focus the light beam emitted from the focusing member 13 on the sample to be detected. That is, the sample slide on the stage 13 is located on the focusing surface of the dark-field auxiliary member 122, and the position of the focusing surface is the object surface of the objective lens 14, providing a dark-field environment for the imaging of the sample to be detected.

[0042] In the above-mentioned embodiments, the illumination light source 111, the first aperture diaphragm 114, the collimator 112, the dark-field ring 121, the concentrator 113, the second aperture diaphragm 114, and the dark-field auxiliary member 122 can be coaxially arranged to improve the utilization rate of light.

[0043] In the dark-field illumination system of the above-mentioned embodiments, the illumination light beam emitted by the illumination light source 111 is collimated by the collimator 112, then passes through the dark-field ring 121, the illumination light beam is focused by the concentrator 113, and then further focused by the dark-field auxiliary device 122 and irradiated on the sample to be detected, providing a dark-field environment for the imaging of the sample to be detected. The dark-field ring 121 has an appropriate light-shielding area, and in cooperation with the concentrator 113 and the dark-field auxiliary member 122, the illumination light beam cannot enter the field of view of the objective lens 14, and only the light emitted by the illuminated sample to be detected on the sample slide can enter the field of view of the objective lens 14 to achieve dark-field imaging. By adding the dark-field auxiliary member 122 to the dark-field illumination system in the present application, the numerical aperture of the dark-field illumination system can be increased, and such an optimized dark-field can achieve dark-field imaging of the objective lens 14 with a large numerical aperture, providing conditions for clear imaging and accurate detection of the sample to be detected.

[0044] The stage 13 is located on the light-emitting path of the dark-field auxiliary member 122. Specifically, the illumination light beam emitted by the dark-field illumination system is emitted to the sample to be detected on the stage 13, and the sample to be detected can transmit the illumination light beam.

[0045] The objective lens 14 is located on the side of the stage 13 away from the lighting assembly 11, and is used to image the sample to be tested in the dark field to form a dark field imaging beam. That is, the objective lens 14 is used to magnify and image the sample to be tested, and the objective lens 14 of the present application is a finite distance objective lens.

[0046] like Figure 1 As shown, the imaging receiving component 15 is located on the light-emitting optical path of the objective lens 14, and is used to receive the dark field imaging light beam. That is, the imaging receiving component 15 is used to receive the image of the sample to be detected formed by the objective lens 14. The imaging receiving component 15 can be a camera module, for example, the imaging receiving component 15 can include a CMOS (Complementary Metal Oxide Semiconductor) camera module, a CMOS camera, or a CCD (charge-coupled device) camera.

[0047] In the optical detection device 10 , the scattered light of the sample to be detected that is illuminated is imaged by the objective lens 14 and is received by the imaging receiving component 15 to observe the sample to be detected.

[0048] In the above embodiment, the lighting component 11 and the dark field optical component 12 can form a dark field lighting system, and the lighting beam emitted by the dark field lighting system is emitted to the sample to be detected. Under the dark field, the objective lens 14 images the sample to be detected to form a dark field imaging beam to obtain an image of the sample to be detected, and a dark field detection and analysis is performed on the sample to be detected based on the imaging. The numerical aperture of the dark field lighting system is large, and it can match the dark field imaging of the objective lens 14 with a larger numerical aperture, which provides conditions for clear imaging and accurate observation of the sample to be detected. For example, the dark field environment provided by the optical detection device can clearly image platelets, providing conditions for their accurate counting.

[0049] In other embodiments, the dark field optical component 12 is movable so that the optical detection device 10 can switch between a bright field and a dark field detection system. By controlling the movement of the dark field optical component 12, the dark field optical component 12 has a first state and a second state.

[0050] Specifically, in the first state of the dark field optical component 12, the dark field ring 121 is arranged between the collimating component 112 and the focusing component 113, and the dark field auxiliary component 122 is arranged on the light path of the focusing component 113. That is, in the first state, the dark field optical component 12 and the lighting component 11 form a dark field lighting system, and the optical detection device 10 is a dark field detection system. For the structure of the dark field detection system, please refer to Figure 1 And the corresponding text description will not be repeated here.

[0051] When the dark field optical component 12 is in the second state, the dark field optical component 12 is away from the illumination component 11 , so that the optical detection device 10 is switched to a bright field detection system.

[0052] like Figure 6 As shown, Figure 6 The present application provides a schematic structural diagram of another embodiment of an optical detection device. In this embodiment, the dark field optical component 12 is arranged away from the lighting component 11, and the optical detection device 10 is switched to a bright field detection system.

[0053] The lighting assembly 11 is movably arranged in the vertical direction so that the lighting assembly 11 has a bright field state and a dark field state. In the bright field state, the dark field optical assembly 12 is in the second state, that is, the dark field optical assembly 12 is arranged away from the lighting assembly 11, and the lighting assembly 11 moves up and down so that the focusing member 123 is configured to focus the collimated illumination beam on the pupil of the objective lens 14. After the objective lens 14 processes the light, the image plane brightness is uniform, thereby improving the imaging effect and the accuracy of optical detection.

[0054] The structure of the lighting assembly 11 can be found in the description of the above embodiment and will not be described in detail here.

[0055] Specifically, the illumination light source 111 emits an illumination beam, which is collimated by the collimator 112, and then focused by the condenser 113. The sample slide is placed at an appropriate position behind the condenser 113 as an illumination surface to provide a background light source for imaging the sample to be detected. The sample in the sample slide receives the image through the objective lens 14 to form a bright field imaging beam, which is received by the imaging receiving component 15, and the sample to be detected is analyzed and detected based on the imaging. For example, the white blood cells after chemical staining and the red blood cells after spheroidization and dilution can be observed through the bright field detection system.

[0056] In this embodiment, the lighting assembly 11 can move up and down, and the dark field optical assembly 12 can also be movably arranged. In the bright field state, the dark field optical assembly 12 is in the second state, that is, the dark field optical assembly 12 is away from the lighting assembly 11, and the lighting assembly 11 moves up and down so that the focusing element 113 focuses the collimated illumination light beam on the pupil of the objective lens 14. In this embodiment, the lighting assembly 11, the stage 13, the objective lens 14 and the imaging receiving assembly 15 constitute a bright field detection system.

[0057] In the dark field state, the dark field optical component 12 is in the first state, that is, the dark field ring 121 is arranged between the collimator 112 and the condenser 113, and the dark field auxiliary component 122 is arranged on the light path of the condenser 113. The lighting component 11 moves up and down so that the dark field auxiliary component 122 is configured to focus the illumination beam on the sample to be detected. In this embodiment, the lighting component 11, the dark field optical component 12, the stage 13, the objective lens 14 and the imaging receiving component 15 constitute a dark field detection system.

[0058] The structures of the stage 13, the objective lens 14 and the imaging receiving assembly 15 of this embodiment are Figure 1 The embodiments shown are the same and will not be described again.

[0059] The optical detection device 10 of the above embodiment can integrate the bright / dark field detection system, and can perform bright / dark field detection on the sample to be detected, so that the optical detection device 10 can perform multiple project detections, thereby improving the scope of application of the optical detection device 10. The bright / dark field detection system can share components such as the objective lens 14 and the imaging receiving component 15, thereby simplifying the structure of the optical detection device 10 and saving the cost of the optical detection device 10. Moreover, the present application adopts a finite distance system for imaging, and the imaging effect is clear, which can improve the accuracy of the detection of the sample to be detected.

[0060] The present application also provides a sample analyzer, such as Figure 7 As shown, Figure 7 It is a structural schematic diagram of an embodiment of a sample analyzer provided in the present application. Specifically, the sample analyzer 70 includes: a sample preparation device 71 and an optical detection device 72. The sample preparation device 71 is used to prepare the sample to obtain a sample to be detected, and the optical detection device 72 is used to perform optical detection on the sample to be detected.

[0061] The optical detection device 72 of this embodiment may be the optical detection device 10 of any of the above embodiments. For the structure of the optical detection device 72 , please refer to the introduction of any of the above embodiments, which will not be described again.

[0062] The sample analyzer 70 in the present application may be a blood analyzer or a body fluid analyzer, etc. The test sample of the sample analyzer 70 may be blood, such as animal blood or human blood, etc., and the test sample may also be body fluids such as saliva, sweat or urine. The sample analyzer 70 of the present application can perform optical detection on the sample, and the reliability of the detection result is high.

[0063] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. An optical detection device, characterized in that: The optical detection device comprises: An illumination assembly, comprising an illumination light source, a collimator and a condenser, wherein the illumination light source is used to emit an illumination light beam, the collimator is located on the light-emitting light path of the illumination light source and is used to collimate the illumination light beam, and the condenser is located on the light-emitting light path of the collimator and is used to focus the illumination light beam; A dark field optical component, comprising a dark field ring and a dark field auxiliary component, wherein the dark field ring is arranged between the collimating component and the focusing component, the dark field ring is used to shield the illumination light beam within a preset range, and the dark field auxiliary component is arranged on the light output path of the focusing component, and is used to increase the degree of deflection of the illumination light beam; A stage for carrying a sample to be tested, the stage being located on the light-emitting path of the dark field auxiliary component; An objective lens, located on a side of the stage away from the dark field auxiliary component, and at least used to image the sample to be tested under the dark field to form a dark field imaging beam; The imaging receiving component is located on the light output path of the objective lens and is used to receive the dark field imaging light beam.

2. The optical detection device according to claim 1, characterized in that: The dark field auxiliary component includes a condenser lens, the focal length of the condenser lens is less than or equal to the focal length of the condenser, and the condenser lens is used to further focus the illumination light beam emitted by the condenser to increase the deflection angle of the illumination light beam.

3. The optical detection device according to claim 1, characterized in that: The dark field auxiliary component includes: a dark field condenser, which is a hollow structure, a reflective layer is provided on the inner wall of the dark field condenser, and the inclination angle of the inner wall of the dark field condenser is greater than the cone angle of the illumination light beam emitted by the condenser.

4. The optical detection device according to claim 3, characterized in that: The dark field condenser is in the shape of a hollow frustum.

5. The optical detection device according to any one of claims 1 to 4, characterized in that: The dark field aid is configured to focus the illumination beam onto the sample to be inspected.

6. The optical detection device according to claim 1, characterized in that: The dark field optical component is movably arranged so that the dark field optical component has a first state and a second state, In the first state, the dark field ring is arranged between the collimating element and the focusing element, and the dark field auxiliary element is arranged on the light output path of the focusing element; In the second state, the dark field optical component is disposed away from the illumination component.

7. The optical detection device according to claim 6, characterized in that: The lighting assembly is movably disposed on one side of the stage in a vertical direction so that the lighting assembly has a bright field state and a dark field state. In the bright field state, the dark field optical assembly is in the second state, and the condenser is used to focus the collimated illumination light beam on the pupil of the objective lens; In the dark field state, the dark field optical component is in the first state, and the dark field auxiliary component is used to focus the illumination light beam on the sample to be detected.

8. The optical detection device according to claim 1, characterized in that: A first aperture stop is further arranged between the illumination light source and the collimating element, and / or, A second aperture stop is arranged between the light focusing element and the dark field auxiliary element.

9. The optical detection device according to claim 8, characterized in that: The first aperture stop and the second aperture stop have the same size.

10. A sample analyzer, characterized in that: The sample analyzer comprises: A sample preparation device, used for preparing samples to obtain samples to be tested; The optical detection device according to any one of claims 1 to 9 is used to perform optical detection on the sample to be detected.

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