Production line retesting method and system of heating non-combustion appliance, upper computer and appliance

Abstract

The invention relates to the technical field of testing of heat-not-burn appliances, and provides a production line retesting method and system for a heat-not-burn appliance, an upper computer and the heat-not-burn appliance. According to the technical scheme, an upper computer is connected with the heat-not-burn appliance, after an aging test of the heat-not-burn appliance is completed, a parameter test instruction is sent to the heat-not-burn appliance through the upper computer, and the heat-not-burn appliance returns appliance parameters to the upper computer after receiving the parameter test instruction; and the upper computer detects whether each appliance parameter meets a preset condition or not, and if all the appliance parameters meet the preset condition, it is determined that the heating non-combustion appliance passes through the production line to be retested. In the above process, after the aging test of the heat-not-burn appliance is completed, whether each appliance parameter of the heat-not-burn appliance is normal or not is detected again, so that the problems of devices such as a heating element caused by the aging test before the appliance leaves a factory can be found, and defective products in the appliances leaving the factory are reduced.

Description

Technical Field

[0001] The present application relates to the technical field of testing heat-not-burn appliances, and in particular to a production line retest method, system, host computer and heat-not-burn appliance for heat-not-burn appliances. Background Art

[0002] When heating-not-burning appliances are mass-produced, various testing operations need to be completed on the production line, which may include parameter testing, functional testing, and aging testing. After the appliance completes the aging test, the appliance is packaged and shipped out. However, due to the poor quality of the heating element of some appliances, the heating element may have different degrees of glass glaze breakage or silver paste coating shedding after multiple aging, which will result in defective appliances leaving the factory. Summary of the invention

[0003] In view of this, the embodiments of the present application provide a production line retest method, system, host computer and heating without burning appliance for heating without burning appliances, which can reduce the number of defective products in the appliances shipped out of the factory.

[0004] A first aspect of an embodiment of the present application provides a production line retest method for a heating-without-combustion appliance, the method being applied to a host computer connected to the heating-without-combustion appliance, comprising:

[0005] After the heating without burning appliance completes the aging test, a parameter test instruction is sent to the heating without burning appliance to instruct the heating without burning appliance to return various appliance parameters to the host computer;

[0006] If all appliance parameters meet the preset conditions, it is determined that the heating without burning appliance has passed the production line retest.

[0007] In the technical solution of the embodiment of the present application, a host computer is connected to the heating-not-burning appliance. After the heating-not-burning appliance completes the aging test, the host computer is used to send a parameter test instruction to the heating-not-burning appliance. After receiving the parameter test instruction, the heating-not-burning appliance returns each appliance parameter to the host computer; the host computer detects whether each appliance parameter meets the preset conditions respectively, and if all appliance parameters meet the preset conditions, it is determined that the heating-not-burning appliance has passed the production line retest. After the heating-not-burning appliance completes the aging test, the above process will re-detect whether each appliance parameter of the heating-not-burning appliance is normal, so that the problems of the heating element and other components caused by the aging test can be found before the appliance leaves the factory, and the defective products in the appliances leaving the factory can be reduced.

[0008] In one implementation of the embodiment of the present application, each appliance parameter includes a current resistance value and an initial resistance value of a heating element of the heating-not-burning appliance; the method further includes:

[0009] If the difference between the current resistance value of the heating element and the initial resistance value of the heating element is less than the preset resistance value, it is determined that the current resistance value of the heating element and the initial resistance value of the heating element meet the preset condition.

[0010] In one implementation of the embodiment of the present application, the various appliance parameters include a circuit board temperature and a battery cell temperature of the heating-not-burning appliance; the method further includes:

[0011] If the circuit board temperature and the battery cell temperature are both within the preset room temperature range, it is determined that the circuit board temperature and the battery cell temperature meet the preset conditions.

[0012] In one implementation of the embodiment of the present application, each appliance parameter includes the aging number of the heat-not-burn appliance; the method further includes:

[0013] If the aging times exceed the preset times, it is determined that the aging times meet the preset conditions.

[0014] In one implementation of the embodiment of the present application, the method further includes:

[0015] If at least one of the appliance parameters does not meet the preset conditions, it is determined that the heating without burning appliance has failed the production line retest, and the error cause and troubleshooting prompt information corresponding to the at least one appliance parameter are output.

[0016] In one implementation of the embodiment of the present application, the number of instruments that passed the retest and the number of instruments that failed the retest are displayed in a display interface of the host computer; the method further includes:

[0017] If it is determined that the heating-not-burning appliance has passed the production line retest, the number of appliances that have passed the retest displayed in the control display interface will increase by one;

[0018] If it is determined that the heating without burning appliance has not passed the production line retest, the number of appliances that have not passed the retest displayed in the control display interface will increase by one.

[0019] A second aspect of an embodiment of the present application provides a production line retest method for a heating-without-combustion appliance, the method being applied to a heating-without-combustion appliance connected to a host computer, comprising:

[0020] After completing the aging test, receive the parameter test instruction sent by the host computer;

[0021] The parameters of each appliance are returned to the host computer to indicate that the host computer determines that the heating without burning appliance has passed the production line retest after detecting that the parameters of each appliance meet the preset conditions.

[0022] A third aspect of an embodiment of the present application provides a host computer, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the production line retest method for heating non-combustion appliances provided in the first aspect of the embodiment of the present application is implemented.

[0023] A fourth aspect of an embodiment of the present application provides a heating-not-burning appliance, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, a production line retest method for heating-not-burning appliances as provided in the second aspect of an embodiment of the present application is implemented.

[0024] A fifth aspect of the embodiments of the present application provides a production line retest system for heating non-combustion appliances, the system comprising a host computer as provided in the third aspect of the embodiments of the present application and a heating non-combustion appliance as provided in the fourth aspect of the embodiments of the present application.

[0025] It can be understood that the beneficial effects of the second to fifth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a schematic diagram of a production line retest system for heating-not-burning appliances provided in an embodiment of the present application;

[0027] Figure 2 It is a structural schematic diagram of a heating without burning device provided in an embodiment of the present application;

[0028] Figure 3 It is a flow chart of a production line retest method of a heating-not-burning appliance provided in an embodiment of the present application;

[0029] Figure 4 This is a schematic diagram of an initial interface of an application software of a host computer provided in an embodiment of the present application;

[0030] Figure 5 This is a schematic diagram of a connection interface of an application software of a host computer provided in an embodiment of the present application;

[0031] Figure 6 This is a schematic diagram of a retest pass result interface of an application software of a host computer provided in an embodiment of the present application;

[0032] Figure 7 This is a schematic diagram of a retest failure result interface of an application software of a host computer provided in an embodiment of the present application;

[0033] Figure 8It is a schematic diagram of the operation flow of the production line retest method of the heating-not-burning appliance provided in an embodiment of the present application in an actual application scenario;

[0034] Fig. 9 It is a schematic diagram of a host computer / heating without burning appliance provided in an embodiment of the present application. DETAILED DESCRIPTION

[0035] In the following description, for the purpose of illustration rather than limitation, specific details such as specific system structures, technologies, etc. are proposed, so as to thoroughly understand the embodiments of the present application. However, it should be clear to those skilled in the art that the present application can also be implemented in other embodiments without these specific details. In other cases, the detailed description of well-known systems, devices, circuits and methods is omitted to prevent unnecessary details from hindering the description of the present application. In addition, in the description of the present application specification and the attached claims, the terms "first", "second", "third" etc. are only used to distinguish the description, and cannot be interpreted as indicating or suggesting relative importance.

[0036] Existing heat-not-burn appliances need to complete various production line test operations on the production line during mass production, and the appliances are packaged and shipped after passing the production line test operations. However, the last step of the production line test operation is generally an aging test, and the heating element of the appliance may have different degrees of glass glaze breakage or silver paste coating shedding after multiple aging, resulting in a large number of defective appliances shipped out of the factory.

[0037] To address this problem, the embodiments of the present application provide a production line retest method, system, host computer, and heating-not-burning appliance for heating-not-burning appliances. By retesting the appliances on the production line after the aging test, defective products in the appliances shipped out of the factory can be reduced. For more specific technical implementation details of the embodiments of the present application, please refer to the various embodiments described below.

[0038] like Figure 1 , which is a schematic diagram of a production line retest system for heating non-combustion appliances provided in an embodiment of the present application. Figure 1 The system shown includes a host computer and a heat-not-burn appliance, wherein the host computer can be a laptop, tablet computer, desktop computer, mobile phone, wearable device, netbook, personal digital assistant (PDA) or large-screen TV and other types of devices. This application does not impose any restrictions on the specific device type of the host computer. The heat-not-burn appliance is a lower computer, which can be any type or model of appliance. As an example, Figure 2 It is a structural schematic diagram of a heating without burning device provided in an embodiment of the present application. Figure 2The heating without burning appliance shown includes a control mainboard, a heating element and a battery module, and the control mainboard is electrically connected to the heating element and the battery module respectively. Among them, the heating without burning appliance can interact with the host computer through the control mainboard. The heating element can be heated up under the control of the control mainboard to bake the aerosol generation matrix, and the battery module serves as a power source to provide electrical energy. The host computer and the heating without burning appliance can establish a communication connection in various wired or wireless ways. As an example, a serial port line can be used to establish a communication connection. One end of the serial port line is connected to the COM port of the host computer, and the other end is connected to the control mainboard of the heating without burning appliance. The host computer can interact with the heating without burning appliance and send various test instructions to the heating without burning appliance. The heating without burning appliance can perform various test operations according to the issued test instructions, and the obtained test results can be displayed on the screen of the host computer. About Figure 1 For the specific working principle of the system shown, please refer to the method embodiment described below.

[0039] See also Figure 3 , shows a production line retest method for a heating-not-burning appliance provided in an embodiment of the present application, comprising:

[0040] 301. After the heating without burning device completes the aging test, the host computer sends a parameter test instruction to the heating without burning device;

[0041] In the prior art, the last step of the production line test operation of the heat-not-burn appliance is the aging test. After the aging test is passed, the appliance is packaged and shipped. No workstation can intercept the appliance quality problems caused by the aging test. To solve this problem, the embodiment of the present application will retest the appliance after the aging test, and send a parameter test instruction to the heat-not-burn appliance through the host computer, so as to re-check whether the various appliance parameters of the appliance are normal, thereby reducing the possibility of defective appliances leaving the factory.

[0042] Before implementing the method provided in the embodiment of the present application, it is necessary to establish a communication connection between the host computer and the heating-not-burning appliance in order to complete data interaction. The host computer and the heating-not-burning appliance can establish a communication connection through various wired or wireless methods such as a serial line, a USB line, Bluetooth, and a network, and the embodiment of the present application does not limit this. As an example, a serial line can be used to connect the host computer and the heating-not-burning appliance, one end of the serial line is connected to a COM port of the host computer, and the other end is connected to the control motherboard of the heating-not-burning appliance. After the host computer configures the corresponding channel number (i.e., the connected COM port number), a communication connection with the heating-not-burning appliance can be established, thereby completing data interaction.

[0043] In actual operation, an application software for testing heat-not-burn appliances can be pre-installed in the host computer. Through the software interface of the application software, the user can perform various operations such as selecting a connection port, issuing test instructions, and viewing appliance test results. For example, after connecting the host computer to the heat-not-burn appliance that has completed the aging test, the user can open and run the application software of the host computer. By clicking the corresponding function buttons in the software interface, the host computer can issue various test instructions to the heat-not-burn appliance.

[0044] 302. After receiving the parameter test instruction, the heating-not-burning appliance returns the parameters of each appliance to the host computer;

[0045] After receiving the parameter test instruction sent by the host computer, the heating-not-burning appliance will return the various appliance parameters stored in the register Flash and other storage devices to the host computer, and the host computer will determine whether the various appliance parameters are normal. The various appliance parameters may include but are not limited to: the current resistance value of the heating element, the initial resistance value of the heating element, the resistance temperature coefficient of the heating element, the circuit board temperature, the battery cell temperature, and the number of times the appliance has aged.

[0046] 303. If all the parameters of the appliance meet the preset conditions, the host computer determines that the heating without burning appliance has passed the production line retest.

[0047] After receiving the various appliance parameters returned by the heating-not-burning appliance, the upper computer determines whether each appliance parameter meets the preset conditions. If all appliance parameters meet the preset conditions, it means that all appliance parameters of the appliance are normal after the aging test, which indicates that the heating element and other components of the appliance are not damaged during the aging test. Therefore, it can be determined that the appliance has passed the production line retest and can be packaged and shipped normally. On the contrary, if there is at least one appliance parameter that does not meet the preset conditions, it means that the appliance has an abnormal appliance parameter after the aging test, which indicates that the heating element and other components of the appliance may be damaged during the aging test. Therefore, it is determined that the appliance has not passed the production line retest. After that, it is necessary to investigate the specific reasons for the abnormal appliance parameters. After completing the investigation and repair, the appliance is retested again until the appliance passes the production line retest. In actual operation, the process of production line retesting may include testing of appliance parameters such as the current resistance of the heating element, the initial resistance of the heating element, the circuit board temperature, the battery cell temperature, and the number of aging times, which are described in detail below.

[0048] In one implementation of the embodiment of the present application, each appliance parameter includes a current resistance value and an initial resistance value of a heating element of the heating-not-burning appliance; the method further includes:

[0049] If the difference between the current resistance value of the heating element and the initial resistance value of the heating element is less than the preset resistance value, the host computer determines that the current resistance value of the heating element and the initial resistance value of the heating element meet the preset conditions.

[0050] For a normal heating element, the difference between its current resistance and initial resistance is within a reasonable range, that is, the difference is less than a preset resistance. 当前 The initial resistance of the heating element R 初始 Then, calculate the difference between the two resistance values ​​| R 当前 -R 初始 ∣, compare the difference with the preset resistance Rx, if ∣R 当前 -R 初始 ∣<Rx, it means the current resistance value of the heating element is R 当前 And the initial resistance of the heating element R 初始 Meet the preset conditions, that is, R 当前 and R 初始 Normal. On the contrary, if |R 当前 -R 初始 ∣≥Rx, it means the current resistance value of the heating element is R 当前 And the initial resistance of the heating element R 初始 Does not meet the preset conditions, that is, R 当前 and R 初始 Abnormal, you need to disassemble the machine to check the cause of the abnormal resistance of the heating element.

[0051] As an example, the calculation formula for the resistance of the heating element is R 当前 =(T 当前 -T 室温 )×R 初始 ×TCR+R 初始 , where T 当前 Indicates the current ambient temperature, T 室温 represents the standard room temperature (usually 26°C), and TCR represents the resistance temperature coefficient of the heating element. Assuming the initial resistance value of the heating element is R 初始 is 0.5Ω (corresponding to the value 5000 stored in the register Flash), TCR is 3000ppm / ℃, T 当前 At 30°C, T 室温 is 26℃, then the current resistance of the heating element is R 当前 =(30-26)×0.5×3000×10 -6 +0.5=0.506, corresponding to the value 5060 stored in register Flash, R 当前 With R 初始 The resistance difference between them is only 60, which is less than the reasonable range of 400. Therefore, R 当前 With R 初始 normal.

[0052] In one implementation of the embodiment of the present application, the various appliance parameters include a circuit board temperature and a battery cell temperature of the heating-not-burning appliance; the method further includes:

[0053] If the circuit board temperature and the battery cell temperature are both within the preset room temperature range, the host computer determines that the circuit board temperature and the battery cell temperature meet the preset conditions.

[0054] Under normal circumstances, the temperature of the circuit board and the battery cell of the device will not differ greatly from the room temperature, that is, the temperature of the circuit board and the battery cell are both within the preset room temperature range, for example, within the range [T 室温 -4℃, T 室温 +4℃] The host computer obtains the circuit board temperature T 电路板 And the battery cell temperature T 电芯 After that, determine the circuit board temperature T 电路板 Is it in the range [T 室温 -4℃, T 室温 +4℃], and judge the battery cell temperature T 电芯 Is it in the range [T 室温 -4℃, T 室温 +4℃]. If both temperatures are within the range [T 室温 -4℃, T 室温 +4℃], indicating the circuit board temperature T 电路板 and battery cell temperature T 电芯 All meet the preset conditions, that is, T 电路板 and T 电芯 Normal. On the contrary, if the circuit board temperature T 电路板 If the temperature of the circuit board is out of range, it means 电路板 Abnormal, if the battery cell temperature T 电芯 If the battery cell temperature is out of range, it means 电芯 Abnormality: As long as any temperature abnormality occurs, it is necessary to investigate the cause of the temperature abnormality, such as whether the device has not been cooled after the aging test, or whether the device's thermistor and other components have malfunctioned.

[0055] In one implementation of the embodiment of the present application, each appliance parameter includes the aging number of the heat-not-burn appliance; the method further includes:

[0056] If the aging times exceed the preset times, the host computer determines that the aging times meet the preset conditions.

[0057] Each heating-not-burning appliance needs to undergo a certain number of aging tests before leaving the factory. If the aging times are not enough, the appliance does not meet the factory standards. After obtaining the aging times x of the appliance, the host computer will determine whether the aging times x exceeds the preset times y (for example, 3 times). If the aging times x exceeds the preset times y, it means that the aging times of the appliance have reached the factory standards, so it is determined that the aging times meet the preset conditions; if the aging times do not exceed the preset times y, it means that the aging times of the appliance have not reached the factory standards, so it is determined that the aging times do not meet the preset conditions, and the appliance needs to continue to be aged.

[0058] In one implementation of the embodiment of the present application, the method further includes:

[0059] If at least one of the appliance parameters does not meet the preset conditions, the host computer determines that the heating without burning appliance has not passed the production line retest, and outputs the error cause and troubleshooting prompt information corresponding to the at least one appliance parameter.

[0060] If at least one of the parameters of each device does not meet the preset conditions, it means that the device parameter is abnormal after the aging test, so the host computer determines that the device has not passed the production line retest, and can output the error cause and troubleshooting prompt information corresponding to the at least one device parameter through screen display or voice broadcast, so that the tester can complete the troubleshooting and maintenance as soon as possible. For example, if the resistance of the heating element of the device does not meet the preset conditions, the host computer can display the error cause of "the resistance of the heating element does not meet the regulations" on the screen, and can output troubleshooting prompt information such as "please disassemble the machine to check whether the heating element is damaged". For another example, if the temperature of the circuit board or the temperature of the battery cell does not meet the preset conditions, the host computer can display the error cause of "the temperature of the circuit board / battery cell is abnormal" on the screen, and can output troubleshooting prompt information such as "please check whether the device is cooled or whether the thermistor is faulty". Through this setting, the tester can easily obtain the specific reasons for the failure of the device retest and the items that should be checked, thereby effectively improving the efficiency of troubleshooting and maintenance.

[0061] In one implementation of the embodiment of the present application, the number of instruments that passed the retest and the number of instruments that failed the retest are displayed in a display interface of the host computer; the method further includes:

[0062] (1) If it is determined that the heating-not-burning appliance has passed the production line retest, the number of appliances that have passed the retest displayed on the upper computer control display interface will increase by one;

[0063] (2) If it is determined that the heating-without-combustion appliance has not passed the production line retest, the number of appliances that have not passed the retest displayed on the upper computer control display interface will increase by one.

[0064] In order to facilitate the testers to conduct statistical analysis on the results of the production line retest, the display interface of the host computer can simultaneously display the number of instruments that passed the retest and the number of instruments that failed the retest. When a certain instrument passes the production line retest, the number of instruments that passed the retest displayed in the display interface is controlled to increase by one, and when a certain instrument fails the production line retest, the number of instruments that failed the retest displayed in the display interface is controlled to increase by one. In addition, the retest yield or defective rate can be calculated based on the number of instruments that passed the retest (number of good products) and the number of instruments that failed the retest (number of defective products). With this setting, testers can easily view the statistical data during the production line retest and understand the probability of defective products in real time.

[0065] As an example, Figure 4 Schematic diagram of the initial interface of an application software of a host computer provided in an embodiment of the present application. Figure 4 The initial interface shown includes a full verification button, a channel number selection box, a verification information display area, an operation information display area, and a test information display area. The full verification button is used to wake up the device to establish interaction, and the channel number selection box is used to select the COM port number connected to the device; the verification information display area is used to display information such as the reasonable range of the heating element resistance, the reasonable range of the circuit board temperature / battery cell temperature, and the minimum standard value of the aging times; the operation information display area is used to display the operation status of the application software, such as Figure 4 The initial interface shown displays "Waiting for connection", indicating that the host computer is not yet connected to the heating without burning appliance; the test information display area is used to display the test result information.

[0066] After the tester selects the correct channel number COM3 and connects the host computer to the heating without burning appliance, the application software of the host computer can enter the following Figure 5 The connection interface diagram is shown in Figure 1. Figure 5 In the connection interface shown, the operation information display area displays "Checking, do not plug or unplug", indicating that the host computer is establishing interaction with the heating without combustion appliance and needs to wait for a certain period of time.

[0067] The tester can send a wake-up command to the device by clicking the full verification button until the device returns the corresponding string, indicating that the interaction is successfully established. After that, the host computer can send parameter test instructions to the device. The host computer reads the various device parameters stored in the register Flash and other devices of the heating non-combustion device, and determines whether each device parameter meets the conditions. If all conditions are met, it can be displayed as follows Figure 6 The following is a schematic diagram of the retest result interface. Figure 6In the result interface shown, the operation information display area displays "passed", indicating that the heating without burning device has passed the production line retest, and the test information display area displays specific test result information, such as "resistance verification successful", "heating element resistance is within the specified range", "circuit board temperature / battery cell temperature is within the specified range", "aging times meet the standard" and the current heating element resistance, circuit board temperature and battery cell temperature. If at least one device parameter does not meet the conditions, the following information can be displayed: Figure 7 The following is a schematic diagram of the interface showing the result of the retest failing. Figure 7 In the result interface shown, the operation information display area displays "Failed", indicating that the heating without burning appliance has not passed the production line retest. The test information display area can display the specific reasons for the failure of the retest, such as "Resistance verification failed", "Heating element resistance exceeds the specified range", "Circuit board temperature / battery cell temperature exceeds the specified range", "Aging times does not meet the standard", as well as the current heating element resistance, circuit board temperature and battery cell temperature, so that testers can troubleshoot the problem.

[0068] In the technical solution of the embodiment of the present application, a host computer is connected to the heating-not-burning appliance. After the heating-not-burning appliance completes the aging test, the host computer is used to send a parameter test instruction to the heating-not-burning appliance. After receiving the parameter test instruction, the heating-not-burning appliance returns each appliance parameter to the host computer; the host computer detects whether each appliance parameter meets the preset conditions respectively, and if all appliance parameters meet the preset conditions, it is determined that the heating-not-burning appliance has passed the production line retest. After the heating-not-burning appliance completes the aging test, the above process will re-detect whether each appliance parameter of the heating-not-burning appliance is normal, so that the heating element problem caused by the aging test can be discovered before the appliance leaves the factory, reducing the defective products in the appliances leaving the factory.

[0069] To facilitate understanding of the production line retest method for heating non-combustion appliances provided in an embodiment of the present application, an actual application scenario is listed below.

[0070] like Figure 8 FIG. 1 is a schematic diagram of the operation flow of the production line retest method of the heating-not-burning appliance provided in an embodiment of the present application in an actual application scenario. Figure 8In the application scenario shown, first connect the upper and lower computers, that is, establish a communication connection between the upper computer and the heating without burning appliance. Specifically, you can use a serial cable to connect the appliance to the COM port of the upper computer, open the corresponding application software in the upper computer, and select the corresponding channel number through the software interface to complete the connection. The appliance has completed the aging test. Determine the reasonable difference range of the resistance of the heating element, the reasonable temperature range of the circuit board temperature / battery cell temperature, and the minimum standard value of the aging times. After establishing the interaction between the upper computer and the appliance, the upper computer sends a parameter test instruction to the appliance, reads each appliance parameter stored in the register Flash of the appliance, and judges whether each appliance parameter meets the conditions. Each appliance parameter includes the current resistance of the heating element, the initial resistance of the heating element, the circuit board temperature, the battery cell temperature, and the aging times; if the difference between the current resistance of the heating element and the initial resistance of the heating element is within a reasonable difference range, the circuit board temperature / battery cell temperature is within a reasonable temperature range, and the aging times reach the minimum standard value, the upper computer determines that the appliance has passed the production line retest and can enter the subsequent whole machine printing. The package factory process; if the difference between the current resistance value of the heating element and the initial resistance value of the heating element exceeds the reasonable difference range, it is determined that the device has not passed the production line retest, and the tester is prompted to disassemble the device to check the heating element; if the circuit board temperature / battery cell temperature exceeds the reasonable temperature range, it is determined that the device has not passed the production line retest, and the circuit board temperature / battery cell temperature is abnormal. You can check whether the device has not been cooled after the aging test, or whether the device's thermistor and other devices have failed; if the aging number of the device does not reach the minimum standard value, it is determined that the device has not passed the production line retest, and it is prompted that the aging number of the device does not meet the shipping standard. After the device completes the aging test, the above process will re-check whether the various device parameters of the heating non-burning device are normal, thereby reducing the number of defective products in the devices shipped.

[0071] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0072] Fig. 9 Schematic diagram of a host computer / heating without burning device provided in one embodiment of the present application. Fig. 9 As shown, the host computer / heating-without-combustion appliance 9 of this embodiment includes: a processor 90, a memory 91, and a computer program 92 stored in the memory 91 and executable on the processor 90. When the processor 90 executes the computer program 92, the steps in the above-mentioned embodiments of the production line retest method of each heating-without-combustion appliance are implemented.

[0073] The computer program 92 may be divided into one or more modules / units, which are stored in the memory 91 and executed by the processor 90 to complete the present application. The one or more modules / units may be a series of computer program instruction segments capable of completing specific functions, which are used to describe the execution process of the computer program 92.

[0074] The processor 90 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0075] The memory 91 may be an internal storage unit, such as a hard disk or a memory. The memory 91 may also be an external storage device, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. Further, the memory 91 may include both the internal storage unit and the external storage device. The memory 91 is used to store the computer program and other data. The memory 91 may also be used to temporarily store data that has been output or is to be output.

[0076] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0077] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0078] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0079] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0080] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the system embodiments described above are only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0081] The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the embodiments of the present application.

[0082] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0083] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0084] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A production line retest method for heating without burning appliances, characterized in that: Applied to a host computer connected to a heat-not-burn appliance, the method comprises: After the heating without burning appliance completes the aging test, sending a parameter test instruction to the heating without burning appliance to instruct the heating without burning appliance to return various appliance parameters to the host computer; If all the appliance parameters meet the preset conditions, it is determined that the heating without burning appliance has passed the production line retest.

2. The method according to claim 1, characterized in that The various appliance parameters include the current resistance value and the initial resistance value of the heating element of the heating-not-burning appliance; the method further includes: If the difference between the current resistance value of the heating element and the initial resistance value of the heating element is smaller than the preset resistance value, it is determined that the current resistance value of the heating element and the initial resistance value of the heating element meet the preset condition.

3. The method according to claim 1, characterized in that The various appliance parameters include a circuit board temperature and a battery cell temperature of the heat-not-burn appliance; the method further includes: If the circuit board temperature and the battery cell temperature are both within a preset room temperature range, it is determined that the circuit board temperature and the battery cell temperature meet the preset condition.

4. The method according to claim 1, characterized in that The various appliance parameters include the aging times of the heat-not-burn appliance; the method further includes: If the aging times exceed the preset times, it is determined that the aging times meet the preset condition.

5. The method according to any one of claims 1 to 4, characterized in that: Also includes: If at least one of the appliance parameters does not meet the preset condition, it is determined that the heating without burning appliance has failed the production line retest, and the error cause and troubleshooting prompt information corresponding to the at least one appliance parameter are output.

6. The method according to claim 5, characterized in that The display interface of the host computer displays the number of instruments that passed the retest and the number of instruments that failed the retest; the method further includes: If it is determined that the heating without burning appliance has passed the production line retest, the number of appliances that have passed the retest displayed in the display interface is controlled to increase by one; If it is determined that the heating without burning appliance has not passed the production line retest, the number of the appliances that have not passed the retest displayed in the display interface is controlled to increase by one.

7. A production line retest method for heating without burning appliances, characterized in that: Applicable to a heating-without-combustion appliance connected to a host computer, the method comprises: After the aging test is completed, receiving a parameter test instruction sent by the host computer; The parameters of each appliance are returned to the host computer to instruct the host computer to determine that the heating without burning appliance has passed the production line retest after detecting that the parameters of each appliance meet the preset conditions.

8. A host computer, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the production line retest method of the heating non-burning appliance as described in any one of claims 1 to 6 is implemented.

9. A heat-not-burn appliance, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the production line retest method of the heating non-burning appliance as claimed in claim 7 is implemented.

10. A production line retest system for heating-not-burning appliances, characterized in that: It comprises the host computer as claimed in claim 8 and the heating without burning device as claimed in claim 9.

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