FPC electrical testing method, system and equipment

Abstract

The present application relates to the field of FPC detection technology, and provides an FPC electrical testing method, system and equipment. The FPC electrical testing method includes: in response to a start electrical testing instruction, determining the number of electrical tests required for the substrate to be tested based on the identification information sent by the scanning component; in the case of receiving the electrical testing data sent by the electrical testing component, recording the electrical testing record corresponding to the substrate to be tested once; in response to the electrical testing end instruction corresponding to the substrate to be tested, determining the number of valid records in the electrical testing record; in the case where the number of valid records does not match the number of electrical tests required and it is determined that the number of valid records in the electrical testing record is to be reviewed, the number of valid records in the electrical testing record is reviewed, and based on the matching relationship between the number of valid records after review and the number of electrical tests required, determining whether there is a missed test in the electrical testing process of the substrate to be tested. By adopting the above technical solution, missed tests in the electrical testing process can be judged, which can help improve the reliability of the electrical testing results.

Description

Technical Field

[0001] The present application relates to the field of FPC detection technology, and in particular to an FPC electrical measurement method, system and equipment. Background Art

[0002] Flexible printed circuits (FPC) play an important role in modern electronic products, especially in the fields of smartphones, tablets, and wearable devices. In order to ensure the quality and reliability of products, electrical testing of FPC has become an indispensable part of the production process.

[0003] At present, FPCs are usually produced and monitored on a substrate basis. A substrate may include multiple FPCs, and different FPCs on the same substrate are independent of each other. During the electrical testing process, each FPC on the substrate needs to be tested separately.

[0004] However, the current electrical testing components can only test one FPC at a time, while the substrate includes multiple FPCs, which often leads to missed tests during the actual electrical testing process, thereby causing the problem of low reliability of the electrical testing results. Summary of the invention

[0005] In order to help improve the reliability of electrical testing results, the present application provides an FPC electrical testing method, system and equipment.

[0006] In the first aspect, the present application provides an FPC electrical testing method, which adopts the following technical solution:

[0007] An FPC electrical testing method is used in a control host of an FPC electrical testing system, wherein the electrical testing system further comprises an electrical testing component and a scanning component connected to the control host signal, wherein the electrical testing component is used to perform electrical testing on the FPC, and the scanning component is used to obtain identification information corresponding to a substrate, wherein the substrate comprises at least two FPCs, and the method comprises:

[0008] In response to the start electrical test instruction, determining the number of electrical tests required for the substrate to be tested based on the identification information sent by the scanning component;

[0009] When receiving the electrical measurement data sent by the electrical measurement component, recording the electrical measurement record corresponding to the substrate to be measured;

[0010] In response to an electrical test end instruction corresponding to the substrate to be tested, determining the number of valid records in the electrical test record;

[0011] Determining whether the number of valid records matches the number of power measurement requirements;

[0012] In the case where the number of valid records does not match the required number of power measurements, determining whether to review the number of valid records in the power measurement record;

[0013] When it is determined that the number of valid records in the electrical test record is to be reviewed, the number of valid records in the electrical test record is reviewed, and based on the matching relationship between the number of reviewed valid records and the required number of electrical tests, it is determined whether there is any missed test in the electrical test process of the substrate to be tested.

[0014] By adopting the above technical solution, when the number of valid records in the electrical test record does not match the number of electrical tests required for the substrate to be tested and a review is required, it can be determined whether there is a missed test in the electrical test process based on the matching relationship between the number of valid records after the review and the number of electrical tests required. In this way, the missed test in the electrical test process can be judged, which can help improve the reliability of the electrical test results.

[0015] Optionally, determining the number of valid records in the electrical measurement records includes:

[0016] Determine, as invalid records, the electric measurement records whose corresponding recording time and the recording time corresponding to the previous electric measurement record have an interval time length less than an interval time length threshold, wherein the recording time is the time when the electric measurement data corresponding to the electric measurement record is received;

[0017] The electrical measurement records that are not determined as invalid records among the electrical measurement records are determined as valid records.

[0018] By adopting the above technical solution, records with too short an interval can be determined as invalid records based on the intervals between the recording times corresponding to different electrical measurement records. This can help avoid the impact of repeated operations in the electrical measurement process on the number of electrical measurements, and thus help improve the accuracy of the number of valid records ultimately determined.

[0019] Optionally, recording an electrical measurement record corresponding to the substrate to be tested includes:

[0020] generating the electrical measurement record based on the electrical measurement data;

[0021] Before determining the electrical measurement records that are not determined as invalid records among the electrical measurement records as valid records, the method further includes:

[0022] For each of the electrical test records, determining whether the electrical test data corresponding to the electrical test record belongs to a preset valid range, wherein the valid range includes a data range corresponding to an FPC that passes the electrical test and a data range corresponding to an FPC that fails the electrical test;

[0023] The electric measurement record whose corresponding electric measurement data does not belong to the valid range is determined as an invalid record.

[0024] By adopting the above technical solution, the electrical measurement records whose electrical measurement data do not fall within the valid range can be determined as invalid records based on the matching relationship between the electrical measurement data corresponding to the electrical measurement records and the valid range. This can help avoid the impact of erroneous operations during the electrical measurement process on the number of electrical measurements, and further help improve the accuracy of the number of valid records finally determined.

[0025] Optionally, the reviewing the number of valid records in the electrical measurement records includes:

[0026] Determine, as retest records, the electric measurement records that are determined to be invalid records only because the interval between the corresponding recording time and the recording time corresponding to the previous electric measurement record is less than the interval time threshold;

[0027] The retest record whose corresponding recording time and the recording time corresponding to the previous valid record have an interval time length greater than the interval time length threshold is determined as the valid record.

[0028] In the above technical solution, since only the determined valid records are considered during the review of invalid records, this can help avoid the influence of invalid records on the validity judgment of electrical measurement records, and further help improve the accuracy of the re-measurement results.

[0029] Optionally, the method further includes:

[0030] In response to the identification information sent by the scanning component, determining whether the substrate to be tested exists;

[0031] In the case where the substrate to be tested exists, generating an electrical test end instruction corresponding to the substrate to be tested, and generating the electrical test start instruction based on the identification information, so as to re-determine the substrate to be tested based on the identification information;

[0032] In the case that the substrate to be tested does not exist, the start electrical test instruction is generated based on the identification information, so as to determine the substrate to be tested based on the identification information.

[0033] By adopting the above technical solution, when the identification information sent by the scanning component is received, the corresponding processing method can be determined in combination with whether there is a substrate to be tested. This can help ensure the accuracy of the correspondence between the received electrical measurement data and the substrate, and further help to accurately count the electrical measurement conditions corresponding to different substrates.

[0034] Optionally, in the case where the substrate to be tested exists, generating an electrical test end instruction corresponding to the substrate to be tested, and generating the electrical test start instruction based on the identification information, comprises:

[0035] In the case where the substrate to be tested exists, determining whether the substrate to be tested is a double-sided substrate;

[0036] In the case where the substrate to be tested is not a double-sided substrate, generating an electrical test end instruction corresponding to the substrate to be tested, and generating the electrical test start instruction based on the identification information;

[0037] In the case where the substrate to be tested is a double-sided substrate, determining whether the identification information matches the substrate to be tested;

[0038] In the case that the identification information does not match the substrate to be tested, an electrical test end instruction corresponding to the substrate to be tested is generated, and the electrical test start instruction is generated based on the identification information.

[0039] By adopting the above technical solution, the electrical measurement data of different surfaces can be automatically accumulated and counted during the electrical measurement of the double-sided substrate, which can help avoid the problem of comparison errors that are easy to occur when the electrical measurement data of different surfaces of the double-sided substrate are counted separately, and thus can help improve the accuracy of missed detection judgment.

[0040] Optionally, after determining whether the identification information matches the substrate to be tested, the method further includes:

[0041] When the identification information matches the substrate to be tested, recording a corresponding flipping record of the substrate to be tested;

[0042] In the case where the substrate to be tested is a double-sided substrate, in response to an electrical test end instruction corresponding to the substrate to be tested, determining the number of valid records in the electrical test record includes:

[0043] In response to an electrical test end instruction corresponding to the substrate to be tested, determining whether the substrate to be tested is a double-sided substrate;

[0044] In the case where the substrate to be tested is a double-sided substrate, determining whether there is a corresponding flipping record of the substrate to be tested;

[0045] In the case where there is a flip record corresponding to the substrate to be tested, determining the number of valid records in the electrical test record;

[0046] In the case that there is no corresponding turning record of the substrate to be tested, it is directly determined that there is a missed test in the electrical testing process of the substrate to be tested.

[0047] By adopting the above technical solution, during the missed detection judgment process, it is possible to first determine whether there is a flipping record of the double-sided substrate, and directly determine whether the double-sided substrate without a flipping record has a missed detection. This can ensure the accuracy of the final missed detection result and also reduce the amount of calculation in the missed detection judgment process.

[0048] Optionally, after determining whether there is any missed test in the electrical test process of the substrate to be tested based on the matching relationship between the number of the verified valid records and the number of required electrical tests, the method further includes:

[0049] When it is determined that there is no missed test in the electrical test process of the substrate to be tested, recording the number of risk times;

[0050] Determining whether the number of risks is greater than a risk threshold;

[0051] When the number of risk occurrences is greater than the risk threshold, risk warning information corresponding to the electrical measurement component is output to prompt that there is a risk in the electrical measurement process.

[0052] By adopting the above technical solution, it is possible to count irregular operations during the electrical measurement process, and output risk warning information when the number of risks is greater than the risk number threshold, which can help monitor and prompt the risks in the electrical measurement process, and further help improve the reliability of the electrical measurement results.

[0053] In the second aspect, the present application provides an FPC electrical testing system, which adopts the following technical solution:

[0054] An FPC electrical measurement system, the system comprising a control host and an electrical measurement component and a scanning component connected to the control host by signal;

[0055] The electrical testing component is used to perform electrical testing on the FPC;

[0056] The scanning component is used to obtain identification information corresponding to the substrate, and the substrate includes at least two FPCs;

[0057] The control host is used to execute any one of the FPC electrical testing methods provided in the first aspect.

[0058] In a second aspect, the present application provides an electronic device, which adopts the following technical solution:

[0059] An electronic device, comprising:

[0060] at least one processor;

[0061] Memory;

[0062] At least one application, wherein the at least one application is stored in a memory and configured to be executed by at least one processor, and the at least one application is configured to: execute any one of the FPC electrical testing methods provided in the first aspect.

[0063] In summary, the present application includes at least one of the following beneficial technical effects:

[0064] 1. When the number of valid records in the electrical test record does not match the number of electrical tests required for the substrate to be tested and a review is required, it can be determined whether there is a missed test in the electrical test process based on the matching relationship between the number of valid records after review and the number of electrical tests required. In this way, the missed test in the electrical test process can be judged, which can help improve the reliability of the electrical test results;

[0065] 2. Since only the confirmed valid records are considered in the process of reviewing the invalid records, this can help avoid the influence of the invalid records on the validity judgment of the electrical measurement records, and thus help improve the accuracy of the re-test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0066] Figure 1 It is a structural schematic diagram of an FPC electrical testing system provided in an embodiment of the present application;

[0067] Figure 2 It is a flow chart of an FPC electrical testing method provided in an embodiment of the present application;

[0068] Figure 3 It is a flowchart of a method for generating a start electrical test instruction provided in an embodiment of the present application;

[0069] Figure 4 It is a flowchart of another method for generating a start electrical test instruction provided in an embodiment of the present application;

[0070] Figure 5 It is a flowchart of a missed detection judgment method provided in an embodiment of the present application;

[0071] Figure 6 It is a structural schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0072] In order to make the purpose, technical solutions and advantages of this application more clear, the following Figure 1-6 It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0073] The present application embodiment discloses an FPC electrical testing system, referring to Figure 1The FPC electrical testing system includes a control host 110 and an electrical testing component 120 and a scanning component 130 connected to the control host 110 by signals.

[0074] The electrical test component 120 is used to perform electrical testing on the FPC. In one example, the electrical test component 120 is used to perform on-off detection on the PFC.

[0075] The scanning component 130 is used to obtain identification information corresponding to the substrate, and the substrate includes at least two FPCs. In one example, the scanning component 130 is a two-dimensional code scanner, and accordingly, the identification information is a two-dimensional code, which is pasted or printed on the substrate.

[0076] The control host 110 is used to record and judge the electrical measurement process based on the data sent by the electrical measurement component 120 and the scanning component 130. In one example, the control host 110 is also connected to the management information system (MIS) system signal, so that the data generated by the electrical measurement process can be recorded.

[0077] The embodiment of the present application also provides an FPC electrical testing method, which is described by taking the method applied to the control host of the above-mentioned FPC electrical testing system as an example. In actual implementation, the method can also be used in other systems for electrical testing of FPC.

[0078] refer to Figure 2 , FPC electrical testing includes the following steps:

[0079] Step 201 , in response to a start electrical test instruction, determining the number of electrical tests required for the substrate to be tested based on identification information sent by a scanning component.

[0080] The identification information is used to identify the substrate, and the substrate to be tested is the substrate corresponding to the identification information. In one example, the identification information is obtained by scanning the two-dimensional code on the substrate with a two-dimensional code scanner.

[0081] The number of required electrical tests is the minimum number of electrical tests corresponding to the substrate, and the number of required electrical tests corresponding to different substrates is preset. In one example, the number of required electrical tests corresponding to the substrate is set based on the number of FPCs on the substrate.

[0082] In one example, the start electrical test instruction is generated upon receiving identification information sent by the scanning component.

[0083] In another example, in response to the start electrical test instruction, the interface of the scanning component starts to be monitored, and when identification information sent by the scanning component is monitored, the number of electrical tests required for the substrate to be tested is determined based on the received identification information.

[0084] Step 202: upon receiving the electrical test data sent by the electrical test component, record an electrical test record corresponding to the substrate to be tested.

[0085] Specifically, when the electrical measurement component is used to perform a test process, the electrical measurement component will generate electrical measurement data and send it to the control host, so that the control host can generate an electrical measurement record corresponding to the substrate to be tested based on the reception of the electrical measurement data.

[0086] Furthermore, the electrical measurement component may also include data with practical meaning, such as measured on / off conditions and / or resistance values, etc. This can help determine the electrical measurement results of the FPC based on the electrical measurement data.

[0087] In this embodiment, the electrical testing component and the scanning component correspond to the same electrical testing station, and one electrical testing station can only perform electrical testing on one substrate at the same time.

[0088] Step 203, in response to the electrical test end instruction corresponding to the substrate to be tested, determining the number of valid records in the electrical test record.

[0089] The electrical test end instruction is used to indicate the end of the test of the substrate to be tested. In one example, the electrical test end instruction may be generated when the identification information sent by the scanning component is received. In another example, the electrical test end instruction may also be automatically generated by the control host, for example, when the staff triggers the test end control displayed on the display component of the control host.

[0090] Valid records refer to: electrical test records obtained by electrical testing of FPC. Specifically, in the actual electrical testing process, the electrical test data may be obtained by testing the FPC, or may be obtained by testing other positions on the substrate. Only the electrical test records obtained by testing the FPC are meaningful to the electrical testing process, so it is necessary to predict the number of valid records in the electrical test records.

[0091] It should be noted that, since it is difficult to determine valid records, in this embodiment, invalid records that are obviously not valid records can be determined from the electrical measurement records through pre-set invalidity judgment rules, and the number of electrical measurement records that have not been determined as invalid records in each electrical measurement record can be determined as the number of valid records.

[0092] In one example, invalid records can be determined based on the distribution of reception times of different electrical test records. Specifically, since different FPCs are staggered on the substrate, there will be a certain time interval between electrical tests of different FPCs during normal testing, that is, there will be a certain time interval between reception times of different electrical test records.

[0093] Based on this, the electric measurement records whose corresponding recording time and the recording time corresponding to the previous electric measurement record have an interval time length less than an interval time length threshold can be determined as invalid records.

[0094] The recording time is the time when the electrical measurement data corresponding to the electrical measurement record is received. The previous electrical measurement record refers to the electrical measurement record received most recently before the electrical measurement record. The interval time threshold can be preset, for example, based on the density of the FPC on the substrate to be measured.

[0095] In the above example, based on the intervals between the recording times corresponding to different electrical measurement records, records with too short an interval can be determined as invalid records. This can help avoid the impact of repeated operations in the electrical measurement process on the number of electrical measurements, and further help improve the accuracy of the number of valid records ultimately determined.

[0096] In another example, the electrical measurement record is generated based on the electrical measurement data, and the invalid record is determined based on the electrical measurement data. In this case, the electrical measurement data is data with actual meaning, such as whether the circuit is open and / or the measured resistance.

[0097] Correspondingly, for each electric measurement record, it is determined whether the electric measurement data corresponding to the electric measurement record belongs to a preset valid range; and the electric measurement record whose corresponding electric measurement data does not belong to the valid range is determined as an invalid record.

[0098] The valid range includes the data range corresponding to the FPC that passed the electrical test and the data range corresponding to the FPC that failed the electrical test. In one example, the electrical test data includes resistance, and accordingly, the data range includes less than the preset maximum open circuit resistance and infinity (ie, open circuit).

[0099] In the above example, based on the matching relationship between the electrical measurement data corresponding to the electrical measurement record and the valid range, the electrical measurement record whose electrical measurement data does not belong to the valid range can be determined as an invalid record. This can help avoid the impact of erroneous operations during the electrical measurement process on the number of electrical measurements, and further help improve the accuracy of the number of valid records finally determined.

[0100] Step 204, determining whether the number of valid records matches the number of power measurement requirements.

[0101] Optionally, determining whether the number of valid records matches the number of power measurement requirements includes: determining whether the number of valid records is less than the number of power measurement requirements; when the number of valid records is less than the number of power measurement requirements, determining that the number of valid records does not match the number of power measurement requirements; when the number of valid records is greater than or equal to the number of power measurement requirements, determining that the number of valid records matches the number of power measurement requirements.

[0102] Step 205: When the number of valid records does not match the required number of power measurements, determine whether to review the number of valid records in the power measurement records.

[0103] Specifically, when the number of valid records does not match the number of electrical tests required, it means that there may be an abnormality in the electrical test process of the substrate to be tested. Since the valid records are predicted through step 203, in order to help ensure the accuracy of the abnormality judgment results, it is necessary to determine whether to review the number of valid records in the electrical test records.

[0104] Optionally, determining whether to review the number of valid records in the electricity measurement records includes: determining whether the number of electricity measurement records is less than the required number of electricity measurements; if the number of electricity measurement records is less than the required number of electricity measurements, determining not to review the number of valid records in the electricity measurement records; if the number of electricity measurement records is greater than or equal to the required number of electricity measurements, determining to review the number of valid records in the electricity measurement records.

[0105] Optionally, when the number of valid records matches the number of small electrical measurements, it is determined that there is no missed measurement in the electrical measurement process.

[0106] Step 206, when it is determined that the number of valid records in the electrical test record is to be reviewed, the number of valid records in the electrical test record is reviewed, and based on the matching relationship between the number of reviewed valid records and the required number of electrical tests, it is determined whether there is any missed test in the electrical test process of the substrate to be tested.

[0107] In one example, the number of valid records in the electrical measurement records is reviewed, including: determining as retest records those electrical measurement records that are determined to be invalid records only because the interval between the corresponding recording time and the recording time corresponding to the previous electrical measurement record is less than the interval time threshold; and determining as valid records those retest records whose interval between the corresponding recording time and the recording time corresponding to the previous valid record is greater than the interval time threshold.

[0108] Specifically, in the process of judging invalid records by interval length, the invalid records that have been determined may affect the judgment of the validity of subsequent electrical measurement records, which may lead to errors in the judgment of the validity of the electrical measurement records. Therefore, in the process of reviewing invalid records, only the valid records that have been determined are considered. This can help avoid the influence of invalid records on the judgment of the validity of electrical measurement records, and thus help improve the accuracy of the re-test results.

[0109] In another example, reviewing the number of valid records in the electrical measurement records includes: for each electrical measurement record determined to be an invalid record, determining whether the electrical measurement record satisfies at least two invalidity conditions; if so, determining the electrical measurement record to be an invalid record; if not, determining the electrical measurement record to be a valid record.

[0110] Specifically, since errors may exist in the process of judging electrical measurement records based on invalid conditions, which may lead to errors in the validity judgment of electrical measurement records, in the process of reviewing invalid records, the electrical measurement records determined to be invalid records are reviewed through at least two invalid conditions, which can help avoid the influence of the judgment error of a single invalid judgment condition on the validity judgment, and thus help improve the accuracy of the review results.

[0111] Optionally, determining whether there are any missed tests in the electrical testing process of the substrate to be tested is based on the matching relationship between the number of valid records after review and the number of required electrical tests, including: when the number of valid records after review matches the number of required electrical tests, determining that there are no missed tests in the electrical testing process; when the number of valid records after review does not match the number of required electrical tests, determining that there are missed tests in the electrical testing process.

[0112] The manner of determining the matching relationship between the number of verified valid records and the number of power measurement needs can be similar to the manner of determining whether the number of valid records and the number of power measurement needs match in step 204, which will not be described in detail here.

[0113] The implementation principle of an FPC electrical testing method provided in an embodiment of the present application is: in response to a start electrical testing instruction, the number of electrical tests required corresponding to the substrate to be tested is determined based on the identification information sent by the scanning component; when the electrical testing data sent by the electrical testing component is received, the electrical testing record corresponding to the substrate to be tested is recorded once; in response to an electrical testing end instruction corresponding to the substrate to be tested, the number of valid records in the electrical testing record is determined; it is determined whether the number of valid records matches the number of electrical tests required; if the number of valid records does not match the number of electrical tests required, it is determined whether to review the number of valid records in the electrical testing record; if it is determined that the number of valid records in the electrical testing record is to be reviewed, the number of valid records in the electrical testing record is reviewed, and based on the matching relationship between the number of valid records after review and the number of electrical tests required, it is determined whether there is any missed test in the electrical testing process of the substrate to be tested. By adopting the above technical scheme, it is possible to generate electrical measurement records corresponding to electrical measurement data during the test process of the substrate to be tested, and when the number of valid records in the electrical measurement records does not match the number of electrical measurements required corresponding to the substrate to be tested and the number of valid records needs to be reviewed, it is determined whether there are any missed measurements in the electrical measurement process based on the matching relationship between the number of valid records after review and the number of electrical measurements required. In this way, missed measurements in the electrical measurement process can be judged, which can help improve the reliability of the electrical measurement results.

[0114] In some embodiments, reference Figure 3 The FPC electrical testing method provided in the embodiment of the present application further includes the following steps:

[0115] Step 301: In response to identification information sent by a scanning component, determine whether there is a substrate to be tested.

[0116] Specifically, the identification information is obtained by scanning the identification on the substrate to be tested by the scanning component. Therefore, when the identification information sent by the scanning component is received, it indicates that the measurement of the substrate corresponding to the identification information is to be started. In the process of continuous electrical measurement, when there is a substrate to be tested, the measurement of a new substrate means the end of the measurement of the current substrate to be tested. Therefore, it is necessary to determine the corresponding processing method based on whether there is a substrate to be tested.

[0117] Step 302 : if there is a substrate to be tested, generate an electrical test end instruction corresponding to the substrate to be tested, and generate an electrical test start instruction based on the identification information, so as to re-determine the substrate to be tested based on the identification information.

[0118] Specifically, when there is a substrate to be tested, it is necessary to first end the test of the current substrate to be tested, and then test the substrate corresponding to the identification information. This can help ensure the accuracy of the correspondence between the received electrical measurement data and the substrate, and further help to accurately count the electrical measurement conditions corresponding to different substrates.

[0119] Step 303 : if there is no substrate to be tested, generate an electrical test start instruction based on the identification information, so as to determine the substrate to be tested based on the identification information.

[0120] Specifically, the reason why there is no substrate to be tested may be that other substrates have not been electrically tested before, or the electrical tests on other substrates have been completed through the test instructions generated previously. For example: after the test of one substrate is completed, the staff will first trigger the test end control displayed by the display component of the control host to generate an electrical test end instruction, and then operate the scanning component to scan the information of the next substrate to be tested.

[0121] In the above technical scheme, when the identification information sent by the scanning component is received, the corresponding processing method can be determined in combination with whether there is a substrate to be tested. In this way, when there is a substrate to be tested, the test of the current substrate to be tested can be ended first, and then the substrate corresponding to the identification information can be tested. This can help ensure the accuracy of the correspondence between the received electrical measurement data and the substrate, and further help to accurately count the electrical measurement conditions corresponding to different substrates.

[0122] For further reference, Figure 4Step 302, in the case where there is a substrate to be tested, generates an electrical test end instruction corresponding to the substrate to be tested, and generates an electrical test start instruction based on the identification information, including the following steps:

[0123] Step 401: when there is a substrate to be tested, determine whether the substrate to be tested is a double-sided substrate.

[0124] Among them, double-sided substrate refers to a substrate that needs to be electrically tested on both sides. Specifically, during the design of the substrate, considering factors such as space utilization and production convenience, the electrical test points of the FPC may be distributed on both sides of the substrate. Therefore, during the test process, both sides of the double-sided substrate need to be electrically tested.

[0125] Whether the substrate to be tested is a pre-set identification substrate can be obtained by querying the identification information.

[0126] Step 402 : if the substrate to be tested is not a double-sided substrate, generate an electrical test end instruction corresponding to the substrate to be tested, and generate an electrical test start instruction based on the identification information.

[0127] Step 403: When the substrate to be tested is a double-sided substrate, determine whether the identification information matches the substrate to be tested.

[0128] Specifically, for a double-sided substrate, both sides of the substrate are marked with corresponding marks, and the marking information corresponding to the marks corresponds to the substrate to be tested. In actual implementation, the marking information on different sides of the double-sided substrate is the same or different.

[0129] Correspondingly, determining whether the identification information matches the substrate to be tested includes: determining whether the identification information is the identification information corresponding to the substrate to be tested; if so, determining that the identification information matches the substrate to be tested; if not, determining that the identification information does not match the substrate to be tested.

[0130] Step 404 : if the identification information does not match the substrate to be tested, generate an electrical test end instruction corresponding to the substrate to be tested, and generate an electrical test start instruction based on the identification information.

[0131] Specifically, when the identification information does not match the substrate to be tested, it means that the test of the current substrate to be tested has been completed. At this time, the test of the current substrate to be tested can be ended and the test of the substrate corresponding to the identification information can be started.

[0132] In this embodiment, when the identification information matches the substrate to be tested, the steps of generating an electrical test end instruction corresponding to the substrate to be tested and generating an electrical test start instruction based on the identification information are not performed.

[0133] In the above embodiment, for a double-sided substrate, it is possible to verify whether the received identification information matches the substrate to be tested. In this way, the electrical measurement data of different sides can be automatically accumulated and counted during the electrical measurement of the double-sided substrate. This can help avoid the problem of comparison errors that are prone to occur when the electrical measurement data of different sides of the double-sided substrate are counted separately, thereby helping to improve the accuracy of missed detection judgments.

[0134] Based on the above technical solution, further reference is made to Figure 4 , step 403, after determining whether the identification information matches the substrate to be tested, further comprising:

[0135] Step 405 : When the identification information matches the substrate to be tested, a corresponding turning record of the substrate to be tested is recorded.

[0136] Specifically, the flip record is used to indicate whether the substrate under test flips during the electrical test. In this embodiment, when the identification information corresponding to the substrate under test is received during the electrical test of the substrate under test, it is determined that the substrate under test flips during the electrical test and the number of flips is recorded.

[0137] Accordingly, in the case where the substrate to be tested is a double-sided substrate, step 203, in response to the electrical test end instruction corresponding to the substrate to be tested, determines the number of valid records in the electrical test record, including the following steps:

[0138] Step 406 , in response to the electrical test end instruction corresponding to the substrate to be tested, determining whether the substrate to be tested is a double-sided substrate.

[0139] Optionally, when the substrate to be tested is not a double-sided substrate, step 408 is directly performed.

[0140] Step 407 : in the case that the substrate to be tested is a double-sided substrate, determining whether there is a corresponding turning record of the substrate to be tested.

[0141] Specifically, for double-sided substrates, since both sides must be electrically tested during the electrical testing process, in order to ensure the accuracy of the final missed test results and also to help reduce the amount of calculations in the missed test judgment process, it is necessary to first determine whether there is any missed test in the electrical testing process based on the flipping records before determining the number of valid electrical test records.

[0142] In this embodiment, when the substrate to be tested is not a double-sided substrate, it can be directly determined whether the identification information matches the substrate to be tested.

[0143] Step 408: if there is a flip record corresponding to the substrate to be tested, determine the number of valid records in the electrical test record.

[0144] Step 409 : when there is no corresponding flipping record of the substrate to be tested, directly determine that there is a missed test in the electrical testing process of the substrate to be tested.

[0145] Specifically, when there is no corresponding flip record of the substrate to be tested, it means that one side of the substrate to be tested has not been electrically tested. At this time, it is not necessary to determine the specific number of valid electrical tests and it can be directly determined that there are missed tests in the electrical test process.

[0146] In the above technical scheme, the turning records corresponding to the double-sided substrate are recorded during the electrical measurement process, and in the process of missed measurement judgment, it is first judged whether there is a turning record of the double-sided substrate, and it is directly determined that the double-sided substrate without a turning record has a missed measurement. This can ensure the accuracy of the final missed measurement result and also reduce the amount of calculation in the missed measurement judgment process.

[0147] In some embodiments, reference Figure 5 In step 206, after determining whether there is any missed test in the electrical test process of the substrate to be tested based on the matching relationship between the number of valid records after verification and the number of electrical tests required, the following steps are also included:

[0148] Step 501 : when it is determined that there is no missed test in the electrical test process of the substrate to be tested, the number of risk times is recorded.

[0149] Specifically, since standardized inspection operations usually do not trigger review operations, when a review operation is triggered and it is ultimately determined that there are no missed tests on the substrate to be tested, it indicates that there may be non-standard operations in the electrical testing process, which may also affect the accuracy of the electrical testing process. Therefore, it is necessary to count the non-standard operations through the number of risks.

[0150] Step 502, determining whether the number of risk occurrences is greater than a risk threshold.

[0151] The risk threshold may be preset, for example, the risk threshold is 5, or may be dynamically updated.

[0152] Optionally, when it is determined that there is a missed test in the electrical test process of the substrate to be tested, the risk number threshold is updated based on the current risk number, and the risk number is cleared. The method of updating the risk number threshold based on the current risk number can be to determine the current risk number as the risk number threshold, or to determine the average of the current risk number and the risk number threshold as the risk number threshold, or to determine whether the current risk number is less than the risk number threshold; if so, the risk number threshold is reduced by a preset amplitude (for example: 1); if not, the risk number threshold is increased by a preset amplitude.

[0153] Step 503: When the number of risk occurrences is greater than the risk threshold, the risk warning information corresponding to the electrical measurement component is output to prompt that there is a risk in the electrical measurement process.

[0154] In the above technical solution, since the number of times that it is determined that there is no missed measurement after retesting can be recorded, the irregular operations in the electrical measurement process can be counted, and when the number of risk times is greater than the risk number threshold, risk warning information can be output, which can help monitor and prompt the risks in the electrical measurement process, and further help improve the reliability of the electrical measurement results.

[0155] The present application also provides an electronic device. Figure 6 As shown, Figure 6 The electronic device 600 shown includes: a processor 601 and a memory 603. The processor 601 and the memory 603 are connected, such as through a bus 602. Optionally, the electronic device 600 may also include a transceiver 604. It should be noted that in actual applications, the transceiver 604 is not limited to one, and the structure of the electronic device 600 does not constitute a limitation on the embodiments of the present application.

[0156] Processor 601 may be a CPU (Central Processing Unit), a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It may implement or execute various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. Processor 601 may also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like.

[0157] The bus 602 may include a path to transmit information between the above components. The bus 602 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus. The bus 602 may be divided into an address bus, a data bus, etc. For ease of representation, Figure 6 Only one thick line is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0158] The memory 603 may be a ROM (Read Only Memory) or other types of static storage devices that can store static information and instructions, a RAM (Random Access Memory) or other types of dynamic storage devices that can store information and instructions, or an EEPROM (Electrically Erasable Programmable Read Only Memory), a disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store desired program codes in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto.

[0159] The memory 603 is used to store the application code for executing the solution of the present application, and the execution is controlled by the processor 601. The processor 601 is used to execute the application code stored in the memory 603 to implement the contents shown in the above method embodiment.

[0160] The electronic devices include, but are not limited to, mobile terminals such as mobile phones, laptop computers, PDAs (personal digital assistants), PADs (tablet computers), etc., and fixed terminals such as digital TVs, desktop computers, etc. It can also be a server terminal, etc. Figure 6 The electronic device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0161] It should be understood that although the steps in the flowchart of the accompanying drawings are shown in sequence according to the instructions of the arrows, these steps are not necessarily performed in the order indicated by the arrows. Unless otherwise clearly stated in this document, the execution of these steps is not strictly limited in order and can be performed in other orders.

[0162] The above are only some implementation methods of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. A FPC electrical testing method, characterized in that: In a control host for an FPC electrical measurement system, the electrical measurement system further comprises an electrical measurement component and a scanning component connected to the control host signal, the electrical measurement component is used to perform electrical measurement on the FPC, the scanning component is used to obtain identification information corresponding to a substrate, the substrate comprises at least two FPCs, and the method comprises: In response to the start electrical test instruction, determining the number of electrical tests required for the substrate to be tested based on the identification information sent by the scanning component; When receiving the electrical measurement data sent by the electrical measurement component, recording the electrical measurement record corresponding to the substrate to be measured; In response to an electrical test end instruction corresponding to the substrate to be tested, determining the number of valid records in the electrical test record; Determining whether the number of valid records matches the number of power measurement requirements; In the case where the number of valid records does not match the required number of power measurements, determining whether to review the number of valid records in the power measurement record; In the case where it is determined that the number of valid records in the electrical test record is to be reviewed, the number of valid records in the electrical test record is reviewed, and based on the matching relationship between the number of valid records after the review and the number of electrical tests required, it is determined whether there is a missed test in the electrical test process of the substrate to be tested; The determining the number of valid records in the electrical measurement records comprises: Determine, as invalid records, the electric measurement records whose corresponding recording time and the recording time corresponding to the previous electric measurement record have an interval time length less than an interval time length threshold, wherein the recording time is the time when the electric measurement data corresponding to the electric measurement record is received; The electrical measurement records that are not determined as invalid records among the electrical measurement records are determined as valid records.

2. The method according to claim 1, characterized in that The step of recording an electrical test record corresponding to the substrate to be tested includes: generating the electrical measurement record based on the electrical measurement data; Before determining the electrical measurement records that are not determined as invalid records among the electrical measurement records as valid records, the method further includes: For each of the electrical test records, determining whether the electrical test data corresponding to the electrical test record belongs to a preset valid range, wherein the valid range includes a data range corresponding to an FPC that passes the electrical test and a data range corresponding to an FPC that fails the electrical test; The electric measurement record whose corresponding electric measurement data does not belong to the valid range is determined as an invalid record.

3. The method according to claim 1, characterized in that The review of the number of valid records in the electrical measurement records includes: Determine, as retest records, the electric measurement records that are determined to be invalid records only because the interval between the corresponding recording time and the recording time corresponding to the previous electric measurement record is less than the interval time threshold; The retest record whose corresponding recording time and the recording time corresponding to the previous valid record have an interval time length greater than the interval time length threshold is determined as the valid record.

4. The method according to claim 1, characterized in that: The method further comprises: In response to the identification information sent by the scanning component, determining whether the substrate to be tested exists; In the case where the substrate to be tested exists, generating an electrical test end instruction corresponding to the substrate to be tested, and generating the electrical test start instruction based on the identification information, so as to re-determine the substrate to be tested based on the identification information; In the case that the substrate to be tested does not exist, the start electrical test instruction is generated based on the identification information, so as to determine the substrate to be tested based on the identification information.

5. The method according to claim 4, characterized in that The step of generating an electrical test end instruction corresponding to the substrate to be tested when the substrate to be tested exists, and generating the electrical test start instruction based on the identification information, comprises: In the case where the substrate to be tested exists, determining whether the substrate to be tested is a double-sided substrate; In the case where the substrate to be tested is not a double-sided substrate, generating an electrical test end instruction corresponding to the substrate to be tested, and generating the electrical test start instruction based on the identification information; In the case where the substrate to be tested is a double-sided substrate, determining whether the identification information matches the substrate to be tested; In the case that the identification information does not match the substrate to be tested, an electrical test end instruction corresponding to the substrate to be tested is generated, and the electrical test start instruction is generated based on the identification information.

6. The method according to claim 5, characterized in that After determining whether the identification information matches the substrate to be tested, the method further includes: When the identification information matches the substrate to be tested, recording a corresponding flipping record of the substrate to be tested; In response to the electrical test end instruction corresponding to the substrate to be tested, determining the number of valid records in the electrical test record includes: In response to an electrical test end instruction corresponding to the substrate to be tested, determining whether the substrate to be tested is a double-sided substrate; In the case where the substrate to be tested is a double-sided substrate, determining whether there is a corresponding flipping record of the substrate to be tested; In the case where there is a flip record corresponding to the substrate to be tested, determining the number of valid records in the electrical test record; In the case that there is no corresponding turning record of the substrate to be tested, it is directly determined that there is a missed test in the electrical testing process of the substrate to be tested.

7. The method according to claim 1, characterized in that After determining whether there is any missed test in the electrical test process of the substrate to be tested based on the matching relationship between the number of the verified valid records and the number of electrical tests required, the method further includes: When it is determined that there is no missed test in the electrical test process of the substrate to be tested, recording the number of risk times; Determining whether the number of risks is greater than a risk threshold; When the number of risk occurrences is greater than the risk threshold, risk warning information corresponding to the electrical measurement component is output to prompt that there is a risk in the electrical measurement process.

8. An FPC electrical testing system, characterized in that: The system includes a control host and an electrical measurement component and a scanning component connected to the control host by signal; The electrical testing component is used to perform electrical testing on the FPC; The scanning component is used to obtain identification information corresponding to the substrate, and the substrate includes at least two FPCs; The control host is used to execute the FPC electrical testing method according to any one of claims 1 to 7.

9. An electronic device, characterized in that: The electronic device comprises: at least one processor; Memory; At least one application, wherein the at least one application is stored in a memory and configured to be executed by at least one processor, and the at least one application is configured to: execute the FPC electrical testing method according to any one of claims 1 to 7.

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