Temperature control method and device, electronic equipment and storage medium

Abstract

The invention provides a temperature control method and device, electronic equipment and a storage medium, and the method comprises the steps: carrying out the test calculation of a test temperature control system, and obtaining test control parameters under different test temperature control data; analyzing the test temperature control data and the test control parameters to determine a first rule relationship between the test temperature control data and the test control parameters; determining a target control parameter corresponding to target temperature control data according to the first rule relationship and the target temperature control data required to be reached by the target temperature control system; and calculating a target control signal according to the target control parameter so as to adjust the target temperature control system based on the target control signal. The method is suitable for temperature regulation and control in a large temperature zone range, the balance between the temperature control rate and the temperature overshoot is achieved, the temperature control precision is improved, and meanwhile the control target is achieved more quickly.

Description

Technical Field

[0001] The present application relates to the field of temperature control technology, and in particular to a temperature control method, device, electronic device and storage medium. Background Art

[0002] The PID algorithm is widely used in various industrial control systems, such as temperature control, speed control, position control, etc., because of its simplicity, effectiveness and wide application range. For example, in temperature control, the PID algorithm can adjust the power of the heating or cooling equipment through proportional, integral and differential operations according to the error between the temperature value fed back by the temperature sensor and the set temperature value, so as to achieve the purpose of precise temperature control.

[0003] In the process that requires high-precision control, high-precision control is achieved by adjusting the control parameters of the PID model. When the temperature setting changes greatly, it is often difficult to balance the relationship between overshoot and rate: for the same set of PID parameters, at the same flow rate, when the set temperature is in the high temperature zone, the system shows temperature oscillation, and in the low temperature zone, the system shows that the adjustment speed is too slow; similarly, at the same set temperature, when the flow rate is large, the system shows slow adjustment speed, and when the flow rate is low, the system shows temperature oscillation. The introduction of more sensor variables is often easily restricted by the working conditions of the use site, and also increases more system uncertainties. Summary of the invention

[0004] In view of this, the purpose of the present application is to provide a temperature control method, device, electronic device and storage medium to overcome the problems in the prior art.

[0005] In a first aspect, an embodiment of the present application provides a temperature control method, which acts on a target temperature control system, wherein the target temperature control system implements temperature control based on a PID algorithm, and the method includes:

[0006] Perform test calculations on the test temperature control system to obtain test control parameters under different test temperature control data;

[0007] Determine a first regular relationship between the test temperature control data and the test control parameter by analyzing the test temperature control data and the test control parameter;

[0008] Determining a target control parameter corresponding to the target temperature control data according to the first regular relationship and the target temperature control data that the target temperature control system needs to achieve;

[0009] A target control signal is calculated according to the target control parameter, so as to adjust the target temperature control system based on the target control signal.

[0010] In some technical solutions of the present application, the target temperature control system includes a water pump and a compressor; the test temperature control data includes test temperature data and test flow rate data;

[0011] The step of analyzing the test temperature control data and the test control parameter to determine a first regular relationship between the test temperature control data and the test control parameter includes:

[0012] By analyzing the test temperature data, the test flow rate data and the test control parameter, a first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined.

[0013] In some technical solutions of the present application, the first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined by analyzing the test temperature data, the test flow rate data and the test control parameter, including:

[0014] Analyzing a second regular relationship between the test control parameter and the test temperature data under the same test flow rate data;

[0015] The second regular relationship under each of the test flow rate data is sorted to obtain the first regular relationship.

[0016] In some technical solutions of the present application, the above-mentioned target temperature control data includes target temperature data and target flow rate data;

[0017] The determining, according to the first regular relationship and the target temperature control data that the target temperature control system needs to achieve, a target control parameter corresponding to the target temperature control data includes:

[0018] Filtering out a third regular relationship corresponding to the target flow rate data from the second regular relationship;

[0019] The target temperature data is brought into the third regular relationship to determine the target control parameter corresponding to the target temperature data.

[0020] In some technical solutions of the present application, the above test calculation is performed on the test temperature control system to obtain the test control parameters under different test temperature control data, including:

[0021] Under a preset working mode, collecting a sampling temperature curve of the test temperature control system;

[0022] Based on the preset calculation method and the sampling temperature curve, the test control parameters under different test temperature control data are calculated.

[0023] In some technical solutions of the present application, the above-mentioned target control parameters include a target proportional parameter, a target integral parameter and a target differential parameter;

[0024] The step of calculating a target control signal according to the target control parameter, so as to adjust the target temperature control system based on the target control signal, comprises:

[0025] A target control signal is calculated according to the target proportional parameter and the error, the target integral parameter and the error integral, the target differential parameter and the rate of change of the error, so as to adjust the target temperature control system based on the target control signal.

[0026] In some technical solutions of the present application, the above error integral is obtained through fine-tuning, and the method obtains the error integral in the following manner:

[0027] The error integral is adjusted based on a fine-tuning term to obtain the adjusted error integral; wherein the fine-tuning term is obtained based on the error and an adjustment coefficient.

[0028] In a second aspect, an embodiment of the present application provides a temperature control device, which acts on a target temperature control system, wherein the target temperature control system implements temperature control based on a PID algorithm, and the device includes:

[0029] The test module is used to perform test calculations on the test temperature control system to obtain test control parameters under different test temperature control data;

[0030] An analysis module, configured to determine a first regular relationship between the test temperature control data and the test control parameter by analyzing the test temperature control data and the test control parameter;

[0031] a determination module, configured to determine a target control parameter corresponding to the target temperature control data according to the first regular relationship and the target temperature control data to be achieved by the target temperature control system;

[0032] A calculation module is used to calculate a target control signal according to the target control parameter, so as to adjust the target temperature control system based on the target control signal.

[0033] In a third aspect, an embodiment of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above-mentioned temperature control method when executing the computer program.

[0034] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the above-mentioned temperature control method are executed.

[0035] The technical solution provided by the embodiments of the present application may have the following beneficial effects:

[0036] The method of the present application includes performing test calculations on a test temperature control system to obtain test control parameters under different test temperature control data; determining a first regular relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters; determining a target control parameter corresponding to the target temperature control data according to the first regular relationship and the target temperature control data that the target temperature control system needs to achieve; calculating a target control signal according to the target control parameter to adjust the target temperature control system based on the target control signal. The present application is suitable for temperature control within a larger temperature range, achieving a balance between temperature control rate and temperature overshoot, improving temperature control accuracy, and achieving control goals faster.

[0037] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0039] Figure 1 A schematic flow chart of a temperature control method provided in an embodiment of the present application is shown;

[0040] Figure 2 A schematic diagram of a temperature curve provided in an embodiment of the present application is shown;

[0041] Figure 3 A schematic diagram of a temperature control device provided in an embodiment of the present application is shown;

[0042] Figure 4 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0043] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It should be understood that the drawings in the present application only serve the purpose of explanation and description and are not used to limit the scope of protection of the present application. In addition, it should be understood that the schematic drawings are not drawn in real proportion. The flowchart used in this application shows the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowchart can be implemented out of sequence, and the steps without logical context can be reversed in order or implemented simultaneously. In addition, those skilled in the art can add one or more other operations to the flowchart under the guidance of the content of the present application, or remove one or more operations from the flowchart.

[0044] In addition, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0045] It should be noted that the term "comprising" will be used in the embodiments of the present application to indicate the existence of the features declared thereafter, but does not exclude the addition of other features.

[0046] The PID algorithm is widely used in various industrial control systems, such as temperature control, speed control, position control, etc., because of its simplicity, effectiveness and wide application range. For example, in temperature control, the PID algorithm can adjust the power of the heating or cooling equipment through proportional, integral and differential operations according to the error between the temperature value fed back by the temperature sensor and the set temperature value, so as to achieve the purpose of precise temperature control.

[0047] In the process that requires high-precision control, high-precision control is achieved by adjusting the control parameters of the PID model. When the temperature setting changes greatly, it is often difficult to balance the relationship between overshoot and rate: for the same set of PID parameters, at the same flow rate, when the set temperature is in the high temperature zone, the system shows temperature oscillation, and in the low temperature zone, the system shows that the adjustment speed is too slow; similarly, at the same set temperature, when the flow rate is large, the system shows slow adjustment speed, and when the flow rate is low, the system shows temperature oscillation. The introduction of more sensor variables is often easily restricted by the working conditions of the use site, and also increases more system uncertainties.

[0048] Based on this, the embodiments of the present application provide a temperature control method, device, electronic device and storage medium, which are described below through embodiments.

[0049] Figure 1 A flow chart of a temperature control method provided in an embodiment of the present application is shown, wherein the target temperature control system is acted on, and the target temperature control system implements temperature control based on a PID algorithm. The method includes steps S101-S104; specifically:

[0050] S101, performing test calculation on the test temperature control system to obtain test control parameters under different test temperature control data;

[0051] S102, determining a first regular relationship between the test temperature control data and the test control parameter by analyzing the test temperature control data and the test control parameter;

[0052] S103, determining a target control parameter corresponding to the target temperature control data according to the first regular relationship and the target temperature control data to be achieved by the target temperature control system;

[0053] S104: Calculate a target control signal according to the target control parameter, so as to adjust the target temperature control system based on the target control signal.

[0054] The present application is suitable for temperature control within a larger temperature range, achieving a balance between temperature control rate and temperature overshoot, improving temperature control accuracy and achieving control goals faster.

[0055] Some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0056] The embodiment of the present application provides a method for temperature control, which acts on a target temperature control system, where the target temperature control system can be a liquid cooling system or a heating system, etc. In the actual target temperature control system, a water pump and a compressor are generally included in order to adjust the temperature. Temperature control is achieved based on the PID algorithm by controlling the flow of the liquid by the water pump and the temperature of the liquid by the compressor. In order to be able to control the temperature of the target temperature control system, the embodiment of the present application needs to perform test calculations on the test temperature control system. The test temperature control system here is determined according to the target temperature control system. That is, the models of the water pump and the compressor in the target temperature control system are included in the test temperature control system. In other words, the test temperature control system includes at least a water pump and a compressor of the same model as the target temperature control system. By testing the test temperature control system, the first regular relationship between the test temperature control data in the test temperature control system and the test control parameters is determined, and the target control parameters of the target temperature control system are determined by the first regular relationship.

[0057] For example, the first regular relationship may only include the regularity of the test control parameter a1, and the target control parameter a'1 may directly use the first regular relationship. The first regular relationship may also include the regularity of the test control parameter a1, the regularity of the test control parameter a2, and the regularity of the test control parameter a3. When the target control parameter a'1 uses the first regular relationship, it is necessary to first select the regularity of the test control parameter a1 corresponding thereto, and then use the regularity of the test control parameter a1.

[0058] When testing the test temperature control system, since the test temperature control system includes a water pump and a compressor, when testing the test temperature control data, the embodiment of the present application further divides the test temperature control data, that is, divides the test temperature control data into test temperature data and test flow rate data.

[0059] Furthermore, the first regular relationship between the test temperature control data and the test control parameter in the above method is the first regular relationship between the test control parameter and the test temperature data and the test flow rate data. Specifically, when determining the first regular relationship, the embodiment of the present application first analyzes the second regular relationship between the test control parameter and the test temperature data under the same test flow rate data; then sorts out the second regular relationship under each test flow rate data to obtain the first regular relationship.

[0060] In the specific implementation, the test temperature data and test flow rate data obtained by the embodiment of the present application are shown in Table 1 and Table 2:

[0061] Table 1

[0062] Temperature Zone P I D Temperature Zone P I D -20 <![CDATA[P -20,5 ]]> <![CDATA[I -20,5 ]]> <![CDATA[D -20,5 ]]> 40 <![CDATA[P 40,5 ]]> <![CDATA[I 40,5 ]]> <![CDATA[D -20,5 ]]> -10 <![CDATA[P -10,5 ]]> <![CDATA[I -10,5 ]]> <![CDATA[D -10,5 ]]> 50 <![CDATA[P 50,5 ]]> <![CDATA[I 50,5 ]]> <![CDATA[D 50,5 ]]> 0 <![CDATA[P 0,5 ]]> <![CDATA[I 0,5 ]]> <![CDATA[D 0,5 ]]> 60 <![CDATA[P 60,5 ]]> <![CDATA[I 60,5 ]]> <![CDATA[D 60,5 ]]> 10 <![CDATA[P 10,5 ]]> <![CDATA[I 10,5 ]]> <![CDATA[D 10,5 ]]> 70 <![CDATA[P 70,5 ]]> <![CDATA[I 70,5 ]]> <![CDATA[D 70,5 ]]> 20 <![CDATA[P 20,5 ]]> <![CDATA[I 20,5 ]]> <![CDATA[D 20,5 ]]> 80 <![CDATA[P 80,5 ]]> <![CDATA[I 80,5 ]]> <![CDATA[D 80,5 ]]> 30 <![CDATA[P 30,5 ]]> <![CDATA[I 30,5 ]]> <![CDATA[D 30,5 ]]> 90 <![CDATA[P 90,5 ]]> <![CDATA[I 90,5 ]]> <![CDATA[D 90,5 ]]>

[0063] Table 2

[0064] Temperature Zone P I D Temperature Zone P I D -20 <![CDATA[P -20,30 ]]> <![CDATA[I -20,30 ]]> <![CDATA[D -20,30 ]]> 40 <![CDATA[P 40,30 ]]> <![CDATA[I 40,30 ]]> <![CDATA[D -20,30 ]]> -10 <![CDATA[P -10,30 ]]> <![CDATA[I -10,30 ]]> <![CDATA[D -10,30 ]]> 50 <![CDATA[P 50,30 ]]> <![CDATA[I 50,30 ]]> <![CDATA[D 50,30 ]]> 0 <![CDATA[P 0,30 ]]> <![CDATA[I 0,30 ]]> <![CDATA[D 0,30 ]]> 60 <![CDATA[P 60,30 ]]> <![CDATA[I 60,30 ]]> <![CDATA[D 60,30 ]]> 10 <![CDATA[P 10,30 ]]> <![CDATA[I 10,30 ]]> <![CDATA[D 10,30 ]]> 70 <![CDATA[P 70,30 ]]> <![CDATA[I 70,30 ]]> <![CDATA[D 70,30 ]]> 20 <![CDATA[P 20,30 ]]> <![CDATA[I 20,30 ]]> <![CDATA[D 20,30 ]]> 80 <![CDATA[P 80,30 ]]> <![CDATA[I 80,30 ]]> <![CDATA[D 80,30 ]]> 30 <![CDATA[P 30,30 ]]> <![CDATA[I 30,30 ]]> <![CDATA[D 30,30 ]]> 90 <![CDATA[P 90,30 ]]> <![CDATA[I 90,30 ]]> <![CDATA[D 90,30 ]]>

[0065] Among them, Table 1 shows the test control parameters at different temperatures when the flow rate is 5 L / min, and Table 2 shows the test control parameters at different temperatures when the flow rate is 30 L / min. The test control parameters include the test proportional parameter (P), the test integral parameter (I) and the test differential parameter (D).

[0066] It should be noted that in the embodiment of the present application, the test control parameters at each temperature are obtained continuously, that is, the data between -20 and -10 in the above table has also been determined, but in order to determine a clearer regular relationship, the embodiment of the present application divides the continuous data. The specific division is based on the difference between the test control parameters at different temperatures and the preset difference threshold. By comparison, the embodiment of the present application chooses to divide the continuous temperature at intervals of 10°C. Then it is determined that the first regular relationship is a linear change relationship.

[0067] After the first regular relationship is determined, a target control parameter corresponding to the target temperature control data is determined according to the first regular relationship and the target temperature control data that the target temperature control system needs to achieve.

[0068] Since the target temperature control data in the embodiment of the present application includes target temperature data and target flow rate data, the above process of determining the target control parameters can be converted into selecting a third regular relationship corresponding to the target flow rate data from the second regular relationship; bringing the target temperature data into the third regular relationship to determine the target control parameters corresponding to the target temperature data.

[0069] For example, for the data in Table 1 and Table 2 above, when the target temperature data is -20°C and the target flow rate data is 20L / min, the target control parameters are calculated as follows:

[0070] The P parameter is calculated as follows:

[0071] P A =(P -20,30 -P -20,5 ) / (30-5);

[0072] P B =P -20，5 -P A *5;

[0073] P=P A *20L+P B ;

[0074] The I parameter is calculated as follows:

[0075] I A =(I -20,30 -I -20,5 ) / (30-5);

[0076] I B =I -20，5 -I A *5;

[0077] I=I A*20L+I B ;

[0078] The D parameter is calculated as follows:

[0079] D A =(D -20,30 -D -20,5 ) / (30-5);

[0080] D B =D -20，5 -D A *5;

[0081] D=D A *20L+D B .

[0082] After the target control parameters are obtained, the target control signal is calculated. sum ), the target differential parameter and the rate of change of the error, and calculate the target control signal.

[0083] Specifically, after calculating the PID parameters, PID calculation is performed, and the discretization formula is as follows:

[0084] OUT P =P*Δerr;

[0085]

[0086] When calculating the error integral, in order to achieve the anti-integral saturation function, a variable integral method is used: the error integral is adjusted based on a fine-tuning term to obtain the adjusted error integral; wherein the fine-tuning term is obtained based on the error and the adjustment coefficient.

[0087] Specifically, err sum =err sum +K*err;

[0088]

[0089] In an optional embodiment, when determining the test control parameters, in order to improve processing efficiency, the process of testing the test temperature control system is: under a preset working mode, collecting a sampling temperature curve of the test temperature control system; based on a preset calculation method and the sampling temperature curve, calculating the test control parameters under different test temperature control data.

[0090] Set the test temperature control system output to switch mode, that is, only output 0% and 100%. When the sampling value is lower than the set value, the refrigeration system outputs 0%, and the system sampling temperature will rise. When the sampling temperature exceeds the set value, the refrigeration system outputs 100%, and the system sampling temperature will drop. Repeat this several times to obtain the sampling temperature curve, such as Figure 2 shown.

[0091] According to the temperature curve, the oscillation period T can be obtained u , oscillation waveform amplitude A, output amplitude d.

[0092] The critical gain K can be obtained by the following formula C .

[0093]

[0094] The PID parameters are determined according to the Ziegle-Nichols algorithm.

[0095] Through the method in the embodiment of the present application, the accuracy of temperature control is improved: by setting the set values ​​of temperature and flow, and looking up the table to calculate the corresponding PID parameters, it can adapt well to large temperature range changes and large flow changes, and quickly obtain appropriate PID parameters. Enhanced system stability: through the anti-integral saturation function of the variable integral, the system output can reduce system overshoot in the case of large temperature changes and shorten the stabilization time. Improve the convenience of parameter adjustment: The function of parameter self-tuning can provide great convenience for debugging personnel, and does not require a lot of debugging experience. The system can automatically calculate the corresponding adaptive PID parameters, and the debugging personnel only need to make fine adjustments.

[0096] Figure 3 A schematic diagram of the structure of a temperature control device provided in an embodiment of the present application is shown, which acts on a target temperature control system, wherein the target temperature control system realizes temperature control based on a PID algorithm, and the device comprises:

[0097] The test module is used to perform test calculations on the test temperature control system to obtain test control parameters under different test temperature control data;

[0098] An analysis module, configured to determine a first regular relationship between the test temperature control data and the test control parameter by analyzing the test temperature control data and the test control parameter;

[0099] a determination module, configured to determine a target control parameter corresponding to the target temperature control data according to the first regular relationship and the target temperature control data to be achieved by the target temperature control system;

[0100] A calculation module is used to calculate a target control signal according to the target control parameter, so as to adjust the target temperature control system based on the target control signal.

[0101] The target temperature control system includes a water pump and a compressor; the test temperature control data includes test temperature data and test flow rate data;

[0102] The step of analyzing the test temperature control data and the test control parameter to determine a first regular relationship between the test temperature control data and the test control parameter includes:

[0103] By analyzing the test temperature data, the test flow rate data and the test control parameter, a first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined.

[0104] The first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined by analyzing the test temperature data, the test flow rate data and the test control parameter, including:

[0105] Analyze the second regular relationship between the test control parameter and the test temperature data under the same test flow rate data;

[0106] The second regular relationship under each of the test flow rate data is sorted to obtain the first regular relationship.

[0107] The target temperature control data includes target temperature data and target flow rate data;

[0108] The determining, according to the first regular relationship and the target temperature control data that the target temperature control system needs to achieve, a target control parameter corresponding to the target temperature control data includes:

[0109] Filtering out a third regular relationship corresponding to the target flow rate data from the second regular relationship;

[0110] The target temperature data is brought into the third regular relationship to determine the target control parameter corresponding to the target temperature data.

[0111] The test calculation is performed on the test temperature control system to obtain the test control parameters under different test temperature control data, including:

[0112] Under a preset working mode, collecting a sampling temperature curve of the test temperature control system;

[0113] Based on the preset calculation method and the sampling temperature curve, the test control parameters under different test temperature control data are calculated.

[0114] The target control parameters include a target proportional parameter, a target integral parameter and a target differential parameter;

[0115] The step of calculating a target control signal according to the target control parameter, so as to adjust the target temperature control system based on the target control signal, comprises:

[0116] A target control signal is calculated according to the target proportional parameter and the error, the target integral parameter and the error integral, the target differential parameter and the rate of change of the error, so as to adjust the target temperature control system based on the target control signal.

[0117] The error integral is obtained through fine-tuning and is obtained in the following manner:

[0118] The error integral is adjusted based on a fine-tuning term to obtain the adjusted error integral; wherein the fine-tuning term is obtained based on the error and an adjustment coefficient.

[0119] like Figure 4 As shown, an embodiment of the present application provides an electronic device for executing the temperature control method in the present application, the device includes a memory, a processor, a bus, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the temperature control method when executing the computer program.

[0120] Specifically, the above-mentioned memory and processor may be general-purpose memory and processor, which are not specifically limited here. When the processor runs the computer program stored in the memory, the above-mentioned temperature control method can be executed.

[0121] Corresponding to the temperature control method in the present application, an embodiment of the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the above-mentioned temperature control method are executed.

[0122] Specifically, the storage medium can be a general storage medium, such as a mobile disk, a hard disk, etc. When the computer program on the storage medium is run, the above-mentioned temperature control method can be executed.

[0123] In the embodiments provided in the present application, it should be understood that the disclosed systems and methods can be implemented in other ways. The system embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of systems or units, which can be electrical, mechanical or other forms.

[0124] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, and may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0125] In addition, each functional unit in the embodiments provided in the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0126] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0127] It should be noted that similar numbers and letters represent similar items in the following figures. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description and are not to be understood as indicating or implying relative importance.

[0128] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-mentioned embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-mentioned embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application. They should all be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. A temperature control method, characterized in that: Acting on a target temperature control system, the target temperature control system realizes temperature control based on a PID algorithm, the method comprising: Perform test calculations on the test temperature control system to obtain test control parameters under different test temperature control data; Determine a first regular relationship between the test temperature control data and the test control parameter by analyzing the test temperature control data and the test control parameter; Determining a target control parameter corresponding to the target temperature control data according to the first regular relationship and the target temperature control data that the target temperature control system needs to achieve; A target control signal is calculated according to the target control parameter, so as to adjust the target temperature control system based on the target control signal.

2. The method according to claim 1, characterized in that The target temperature control system includes a water pump and a compressor; the test temperature control data includes test temperature data and test flow rate data; The step of analyzing the test temperature control data and the test control parameter to determine a first regular relationship between the test temperature control data and the test control parameter includes: By analyzing the test temperature data, the test flow rate data and the test control parameter, a first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined.

3. The method according to claim 2, characterized in that The first regular relationship between the test control parameter and the test temperature data and the test flow rate data is determined by analyzing the test temperature data, the test flow rate data and the test control parameter, including: Analyze the second regular relationship between the test control parameter and the test temperature data under the same test flow rate data; The second regular relationship under each of the test flow rate data is sorted to obtain the first regular relationship.

4. The method according to claim 3, characterized in that The target temperature control data includes target temperature data and target flow rate data; The determining, according to the first regular relationship and the target temperature control data that the target temperature control system needs to achieve, a target control parameter corresponding to the target temperature control data includes: Filtering out a third regular relationship corresponding to the target flow rate data from the second regular relationship; The target temperature data is brought into the third regular relationship to determine the target control parameter corresponding to the target temperature data.

5. The method according to claim 1, characterized in that The test calculation is performed on the test temperature control system to obtain the test control parameters under different test temperature control data, including: Under a preset working mode, collecting a sampling temperature curve of the test temperature control system; Based on the preset calculation method and the sampling temperature curve, the test control parameters under different test temperature control data are calculated.

6. The method according to claim 1, characterized in that The target control parameters include a target proportional parameter, a target integral parameter and a target differential parameter; The step of calculating a target control signal according to the target control parameter, so as to adjust the target temperature control system based on the target control signal, comprises: A target control signal is calculated according to the target proportional parameter and the error, the target integral parameter and the error integral, the target differential parameter and the rate of change of the error, so as to adjust the target temperature control system based on the target control signal.

7. The method according to claim 6, characterized in that The error integral is obtained through fine-tuning, and the method obtains the error integral in the following manner: The error integral is adjusted based on a fine-tuning term to obtain the adjusted error integral; wherein the fine-tuning term is obtained based on the error and an adjustment coefficient.

8. A temperature control device, characterized in that: Acting on a target temperature control system, the target temperature control system realizes temperature control based on a PID algorithm, and the device comprises: The test module is used to perform test calculations on the test temperature control system to obtain test control parameters under different test temperature control data; An analysis module, configured to determine a first regular relationship between the test temperature control data and the test control parameter by analyzing the test temperature control data and the test control parameter; a determination module, configured to determine a target control parameter corresponding to the target temperature control data according to the first regular relationship and the target temperature control data to be achieved by the target temperature control system; A calculation module is used to calculate a target control signal according to the target control parameter, so as to adjust the target temperature control system based on the target control signal.

9. An electronic device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate via the bus, and when the machine-readable instructions are executed by the processor, the steps of the temperature control method as described in any one of claims 1 to 7 are performed.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the temperature control method according to any one of claims 1 to 7 are executed.

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