Test method and device, electronic equipment and storage medium

Abstract

The invention relates to a test method and device, electronic equipment and a storage medium. The method comprises the steps that based on log information of a target test item, a loss parameter of the target test item is determined, and the loss parameter is used for representing a loss value generated by physical connection between test equipment and tested equipment; determining a reference loss parameter; and determining a test result of the target test item based on the loss parameter and the reference loss parameter. According to the automatic testing mode, the loss parameter and the reference loss parameter are directly and automatically obtained, the testing result is determined, whether the loss parameter is abnormal or not can be found in time, potential problems in the testing process are intercepted in time, the shutdown risk caused by the potential problems is avoided, and compared with a manual testing mode, the testing time can be shortened, and the testing efficiency can be improved.

Description

Technical Field

[0001] The present disclosure relates to the field of testing technology, and in particular to a testing method, device, electronic equipment and storage medium. Background Art

[0002] During the equipment production process, the motherboard and other components used in the equipment need to be tested to ensure the quality of these components. The loss parameter is an important parameter in the test. The loss parameter is used to characterize the loss value caused by the physical connection between the test equipment and the tested component. Abnormal loss parameters indicate that accurate loss parameters are not used when testing the component. It may happen that there is no problem with the component itself, but the test equipment ultimately determines that there is a problem with the component based on the loss parameters and other test data, which leads to many problems such as reduced component yield.

[0003] In the related art, when testing the motherboard, the tester checks the CPK (Complex Process Capability index) of the test item from time to time, and then determines whether there is any abnormality in the loss parameter. This manual testing method is not intelligent enough and has poor real-time performance, making it difficult to detect abnormalities in the loss parameter in a timely manner. Summary of the invention

[0004] In order to overcome the problems existing in the related art, the present disclosure provides a testing method, a device, an electronic device and a storage medium.

[0005] According to a first aspect of an embodiment of the present disclosure, a testing method is provided, the method comprising:

[0006] Determine, based on the log information of the target test item, a loss parameter of the target test item, wherein the loss parameter is used to characterize a loss value generated by a physical connection between a test device and a device under test;

[0007] determining reference loss parameters;

[0008] Based on the loss parameter and the reference loss parameter, a test result of the target test item is determined.

[0009] In some embodiments, the reference loss parameter includes at least one of a first reference loss parameter, a second reference loss parameter, and a third reference loss parameter; and determining the reference loss parameter includes at least one of the following:

[0010] Determining a first reference loss parameter based on a plurality of first loss parameters when different test devices test a first test item, wherein the first test item and the target test item have the same format and the first test item and the target test item have the same frequency when tested;

[0011] Determining a second reference loss parameter based on a plurality of second loss parameters when a plurality of second test items are tested by the same test device, wherein the second test items are different in format from the target test items, and the second test items and the target test items have the same frequency when tested;

[0012] Based on a first preset relationship, a third reference loss parameter corresponding to each frequency of the target test item is determined, wherein the first preset relationship is a relationship between the frequency of the test item and the loss parameter.

[0013] In some embodiments, determining the test result of the target test item based on the loss parameter and the reference loss parameter includes:

[0014] Based on the reference loss parameter, determining a parameter range, wherein the parameter range includes the reference loss parameter;

[0015] When the loss parameter belongs to the parameter range, determining that the loss parameter is normal;

[0016] When the loss parameter does not fall within the parameter range, it is determined that the loss parameter is abnormal.

[0017] In some embodiments, after determining that the loss parameter is normal, the method further includes:

[0018] The loss parameter is adjusted so that the difference between the adjusted loss parameter and the reference loss parameter is reduced.

[0019] In some embodiments, after determining that the loss parameter is abnormal, the method further includes:

[0020] Prompt information is sent to the target device, where the prompt information is used to prompt the tested device corresponding to the target test item to perform fault repair.

[0021] In some embodiments, determining the loss parameter of the target test item based on the log information of the target test item includes:

[0022] Based on the log information, determining the process capability index of the target test item;

[0023] The loss parameter is determined based on the process capability index and a second preset relationship, wherein the second preset relationship is a relationship between the process capability index and the loss parameter.

[0024] In some embodiments, the method further comprises:

[0025] When the test equipment uses the same probe to test the target test item, based on the loss parameters of the target test item at multiple different times, the change information of the loss parameters is determined, and the change information is used to characterize the wear condition of the probe.

[0026] According to a second aspect of an embodiment of the present disclosure, a testing device is provided, the device comprising:

[0027] A parameter determination module is configured to determine a loss parameter of a target test item based on log information of the target test item, wherein the loss parameter is used to characterize a loss value generated by a physical connection between a test device and a device under test;

[0028] A reference parameter determination module, configured to determine a reference loss parameter;

[0029] The testing module is configured to determine a test result of the target test item based on the loss parameter and the reference loss parameter.

[0030] According to a third aspect of an embodiment of the present disclosure, there is provided an electronic device, including:

[0031] processor;

[0032] a memory for storing processor-executable instructions;

[0033] The processor is configured to execute the method as described in the first aspect of the embodiment of the present disclosure.

[0034] According to a fourth aspect of an embodiment of the present disclosure, a non-temporary computer-readable storage medium is provided. When instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to execute the method described in the first aspect of the embodiment of the present disclosure.

[0035] The above method of the present disclosure has the following beneficial effects:

[0036] The method provided by the embodiment of the present disclosure determines the loss parameter of the target test item based on the log information of the target test item, and the loss parameter is used to characterize the loss value generated by the physical connection between the test device and the device under test; determines the reference loss parameter; and determines the test result of the target test item based on the loss parameter and the reference loss parameter. This automatic testing method directly and automatically obtains the loss parameter and the reference loss parameter and determines the test result. It is more intelligent and can promptly detect whether the loss parameter is abnormal, thereby promptly intercepting potential problems in the test process and avoiding the risk of downtime caused by potential problems. Compared with manual testing methods, it can reduce test time and improve test efficiency.

[0037] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0039] Figure 1 is a flow chart of a testing method according to an exemplary embodiment;

[0040] Figure 2 is a flow chart showing another testing method according to an exemplary embodiment;

[0041] Figure 3 is a schematic diagram showing a testing method according to an exemplary embodiment;

[0042] Figure 4 is a flow chart showing a testing process according to an exemplary embodiment;

[0043] Figure 5 is a schematic diagram of a test curve according to an exemplary embodiment;

[0044] Figure 6 is a flow chart showing another testing process according to an exemplary embodiment;

[0045] Figure 7 is a schematic diagram of another test curve according to an exemplary embodiment;

[0046] Figure 8 is a flow chart showing another testing process according to an exemplary embodiment;

[0047] Fig. 9 is a schematic diagram of another test curve according to an exemplary embodiment;

[0048] Fig.10 is a schematic diagram of a loss parameter variation curve according to an exemplary embodiment;

[0049] Fig.11 is a block diagram of a testing device according to an exemplary embodiment;

[0050] Fig.12 It is a block diagram of an electronic device according to an exemplary embodiment. DETAILED DESCRIPTION

[0051] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are merely examples of devices and methods consistent with some aspects of the present invention as detailed in the appended claims.

[0052] In the related art, after the line calibration is completed on the production line of the tested device, the tester will check the CPK from time to time to determine whether there is a problem with the loss parameter. If the tester does not check the CPK, it will not be able to find the problem of the loss parameter, nor the potential problem of the tested device. When the tester does not check the CPK but the loss parameter is abnormal, a test error will occur, thereby reducing the yield of the tested device. There may also be some sudden failures, resulting in the inability to guarantee the production yield. The tested device can be a motherboard or a component in other devices.

[0053] For example, when manually testing the motherboard, during the loss parameter modification process, it takes about 4 minutes to analyze the log information and calculate the loss parameters, accounting for 80% of the entire modification time. In addition, the loss parameters of hundreds of test items need to be modified, and it takes 5 people to check for at least a week to ensure that there are no problems, which takes a long time. In addition, it is necessary to use the gold plate for inspection, which is done once a week and requires 2 people to work for half a day. If the inspection finds that there is a problem with the loss parameters, the loss parameters also need to be modified.

[0054] The disclosed embodiment provides an automatic testing method for the above-mentioned testing method, which directly and automatically obtains loss parameters and reference loss parameters and determines the test results. It can promptly detect whether the loss parameters are abnormal, thereby promptly intercepting potential problems in the testing process and avoiding the risk of downtime caused by potential problems. Compared with manual testing methods, it can reduce testing time and improve testing efficiency.

[0055] The method provided in the embodiments of the present disclosure may be executed by an electronic device, which may be a mobile phone, a tablet computer, a laptop computer, a server, or the like.

[0056] Figure 1 is a flow chart of a testing method according to an exemplary embodiment, which is executed by an electronic device, see Figure 1 , the method comprises the following steps:

[0057] Step S101 : determining a loss parameter of a target test item based on log information of the target test item, where the loss parameter is used to characterize a loss value generated by a physical connection between a test device and a device under test.

[0058] The target test item is one of the multiple test items of the device under test. The device under test can be a component in a device such as a motherboard or a chip. The test item is a function of the device under test when in use. For example, the test item is WiFi (Wireless Fidelity), Bluetooth, 5G and other functions. The loss parameter is used to characterize the loss value caused by the physical connection between the test device and the device under test. For example, if the test device is a test instrument and the device under test is a motherboard, the physical connection between the test device and the device under test is the connection line that physically connects the test instrument and the motherboard when the test instrument tests the motherboard.

[0059] The log information of the target test item includes test data recorded during the test process of the target test item, and the test data is used to characterize the test situation of the device under test.

[0060] Step S102, determining a reference loss parameter.

[0061] Among them, the reference loss parameter is the loss parameter when the test result of the test item is normal. The reference loss parameter can be a preset value or a value determined based on the loss parameter in the historical test process.

[0062] Step S103: determining the test result of the target test item based on the loss parameter and the reference loss parameter.

[0063] The loss parameter characterizes the test condition of the target test item during this test process, and the reference loss parameter characterizes the test condition when the test is normal during the test process. Therefore, based on the reference loss parameter and the loss parameter, it can be determined whether the target test item is normal this time, that is, the test result of the target test item can be determined, and the test result is used to characterize whether the loss parameter is normal.

[0064] The method provided by the embodiment of the present disclosure determines the loss parameter of the target test item based on the log information of the target test item; determines the reference loss parameter; and determines the test result of the target test item based on the loss parameter and the reference loss parameter. This automatic testing method is more intelligent, directly and automatically obtains the loss parameter and the reference loss parameter, and determines the test result. It can promptly detect whether the loss parameter is abnormal, thereby promptly intercepting potential problems in the test process and avoiding the risk of downtime caused by potential problems. Compared with manual testing methods, it can reduce test time and improve test efficiency.

[0065] Figure 2 is a flowchart of another testing method according to an exemplary embodiment, which is executed by an electronic device, see Figure 2 , the method comprises the following steps:

[0066] Step S201, determining the loss parameter of the target test item based on the log information of the target test item.

[0067] The log information of the target test item includes test data recorded during the test process of the target test item, and the test data is used to characterize the test situation of the device under test.

[0068] In some embodiments, a target test item is determined, and log information of the target test item is obtained from all log information, so that the log information of the target test item is used for subsequent processing without using all log information.

[0069] In some embodiments, based on the log information, the process capability index of the target test item is determined, and based on the process capability index and the second preset relationship, the loss parameter is determined. The process capability index indicates the degree to which the process capability meets the technical standards, and the second preset relationship is the relationship between the process capability index and the loss parameter. For example, the second preset relationship can be a preset function, and the variables in the preset function include the process capability index and the loss parameter. Substituting the process capability index into the preset function can obtain the loss parameter.

[0070] In the embodiment of the present disclosure, the process capability index is used to characterize whether the test result of the target test item is normal. However, if the test result is judged directly based on the process capability index, the tester needs to perform analysis. Therefore, in order to realize automatic testing, the loss parameter is determined based on the process capability index and the second preset relationship, so that the test result can be directly judged according to the loss parameter.

[0071] Step S202, determining a reference loss parameter.

[0072] Among them, the reference loss parameter is the loss parameter when the test result of the test item is normal. The reference loss parameter can be a preset value or a value determined based on the loss parameter in the historical test process.

[0073] In the disclosed embodiment, each test item has a corresponding standard and frequency, and any test equipment can be used to test the test item. Among them, the standard refers to the network standard used by the test item during the test process, for example, the network standard can be 4G, 5G or other network standards; the frequency refers to the frequency of the test item when transmitting data during the test process, and the same test item can correspond to multiple different frequencies, for example, the frequency of the test item can be 900Hz, 850Hz, 1KHz and other frequencies, and each test process is to test a frequency of the test item; the test equipment is a device used to test the test item, and the test equipment can be a machine, which can include probes and other components used to test the test item.

[0074] For the standard, frequency and test equipment, reference loss parameters corresponding to different standards, different frequencies and different test equipment can be obtained, and the reference loss parameters include at least one of a first reference loss parameter, a second reference loss parameter and a third reference loss parameter; determining the reference loss parameter includes at least one of the following:

[0075] The first type: determining a first reference loss parameter based on multiple first loss parameters when different test devices test the first test item. The first test item has the same format as the target test item, and the first test item and the target test item have the same frequency during testing. The first test item can be the target test item, or it can be another test item that is executed the same as the target test item and has the same frequency during testing. The multiple first loss parameters include loss parameters corresponding to different test devices. For different test devices, the line loss of the test devices is very small. Therefore, the difference between the loss parameters of different test devices when testing test items of the same format and the same frequency will also be very small. Therefore, the first reference loss parameter can characterize the loss parameter when the test result of the target test item is normal.

[0076] Optionally, multiple first loss parameters are averaged to obtain a first reference loss parameter.

[0077] The second type: determining the second reference loss parameter based on multiple second loss parameters when the same test device tests multiple second test items. The second test item is different from the target test item in format, and the second test item and the target test item have the same frequency during testing. The second test item may be a test item different from the target test item, and the multiple second loss parameters include loss parameters of different second test items at the same frequency. For test items of different formats, when the test equipment and frequency during testing are the same, the loss parameters corresponding to the test items of different formats are the same, and even if there are differences, the differences will be very small. Therefore, the difference between the loss parameters when the same test device tests test items of different formats and the same frequency will also be very small. Thus, the second reference loss parameter can characterize the loss parameter when the test result of the target test item is normal.

[0078] Optionally, multiple second loss parameters are averaged to obtain a second reference loss parameter.

[0079] The third type: Based on the first preset relationship, determine the third reference loss parameter corresponding to each frequency of the target test item. The first preset relationship is the relationship between the frequency of the test item and the loss parameter. The higher the frequency, the greater the line loss and the greater the loss parameter. The difference in loss parameters can be determined based on the difference in frequency, that is, there is a corresponding relationship between frequency and loss parameter. When the loss parameter corresponding to a certain frequency is abnormal during the test, the frequency and the loss parameter do not satisfy the corresponding relationship, that is, they do not satisfy the first preset relationship. Therefore, for a certain frequency of the target test item, the third reference loss parameter can characterize the loss parameter when the test result of the target test item at this frequency is normal.

[0080] Step S203: determining a parameter range based on the reference loss parameter, where the parameter range includes the reference loss parameter.

[0081] The parameter loss parameter is any parameter in the parameter range. For example, the reference loss parameter can be the maximum value, minimum value or middle value in the parameter range.

[0082] In some embodiments, the middle value of the parameter range is the reference loss parameter. Optionally, a preset value is obtained, the maximum value of the parameter range is the sum of the reference loss parameter and the preset value, and the minimum value of the parameter range is the difference between the reference loss parameter and the preset value.

[0083] Optionally, for the first case above, based on multiple first loss parameters, the standard deviations of multiple first loss parameters are calculated, the maximum value of the parameter range is the sum of the first reference loss parameter and 3 times the standard deviation, and the minimum value of the parameter range is the difference between the first reference loss parameter and 3 times the standard deviation. Similarly, for the second case above, based on multiple second loss parameters, the standard deviations of multiple second loss parameters are calculated, the maximum value of the parameter range is the sum of the second reference loss parameter and 3 times the standard deviation, and the minimum value of the parameter range is the difference between the second reference loss parameter and 3 times the standard deviation.

[0084] Of course, other methods may also be used to determine a parameter range with the reference loss parameter as the intermediate value based on the reference loss parameter.

[0085] Step S204: When the loss parameter falls within the parameter range, it is determined that the loss parameter is normal.

[0086] When the loss parameter falls within the parameter range, it indicates that the loss parameter is reasonable and will not affect the judgment of potential problems in the test process or cause a decrease in the yield of the tested device.

[0087] Step S205, adjusting the loss parameter so that the difference between the adjusted loss parameter and the reference loss parameter is reduced.

[0088] When the loss parameter is not the reference loss parameter, the loss parameter has not reached the most standard situation. In order to make subsequent tests more accurate and further improve the accuracy of the test, the loss parameter can be automatically adjusted to reduce the difference between the adjusted loss parameter and the reference loss parameter. Optionally, the loss parameter is directly adjusted to the reference loss parameter.

[0089] Step S206: When the loss parameter does not fall within the parameter range, it is determined that the loss parameter is abnormal.

[0090] When the loss parameter does not fall within the parameter range, it means that the loss parameter is unreasonable and abnormal, and this abnormality is difficult to fix by adjusting the loss parameter.

[0091] Step S207: Send prompt information to the target device, where the prompt information is used to prompt the tested device corresponding to the target test item to perform fault repair.

[0092] In the disclosed embodiment, a prompt message is sent to a target device, which is a device that can be viewed by the tester, for example, the target device is a mobile phone, computer, etc. of the tester, and the prompt message is used to prompt the tester that the tested device corresponding to the target test item may have a fault and needs to be repaired. Optionally, the prompt message is sent to the target device via SMS, email, or application notification. For the tester, after receiving the prompt message, the tester can perform fault detection and troubleshooting.

[0093] In some embodiments, failure information and repair information during the testing process are recorded.

[0094] The automatic testing method provided by the embodiment of the present disclosure directly and automatically obtains loss parameters and reference loss parameters, and determines the test results. It can promptly detect whether the loss parameters are abnormal, thereby promptly intercepting potential problems in the test process and avoiding the risk of downtime caused by potential problems. Compared with manual testing methods, it can reduce testing time and improve testing efficiency.

[0095] Moreover, when the test result indicates that the loss parameter is normal, the loss parameter can be further adjusted to obtain a better loss parameter. When the test result indicates that the loss parameter is abnormal, a prompt message can be sent to the target device so that the tester can manually repair the fault. This combination of automatic adjustment of loss parameters and manual repair can not only reduce the test time, reduce the time for abnormality investigation, and improve the efficiency of loss parameter modification, but also timely perform manual repair on faults that cannot be automatically repaired.

[0096] For the three reference loss parameters proposed in step S202 above, in some embodiments, the test method is as follows: Figure 3, obtain loss parameters; then, compare loss parameters for the same standard, the same frequency, and different test equipment, and determine the first test result based on the loss parameters and the first reference loss parameters; compare loss parameters for the same standard, the same test equipment, and different frequencies, that is, determine the second test result based on the loss parameters and the third reference loss parameters; compare loss parameters for the same test equipment, the same frequency, and different standards, that is, determine the third test result based on the loss parameters and the second reference loss parameters; finally, issue an early warning or adjust the loss parameters based on the three test results. Among them, the early warning refers to sending a prompt message to the target device.

[0097] In one example, the reference loss parameter is a first reference loss parameter, see Figure 4 The test process shown is to obtain the loss parameter based on the log information; obtain multiple first loss parameters, calculate the average value of the multiple first loss parameters, and the average value ±3σ is a reasonable parameter range; determine whether the loss parameter exceeds the parameter range; if the loss parameter does not exceed the parameter range, determine that the loss parameter is normal; if the loss parameter exceeds the parameter range, determine that the loss parameter is abnormal, and notify the engineer (tester) by phone or text message, that is, send a prompt message to the target device; the engineer troubleshoots and repairs the fault; record the fault information and repair information.

[0098] For example, when the reference loss parameter is the first reference loss parameter, see Figure 5 In the test curve shown, the horizontal axis represents the machine and the vertical axis represents the loss parameter. Figure 5 Curve 1 and curve 2 in the figure are the maximum and minimum values ​​in the parameter range respectively, and curve 3 is the loss parameter when the test items of the same standard and the same frequency are tested on different machines. Figure 5 It can be seen that when the loss parameter is greater than the maximum value, an early warning is issued.

[0099] In one example, the reference loss parameter is a second reference loss parameter, see Figure 6 The test process shown is as follows: based on the log information, a loss parameter is obtained; multiple second loss parameters are obtained, and the average values ​​of the multiple second loss parameters are calculated, and the average value ±3σ is a reasonable parameter range; it is determined whether the loss parameter exceeds the parameter range; if the loss parameter does not exceed the parameter range, the loss parameter is determined to be normal; if the loss parameter exceeds the parameter range, the loss parameter is determined to be abnormal, and the engineer (tester) is notified by phone or text message, that is, a prompt message is sent to the target device; the engineer troubleshoots and repairs the fault; and the fault information and repair information are recorded.

[0100] For example, when the reference loss parameter is the second reference loss parameter, see Figure 7 The test curve shown, the horizontal axis represents the standard, the vertical axis represents the loss parameter, Figure 7 The circles, squares, and triangles in the figure represent the loss parameters corresponding to different systems. Figure 7 In the example, the loss parameters corresponding to the test items of different standards at frequency 1 are the same, the loss parameters corresponding to the test items of different standards at frequency 2 are not completely the same, but the difference is small, the loss parameters corresponding to the test items of different standards at frequency 3 are the same, and the loss parameters corresponding to the test items of different standards at frequency 4 are different, and the difference is large. Then, from Figure 7 It can be seen that at frequency 4, the corresponding loss parameters of different standards are quite different, and the loss parameters may be abnormal.

[0101] In one example, the reference loss parameter is a third reference loss parameter, see Figure 8 The test process shown is as follows: based on the log information, the loss parameter is obtained; based on the functional relationship between the frequency and the loss parameter, the third reference loss parameter is determined, and the third loss parameter ±3σ is a reasonable parameter range; it is determined whether the loss parameter exceeds the parameter range; if the loss parameter does not exceed the parameter range, the loss parameter is determined to be normal; if the loss parameter exceeds the parameter range, the loss parameter is determined to be abnormal, and the engineer (tester) is notified by phone or text message, that is, a prompt message is sent to the target device; the engineer troubleshoots and repairs the fault; and the fault information and repair information are recorded.

[0102] For example, when the reference loss parameter is the third reference loss parameter, see Fig. 9 In the test curve shown, the horizontal axis represents the frequency and the vertical axis represents the loss parameter. Fig. 9 Curve 1 and curve 2 are the maximum and minimum values ​​in the parameter range respectively, and curve 3 is the loss parameter when the test items of the same standard and the same machine are tested at different frequencies. Fig. 9 It can be seen that the larger the frequency, the larger the loss parameter.

[0103] In addition, the test equipment uses a probe to test the device under test. The probe is the contact medium for electrical testing. As the use time increases, the wear of the probe will become more and more serious, and the wear of the probe will affect the test results. In some embodiments, when the test equipment uses the same probe to test the target test item, based on the loss parameters of the target test item at multiple different times, the change information of the loss parameter is determined. Among them, the change information is used to characterize the wear of the probe, and the change information is in the form of a loss parameter change curve or table. Optionally, since the loss parameters corresponding to different frequencies are different, when determining the change information, it is necessary to keep the frequency of the test unchanged, that is, based on the loss parameters of the target test item at the same frequency at multiple different times, the change information of the loss parameter is determined.

[0104] For example, see Fig.10The loss parameter change curve shown in the figure shows that the loss parameter becomes smaller and smaller as time goes by. In order to make the test more accurate, the loss parameter needs to be as close to the reference loss parameter as possible. Therefore, as the loss parameter decreases, the compensation value of the loss parameter will become larger and larger. The compensation value of the loss parameter refers to the value used to adjust the loss parameter.

[0105] In the related art, CPK cannot reflect the wear condition of the probe, but the embodiment of the present disclosure can use the change information of statistical loss parameters to reflect the wear condition of the probe, thereby realizing the monitoring of the probe life. When the probe is severely worn, the probe can be replaced in time to avoid the influence of probe wear on the test results.

[0106] Fig.11 is a block diagram of a test device according to an exemplary embodiment, which is configured in an electronic device, see Fig.11 , the device comprises:

[0107] The parameter determination module 1101 is configured to determine the loss parameter of the target test item based on the log information of the target test item, where the loss parameter is used to characterize the loss value generated by the physical connection between the test device and the device under test;

[0108] A reference parameter determination module 1102 is configured to determine a reference loss parameter;

[0109] The testing module 1103 is configured to determine the test result of the target test item based on the loss parameter and the reference loss parameter.

[0110] In some embodiments, the reference loss parameter includes at least one of a first reference loss parameter, a second reference loss parameter, and a third reference loss parameter; the reference parameter determination module 1102 is configured to perform at least one of the following:

[0111] Determine a first reference loss parameter based on a plurality of first loss parameters when different test devices test a first test item, the first test item and a target test item having the same format, and the first test item and the target test item having the same frequency during testing;

[0112] Determining a second reference loss parameter based on a plurality of second loss parameters when a plurality of second test items are tested by the same test device, wherein the second test items are different in format from the target test items, and the second test items and the target test items have the same frequency when tested;

[0113] Based on a first preset relationship, a third reference loss parameter corresponding to each frequency of the target test item is determined, where the first preset relationship is a relationship between the frequency of the test item and the loss parameter.

[0114] In some embodiments, the testing module 1103 is configured to:

[0115] Based on the reference loss parameter, determining a parameter range, the parameter range including the reference loss parameter;

[0116] When the loss parameter falls within the parameter range, it is determined that the loss parameter is normal;

[0117] When the loss parameter does not fall within the parameter range, it is determined that the loss parameter is abnormal.

[0118] In some embodiments, the testing module 1103 is further configured to:

[0119] The loss parameter is adjusted so that the difference between the adjusted loss parameter and the reference loss parameter decreases.

[0120] In some embodiments, the testing module 1103 is further configured to:

[0121] Send a prompt message to the target device, where the prompt message is used to prompt the tested device corresponding to the target test item to perform fault repair.

[0122] In some embodiments, the parameter determination module 1101 is configured to:

[0123] Determine the process capability index of the target test item based on the log information;

[0124] Based on the process capability index and the second preset relationship, the loss parameter is determined, and the second preset relationship is the relationship between the process capability index and the loss parameter.

[0125] In some embodiments, the apparatus further comprises:

[0126] The change information determination module is configured to determine the change information of the loss parameters based on the loss parameters of the target test item at multiple different times when the test equipment uses the same probe to test the target test item. The change information is used to characterize the wear of the probe.

[0127] Regarding the device in the above embodiment, the specific manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be elaborated here.

[0128] An embodiment of the present disclosure further provides an electronic device, comprising: a processor; and a memory for storing instructions executable by the processor; wherein the processor is configured to execute the test method in the above embodiment.

[0129] Fig.12 is a block diagram of an electronic device 1200 according to an exemplary embodiment.

[0130] Reference Fig.12, the electronic device 1200 may include one or more of the following components: a processing component 1202 , a memory 1204 , a power component 1206 , a multimedia component 1208 , an audio component 1210 , an input / output (I / O) interface 1212 , a sensor component 1214 , and a communication component 1216 .

[0131] The processing component 1202 generally controls the overall operation of the electronic device 1200, such as operations associated with display, phone calls, data communications, camera operations, and recording operations. The processing component 1202 may include one or more processors 1220 to execute instructions to complete all or part of the steps of the above-mentioned method. In addition, the processing component 1202 may include one or more modules to facilitate the interaction between the processing component 1202 and other components. For example, the processing component 1202 may include a multimedia module to facilitate the interaction between the multimedia component 1208 and the processing component 1202.

[0132] The memory 1204 is configured to store various types of data to support operations on the electronic device 1200. Examples of such data include instructions for any application or method operating on the electronic device 1200, contact data, phone book data, messages, pictures, videos, etc. The memory 1204 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0133] The power supply component 1206 provides power to the various components of the electronic device 1200. The power supply component 1206 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power to the electronic device 1200.

[0134] The multimedia component 1208 includes a screen that provides an output interface between the electronic device 1200 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundaries of the touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 1208 includes a front camera and / or a rear camera. When the electronic device 1200 is in an operating mode, such as a shooting mode or a video mode, the front camera and / or the rear camera may receive external multimedia data. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

[0135] The audio component 1210 is configured to output and / or input audio signals. For example, the audio component 1210 includes a microphone (MIC), and when the electronic device 1200 is in an operation mode, such as a call mode, a recording mode, and a speech recognition mode, the microphone is configured to receive an external audio signal. The received audio signal can be further stored in the memory 1204 or sent via the communication component 1216. In some embodiments, the audio component 1210 also includes a speaker for outputting audio signals.

[0136] I / O interface 1212 provides an interface between processing component 1202 and peripheral interface modules, such as keyboards, click wheels, buttons, etc. These buttons may include but are not limited to: a home button, a volume button, a start button, and a lock button.

[0137] The sensor assembly 1214 includes one or more sensors for providing various aspects of status assessment for the electronic device 1200. For example, the sensor assembly 1214 can detect the open / closed state of the electronic device 1200, the relative positioning of components, such as the display and keypad of the electronic device 1200, and the sensor assembly 1214 can also detect the position change of the electronic device 1200 or a component of the electronic device 1200, the presence or absence of user contact with the electronic device 1200, the orientation or acceleration / deceleration of the electronic device 1200, and the temperature change of the electronic device 1200. The sensor assembly 1214 may include a proximity sensor configured to detect the presence of a nearby object without any physical contact. The sensor assembly 1214 may also include an optical sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 1214 may also include an accelerometer, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0138] The communication component 1216 is configured to facilitate wired or wireless communication between the electronic device 1200 and other devices. The electronic device 1200 can access a wireless network based on a communication standard, such as WiFi, 2G or 3G, or a combination thereof. In an exemplary embodiment, the communication component 1216 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 1216 also includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology and other technologies.

[0139] In an exemplary embodiment, the electronic device 1200 may be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to perform the above methods.

[0140] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 1204 including instructions, and the instructions can be executed by a processor 1220 of the electronic device 1200 to perform the above method. For example, the non-transitory computer-readable storage medium can be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0141] The embodiments of the present disclosure also provide a non-temporary computer-readable storage medium. When the instructions in the storage medium are executed by a processor of an electronic device, the electronic device can execute the test method in the above embodiment.

[0142] Those skilled in the art will readily appreciate other embodiments of the present invention after considering the specification and practicing the invention disclosed herein. This application is intended to cover any variations, uses or adaptations of the present invention that follow the general principles of the present invention and include common knowledge or customary techniques in the art that are not disclosed in this disclosure. The specification and examples are to be considered exemplary only, and the true scope and spirit of the present invention are indicated by the following claims.

[0143] It should be understood that the present invention is not limited to the exact construction that has been described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present invention is limited only by the appended claims.

Claims

1. A testing method, characterized in that: The method comprises: Determine, based on the log information of the target test item, a loss parameter of the target test item, wherein the loss parameter is used to characterize a loss value generated by a physical connection between a test device and a device under test; determining reference loss parameters; Based on the loss parameter and the reference loss parameter, a test result of the target test item is determined.

2. The method according to claim 1, characterized in that The reference loss parameter includes at least one of a first reference loss parameter, a second reference loss parameter, and a third reference loss parameter; and the determining of the reference loss parameter includes at least one of the following: Determining a first reference loss parameter based on a plurality of first loss parameters when different test devices test a first test item, wherein the first test item and the target test item have the same format and the first test item and the target test item have the same frequency when tested; Determining a second reference loss parameter based on a plurality of second loss parameters when a plurality of second test items are tested by the same test device, wherein the second test items are different in format from the target test items, and the second test items and the target test items have the same frequency when tested; Based on a first preset relationship, a third reference loss parameter corresponding to each frequency of the target test item is determined, wherein the first preset relationship is a relationship between the frequency of the test item and the loss parameter.

3. The method according to claim 1 or 2, characterized in that: The determining, based on the loss parameter and the reference loss parameter, a test result of the target test item includes: Based on the reference loss parameter, determining a parameter range, wherein the parameter range includes the reference loss parameter; When the loss parameter belongs to the parameter range, determining that the loss parameter is normal; When the loss parameter does not fall within the parameter range, it is determined that the loss parameter is abnormal.

4. The method according to claim 3, characterized in that After determining that the loss parameter is normal, the method further includes: The loss parameter is adjusted so that the difference between the adjusted loss parameter and the reference loss parameter is reduced.

5. The method according to claim 3, characterized in that: After determining that the loss parameter is abnormal, the method further includes: Prompt information is sent to the target device, where the prompt information is used to prompt the tested device corresponding to the target test item to perform fault repair.

6. The method according to claim 1, characterized in that The determining the loss parameter of the target test item based on the log information of the target test item includes: Based on the log information, determining the process capability index of the target test item; The loss parameter is determined based on the process capability index and a second preset relationship, wherein the second preset relationship is a relationship between the process capability index and the loss parameter.

7. The method according to claim 1, characterized in that The method further comprises: When the test equipment uses the same probe to test the target test item, based on the loss parameters of the target test item at multiple different times, change information of the loss parameters is determined, and the change information is used to characterize the wear condition of the probe.

8. A testing device, characterized in that: The device comprises: A parameter determination module is configured to determine a loss parameter of a target test item based on log information of the target test item, wherein the loss parameter is used to characterize a loss value generated by a physical connection between a test device and a device under test; A reference parameter determination module, configured to determine a reference loss parameter; The testing module is configured to determine a test result of the target test item based on the loss parameter and the reference loss parameter.

9. An electronic device, characterized in that: include: processor; a memory for storing processor-executable instructions; The processor is configured to execute the method as claimed in any one of claims 1 to 7.

10. A non-transitory computer-readable storage medium, characterized in that: When the instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to execute the method as claimed in any one of claims 1 to 7.

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