A device and method for measuring width of substrate glass plate

Abstract

The present invention provides a device and method for measuring the width of a substrate glass plate, belonging to the technical field of glass plate width measurement, comprising a chopping board mechanism, wherein a left end scale and a right end scale are respectively installed at two ends of the front of the chopping board mechanism, and a chopping board strip is also installed at the front of the chopping board mechanism, the chopping board strip is bonded with the substrate glass, the starting scale to the last scale of the left end scale is from left to right, and the starting scale to the last scale of the right end scale is from right to left; the present invention can accurately and quickly measure the plate width value without directly contacting the substrate glass, while meeting the accuracy of the detection, avoiding product waste and improving the yield rate; and the measurement method using the device can be independently completed by only one person, while improving the yield rate and the work efficiency; at the same time, it can also enhance the safety factor and reduce potential safety risks.

Description

Technical Field

[0001] The present invention relates to the technical field of glass plate width measurement, and in particular to a device and method for measuring the width of a substrate glass plate. Background Art

[0002] Glass substrate is a basic component of liquid crystal display devices. It is a thin glass sheet with an extremely flat surface. The main thickness of the glass substrate is 0.5 mm, and it is about to enter the process of thinner thickness (such as 0.4 mm).

[0003] Among the mature technical methods for substrate glass production, the overflow down-pull method has the highest production efficiency and is relatively mature. However, this technology has very high requirements on the process and production equipment. The surface process requirements of the substrate glass are that both cross-cutting and longitudinal cutting are effective surfaces, and no scratches or other defects can occur.

[0004] When measuring the width of the plate, the current measurement method requires direct contact with the substrate glass and manual measurement, that is, using a tape measure to measure horizontally at the lower edge of the glass plate after cross-cutting. Manual measurement with a tape measure will directly contact the glass plate, causing the risk of scratching the product and causing product loss. In addition, the current measurement method requires two people to perform it at the same time, and errors are inevitable in the measurement results. It is unavoidable that the product will be scratched or scratched, resulting in product waste and reduced production capacity. There are also certain safety risks, such as burns and scratches. Summary of the invention

[0005] The purpose of the present invention is to provide a device and method for measuring the width of a substrate glass plate, so as to overcome the problems existing in the prior art. The present invention can accurately and quickly measure the plate width value without directly contacting the substrate glass, thereby meeting the accuracy of the detection and avoiding product waste, thereby improving the yield rate; and the measurement method using the device can be completed independently by only one person, thereby improving the yield rate and the work efficiency; at the same time, it can also enhance the safety factor and reduce potential safety risks.

[0006] In order to achieve the above object, the technical solution adopted by the present invention is as follows: A device for measuring the width of a substrate glass plate comprises an anvil mechanism, a left end scale and a right end scale are respectively installed at two ends of the front of the anvil mechanism, an anvil strip is also installed at the front of the anvil mechanism, and the substrate glass is attached to the anvil strip; The starting scale to the last scale of the left end scale is from left to right, and the starting scale to the last scale of the right end scale is from right to left.

[0007] Further, the anvil mechanism comprises an upper anvil, the bottom of the upper anvil is connected to a raised anvil, and the bottom of the raised anvil is connected to a lower anvil; Furthermore, a slot is formed at the front of the raised cutting board, and the cutting board strip is installed in the slot; Furthermore, the left end scale and the right end scale are respectively mounted on the two ends of the front part of the upper chopping board; A method for measuring the width of a substrate glass plate, based on the above-mentioned device for measuring the width of a substrate glass plate, comprises the following steps: Step 1: Measure the distance between the left and right scales on the chopping block mechanism, recorded as L; Step 2: Lay the substrate glass on the front of the cutting board, and read the lengths displayed by the left and right scales on the cutting board mechanism, respectively, and record them as L1 and L2; Step 3: Calculate the width L3 of the substrate glass using L obtained in step 1 and L1 and L2 obtained from S2.

[0008] Furthermore, L in the step 1 is specifically: the distance between the starting scale of the left end scale and the starting scale of the right end scale; Further, said L>L3; Furthermore, L1 in the step 2 is specifically: the length from the starting scale of the left end scale to the left edge of the substrate glass; Furthermore, L2 in the step 2 is specifically: the length from the starting scale of the right end scale to the right edge of the substrate glass; Furthermore, the calculation formula in step three is: L3=L-L1-L2.

[0009] The above technical solution has the following advantages or beneficial effects: The present invention provides a device for measuring the width of a substrate glass plate. By installing scales at the two ends of the front of an anvil mechanism respectively, the substrate glass is attached to the anvil strip, so that a worker can intuitively read the data on the two scales and calculate the plate width of the substrate glass without directly contacting the substrate glass. The anvil strip can ensure the stability of the measurement. At the same time, the distance between the scales can be selected and adjusted according to actual needs to meet the measurement requirements of substrate glasses of different widths. In addition, by setting the starting scale to the last scale of the scales at the two ends to be from left to right and from right to left respectively, it is possible to facilitate reading of values ​​and prevent reading deviations.

[0010] Furthermore, the raised anvil can isolate the substrate glass from the scale to prevent the scale from directly contacting the substrate glass. At the same time, the raised anvil can provide a stable supporting surface so that the substrate glass can remain horizontal during measurement, avoiding measurement errors caused by unevenness.

[0011] Furthermore, by installing the anvil strip in the slot of the raised anvil, a secure connection between the anvil strip and the anvil mechanism can be ensured, thereby avoiding possible loosening or displacement of the anvil strip during use, thereby improving the accuracy and stability of the measurement.

[0012] Furthermore, the left end scale and the right end scale are directly installed on the front ends of the upper anvil, so that the staff does not need to move or adjust the measuring tool when measuring the width of the substrate glass plate, thereby improving the convenience and efficiency of the measurement.

[0013] The present invention provides a method for measuring the width of a substrate glass plate. In actual production, when a cutting board mechanism is close to the substrate glass and is bonded to the substrate glass, data on two scales can be read intuitively without directly contacting the substrate glass. By calculation, the width of the glass plate can be accurately known, thereby avoiding the occurrence rate of scratches and can greatly improve the product yield. Moreover, the entire process can be completed independently by only one person, thereby improving the yield rate and the work efficiency. At the same time, the safety factor can be enhanced and potential safety risks can be reduced.

[0014] Furthermore, by ensuring that L is greater than L3, it can be ensured that the measuring device can accommodate and accurately measure the plate width dimension of the substrate glass.

[0015] Furthermore, by directly reading the scale values ​​corresponding to the edges of the substrate glass on the left and right scales, the difference between the distance between the left and right scales and the width of the substrate glass can be obtained, thereby facilitating the acquisition of the width of the substrate glass.

[0016] Furthermore, by calculating the width of the substrate glass, damage to the substrate glass caused by direct manual measurement is avoided, which helps to improve the yield rate. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic structural diagram of a device for measuring the width of a substrate glass plate of the present invention; Figure 2 A side view of a device for measuring the width of a substrate glass plate according to the present invention; Figure 3 A schematic diagram of the structure of a device for measuring the width of a substrate glass plate according to the present invention; Figure 4 A schematic flow chart of a method for measuring the width of a glass substrate according to the present invention; In the figure, 1-anvil mechanism; 101-upper anvil; 102-raised anvil; 103-lower anvil; 11-slot; 12-anvil strip; 2-left end scale; 3-right end scale. DETAILED DESCRIPTION

[0018] The present invention is further described in detail below in conjunction with specific embodiments, which are intended to explain the present invention rather than to limit it. In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention. It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0019] Embodiment 1: like Figure 1 and Figure 3 As shown, the present invention provides a device for measuring the width of a substrate glass plate, comprising an anvil mechanism 1, wherein a left end scale 2 and a right end scale 3 are respectively installed at the two ends of the front portion of the anvil mechanism 1, and an anvil strip 12 is also installed at the front portion of the anvil mechanism 1, and the anvil strip 12 is bonded with the substrate glass. When the anvil mechanism 1 is bonded with the substrate glass, the data on the scale can be read intuitively, and after calculation, the current plate width can be known, which can effectively reduce product losses and play a decisive role in improving product yield to a great extent; the starting scale to the last scale of the left end scale 2 is from left to right, and the starting scale to the last scale of the right end scale 3 is from right to left; like Figure 2 As shown, the chopping board mechanism 1 includes an upper chopping board 101, a left end scale 2 and a right end scale 3 are respectively installed at the two ends of the front part of the upper chopping board 101, a raised chopping board 102 is connected to the bottom of the upper chopping board 101, a slot 11 is opened at the front part of the raised chopping board 102, a chopping board strip 12 is installed in the slot 11, and a lower chopping board 103 is connected to the bottom of the raised chopping board 102.

[0020] Embodiment 2: like Figure 1 , Figure 2 and Figure 3As shown, the present invention provides a device for measuring the width of a substrate glass plate, comprising an anvil mechanism 1, an anvil strip 12 and a scale, wherein the anvil mechanism 1 comprises an upper anvil 101, a raised anvil 102 and a lower anvil 103; the scale comprises a left end scale 2 and a right end scale 3; The left end scale 2 and the right end scale 3 are respectively mounted on the two ends of the front part of the anvil mechanism 1. The starting scale to the last scale of the left end scale 2 is from left to right, and the starting scale to the last scale of the right end scale 3 is from right to left, which can facilitate reading of values ​​and prevent reading deviation; the anvil strip 12 is mounted on the front part of the anvil mechanism 1, and the anvil strip 12 is attached to the substrate glass; the raised anvil 102 is located at the bottom of the upper anvil 101, and the raised anvil 102 can provide a stable supporting surface, so that the substrate glass can remain horizontal during the measurement process, avoiding measurement errors caused by unevenness; the left end scale 2 and the right end scale 3 are respectively mounted on the two ends of the front part of the upper anvil 101 The lower anvil 103 is located at the bottom of the raised anvil 102, and a card slot 11 is provided at the front of the raised anvil 102. The anvil strip 12 is installed in the card slot 11, which can ensure the firm connection between the anvil strip 12 and the anvil mechanism 1, avoiding the loosening or displacement of the anvil strip 12 during use, thereby improving the accuracy and stability of the measurement.

[0021] Embodiment 3: like Figure 3 and Figure 4 As shown, the present invention provides a method for measuring the width of a substrate glass plate. Because the upper and lower edges of the substrate glass are both effective use areas, a tape measure is currently used to directly measure the plate width, which inevitably requires contact with the product, which will cause hidden dangers of scratches and cause product losses. The method of the present invention sets a scale on the device and fixes the scale with the anvil strip 12. In actual production, when the anvil mechanism 1 is close to the glass plate and the anvil strip 12 is attached to the substrate glass, the data on the two scales can be read intuitively. By calculation, the plate width of the substrate glass can be accurately known. The method of the present invention can avoid direct contact with the substrate glass, eliminate the hidden danger of scratches caused by direct contact with the substrate glass, and improve the yield rate. The method includes the following steps: Step 1: Measure the distance between the starting scale of the left end scale 2 and the starting scale of the right end scale 3 on the chopping block mechanism 1, which is recorded as L; Step 2: attach the substrate glass to the front of the cutting board strip 12, and read the lengths displayed by the left scale 2 and the right scale 3 on the cutting board mechanism 1, respectively, and record them as L1 and L2; Specifically, L1 is the length from the starting scale of the left end scale 2 to the left edge of the substrate glass, and L2 is the length from the starting scale of the right end scale 3 to the right edge of the substrate glass; Step 3, calculating the plate width L3 of the substrate glass by using L obtained in step 1 and L1 and L2 obtained in step 2, and the calculation formula is: L3=L-L1-L2. The plate width of the substrate glass is obtained by calculation, which avoids the damage to the substrate glass by direct manual measurement, and helps to improve the yield rate; Preferably, L>L3, so that the distance between the two scales completely satisfies the actual width of the substrate glass plate, so as to be applicable to the measurement and inspection of the width of substrate glass plates of all varieties on the market.

[0022] Embodiment 4: pass Figure 3 and Figure 4 The technical problem to be solved by the present invention is described. In the production process of substrate glass, it is necessary to constantly grasp the change of plate width and take necessary countermeasures. Therefore, understanding the plate width size is an indispensable part of the production process of substrate glass. The main purpose of the present invention is to know the plate width size without contacting the product, avoid product waste, and increase product yield. A method for measuring the plate width of substrate glass is provided, which includes the following steps: Step 1: Measure the distance 2 m between the starting scale of the left end scale 2 and the starting scale of the right end scale 3 on the chopping block mechanism 1, recorded as L; Step 2: Lay the substrate glass on the front of the cutting board strip 12, read the length of the left scale 2 on the cutting board mechanism 1 as 20 cm, and the length of the right scale 3 as 20 cm, which are recorded as L1 and L2 respectively; Specifically, L1 is the length from the starting scale of the left end scale 2 to the left edge of the substrate glass, and L2 is the length from the starting scale of the right end scale 3 to the right edge of the substrate glass; Step 3: Calculate the width L3 of the substrate glass as 1.6 m using L obtained in step 1 and L1 and L2 obtained in step 2. The calculation formula is: L3=L-L1-L2.

[0023] Embodiment 5: pass Figure 3 and Figure 4 The technical problem to be solved by the present invention is described. In the production process of substrate glass, it is necessary to constantly grasp the change of plate width and take necessary countermeasures. Therefore, understanding the plate width size is an indispensable part of the production process of substrate glass. The main purpose of the present invention is to know the plate width size without contacting the product, avoid product waste, and increase product yield. A method for measuring the plate width of substrate glass is provided, which includes the following steps: Step 1: Measure the distance 2 m between the starting scale of the left end scale 2 and the starting scale of the right end scale 3 on the chopping block mechanism 1, recorded as L; Step 2: Lay the substrate glass on the front of the cutting board strip 12, read the length of the left scale 2 on the cutting board mechanism 1 as 20 cm, and the length of the right scale 3 as 30 cm, which are recorded as L1 and L2 respectively; Specifically, L1 is the length from the starting scale of the left end scale 2 to the left edge of the substrate glass, and L2 is the length from the starting scale of the right end scale 3 to the right edge of the substrate glass; Step 3: Calculate the width L3 of the substrate glass as 1.5 m using L obtained in step 1 and L1 and L2 obtained in step 2. The calculation formula is: L3=L-L1-L2.

[0024] Due to the particularity of the substrate glass process requirements, we cannot touch the product when measuring the board width. The significance of the present invention is to design a method for measuring the board width accurately and quickly without touching the product based on the above reasons, so as to avoid waste of such products and improve the yield rate; at the same time, the measurement method using this device can be completed independently by only one person, which improves the yield rate and work efficiency; at the same time, it can also enhance the safety factor and reduce potential safety risks.

[0025] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A device for measuring the width of a substrate glass plate, characterized in that: It comprises a chopping board mechanism (1), wherein a left end scale (2) and a right end scale (3) are respectively installed at two ends of the front part of the chopping board mechanism (1), and a chopping board strip (12) is also installed at the front part of the chopping board mechanism (1), and the chopping board strip (12) is bonded to a substrate glass; The starting scale to the last scale of the left end scale (2) is from left to right, and the starting scale to the last scale of the right end scale (3) is from right to left.

2. The device for measuring the width of a substrate glass plate according to claim 1, characterized in that: The anvil mechanism (1) comprises an upper anvil (101), the bottom of the upper anvil (101) being connected to a raised anvil (102), and the bottom of the raised anvil (102) being connected to a lower anvil (103).

3. The device for measuring the width of a substrate glass plate according to claim 2, characterized in that: A slot (11) is formed at the front of the raised chopping board (102), and the chopping board strip (12) is installed in the slot (11).

4. The device for measuring the width of a substrate glass plate according to claim 2, characterized in that: The left end scale (2) and the right end scale (3) are respectively mounted at the two ends of the front portion of the upper anvil (101).

5. A method for measuring the width of a substrate glass plate, based on a device for measuring the width of a substrate glass plate according to any one of claims 1 to 4, characterized in that: The following steps are involved: S1, measuring the distance between the left end scale (2) and the right end scale (3) on the anvil mechanism (1), recorded as L; S2, attaching the substrate glass to the front of the chopping board strip (12), and reading the lengths displayed by the left end scale (2) and the right end scale (3) on the chopping board mechanism (1), respectively, and recording them as L1 and L2; S3, calculate the plate width L3 of the substrate glass from L obtained in S1 and L1 and L2 obtained in S2.

6. The method for measuring the width of a substrate glass plate according to claim 5, characterized in that: L in S1 is specifically the distance between the starting scale mark of the left end scale (2) and the starting scale mark of the right end scale (3).

7. The method for measuring the width of a substrate glass plate according to claim 6, characterized in that: Said L>L3.

8. The method for measuring the width of a substrate glass plate according to claim 5, characterized in that: L1 in S2 is specifically: the length from the starting scale of the left end scale (2) to the left edge of the substrate glass.

9. The method for measuring the width of a substrate glass plate according to claim 5, characterized in that: L2 in S2 is specifically: the length from the starting scale of the right end scale (3) to the right edge of the substrate glass.

10. The method for measuring the width of a substrate glass plate according to claim 5, characterized in that: The calculation formula in S3 is: L3=L-L1-L2.

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