A method and system for automatically tracking and determining test signal waveform parameters

Abstract

The present invention provides a method and system for automatically tracking and determining test signal waveform parameters in the field of electronic equipment testing technology, the method comprising the following steps: step S1, the test equipment obtains the input test parameters, and outputs the test signal to the connected electronic equipment based on the test parameters; step S2, the signal waveform of the test signal output by the test equipment is collected by an oscilloscope, and the signal waveform is converted into a waveform picture; step S3, the waveform picture is preprocessed to obtain a waveform optimization picture; step S4, the waveform center line of the signal waveform in the waveform optimization picture is located based on the horizontal trigger line, and the upper horizontal line and the lower horizontal line of the signal waveform in the steady state are searched based on the waveform center line; step S5, the waveform parameters of the signal waveform are automatically determined based on the upper horizontal line and the lower horizontal line. The advantages of the present invention are: the accuracy and efficiency of the determination of the test signal waveform parameters are greatly improved.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic equipment testing, and in particular to a method and system for automatically tracking and determining test signal waveform parameters. Background Art

[0002] Electronic equipment needs to undergo a series of tests during the production process, and also needs to be tested if problems are encountered during use. The test requires loading test signals (voltage signals, current signals) on the electronic equipment. In order to ensure the stability of the performance of the electronic equipment, the accuracy of the test signal loading needs to be guaranteed.

[0003] In order to accurately load the test signal, the waveform parameters of the test signal need to be detected. Traditionally, the waveform parameters of the test signal are determined by human eyes to ensure that the signal values ​​of the test signal are within the specified range. However, this method has the following disadvantages:

[0004] 1. Unsatisfactory accuracy: It is easy to automatically ignore core points, surges and other problems; 2. Low efficiency: Since time and overshoot parameters need to be calculated each time, the operation is cumbersome and highly professional; 3. Difficult maintenance: As the types of electronic equipment tested increase, the shapes of waveforms vary and are easy to confuse.

[0005] Therefore, how to provide a method and system for automatically tracking and determining test signal waveform parameters to improve the accuracy and efficiency of test signal waveform parameter determination has become a technical problem that needs to be solved urgently. Summary of the invention

[0006] The technical problem to be solved by the present invention is to provide a method and system for automatically tracking and determining test signal waveform parameters, so as to improve the accuracy and efficiency of determining the test signal waveform parameters.

[0007] In a first aspect, the present invention provides a method for automatically tracking and determining test signal waveform parameters, comprising the following steps:

[0008] Step S1, the test device obtains input test parameters, and outputs a test signal to the connected electronic device based on the test parameters;

[0009] Step S2, collecting the signal waveform of the test signal output by the test device through an oscilloscope, and converting the signal waveform into a waveform image;

[0010] Step S3, preprocessing the waveform image to obtain a waveform optimized image;

[0011] Step S4, locating the waveform center line of the signal waveform in the waveform optimization picture based on the horizontal trigger line, and searching for the upper horizontal line and the lower horizontal line of the signal waveform in a steady state based on the waveform center line;

[0012] Step S5: automatically determining waveform parameters of the signal waveform based on the upper horizontal line and the lower horizontal line.

[0013] Furthermore, in step S1, the test parameters include at least a signal type, a waveform shape, and a waveform peak value; the signal type is a voltage signal or a current signal.

[0014] Furthermore, the step S2 is specifically as follows:

[0015] The signal waveform of the test signal output by the test equipment is collected by an oscilloscope, and the signal waveform is converted into a waveform image in RGB format by a computer.

[0016] Furthermore, the step S3 is specifically as follows:

[0017] The waveform image is preprocessed by at least binarization to remove background pixel color and image filtering to remove signal waveform burrs to obtain a waveform optimized image.

[0018] Furthermore, the step S4 is specifically as follows:

[0019] A horizontal trigger line is set, and the horizontal trigger line is controlled to move from bottom to top in the waveform optimization picture to locate the waveform center line of the signal waveform in the waveform optimization picture, and an upper horizontal line and a lower horizontal line of the signal waveform in a steady state are searched based on the waveform center line;

[0020] The step S5 is specifically as follows:

[0021] Based on the upper horizontal line and the lower horizontal line, a corresponding standard threshold line is fitted, and based on the standard threshold line, the waveform parameters of the signal waveform including at least the rising edge, the falling edge, the assignment and the response time are automatically determined, and the standard threshold line and the waveform parameters are bound and saved.

[0022] In a second aspect, the present invention provides a test signal waveform parameter automatic tracking and determination system, comprising the following modules:

[0023] A test signal output module, used for the test device to obtain input test parameters and output a test signal to a connected electronic device based on the test parameters;

[0024] A waveform image acquisition module, used for acquiring the signal waveform of the test signal output by the test device through an oscilloscope, and converting the signal waveform into a waveform image;

[0025] A waveform image preprocessing module, used for preprocessing the waveform image to obtain a waveform optimized image;

[0026] An upper and lower horizontal line search module, used for locating the waveform center line of the signal waveform in the waveform optimization picture based on the horizontal trigger line, and searching for the upper horizontal line and the lower horizontal line of the signal waveform in a steady state based on the waveform center line;

[0027] The waveform parameter determination module is used to automatically determine the waveform parameters of the signal waveform based on the upper horizontal line and the lower horizontal line.

[0028] Furthermore, in the test signal output module, the test parameters include at least a signal type, a waveform shape, and a waveform peak value; and the signal type is a voltage signal or a current signal.

[0029] Furthermore, the waveform image acquisition module is specifically used for:

[0030] The signal waveform of the test signal output by the test equipment is collected by an oscilloscope, and the signal waveform is converted into a waveform image in RGB format by a computer.

[0031] Furthermore, the waveform image preprocessing module is specifically used for:

[0032] The waveform image is preprocessed by at least binarization to remove background pixel color and image filtering to remove signal waveform burrs to obtain a waveform optimized image.

[0033] Furthermore, the upper and lower horizontal line search module is specifically used for:

[0034] A horizontal trigger line is set, and the horizontal trigger line is controlled to move from bottom to top in the waveform optimization picture to locate the waveform center line of the signal waveform in the waveform optimization picture, and an upper horizontal line and a lower horizontal line of the signal waveform in a steady state are searched based on the waveform center line;

[0035] The waveform parameter determination module is specifically used for:

[0036] Based on the upper horizontal line and the lower horizontal line, a corresponding standard threshold line is fitted, and based on the standard threshold line, the waveform parameters of the signal waveform including at least the rising edge, the falling edge, the assignment and the response time are automatically determined, and the standard threshold line and the waveform parameters are bound and saved.

[0037] The advantages of the present invention are:

[0038] The input test parameters are obtained through the test equipment, and a test signal is output to the connected electronic device based on the test parameters; then the signal waveform of the test signal output by the test equipment is collected through an oscilloscope, the signal waveform is converted into a waveform image, and the waveform image is preprocessed to obtain a waveform optimization image; then the waveform center line of the signal waveform in the waveform optimization image is located based on the horizontal trigger line, and the upper horizontal line and the lower horizontal line of the signal waveform in the steady state are found based on the waveform center line, and the waveform parameters of the signal waveform including at least the rising edge, the falling edge, the assignment and the response time are automatically determined based on the upper horizontal line and the lower horizontal line; that is, the signal waveform is converted into a waveform image, the waveform image is preprocessed to improve the image quality, and then the relevant reference lines of the waveform signal (horizontal trigger line, waveform center line, upper horizontal line, lower horizontal line, standard threshold line) are obtained through relevant image processing technology to automatically determine the waveform parameters, which greatly improves the accuracy and efficiency of the determination of the waveform parameters of the test signal compared with the traditional manual naked eye determination. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The present invention will be further described below in conjunction with embodiments with reference to the accompanying drawings.

[0040] Figure 1 The present invention is a flow chart of a method for automatically tracking and determining test signal waveform parameters.

[0041] Figure 2 It is a structural schematic diagram of a test signal waveform parameter automatic tracking and determination system of the present invention. DETAILED DESCRIPTION

[0042] The technical solution in the embodiments of the present application has the following overall idea: converting the signal waveform into a waveform image, preprocessing the waveform image to improve the image quality, and then obtaining the relevant reference lines of the waveform signal (horizontal trigger line, waveform center line, upper horizontal line, lower horizontal line, standard threshold line) through relevant image processing technology to automatically determine the waveform parameters, thereby improving the accuracy and efficiency of the determination of the test signal waveform parameters.

[0043] Please refer to Figure 1 to Figure 2 As shown, a preferred embodiment of a method for automatically tracking and determining test signal waveform parameters of the present invention comprises the following steps:

[0044] Step S1, the test device obtains input test parameters, and outputs a test signal to the connected electronic device based on the test parameters;

[0045] Step S2, collecting the signal waveform of the test signal output by the test device through an oscilloscope, and converting the signal waveform into a waveform image;

[0046] Step S3, preprocessing the waveform image to obtain a waveform optimized image;

[0047] Step S4, locating the waveform center line of the signal waveform in the waveform optimization picture based on the horizontal trigger line, and searching for the upper horizontal line and the lower horizontal line of the signal waveform in a steady state based on the waveform center line;

[0048] Step S5: automatically determining waveform parameters of the signal waveform based on the upper horizontal line and the lower horizontal line.

[0049] In the step S1, the test parameters include at least a signal type, a waveform shape, and a waveform peak value; the signal type is a voltage signal or a current signal.

[0050] The step S2 is specifically as follows:

[0051] The signal waveform of the test signal output by the test device is collected by an oscilloscope, and the signal waveform is converted into a waveform image in RGB format by a computer. In specific implementation, before conversion into the waveform image, the signal waveform is also preliminarily checked based on a preset array.

[0052] The step S3 is specifically as follows:

[0053] The waveform image is preprocessed by at least binarization to remove background pixel colors and image filtering to remove signal waveform burrs to obtain a waveform optimized image. In specific implementation, noise reduction, normalization, sharpening and other operations can also be combined to further improve the image quality of the waveform image.

[0054] The step S4 is specifically as follows:

[0055] A horizontal trigger line is set, and the horizontal trigger line is controlled to move from bottom to top in the waveform optimization picture to locate the waveform center line of the signal waveform in the waveform optimization picture, and an upper horizontal line and a lower horizontal line of the signal waveform in a steady state are searched based on the waveform center line;

[0056] The step S5 is specifically as follows:

[0057] Based on the upper horizontal line and the lower horizontal line, the corresponding standard threshold line is fitted, and based on the standard threshold line, the waveform parameters of the signal waveform including at least the rising edge, the falling edge, the assignment, and the response time are automatically determined, and the standard threshold line is bound and saved with the waveform parameters. By binding and saving the standard threshold line with the waveform parameters, it is convenient for later tracing.

[0058] A preferred embodiment of a test signal waveform parameter automatic tracking and determination system of the present invention includes the following modules:

[0059] A test signal output module, used for the test device to obtain input test parameters and output a test signal to a connected electronic device based on the test parameters;

[0060] A waveform image acquisition module, used for acquiring the signal waveform of the test signal output by the test device through an oscilloscope, and converting the signal waveform into a waveform image;

[0061] A waveform image preprocessing module, used for preprocessing the waveform image to obtain a waveform optimized image;

[0062] An upper and lower horizontal line search module, used for locating the waveform center line of the signal waveform in the waveform optimization picture based on the horizontal trigger line, and searching for the upper horizontal line and the lower horizontal line of the signal waveform in a steady state based on the waveform center line;

[0063] The waveform parameter determination module is used to automatically determine the waveform parameters of the signal waveform based on the upper horizontal line and the lower horizontal line.

[0064] In the test signal output module, the test parameters include at least a signal type, a waveform shape, and a waveform peak value; the signal type is a voltage signal or a current signal.

[0065] The waveform image acquisition module is specifically used for:

[0066] The signal waveform of the test signal output by the test device is collected by an oscilloscope, and the signal waveform is converted into a waveform image in RGB format by a computer. In specific implementation, before conversion into the waveform image, the signal waveform is also preliminarily checked based on a preset array.

[0067] The waveform image preprocessing module is specifically used for:

[0068] The waveform image is preprocessed by at least binarization to remove background pixel colors and image filtering to remove signal waveform burrs to obtain a waveform optimized image. In specific implementation, noise reduction, normalization, sharpening and other operations can also be combined to further improve the image quality of the waveform image.

[0069] The upper and lower horizontal line search module is specifically used for:

[0070] A horizontal trigger line is set, and the horizontal trigger line is controlled to move from bottom to top in the waveform optimization picture to locate the waveform center line of the signal waveform in the waveform optimization picture, and an upper horizontal line and a lower horizontal line of the signal waveform in a steady state are searched based on the waveform center line;

[0071] The waveform parameter determination module is specifically used for:

[0072] Based on the upper horizontal line and the lower horizontal line, the corresponding standard threshold line is fitted, and based on the standard threshold line, the waveform parameters of the signal waveform including at least the rising edge, the falling edge, the assignment, and the response time are automatically determined, and the standard threshold line is bound and saved with the waveform parameters. By binding and saving the standard threshold line with the waveform parameters, it is convenient for later tracing.

[0073] In summary, the advantages of the present invention are:

[0074] The input test parameters are obtained through the test equipment, and a test signal is output to the connected electronic device based on the test parameters; then the signal waveform of the test signal output by the test equipment is collected through an oscilloscope, the signal waveform is converted into a waveform image, and the waveform image is preprocessed to obtain a waveform optimization image; then the waveform center line of the signal waveform in the waveform optimization image is located based on the horizontal trigger line, and the upper horizontal line and the lower horizontal line of the signal waveform in the steady state are found based on the waveform center line, and the waveform parameters of the signal waveform including at least the rising edge, the falling edge, the assignment and the response time are automatically determined based on the upper horizontal line and the lower horizontal line; that is, the signal waveform is converted into a waveform image, the waveform image is preprocessed to improve the image quality, and then the relevant reference lines of the waveform signal (horizontal trigger line, waveform center line, upper horizontal line, lower horizontal line, standard threshold line) are obtained through relevant image processing technology to automatically determine the waveform parameters, which greatly improves the accuracy and efficiency of the determination of the waveform parameters of the test signal compared with the traditional manual naked eye determination.

[0075] Although the specific implementation modes of the present invention are described above, those skilled in the art should understand that the specific implementation modes described are only illustrative and are not intended to limit the scope of the present invention. Equivalent modifications and changes made by those skilled in the art in accordance with the spirit of the present invention should be included in the scope of protection of the claims of the present invention.

Claims

1. A method for automatically tracking and determining test signal waveform parameters, characterized in that: The steps include: Step S1, the test device obtains input test parameters, and outputs a test signal to the connected electronic device based on the test parameters; Step S2, collecting the signal waveform of the test signal output by the test device through an oscilloscope, and converting the signal waveform into a waveform image; Step S3, preprocessing the waveform image to obtain a waveform optimized image; Step S4, locating the waveform center line of the signal waveform in the waveform optimization picture based on the horizontal trigger line, and searching for the upper horizontal line and the lower horizontal line of the signal waveform in a steady state based on the waveform center line; Step S5: automatically determining waveform parameters of the signal waveform based on the upper horizontal line and the lower horizontal line.

2. A method for automatically tracking and determining test signal waveform parameters as claimed in claim 1, characterized in that: In the step S1, the test parameters include at least a signal type, a waveform shape, and a waveform peak value; the signal type is a voltage signal or a current signal.

3. A method for automatically tracking and determining test signal waveform parameters as claimed in claim 1, characterized in that: The step S2 is specifically as follows: The signal waveform of the test signal output by the test equipment is collected by an oscilloscope, and the signal waveform is converted into a waveform image in RGB format by a computer.

4. A method for automatically tracking and determining test signal waveform parameters as claimed in claim 1, characterized in that: The step S3 is specifically as follows: The waveform image is preprocessed by at least binarization to remove background pixel color and image filtering to remove signal waveform burrs to obtain a waveform optimized image.

5. The method for automatically tracking and determining test signal waveform parameters according to claim 1, characterized in that: The step S4 is specifically as follows: A horizontal trigger line is set, and the horizontal trigger line is controlled to move from bottom to top in the waveform optimization picture to locate the waveform center line of the signal waveform in the waveform optimization picture, and an upper horizontal line and a lower horizontal line of the signal waveform in a steady state are found based on the waveform center line; The step S5 is specifically as follows: Based on the upper horizontal line and the lower horizontal line, a corresponding standard threshold line is fitted, and based on the standard threshold line, the waveform parameters of the signal waveform including at least the rising edge, the falling edge, the assignment and the response time are automatically determined, and the standard threshold line and the waveform parameters are bound and saved.

6. A system for automatically tracking and determining test signal waveform parameters, characterized in that: Includes the following modules: A test signal output module, used for the test device to obtain input test parameters and output a test signal to a connected electronic device based on the test parameters; A waveform image acquisition module, used for acquiring the signal waveform of the test signal output by the test device through an oscilloscope, and converting the signal waveform into a waveform image; A waveform image preprocessing module, used for preprocessing the waveform image to obtain a waveform optimized image; An upper and lower horizontal line search module, used for locating the waveform center line of the signal waveform in the waveform optimization picture based on the horizontal trigger line, and searching for the upper horizontal line and the lower horizontal line of the signal waveform in a steady state based on the waveform center line; The waveform parameter determination module is used to automatically determine the waveform parameters of the signal waveform based on the upper horizontal line and the lower horizontal line.

7. A test signal waveform parameter automatic tracking and determination system as claimed in claim 6, characterized in that: In the test signal output module, the test parameters include at least a signal type, a waveform shape, and a waveform peak value; the signal type is a voltage signal or a current signal.

8. The automatic tracking and determination system for test signal waveform parameters according to claim 6, characterized in that: The waveform image acquisition module is specifically used for: The signal waveform of the test signal output by the test equipment is collected by an oscilloscope, and the signal waveform is converted into a waveform image in RGB format by a computer.

9. The automatic tracking and determination system for test signal waveform parameters according to claim 6, characterized in that: The waveform image preprocessing module is specifically used for: The waveform image is preprocessed by at least binarization to remove background pixel color and image filtering to remove signal waveform burrs to obtain a waveform optimized image.

10. The automatic tracking and determination system for test signal waveform parameters according to claim 6, characterized in that: The upper and lower horizontal line search module is specifically used for: A horizontal trigger line is set, and the horizontal trigger line is controlled to move from bottom to top in the waveform optimization picture to locate the waveform center line of the signal waveform in the waveform optimization picture, and an upper horizontal line and a lower horizontal line of the signal waveform in a steady state are searched based on the waveform center line; The waveform parameter determination module is specifically used for: Based on the upper horizontal line and the lower horizontal line, a corresponding standard threshold line is fitted, and based on the standard threshold line, the waveform parameters of the signal waveform including at least the rising edge, the falling edge, the assignment and the response time are automatically determined, and the standard threshold line and the waveform parameters are bound and saved.

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