Component insertion loss test method, system and terminal

Abstract

The invention relates to a component insertion loss test method, system and terminal, and relates to the technical field of insertion loss, and the method comprises the steps: obtaining loss test result information and test component model information; determining test reference result information and a result deviation reference interval according to the model information of the test component; analyzing a deviation condition between the loss test result information and the test benchmark result information and taking the deviation condition as result deviation information; determining a result deviation value according to the result deviation information; and determining test parameter adjustment information according to the falling condition of the result deviation value and the result deviation reference interval, and outputting the test parameter adjustment information to the insertion loss test device for adjustment so as to perform loss test again. According to the invention, common personnel can conveniently carry out insertion loss detection.

Description

Technical Field

[0001] The present invention relates to the technical field of insertion loss, and in particular to a component insertion loss testing method, system and terminal. Background Art

[0002] Insertion loss refers to the loss of load power caused by the insertion of components or devices somewhere in the transmission system. Insertion loss is one of the key test items for many RF passive components and is widely used in fiber optic communications, RF systems, power supply filtering and other fields.

[0003] At present, when testing the insertion loss, it is generally tested through an insertion loss test device, which includes a test box body for testing, a bias source for providing bias current, and a spectrum analyzer for analysis and display. The test box body is used to place the test components. The test box body includes a test sub-box, a bias coupling sub-box, a signal introduction sub-box, and a bias power introduction sub-box. There are two bias coupling sub-boxes and they are symmetrically located on both sides of the test sub-box. The bias source is connected in parallel with the test components in the test box body through the bias power introduction sub-box. After the test components are manually placed in the test box body, the deviation between the input and output is analyzed by the spectrum analyzer to obtain the anti-interference ability of the test components.

[0004] When using an insertion loss test device to test the insertion loss of test components, it is easy for the test results to be biased. At this time, the operator usually determines the cause and makes adjustments based on experience, which makes it inconvenient for ordinary personnel to continue to perform insertion loss testing when the test results are biased. Summary of the invention

[0005] In order to facilitate ordinary personnel to perform insertion loss detection, the present invention provides a component insertion loss test method, system and terminal.

[0006] In a first aspect, the present invention provides a component insertion loss test method, which adopts the following technical solution: A component insertion loss testing method, comprising: Obtain loss test result information and test component model information; Determine the test benchmark result information and the result deviation benchmark range according to the test component model information; Analyze the deviation between the loss test result information and the test benchmark result information and use it as the result deviation information; determining a result deviation value according to the result deviation information; According to the falling condition of the result deviation value and the result deviation reference interval, the test parameter adjustment information is determined, and the test parameter adjustment information is output to the insertion loss test device for adjustment so as to re-perform the loss test.

[0007] Optionally, the method for determining the test benchmark result information and the result deviation benchmark interval includes: Retrieve the core specification information, inductance value and effective wire diameter value based on the test component model information; Determine the initial test result information based on the core specification information and the inductance value; According to the corresponding relationship between the effective wire diameter value and the preset effective wire diameter influence value, the effective wire diameter influence value corresponding to the effective wire diameter value is determined; Adjusting the initial test result information based on the effective wire diameter influence value to form test adjustment result information; The test deviation reference interval is determined according to the test adjustment result information, and the test adjustment result information is used as the test reference result information, and the test deviation reference interval is used as the result deviation reference interval.

[0008] Optionally, the method for determining the initial test result information includes: Determine whether the core specification information exists; If yes, then retrieve the core permeability, core cross-sectional area and magnetic path length values ​​based on the core specification information; Determine the comprehensive inductance of the core based on the core permeability, core cross-sectional area, magnetic path length and inductance value; According to the correspondence between the magnetic core comprehensive inductance value and the preset magnetic core specification result information, the magnetic core specification result information corresponding to the magnetic core comprehensive inductance value is determined, and the magnetic core specification result information is used as the initial test result information; If not, the number of turns result information corresponding to the inductance value is determined according to the correspondence between the inductance value and the preset number of turns result information, and the number of turns result information is used as the initial test result information.

[0009] Optionally, the method for determining the test deviation reference interval includes: Based on the preset demand detection frequency value, the test adjustment result information is retrieved and used as the frequency detection value; Calculate the difference between the frequency detection value and the preset frequency reference value and use it as the frequency deviation value; Calculate the average value of the frequency deviation values ​​corresponding to each required detection frequency value and use it as the frequency deviation average value; According to the correspondence between the frequency deviation average value and the preset deviation average interval, the deviation average interval corresponding to the frequency deviation average value is determined; Select the maximum value and the minimum value based on the frequency deviation value corresponding to each required detection frequency value, and calculate the difference between the selected maximum value and the minimum value as the frequency deviation floating value; According to the corresponding relationship between the frequency deviation floating value and the preset deviation floating influence value, the deviation floating influence value corresponding to the frequency deviation floating value is determined; Based on the deviation floating impact value, the deviation average interval is adjusted to form a test deviation benchmark interval.

[0010] Optionally, a method for determining the result deviation value includes: Based on the result deviation information, retrieve the deviation frequency value, deviation result value and deviation number value; According to the correspondence between the deviation frequency value and the preset frequency unit result value, the frequency unit result value corresponding to the deviation frequency value is determined; Calculate the product value between the deviation result value and the frequency unit result value and use it as the single frequency result value; Calculate the sum of the single frequency result values ​​and use it as the comprehensive value of the frequency result; Calculate the quotient between the comprehensive value of the frequency result and the individual deviation value and use it as the average value of the frequency result; According to the correspondence between the deviation number value and the preset deviation number influence value, the deviation number influence value corresponding to the deviation number value is determined; The product value between the frequency result average value and the deviation number influence value is calculated and used as the frequency result adjustment value, and the frequency result adjustment value is used as the result deviation value.

[0011] Optionally, the method for determining the test parameter adjustment information includes: Determine whether the result deviation value falls within the result deviation reference interval; If yes, the preset reference adjustment information is output as the test parameter adjustment information; If not, obtain the test environment information; Determine test environment abnormal values ​​according to test environment information; Calculate the difference between the result deviation value and the result deviation benchmark interval and use it as the result deviation abnormal value; The environment adjustment information is determined according to the result deviation abnormal value and the test environment abnormal value, and the environment adjustment information is used as the test parameter adjustment information.

[0012] Optionally, a method for determining an abnormal value of a test environment includes: Based on the test environment information, retrieve the ambient temperature value, ambient humidity value and ambient magnetic field value; Based on the model information of the test component, retrieve the model temperature reference value, model humidity reference value and model magnetic field reference value; Calculate the difference between the ambient temperature value and the model temperature reference value and use it as the temperature deviation value; According to the corresponding relationship between the temperature deviation value and the preset temperature deviation influence value, the temperature deviation influence value corresponding to the temperature deviation value is determined; Calculate the difference between the ambient humidity value and the model humidity reference value and use it as the humidity deviation value; According to the corresponding relationship between the humidity deviation value and the preset humidity deviation influence value, the humidity deviation influence value corresponding to the humidity deviation value is determined; Calculate the difference between the environmental magnetic field value and the model magnetic field reference value and use it as the magnetic field deviation value; According to the correspondence between the magnetic field deviation value and the preset magnetic field deviation influence value, the magnetic field deviation influence value corresponding to the magnetic field deviation value is determined; The sum of the temperature deviation impact value, humidity deviation impact value and magnetic field deviation impact value is calculated and used as the test environment abnormal value.

[0013] Optionally, a method for determining the environment adjustment information includes: Determine whether the result deviation abnormal value is smaller than the test environment abnormal value; If yes, then based on the comparison results of the temperature deviation impact value, the humidity deviation impact value and the magnetic field deviation impact value, an environmental impact value is selected; Determine a corresponding relationship of environmental impact adjustment information according to the environmental impact value, so as to determine the environmental impact adjustment information corresponding to the environmental impact value, and use the environmental impact adjustment information as the environmental adjustment information; If not, the difference between the result deviation anomaly value and the test environment anomaly value is calculated and used as the deviation anomaly adjustment value; According to the correspondence between the deviation abnormality adjustment value and the preset contact adjustment information, the contact adjustment information corresponding to the deviation abnormality adjustment value is determined, and the contact adjustment information is used as the environment adjustment information.

[0014] In a second aspect, the present invention provides a component insertion loss test system, which adopts the following technical solution: A component insertion loss test system, comprising: An acquisition module is used to obtain loss test result information, test component model information and test environment information; A memory, used to store the component insertion loss test method as described in any one of the first aspects; The processor loads and executes the program in the memory.

[0015] In a third aspect, the present invention provides a terminal, which adopts the following technical solution: A terminal comprises a memory and a processor, wherein the memory stores a component insertion loss test method as described in any one of the first aspects and can be loaded and executed by the processor.

[0016] In summary, the present invention includes at least one of the following beneficial technical effects: 1. Obtain the loss test result information and the test component model information, determine the test benchmark result information and the result deviation benchmark interval, and determine the result deviation value after analyzing the result deviation information. Then, according to the result deviation value and the result deviation benchmark interval, determine the test parameter adjustment information and output it to the insertion loss test device for adjustment to re-perform the loss test, so as to facilitate ordinary personnel to perform insertion loss detection; 2. The core specification information, inductance value and effective wire diameter value are retrieved through the test component model information, and the initial test result information is determined through the core specification information and the inductance value. The effective wire diameter influence value is determined through the effective wire diameter value query to adjust the initial test result information to form the test adjustment result information and serve as the test benchmark result information. The test deviation reference interval is then determined through the test adjustment result information and used as the result deviation reference interval, thereby improving the accuracy of the obtained test benchmark result information and the result deviation reference interval; 3. By judging whether the core specification information exists, if it exists, the core permeability, core cross-sectional area and magnetic path length are retrieved through the core specification information and the comprehensive inductance of the core is determined with the inductance value. The core specification result information is determined by querying the comprehensive inductance of the core and used as the initial result information of the test. If it does not exist, the number of turns result information is determined by querying the inductance value and used as the initial result information of the test, thereby improving the accuracy of the obtained initial result information of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is a flow chart of a method for component insertion loss testing according to an embodiment of the present application; Figure 2 It is a flow chart of a method for determining test benchmark result information and result deviation benchmark interval in an embodiment of the present application; Figure 3 is a flow chart of a method for determining initial test result information in an embodiment of the present application; Figure 4 is a flow chart of a method for determining a test deviation reference interval according to an embodiment of the present application; Figure 5 is a flow chart of a method for determining a result deviation value in an embodiment of the present application; Figure 6 is a flow chart of a method for determining test parameter adjustment information according to an embodiment of the present application; Figure 7is a flow chart of a method for determining abnormal values ​​of a test environment according to an embodiment of the present application; Figure 8 It is a flow chart of a method for determining environmental adjustment information according to an embodiment of the present application. DETAILED DESCRIPTION

[0018] The present invention is further described in detail below in conjunction with the accompanying drawings and embodiments.

[0019] A component insertion loss test method obtains loss test result information, test component model information and test environment information, analyzes whether there is an error in the test result, determines the cause of the environment or contact situation based on the error to automatically adjust, and then re-tests the loss, thereby facilitating ordinary personnel to perform insertion loss detection.

[0020] Reference Figure 1 The embodiment of the present invention discloses a component insertion loss testing method, which includes: Step S100: Obtain loss test result information and test component model information.

[0021] The loss test result information refers to the result information when performing insertion loss, and the loss test result information is retrieved by querying from the spectrum analyzer. The test component model information refers to the model information corresponding to the test component currently performing insertion loss, and the test component model information is obtained after being pre-input by the operator. In this embodiment, the test component corresponding to the test component model information is an inductor.

[0022] Step S101: Determine test benchmark result information and result deviation benchmark interval according to test component model information.

[0023] Among them, the test benchmark result information refers to the benchmark result information corresponding to the insertion loss detection of the model to which the test component belongs, and the result deviation benchmark interval refers to the benchmark interval corresponding to the allowable deviation of the test result of the model to which the test component belongs under normal circumstances. By analyzing the test component model information, the test benchmark result information and the result deviation benchmark interval are determined to facilitate subsequent use. The specific steps for determining the test benchmark result information and the result deviation benchmark interval refer to steps S200 to S204.

[0024] Step S102: Analyze the deviation between the loss test result information and the test reference result information and use it as result deviation information.

[0025] Among them, the result deviation information refers to the deviation information corresponding to the presence of a deviation in the test result. The deviation between the loss test result information and the test benchmark result information is analyzed and used as the result deviation information to facilitate subsequent use.

[0026] Step S103: Determine the result deviation value according to the result deviation information.

[0027] The result deviation value refers to the deviation parameter value corresponding to the deviation of the test result. The result deviation value is determined by analyzing the result deviation information to facilitate subsequent use. The specific steps for determining the result deviation value refer to steps S500 to S506.

[0028] Step S104: determining the test parameter adjustment information according to whether the result deviation value falls within the result deviation reference interval, and outputting the test parameter adjustment information to the insertion loss test device for adjustment so as to re-perform the loss test.

[0029] Among them, the test parameter adjustment information refers to the control information used to adjust the parameters of the insertion loss test device. The test parameter adjustment information is determined by analyzing the fall of the result deviation value and the result deviation reference interval, and the test parameter adjustment information is output to the insertion loss test device for adjustment, and then the loss test is performed again, so as to facilitate ordinary personnel to perform insertion loss detection.

[0030] exist Figure 1 In step S101, in order to further ensure the rationality of the test benchmark result information and the result deviation reference interval, it is necessary to further analyze and calculate the test benchmark result information and the result deviation reference interval separately, specifically by Figure 2 The steps shown are explained in detail.

[0031] Reference Figure 2 The method for determining the test benchmark result information and the result deviation benchmark interval includes the following steps: Step S200: Retrieve the core specification information, inductance value and effective wire diameter value based on the test component model information.

[0032] Among them, the core specification information refers to the specification information corresponding to the core in the test component, the inductance turn value refers to the turn value corresponding to the inductance in the test component, and the effective wire diameter value refers to the wire diameter value that the inductance in the test component can actually take effect. Through the test component model information, the core specification corresponding to the model is retrieved and used as the core specification information, the number of turns corresponding to the inductance under the model is used as the inductance turn value, and the wire diameter that the inductance under the model actually takes effect is used as the effective wire diameter value, so as to facilitate subsequent use.

[0033] Step S201: determining initial test result information according to the core specification information and the inductance value.

[0034] The initial test result information refers to the initial test result information corresponding to the insertion loss test of the test components corresponding to the core specifications and the number of inductance turns. The initial test result information is determined by analyzing the core specification information and the inductance turn value, which is convenient for subsequent use. The specific steps for determining the initial test result information refer to steps S300 to S304.

[0035] Step S202: determining the effective wire diameter influence value corresponding to the effective wire diameter value according to the corresponding relationship between the effective wire diameter value and the preset effective wire diameter influence value.

[0036] Among them, the effective wire diameter influence value refers to the influence degree value when the wire diameter that the inductor can actually produce an effect affects the insertion loss test result of the test component. Different effective wire diameter values ​​correspond to different effective wire diameter influence values. The effective wire diameter influence value is obtained by querying from a database storing different effective wire diameter values ​​and corresponding effective wire diameter influence values. The database is obtained after pre-input. The effective wire diameter influence value is determined by querying the effective wire diameter value to facilitate subsequent use.

[0037] Step S203: adjusting the test initial result information based on the effective wire diameter influence value to form test adjustment result information.

[0038] Among them, the test adjustment result information refers to the result information after adjusting the initial test results. The test adjustment result information is formed by multiplying the effective wire diameter influence value by the insertion loss result value at each frequency corresponding to the initial test result information, and then combining the result values ​​to facilitate subsequent use.

[0039] Step S204: determining a test deviation reference interval according to the test adjustment result information, and using the test adjustment result information as the test reference result information, and using the test deviation reference interval as the result deviation reference interval.

[0040] The test deviation reference interval refers to the reference deviation interval that can be tolerated according to the insertion loss result value corresponding to the test adjustment result information. The test deviation reference interval is determined by analyzing the test adjustment result information, and the test adjustment result information is used as the test reference result information, and the test deviation reference interval is used as the result deviation reference interval, so as to improve the accuracy of the obtained test reference result information and the result deviation reference interval. The specific steps for determining the test deviation reference interval refer to steps S400 to S406.

[0041] exist Figure 2 In step S201, in order to further ensure the rationality of the initial test result information, it is necessary to further analyze and calculate the initial test result information. Figure 3The steps shown are explained in detail.

[0042] Reference Figure 3 , the method for determining the initial test result information includes the following steps: Step S300: Determine whether the core specification information exists. If yes, execute step S301; if no, execute step S304.

[0043] Wherein, whether the magnetic core exists in the inductor is determined by judging whether the magnetic core specification information exists.

[0044] Step S301: Retrieve the magnetic permeability, cross-sectional area and magnetic path length of the magnetic core based on the magnetic core specification information.

[0045] Among them, the core permeability refers to the permeability corresponding to the core in the inductor, the core cross-sectional area refers to the cross-sectional area corresponding to the core in the inductor, and the magnetic path length value refers to the path length value of the magnetic core in the inductor passed by the magnetic force lines. Through the core specification information query, the permeability corresponding to the core under this specification is retrieved and used as the core permeability, the cross-sectional area corresponding to the core under this specification is used as the core cross-sectional area, and the path length of the magnetic force lines corresponding to the core under this specification is used as the magnetic path length value, which is convenient for subsequent use.

[0046] Step S302: determining the comprehensive inductance of the magnetic core according to the magnetic permeability of the magnetic core, the cross-sectional area of ​​the magnetic core, the magnetic path length value and the inductance value.

[0047] Among them, the comprehensive inductance value of the core refers to the comprehensive inductance value generated by the inductor. The preset comprehensive inductance value calculation formula of the core is used to calculate the magnetic permeability, core cross-sectional area, magnetic path length value and inductance coil value to obtain the comprehensive inductance value of the core, which is convenient for subsequent use. The comprehensive inductance value calculation formula of the core refers to the formula for calculating the comprehensive inductance value of the core. The comprehensive inductance value calculation formula of the core is obtained after pre-input. The comprehensive inductance value calculation formula of the core is L=uN 2 A / L; L is the comprehensive inductance of the core; u is the magnetic permeability of the core; N is the value of the inductance coil; L is the length of the magnetic path.

[0048] Step S303: determining the magnetic core specification result information corresponding to the magnetic core comprehensive inductance value according to the correspondence between the magnetic core comprehensive inductance value and the preset magnetic core specification result information, and using the magnetic core specification result information as the test initial result information.

[0049] The core specification result information refers to the result information of estimating the test result according to the specification of the core. Different core comprehensive inductance values ​​correspond to different core specification result information. The core specification result information is obtained by querying from a database storing different core comprehensive inductance values ​​and corresponding core specification result information. The database is obtained after pre-input. The core specification result information is determined by querying the core comprehensive inductance value, and the core specification result information is used as the test initial result information, thereby improving the accuracy of the obtained test initial result information.

[0050] Step S304: determining the turns result information corresponding to the inductance value according to the correspondence between the inductance value and the preset turns result information, and using the turns result information as the initial test result information.

[0051] The number of turns result information refers to the result information that directly estimates the test result based on the number of turns of the inductor. Different inductor turn values ​​correspond to different number of turns result information. The number of turns result information is obtained by querying from a database storing different inductor turn values ​​and corresponding number of turns result information. The database is obtained after pre-input. The number of turns result information is determined by querying the inductor turn value, and the number of turns result information is used as the test initial result information, thereby improving the accuracy of the obtained test initial result information.

[0052] exist Figure 2 In step S204, in order to further ensure the rationality of the test deviation reference interval, it is necessary to further analyze and calculate the test deviation reference interval separately, specifically by Figure 4 The steps shown are explained in detail.

[0053] Reference Figure 4 , the method for determining the test deviation reference interval includes the following steps: Step S400: based on a preset demand detection frequency value, the test adjustment result information is retrieved and used as a frequency detection value.

[0054] Among them, the required detection frequency value refers to the frequency value that needs to be compared and detected, and the required detection frequency value is obtained after pre-input. The frequency detection value refers to the insertion loss result value corresponding to the required detection frequency value. The corresponding insertion loss result value is retrieved from the required detection frequency value through the test adjustment result information and used as the frequency detection value for subsequent use.

[0055] Step S401: Calculate the difference between the frequency detection value and the preset frequency reference value and use it as the frequency deviation value.

[0056] The frequency reference value refers to the reference value that the insertion loss result corresponding to the required detection frequency value needs to reach, and the frequency reference value is obtained after pre-input. The frequency deviation value refers to the deviation value corresponding to the insertion loss result corresponding to the required detection frequency value when there is a deviation. The difference between the frequency detection value and the preset frequency reference value is calculated and used as the frequency deviation value for subsequent use.

[0057] Step S402: Calculate the average value of the frequency deviation values ​​corresponding to each required detection frequency value and use it as the frequency deviation average value.

[0058] Among them, the average frequency deviation refers to the average deviation value corresponding to the insertion loss result corresponding to the required detection frequency value when there is a deviation. The average value between the frequency deviation values ​​corresponding to each required detection frequency value is calculated and used as the average frequency deviation value for convenience in subsequent use.

[0059] Step S403: determining the average deviation interval corresponding to the average frequency deviation value according to the corresponding relationship between the average frequency deviation value and the preset average deviation interval.

[0060] The deviation average interval refers to the reference deviation interval corresponding to the deviation of the insertion loss result value when the frequency deviation average value is tolerated. Different frequency deviation average values ​​correspond to different deviation average intervals. The deviation average interval is obtained by querying from a database storing different frequency deviation average values ​​and corresponding deviation average intervals. The database is obtained after pre-input. The deviation average interval is determined by querying the frequency deviation average value to facilitate subsequent use.

[0061] Step S404: selecting a maximum value and a minimum value based on the frequency deviation values ​​corresponding to each required detection frequency value, and calculating the difference between the selected maximum value and the minimum value as the frequency deviation floating value.

[0062] Among them, the frequency deviation floating value refers to the floating value corresponding to the floating change of the frequency deviation value. The maximum and minimum values ​​of the frequency deviation values ​​corresponding to each required detection frequency value are selected, and then the difference between the selected maximum and minimum values ​​is calculated and used as the frequency deviation floating value for subsequent use.

[0063] Step S405: determining the deviation floating influence value corresponding to the frequency deviation floating value according to the corresponding relationship between the frequency deviation floating value and the preset deviation floating influence value.

[0064] The deviation floating impact value refers to the impact degree value of the frequency deviation value on the interval when there is a floating change. Different frequency deviation floating values ​​correspond to different deviation floating impact values. The deviation floating impact value is obtained by querying from a database storing different frequency deviation floating values ​​and corresponding deviation floating impact values. The database is obtained after pre-input. The deviation floating impact value is determined by querying the frequency deviation floating value to facilitate subsequent use.

[0065] Step S406: adjusting the deviation average interval based on the deviation floating impact value to form a test deviation reference interval.

[0066] The deviation average interval is adjusted by the deviation floating influence value, and the adjusted interval is used as the test deviation reference interval, thereby improving the accuracy of the obtained test deviation reference interval.

[0067] exist Figure 1 In step S103, in order to further ensure the rationality of the result deviation value, it is necessary to further analyze and calculate the result deviation value separately, specifically by Figure 5 The steps shown are explained in detail.

[0068] Reference Figure 5 , the method for determining the result deviation value includes the following steps: Step S500: Retrieve the deviation frequency value, deviation result value and deviation number value based on the result deviation information.

[0069] Among them, the deviation frequency value refers to the frequency value corresponding to the deviation of the result, the deviation result value refers to the deviation value corresponding to the deviation of the result, and the deviation individual value refers to the individual value corresponding to the deviation of the result. The deviation frequency value, deviation result value and deviation individual value are retrieved through the result deviation information for subsequent use.

[0070] Step S501: determining a frequency unit result value corresponding to the deviation frequency value according to a correspondence relationship between the deviation frequency value and a preset frequency unit result value.

[0071] Among them, the frequency unit result value refers to the parameter value corresponding to the frequency with deviation in the result under the unit deviation. Different deviation frequency values ​​correspond to different frequency unit result values. The frequency unit result value is determined by querying from a database storing different deviation frequency values ​​and corresponding frequency unit result values. The database is obtained after pre-input. The frequency unit result value is determined by querying the deviation frequency value, which is convenient for subsequent use.

[0072] Step S502: Calculate the product value between the deviation result value and the frequency unit result value and use it as the single frequency result value.

[0073] The single-frequency result value refers to the parameter value corresponding to the deviation of the result at a single frequency. The product value between the deviation result value and the frequency unit result value is calculated and used as the single-frequency result value for convenience in subsequent use.

[0074] Step S503: Calculate the sum of the single frequency result values ​​and use it as the frequency result comprehensive value.

[0075] The comprehensive value of the frequency result refers to the parameter value corresponding to the deviation of the results at all frequencies. The sum of the single frequency result values ​​is calculated and used as the comprehensive value of the frequency result for subsequent use.

[0076] Step S504: Calculate the quotient between the frequency result comprehensive value and the deviation value and use it as the frequency result average value.

[0077] The frequency result average value refers to the parameter average value corresponding to the deviation of the result at the frequency corresponding to the deviation value. The quotient between the comprehensive value of the frequency result and the deviation value is calculated and used as the frequency result average value for convenience in subsequent use.

[0078] Step S505: determining the deviation number impact value corresponding to the deviation number value according to the corresponding relationship between the deviation number value and the preset deviation number impact value.

[0079] The deviation number impact value refers to the impact degree value corresponding to the deviation number's impact on the parameter value. Different deviation number values ​​correspond to different deviation number impact values. The deviation number impact value is obtained by querying from a database storing different deviation number values ​​and corresponding deviation number impact values. The database is obtained after pre-input. The deviation number impact value is determined by querying the deviation number value to facilitate subsequent use.

[0080] Step S506: Calculate the product of the frequency result average value and the deviation number influence value and use it as the frequency result adjustment value, and use the frequency result adjustment value as the result deviation value.

[0081] Among them, the frequency result adjustment value refers to the parameter adjustment value corresponding to the deviation of the result at the frequency corresponding to the deviation number value. The product value between the frequency result average value and the deviation number influence value is calculated and used as the frequency result adjustment value, and the frequency result adjustment value is used as the result deviation value, thereby improving the accuracy of the obtained result deviation value.

[0082] exist Figure 1 In step S104, in order to further ensure the rationality of the test parameter adjustment information, it is necessary to further analyze and calculate the test parameter adjustment information. Figure 6 The steps shown are explained in detail.

[0083] Reference Figure 6 , the method for determining the test parameter adjustment information comprises the following steps: Step S600: Determine whether the result deviation value falls within the result deviation reference interval. If yes, execute step S601; if no, execute step S602.

[0084] Here, it is determined whether the result deviation value falls within the result deviation reference interval to determine whether adjustment is required.

[0085] Step S601: outputting preset benchmark adjustment information as test parameter adjustment information.

[0086] The benchmark adjustment information refers to the adjustment information corresponding to when no adjustment is required, and the benchmark adjustment information is obtained after pre-input. When the result deviation value falls into the result deviation benchmark interval, it means that no adjustment is required at this time, so the preset benchmark adjustment information is output and used as the test parameter adjustment information, thereby improving the accuracy of the obtained test parameter adjustment information.

[0087] Step S602: Acquire test environment information.

[0088] Among them, the test environment information refers to parameter information such as temperature, humidity, and magnetic field strength of the environment in which the insertion loss test is performed. The test environment information is detected and acquired through temperature sensors, humidity sensors, and magnetic field strength sensors preset on the insertion loss test device.

[0089] Step S603: Determine the test environment abnormal value according to the test environment information.

[0090] The test environment abnormal value refers to the abnormal value corresponding to the abnormal environment when the insertion loss test is performed. The test environment abnormal value is determined by analyzing the test environment information to facilitate subsequent use. The specific steps for determining the test environment abnormal value refer to steps S700 to S708.

[0091] Step S604: Calculate the difference between the result deviation value and the result deviation reference interval and use it as the result deviation abnormal value.

[0092] Among them, the result deviation abnormal value refers to the abnormal value corresponding to the abnormal result deviation value. The difference between the result deviation value and the result deviation reference interval is calculated and used as the result deviation abnormal value for convenience in subsequent use.

[0093] Step S605: determining environment adjustment information according to the result deviation abnormal value and the test environment abnormal value, and using the environment adjustment information as the test parameter adjustment information.

[0094] The environment adjustment information refers to the adjustment information adjusted according to the environment conditions. The environment adjustment information is determined by analyzing the result deviation abnormal value and the test environment abnormal value, and the environment adjustment information is used as the test parameter adjustment information to improve the accuracy of the obtained test parameter adjustment information. The specific steps of the environment adjustment information refer to steps S800 to S804.

[0095] exist Figure 6 In step S603, in order to further ensure the rationality of the test environment abnormal value, it is necessary to further analyze and calculate the test environment abnormal value separately, specifically by Figure 7 The steps shown are explained in detail.

[0096] Reference Figure 7 ,The method for determining the abnormal value of the test environment includes the following steps: Step S700: Retrieve the ambient temperature value, ambient humidity value and ambient magnetic field value based on the test environment information.

[0097] Among them, the ambient temperature value refers to the temperature value of the environment during the insertion loss test, the ambient humidity value refers to the humidity value of the environment during the insertion loss test, and the ambient magnetic field value refers to the magnetic field strength value of the environment during the insertion loss test. The ambient temperature value, ambient humidity value, and ambient magnetic field value are retrieved through the test environment information for subsequent use.

[0098] Step S701: Retrieve the model temperature reference value, model humidity reference value and model magnetic field reference value based on the test component model information.

[0099] Among them, the model temperature reference value refers to the reference temperature value required when testing the model of the test component, the model humidity reference value refers to the reference humidity value required when testing the model of the test component, and the model magnetic field reference value refers to the reference magnetic field strength value required when testing the model of the test component. The model temperature reference value, model humidity reference value, and model magnetic field reference value are retrieved through the test component model information for subsequent use.

[0100] Step S702: Calculate the difference between the ambient temperature value and the model temperature reference value and use it as the temperature deviation value.

[0101] The temperature deviation value refers to the deviation value corresponding to the temperature deviation. The difference between the ambient temperature value and the model temperature reference value is calculated and used as the temperature deviation value for subsequent use.

[0102] Step S703: determining a temperature deviation influence value corresponding to the temperature deviation value according to a correspondence between the temperature deviation value and a preset temperature deviation influence value.

[0103] The temperature deviation impact value refers to the impact value caused by the temperature deviation. Different temperature deviation values ​​correspond to different temperature deviation impact values. The temperature deviation impact value is obtained by querying from a database storing different temperature deviation values ​​and corresponding temperature deviation impact values. The database is obtained after pre-input. The temperature deviation impact value is determined by querying the temperature deviation value to facilitate subsequent use.

[0104] Step S704: Calculate the difference between the ambient humidity value and the model humidity reference value and use it as the humidity deviation value.

[0105] The humidity deviation value refers to the deviation value corresponding to the humidity deviation. The difference between the ambient humidity value and the model humidity reference value is calculated and used as the humidity deviation value for subsequent use.

[0106] Step S705: determining a humidity deviation influence value corresponding to the humidity deviation value according to a correspondence between the humidity deviation value and a preset humidity deviation influence value.

[0107] The humidity deviation impact value refers to the impact value caused by the humidity deviation. Different humidity deviation values ​​correspond to different humidity deviation impact values. The humidity deviation impact value is obtained by querying from a database storing different humidity deviation values ​​and corresponding humidity deviation impact values. The database is obtained after pre-input. The humidity deviation impact value is determined by querying the humidity deviation value to facilitate subsequent use.

[0108] Step S706: Calculate the difference between the environmental magnetic field value and the model magnetic field reference value and use it as the magnetic field deviation value.

[0109] The magnetic field deviation value refers to the deviation value corresponding to the deviation of the magnetic field strength. The difference between the ambient magnetic field value and the model magnetic field reference value is calculated and used as the magnetic field deviation value for subsequent use.

[0110] Step S707: determining the magnetic field deviation influence value corresponding to the magnetic field deviation value according to the correspondence between the magnetic field deviation value and the preset magnetic field deviation influence value.

[0111] The magnetic field deviation impact value refers to the impact value caused by the deviation of the magnetic field strength. Different magnetic field deviation values ​​correspond to different magnetic field deviation impact values. The magnetic field deviation impact value is obtained by querying from a database storing different magnetic field deviation values ​​and corresponding magnetic field deviation impact values. The database is obtained after pre-input. The magnetic field deviation impact value is determined by querying the magnetic field deviation value to facilitate subsequent use.

[0112] Step S708: Calculate the sum of the temperature deviation impact value, the humidity deviation impact value and the magnetic field deviation impact value and use it as the test environment abnormal value.

[0113] The accuracy of the obtained test environment abnormal value is improved by calculating the sum of the temperature deviation influence value, the humidity deviation influence value and the magnetic field deviation influence value and taking it as the test environment abnormal value.

[0114] exist Figure 6 In step S605, in order to further ensure the rationality of the environment adjustment information, it is necessary to further analyze and calculate the environment adjustment information separately. Figure 8 The steps shown are explained in detail.

[0115] Reference Figure 8 , the method for determining the environment adjustment information includes the following steps: Step S800: Determine whether the result deviation abnormal value is less than the test environment abnormal value. If yes, execute step S801; if no, execute step S803.

[0116] Among them, by judging whether the result deviation abnormal value is smaller than the test environment abnormal value, it is judged whether adjustment is needed according to the abnormality of the test environment.

[0117] Step S801: Selecting an environmental impact value based on the comparison results of the temperature deviation impact value, the humidity deviation impact value and the magnetic field deviation impact value.

[0118] Among them, the environmental impact value refers to the impact value corresponding to the test environment. When the result deviation abnormal value is less than the test environment abnormal value, it means that adjustments need to be made based on the abnormality of the test environment. Therefore, the comparison results of the temperature deviation impact value, humidity deviation impact value and magnetic field deviation impact value are analyzed, and the maximum value among the temperature deviation impact value, humidity deviation impact value and magnetic field deviation impact value is taken as the environmental impact value for subsequent use.

[0119] Step S802: determining a corresponding relationship of environmental impact adjustment information according to the environmental impact value, so as to determine environmental impact adjustment information corresponding to the environmental impact value, and using the environmental impact adjustment information as environmental adjustment information.

[0120] The environmental impact adjustment information refers to the adjustment information adjusted according to the environmental impact value. Different environmental impact values ​​correspond to different environmental impact adjustment information. The environmental impact adjustment information is obtained by querying from a database storing different environmental impact values ​​and corresponding environmental impact adjustment information. The database is obtained after pre-input. The environmental impact adjustment information is determined by querying the environmental impact value, and the environmental impact adjustment information is used as the environmental adjustment information, thereby improving the accuracy of the obtained environmental adjustment information.

[0121] Step S803: Calculate the difference between the result deviation abnormal value and the test environment abnormal value and use it as the deviation abnormal adjustment value.

[0122] Among them, the deviation abnormality adjustment value refers to the adjustment value that needs to be adjusted to eliminate the abnormalities caused by the environment. When the result deviation abnormality value is not less than the test environment abnormality value, it means that there is no need to adjust according to the abnormality of the test environment at this time. Therefore, the difference between the result deviation abnormality value and the test environment abnormality value is calculated and used as the deviation abnormality adjustment value for subsequent use.

[0123] Step S804: determining contact adjustment information corresponding to the abnormal deviation adjustment value according to the correspondence between the abnormal deviation adjustment value and the preset contact adjustment information, and using the contact adjustment information as the environment adjustment information.

[0124] The contact adjustment information refers to the adjustment information for adjusting the placement of the test components. Different deviation abnormality adjustment values ​​correspond to different contact adjustment information. The contact adjustment information is obtained by querying from a database storing different deviation abnormality adjustment values ​​and corresponding contact adjustment information. The database is obtained after pre-input. The contact adjustment information is determined by querying the deviation abnormality adjustment value, and the contact adjustment information is used as the environment adjustment information, thereby improving the accuracy of the obtained environment adjustment information.

[0125] Based on the same inventive concept, an embodiment of the present invention provides a component insertion loss test system, including: An acquisition module is used to obtain loss test result information, test component model information and test environment information; A memory, used to store the component insertion loss test method as described above; The processor loads and executes the program in the memory.

[0126] Based on the same inventive concept, an embodiment of the present invention provides a terminal, including a memory and a processor, wherein the memory stores a component insertion loss test method as described above that can be loaded and executed by the processor.

[0127] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device and unit described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0128] The above is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above embodiments. All technical solutions under the concept of the present invention belong to the protection scope of the present invention. It should be pointed out that for ordinary technicians in this technical field, some improvements and modifications without departing from the principle of the present invention should also be regarded as the protection scope of the present invention.

Claims

1. A component insertion loss test method, characterized in that: include: Obtain loss test result information and test component model information; Determine the test benchmark result information and the result deviation benchmark range according to the test component model information; Analyze the deviation between the loss test result information and the test benchmark result information and use it as the result deviation information; determining a result deviation value according to the result deviation information; According to the falling condition of the result deviation value and the result deviation reference interval, the test parameter adjustment information is determined, and the test parameter adjustment information is output to the insertion loss test device for adjustment so as to re-perform the loss test.

2. The component insertion loss testing method according to claim 1, characterized in that: The method for determining the test benchmark result information and the result deviation benchmark range includes: Retrieve the core specification information, inductance value and effective wire diameter value based on the test component model information; Determine the initial test result information based on the core specification information and the inductance value; According to the corresponding relationship between the effective wire diameter value and the preset effective wire diameter influence value, the effective wire diameter influence value corresponding to the effective wire diameter value is determined; Adjusting the initial test result information based on the effective wire diameter influence value to form test adjustment result information; The test deviation reference interval is determined according to the test adjustment result information, and the test adjustment result information is used as the test reference result information, and the test deviation reference interval is used as the result deviation reference interval.

3. The component insertion loss testing method according to claim 2, characterized in that: Methods for determining the initial test result information include: Determine whether the core specification information exists; If yes, then retrieve the core permeability, core cross-sectional area and magnetic path length values ​​based on the core specification information; Determine the comprehensive inductance of the core based on the core permeability, core cross-sectional area, magnetic path length and inductance value; According to the correspondence between the magnetic core comprehensive inductance value and the preset magnetic core specification result information, the magnetic core specification result information corresponding to the magnetic core comprehensive inductance value is determined, and the magnetic core specification result information is used as the initial test result information; If not, the number of turns result information corresponding to the inductance value is determined according to the correspondence between the inductance value and the preset number of turns result information, and the number of turns result information is used as the initial test result information.

4. The component insertion loss testing method according to claim 3, characterized in that: The method for determining the test deviation reference interval includes: Based on the preset demand detection frequency value, the test adjustment result information is retrieved and used as the frequency detection value; Calculate the difference between the frequency detection value and the preset frequency reference value and use it as the frequency deviation value; Calculate the average value of the frequency deviation values ​​corresponding to each required detection frequency value and use it as the frequency deviation average value; According to the correspondence between the frequency deviation average value and the preset deviation average interval, the deviation average interval corresponding to the frequency deviation average value is determined; Select the maximum value and the minimum value based on the frequency deviation value corresponding to each required detection frequency value, and calculate the difference between the selected maximum value and the minimum value as the frequency deviation floating value; According to the corresponding relationship between the frequency deviation floating value and the preset deviation floating influence value, the deviation floating influence value corresponding to the frequency deviation floating value is determined; Based on the deviation floating impact value, the deviation average interval is adjusted to form a test deviation benchmark interval.

5. The component insertion loss testing method according to claim 1, characterized in that: The methods for determining the result deviation value include: Based on the result deviation information, retrieve the deviation frequency value, deviation result value and deviation number value; According to the correspondence between the deviation frequency value and the preset frequency unit result value, the frequency unit result value corresponding to the deviation frequency value is determined; Calculate the product value between the deviation result value and the frequency unit result value and use it as the single frequency result value; Calculate the sum of the single frequency result values ​​and use it as the comprehensive value of the frequency result; Calculate the quotient between the comprehensive value of the frequency result and the individual deviation value and use it as the average value of the frequency result; According to the correspondence between the deviation number value and the preset deviation number influence value, the deviation number influence value corresponding to the deviation number value is determined; The product value between the frequency result average value and the deviation number influence value is calculated and used as the frequency result adjustment value, and the frequency result adjustment value is used as the result deviation value.

6. The component insertion loss testing method according to claim 1, characterized in that: The method for determining the test parameter adjustment information includes: Determine whether the result deviation value falls within the result deviation reference interval; If yes, the preset reference adjustment information is output as the test parameter adjustment information; If not, obtain the test environment information; Determine test environment abnormal values ​​according to test environment information; Calculate the difference between the result deviation value and the result deviation benchmark interval and use it as the result deviation abnormal value; The environment adjustment information is determined according to the result deviation abnormal value and the test environment abnormal value, and the environment adjustment information is used as the test parameter adjustment information.

7. The component insertion loss testing method according to claim 6, characterized in that: Methods for determining test environment outliers include: Based on the test environment information, retrieve the ambient temperature value, ambient humidity value and ambient magnetic field value; Based on the model information of the test component, retrieve the model temperature reference value, model humidity reference value and model magnetic field reference value; Calculate the difference between the ambient temperature value and the model temperature reference value and use it as the temperature deviation value; According to the corresponding relationship between the temperature deviation value and the preset temperature deviation influence value, the temperature deviation influence value corresponding to the temperature deviation value is determined; Calculate the difference between the ambient humidity value and the model humidity reference value and use it as the humidity deviation value; According to the corresponding relationship between the humidity deviation value and the preset humidity deviation influence value, the humidity deviation influence value corresponding to the humidity deviation value is determined; Calculate the difference between the environmental magnetic field value and the model magnetic field reference value and use it as the magnetic field deviation value; According to the correspondence between the magnetic field deviation value and the preset magnetic field deviation influence value, the magnetic field deviation influence value corresponding to the magnetic field deviation value is determined; The sum of the temperature deviation impact value, humidity deviation impact value and magnetic field deviation impact value is calculated and used as the test environment abnormal value.

8. The component insertion loss testing method according to claim 7, characterized in that: Methods for determining environmental adjustment information include: Determine whether the result deviation abnormal value is smaller than the test environment abnormal value; If yes, then based on the comparison results of the temperature deviation impact value, the humidity deviation impact value and the magnetic field deviation impact value, an environmental impact value is selected; Determine a corresponding relationship of environmental impact adjustment information according to the environmental impact value, so as to determine the environmental impact adjustment information corresponding to the environmental impact value, and use the environmental impact adjustment information as the environmental adjustment information; If not, the difference between the result deviation anomaly value and the test environment anomaly value is calculated and used as the deviation anomaly adjustment value; According to the correspondence between the deviation abnormality adjustment value and the preset contact adjustment information, the contact adjustment information corresponding to the deviation abnormality adjustment value is determined, and the contact adjustment information is used as the environment adjustment information.

9. A component insertion loss test system, characterized in that: include: An acquisition module is used to obtain loss test result information, test component model information and test environment information; A memory, used to store the component insertion loss test method according to any one of claims 1 to 8; The processor loads and executes the program in the memory.

10. A terminal, characterized in that: The method comprises a memory and a processor, wherein the memory stores a component insertion loss test method as claimed in any one of claims 1 to 8 which can be loaded and executed by the processor.

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