Measuring method based on three-dimensional scanning, three-dimensional scanning device and three-dimensional scanning system

Abstract

The invention discloses a measuring method based on three-dimensional scanning, a three-dimensional scanning device and a three-dimensional scanning system. The measuring method based on three-dimensional scanning is suitable for the three-dimensional scanning device and the three-dimensional scanning system. The three-dimensional scanning-based measurement method comprises the following steps of: manufacturing an adapter for binding mark point data of a plurality of mark points and the type of the adapter, and obtaining a first mapping relationship between a working surface of the adapter and the mark points; the adapter definition is used for determining the feature type of the to-be-detected feature; the adapter is measured, the adapter is arranged on a bearing object with the to-be-measured features, and the first feature of the to-be-measured features is determined according to the mark point data, the first mapping relation and the feature types of the to-be-measured features. Through the arrangement, the to-be-detected features which cannot be in direct contact can be scanned, and the efficiency and precision of obtaining the first feature of the to-be-detected features are improved.

Description

Technical Field

[0001] The present application relates to the field of three-dimensional scanning technology, and in particular to a measurement method based on three-dimensional scanning, a three-dimensional scanning device and a three-dimensional scanning system. Background Art

[0002] In current technology, it is necessary to measure the geometric tolerances of the workpiece, such as thickness, flatness, and cylindricity, to check whether the workpiece is qualified. Before measurement, it is necessary to reconstruct the geometric features of the workpiece. The current reconstruction methods include the following: scanning the point cloud data of the workpiece through a three-dimensional scanning device, and fitting the point cloud data to output the required features; using a tracking measurement light pen to detect multiple feature points on the surface of the workpiece, and fitting the features of the workpiece through the above feature points; using a contact three-dimensional coordinate measuring instrument, contacting the workpiece through its measuring probe, and obtaining the feature points on the surface of the workpiece, so as to fit the required features. However, the above reconstruction method requires a unique measuring device, and the operation of the above measuring device is relatively complicated, which will lead to the low efficiency of the above reconstruction method. Secondly, the above measuring equipment has high requirements for the environment, and the environment has a greater impact on the measurement accuracy of the measuring equipment. Therefore, if the environmental requirements cannot be met, the accuracy of the above reconstruction method will be insufficient.

[0003] Finally, for workpieces that cannot be directly contacted but only indirectly contacted, the existing technology cannot achieve the measurement of such workpieces.

[0004] Therefore, how to improve the accuracy and efficiency of acquiring workpiece features and measure workpieces that cannot be directly contacted is a technical problem that urgently needs to be solved in this field. Summary of the invention

[0005] In order to address the deficiencies of the prior art, the purpose of the present application is to provide a measurement method, a three-dimensional scanning device and a three-dimensional scanning system based on three-dimensional scanning, which can scan features to be measured that cannot be directly contacted, and improve the efficiency and accuracy of obtaining the first feature of the feature to be measured.

[0006] To achieve the above objectives, this application adopts the following technical solutions:

[0007] A measurement method based on three-dimensional scanning is applicable to a three-dimensional scanning system. The measurement method includes: adapter production, which is used to bind the marking point data of several marking points with the type of the adapter; adapter definition, which is used to determine the feature type of the feature to be measured and obtain the first mapping relationship between the working surface of the adapter and the marking point; adapter measurement, which is to arrange the adapter on the carrier of the feature to be measured, and determine the first feature of the feature to be measured according to the marking point data, the first mapping relationship and the feature type of the feature to be measured.

[0008] Furthermore, the measurement method based on three-dimensional scanning includes:

[0009] Adapter production: obtaining the type of the adapter; placing a number of marking points on the adapter, and binding the marking point data of the number of marking points to the type of the adapter, wherein the marking point data includes positioning data and identification data bound to the type of the adapter;

[0010] Adapter definition: determining the feature type of the feature to be measured; selecting at least one working surface on the adapter, and obtaining a first mapping relationship between the working surface and the positioning data of the marking point;

[0011] Adapter measurement: The adapter is arranged on the carrier of the feature to be measured, and the marking point data on the adapter is obtained; the position of the working surface in the three-dimensional scan is determined according to the marking point data and the first mapping relationship; based on the position of the working surface and the feature type of the feature to be measured, the first feature of the feature to be measured is determined.

[0012] Furthermore, the adapter definition also includes: determining a second feature of the feature to be measured, the second feature being different from the first feature; determining the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured, including: determining the first feature of the feature to be measured based on the position of the working surface, the second feature and the feature type of the feature to be measured.

[0013] Furthermore, based on the position of the working surface and the feature type of the feature to be measured, the first feature of the feature to be measured is determined, including: obtaining the contact position between the feature to be measured and the working surface; determining the second mapping relationship between the contact position and the marking point according to the position of the working surface, the second feature and the first mapping relationship; and determining the first feature of the feature to be measured based on the second mapping relationship and the feature type of the feature to be measured.

[0014] Furthermore, based on the position of the working surface and the feature type of the feature to be measured, the first feature of the feature to be measured is determined, including: obtaining the contact position between the feature to be measured and the working surface; determining the second mapping relationship between the contact position and the marking point according to the position of the working surface and the first mapping relationship; and determining the first feature of the feature to be measured based on the second mapping relationship and the feature type of the feature to be measured.

[0015] Further, obtaining the type of the adapter includes: scanning the adapter to obtain the type of the adapter; or configuring the adapter to a preset model of a known type to obtain the type of the adapter.

[0016] Furthermore, the marking point data of the plurality of marking points are bound to the type of the adapter, including: scanning and acquiring the identification data of the plurality of marking points; matching the acquired type of the adapter with the identification data of the plurality of marking points to bind the identification data of the plurality of marking points to the type of the adapter.

[0017] To achieve the above objectives, this application adopts the following technical solutions:

[0018] A three-dimensional scanning device includes an adapter manufacturing module, an adapter definition module and an adapter measurement module. The adapter manufacturing module is used to bind the marking point data of a plurality of marking points with the type of the adapter; the adapter definition module is used to determine the feature type of the feature to be measured and obtain a first mapping relationship between the working surface of the adapter and the marking point; when the adapter is arranged on a carrier of the feature to be measured, the adapter measurement module determines the first feature of the feature to be measured according to the marking point data, the first mapping relationship and the feature type of the feature to be measured.

[0019] Further, the adapter making module can obtain the type of the adapter; and / or, the adapter making module can bind the marking point data of several marking points to the type of the adapter, wherein the marking point data includes positioning data and identification data bound to the type of the adapter; and / or, the adapter definition module can select at least one working surface on the adapter and obtain a first mapping relationship between the working surface and the positioning data of the marking point; and / or, the adapter definition module can determine the feature type of the feature to be measured; and / or, the adapter definition module can determine the second feature of the feature to be measured, the second feature being different from the first feature; and / or, the adapter measurement module can obtain the marking point data on the adapter when the adapter is arranged on the carrier of the feature to be measured; and / or, the adapter measurement module can determine the position of the working surface in the three-dimensional scan based on the marking point data and the first mapping relationship; and / or, the adapter measurement module can determine the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured; and / or, the adapter measurement module can determine the first feature of the feature to be measured based on the position of the working surface, the second feature and the feature type of the feature to be measured.

[0020] To achieve the above objectives, this application adopts the following technical solutions:

[0021] A three-dimensional scanning system comprises the three-dimensional scanning device mentioned above.

[0022] The above-mentioned three-dimensional scanning-based measurement method, three-dimensional scanning device and three-dimensional scanning system can scan the features to be measured that cannot be directly contacted, that is, they can scan the features to be measured that can only be indirectly contacted; secondly, the three-dimensional scanning-based measurement method of the present application has low requirements on the environment, and the three-dimensional scanning-based measurement method can thus improve the accuracy of obtaining the first feature of the feature to be measured. Finally, for the three-dimensional point cloud measurement system, the three-dimensional scanning-based measurement method of the present application does not need to fit the point cloud into features before measuring the features, which is especially beneficial for large features to be measured. The efficiency of obtaining the first feature of the feature to be measured is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1A hardware structure block diagram of a terminal for a three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0024] Figure 2 A flow chart of a three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0025] Figure 3 This is a specific flow chart of step S1 in the three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0026] Figure 4 A first specific flow chart of a three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0027] Figure 5 A second specific flow chart of the three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0028] Figure 6 This is a specific flow chart of step S2 in the three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0029] Figure 7 This is a specific flow chart of step S3 in the three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0030] Figure 8 This is a first specific flow chart of step S33 in the three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0031] Fig. 9 This is a second specific flow chart of step S33 in the three-dimensional scanning-based measurement method provided in an embodiment of the present application.

[0032] Fig.10 A schematic diagram of the structure of an adapter provided in an embodiment of the present application.

[0033] Fig.11 A cross-sectional view of an adapter provided in an embodiment of the present application.

[0034] Fig.12 Another schematic diagram of the structure of the adapter provided in an embodiment of the present application.

[0035] Fig.13 A structural cross-sectional view of a fixing member of an adapter provided in an embodiment of the present application.

[0036] Fig.14 This is a structural block diagram of a three-dimensional scanning device according to an embodiment of the present application. DETAILED DESCRIPTION

[0037] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the specific implementation manner of the present application will be clearly and completely described below in conjunction with the drawings in the implementation manner of the present application.

[0038] It should be noted that the words "first", "second" and similar words used in the specification and claims of this application do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, words such as "one" or "a" do not indicate a quantitative limitation, but indicate the existence of at least one. "Multiple" or "several" means at least two. Unless otherwise specified, words such as "front", "back", "left", "right", "bottom" and / or "top" are only for the convenience of description and are not limited to one position or one spatial orientation. Words such as "include" or "comprise" mean that the elements or objects appearing before "include" or "comprise" include the elements or objects listed after "include" or "comprise" and their equivalents, and do not exclude other elements or objects. Words such as "connect" or "connected" are not limited to physical or mechanical connections, and may include electrical connections, whether direct or indirect.

[0039] The singular forms "a", "said" and "the" used in this specification and the appended claims are also intended to include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the term "and / or" used herein refers to and includes any or all possible combinations of one or more of the associated listed items.

[0040] The method embodiment provided in this embodiment can be executed in the terminal 100, a computer or a similar computing device. For example, running on the terminal 100, Figure 1 1 is a hardware structure block diagram of a terminal 100 for executing a measurement method based on three-dimensional scanning according to an embodiment of the present application. Figure 1 As shown, the terminal 100 may include one or more ( Figure 1 The terminal 100 may also include a transmission device 13 and an input / output device 14 for communication functions. It can be understood by those skilled in the art that Figure 1 The structure shown is only for illustration and does not limit the structure of the terminal 100. For example, the terminal 100 may also include Figure 1 More or fewer components as shown, or with Figure 1 Different configurations shown.

[0041] The memory 12 can be used to store computer programs, for example, software programs and modules of application software, such as a computer program corresponding to a measurement method based on three-dimensional scanning in this embodiment. The processor 11 executes various functional applications and data processing by running the computer program stored in the memory 12, that is, to implement the above method. The memory 12 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 12 may further include a memory 12 remotely arranged relative to the processor 11, and these remote memories 12 may be connected to the terminal 100 via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and a combination thereof.

[0042] The transmission device 13 is used to receive or send data via a network. The above network includes a wireless network provided by a communication provider of the terminal 100. In one example, the transmission device 13 includes a network adapter (Network Interface Controller, referred to as NIC), which can be connected to other network devices through a base station so as to communicate with the Internet. In one example, the transmission device 13 can be a radio frequency (Radio Frequency, referred to as RF) module, which is used to communicate with the Internet wirelessly.

[0043] This embodiment provides a measurement method based on three-dimensional scanning. Figure 2 This is a flow chart of a measurement method based on three-dimensional scanning in an embodiment of the present application. The measurement method based on three-dimensional scanning is suitable for a three-dimensional scanning system, which is used to scan features to be measured that cannot be directly contacted, that is, the measurement method based on three-dimensional scanning is used to scan features to be measured that can only be indirectly contacted.

[0044] It should be noted that the three-dimensional scanning-based measurement method of the embodiment of the present application can also be applied to features to be measured that can be directly contacted.

[0045] It should be noted that the three-dimensional scanning-based measurement method in the embodiment of the present application is described by taking the feature to be measured that can be applied to indirect contact as an example.

[0046] like Figure 2 As shown, the measurement method based on three-dimensional scanning includes the following steps:

[0047] S1: Adapter creation, used to bind the marker data of several markers to the adapter type.

[0048] S2: Adapter definition, used to determine the feature type of the feature to be measured and obtain the first mapping relationship between the working surface of the adapter and the marking point.

[0049] For example, in step S1, the number of marking points may be one, in which case the marking points are coded marking points, or the number of marking points may be at least four, in which case the marking points are common circular marking points.

[0050] For example, the marking point may be a reflective marking point, or a self-luminous marking point, that is, the present application does not limit the number and type of marking points.

[0051] Exemplarily, in step S1, the marking point data of the marking points include but are not limited to the number of marking points, the relative positions between the marking points, the size of the marking points, the shape of the marking points, etc.

[0052] Exemplarily, in step S1, after the marking point data of several marking points are bound to the type of the adapter, the marking point data can be used to correspond to the corresponding adapter type, so that the efficiency of identifying the adapter type can be improved through the marking point data. Specifically, after the marking point data is bound to the type of the adapter, the binding relationship between the two can be stored in the memory 12, so as to facilitate the subsequent processor 11 to call or identify the above binding relationship.

[0053] Exemplarily, in step S2, the marking point data can be acquired through the input and output device 14, and the marking point data can be transmitted to the memory 12 through the transmission device 13, so that the processor 11 can call the data acquired by the input and output device 14. The transmission device 13 and the input and output device 14 can be components of the three-dimensional scanning system. Or the input and output device 14 can be a three-dimensional scanning system, and the transmission device 13 can be other wireless transmission devices.

[0054] Exemplarily, in step S2, the adapter includes at least one working surface, and the working surface is used to contact the feature to be measured to form a contact position. In the present application, the first mapping relationship between the working surface of the adapter and the marking point can be obtained through the input and output device 14. Specifically, the present application obtains the first mapping relationship between the working surface of the adapter and the marking point through a three-dimensional scanning system. Through the above settings, the relative relationship between the working surface of the adapter and the marking point can be converted through the first mapping relationship.

[0055] As an implementation method, the three-dimensional scanning system includes a monocular vision camera or a multi-eye vision camera, which uses the monocular vision camera or the multi-eye vision camera to perform spatial three-dimensional reconstruction of the adapter to obtain marker point data such as marker point coordinates and the number of marker points on the adapter.

[0056] Similarly, a first mapping relationship between the working surface of the adapter and the marking point can also be obtained using a monocular vision camera or a multi-eye vision camera.

[0057] Among them, in step S2, the feature type of the feature to be measured is input into the memory 12, so that the processor 11 can obtain the feature to be measured through the three-dimensional scanning-based measurement method of the present application, whether it is a point, line, surface, circle, cylinder, cone, sphere, threaded hole, stud, etc., so as to facilitate the subsequent feature acquisition of the feature to be measured. Specifically, after the processor 11 obtains the feature type of the feature to be measured and the adapter type in the memory 12, the processor 11 can obtain the specific feature type of the feature to be measured through the three-dimensional scanning-based measurement method of the present application.

[0058] S3: Adapter measurement: placing the adapter on the carrier of the feature to be measured, and determining the first feature of the feature to be measured according to the marking point data, the first mapping relationship, and the feature type of the feature to be measured.

[0059] In step S3, since the feature to be measured may be a virtual body, such as a threaded hole, etc., it is necessary to place the adapter on a carrier of the feature to be measured so that the carrier can support the adapter, thereby facilitating the measurement of the feature to be measured.

[0060] It can be understood that when the feature to be measured is a solid object, such as a cylinder, a cone, etc., the carrier of the feature to be measured is the feature itself.

[0061] Exemplarily, since the memory 12 can record the marker point data, in step S3, the three-dimensional scanning system first identifies the marker point, and then aligns the identified marker point data with the marker point data recorded in the memory 12 in step S1, thereby obtaining a coordinate transformation matrix according to the marker point data and the first mapping relationship, and the mapping relationship between the working surface of the adapter and the marker point during the measurement process can be determined according to the coordinate transformation matrix, and then the first feature of the feature to be measured can be determined according to the feature type of the feature to be measured. Among them, the coordinate transformation matrix includes a translation matrix and a rotation matrix.

[0062] Through the above-mentioned settings, the three-dimensional scanning-based measurement method of the present application can scan the features to be measured that cannot be directly contacted, that is, the three-dimensional scanning-based measurement method can scan the features to be measured that can only be indirectly contacted. Secondly, the three-dimensional scanning-based measurement method of the present application has low requirements on the environment, that is, the three-dimensional scanning-based measurement method of the present application can be applied to on-site measurement, so the impact of the environment on the three-dimensional scanning-based measurement method of the present application is relatively low, so that the three-dimensional scanning-based measurement method of the present application has a higher accuracy in obtaining the first feature of the feature to be measured. Finally, for the three-dimensional point cloud measurement system, the three-dimensional scanning-based measurement method of the present application does not need to fit the point cloud into features before measuring the features, especially for large features to be measured, the efficiency of obtaining the features of the features to be measured is higher, that is, it is conducive to improving the efficiency of obtaining the first feature of the feature to be measured.

[0063] As an implementation method, the feature to be measured is a threaded hole, and the characteristic parameter to be measured is the center axis of the threaded hole. That is, the first feature is the center axis of the threaded hole. At this time, the adapter can be a hemispherical structure, and the marking point is located on the center of the adapter. Specifically, the adapter with the hemispherical structure is placed on the carrier where the threaded hole is located, so that the spherical surface of the hemisphere is in contact with the threaded hole, wherein the spherical surface of the hemisphere is the working surface of the adapter. At this time, no matter what position the hemispherical structure is in, its center is always located on the center axis of the threaded hole, and at this time, the first mapping relationship between the working surface of the adapter and the marking point, the feature type of the feature to be measured, and the marking point data are known, so that the position of the center axis of the threaded hole can be obtained by obtaining the position of the marking point, and the first feature can be obtained.

[0064] like Figure 3 , Figure 4 and Figure 5 As shown, as an implementation method, step S1 includes the following steps:

[0065] S11: Get the type of adapter.

[0066] The adapter type is not unique. For example, Figure 4 As shown, step S11 includes:

[0067] S111: Scan the adapter to obtain the type of the adapter.

[0068] In step S111, a monocular vision camera or a multi-eye vision camera may be used to perform spatial three-dimensional reconstruction on the adapter to obtain the type of the adapter.

[0069] Or, if Figure 5 As shown, step S11 includes:

[0070] S112: Configuring the adapter to be a preset model of known type to obtain the type of the adapter.

[0071] The type of the adapter may be first stored in the memory 12 , so that the processor 11 can obtain the type of the adapter through a preset model of the adapter in the memory 12 .

[0072] It should be noted that the method for obtaining the adapter type is not limited to the above-mentioned method.

[0073] S12: placing a number of marking points on the adapter, and binding the marking point data of the number of marking points to the type of the adapter, wherein the marking point data includes positioning data and identification data bound to the type of the adapter.

[0074] In step S12, a common circular marking point is used as an example for explanation. At least four marking points are placed on the adapter, so that the three-dimensional scanning system can obtain the marking point data of several marking points. Combined with the type of adapter obtained in step S11, the identification data of several marking points and the type of adapter can be bound, that is, the type of adapter can be obtained through the identification data of several marking points.

[0075] More specifically, step S12 includes the following steps:

[0076] S121: Scan and obtain identification data of several marking points;

[0077] S122: Match the acquired adapter type with the identification data of the plurality of marking points to bind the identification data of the plurality of marking points with the adapter type.

[0078] Among them, step S121 scans and obtains identification data of several marking points through a three-dimensional scanning system, wherein the identification data includes but is not limited to the distribution, shape, size, etc. of the several marking points. Specifically, the identification data of the several marking points are obtained through a monocular vision camera or a multi-eye vision camera.

[0079] In step S122, the identification data of a plurality of marking points and the type of the adapter may be matched one by one and stored in the memory 12, so that the type of the adapter may be obtained through the identification data.

[0080] like Figure 6 As shown, as an implementation method, step S2 includes the following steps:

[0081] S21: Determine the feature type of the feature to be measured. Step S21 is basically the same as step S2, and will not be described in detail here.

[0082] S22: Select at least one working surface on the adapter, and obtain a first mapping relationship between the working surface and the positioning data of the marking point.

[0083] In step S22, due to the different types of features to be measured, the number of working surfaces on the adapter that contact the features to be measured is different. For example, when the features to be measured are points, lines, edges, etc., the features to be measured only contact one working surface. When the features to be measured are cylinders, etc., the features to be measured contact at least two working surfaces.

[0084] Exemplarily, in step S22, a first mapping relationship between the positioning data of the work surface and the marking point can be obtained by a three-dimensional scanning system. Specifically, a monocular vision camera or a multi-eye vision camera can be used to perform spatial three-dimensional reconstruction on the adapter to obtain marking point data such as the coordinates of the marking points on the adapter.

[0085] like Figure 7 As shown, as an implementation method, step S3 includes the following steps:

[0086] S31: The adapter is arranged on the carrier of the feature to be measured, and the marking point data on the adapter is obtained;

[0087] S32: determining the position of the working surface in the three-dimensional scanning according to the marking point data and the first mapping relationship;

[0088] S33: Determine a first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured.

[0089] In step S32, the marking point data acquired by the three-dimensional scanning system in step S31 and the first mapping relationship acquired in step S1 can be converted into the position of the working surface in the three-dimensional scanning.

[0090] In step S33, since the position of the working surface has been obtained in step S32 and the feature type of the feature to be measured has been determined in step S2, the first feature of the feature to be measured can be determined based on the above data.

[0091] Exemplarily, the case where the feature to be measured is a circle, the two working surfaces of the adapter in contact with the circle are perpendicular to each other, and the first feature is the center of the circle is used for explanation. First, the three-dimensional scanning system can identify the marking point to obtain the identification data and positioning data of the marking point. Secondly, the type of the adapter can be confirmed by the identification data of the marking point. Then, the adapter is arranged on the feature to be measured. At this time, the feature to be measured is in contact with the two working surfaces of the adapter, thereby forming two contact positions. Since the above-mentioned two working surfaces are perpendicular to each other and the feature to be measured is a circle, the position of the center of the circle can be determined. Specifically, since the positioning data of the marking point is known, the positions of the two working surfaces can be obtained through the marking point data and the first mapping relationship, and through the coordinate transformation matrix, the positions of the two contact positions of the two working surfaces with the circle can be obtained, and then the position of the center of the circle can be obtained.

[0092] It should be noted that, since the two working surfaces in the above embodiment may not be perpendicular to each other, at this time, only the type of the feature to be measured is known, that is, the type of the feature to be measured is a circle, and the position of the center of the circle cannot be determined. Therefore, in order to obtain the position of the center of the circle in the above case, Figure 6 As shown, step S2 in the present application also includes the following steps:

[0093] S23: determining a second feature of the feature to be measured, where the second feature is different from the first feature;

[0094] For example, the feature to be measured is a circle, and the first feature is the center of the circle. The second feature can be the diameter of the circle, etc., so the first feature of the feature to be measured, that is, the position of the center of the circle, can be determined by the second feature (the diameter of the circle, etc.), the position of the working surface, and the feature type of the feature to be measured.

[0095] At this time, step S33 may be the following steps:

[0096] The first feature of the feature to be measured is determined based on the position of the working surface, the second feature, and the feature type of the feature to be measured.

[0097] like Figure 8 As shown, more specifically, step S33 includes the following steps:

[0098] S331: Acquire the contact position between the feature to be measured and the working surface;

[0099] S332: Determine a second mapping relationship between the contact position and the marking point according to the position of the working surface, the second feature, and the first mapping relationship;

[0100] S333: Determine a first feature of the feature to be measured based on the second mapping relationship and the feature type of the feature to be measured.

[0101] Or, if Fig. 9 As shown, when step S2 does not include step S22, step S33 may include the following steps:

[0102] S331: Acquire the contact position between the feature to be measured and the working surface;

[0103] S332: Determine a second mapping relationship between the contact position and the marking point according to the position of the working surface and the first mapping relationship;

[0104] S333: Determine a first feature of the feature to be measured based on the second mapping relationship and the feature type of the feature to be measured.

[0105] That is, the present application does not restrict whether the second feature is known or not, and only requires that the first feature can be acquired.

[0106] like Fig.10 and Fig.11 As shown, as an implementation, the present application further provides an adapter 300, which is used to measure parameters of a cylindrical object to be measured in three-dimensional scanning.

[0107] The adapter 300 includes an adapter body 31 and a fixing member 32 .

[0108] The adapter body 31 includes a first contact surface 311 and a second contact surface 312 both of which are in contact with the object to be measured, and the angle between the first contact surface 311 and the second contact surface 312 is a preset angle, so as to facilitate obtaining the mapping relationship between the first contact surface 311 and the marking point 34 and the mapping relationship between the second contact surface 312 and the marking point 34 through the above-mentioned three-dimensional scanning-based measurement method. The first contact surface 311 and the second contact surface 312 are the working surfaces in the three-dimensional scanning method.

[0109] The fixing member 32 is movably connected to the adapter body 31, and the fixing member 32 includes a fixed position and a separation position separated from the object to be measured. When the fixing member 32 is in the fixed position, the fixing member 32, the first contact surface 311 and the second contact surface 312 cooperate to fix the object to be measured. Through the above arrangement, the object to be measured can be fixed, so that the object to be measured can be prevented from being offset during the measurement process, thereby improving the accuracy of obtaining the first feature of the object to be measured. In addition, the three-dimensional scanning system can simplify the scanning steps and scanning data through the adapter 300, that is, the three-dimensional scanning system can measure the first feature of the object to be measured without scanning the entire object to be measured, thereby improving the efficiency of obtaining the first feature of the object to be measured.

[0110] As an implementation method, the fixing member 32 is provided with an external thread 33, the adapter body 31 is provided with a threaded hole 313, and the fixing member 32 is movably connected to the threaded hole 313 through the external thread 33. Through the above arrangement, the adapter 300 can be applied to objects to be measured with different diameters, thereby improving the versatility of the adapter 300. In addition, the threaded connection can improve the movement accuracy of the fixing member 32, thereby improving the accuracy of obtaining the first feature of the object to be measured.

[0111] It should be noted that the movable connection between the fixing member 32 and the adapter body 31 may also be:

[0112] The adapter body 31 is provided with a cylinder, and a movable end of the cylinder is fixedly connected to the fixing member 32 , so as to realize the movement of the fixing member 32 .

[0113] Alternatively, the fixing member 32 is a pin, a through hole is provided on the adapter body 31, and the pin and the through hole are interference fit so that the pin can be fixed relative to the adapter body 31, and the interference fit can cause the through hole and the pin to move relative to each other when a force is applied, thereby moving the pin.

[0114] It should be noted that the manner of movable connection between the fixing member 32 and the adapter body 31 is not limited to the above manner, and this application does not impose any limitation thereto.

[0115] like Fig.10 and Fig.12 As shown, as an implementation, the adapter body 31 includes a first body 314, a second body 315 and a third body 316, the first contact surface 311 is located on the first body 314, the second contact surface 312 is located on the second body 315, the fixing member 32 is movably connected to the third body 316, and the first body 314, the second body 315 and the third body 316 are surrounded by a receiving space 301 for receiving at least part of the object to be tested. Through the above arrangement, the object to be tested can be located in the receiving space 301, so as to facilitate the fixing member 32, the first contact surface 311 and the second contact surface 312 to cooperate and fix the object to be tested.

[0116] like Fig.12 As shown, exemplarily, the first body 314 and the second body 315 are fixedly connected or integrally formed, and the third body 316 is fixedly connected or integrally formed with the first body 314 , so that the third body 316 can be fixed on the first body 314 , and the fixing member 32 is fixed to the first body 314 through the third body 316 .

[0117] In this embodiment, since the second body 315 and the third body 316 are not connected, a gap 317 for the object to be measured to pass through is formed between the second body 315 and the third body 316, so that the object to be measured can enter the accommodating space 301 through the gap 317. It should be noted that, when the object to be measured is long and it is not easy to sleeve the adapter 300 from one end of the object to be measured, the gap 317 can facilitate the fixation between the adapter 300 and the object to be measured.

[0118] like Fig.10 As shown, illustratively, the first body 314 and the second body 315 are fixedly connected or integrally formed, the third body 316 is fixedly connected or integrally formed with the first body 314, and the third body 316 is fixedly connected or integrally formed with the second body 315. At this time, there is no gap 317 between the third body 316 and the second body 315. Through the above arrangement, the stability of the third body 316 can be improved, so that the working stability of the fixing member 32 is higher, thereby improving the accuracy of obtaining the first feature of the object to be measured.

[0119] like Fig.13 As shown, as an implementation method, the fixing member 32 includes a fixing body 321, a fixing head 322 and an elastic member 323, the fixing body 321 is movably connected to the adapter body 31, the fixing head 322 is at least partially located in the fixing body 321, and the elastic member 323 is located in the fixing body 321.

[0120] The fixing head 322 is movably connected to the fixing body 321, and the two ends of the elastic member 323 are respectively in contact with the fixing body 321 and the fixing head 322. The elastic member 323 has a preload force acting on the fixing head 322. When the fixing member 32 is in a fixed position, the preload force makes the fixing head 322 maintain the contact position with the object to be measured. Through the above arrangement, the object to be measured can be kept in contact with the first contact surface 311 and the second contact surface 312, which is conducive to improving the fixing stability between the object to be measured and the adapter 300, and then improving the working stability of the fixing member 32, so as to improve the accuracy of obtaining the first feature of the object to be measured.

[0121] like Fig.11 As shown, as an optional implementation, the fixing member 32 moves relative to the adapter body 31 along the preset straight line 303, defining a preset plane 302 perpendicular to the preset straight line 303, and the preset plane 302, the first contact surface 311 and the second contact surface 312 are not parallel to each other. Through the above arrangement, the directions of any two forces for fixing the object to be measured can be non-parallel, thereby preventing the object to be measured from moving under the action of three forces, that is, three fixed points can be used to fix the cylindrical object to be measured.

[0122] like Fig.10 As shown, in the present application, the adapter 300 further includes a marking point 34 at a preset position relative to the adapter body 31, and the marking point 34 is located on the adapter body 31 or is detachably connected to the adapter body 31. Specifically, the marking point 34 can be bonded to the adapter body 31, or the marking point 34 can be fixed to the adapter body 31 by plugging, etc., and the present application does not limit the method of fixing the marking point 34 to the adapter body 31.

[0123] Exemplarily, the description is made by taking the example that the feature to be measured is a cylinder, the first contact surface 311 and the second contact surface 312 are perpendicular to each other, and the first feature is the center of the circle.

[0124] First, the three-dimensional scanning system can identify the marking point 34 on the adapter 300 to obtain the identification data and positioning data of the marking point 34 .

[0125] Secondly, the type of the adapter 300 can be confirmed by the identification data of the marking point 34, that is, it can be confirmed that the adapter 300 can measure a cylinder. It should be noted that the adapter 300 includes but is not limited to being able to measure a cylinder.

[0126] Then, the adapter 300 is arranged on the cylinder to be measured. At this time, the cylinder contacts the first contact surface 311 and the second contact surface 312 respectively, thereby forming two contact positions. Since the first contact surface 311 and the second contact surface 312 are perpendicular to each other, and the feature to be measured is a cylinder, the position of the center of the cylinder can be determined. Specifically, since the positioning data of the marking point 34 is known, the positions of the first contact surface 311 and the second contact surface 312 can be obtained through the marking point data, the first mapping relationship and the coordinate transformation matrix, so that the position of the contact position between the cylinder and the first contact surface 311 and the position of the contact position between the cylinder and the second contact surface 312 can be obtained, and then the position of the center of the cylinder can be obtained.

[0127] It should be noted that, since the first contact surface 311 and the second contact surface 312 in the above embodiment may not be perpendicular to each other, at this time, only the type of the feature to be measured is known, that is, the type of the feature to be measured is a cylinder, and the position of the center of the cylinder cannot be determined. Therefore, in order to obtain the position of the center of the cylinder in the above situation, it is also necessary to provide a second feature of the cylinder, such as the diameter of the cylinder.

[0128] As an implementation manner, the present application also provides a three-dimensional scanning system, which includes the adapter 300 mentioned above.

[0129] like Fig.14 As shown, as an implementation, the present application also provides a three-dimensional scanning device 200, which is used to implement the above-mentioned embodiments and preferred implementation modes, and will not be repeated hereafter. The terms "module", "unit", "subunit", etc. used below may be a combination of software and / or hardware that implements predetermined functions. Although the devices described in the following embodiments are preferably implemented in software, the implementation in hardware, or a combination of software and hardware, is also possible and conceivable.

[0130] like Fig.14 As shown, it is a structural block diagram of a three-dimensional scanning device 200 according to an embodiment of the present application. Fig.14 As shown, the three-dimensional scanning device 200 includes an adapter manufacturing module 21 , an adapter definition module 22 and an adapter measurement module 23 .

[0131] The adapter making module 21 is used to bind the marking point data of several marking points with the type of the adapter. The adapter defining module 22 is used to determine the feature type of the feature to be measured and obtain the first mapping relationship between the working surface of the adapter and the marking point. When the adapter is arranged on the carrier of the feature to be measured, the adapter measuring module 23 determines the first feature of the feature to be measured according to the marking point data, the first mapping relationship and the feature type of the feature to be measured.

[0132] It should be noted that the above modules can be functional modules or program modules, and can be implemented by software or hardware. For modules implemented by hardware, the above modules can be located in the same processor 11; or the above modules can be located in different processors 11 in any combination.

[0133] More specifically, the adapter making module 21 can obtain the type of the adapter.

[0134] And / or, the adapter making module 21 can bind the marking point data of several marking points with the type of the adapter, wherein the marking point data includes positioning data and identification data bound with the type of the adapter.

[0135] And / or, the adapter definition module 22 can select at least one working surface on the adapter and obtain a first mapping relationship between the working surface and the positioning data of the marking point.

[0136] And / or, the adapter definition module 22 can determine the feature type of the feature to be measured.

[0137] And / or, the adapter definition module 22 can determine a second characteristic of the characteristic to be measured, the second characteristic being different from the first characteristic.

[0138] And / or, the adapter measurement module 23 can obtain the marking point data on the adapter when the adapter is arranged on a carrier having a characteristic to be measured.

[0139] And / or, the adapter measurement module 23 can determine the position of the working surface in the three-dimensional scanning according to the marking point data and the first mapping relationship.

[0140] And / or, the adapter measurement module 23 can determine the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured.

[0141] And / or, the adapter measurement module 23 can determine the first feature of the feature to be measured based on the position of the working surface, the second feature, and the feature type of the feature to be measured.

[0142] like Figure 1 As shown, this embodiment further provides an electronic device, including a memory 12 and a processor 11, wherein the memory 12 stores a computer program, and the processor 11 is configured to run the computer program to execute the steps in any of the above method embodiments.

[0143] Optionally, the electronic device may further include a transmission device 13 and an input / output device 14 , wherein the transmission device 13 is connected to the processor 11 , and the input / output device 14 is connected to the processor 11 .

[0144] Optionally, in this embodiment, the processor 11 may be configured to perform the following steps through a computer program:

[0145] S1: Adapter production, used to bind the marker data of several markers and the type of adapter;

[0146] S2: adapter definition, used to determine the feature type of the feature to be measured and obtain the first mapping relationship between the working surface of the adapter and the marking point;

[0147] S3: Adapter measurement: placing the adapter on the carrier of the feature to be measured, and determining the first feature of the feature to be measured according to the marking point data, the first mapping relationship, and the feature type of the feature to be measured.

[0148] Alternatively, in this embodiment, the processor 11 may be configured to execute the following steps through a computer program:

[0149] S11: Get the type of adapter;

[0150] S12: placing a number of marking points on the adapter, and binding the marking point data of the number of marking points to the type of the adapter, wherein the marking point data includes positioning data and identification data bound to the type of the adapter;

[0151] S21: Determine the feature type of the feature to be measured;

[0152] S22: Select at least one working surface on the adapter, and obtain a first mapping relationship between the working surface and the positioning data of the marking point;

[0153] S31: The adapter is arranged on the carrier of the feature to be measured, and the marking point data on the adapter is obtained;

[0154] S32: determining the position of the working surface in the three-dimensional scanning according to the marking point data and the first mapping relationship;

[0155] S33: Determine a first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured.

[0156] Alternatively, in this embodiment, the processor 11 may be configured to execute the following steps through a computer program:

[0157] S11: Get the type of adapter;

[0158] S12: placing a number of marking points on the adapter, and binding the marking point data of the number of marking points to the type of the adapter, wherein the marking point data includes positioning data and identification data bound to the type of the adapter;

[0159] S21: Determine the feature type of the feature to be measured;

[0160] S22: Select at least one working surface on the adapter, and obtain a first mapping relationship between the working surface and the positioning data of the marking point;

[0161] S23: determining a second feature of the feature to be measured, where the second feature is different from the first feature;

[0162] S31: The adapter is arranged on the carrier of the feature to be measured, and the marking point data on the adapter is obtained;

[0163] S32: determining the position of the working surface in the three-dimensional scanning according to the marking point data and the first mapping relationship;

[0164] S33: Determine the first feature of the feature to be measured based on the position of the working surface, the second feature, and the feature type of the feature to be measured.

[0165] It should be noted that the specific examples in this embodiment can refer to the examples described in the above embodiments and optional implementation modes, and will not be repeated in this embodiment.

[0166] In addition, in combination with a three-dimensional scanning-based measurement method provided in the above embodiment, a storage medium may also be provided in this embodiment to implement the measurement method. The storage medium stores a computer program; when the computer program is executed by the processor 11, any one of the three-dimensional scanning-based measurement methods in the above embodiment is implemented.

[0167] As an implementation method, the present application also provides a three-dimensional scanning system, which includes the three-dimensional scanning device 200 mentioned above.

[0168] It should be understood that those skilled in the art can make improvements or changes based on the above description, and all these improvements and changes should fall within the scope of protection of the claims attached to this application.

Claims

1. A measurement method based on three-dimensional scanning, which is applicable to a three-dimensional scanning system, characterized in that: The three-dimensional scanning-based measurement method includes: Adapter creation, used to bind the marker data of several markers to the type of adapter; An adapter definition, used to determine the feature type of the feature to be measured, and obtain a first mapping relationship between the working surface of the adapter and the marking point; Adapter measurement: placing the adapter on a carrier of the feature to be measured, and determining the first feature of the feature to be measured according to the marking point data, the first mapping relationship, and the feature type of the feature to be measured.

2. The three-dimensional scanning-based measurement method according to claim 1, characterized in that: The three-dimensional scanning-based measurement method includes: Adapter production: Get the type of the adapter; Placing a plurality of marking points on the adapter, and binding the marking point data of the plurality of marking points to the type of the adapter, wherein the marking point data includes positioning data and identification data bound to the type of the adapter; Adapter definition: Determine the feature type of the feature to be measured; Selecting at least one working surface on the adapter, and acquiring a first mapping relationship between the working surface and the positioning data of the marking point; Adapter Measurements: The adapter is arranged on a carrier of the feature to be measured, and the marking point data on the adapter is obtained; Determine the position of the working surface in the three-dimensional scanning according to the marking point data and the first mapping relationship; Based on the position of the working surface and the feature type of the feature to be measured, a first feature of the feature to be measured is determined.

3. The three-dimensional scanning-based measurement method according to claim 2, characterized in that: The adapter definition also includes: determining a second characteristic of the feature to be measured, the second characteristic being different from the first characteristic; The determining the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured includes: The first feature of the feature to be measured is determined based on the position of the working surface, the second feature, and the feature type of the feature to be measured.

4. The three-dimensional scanning-based measurement method according to claim 3, characterized in that: The determining the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured includes: Acquiring a contact position between the feature to be measured and the working surface; Determining a second mapping relationship between the contact position and the marking point according to the position of the working surface, the second feature, and the first mapping relationship; Based on the second mapping relationship and the feature type of the feature to be measured, a first feature of the feature to be measured is determined.

5. The three-dimensional scanning-based measurement method according to claim 2, characterized in that: The determining the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured includes: Acquiring a contact position between the feature to be measured and the working surface; Determining a second mapping relationship between the contact position and the marking point according to the position of the working surface and the first mapping relationship; Based on the second mapping relationship and the feature type of the feature to be measured, a first feature of the feature to be measured is determined.

6. The three-dimensional scanning-based measurement method according to claim 2, characterized in that: The obtaining the type of the adapter includes: Scanning the adapter to obtain the type of the adapter; Alternatively, the adapter is configured as a preset model of a known type to obtain the type of the adapter.

7. The three-dimensional scanning-based measurement method according to claim 6, characterized in that: The step of binding the marking point data of the plurality of marking points to the type of the adapter comprises: Scan and obtain identification data of a number of said marking points; The acquired type of the adapter is matched with the identification data of the plurality of marking points to bind the identification data of the plurality of marking points with the type of the adapter.

8. A three-dimensional scanning device, characterized in that: The three-dimensional scanning device comprises: An adapter making module is used to bind the mark point data of several mark points with the type of the adapter; An adapter definition module, used to determine the feature type of the feature to be measured, and obtain a first mapping relationship between the working surface of the adapter and the marking point; The adapter measurement module determines the first feature of the feature to be measured according to the marking point data, the first mapping relationship and the feature type of the feature to be measured when the adapter is arranged on the carrier of the feature to be measured.

9. The three-dimensional scanning device according to claim 8, characterized in that: The adapter making module can obtain the type of the adapter; and / or, The adapter making module is capable of binding the marking point data of a number of the marking points to the type of the adapter, wherein the marking point data includes positioning data and identification data bound to the type of the adapter; and / or, The adapter definition module can select at least one working surface on the adapter and obtain a first mapping relationship between the working surface and the positioning data of the marking point; and / or, The adapter definition module is capable of determining the feature type of the feature to be tested; and / or, The adapter definition module is capable of determining a second characteristic of the feature to be measured, the second characteristic being different from the first characteristic; and / or, The adapter measurement module is capable of acquiring the marking point data on the adapter when the adapter is arranged on a carrier having a characteristic to be measured; and / or, The adapter measurement module can determine the position of the working surface in the three-dimensional scanning according to the marking point data and the first mapping relationship; and / or, The adapter measurement module is capable of determining a first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured; and / or, The adapter measurement module can determine the first feature of the feature to be measured based on the position of the working surface, the second feature, and the feature type of the feature to be measured.

10. A three-dimensional scanning system, characterized in that: The three-dimensional scanning system includes the three-dimensional scanning device as described in claim 8 or 9.

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