Test system and test method

Abstract

The invention relates to the technical field of optical communication, in particular to a testing system and a testing method.The testing system comprises a clamp assembly, a displacement driving assembly, a power-up driving assembly, a spectrum testing assembly, a signal acquisition assembly and a controller, and the controller is electrically connected with the displacement driving assembly, the spectrum testing assembly, the signal acquisition assembly and the power-up driving assembly; a plurality of sets of test programs are preset in the controller, each test program correspondingly tests one product type, and the controller is used for identifying the type of the current to-be-tested product and calling the corresponding test program so as to control each component to be tested; by presetting multiple sets of test programs in the controller, the products can be driven to the corresponding test positions on the clamp assembly according to the product types, and the corresponding test programs are called according to the product types to perform automatic testing so as to obtain test data, so that the integrated test function of different pump laser products is realized, test equipment is reduced to the maximum extent, and the test efficiency is improved. And the requirements of multi-product and low-cost integrated testing are met.

Description

Technical Field

[0001] The present invention relates to the field of optical communication technology, and in particular to a testing system and a testing method. Background Art

[0002] With the rapid development of optical communications, the demand for product diversification and miniaturization has become increasingly obvious. The market demand for pump lasers has also changed from the early 14PIN single-core and dual-core to the current 10PIN single-core and dual-core. Since 14PIN single-core and dual-core have many years of mature EDFA application scenarios, the EDFA modules that match 14PIN single-core and dual-core products are very mature. Therefore, 10PIN single-core and dual-core products are difficult to completely replace 14PIN single-core and dual-core pump source products. This will cause 14PIN single-core and dual-core and 10PIN single-core and dual-core pump source products to coexist for a long time.

[0003] Since the structural dimensions and pin definitions of the four types of pump source products, 14PIN & 10PIN single and dual core, are somewhat different, different test benches need to be built to complete the performance testing of each product. The current mature pump source product testing solution in the industry is to build a complete test system for each of the four types of products to complete the testing. This method requires a large number of test equipment and test fixtures, and the total value is very expensive.

[0004] Therefore, it is very important for those skilled in the art to design a low-cost testing system and testing method that can realize integrated testing of multiple types of pump laser products. Summary of the invention

[0005] The technical problem to be solved by the embodiments of the present invention is to provide a low-cost testing system and testing method that can realize integrated testing of multiple types of pump laser products, so as to solve the problem in the prior art that the number of testing equipment and test fixtures is large and the total value is very expensive.

[0006] The present invention discloses a testing system for performance testing of a pump laser, and the scheme thereof comprises:

[0007] A fixture assembly is provided with multiple test positions for loading different types of products to be tested;

[0008] Displacement drive component, used to drive the product to be tested to match the test position;

[0009] Power-on drive component, used to power on the product to be tested and perform current scanning LIV test;

[0010] Spectral test component, used to collect and measure the output spectrum of the product to be tested;

[0011] A signal acquisition component, used to collect input current, input voltage, output current and output voltage of the product under test;

[0012] A controller, electrically connected to the displacement drive component, the spectrum test component, the signal acquisition component and the power-on drive component respectively;

[0013] There are multiple test programs preset in the controller, and each test program corresponds to testing a product type. The controller is used to identify the type of the product to be tested and call the corresponding test program to control each component to perform the test.

[0014] Optionally, an external temperature controller is also included to feedback and control the external temperature of the product to be tested during the test process.

[0015] Optionally, a cooling water circulation component is also included to cool the temperature of the external temperature controller.

[0016] Optionally, the product types include 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products.

[0017] Optionally, each of the test positions is provided with a plurality of test pins for connecting to a 10PIN single-core product, a 10PIN dual-core product, a 14PIN single-core product and a 14PIN dual-core product respectively.

[0018] Optionally, the spectral testing component includes a spectrometer and an optical switching switch, the optical switching switch is used to switch the output spectral channels of 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products, and the spectrometer is used to measure and analyze the output spectrum.

[0019] Optionally, the signal acquisition component includes a DAQ acquisition card for calculating and processing the input current, input voltage, output current and output voltage of the product to be tested.

[0020] In order to solve the problems existing in the prior art, the present invention further provides a testing method for performance testing of a pump laser, wherein the method is implemented by any of the above-mentioned testing systems and comprises the following steps:

[0021] Loading the product to be tested onto the fixture assembly;

[0022] Select the product type to be tested, and control the displacement drive component according to the selected product type to drive the product to be tested to the corresponding test position;

[0023] Enter the serial number of the product to be tested, and automatically identify the product type according to the serial number of the product to be tested to select the corresponding driver power-on solution;

[0024] Power on the product to be tested according to the driving power-on scheme, and collect and measure the output spectrum of the product to be tested through the spectrum test component, and collect the input current, input voltage, output current and output voltage of the product to be tested through the signal acquisition component;

[0025] The collected test data is processed through the controller and a test data report is generated;

[0026] Among them, the product types include 10PIN single-core, 10PIN dual-core, 14PIN single-core and 14PIN dual-core.

[0027] Optionally, the method further comprises the following steps:

[0028] Four drive power-on schemes are preset in the controller to correspond to 10PIN single-core, 10PIN dual-core, 14PIN single-core and 14PIN dual-core respectively.

[0029] Optionally, the method further comprises the following steps:

[0030] The product under test is subjected to multiple rounds of testing at different temperatures.

[0031] Compared with the prior art, the test system provided by the embodiment of the present invention has the following beneficial effects: by designing a test system, including a fixture assembly, a displacement drive assembly, a power-on drive assembly, a spectrum test assembly, a signal acquisition assembly and a controller, the fixture assembly, the displacement drive assembly, the power-on drive assembly, the spectrum test assembly and the signal acquisition assembly are all connected to the controller; by presetting multiple sets of test programs in the controller, the product can be driven to the corresponding test position on the fixture assembly according to the product type, and the corresponding test program can be called according to the product type to perform automatic testing to obtain test data, thereby realizing the integrated testing function of different pump laser products, maximizing the reduction of test equipment, and meeting the integrated testing requirements of multiple products and low cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The technical solution of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments, in which:

[0033] Figure 1 is a system block diagram of a test system provided by an embodiment of the present invention;

[0034] Figure 2 is a pin diagram of a fixture assembly provided by an embodiment of the present invention;

[0035] Figure 3 This is the process of the test method provided by the embodiment of the present invention Figure 1 ;

[0036] Figure 4This is the process of the test method provided by the embodiment of the present invention Figure 2 .

[0037] The reference numerals in the figures are:

[0038] 100. Fixture assembly; 200. Displacement drive assembly; 300. Power-on drive assembly; 400. Spectrum test assembly; 500. Signal acquisition assembly; 600. Controller; 700. External temperature controller; 800. Cooling water circulation assembly. DETAILED DESCRIPTION

[0039] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. Now, in conjunction with the accompanying drawings, the preferred embodiments of the present invention are described in detail.

[0040] like Figure 1 and Figure 2 As shown, the present invention provides a specific embodiment of a testing system.

[0041] A test system for testing the performance of pump lasers, referring to Figure 1 , including a fixture assembly 100, a displacement drive assembly 200, a power-on drive assembly 300, a spectrum test assembly 400, a signal acquisition assembly 500 and a controller 600. The fixture assembly 100, the displacement drive assembly 200, the power-on drive assembly 300, the spectrum test assembly 400, and the signal acquisition assembly 500 are all connected to the controller 600.

[0042] Specifically, refer to Figure 1 and Figure 2 The pump laser products include 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products. The fixture assembly 100 is provided with a plurality of test positions for loading 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products respectively; each test position is provided with a plurality of test pins for connecting with the product, for connecting 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products respectively.

[0043] Among them, reference Figure 1 and Figure 2The test pins on the fixture assembly 100 include TEC-pin, TEC+pin, RT pin, MPD+pin, MPD-pin, 14PIN LD2+test pin, 14PIN LD2-test pin, GND pin, NC pin, 14PIN LD1+test pin and 14PIN LD1-test pin; among which, the NC pin can also be used as a 10PIN LD2-test pin, the 14PIN LD1-test pin can also be used as a 10PIN LD1-test pin, and the 14PIN LD1+test pin can also be used as a 10PIN LD1+test pin and a 10PIN LD2+test pin.

[0044] Further, refer to Figure 1 and Figure 2 The displacement drive component 200 is used to drive the product to be tested to match the test position; the product to be tested is placed on the fixture component 100. When the product to be tested is a 10PIN single-core product, the displacement drive component 200 drives the product to be tested to move on the fixture component 100, and connects the 10PIN LD1+ pin of the 10PIN single-core product to the 10PIN LD1+ test pin on the fixture component 100, and connects the 10PIN LD1- pin of the 10PIN single-core product to the 10PIN LD1- test pin on the fixture component 100.

[0045] When the product to be tested is a 10PIN dual-core product, the displacement drive component 200 drives the product to be tested to move on the fixture component 100, and connects the 10PIN LD1+ pin of the 10PIN dual-core product to the 10PIN LD1+ test pin on the fixture component 100, connects the 10PIN LD1- pin of the 10PIN dual-core product to the 10PIN LD1- test pin on the fixture component 100, and connects the 10PIN LD2+ pin of the 10PIN dual-core product to the 10PIN LD2+ test pin on the fixture component 100, and connects the 10PIN LD2- pin of the 10PIN dual-core product to the 10PIN LD2- test pin on the fixture component 100.

[0046] When the product to be tested is a 14PIN single-core product, the displacement drive component 200 drives the product to be tested to move on the fixture component 100, and connects the 14PIN LD1+ pin of the 14PIN single-core product to the 14PIN LD1+ test pin on the fixture component 100, and connects the 14PIN LD1- pin of the 14PIN single-core product to the 14PIN LD1- test pin on the fixture component 100.

[0047] When the product to be tested is a 14PIN dual-core product, the displacement drive component 200 drives the product to be tested to move on the fixture component 100, and connects the 14PIN LD1+ pin of the 14PIN dual-core product to the 14PIN LD1+ test pin on the fixture component 100, connects the 14PIN LD1- pin of the 14PIN dual-core product to the 14PIN LD1- test pin on the fixture component 100, and connects the 14PIN LD2+ pin of the 14PIN dual-core product to the 14PIN LD2+ test pin on the fixture component 100, and connects the 14PIN LD2- pin of the 14PIN dual-core product to the 14PIN LD2- test pin on the fixture component 100.

[0048] Furthermore, the power-on drive component 300 is used to power on the product to be tested and perform a current scanning LIV test. The power-on drive component 300 includes a laser diode controller for driving single-core products and dual-core products respectively. Specifically, the ILX LDC3744 controller can be used, which can provide precise current control and has high temperature stability. In addition, it can also control laser diodes of multiple channels to simultaneously control multiple laser sources to achieve separate driving of single-core products and dual-core products.

[0049] Furthermore, the spectral testing component 400 is used to collect and measure the output spectrum of the product to be tested. The spectral testing component 400 includes a spectrometer and an optical switching switch. The optical switching switch is a 1*4 optical switch for switching the output spectrum channels of 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products. The spectrometer is used to measure and analyze the output spectrum; the spectrometer can specifically use the YOKOGAWA AQ6370D OSA model.

[0050] During the current scanning LIV test, the spectrum test component 400 synchronously measures and analyzes the output spectrum information of the product to be tested, and transmits it back to the controller 600 for real-time display. The controller 600 processes the test data and generates a test data report, and then waits for the next automatic test of the product to be tested to be executed.

[0051] Furthermore, the signal acquisition component 500 is used to collect the input current, input voltage, output current and output voltage of the product under test; the signal acquisition component 500 includes a DAQ acquisition card for calculating and processing the input current, input voltage, output current and output voltage of the product under test.

[0052] During the current scanning LIV test, the DAQ acquisition card continuously collects and records the output current and output voltage data of the product to be tested, and transmits them back to the controller 600 for real-time display. The controller 600 processes the test data and generates a test data report, and then starts waiting to execute the automatic test of the next product to be tested.

[0053] Furthermore, the controller 600 is used for test control and data processing. The controller 600 is controlled by computer software. Four sets of test programs are stored in the controller 600. The four sets of test programs correspond to testing 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products respectively. When the displacement drive component 200 drives the product to be tested to the test position, the serial number of the product to be tested is input, and the controller 600 will automatically identify the product type according to the serial number of the product, and select the test program that matches the current product to be tested from the four built-in test programs, and control the power-on drive component 300 to power on to perform the current scanning LIV test.

[0054] Among them, the controller 600 has 4 sets of test programs preset, and each set of test programs corresponds to a product type. The product types specifically include 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products. The controller 600 is used to identify the type of the current product to be tested and call the corresponding test program, thereby controlling each component to test the current product to be tested according to the corresponding test program.

[0055] Since the structural dimensions and pin definitions of the four types of pump source products, 14PIN & 10PIN single and dual core, are somewhat different, different test benches need to be built to complete the performance testing of each product. The current mature pump source product testing solution in the industry is to build a complete test system for each of the four types of products to complete the testing. This method requires a large number of test equipment and test fixtures, and the total value is very expensive.

[0056] In this embodiment, a test system is designed, including a fixture assembly 100, a displacement drive assembly 200, a power-on drive assembly 300, a spectrum test assembly 400, a signal acquisition assembly 500 and a controller 600. The fixture assembly 100, the displacement drive assembly 200, the power-on drive assembly 300, the spectrum test assembly 400, and the signal acquisition assembly 500 are all connected to the controller 600. By presetting multiple sets of test programs in the controller 600, and calling the corresponding test programs according to the type of the current product to be tested through the controller 600, and controlling each component to automatically test the current product to be tested, test data is obtained; the integrated test function of various types of pump laser products is realized, and the test equipment is minimized to maximize the reduction, thereby meeting the needs of a multi-product integrated test system with lower cost requirements.

[0057] In one embodiment, reference Figure 1 The test system also includes an external temperature controller 700 for feedback and control of the external temperature of the product to be tested during the test process; to ensure that the external temperature during the product testing process is constant, thereby achieving stable testing of the product to be tested under different temperature conditions.

[0058] In one embodiment, reference Figure 1 The test system also includes a cooling water circulation component 800 for cooling the temperature of the external temperature controller 700; ensuring the stability of the external temperature controller 700 during the test of the product to be tested, and ensuring that the external temperature controller 700 can operate normally.

[0059] like Figure 3 and Figure 4 As shown, the present invention also provides a specific embodiment of a testing method.

[0060] A testing method is used for performance testing of a pump laser and is implemented by any of the testing systems shown above. The testing method specifically comprises the following steps:

[0061] S1, loading the product to be tested onto the fixture assembly 100;

[0062] S2, selecting the product type to be tested, and controlling the displacement drive assembly 200 according to the selected product type to drive the product to be tested to the corresponding test position;

[0063] S3. Input the serial number of the product to be tested, and automatically identify the product type according to the serial number of the product to be tested to select the corresponding driver power-on solution;

[0064] S4, powering on the product to be tested according to the driving power-on scheme, and collecting and measuring the output spectrum of the product to be tested through the spectrum testing component 400, and collecting the input current, input voltage, output current and output voltage of the product to be tested through the signal acquisition component 500;

[0065] S5. Processing the collected test data through the controller 600 and generating a test data report;

[0066] Among them, the product types include 10PIN single-core, 10PIN dual-core, 14PIN single-core and 14PIN dual-core.

[0067] Specifically, the products to be tested include four types: 10PIN single-core, 10PIN dual-core, 14PIN single-core and 14PIN dual-core. A plurality of test pins are provided on the fixture assembly 100 for respectively testing 10PIN single-core, 10PIN dual-core, 14PIN single-core and 14PIN dual-core. The controller 600 also has four preset drive power-on schemes corresponding to 10PIN single-core, 10PIN dual-core, 14PIN single-core and 14PIN dual-core respectively.

[0068] After the product to be tested is loaded into the fixture assembly 100, the type of product to be tested is selected, and the controller 600 automatically controls the displacement drive assembly 200 to match the test position of the current product to be tested, and then inputs the serial number of the current product to be tested. The controller 600 selects a driving power-on scheme that matches the serial number of the current product to be tested. When the driving power-on scheme is loaded, the controller 600 controls the power-on drive assembly 300 to power on the current product to be tested, and performs a current scanning LIV test on the current product to be tested. During the LIV performance test of the current product to be tested, the controller 600 controls the signal acquisition assembly 500 to continuously collect and record the output current and output voltage of the current product to be tested, and the spectrum acquisition assembly synchronously measures and analyzes the output spectrum information of the current product to be tested. Finally, the test data is processed and analyzed by the controller 600 to complete the test of the current product to be tested.

[0069] In one embodiment, reference Figure 4 , the test method further comprises the following steps:

[0070] S6. Perform multiple rounds of tests on the product under test at different temperatures.

[0071] Specifically, the temperature of the external temperature controller 700 is controlled at -5 degrees Celsius, 25 degrees Celsius and 75 degrees Celsius, respectively, so as to test the current product to be tested at three temperatures. After three rounds of tests at different temperatures, the test of the current product to be tested is completed, the controller 600 processes the test data and generates a test data report, and starts waiting to execute the automatic test of the next product.

[0072] It should be understood that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. For those skilled in the art, the technical solutions described in the above embodiments can be modified, or some of the technical features therein can be replaced by equivalents; and all these modifications and replacements should fall within the scope of protection of the claims attached to the present invention.

Claims

1. A test system for testing the performance of a pump laser, characterized in that: include: A fixture assembly is provided with multiple test positions for loading different types of products to be tested; Displacement drive component, used to drive the product to be tested to match the test position; Power-on drive component, used to power on the product to be tested and perform current scanning LIV test; Spectral test component, used to collect and measure the output spectrum of the product to be tested; A signal acquisition component, used to collect input current, input voltage, output current and output voltage of the product under test; A controller, electrically connected to the displacement drive component, the spectrum test component, the signal acquisition component and the power-on drive component respectively; There are multiple test programs preset in the controller, and each test program corresponds to testing a product type. The controller is used to identify the type of the product to be tested and call the corresponding test program to control each component to perform the test.

2. The test system according to claim 1, characterized in that: An external temperature controller is also included to feedback and control the external temperature of the product to be tested during the test process.

3. The test system according to claim 2, characterized in that: A cooling water circulation component is also included to cool the temperature of the external temperature controller.

4. The test system according to claim 1, characterized in that: The product types include 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products.

5. The test system according to claim 4, characterized in that: Each of the test positions is provided with a plurality of test pins, which are respectively used to connect with a 10PIN single-core product, a 10PIN dual-core product, a 14PIN single-core product and a 14PIN dual-core product.

6. The test system according to claim 4, characterized in that: The spectrum test component includes a spectrometer and an optical switching switch, wherein the optical switching switch is used to switch the output spectrum channels of 10PIN single-core products, 10PIN dual-core products, 14PIN single-core products and 14PIN dual-core products, and the spectrometer is used to measure and analyze the output spectrum.

7. The test system according to claim 1, characterized in that: The signal acquisition component includes a DAQ acquisition card for calculating and processing the input current, input voltage, output current and output voltage of the product to be tested.

8. A test method for testing the performance of a pump laser, characterized in that: The method is implemented by a test system as described in any one of claims 1 to 7, comprising the following steps: Loading the product to be tested onto the fixture assembly; Select the product type to be tested, and control the displacement drive component according to the selected product type to drive the product to be tested to the corresponding test position; Enter the serial number of the product to be tested, and automatically identify the product type according to the serial number of the product to be tested to select the corresponding driver power-on solution; Power on the product to be tested according to the driving power-on scheme, and collect and measure the output spectrum of the product to be tested through the spectrum test component, and collect the input current, input voltage, output current and output voltage of the product to be tested through the signal acquisition component; The collected test data is processed through the controller and a test data report is generated; Among them, the product types include 10PIN single-core, 10PIN dual-core, 14PIN single-core and 14PIN dual-core.

9. The testing method according to claim 8, characterized in that: The following steps are also included: Four drive power-on schemes are preset in the controller to correspond to 10PIN single-core, 10PIN dual-core, 14PIN single-core and 14PIN dual-core respectively.

10. The testing method according to claim 8, characterized in that: The following steps are also included: The product under test is subjected to multiple rounds of testing at different temperatures.

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