A lithium battery protection board communication link voltage and current test device

By designing a lithium battery protection board communication link voltage and current testing device including MCU, power module, analog-to-digital conversion module, voltage and current signal processing module and test link switching module, the problem that traditional testing equipment cannot accurately test the voltage and current of the protection board communication link is solved, and higher testing comprehensiveness and reliability are achieved.

CN119757843APending Publication Date: 2025-04-04FUJIAN NEBULA ELECTRONICS CO LTD
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Patent Information

Application Number
CN202411699316.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-26
Publication Date
2025-04-04

AI Technical Summary

Technical Problem

Traditional lithium battery protection board testing equipment cannot meet the requirements for accurate testing of the voltage and current of the protection board communication link, resulting in insufficient comprehensiveness and reliability of the test.

Method used

A communication link voltage and current testing device for lithium battery protection board is designed, including an MCU, a power supply module, an analog-to-digital conversion module, a voltage and current signal processing module and a test link switching module. These modules are used to test and switch the communication link voltage and current.

Benefits of technology

The comprehensive testing of the communication link voltage and current of the lithium battery protection board is achieved, which improves the comprehensiveness and reliability of the test, and is compatible with traditional test equipment, reduces interference sources and enhances the stability of signal acquisition.

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Abstract

The present invention provides a lithium battery protection board communication link voltage and current testing device in the field of lithium battery testing technology, including an MCU, a power module, an analog-to-digital conversion module, a voltage and current signal processing module and a test link switching module; the MCU, the analog-to-digital conversion module, the voltage and current signal processing module and the test link switching module are connected in sequence; the MCU is respectively connected to the voltage and current signal processing module and the test link switching module; the power module is respectively connected to the MCU, the analog-to-digital conversion module, the voltage and current signal processing module and the test link switching module. The advantage of the present invention is that it can test the voltage and current of the lithium battery protection board communication link, which greatly improves the comprehensiveness and reliability of the test.
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Description

Technical Field

[0001] The present invention relates to the technical field of lithium battery testing, and in particular to a device for testing voltage and current of a communication link of a lithium battery protection board. Background Art

[0002] With the rapid development of electric vehicles, renewable energy and other fields, lithium batteries, as an important energy storage device, have also been booming. With the iteration of lithium battery technology, the communication IC models of lithium battery protection boards are becoming increasingly diverse. In the production process of lithium batteries, in addition to testing the communication function of the protection board, the need for accurate testing of the voltage and current values ​​of the communication link on the protection board has gradually become prominent.

[0003] However, traditional testing equipment only has a single communication test function, which cannot meet the newly added demand for testing the voltage and current values ​​of the protection board communication link during the production test of the lithium battery protection board. Therefore, how to provide a lithium battery protection board communication link voltage and current test device to test the lithium battery protection board communication link voltage and current to improve the comprehensiveness and reliability of the test has become a technical problem that needs to be solved urgently. Summary of the invention

[0004] The technical problem to be solved by the present invention is to provide a lithium battery protection board communication link voltage and current testing device to test the lithium battery protection board communication link voltage and current to improve the comprehensiveness and reliability of the test.

[0005] The present invention is implemented as follows: A lithium battery protection board communication link voltage and current test device includes an MCU, a power module, an analog-to-digital conversion module, a voltage and current signal processing module and a test link switching module;

[0006] The MCU, the analog-to-digital conversion module, the voltage and current signal processing module and the test link switching module are connected in sequence; the MCU is respectively connected to the voltage and current signal processing module and the test link switching module; the power supply module is respectively connected to the MCU, the analog-to-digital conversion module, the voltage and current signal processing module and the test link switching module;

[0007] The power supply module includes a power supply protection unit, a DCDC unit and a linear voltage stabilization unit;

[0008] The power supply protection unit includes a power supply interface J3, a fuse F1, a diode D3, a diode D4, a diode D5, a gas discharge tube G1, a capacitor C3, a capacitor C4, a resistor R52, a resistor R53, a resistor R56, a resistor R188, a transistor Q4, a MOS tube Q5 and a light emitting diode LED_5V_PRO;

[0009] Pin 1 of the power supply interface J3 is connected to the fuse F1, and pins 2 and 3 are connected to pin 2 of the gas discharge tube G1, capacitor C3, the input end of the diode D3, resistor R56, the input end of the diode D4, capacitor C4, and the output end of the light-emitting diode LED_5V_PRO; pin 1 of the gas discharge tube G1 is connected to capacitor C3;

[0010] The b-pole of the transistor Q4 is connected to the resistor R53, the c-pole is connected to the resistor R56 and the G-pole of the MOS tube Q5, and the e-pole is connected to the resistor R52, the output end of the diode D5 and the S-pole of the MOS tube Q5; the input end of the diode D5 is connected to the fuse F1; the output end of the diode D3 is connected to the resistor R52 and the resistor R53;

[0011] One end of the resistor R188 is connected to the input end of the light emitting diode LED_5V_PRO, and the other end is connected to the D pole of the MOS tube Q5, the output end of the diode D4, the capacitor C4 and the DCDC unit.

[0012] Further, the DCDC unit includes a DC conversion chip U4, a DC conversion chip U7, a capacitor C5, a capacitor C6, a capacitor C7, a capacitor C8, a capacitor C9 and an inductor L1;

[0013] Pin 2 of the DC conversion chip U7 is connected to capacitor C5 and resistor R188, pin 1 is connected to capacitor C5 and grounded, pin 6 is connected to capacitor C8 and a linear voltage regulator unit, pin 7 is connected to capacitor C8 and capacitor C9 and grounded, and pin 8 is connected to capacitor C9 and a linear voltage regulator unit;

[0014] Pin 2 of the DC conversion chip U4 is connected to capacitor C6 and resistor R188, pin 1 is connected to capacitor C6 and grounded, pin 6 is connected to capacitor C7, inductor L1 and a linear voltage regulator unit, and pin 7 is connected to capacitor C8 and grounded; the inductor L1 is connected to a test link switching module.

[0015] Further, the linear voltage stabilizing unit includes a linear voltage stabilizing chip U8, a linear voltage stabilizing chip U9, a linear voltage stabilizing chip U10, a diode D6, a diode D7, a diode D8, a diode D9, a capacitor C10, a capacitor C11, a capacitor C12, a capacitor C13, a capacitor C14, a capacitor C15, a capacitor C16, a capacitor C17, a capacitor C18, a capacitor C19, a resistor R60, a resistor R62, a resistor R63, a resistor R64 and a resistor R65;

[0016] Pins 1 and 3 of the linear voltage regulator chip U9 are connected to pin 6 of the DC conversion chip U7, the output end of the diode D6, the capacitor C10, and the voltage and current signal processing module; after the capacitor C15 and the capacitor C17 are connected in parallel, one end is grounded, and the other end is connected to the input end of the diode D6, pins 4 and 5 of the linear voltage regulator chip U9, pin 3 of the linear voltage regulator chip U8, the analog-to-digital conversion module, and the voltage and current signal processing module;

[0017] Pin 2 of the linear voltage regulator chip U8 is connected to the capacitor C11, the input end of the diode D8 and the voltage and current signal processing module, and pin 5 is connected to the output end of the diode D8, one end of the capacitor C14, one end of the capacitor C16, the analog-to-digital conversion module and the voltage and current signal processing module; the other end of the capacitor C14 is connected to the other end of the capacitor C16 and is grounded;

[0018] Pins 1 and 2 of the linear voltage regulator chip U10 are connected to the output end of the diode D9, the capacitor C18, the resistor R64, the input end of the diode D7, the capacitor C19, the analog-to-digital conversion module and pins 7, 8, 16, 26, 28, 39, 47, 51, 52, 69, 79, 90, 101 and 122 of the MCU, pin 3 is connected to the input end of the diode D9, the resistor R63, the resistor R65 and the capacitor C18, pin 4 is connected to the resistor R63 and the capacitor C19 and is grounded, pins 5, 7 and 8 are connected to the capacitor C12, one end of the resistor R60, one end of the resistor R62 and the output end of the diode D7, pin 6 is connected to the capacitor C13; the other end of the resistor R60 is connected to the other end of the resistor R62 and pin 6 of the DC conversion chip U4; the resistor R64 is connected to the resistor R65.

[0019] Further, the analog-to-digital conversion module includes an ADC chip U18, an active crystal oscillator Y2, a resistor R108, a resistor R109, a resistor R110, a resistor R111, a resistor R112, a resistor R113, a resistor R114, a resistor R115, a resistor R117, a resistor R119, a resistor R120, a resistor R121, a resistor R209, a resistor R116, a resistor R118, an inductor L2, a capacitor C36, a capacitor C37, a capacitor C39, a capacitor C40, a capacitor C42, a capacitor C43, a capacitor C44, a capacitor C45, a capacitor C46, ​​a capacitor C47, a capacitor C48 and a capacitor C64;

[0020] After the capacitor C45 is connected in parallel with the capacitor C46, ​​one end is grounded, and the other end is connected to the inductor L2 and the pin 4 of the active crystal oscillator Y2; one end of the resistor R120 is connected to the inductor L2 and the capacitor C47, and the other end is connected to the power module; one end of the resistor R121 is connected to the capacitor C48 and the pin 3 of the active crystal oscillator Y2, and the other end is connected to the pin 25 of the ADC chip U18; the pin 2 of the active crystal oscillator Y2 is connected to the capacitor C48 and the ground;

[0021] One end of the resistor R118 is connected to the resistor R116 and the pins 120, 121, 123, and 124 of the MCU, and the other end is connected to the resistor R117, the resistor R119, and the power module;

[0022] Pins 1, 2, 3, and 4 of the ADC chip U18 are connected to the voltage and current signal processing module, pin 5 is connected to resistor R108, pin 6 is connected to resistor R109, pin 7 is connected to resistor R110, pin 8 is connected to resistor R111, pin 9 is connected to capacitor C36, capacitor C37, and a power module, pins 10 and 11 are connected to the power module, pin 12 is connected to capacitor C39, pin 13 is connected to capacitor C39 and the power module, and pin 14 is connected to capacitor C42. Pins 15 and 16 are connected to capacitor C43 and a power module, pin 17 is connected to resistor R115, pin 19 is connected to resistor R114, pins 20, 21, 22, and 23 are connected to resistor R116, pin 27 is connected to capacitor C40 and grounded, pin 28 is connected to capacitor C40, pin 29 is connected to resistor R113, capacitor C64, and a power module, pin 30 is connected to resistor R113, pin 31 is connected to resistor R112, and pin 32 is connected to resistor R209;

[0023] The resistor R108 is connected to the resistor R109, the resistor R110 and the resistor R111 and is grounded; the capacitor C36 is connected to the capacitor C37 and the power module; the capacitor C42 is connected to the power module; the resistor R115 is connected to the resistor R119 and the capacitor C44; the resistor R114 is connected to the resistor R117.

[0024] Further, the voltage and current signal processing module includes an analog switch U12, a resistor R78, a resistor R80, a resistor R82, a resistor R84, a resistor R85, a resistor R86, a resistor R87, a resistor R88, a resistor R89, a resistor R90, a resistor R91, a resistor R92, a resistor R93, a resistor R94, a resistor R95, a resistor R96, a resistor R97, a resistor R98, a resistor R99, a resistor R100, a resistor R101, a resistor R102, a resistor R103, a resistor R104, a resistor R105, a TVS tube D22, an operational amplifier U14A, an operational amplifier U14B, an operational amplifier U16A, an operational amplifier U16B, a bidirectional diode D15, a capacitor C28, a capacitor C29, a capacitor C31, a capacitor C32, a capacitor C33, a capacitor C34 and a capacitor C35;

[0025] Pin 1 of the analog switch U12 is connected to pin 14 of the MCU, pin 2 is connected to pin 15 of the MCU, pin 3 is connected to the power module, pin 4 is connected to resistor R78 and the test link switching module, pins 5 and 13 are connected to resistor R78, resistor R80 and the test link switching module, pins 6 and 12 are connected to resistor R80, resistor R82 and the test link switching module, pins 7 and 11 are connected to resistor R82, resistor R84 and the test link switching module, pin 8 is connected to resistor R85 and resistor R86, pin 9 is connected to resistor R87, pin 10 is connected to resistor R84 and TVS tube D22, and pin 14 is connected to the power module;

[0026] After the resistor R89 ​​is connected in parallel with the capacitor C31, one end is connected to the resistor R88 and the pin 2 of the operational amplifier U14A, and the other end is connected to the resistor R91, the resistor R92 and the pin 1 of the operational amplifier U14A; the pin 3 of the operational amplifier U14A is connected to the resistor R87 and the capacitor C29, and the pins 4 and 8 are connected to the power module;

[0027] One end of the resistor R93 is connected to the resistor R90 and the resistor R91, and the other end is connected to the capacitor C32 and the pin 3 of the operational amplifier U16A; the pin 1 of the operational amplifier U16A is connected to the resistor R97 and the resistor R100, the pin 2 is connected to the resistor R97, and the pins 4 and 8 are connected to the power module; one end of the capacitor C34 is connected to the resistor R100 and the analog-to-digital conversion module, and the other end is connected to the resistor R101 and the analog-to-digital conversion module;

[0028] Pin 5 of the operational amplifier U14B is connected to resistor R86 and capacitor C28, pin 6 is connected to resistor R92, resistor R94 and capacitor C33, and pin 7 is connected to resistor R95 and resistor R96; pins 1 and 2 of the bidirectional diode D15 are connected to the power module, and pin 3 is connected to resistor R94, resistor R96, resistor R98 and capacitor C33; pin 5 of the operational amplifier U16B is connected to resistor R98 and resistor R102, pin 6 is connected to resistor R99 and resistor R103, and pin 7 is connected to resistor R104; one end of the capacitor C35 is connected to resistor R104 and the analog-to-digital conversion module, and the other end is connected to resistor R105 and the analog-to-digital conversion module.

[0029] Further, the test link switching module includes an optical coupler K1, an optical coupler K6, an optical coupler K7, an optical coupler K8, a resistor R1, a resistor R2, a resistor R49, a resistor R50, a resistor R124, a resistor R126, a resistor R127, a resistor R128, a resistor R129, a resistor R130, a resistor R131, a resistor R132, a resistor R133, a resistor R134, a resistor R135, a resistor R136, a resistor R137, a resistor R138, a resistor R139, a resistor R141, a resistor R159, a resistor R160, a resistor R162, a resistor R163, a resistor R197, a resistor R198, a resistor R213, a resistor R214, a resistor R215, a resistor R216, a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q6, a MOS transistor Q10, a MOS transistor Q11, a MOS transistor Q12, a MOS transistor Q13, a MOS transistor Q14, a MOS transistor Q16, a MOS transistor Q21, a TVS transistor D23, a relay K2, a relay K3, a relay K4, a relay K5, a relay K12, a relay K17, a relay K20, a diode D1, a diode D2, a diode D10, a diode D17, a diode D18, a diode D19, and a diode D43;

[0030] Pin 1 of the optocoupler K1 is connected to the power module, pin 2 is connected to the resistor R124, pin 3 is connected to pin 3 of the optocoupler K6, pin 3 of the optocoupler K7, pin 3 of the optocoupler K8, TVS tube D23 and pin 3 of the relay K17, and pin 4 is connected to resistor R78 and pin 4 of the analog switch U12; pin 1 of the optocoupler K6 is connected to the power module, pin 2 is connected to resistor R128, and pin 4 is connected to resistor R78 and resistor R80; pin 1 of the optocoupler K7 is connected to the power module, pin 2 is connected to resistor R131, and pin 4 is connected to resistor R80 and resistor R82; pin 1 of the optocoupler K8 is connected to the power module, pin 2 is connected to resistor R134, and pin 4 is connected to resistor R82 and resistor R84;

[0031] The G pole of the MOS tube Q1 is connected to the resistor R49 and the resistor R50, the S pole is connected to the resistor R50 and grounded, and the D pole is connected to the resistor R124; the resistor R49 is connected to the pin 29 of the MCU;

[0032] The G pole of the MOS tube Q10 is connected to the resistor R126 and the resistor R127, the S pole is connected to the resistor R127 and grounded, and the D pole is connected to the resistor R128; the resistor R126 is connected to the pin 30 of the MCU;

[0033] The G pole of the MOS tube Q11 is connected to the resistor R129 and the resistor R130, the S pole is connected to the resistor R130 and grounded, and the D pole is connected to the resistor R131; the resistor R129 is connected to the pin 31 of the MCU;

[0034] The G pole of the MOS tube Q12 is connected to the resistor R132 and the resistor R133, the S pole is connected to the resistor R133 and grounded, and the D pole is connected to the resistor R134; the resistor R132 is connected to the pin 32 of the MCU;

[0035] Pin 1 of the relay K17 is connected to the output end of the diode D17 and the power module, pin 2 is connected to pin 3 of the relay K4, pin 4 is connected to pin 3 of the relay K2, pin 5 is connected to resistor R162, pin 6 is connected to resistor R84, pin 7 is connected to pin 6 of the relay K4, and pin 8 is connected to the input end of the diode D17 and the D pole of the MOS tube Q13; the G pole of the MOS tube Q13 is connected to the resistor R135 and the resistor R136, and the S pole is connected to the resistor R136 and grounded;

[0036] Pin 1 of the relay K4 is connected to the output end of the diode D18 and the power module, pin 2 is connected to pin 3 of the relay K12, pin 4 is connected to pin 6 of the relay K3, pin 5 is connected to resistor R160, pin 7 is connected to pin 6 of the relay K12, and pin 8 is connected to the input end of the diode D18 and the D pole of the MOS tube Q14; the G pole of the MOS tube Q14 is connected to the resistor R137 and the resistor R138, and the S pole is connected to the resistor R138 and grounded;

[0037] Pin 1 of the relay K12 is connected to the output end of the diode D19 and the power module, pin 2 is connected to pin 3 of the relay K20, pin 4 is connected to pin 3 of the relay K3, pin 7 is connected to pin 6 of the relay K20, and pin 8 is connected to the input end of the diode D19 and the D pole of the MOS tube Q16; the G pole of the MOS tube Q16 is connected to the resistor R139 and the resistor R141, and the S pole is connected to the resistor R141 and grounded;

[0038] Pin 1 of the relay K20 is connected to the output end of the diode D43 and the power module, pin 4 is connected to pin 4 of the relay K5, and pin 8 is connected to the input end of the diode D43 and the D pole of the MOS tube Q21; the G pole of the MOS tube Q21 is connected to the resistor R197 and the resistor R198, and the S pole is connected to the resistor R198 and grounded;

[0039] Pin 1 of the relay K2 is connected to the output end of the diode D1 and the power module, pin 4 is connected to the resistor R162, pin 5 is connected to the resistor R159, and pin 8 is connected to the input end of the diode D1 and the D pole of the MOS tube Q2; the G pole of the MOS tube Q2 is connected to the resistor R213 and the resistor R215, and the S pole is connected to the resistor R215 and grounded;

[0040] Pin 1 of the relay K3 is connected to the output end of the diode D2 and the power module, pin 4 is connected to the resistor R163, pin 5 is connected to the resistor R160, and pin 8 is connected to the input end of the diode D2 and the D pole of the MOS tube Q3; the G pole of the MOS tube Q3 is connected to the resistor R214 and the resistor R216, and the S pole is connected to the resistor R216 and grounded;

[0041] Pin 1 of the relay K5 is connected to the output end of the diode D10 and the power module, and pin 8 is connected to the input end of the diode D10 and the D pole of the MOS tube Q6; the G pole of the MOS tube Q6 is connected to the resistor R1 and the resistor R2, and the S pole is connected to the resistor R2 and grounded.

[0042] The advantages of the present invention are:

[0043] 1. By setting up a lithium battery protection board communication link voltage and current test device including an MCU, a power module, an analog-to-digital conversion module, a voltage and current signal processing module and a test link switching module, the lithium battery protection board communication link voltage and current test device can switch the test link through the test link switching module, and test the voltage and current of the communication link through the voltage and current signal processing module, that is, the lithium battery protection board communication link voltage and current are tested, which greatly improves the comprehensiveness and reliability of the test; and the test lead of the present invention is connected in series to the corresponding test line of the traditional test equipment and the protection board, so as to realize the voltage and current test on the protection board communication line link, which greatly improves the compatibility.

[0044] 2. The connection between the traditional test equipment and the protection board is switched by a relay, which reduces interference sources and enhances the stability of the collected signal of the present invention.

[0045] 3. By combining and switching the relay and the analog switch, the switching control of multiple current values ​​is performed to avoid the use of a large current collection resistor under a large current state, which causes a large voltage drop on the current collection resistor, resulting in a low voltage on the communication line of the protection board, affecting the accuracy of current collection. That is, the present invention greatly guarantees the accuracy of current collection.

[0046] 4. By setting the differential acquisition mode of the current value and using the operational amplifier for pre-stage buffering, further differential processing is performed instead of using resistors for differential sampling processing in the pre-stage, which enhances the accuracy of current acquisition and reduces leakage current.

[0047] 5. By using positive and negative voltages to supply the analog acquisition power supply of the analog-to-digital conversion module, the analog-to-digital conversion module can directly acquire the voltage provided by the operational amplifier, so that the present invention can acquire positive and negative current values ​​and voltage values.

[0048] 6. By setting the operational amplifier that transmits the voltage to the analog-to-digital conversion module and using a power supply that is consistent with the power supply of the analog-to-digital conversion module, damage to the analog-to-digital conversion module due to excessively high or low voltage transmitted to the acquisition pin of the analog-to-digital conversion module can be avoided, thereby ensuring the reliability of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] The present invention will be further described below in conjunction with embodiments with reference to the accompanying drawings.

[0050] Figure 1 The invention discloses a circuit principle block diagram of a voltage and current testing device for a communication link of a lithium battery protection board.

[0051] Figure 2 It is a circuit diagram of the power supply protection unit of the present invention.

[0052] Figure 3is a circuit diagram of the DCDC unit of the present invention.

[0053] Figure 4 It is a circuit diagram of the linear voltage stabilizing unit of the present invention.

[0054] Figure 5 It is a circuit diagram of the analog-to-digital conversion module of the present invention.

[0055] Figure 6 It is a circuit diagram of the voltage and current signal processing module of the present invention.

[0056] Figure 7 It is a circuit diagram of the test link switching module of the present invention.

[0057] Figure 8 It is a circuit diagram of the MCU of the present invention. DETAILED DESCRIPTION

[0058] Please refer to Figures 1 to 8 As shown, a preferred embodiment of a lithium battery protection board communication link voltage and current test device of the present invention includes an MCU, a power module, an analog-to-digital conversion module (ADC module), a voltage and current signal processing module and a test link switching module;

[0059] The MCU is used to control the test object and path selection of the test link switching module, control the switching of the corresponding signal acquisition processing in the voltage and current signal processing module, exchange information with the analog-to-digital conversion module, obtain the current sampling value, and convert the sampled data according to the configuration of the current test object. The model can be selected as the ARM microprocessor TM4C1294; the power supply module includes protection measures such as overvoltage, reverse connection, and short circuit at the power input end, and then the power supply with adjusted voltage is delivered to each module for use; the analog-to-digital conversion module is used to convert the analog signal transmitted from the voltage and current signal processing module into a digital signal and transmit it to the MCU for further processing of the digital signal; the voltage and current signal processing module is used to further process the signal to be tested through the voltage and current acquisition circuit after switching the test object, and the processed signal is delivered to the analog-to-digital conversion module; the test link switching module opens the corresponding test link according to the signal transmitted by the MCU, and provides a signal acquisition object for the voltage and current signal processing module.

[0060] The MCU, the analog-to-digital conversion module, the voltage and current signal processing module and the test link switching module are connected in sequence; the MCU is respectively connected to the voltage and current signal processing module and the test link switching module; the power supply module is respectively connected to the MCU, the analog-to-digital conversion module, the voltage and current signal processing module and the test link switching module;

[0061] The power supply module includes a power supply protection unit, a DCDC unit and a linear voltage stabilization unit;

[0062] The power supply protection unit includes a power supply interface J3, a fuse F1, a diode D3, a diode D4, a diode D5, a gas discharge tube G1, a capacitor C3, a capacitor C4, a resistor R52, a resistor R53, a resistor R56, a resistor R188, a transistor Q4, a MOS tube Q5 and a light emitting diode LED_5V_PRO;

[0063] Pin 1 of the power supply interface J3 is connected to the fuse F1, and pins 2 and 3 are connected to pin 2 of the gas discharge tube G1, capacitor C3, the input end of the diode D3, resistor R56, the input end of the diode D4, capacitor C4, and the output end of the light-emitting diode LED_5V_PRO; pin 1 of the gas discharge tube G1 is connected to capacitor C3;

[0064] The b-pole of the transistor Q4 is connected to the resistor R53, the c-pole is connected to the resistor R56 and the G-pole of the MOS tube Q5, and the e-pole is connected to the resistor R52, the output end of the diode D5 and the S-pole of the MOS tube Q5; the input end of the diode D5 is connected to the fuse F1; the output end of the diode D3 is connected to the resistor R52 and the resistor R53;

[0065] One end of the resistor R188 is connected to the input end of the light emitting diode LED_5V_PRO, and the other end is connected to the D pole of the MOS tube Q5, the output end of the diode D4, the capacitor C4 and the DCDC unit.

[0066] The DCDC unit includes a DC conversion chip U4, a DC conversion chip U7, a capacitor C5, a capacitor C6, a capacitor C7, a capacitor C8, a capacitor C9 and an inductor L1;

[0067] Pin 2 of the DC conversion chip U7 is connected to capacitor C5 and resistor R188, pin 1 is connected to capacitor C5 and grounded, pin 6 is connected to capacitor C8 and a linear voltage regulator unit, pin 7 is connected to capacitor C8 and capacitor C9 and grounded, and pin 8 is connected to capacitor C9 and a linear voltage regulator unit;

[0068] Pin 2 of the DC conversion chip U4 is connected to capacitor C6 and resistor R188, pin 1 is connected to capacitor C6 and grounded, pin 6 is connected to capacitor C7, inductor L1 and a linear voltage regulator unit, and pin 7 is connected to capacitor C8 and grounded; the inductor L1 is connected to a test link switching module.

[0069] The linear voltage stabilizing unit includes a linear voltage stabilizing chip U8, a linear voltage stabilizing chip U9, a linear voltage stabilizing chip U10, a diode D6, a diode D7, a diode D8, a diode D9, a capacitor C10, a capacitor C11, a capacitor C12, a capacitor C13, a capacitor C14, a capacitor C15, a capacitor C16, a capacitor C17, a capacitor C18, a capacitor C19, a resistor R60, a resistor R62, a resistor R63, a resistor R64 and a resistor R65;

[0070] Pins 1 and 3 of the linear voltage regulator chip U9 are connected to pin 6 of the DC conversion chip U7, the output end of the diode D6, the capacitor C10, and the voltage and current signal processing module; after the capacitor C15 and the capacitor C17 are connected in parallel, one end is grounded, and the other end is connected to the input end of the diode D6, pins 4 and 5 of the linear voltage regulator chip U9, pin 3 of the linear voltage regulator chip U8, the analog-to-digital conversion module, and the voltage and current signal processing module;

[0071] Pin 2 of the linear voltage regulator chip U8 is connected to the capacitor C11, the input end of the diode D8 and the voltage and current signal processing module, and pin 5 is connected to the output end of the diode D8, one end of the capacitor C14, one end of the capacitor C16, the analog-to-digital conversion module and the voltage and current signal processing module; the other end of the capacitor C14 is connected to the other end of the capacitor C16 and is grounded;

[0072] Pins 1 and 2 of the linear voltage regulator chip U10 are connected to the output end of the diode D9, the capacitor C18, the resistor R64, the input end of the diode D7, the capacitor C19, the analog-to-digital conversion module and pins 7, 8, 16, 26, 28, 39, 47, 51, 52, 69, 79, 90, 101 and 122 of the MCU, pin 3 is connected to the input end of the diode D9, the resistor R63, the resistor R65 and the capacitor C18, pin 4 is connected to the resistor R63 and the capacitor C19 and is grounded, pins 5, 7 and 8 are connected to the capacitor C12, one end of the resistor R60, one end of the resistor R62 and the output end of the diode D7, pin 6 is connected to the capacitor C13; the other end of the resistor R60 is connected to the other end of the resistor R62 and pin 6 of the DC conversion chip U4; the resistor R64 is connected to the resistor R65.

[0073] The analog-to-digital conversion module includes an ADC chip U18, an active crystal oscillator Y2, a resistor R108, a resistor R109, a resistor R110, a resistor R111, a resistor R112, a resistor R113, a resistor R114, a resistor R115, a resistor R117, a resistor R119, a resistor R120, a resistor R121, a resistor R209, a resistor row R116, a resistor row R118, an inductor L2, a capacitor C36, a capacitor C37, a capacitor C39, a capacitor C40, a capacitor C42, a capacitor C43, a capacitor C44, a capacitor C45, a capacitor C46, ​​a capacitor C47, a capacitor C48 and a capacitor C64; the model of the ADC chip U18 can be selected as ADS131A04;

[0074] After the capacitor C45 is connected in parallel with the capacitor C46, ​​one end is grounded, and the other end is connected to the inductor L2 and the pin 4 of the active crystal oscillator Y2; one end of the resistor R120 is connected to the inductor L2 and the capacitor C47, and the other end is connected to the power module; one end of the resistor R121 is connected to the capacitor C48 and the pin 3 of the active crystal oscillator Y2, and the other end is connected to the pin 25 of the ADC chip U18; the pin 2 of the active crystal oscillator Y2 is connected to the capacitor C48 and the ground;

[0075] One end of the resistor R118 is connected to the resistor R116 and the pins 120, 121, 123, and 124 of the MCU, and the other end is connected to the resistor R117, the resistor R119, and the power module;

[0076] Pins 1, 2, 3, and 4 of the ADC chip U18 are connected to the voltage and current signal processing module, pin 5 is connected to resistor R108, pin 6 is connected to resistor R109, pin 7 is connected to resistor R110, pin 8 is connected to resistor R111, pin 9 is connected to capacitor C36, capacitor C37, and a power module, pins 10 and 11 are connected to the power module, pin 12 is connected to capacitor C39, pin 13 is connected to capacitor C39 and the power module, and pin 14 is connected to capacitor C42. Pins 15 and 16 are connected to capacitor C43 and a power module, pin 17 is connected to resistor R115, pin 19 is connected to resistor R114, pins 20, 21, 22, and 23 are connected to resistor R116, pin 27 is connected to capacitor C40 and grounded, pin 28 is connected to capacitor C40, pin 29 is connected to resistor R113, capacitor C64, and a power module, pin 30 is connected to resistor R113, pin 31 is connected to resistor R112, and pin 32 is connected to resistor R209;

[0077] The resistor R108 is connected to the resistor R109, the resistor R110 and the resistor R111 and is grounded; the capacitor C36 is connected to the capacitor C37 and the power module; the capacitor C42 is connected to the power module; the resistor R115 is connected to the resistor R119 and the capacitor C44; the resistor R114 is connected to the resistor R117.

[0078] The voltage and current signal processing module includes an analog switch U12, a resistor R78, a resistor R80, a resistor R82, a resistor R84, a resistor R85, a resistor R86, a resistor R87, a resistor R88, a resistor R89, a resistor R90, a resistor R91, a resistor R92, a resistor R93, a resistor R94, a resistor R95, a resistor R96, a resistor R97, a resistor R98, a resistor R99, a resistor R100, a resistor R101, a resistor R102, and a resistor R103. 03. A resistor R104, a resistor R105, a TVS tube D22, an operational amplifier U14A, an operational amplifier U14B, an operational amplifier U16A, an operational amplifier U16B, a bidirectional diode D15, a capacitor C28, a capacitor C29, a capacitor C31, a capacitor C32, a capacitor C33, a capacitor C34 and a capacitor C35; the model of the analog switch U12 can be MUX509; the model of the operational amplifier U14A, the operational amplifier U14B, the operational amplifier U16A and the operational amplifier U16B can be OPA2188;

[0079] Pin 1 of the analog switch U12 is connected to pin 14 of the MCU, pin 2 is connected to pin 15 of the MCU, pin 3 is connected to the power module, pin 4 is connected to resistor R78 and the test link switching module, pins 5 and 13 are connected to resistor R78, resistor R80 and the test link switching module, pins 6 and 12 are connected to resistor R80, resistor R82 and the test link switching module, pins 7 and 11 are connected to resistor R82, resistor R84 and the test link switching module, pin 8 is connected to resistor R85 and resistor R86, pin 9 is connected to resistor R87, pin 10 is connected to resistor R84 and TVS tube D22, and pin 14 is connected to the power module;

[0080] After the resistor R89 ​​is connected in parallel with the capacitor C31, one end is connected to the resistor R88 and the pin 2 of the operational amplifier U14A, and the other end is connected to the resistor R91, the resistor R92 and the pin 1 of the operational amplifier U14A; the pin 3 of the operational amplifier U14A is connected to the resistor R87 and the capacitor C29, and the pins 4 and 8 are connected to the power module;

[0081] One end of the resistor R93 is connected to the resistor R90 and the resistor R91, and the other end is connected to the capacitor C32 and the pin 3 of the operational amplifier U16A; the pin 1 of the operational amplifier U16A is connected to the resistor R97 and the resistor R100, the pin 2 is connected to the resistor R97, and the pins 4 and 8 are connected to the power module; one end of the capacitor C34 is connected to the resistor R100 and the analog-to-digital conversion module, and the other end is connected to the resistor R101 and the analog-to-digital conversion module;

[0082] Pin 5 of the operational amplifier U14B is connected to resistor R86 and capacitor C28, pin 6 is connected to resistor R92, resistor R94 and capacitor C33, and pin 7 is connected to resistor R95 and resistor R96; pins 1 and 2 of the bidirectional diode D15 are connected to the power module, and pin 3 is connected to resistor R94, resistor R96, resistor R98 and capacitor C33; pin 5 of the operational amplifier U16B is connected to resistor R98 and resistor R102, pin 6 is connected to resistor R99 and resistor R103, and pin 7 is connected to resistor R104; one end of the capacitor C35 is connected to resistor R104 and the analog-to-digital conversion module, and the other end is connected to resistor R105 and the analog-to-digital conversion module.

[0083] The test link switching module includes an optical coupler K1, an optical coupler K6, an optical coupler K7, an optical coupler K8, a resistor R1, a resistor R2, a resistor R49, a resistor R50, a resistor R124, a resistor R126, a resistor R127, a resistor R128, a resistor R129, a resistor R130, a resistor R131, a resistor R132, a resistor R133, a resistor R134, a resistor R135, a resistor R136, a resistor R137, a resistor R138, a resistor R139, a resistor R141, a resistor R159, a resistor R160, a resistor R162, a resistor R163, a resistor R197, a resistor R198, and a resistor R199. a resistor R213, a resistor R214, a resistor R215, a resistor R216, a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q6, a MOS transistor Q10, a MOS transistor Q11, a MOS transistor Q12, a MOS transistor Q13, a MOS transistor Q14, a MOS transistor Q16, a MOS transistor Q21, a TVS transistor D23, a relay K2, a relay K3, a relay K4, a relay K5, a relay K12, a relay K17, a relay K20, a diode D1, a diode D2, a diode D10, a diode D17, a diode D18, a diode D19 and a diode D43;

[0084] Pin 1 of the optocoupler K1 is connected to the power module, pin 2 is connected to the resistor R124, pin 3 is connected to pin 3 of the optocoupler K6, pin 3 of the optocoupler K7, pin 3 of the optocoupler K8, TVS tube D23 and pin 3 of the relay K17, and pin 4 is connected to resistor R78 and pin 4 of the analog switch U12; pin 1 of the optocoupler K6 is connected to the power module, pin 2 is connected to resistor R128, and pin 4 is connected to resistor R78 and resistor R80; pin 1 of the optocoupler K7 is connected to the power module, pin 2 is connected to resistor R131, and pin 4 is connected to resistor R80 and resistor R82; pin 1 of the optocoupler K8 is connected to the power module, pin 2 is connected to resistor R134, and pin 4 is connected to resistor R82 and resistor R84;

[0085] The G pole of the MOS tube Q1 is connected to the resistor R49 and the resistor R50, the S pole is connected to the resistor R50 and grounded, and the D pole is connected to the resistor R124; the resistor R49 is connected to the pin 29 of the MCU;

[0086] The G pole of the MOS tube Q10 is connected to the resistor R126 and the resistor R127, the S pole is connected to the resistor R127 and grounded, and the D pole is connected to the resistor R128; the resistor R126 is connected to the pin 30 of the MCU;

[0087] The G pole of the MOS tube Q11 is connected to the resistor R129 and the resistor R130, the S pole is connected to the resistor R130 and grounded, and the D pole is connected to the resistor R131; the resistor R129 is connected to the pin 31 of the MCU;

[0088] The G pole of the MOS tube Q12 is connected to the resistor R132 and the resistor R133, the S pole is connected to the resistor R133 and grounded, and the D pole is connected to the resistor R134; the resistor R132 is connected to the pin 32 of the MCU;

[0089] Pin 1 of the relay K17 is connected to the output end of the diode D17 and the power module, pin 2 is connected to pin 3 of the relay K4, pin 4 is connected to pin 3 of the relay K2, pin 5 is connected to resistor R162, pin 6 is connected to resistor R84, pin 7 is connected to pin 6 of the relay K4, and pin 8 is connected to the input end of the diode D17 and the D pole of the MOS tube Q13; the G pole of the MOS tube Q13 is connected to the resistor R135 and the resistor R136, and the S pole is connected to the resistor R136 and grounded;

[0090] Pin 1 of the relay K4 is connected to the output end of the diode D18 and the power module, pin 2 is connected to pin 3 of the relay K12, pin 4 is connected to pin 6 of the relay K3, pin 5 is connected to resistor R160, pin 7 is connected to pin 6 of the relay K12, and pin 8 is connected to the input end of the diode D18 and the D pole of the MOS tube Q14; the G pole of the MOS tube Q14 is connected to the resistor R137 and the resistor R138, and the S pole is connected to the resistor R138 and grounded;

[0091] Pin 1 of the relay K12 is connected to the output end of the diode D19 and the power module, pin 2 is connected to pin 3 of the relay K20, pin 4 is connected to pin 3 of the relay K3, pin 7 is connected to pin 6 of the relay K20, and pin 8 is connected to the input end of the diode D19 and the D pole of the MOS tube Q16; the G pole of the MOS tube Q16 is connected to the resistor R139 and the resistor R141, and the S pole is connected to the resistor R141 and grounded;

[0092] Pin 1 of the relay K20 is connected to the output end of the diode D43 and the power module, pin 4 is connected to pin 4 of the relay K5, and pin 8 is connected to the input end of the diode D43 and the D pole of the MOS tube Q21; the G pole of the MOS tube Q21 is connected to the resistor R197 and the resistor R198, and the S pole is connected to the resistor R198 and grounded;

[0093] Pin 1 of the relay K2 is connected to the output end of the diode D1 and the power module, pin 4 is connected to the resistor R162, pin 5 is connected to the resistor R159, and pin 8 is connected to the input end of the diode D1 and the D pole of the MOS tube Q2; the G pole of the MOS tube Q2 is connected to the resistor R213 and the resistor R215, and the S pole is connected to the resistor R215 and grounded;

[0094] Pin 1 of the relay K3 is connected to the output end of the diode D2 and the power module, pin 4 is connected to the resistor R163, pin 5 is connected to the resistor R160, and pin 8 is connected to the input end of the diode D2 and the D pole of the MOS tube Q3; the G pole of the MOS tube Q3 is connected to the resistor R214 and the resistor R216, and the S pole is connected to the resistor R216 and grounded;

[0095] Pin 1 of the relay K5 is connected to the output end of the diode D10 and the power module, and pin 8 is connected to the input end of the diode D10 and the D pole of the MOS tube Q6; the G pole of the MOS tube Q6 is connected to the resistor R1 and the resistor R2, and the S pole is connected to the resistor R2 and grounded.

[0096] Working principle of the present invention:

[0097] According to the communication mode of the protection board to be tested, the voltage and current test device of the lithium battery protection board communication link is connected in series between the traditional test equipment and the protection board. Assuming that the communication mode to be tested on the protection board is the HDQ (single bus) communication mode, the interface of network number HDQ and GND is connected to the corresponding interface of the protection board, and the interface of network number HDQ_I N and NGND is connected to the corresponding interface of the traditional test equipment. (Assuming that the communication mode to be tested on the protection board is the IIC communication mode, the interface of network number SCL, SDA and GND is connected to the corresponding interface of the protection board, and the interface of network number SCL_IN, SDA_IN, NGND is connected to the corresponding interface of the traditional test equipment). According to the user's test object, the MCU controls the test link switching module accordingly. The following is an example of testing with HDQ communication:

[0098] Assuming that the voltage value on the HDQ communication line of the protection board is to be tested, the MCU controls relay K2 to be in the normally closed contact, controls relay K5 to be in the normally open contact, controls relay K17 to be in the normally open contact, and sets the MCU-end control signals of the remaining optocouplers and relays to a low level, so that the output end of the optocoupler is in the disconnected state, and the relay is in the normally closed contact, so that the HDQ terminal of the traditional test equipment and the HDQ terminal of the protection board are in the disconnected state, so as to avoid affecting the test of the voltage on the HDQ line of the protection board. After that, the MCU selects the selection control of the analog switch U12 in the voltage and current signal processing module to SA4 (PIN7) and SB4 (PIN10). At this time, the voltage on the HDQ line of the protection board will pass through the switched test link, and the first step of voltage acquisition will be performed by the operational amplifier U14A, and then output by pin 1 of the operational amplifier U14A, and after passing through the resistor R91 and the resistor R90, the second step of voltage processing will be performed by the operational amplifier U16A. The processed signal is transmitted to the analog-to-digital conversion module by the network number AI N2P and AI N2N, and the analog signal is converted into a digital signal and then interacts with the MCU. After the test is completed, the MCU controls the relay K2 and the relay K5 to be in the normally open contact, and the MCU-side control signals of the remaining optocouplers and relays are set to a low level, so that the output end of the optocoupler is in the disconnected state, and the relay is in the normally closed contact, restoring the communication link between the traditional test equipment and the protection board.

[0099] Assuming that the current value to be tested is the current value on the communication line between the traditional test equipment and the protection board HDQ, the MCU controls relay K2 to be in a normally closed contact, controls relay K5 to be in a normally open contact, controls relay K17 to be in a normally open contact, and sets the MCU-end control signals of the remaining optocouplers and relays to a low level, so that the output end of the optocoupler is in a disconnected state and the relay is in a normally closed contact. The HDQ terminal of the traditional test equipment and the HDQ terminal of the protection board are connected through the present invention, and the current between the two is transmitted through the current acquisition circuit of the present invention. After that, the MCU controls the current value sampling gear according to the current value range that needs to be collected at present.

[0100] 1. If the current value to be collected is below 10uA, the MCU controls the output end of the optocoupler K1 to be in the on state, and controls the selection link of the analog switch U12 to be between PIN4 and PIN13. After the switching is completed, the current on the HDQ line of the traditional test equipment and the protection board will flow through the resistor R78.

[0101] 2. If the current value to be collected is below 100uA, the MCU controls the output end of the optocoupler K6 to be in the on state, and controls the selection link of the analog switch U12 to be between PIN5 and PIN12. After the switching is completed, the current on the HDQ line of the traditional test equipment and the protection board will flow through the resistor R80.

[0102] 3. If the current value to be collected is below 1mA, the MCU controls the output end of the optocoupler K7 to be in the on state, and controls the selection link of the analog switch U12 to be between PIN6 and PIN11. After the switching is completed, the current on the HDQ line of the traditional test equipment and the protection board will flow through the resistor R82.

[0103] 4. If the current value to be collected is below 10mA, the MCU controls the output end of the optocoupler K8 to be in the on state, and controls the selection link of the analog switch U12 to be between PIN7 and PIN10. After the switching is completed, the current on the HDQ line of the traditional test equipment and the protection board will flow through the resistor R84.

[0104] The voltage drop generated by the current flowing through the sampling resistor is collected by the operational amplifier U14A and the operational amplifier U14B in the first step, and then further processed by the operational amplifier U16B. The processed signal is transmitted to the analog-to-digital conversion module through the network number AI N1 P and AIN1 N, and the analog signal is converted into a digital signal and then interacts with the MCU. After the test is completed, the MCU controls the relay K2 and the relay K5 to be in the normally open contact, and the MCU-side control signals of the remaining optocouplers and relays are set to a low level, so that the output end of the optocoupler is in the disconnected state, and the relay is in the normally closed contact, restoring the communication link between the traditional test equipment and the protection board.

[0105] Assuming that the current value to be tested is the current value on the GND line of the traditional test equipment and the protection board, the MCU controls relay K2 to be in a normally open contact, controls relay K5 to be in a normally closed contact, controls relay K20 to be in a normally open contact, and sets the MCU-end control signals of the remaining optocouplers and relays to a low level, so that the output end of the optocoupler is in a disconnected state and the relay is in a normally closed contact. The GND terminal of the traditional test equipment and the GND terminal of the protection board are connected through the present invention, and the current between the two is transmitted through the current acquisition circuit of the present invention. After that, the MCU controls the current value sampling gear according to the current value range that needs to be collected at present, and the collection method is the same as collecting the current value on the HDQ line.

[0106] In summary, the advantages of the present invention are:

[0107] 1. By setting up a lithium battery protection board communication link voltage and current test device including an MCU, a power module, an analog-to-digital conversion module, a voltage and current signal processing module and a test link switching module, the lithium battery protection board communication link voltage and current test device can switch the test link through the test link switching module, and test the voltage and current of the communication link through the voltage and current signal processing module, that is, the lithium battery protection board communication link voltage and current are tested, which greatly improves the comprehensiveness and reliability of the test; and the test lead of the present invention is connected in series to the corresponding test line of the traditional test equipment and the protection board, so as to realize the voltage and current test on the protection board communication line link, which greatly improves the compatibility.

[0108] 2. The connection between the traditional test equipment and the protection board is switched by a relay, which reduces interference sources and enhances the stability of the collected signal of the present invention.

[0109] 3. By combining and switching the relay and the analog switch, the switching control of multiple current values ​​is performed to avoid the use of a large current collection resistor under a large current state, which causes a large voltage drop on the current collection resistor, resulting in a low voltage on the communication line of the protection board, affecting the accuracy of current collection. That is, the present invention greatly guarantees the accuracy of current collection.

[0110] 4. By setting the differential acquisition mode of the current value and using the operational amplifier for pre-stage buffering, further differential processing is performed instead of using resistors for differential sampling processing in the pre-stage, which enhances the accuracy of current acquisition and reduces leakage current.

[0111] 5. By using positive and negative voltages to supply the analog acquisition power supply of the analog-to-digital conversion module, the analog-to-digital conversion module can directly acquire the voltage provided by the operational amplifier, so that the present invention can acquire positive and negative current values ​​and voltage values.

[0112] 6. By setting the operational amplifier that transmits the voltage to the analog-to-digital conversion module and using a power supply that is consistent with the power supply of the analog-to-digital conversion module, damage to the analog-to-digital conversion module due to excessively high or low voltage transmitted to the acquisition pin of the analog-to-digital conversion module can be avoided, thereby ensuring the reliability of the test.

[0113] Although the specific implementation modes of the present invention are described above, those skilled in the art should understand that the specific implementation modes described are only illustrative and are not intended to limit the scope of the present invention. Equivalent modifications and changes made by those skilled in the art in accordance with the spirit of the present invention should be included in the scope of protection of the claims of the present invention.

Claims

1. A lithium battery protection board communication link voltage and current testing device, characterized in that: It includes an MCU, a power module, an analog-to-digital conversion module, a voltage and current signal processing module, and a test link switching module; The MCU, the analog-to-digital conversion module, the voltage and current signal processing module and the test link switching module are connected in sequence; the MCU is respectively connected to the voltage and current signal processing module and the test link switching module; the power supply module is respectively connected to the MCU, the analog-to-digital conversion module, the voltage and current signal processing module and the test link switching module; The power supply module includes a power supply protection unit, a DCDC unit and a linear voltage stabilization unit; The power supply protection unit includes a power supply interface J3, a fuse F1, a diode D3, a diode D4, a diode D5, a gas discharge tube G1, a capacitor C3, a capacitor C4, a resistor R52, a resistor R53, a resistor R56, a resistor R188, a transistor Q4, a MOS tube Q5 and a light emitting diode LED_5V_PRO; Pin 1 of the power supply interface J3 is connected to the fuse F1, and pins 2 and 3 are connected to pin 2 of the gas discharge tube G1, capacitor C3, the input end of the diode D3, resistor R56, the input end of the diode D4, capacitor C4, and the output end of the light-emitting diode LED_5V_PRO; pin 1 of the gas discharge tube G1 is connected to capacitor C3; The b-pole of the transistor Q4 is connected to the resistor R53, the c-pole is connected to the resistor R56 and the G-pole of the MOS tube Q5, and the e-pole is connected to the resistor R52, the output end of the diode D5 and the S-pole of the MOS tube Q5; the input end of the diode D5 is connected to the fuse F1; the output end of the diode D3 is connected to the resistor R52 and the resistor R53; One end of the resistor R188 is connected to the input end of the light emitting diode LED_5V_PRO, and the other end is connected to the D pole of the MOS tube Q5, the output end of the diode D4, the capacitor C4 and the DCDC unit.

2. A lithium battery protection board communication link voltage and current testing device as claimed in claim 1, characterized in that: The DCDC unit includes a DC conversion chip U4, a DC conversion chip U7, a capacitor C5, a capacitor C6, a capacitor C7, a capacitor C8, a capacitor C9 and an inductor L1; Pin 2 of the DC conversion chip U7 is connected to capacitor C5 and resistor R188, pin 1 is connected to capacitor C5 and grounded, pin 6 is connected to capacitor C8 and a linear voltage regulator unit, pin 7 is connected to capacitor C8 and capacitor C9 and grounded, and pin 8 is connected to capacitor C9 and a linear voltage regulator unit; Pin 2 of the DC conversion chip U4 is connected to capacitor C6 and resistor R188, pin 1 is connected to capacitor C6 and grounded, pin 6 is connected to capacitor C7, inductor L1 and a linear voltage regulator unit, and pin 7 is connected to capacitor C8 and grounded; the inductor L1 is connected to a test link switching module.

3. A lithium battery protection board communication link voltage and current testing device as claimed in claim 2, characterized in that: The linear voltage stabilizing unit includes a linear voltage stabilizing chip U8, a linear voltage stabilizing chip U9, a linear voltage stabilizing chip U10, a diode D6, a diode D7, a diode D8, a diode D9, a capacitor C10, a capacitor C11, a capacitor C12, a capacitor C13, a capacitor C14, a capacitor C15, a capacitor C16, a capacitor C17, a capacitor C18, a capacitor C19, a resistor R60, a resistor R62, a resistor R63, a resistor R64 and a resistor R65; Pins 1 and 3 of the linear voltage regulator chip U9 are connected to pin 6 of the DC conversion chip U7, the output end of the diode D6, the capacitor C10, and the voltage and current signal processing module; after the capacitor C15 and the capacitor C17 are connected in parallel, one end is grounded, and the other end is connected to the input end of the diode D6, pins 4 and 5 of the linear voltage regulator chip U9, pin 3 of the linear voltage regulator chip U8, the analog-to-digital conversion module, and the voltage and current signal processing module; Pin 2 of the linear voltage regulator chip U8 is connected to the capacitor C11, the input end of the diode D8 and the voltage and current signal processing module, and pin 5 is connected to the output end of the diode D8, one end of the capacitor C14, one end of the capacitor C16, the analog-to-digital conversion module and the voltage and current signal processing module; the other end of the capacitor C14 is connected to the other end of the capacitor C16 and is grounded; Pins 1 and 2 of the linear voltage regulator chip U10 are connected to the output end of the diode D9, the capacitor C18, the resistor R64, the input end of the diode D7, the capacitor C19, the analog-to-digital conversion module and pins 7, 8, 16, 26, 28, 39, 47, 51, 52, 69, 79, 90, 101 and 122 of the MCU, pin 3 is connected to the input end of the diode D9, the resistor R63, the resistor R65 and the capacitor C18, pin 4 is connected to the resistor R63 and the capacitor C19 and is grounded, pins 5, 7 and 8 are connected to the capacitor C12, one end of the resistor R60, one end of the resistor R62 and the output end of the diode D7, pin 6 is connected to the capacitor C13; the other end of the resistor R60 is connected to the other end of the resistor R62 and pin 6 of the DC conversion chip U4; the resistor R64 is connected to the resistor R65.

4. A lithium battery protection board communication link voltage and current testing device as claimed in claim 1, characterized in that: The analog-to-digital conversion module includes an ADC chip U18, an active crystal oscillator Y2, a resistor R108, a resistor R109, a resistor R110, a resistor R111, a resistor R112, a resistor R113, a resistor R114, a resistor R115, a resistor R117, a resistor R119, a resistor R120, a resistor R121, a resistor R209, a resistor array R116, a resistor array R118, an inductor L2, a capacitor C36, a capacitor C37, a capacitor C39, a capacitor C40, a capacitor C42, a capacitor C43, a capacitor C44, a capacitor C45, a capacitor C46, ​​a capacitor C47, a capacitor C48 and a capacitor C64; After the capacitor C45 is connected in parallel with the capacitor C46, ​​one end is grounded, and the other end is connected to the inductor L2 and the pin 4 of the active crystal oscillator Y2; one end of the resistor R120 is connected to the inductor L2 and the capacitor C47, and the other end is connected to the power module; one end of the resistor R121 is connected to the capacitor C48 and the pin 3 of the active crystal oscillator Y2, and the other end is connected to the pin 25 of the ADC chip U18; the pin 2 of the active crystal oscillator Y2 is connected to the capacitor C48 and the ground; One end of the resistor R118 is connected to the resistor R116 and the pins 120, 121, 123, and 124 of the MCU, and the other end is connected to the resistor R117, the resistor R119, and the power module; Pins 1, 2, 3, and 4 of the ADC chip U18 are connected to the voltage and current signal processing module, pin 5 is connected to resistor R108, pin 6 is connected to resistor R109, pin 7 is connected to resistor R110, pin 8 is connected to resistor R111, pin 9 is connected to capacitor C36, capacitor C37, and a power module, pins 10 and 11 are connected to the power module, pin 12 is connected to capacitor C39, pin 13 is connected to capacitor C39 and the power module, and pin 14 is connected to capacitor C42. Pins 15 and 16 are connected to capacitor C43 and a power module, pin 17 is connected to resistor R115, pin 19 is connected to resistor R114, pins 20, 21, 22, and 23 are connected to resistor R116, pin 27 is connected to capacitor C40 and grounded, pin 28 is connected to capacitor C40, pin 29 is connected to resistor R113, capacitor C64, and a power module, pin 30 is connected to resistor R113, pin 31 is connected to resistor R112, and pin 32 is connected to resistor R209; The resistor R108 is connected to the resistor R109, the resistor R110 and the resistor R111 and is grounded; the capacitor C36 is connected to the capacitor C37 and the power module; the capacitor C42 is connected to the power module; the resistor R115 is connected to the resistor R119 and the capacitor C44; the resistor R114 is connected to the resistor R117.

5. A lithium battery protection board communication link voltage and current testing device as claimed in claim 1, characterized in that: The voltage and current signal processing module includes an analog switch U12, a resistor R78, a resistor R80, a resistor R82, a resistor R84, a resistor R85, a resistor R86, a resistor R87, a resistor R88, a resistor R89, a resistor R90, a resistor R91, a resistor R92, a resistor R93, a resistor R94, a resistor R95, a resistor R96, a resistor R97, a resistor R98, a resistor R99, a resistor R100, a resistor R101, a resistor R102, a resistor R103, a resistor R104, a resistor R105, a TVS tube D22, an operational amplifier U14A, an operational amplifier U14B, an operational amplifier U16A, an operational amplifier U16B, a bidirectional diode D15, a capacitor C28, a capacitor C29, a capacitor C31, a capacitor C32, a capacitor C33, a capacitor C34 and a capacitor C35; Pin 1 of the analog switch U12 is connected to pin 14 of the MCU, pin 2 is connected to pin 15 of the MCU, pin 3 is connected to the power module, pin 4 is connected to resistor R78 and the test link switching module, pins 5 and 13 are connected to resistor R78, resistor R80 and the test link switching module, pins 6 and 12 are connected to resistor R80, resistor R82 and the test link switching module, pins 7 and 11 are connected to resistor R82, resistor R84 and the test link switching module, pin 8 is connected to resistor R85 and resistor R86, pin 9 is connected to resistor R87, pin 10 is connected to resistor R84 and TVS tube D22, and pin 14 is connected to the power module; After the resistor R89 ​​is connected in parallel with the capacitor C31, one end is connected to the resistor R88 and the pin 2 of the operational amplifier U14A, and the other end is connected to the resistor R91, the resistor R92 and the pin 1 of the operational amplifier U14A; the pin 3 of the operational amplifier U14A is connected to the resistor R87 and the capacitor C29, and the pins 4 and 8 are connected to the power module; One end of the resistor R93 is connected to the resistor R90 and the resistor R91, and the other end is connected to the capacitor C32 and the pin 3 of the operational amplifier U16A; the pin 1 of the operational amplifier U16A is connected to the resistor R97 and the resistor R100, the pin 2 is connected to the resistor R97, and the pins 4 and 8 are connected to the power module; one end of the capacitor C34 is connected to the resistor R100 and the analog-to-digital conversion module, and the other end is connected to the resistor R101 and the analog-to-digital conversion module; Pin 5 of the operational amplifier U14B is connected to resistor R86 and capacitor C28, pin 6 is connected to resistor R92, resistor R94 and capacitor C33, and pin 7 is connected to resistor R95 and resistor R96; pins 1 and 2 of the bidirectional diode D15 are connected to the power module, and pin 3 is connected to resistor R94, resistor R96, resistor R98 and capacitor C33; pin 5 of the operational amplifier U16B is connected to resistor R98 and resistor R102, pin 6 is connected to resistor R99 and resistor R103, and pin 7 is connected to resistor R104; one end of the capacitor C35 is connected to resistor R104 and the analog-to-digital conversion module, and the other end is connected to resistor R105 and the analog-to-digital conversion module.

6. A lithium battery protection board communication link voltage and current testing device as claimed in claim 5, characterized in that: The test link switching module includes an optical coupler K1, an optical coupler K6, an optical coupler K7, an optical coupler K8, a resistor R1, a resistor R2, a resistor R49, a resistor R50, a resistor R124, a resistor R126, a resistor R127, a resistor R128, a resistor R129, a resistor R130, a resistor R131, a resistor R132, a resistor R133, a resistor R134, a resistor R135, a resistor R136, a resistor R137, a resistor R138, a resistor R139, a resistor R141, a resistor R159, a resistor R160, a resistor R162, a resistor R163, a resistor R197, a resistor R198, and a resistor R199. a resistor R213, a resistor R214, a resistor R215, a resistor R216, a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q6, a MOS transistor Q10, a MOS transistor Q11, a MOS transistor Q12, a MOS transistor Q13, a MOS transistor Q14, a MOS transistor Q16, a MOS transistor Q21, a TVS transistor D23, a relay K2, a relay K3, a relay K4, a relay K5, a relay K12, a relay K17, a relay K20, a diode D1, a diode D2, a diode D10, a diode D17, a diode D18, a diode D19 and a diode D43; Pin 1 of the optocoupler K1 is connected to the power module, pin 2 is connected to the resistor R124, pin 3 is connected to pin 3 of the optocoupler K6, pin 3 of the optocoupler K7, pin 3 of the optocoupler K8, TVS tube D23 and pin 3 of the relay K17, and pin 4 is connected to resistor R78 and pin 4 of the analog switch U12; pin 1 of the optocoupler K6 is connected to the power module, pin 2 is connected to resistor R128, and pin 4 is connected to resistor R78 and resistor R80; pin 1 of the optocoupler K7 is connected to the power module, pin 2 is connected to resistor R131, and pin 4 is connected to resistor R80 and resistor R82; pin 1 of the optocoupler K8 is connected to the power module, pin 2 is connected to resistor R134, and pin 4 is connected to resistor R82 and resistor R84; The G pole of the MOS tube Q1 is connected to the resistor R49 and the resistor R50, the S pole is connected to the resistor R50 and grounded, and the D pole is connected to the resistor R124; the resistor R49 is connected to the pin 29 of the MCU; The G pole of the MOS tube Q10 is connected to the resistor R126 and the resistor R127, the S pole is connected to the resistor R127 and grounded, and the D pole is connected to the resistor R128; the resistor R126 is connected to the pin 30 of the MCU; The G pole of the MOS tube Q11 is connected to the resistor R129 and the resistor R130, the S pole is connected to the resistor R130 and grounded, and the D pole is connected to the resistor R131; the resistor R129 is connected to the pin 31 of the MCU; The G pole of the MOS tube Q12 is connected to the resistor R132 and the resistor R133, the S pole is connected to the resistor R133 and grounded, and the D pole is connected to the resistor R134; the resistor R132 is connected to the pin 32 of the MCU; Pin 1 of the relay K17 is connected to the output end of the diode D17 and the power module, pin 2 is connected to pin 3 of the relay K4, pin 4 is connected to pin 3 of the relay K2, pin 5 is connected to resistor R162, pin 6 is connected to resistor R84, pin 7 is connected to pin 6 of the relay K4, and pin 8 is connected to the input end of the diode D17 and the D pole of the MOS tube Q13; the G pole of the MOS tube Q13 is connected to the resistor R135 and the resistor R136, and the S pole is connected to the resistor R136 and grounded; Pin 1 of the relay K4 is connected to the output end of the diode D18 and the power module, pin 2 is connected to pin 3 of the relay K12, pin 4 is connected to pin 6 of the relay K3, pin 5 is connected to resistor R160, pin 7 is connected to pin 6 of the relay K12, and pin 8 is connected to the input end of the diode D18 and the D pole of the MOS tube Q14; the G pole of the MOS tube Q14 is connected to the resistor R137 and the resistor R138, and the S pole is connected to the resistor R138 and grounded; Pin 1 of the relay K12 is connected to the output end of the diode D19 and the power module, pin 2 is connected to pin 3 of the relay K20, pin 4 is connected to pin 3 of the relay K3, pin 7 is connected to pin 6 of the relay K20, and pin 8 is connected to the input end of the diode D19 and the D pole of the MOS tube Q16; the G pole of the MOS tube Q16 is connected to the resistor R139 and the resistor R141, and the S pole is connected to the resistor R141 and grounded; Pin 1 of the relay K20 is connected to the output end of the diode D43 and the power module, pin 4 is connected to pin 4 of the relay K5, and pin 8 is connected to the input end of the diode D43 and the D pole of the MOS tube Q21; the G pole of the MOS tube Q21 is connected to the resistor R197 and the resistor R198, and the S pole is connected to the resistor R198 and grounded; Pin 1 of the relay K2 is connected to the output end of the diode D1 and the power module, pin 4 is connected to the resistor R162, pin 5 is connected to the resistor R159, and pin 8 is connected to the input end of the diode D1 and the D pole of the MOS tube Q2; the G pole of the MOS tube Q2 is connected to the resistor R213 and the resistor R215, and the S pole is connected to the resistor R215 and grounded; Pin 1 of the relay K3 is connected to the output end of the diode D2 and the power module, pin 4 is connected to the resistor R163, pin 5 is connected to the resistor R160, and pin 8 is connected to the input end of the diode D2 and the D pole of the MOS tube Q3; the G pole of the MOS tube Q3 is connected to the resistor R214 and the resistor R216, and the S pole is connected to the resistor R216 and grounded; Pin 1 of the relay K5 is connected to the output end of the diode D10 and the power module, and pin 8 is connected to the input end of the diode D10 and the D pole of the MOS tube Q6; the G pole of the MOS tube Q6 is connected to the resistor R1 and the resistor R2, and the S pole is connected to the resistor R2 and grounded.