Crystal Oscillator Frequency Offset Testing Method, Apparatus, Device and Medium

Abstract

The present invention discloses a crystal oscillator frequency offset testing method, device, equipment and medium. The method includes: if the input crystal oscillator specification information is received, obtaining a waveform image detected by the detector; determining a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; performing deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; and judging whether the deviation analysis result conforms to the crystal oscillator specification information to obtain a corresponding frequency offset test result. The above testing method can analyze the waveform image and the reference frequency by obtaining the waveform image and combining the crystal oscillator specification information to obtain a deviation analysis result, so as to accurately obtain the test result of whether there is a frequency offset, and greatly improve the accuracy of testing the crystal oscillator in the circuit board.

Description

Technical Field

[0001] The present invention relates to the technical field of intelligent testing, and particularly to a crystal oscillator frequency offset testing method, device, equipment and medium. Background Art

[0002] A crystal oscillator is a commonly used component in a circuit board. In order to enable the circuit board to work stably, it is necessary to measure the frequency offset of the crystal oscillator before the circuit board leaves the factory. There are several common crystal oscillator frequency offset testing methods in the current technical methods, such as the frequency meter method, the oscilloscope detection method and the spectrum analyzer method. However, the accuracy of the instruments used in the frequency meter method and the oscilloscope detection method is relatively low; the spectrum analyzer can meet the high-precision crystal oscillator testing, but its price is relatively high, and it is impossible to achieve low-cost measurement of the crystal oscillator. Therefore, the technical methods for crystal oscillator measurement in the prior art have the problem of low measurement accuracy. Summary of the Invention

[0003] Embodiments of the present invention provide a crystal oscillator frequency offset testing method, device, equipment and medium, aiming to solve the problem of low measurement accuracy existing in the technical methods for crystal oscillator measurement in the prior art.

[0004] In a first aspect, embodiments of the present invention provide a crystal oscillator frequency offset testing method. The testing method is applied to a testing terminal, and the testing terminal is communicatively connected to a detector to achieve data information transmission. The probe of the detector is close to the crystal oscillator to be tested for frequency offset testing. The testing method includes:

[0005] If the input crystal oscillator specification information is received, obtain the waveform image detected by the detector;

[0006] Determine the reference frequency corresponding to the crystal oscillator specification information according to the preset frequency determination rule and the waveform image;

[0007] Perform deviation analysis on the waveform image and the reference frequency according to the preset deviation analysis rule to obtain the corresponding deviation analysis result;

[0008] Judge whether the deviation analysis result meets the crystal oscillator specification information to obtain the corresponding frequency offset test result.

[0009] In a second aspect, embodiments of the present application further provide a crystal oscillator frequency offset testing device. The testing device is configured in a testing terminal, and the testing terminal is communicatively connected to a detector to achieve data information transmission. The probe of the detector is close to the crystal oscillator to be tested for frequency offset testing. The testing device includes:

[0010] A waveform image acquisition unit, configured to obtain the waveform image detected by the detector if the input crystal oscillator specification information is received;

[0011] A reference frequency acquisition unit, configured to determine a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image;

[0012] A deviation analysis result acquisition unit, configured to perform deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result;

[0013] A frequency offset test result acquisition unit, configured to determine whether the deviation analysis result meets the crystal oscillator specification information to obtain a corresponding frequency offset test result.

[0014] In a third aspect, an embodiment of the present application further provides a computer device, including a processor, a communication interface, a memory, and a communication bus. Among them, the processor, the communication interface, and the memory complete communication with each other through the communication bus;

[0015] The memory is used to store a computer program;

[0016] The processor, when executing the program stored on the memory, implements the crystal oscillator frequency offset test method as described in the first aspect above.

[0017] In a fourth aspect, an embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. Among them, when the computer program is executed by a processor, the steps of the crystal oscillator frequency offset test method as described in the first aspect are implemented.

[0018] An embodiment of the present invention provides a crystal oscillator frequency offset test method, device, equipment, and medium. The method includes: if the input crystal oscillator specification information is received, obtaining a waveform image detected by the detector; determining a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; performing deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; determining whether the deviation analysis result meets the crystal oscillator specification information to obtain a corresponding frequency offset test result. The above test method can obtain a deviation analysis result by acquiring a waveform image and combining the crystal oscillator specification information, and then accurately obtain a test result on whether there is a frequency offset, greatly improving the accuracy of testing the crystal oscillator in the circuit board. Description of the Drawings

[0019] To more clearly illustrate the technical solutions of the embodiments of the present invention, the following will briefly introduce the accompanying drawings required for the description of the embodiments. Obviously, the accompanying drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can also be obtained based on these drawings.

[0020] Figure 1 It is a flowchart of the crystal oscillator frequency offset testing method provided by the embodiments of the present invention;

[0021] Figure 2 It is a schematic diagram of the application scenario of the crystal oscillator frequency offset testing method provided by the embodiments of the present invention;

[0022] Figure 3 It is an application effect diagram of the crystal oscillator frequency offset testing method provided by the embodiments of the present invention;

[0023] Figure 4 It is a schematic block diagram of the crystal oscillator frequency offset testing device provided by the embodiments of the present invention;

[0024] Figure 5 It is a schematic block diagram of the computer device provided by the embodiments of the present invention. Specific embodiments

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art without creative efforts based on the embodiments of the present invention belong to the scope of protection of the present invention.

[0026] It should be understood that when used in this specification and the appended claims, the terms "comprises" and "comprising" indicate the presence of the described features, wholes, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, wholes, steps, operations, elements, components, and / or their combinations.

[0027] It should also be understood that the terms used in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are intended to include the plural forms.

[0028] It should be further understood that the term " / and" used in the specification of the present invention and the appended claims refers to any combination and all possible combinations of one or more of the related listed items, and includes these combinations.

[0029] Please refer to Figure 1 , as shown in the figure, an embodiment of the present application discloses a crystal oscillator frequency offset testing method; as Figure 2 shown, this method is applied to the test terminal 10, and the test terminal 10 is communicatively connected to the detector 20 to achieve the transmission of data information. The probe of the detector 20 is close to the crystal oscillator to be tested for frequency offset testing. Specifically, as Figure 3 shown, the probe of the detector 20 consists of a coupling coil 21 and a transmission line. The coupling coil 21 is connected to the detector 20 through a connection line. The crystal oscillator 31 to be tested is arranged on the circuit board 30. The coupling coil 21 surrounds the outside of the crystal oscillator 31 to be tested. The transmission line is a radio frequency coaxial cable, and one end of the transmission line without an SMA terminal is wound to form the coupling coil 21. The coupling coil 21 is used to transmit an alternating current signal. When an alternating current passes through a coil (referred to as the primary coil), it generates a changing electromagnetic field. This electromagnetic field induces a current in another nearby coil (referred to as the secondary coil), thereby achieving signal transmission. Then, the coupling coil 21 can detect the magnetic field change in the crystal oscillator based on electromagnetic induction and obtain a corresponding detection signal. The detection signal is transmitted to the detector 20 for analysis to obtain a waveform image, and the waveform image is transmitted to the test terminal 10 for test analysis. Among them, the detector 20 can be a CMW500 comprehensive tester. The CMW500 comprehensive tester is a dedicated instrument for measuring radio frequency, and has extremely high-precision measurement results for frequency. The lowest frequency it can measure is 70 MHz. The test terminal 10 can be a terminal device with data transceiver and processing functions, such as a desktop computer, a notebook computer, a tablet computer, or a mobile phone, etc. As Figure 1 shown, this method includes steps S110 to S140.

[0030] S110. If the input crystal oscillator specification information is received, obtain the waveform image detected by the detector.

[0031] If the input crystal oscillator specification information is received, obtain the waveform image detected by the detector. The test terminal can receive the crystal oscillator specification information input by the user. The crystal oscillator specification information is the specific information used to record the crystal oscillator model and specification. The crystal oscillator specification information includes information such as the crystal oscillator type, rated frequency, and frequency tolerance range. For example, the crystal oscillator type can be a passive type, the rated frequency can be 25 MHz, and the frequency tolerance range can be ±10 PPM. The test terminal can correspondingly obtain the waveform image detected by the detector.

[0032] The waveform image detected by the detector contains multiple harmonic frequencies. The interval distances between adjacent harmonic frequencies in the waveform image are all equal, and the amplitudes of the harmonic frequencies decrease as the frequency increases. According to the analysis principle of the French mathematician Fourier (M. Fourier), any repetitive waveform can be decomposed into sine wave components containing the fundamental frequency (main frequency) and a series of harmonics that are multiples of the fundamental frequency. The formula is expressed as follows: V(t)=V1sin(ωt)+V2 sin(2ωt)+V3 sin(3ωt) +........; where V(t) represents the voltage value at time t, V1 represents the fundamental voltage value, ω represents the angular frequency of the fundamental wave, and V2, V3,....... etc. represent the respective harmonic voltage values.

[0033] S120. Determine the reference frequency corresponding to the crystal oscillator specification information according to the preset frequency determination rule and the waveform image.

[0034] Determine the reference frequency corresponding to the crystal oscillator specification information according to the preset frequency determination rule and the waveform image. Further, determine the reference frequency corresponding to the crystal oscillator specification information according to the frequency determination rule and the obtained waveform diagram. The reference frequency is an integer multiple of the rated frequency in the crystal oscillator specification information. However, since there are multiple frequency values that are integer multiples of the rated frequency, it is necessary to correspondingly determine one of the frequency values as the reference frequency.

[0035] In a specific embodiment, step S120 includes the steps of: calculating a corresponding plurality of alternative frequencies according to the rated frequency in the crystal oscillator specification information and the magnification factor set in the frequency determination rule; obtaining an alternative frequency that is closest to the main frequency in the waveform image from the plurality of alternative frequencies as the reference frequency.

[0036] Specifically, the rated frequency in the crystal oscillator specification information can be obtained and calculated with the magnification factor set in the frequency determination rule. The rated frequency can be multiplied by each magnification factor respectively to obtain the corresponding plurality of alternative frequencies. The magnification factor can be set to 1, 2, 3,..., 10.

[0037] Further, compare the frequency differences between each alternative frequency and the main frequency in the waveform image, and select an alternative frequency that is closest to the main frequency as the reference frequency according to the frequency difference, that is, select an alternative frequency with the smallest frequency difference from the main frequency as the reference frequency.

[0038] In a specific embodiment, before obtaining an alternative frequency that is closest to the main frequency in the waveform image from the plurality of alternative frequencies as the reference frequency, it further includes: obtaining the amplitudes of the harmonic frequencies in the waveform image; determining a harmonic frequency with the largest amplitude as the main frequency of the waveform image.

[0039] Specifically, since the waveform image contains multiple harmonic frequencies, the amplitudes of the harmonic frequencies in the waveform image can be obtained separately. The amplitude of a harmonic frequency is also the harmonic intensity corresponding to that harmonic frequency. The greater the amplitude, the higher the harmonic intensity. Determine the harmonic frequency with the largest amplitude as the corresponding main frequency.

[0040] In a specific embodiment, before determining the harmonic frequency with the largest amplitude as the main frequency of the waveform image, it further includes: calculating the amplitude attenuation coefficient between adjacent harmonic frequencies; determining whether each of the amplitude attenuation coefficients is within a preset reference interval; if each of the amplitude attenuation coefficients is within the reference interval, then perform the step of determining the harmonic frequency with the largest amplitude as the main frequency of the waveform image; if any one of the amplitude attenuation coefficients is not within the reference interval, generate a prompt message indicating waveform abnormality.

[0041] Further, to improve the detection accuracy, the amplitude attenuation coefficient between adjacent harmonic frequencies in the waveform image can be calculated; that is, the amplitude of the previous harmonic frequency is divided by the amplitude of the next harmonic frequency, and the resulting ratio is the corresponding amplitude attenuation coefficient. Then, a corresponding amplitude attenuation coefficient can be calculated for each pair of adjacent harmonic frequencies. Further, determine whether each amplitude attenuation coefficient is within the preset reference interval. Since the attenuation process is non-linear, the reference interval corresponding to each amplitude attenuation coefficient can be calculated based on the harmonic frequency corresponding to the amplitude attenuation coefficient. Specifically, the reference interval can be expressed as [0.75R i , 1.2R i , where R i is the reference attenuation coefficient, and its calculation process can be expressed by formula (1):

[0042] (1);

[0043] where i is the serial number of the reference attenuation coefficient (the value of i is an integer between 1 and 10). For example, the serial number of the reference attenuation coefficient corresponding to the first harmonic frequency and the second harmonic frequency is 1, and one reference attenuation coefficient corresponds to one amplitude attenuation coefficient. Through the above calculation formula, the reference attenuation coefficient corresponding to each amplitude attenuation coefficient can be determined, and the corresponding reference interval can be determined based on the reference attenuation coefficient; then each amplitude attenuation coefficient corresponds to a reference interval.

[0044] Further determine whether each amplitude attenuation coefficient is within the corresponding reference interval. If all are within the corresponding reference, then perform the step of obtaining the main frequency of the waveform image; if any one of the amplitude attenuation coefficients is not within the corresponding reference interval, then determine that the current waveform image is abnormal, and a prompt message indicating waveform abnormality can be generated to prompt the current tester.

[0045] In a specific embodiment, before calculating the amplitude attenuation coefficient between adjacent harmonic frequencies, the method further includes: determining whether the amplitude of the harmonic frequency with the largest amplitude is greater than a preset amplitude threshold; if the amplitude of the harmonic frequency with the largest amplitude is greater than the amplitude threshold, performing the step of calculating the amplitude attenuation coefficient between adjacent harmonic frequencies; if the amplitude of the harmonic frequency with the largest amplitude is not greater than the amplitude threshold, generating a prompt message indicating that the wave signal is weak.

[0046] Further, to improve the accuracy of detection, it is also possible to determine whether the amplitude of the harmonic frequency with the largest amplitude is greater than a preset amplitude threshold. If it is greater, it indicates that the amplitude of this harmonic frequency meets the test requirements and the signal strength of the current harmonic frequency is strong. If it is not greater, it indicates that the signal strength of this harmonic frequency is weak, which may lead to inaccurate test results, that is, it indicates that the amplitude of this harmonic frequency does not meet the test requirements. If it is greater than the amplitude threshold, perform the subsequent steps of calculating the amplitude attenuation coefficient; if it is not greater than the amplitude threshold, a prompt message indicating that the wave signal is weak can be generated to prompt the tester.

[0047] S130. Perform deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result.

[0048] Perform deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result. Further, the deviation analysis rule can be used to perform deviation analysis on the waveform image and the reference frequency, thereby obtaining a deviation analysis result.

[0049] In a specific embodiment, the step of performing deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result includes: calculating the frequency deviation value between the main frequency in the waveform image and the reference frequency; calculating the reference frequency and the frequency deviation value through the analysis calculation formula in the deviation analysis rule to obtain a corresponding deviation amplitude as the corresponding deviation analysis result.

[0050] Specifically, the frequency deviation value between the main frequency in the waveform image and the reference frequency can be calculated; further, the reference frequency and the frequency deviation value are calculated through the analysis calculation formula in the deviation analysis rule. The specific calculation formula is shown in formula (2):

[0051] (2);

[0052] where f 0 - f t represents the frequency deviation value between the main frequency and the reference frequency, f 0is the main frequency in the waveform image, f t is the reference frequency, s is the magnification factor, and p is the deviation amplitude.

[0053] For example, s is 10 6 , f 0 is 75000510.454 Hz, f t is 75 MHz (75×10 6 Hz), then the corresponding calculated deviation amplitude is 6.8 PPM. PPM (Parts Per Million) is a unit of precision. The obtained deviation amplitude is used as the deviation analysis result.

[0054] S140. Determine whether the deviation analysis result conforms to the crystal oscillator specification information to obtain the corresponding frequency deviation test result.

[0055] Determine whether the deviation analysis result conforms to the crystal oscillator specification information to obtain the corresponding frequency deviation test result. Further determine whether the deviation analysis result conforms to the crystal oscillator specification information. If the deviation analysis result conforms to the crystal oscillator specification information, a frequency deviation test result without frequency deviation is obtained; if the deviation analysis result does not conform to the crystal oscillator specification information, a frequency deviation test result with frequency deviation is obtained.

[0056] In a specific embodiment, the determining whether the deviation analysis result conforms to the crystal oscillator specification information to obtain the corresponding frequency deviation test result includes: determining whether the deviation amplitude value in the deviation analysis result is within the frequency tolerance range in the crystal oscillator specification information to determine whether the deviation analysis result conforms to the crystal oscillator specification information; if the deviation analysis result conforms to the crystal oscillator specification information, a frequency deviation test result without frequency deviation is obtained; if the deviation analysis result does not conform to the crystal oscillator specification information, a frequency deviation test result with frequency deviation is obtained.

[0057] Specifically, it can be determined whether the deviation amplitude value is within the frequency tolerance range. For example, if the frequency tolerance range in the crystal oscillator specification information is ±10 PPM, the corresponding range interval is [-10 PPM, 10 PPM]. If the deviation amplitude value is within this frequency tolerance range, it is determined that the deviation analysis result conforms to the crystal oscillator specification information; if the deviation amplitude value is not within this frequency tolerance range, it is determined that the deviation analysis result does not conform to the crystal oscillator specification information. Through the above determination, the frequency deviation test result of whether there is frequency deviation can be obtained, so as to accurately test whether the crystal oscillator under test has frequency deviation.

[0058] With the high precision and detection depth of the CMW500, the frequency deviation of the crystal oscillator can be accurately measured; moreover, it is possible to measure the frequency deviation of the crystal oscillator without being equipped with an expensive spectrum analyzer, significantly reducing the test cost of the frequency deviation of the crystal oscillator.

[0059] The crystal oscillator frequency deviation test method disclosed in the above embodiments includes: if the input crystal oscillator specification information is received, obtaining the waveform image detected by the detector; determining the reference frequency corresponding to the crystal oscillator specification information according to the preset frequency determination rule and the waveform image; performing deviation analysis on the waveform image and the reference frequency according to the preset deviation analysis rule to obtain the corresponding deviation analysis result; judging whether the deviation analysis result conforms to the crystal oscillator specification information to obtain the corresponding frequency deviation test result. The above test method can, by obtaining the waveform image and combining the crystal oscillator specification information, analyze the waveform image and the reference frequency to obtain the deviation analysis result, thereby accurately obtaining the test result of whether there is a frequency deviation, and significantly improving the accuracy of testing the crystal oscillator in the circuit board.

[0060] An embodiment of the present invention further provides a crystal oscillator frequency deviation test device. The crystal oscillator frequency deviation test device can be configured in a test terminal. The test terminal is communicatively connected to a detector to realize the transmission of data information. The probe of the detector is close to the crystal oscillator to be tested to perform frequency deviation test on the crystal oscillator to be tested. The crystal oscillator frequency deviation test device is used to execute any one of the foregoing embodiments of the crystal oscillator frequency deviation test method. Specifically, please refer to Figure 4 , Figure 4 which is a schematic block diagram of the crystal oscillator frequency deviation test device provided by the embodiment of the present invention.

[0061] As Figure 4 shown, the crystal oscillator frequency deviation test device 100 includes a waveform image acquisition unit 110, a reference frequency acquisition unit 120, a deviation analysis result acquisition unit 130, and a frequency deviation test result acquisition unit 140.

[0062] The waveform image acquisition unit 110 is configured to, if the input crystal oscillator specification information is received, obtain the waveform image detected by the detector.

[0063] The reference frequency acquisition unit 120 is configured to determine the reference frequency corresponding to the crystal oscillator specification information according to the preset frequency determination rule and the waveform image.

[0064] The deviation analysis result acquisition unit 130 is configured to perform deviation analysis on the waveform image and the reference frequency according to the preset deviation analysis rule to obtain the corresponding deviation analysis result.

[0065] The frequency deviation test result acquisition unit 140 is configured to judge whether the deviation analysis result conforms to the crystal oscillator specification information to obtain the corresponding frequency deviation test result.

[0066] In the crystal oscillator frequency offset testing device provided by the embodiments of the present invention, when the input crystal oscillator specification information is received, a waveform image detected by the detector is obtained; a reference frequency corresponding to the crystal oscillator specification information is determined according to a preset frequency determination rule and the waveform image; deviation analysis is performed on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; it is determined whether the deviation analysis result conforms to the crystal oscillator specification information to obtain a corresponding frequency offset test result. The above testing method can, by obtaining a waveform image and combining the crystal oscillator specification information, analyze the waveform image and the reference frequency to obtain a deviation analysis result, so as to accurately obtain a test result on whether there is a frequency offset, greatly improving the accuracy of testing the crystal oscillator in a circuit board.

[0067] The above crystal oscillator frequency offset testing device can be implemented in the form of a computer program, and this computer program can run on a computer device.

[0068] Please refer to Figure 5 , Figure 5 which is a schematic block diagram of a computer device provided by the embodiments of the present invention. This computer device can be a test terminal used to execute the crystal oscillator frequency offset testing method to implement the test and analysis of whether there is a frequency offset in the crystal oscillator.

[0069] Refer to Figure 5 , the computer device 500 includes a processor 502, a memory, and a communication interface 505 connected through a communication bus 501. Among them, the memory can include a storage medium 503 and an internal memory 504.

[0070] The storage medium 503 can store an operating system 5031 and a computer program 5032. When the computer program 5032 is executed, the processor 502 can be made to execute the crystal oscillator frequency offset testing method. Among them, the storage medium 503 can be a volatile storage medium or a non-volatile storage medium.

[0071] The processor 502 is used to provide computing and control capabilities to support the operation of the entire computer device 500.

[0072] The internal memory 504 provides an environment for the operation of the computer program 5032 in the storage medium 503. When the computer program 5032 is executed by the processor 502, the processor 502 can be made to execute the crystal oscillator frequency offset testing method.

[0073] The communication interface 505 is used for network communication, such as providing the transmission of data information, etc. Those skilled in the art can understand that Figure 5The structure shown is only a block diagram of some structures related to the solution of the present invention, and does not constitute a limitation on the computer device 500 to which the solution of the present invention is applied. Specifically, the computer device 500 may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0074] Among them, the processor 502 is used to run the computer program 5032 stored in the memory to implement the corresponding functions in the above crystal oscillator frequency offset test method.

[0075] Those skilled in the art can understand that Figure 5 the embodiments of the computer device shown do not constitute a limitation on the specific composition of the computer device. In other embodiments, the computer device may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements. For example, in some embodiments, the computer device may only include a memory and a processor. In such an embodiment, the structures and functions of the memory and the processor are the same as those Figure 5 shown in the embodiment, and will not be described in detail here.

[0076] It should be understood that in the embodiments of the present invention, the processor 502 may be a central processing unit (CPU), and the processor 502 may also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0077] In another embodiment of the present invention, a computer-readable storage medium is provided. The computer-readable storage medium may be a volatile or non-volatile computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps included in the above crystal oscillator frequency offset test method are implemented.

[0078] Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working processes of the above-described devices, apparatuses, and units can refer to the corresponding processes in the foregoing method embodiments, and will not be elaborated herein. Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described according to functions in the above description. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0079] In several embodiments provided by the present invention, it should be understood that the disclosed devices, apparatuses, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods, or units with the same function can be aggregated into one unit. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed couplings or direct couplings or communication connections to each other can be indirect couplings or communication connections through some interfaces, devices, or units, and can also be in the form of electrical, mechanical, or other connections.

[0080] The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they can be located in one place, or can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiments of the present invention.

[0081] In addition, the functional units in each embodiment of the present invention can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units.

[0082] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a computer-readable storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned computer-readable storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROMs), magnetic disks, or optical discs.

[0083] As described above, the above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of various equivalent modifications or substitutions, and these modifications or substitutions should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. A crystal oscillator frequency deviation test method, the test method is applied to a test terminal, the test terminal is connected to a detector for communication to achieve data information transmission, the probe of the detector is close to the crystal oscillator to be tested to perform a frequency deviation test on the crystal oscillator to be tested, characterized in that: The test method includes: If the input crystal oscillator specification information is received, a waveform image detected by the detector is obtained; Determine a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; Performing deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; Determine whether the deviation analysis result meets the crystal oscillator specification information, and obtain a corresponding frequency deviation test result; The step of determining a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image includes: Calculate the corresponding multiple candidate frequencies according to the rated frequency in the crystal oscillator specification information and the multiplication factor set in the frequency determination rule; Acquire, from the plurality of candidate frequencies, a candidate frequency closest to the main frequency in the waveform image as a reference frequency; Before acquiring an alternative frequency closest to the main frequency in the waveform image from the plurality of alternative frequencies as a reference frequency, the method further includes: Obtaining the amplitude of each harmonic frequency in the waveform image; Determine a harmonic frequency with the largest amplitude as the main frequency of the waveform image; Before determining a harmonic frequency with the largest amplitude as the main frequency of the waveform image, the method further includes: Calculate the amplitude attenuation coefficient between adjacent harmonic frequencies; Determining whether each of the amplitude attenuation coefficients is within a preset reference interval; If all the amplitude attenuation coefficients are within the reference interval, the step of determining a harmonic frequency with the largest amplitude as the main frequency of the waveform image is performed; If any of the amplitude attenuation coefficients is not within the reference interval, a prompt message indicating waveform abnormality is generated.

2. The crystal oscillator frequency deviation testing method according to claim 1, characterized in that: Before calculating the amplitude attenuation coefficient between adjacent harmonic frequencies, the method further includes: Determine whether the amplitude of a harmonic frequency with the largest amplitude is greater than a preset amplitude threshold; If the amplitude of the harmonic frequency with the largest amplitude is greater than the amplitude threshold, the step of calculating the amplitude attenuation coefficient between adjacent harmonic frequencies is performed; If the amplitude of the harmonic frequency with the largest amplitude is not greater than the amplitude threshold, a prompt message indicating that the harmonic signal is weak is generated.

3. The crystal oscillator frequency deviation testing method according to claim 1, characterized in that: The performing deviation analysis on the waveform image and the reference frequency according to the preset deviation analysis rule to obtain the corresponding deviation analysis result includes: Calculating a frequency deviation value between a main frequency in the waveform image and the reference frequency; The reference frequency and the frequency deviation value are calculated by the analytical calculation formula in the deviation analysis rule to obtain a corresponding deviation amplitude as a corresponding deviation analysis result.

4. The crystal oscillator frequency deviation testing method according to claim 1, characterized in that: The determining whether the deviation analysis result meets the crystal oscillator specification information to obtain a corresponding frequency deviation test result includes: Determining whether the deviation amplitude value in the deviation analysis result is within the frequency tolerance range in the crystal oscillator specification information to determine whether the deviation analysis result complies with the crystal oscillator specification information; If the deviation analysis result meets the crystal oscillator specification information, a frequency deviation test result with no frequency deviation is obtained; If the deviation analysis result does not meet the crystal oscillator specification information, a frequency deviation test result with frequency deviation is obtained.

5. A crystal oscillator frequency deviation test device, characterized in that: The device is used to perform the crystal oscillator frequency deviation test method according to any one of claims 1 to 4, the test device is configured in a test terminal, the test terminal is connected to a detector for communication to achieve data information transmission, the probe of the detector is close to the crystal oscillator to be tested to perform a frequency deviation test on the crystal oscillator to be tested, and the test device includes: A waveform image acquisition unit, configured to acquire a waveform image detected by the detector upon receiving input crystal oscillator specification information; A reference frequency acquisition unit, used to determine a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; A deviation analysis result acquisition unit, used to perform deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; The frequency deviation test result acquisition unit is used to determine whether the deviation analysis result conforms to the crystal oscillator specification information, and obtain a corresponding frequency deviation test result.

6. A computer device, characterized in that: The computer device includes a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus; Memory, used to store computer programs; A processor, for implementing the crystal oscillator frequency deviation testing method according to any one of claims 1 to 4 when executing a program stored in a memory.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the crystal oscillator frequency deviation testing method as described in any one of claims 1 to 4 are implemented.

Images