Discharge tube service life test circuit

Abstract

A discharge tube life test circuit disclosed by the present invention comprises a to-be-tested sample, a master control circuit and a voltage sampling circuit, the master control circuit is connected with the to-be-tested sample and the voltage sampling circuit, and the voltage sampling circuit is also connected with the to-be-tested sample and is used for collecting the voltage at the output end of the discharge tube sample and feeding back the voltage to the master control circuit. The main control circuit is used for judging the working state of the sample to be tested according to a feedback result; the master controller comprises a master control chip, a driving chip, a relay RY1 and a relay RY2; the main control chip is connected with the driving chip, and the driving chip and the discharge tube test sample are respectively connected with the relay RY1 and the relay RY2. Through cooperation of the main control circuit and the sampling circuit, whether parameters of the discharge tube meet design requirements or not is detected by testing the action voltage of the discharge tube, the service life times of a discharge tube sample are detected through high action voltage and long-time testing, and powerful guarantee is provided for controller product design.

Description

Technical Field

[0001] The invention relates to the field of discharge tube testing electronic circuits, and in particular to a discharge tube life testing circuit. Background Art

[0002] In order to meet product safety requirements, the controller circuit is generally connected to a discharge tube circuit to meet EMC test requirements. In the controller, the discharge tube plays a vital role, and its main function is to protect the circuit from overvoltage (such as lightning and surge).

[0003] A discharge tube (also called a gas discharge tube) is a device that converts electrical energy into light energy or heat energy. When the overvoltage at both ends of the discharge tube exceeds the breakdown voltage of the discharge tube itself, the gas in the tube is rapidly ionized under the action of the electric field and forms a conductive channel, allowing the current to pass quickly, effectively releasing the overvoltage energy to the ground, thereby protecting sensitive devices in the circuit.

[0004] The life test of the discharge tube is an important part of evaluating its long-term stability and reliability. The life of the discharge tube is mainly tested by testing the operating voltage and various parameters of the discharge tube. In the existing scheme, there is no relatively effective and stable method to test the operating voltage of the discharge tube and the number of operating times of the set frequency test under the operating voltage. Therefore, the existing scheme needs to be further improved.

[0005] This new test circuit provides an effective detection method to determine whether the discharge tube meets our use requirements and whether the discharge tube life meets our design requirements. This detection circuit tests the discharge tube's operating voltage and the number of operations at a set frequency under the operating voltage, thereby verifying the discharge tube sample's life. Summary of the invention

[0006] In order to solve the above technical problems, a test circuit is proposed to test the operating voltage of the discharge tube and the number of operations of the set frequency test under the operating voltage, so as to check the life of the discharge tube sample and effectively verify the life of the discharge tube.

[0007] To achieve the above object, the technical solution adopted by the present invention is as follows: a discharge tube life test circuit, including a sample to be tested, a main control circuit and a voltage sampling circuit,

[0008] The main control circuit is connected to the sample to be tested and the voltage sampling circuit respectively. The voltage sampling circuit is also connected to the sample to be tested to collect the voltage at the output end of the discharge tube sample and feed it back to the main control circuit. The main control circuit determines the working state of the sample to be tested according to the feedback result.

[0009] The samples to be tested include a discharge tube test sample DS1 and a discharge tube test sample DS2;

[0010] The main control includes a main control chip U1, a drive chip D3, a relay RY1 and a relay RY2;

[0011] Pin 23 and pin 24 of the main control chip U1 are connected to pin 6 and pin 7 of the driving chip D3 respectively, pin 10 of the driving chip D3 is connected to the relay RY1, pin 11 of the driving chip D3 is connected to the relay RY2, the discharge tube test sample DS1 is connected to the relay RY1, and the discharge tube test sample DS2 is connected to the relay RY2.

[0012] Preferably, the chip model of the main control chip U1 is STM8S005K6T6C.

[0013] Preferably, the chip model of the driving chip D3 is ULN2003AN.

[0014] Preferably, the sampling circuit includes resistors R1 to R20, capacitors C3, C4, C5, C6, a clamping diode D4 and a clamping diode D5;

[0015] The resistors R1 to R7 are connected in series to form a first voltage-dropping resistor assembly, one end of which is connected to the discharge tube test sample DS1, and the other end is connected to PGND;

[0016] The resistors R11 to R17 are connected in series to form a second voltage-dropping resistor assembly, one end of which is connected to the discharge tube test sample DS2, and the other end is connected to PGND;

[0017] The cathode end of the clamping diode D4 is connected to the power supply end, the anode end is connected to the resistor R10, and the cathode / anode ends are connected to the capacitor C4 and PGND;

[0018] The branch formed by the series connection of the resistor R10 and the capacitor C4 is then connected in parallel with the resistor R9 and the capacitor C3 respectively;

[0019] The branch formed by the capacitor C3 and the resistor R8 being connected in series is connected to the resistor R7;

[0020] The cathode end of the clamping diode D5 is connected to the power supply end, the anode end is connected to the resistor R20, and the cathode / anode ends are connected to the capacitor C6 and PGND;

[0021] The branch formed by the series connection of the resistor R20 and the capacitor C6 is then connected in parallel with the resistor R19 and the capacitor C5 respectively;

[0022] The branch formed by the series connection of the capacitor C5 and the resistor R18 is connected to the resistor R17.

[0023] Preferably, a signal interface AD-VDC1 is provided between the resistor R10 and the capacitor C4, and the signal interface AD-VDC1 is connected to the pin 16 of the main control chip U1.

[0024] Preferably, a signal interface AD-VDC2 is provided between the resistor R20 and the capacitor C6, and the signal interface AD-VDC2 is connected to the pin 15 of the main control chip U1.

[0025] Preferably, the main control chip sends a high-level driving signal to pins 6 and 7 of the driving chip D3 through pins 23 and 24, converting the driving signal into a 12V driving signal;

[0026] The output drive signals of pins 10 and 11 of the driver chip D3 are low level 0V, and the pins 3 of relays RY1 and RY2 are low level;

[0027] At this time, the coil ends of relays RY1 and RY2 are energized, the contact ends of relays RY1 and RY2, pins 1 and 2, are closed and turned on, the input ends of discharge tube test samples DS1 and DS2 are energized, and the test state is entered;

[0028] When the voltages at pins 1 and 3 of the DS1 and DS2 input terminals reach the action voltage of 60V, pin 2 of the DS1 and DS2 output terminals is energized with a voltage of 60V;

[0029] When the main control chip sends a low-level driving signal to pins 6 and 7 of the driver chip D3 through pins 23 and 24, the driving signal is converted into a 12V driving signal;

[0030] Pins 10 and 11 of the driver chip D3 output drive signals of high level 12V, and pin 3 of relays RY1 and RY2 is high level. At this time, there is no power at the coil ends of RY1 and RY2, and pins 1 and 2 of the contact ends of RY1 and RY2 are disconnected. There is no power at the input ends of the discharge tube test samples DS1 and DS2, and the discharge tube enters a non-test state, and DS1 and DS2 have no output.

[0031] Preferably, the sampling resistor reduces the voltage at the output end of the discharge tube test sample to a low voltage by means of voltage division through resistors R1 to R7 and R11 to R17, and then reduces the voltage again through resistors R8 to R9 and R18 to R19, and then filters out high-frequency and interference components through capacitors C3, C4, C5, and C6, and adds clamping diodes D4 and D5 to limit its voltage range to 0 to 5V, and then sends the AD-VDC1 and AD-VDC2 signals to pins 16 and 15 of the main control chip U1 for detection.

[0032] The beneficial technical effects of the present invention are as follows: the present invention can verify whether the discharge tube parameters meet the design requirements by testing the action voltage of the discharge tube through the cooperation of the main control circuit and the sampling circuit; at the same time, it can also verify whether the discharge tube sample meets the design requirements by the number of actions at a certain frequency under a set voltage; testing multiple discharge tube samples at one time can improve the detection efficiency; by increasing the action voltage and testing for a long time, the life times of the discharge tube sample can be detected, providing a strong guarantee for the controller product design. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 The present invention is a schematic diagram of the overall circuit of a discharge tube life test circuit. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with embodiments, but the scope of protection claimed in the present invention is not limited to the following specific embodiments.

[0035] like Figure 1 As shown, a discharge tube life test circuit includes a sample to be tested, a main control circuit and a voltage sampling circuit.

[0036] The main control circuit is connected to the sample to be tested and the voltage sampling circuit respectively. The voltage sampling circuit is also connected to the sample to be tested to collect the voltage at the output end of the discharge tube sample and feed it back to the main control circuit. The main control circuit determines the working state of the sample to be tested according to the feedback result.

[0037] Specifically, the samples to be tested include a discharge tube test sample DS1 and a discharge tube test sample DS2;

[0038] The main control includes a main control chip U1, a drive chip D3, a relay RY1 and a relay RY2;

[0039] Pin 23 and pin 24 of the main control chip U1 are connected to pin 6 and pin 7 of the driving chip D3 respectively, pin 10 of the driving chip D3 is connected to the relay RY1, pin 11 of the driving chip D3 is connected to the relay RY2, the discharge tube test sample DS1 is connected to the relay RY1, and the discharge tube test sample DS2 is connected to the relay RY2.

[0040] In this embodiment, the chip model of the main control chip U1 is STM8S005K6T6C. The chip model of the driving chip D3 is ULN2003AN.

[0041] The specific circuit of the sampling circuit is as follows:

[0042] The sampling circuit includes resistors R1 to R20, capacitors C3, C4, C5, C6, a clamping diode D4 and a clamping diode D5; the resistors R1 to R7 are connected in series to form a first voltage-dropping resistor component, one end of which is connected to the discharge tube test sample DS1, and the other end is connected to PGND; the resistors R11 to R17 are connected in series to form a second voltage-dropping resistor component, one end of which is connected to the discharge tube test sample DS2, and the other end is connected to PGND;

[0043] The cathode end of the clamping diode D4 is connected to the power supply end, the anode end is connected to the resistor R10, and the cathode / anode ends are connected to the capacitor C4 and PGND; the branch after the resistor R10 and the capacitor C4 are connected in series is then connected in parallel with the resistor R9 and the capacitor C3 respectively; the branch after the capacitor C3 and the resistor R8 are connected in series is connected to the resistor R7; the cathode end of the clamping diode D5 is connected to the power supply end, the anode end is connected to the resistor R20, and the cathode / anode ends are connected to the capacitor C6 and PGND; the branch after the resistor R20 and the capacitor C6 are connected in series is then connected in parallel with the resistor R19 and the capacitor C5 respectively; the branch after the capacitor C5 and the resistor R18 are connected in series is connected to the resistor R17.

[0044] In addition, a signal interface AD-VDC1 is provided between the resistor R10 and the capacitor C4, and the signal interface AD-VDC1 is connected to the pin 16 of the main control chip U1; a signal interface AD-VDC2 is provided between the resistor R20 and the capacitor C6, and the signal interface AD-VDC2 is connected to the pin 15 of the main control chip U1.

[0045] Specifically, the working principle of the main control circuit is:

[0046] The main control chip sends a high-level drive signal to pins 6 and 7 of the driver chip D3 through pins 23 and 24, converting the drive signal into a 12V drive signal; pins 10 and 11 of the driver chip D3 output a low-level drive signal of 0V, and pins 3 of relays RY1 and RY2 are at a low level;

[0047] At this time, the coil ends of relays RY1 and RY2 are energized, the contact ends of relays RY1 and RY2, pins 1 and 2, are closed and turned on, the input ends of discharge tube test samples DS1 and DS2 are energized, and the test state is entered;

[0048] When the voltages at pins 1 and 3 of the DS1 and DS2 input terminals reach the action voltage of 60V, pin 2 of the DS1 and DS2 output terminals is energized with a voltage of 60V;

[0049] When the main control chip sends a low-level driving signal to pins 6 and 7 of the driver chip D3 through pins 23 and 24, the driving signal is converted into a 12V driving signal;

[0050] Pins 10 and 11 of the driver chip D3 output drive signals of high level 12V, and pin 3 of relays RY1 and RY2 is high level. At this time, there is no power at the coil ends of RY1 and RY2, and pins 1 and 2 of the contact ends of RY1 and RY2 are disconnected. There is no power at the input ends of the discharge tube test samples DS1 and DS2, and the discharge tube enters a non-test state, and DS1 and DS2 have no output.

[0051] The working principle of the sampling circuit is as follows:

[0052] The sampling resistor reduces the voltage at the output end of the discharge tube test sample to a low voltage by means of voltage division through resistors R1~R7 and R11~R17, and then reduces the voltage again through resistors R8~R9 and R18~R19. Then, the high-frequency and interference components are filtered out through capacitors C3, C4, C5, C6, and the voltage range is limited to 0 to 5V by adding clamping diodes D4 and D5. Then, the AD-VDC1 and AD-VDC2 signals are sent to pins 16 and 15 of the main control chip U1 for detection.

[0053] The overall circuit principle is:

[0054] First, connect the discharge tube test sample to the circuit and adjust the test voltage, and enter the test mode through the external control panel control (external data is communicated with pins 25 and 26 of the main control chip U1 through pins 3 and 4 of CN1 through resistors R21 and R22, and the main control chip U1 chip executes data and sends instructions to pins 23 and 24 of the control end IO port). At this time, the main control chip receives the external control panel instruction, outputs a high level to pins 6 and 7 of the test port of the driver chip D3, D3 converts the drive signal to a low level, and outputs the drive relays RY1 and RY2 from the output port pins 10 and 11, and the contacts of RY1 and RY2 are closed. At this time, the discharge tube test samples DS1 and DS2 are energized.

[0055] When the test voltage reaches the discharge tube action voltage of 60V, the discharge tube is activated, enters the discharge state, and the output port is energized. The voltage sampling circuit detects the voltage at the output end of the discharge tube sample and feeds it back to the main control chip to detect the action state of the discharge tube sample. When the discharge tube is not in action, the voltage detected by the main control chip is a low level close to 0V; when the discharge tube is in action, the voltage detected at the chip port is a 0-5V fluctuating voltage waveform.

[0056] The following is a specific test example

[0057] Example 1: Test the action voltage of the discharge tube sample: Connect the discharge tube test sample and the test circuit according to the schematic diagram, press the main panel to enter the test action voltage mode, the main control chip drives the test control signal port, and keeps the test port relay closed. Then start the input power supply LN, gradually increase the input voltage, when the input voltage + E reaches the action voltage of the discharge tube sample, the discharge tube is actuated, the main control chip detects the voltage change through the voltage sampling port, and derives that this input voltage + E is the action voltage of the discharge tube sample, and the discharge tube action voltage detection is completed.

[0058] Example 2: Test the discharge tube life operation times of 5000 times under voltage +E1: Connect the discharge tube test sample and test circuit according to the schematic diagram, adjust the input voltage to +E1, press the main panel to enter the test life mode, set the test frequency to 0.1s on and 0.1s off, start the test, the main control chip outputs high and low level drive relays at a frequency of 5HZ, the relay contacts and the discharge tube sample also operate at the same frequency of 5HZ, the main control chip detects that the discharge tube operation voltage changes 5000 times, which means the sample test is qualified, and the main panel output displays PASS; if the number of detection voltage changes does not increase within 5000 times, the main panel outputs FAIL after 0.2+10 seconds, and the sample test fails.

[0059] The present invention cooperates with the main control circuit and the sampling circuit to test the operating voltage of the discharge tube to check whether the discharge tube parameters meet the design requirements; at the same time, it can also check whether the discharge tube sample meets the design requirements by the number of operations at a certain frequency under a set voltage; multiple discharge tube samples can be tested at one time to improve the detection efficiency; the life times of the discharge tube sample can be detected through high operating voltage and long-term testing, providing a strong guarantee for the controller product design.

[0060] According to the disclosure and teaching of the above description, those skilled in the art to which the present invention belongs may also make changes and modifications to the above embodiments. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and some modifications and changes to the invention should also fall within the scope of protection of the claims of the present invention. In addition, although some specific terms are used in this specification, these terms are only for the convenience of description and do not constitute any limitation to the invention.

Claims

1. A discharge tube life test circuit, characterized in that: Including the sample to be tested, the main control circuit and the voltage sampling circuit, The main control circuit is connected to the sample to be tested and the voltage sampling circuit respectively. The voltage sampling circuit is also connected to the sample to be tested to collect the voltage at the output end of the discharge tube sample and feed it back to the main control circuit. The main control circuit determines the working state of the sample to be tested according to the feedback result. The samples to be tested include a discharge tube test sample DS1 and a discharge tube test sample DS2; The main control includes a main control chip U1, a drive chip D3, a relay RY1 and a relay RY2; Pin 23 and pin 24 of the main control chip U1 are connected to pin 6 and pin 7 of the driving chip D3 respectively, pin 10 of the driving chip D3 is connected to the relay RY1, pin 11 of the driving chip D3 is connected to the relay RY2, the discharge tube test sample DS1 is connected to the relay RY1, and the discharge tube test sample DS2 is connected to the relay RY2.

2. A discharge tube life test circuit as claimed in claim 1, characterized in that: The chip model of the main control chip U1 is STM8S005K6T6C.

3. A discharge tube life test circuit as claimed in claim 2, characterized in that: The chip model of the driver chip D3 is ULN2003AN.

4. A discharge tube life test circuit as claimed in claim 3, characterized in that: The sampling circuit includes resistors R1 to R20, capacitors C3, C4, C5, C6, clamping diode D4 and clamping diode D5; The resistors R1 to R7 are connected in series to form a first voltage-dropping resistor assembly, one end of which is connected to the discharge tube test sample DS1, and the other end is connected to PGND; The resistors R11 to R17 are connected in series to form a second voltage-dropping resistor assembly, one end of which is connected to the discharge tube test sample DS2, and the other end is connected to PGND; The cathode end of the clamping diode D4 is connected to the power supply end, the anode end is connected to the resistor R10, and the cathode / anode ends are connected to the capacitor C4 and PGND; The branch formed by the series connection of the resistor R10 and the capacitor C4 is then connected in parallel with the resistor R9 and the capacitor C3 respectively; The branch formed by the capacitor C3 and the resistor R8 being connected in series is connected to the resistor R7; The cathode end of the clamping diode D5 is connected to the power supply end, the anode end is connected to the resistor R20, and the cathode / anode ends are connected to the capacitor C6 and PGND; The branch formed by the series connection of the resistor R20 and the capacitor C6 is then connected in parallel with the resistor R19 and the capacitor C5 respectively; The branch formed by the series connection of the capacitor C5 and the resistor R18 is connected to the resistor R17.

5. A discharge tube life test circuit as claimed in claim 4, characterized in that: A signal interface AD-VDC1 is provided between the resistor R10 and the capacitor C4 , and the signal interface AD-VDC1 is connected to the pin 16 of the main control chip U1 .

6. A discharge tube life test circuit as claimed in claim 5, characterized in that: A signal interface AD-VDC2 is provided between the resistor R20 and the capacitor C6 , and the signal interface AD-VDC2 is connected to the pin 15 of the main control chip U1 .

7. A discharge tube life test circuit as claimed in claim 6, characterized in that: The main control chip sends a high-level driving signal to pins 6 and 7 of the driver chip D3 through pins 23 and 24, converting the driving signal into a 12V driving signal; The output drive signals of pins 10 and 11 of the driver chip D3 are low level 0V, and the pins 3 of the relays RY1 and RY2 are low level; At this time, the coil ends of relays RY1 and RY2 are energized, the contact ends of relays RY1 and RY2, pins 1 and 2, are closed and turned on, the input ends of discharge tube test samples DS1 and DS2 are energized, and the test state is entered; When the voltages at pins 1 and 3 of the DS1 and DS2 input terminals reach the action voltage of 60V, pin 2 of the DS1 and DS2 output terminals is energized with a voltage of 60V; When the main control chip sends a low-level driving signal to pins 6 and 24 of the driver chip D3 through pins 23 and 24, the driving signal is converted into a 12V driving signal; Pins 10 and 11 of the driver chip D3 output drive signals of high level 12V, and pin 3 of relays RY1 and RY2 is high level. At this time, there is no power at the coil ends of RY1 and RY2, and pins 1 and 2 of the contact ends of RY1 and RY2 are disconnected. There is no power at the input ends of the discharge tube test samples DS1 and DS2, and the discharge tube enters a non-test state, and DS1 and DS2 have no output.

8. A discharge tube life test circuit as claimed in claim 7, characterized in that: The sampling resistor reduces the voltage at the output end of the discharge tube test sample to a low voltage by means of voltage division through resistors R1~R7 and R11~R17, and then reduces the voltage again through resistors R8~R9 and R18~R19. Then, the high-frequency and interference components are filtered out through capacitors C3, C4, C5, C6, and the voltage range is limited to 0 to 5V by adding clamping diodes D4 and D5. Then, the AD-VDC1 and AD-VDC2 signals are sent to pins 16 and 15 of the main control chip U1 for detection.

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