Capacitor loss measurement method and device based on frequency domain dielectric spectrum and storage medium

Abstract

The application relates to the technical field of artificial intelligence, and discloses a capacitor loss measurement method and device based on frequency domain dielectric spectrum and a storage medium. The method comprises the following steps: the frequency domain characteristics of a capacitor to be measured are systematically obtained through accurate measurement and equivalent circuit modeling, and the loss is calculated based on the obtained data. The application has the beneficial effects that a solid foundation is provided for analyzing the performance and reliability of the capacitor in actual application, the relationship between the series equivalent circuit of the capacitor and the frequency domain dielectric spectrum parameters is researched, the corresponding numerical value of the capacitor equipment under different voltage frequencies and the change trend are obtained, and the active loss characteristics of the capacitor are better characterized, which is different from the current fixed frequency measurement.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of capacitor loss measurement based on frequency domain dielectric spectrum, and particularly relates to a capacitor loss measurement method and device based on frequency domain dielectric spectrum and a storage medium. BACKGROUND

[0002] At present, the power supply for measuring the capacitor at home and abroad mostly adopts a single frequency excitation mode, but there are periodic harmonic voltages and non-periodic transient voltages under actual operating conditions, the active loss of the capacitor under high-frequency high-amplitude voltage will increase, and the loss characteristics will also change. The capacitor works under complex voltage conditions, generates higher loss, and also brings challenges to the insulation performance of the capacitor under extreme conditions. The active loss of the capacitor is divided into: dielectric loss, including conductance loss and polarization loss; metal loss, mainly plate loss, including resistance loss such as internal fuse loss, but when measuring the loss, various losses cannot be measured separately, only the total active loss characteristics can be measured. SUMMARY

[0003] Therefore, it is necessary to propose a capacitor loss measurement method and device based on frequency domain dielectric spectrum and a storage medium for the existing capacitor loss measurement based on frequency domain dielectric spectrum.

[0004] A capacitor loss measurement method based on frequency domain dielectric spectrum, the method comprises:

[0005] Step S1, performing a voltage and current acquisition operation, applying a preset frequency steady-state voltage to a to-be-measured capacitor, and acquiring a target voltage and a target current of the to-be-measured capacitor;

[0006] Step S2, performing a parameter adjustment operation, applying a preset frequency steady-state voltage to an equivalent series circuit, adjusting the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit, until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0007] Step S3, performing a marking operation, acquiring the parameters of the adjusted equivalent resistance and the equivalent capacitance, and marking them as the actual resistance and the actual capacitance of the to-be-measured capacitor under the preset frequency steady-state voltage;

[0008] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency values set in the frequency domain dielectric spectrum, and repeating steps S1-S3, so as to obtain the actual resistance and the actual capacitance under each frequency steady-state voltage;

[0009] Step S5, calculating the loss of the to-be-measured capacitor based on the actual resistance and the actual capacitance under each frequency steady-state voltage.

[0010] Further, the step S1 of performing the voltage and current acquisition operation, applying a preset frequency steady-state voltage to the capacitor under test, and acquiring the target voltage and the target current of the capacitor under test comprises:

[0011] The step S101 of sequentially connecting the capacitor under test, the preset voltage source, and the preset ammeter to form a first loop, and connecting the preset voltage meter across the preset voltage source;

[0012] The step S102 of applying a preset frequency steady-state voltage to the capacitor under test based on the preset voltage source;

[0013] The step S103 of acquiring the target voltage and the target current of the capacitor under test based on the preset ammeter and the preset voltage meter, respectively.

[0014] Further, the step S1 further comprises an industrial computer, the preset voltage source is connected to the industrial computer and controlled by the industrial computer, and the preset ammeter and the preset voltage meter are connected to the industrial computer, respectively.

[0015] Further, the step S2 of performing the parameter adjustment operation, applying a preset frequency steady-state voltage to the equivalent series circuit, and adjusting the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current comprises:

[0016] The step S201 of calculating a complex capacitance constant and a dielectric loss tangent according to the target voltage and the target current;

[0017] The step S202 of adjusting the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit based on the complex capacitance constant and the dielectric loss tangent until the voltage and the current in the equivalent series circuit are the target voltage and the target current.

[0018] Further, the equivalent series circuit comprises an equivalent resistance and an equivalent capacitance connected in series.

[0019] Further, the step S5 of calculating the loss of the capacitor under test based on the actual resistance and the actual capacitance under each frequency steady-state voltage comprises:

[0020] The step S501 of acquiring a lossless capacitor with the same parameters as the capacitor under test;

[0021] The step S502 of measuring a reference resistance and a reference capacitance of the lossless capacitor under each frequency steady-state voltage in the frequency domain dielectric spectrum;

[0022] Step S503, comparing the actual resistance at different frequencies with the reference resistance, and comparing the actual capacitance with the reference capacitance, to obtain the loss of the capacitor to be measured at different frequencies.

[0023] Further, after the step S5 of calculating the loss of the capacitor to be measured based on the actual resistance and the actual capacitance at each frequency steady voltage, the method further comprises:

[0024] Step S601, judging whether the loss of the capacitor to be measured reaches a preset value;

[0025] Step S602, if the loss of the capacitor to be measured reaches the preset value, determining that the capacitor to be measured is an unusable capacitor.

[0026] A capacitor loss measuring device based on frequency domain dielectric spectrum, the device comprising:

[0027] An acquisition module is configured to instruct to implement step S1, perform a voltage and current acquisition operation, apply a preset frequency steady voltage to a capacitor to be measured, and acquire a target voltage and a target current of the capacitor to be measured;

[0028] An adjustment module is configured to instruct to implement step S2, perform a parameter adjustment operation, apply a preset frequency steady voltage to an equivalent series circuit, and adjust parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0029] A marking module is configured to instruct to implement step S3, perform a marking operation, acquire the parameters of the adjusted equivalent resistance and the equivalent capacitance, and mark them as the actual resistance and the actual capacitance of the capacitor to be measured at the preset frequency steady voltage;

[0030] A modification module is configured to instruct to implement step S4, modify the frequency of the applied steady voltage multiple times based on frequency values set in the frequency domain dielectric spectrum, and repeat steps S1-S3, so as to obtain the actual resistance and the actual capacitance at each frequency steady voltage;

[0031] A calculation module is configured to instruct to implement step S5, calculate the loss of the capacitor to be measured based on the actual resistance and the actual capacitance at each frequency steady voltage.

[0032] A computer device comprising a memory and a processor, the memory storing a computer program, the computer program being executed by the processor to cause the processor to perform the following steps:

[0033] Step S1, performing a voltage and current acquisition operation, applying a preset frequency steady voltage to a capacitor to be measured, and acquiring a target voltage and a target current of the capacitor to be measured;

[0034] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, adjusting parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0035] Step S3, performing a marking operation, obtaining the parameters of the adjusted equivalent resistance and the equivalent capacitance, and marking them as the actual resistance and the actual capacitance of the to-be-tested capacitor under the steady-state voltage of the preset frequency;

[0036] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency values set in the frequency domain dielectric spectrum, repeating steps S1-S3, thereby obtaining the actual resistance and the actual capacitance under the steady-state voltage of each frequency;

[0037] Step S5, calculating the loss of the to-be-tested capacitor based on the actual resistance and the actual capacitance under the steady-state voltage of each frequency.

[0038] Step S1, performing a voltage and current acquisition operation, applying a steady-state voltage of a preset frequency to the to-be-tested capacitor, and obtaining the target voltage and the target current of the to-be-tested capacitor;

[0039] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, adjusting parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0040] Step S3, performing a marking operation, obtaining the parameters of the adjusted equivalent resistance and the equivalent capacitance, and marking them as the actual resistance and the actual capacitance of the to-be-tested capacitor under the steady-state voltage of the preset frequency;

[0041] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency values set in the frequency domain dielectric spectrum, repeating steps S1-S3, thereby obtaining the actual resistance and the actual capacitance under the steady-state voltage of each frequency;

[0042] Step S5, calculating the loss of the to-be-tested capacitor based on the actual resistance and the actual capacitance under the steady-state voltage of each frequency.

[0043] The application has the beneficial effects that: by accurate measurement and equivalent circuit modeling, the frequency domain characteristics of the capacitor to be measured are systematically obtained, the loss is calculated based on the obtained data, a solid foundation is provided for analyzing the performance and reliability of the capacitor in actual application, the relationship between the series equivalent circuit of the capacitor and the frequency domain dielectric spectrum parameters is researched, the corresponding values of the capacitor equipment under different voltage frequencies and the change trend thereof are obtained, which is different from the current fixed frequency measurement, and the active loss characteristics of the capacitor are better characterized. BRIEF DESCRIPTION OF DRAWINGS

[0044] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or prior art description will be briefly introduced as follows. Obviously, the drawings in the following description only constitute some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor based on these drawings.

[0045] Among them:

[0046] Figure 1 It is an application environment diagram of the capacitor loss measurement method based on the frequency domain dielectric spectrum in one embodiment;

[0047] Figure 2 It is a flowchart of the capacitor loss measurement based on the frequency domain dielectric spectrum in one embodiment;

[0048] Figure 3 It is a frequency domain dielectric response test schematic diagram in one embodiment;

[0049] Figure 4 It is a capacitor series equivalent circuit diagram in one embodiment;

[0050] Figure 5 It is a curve diagram of frequency and real part of complex capacitance in one embodiment;

[0051] Figure 6 It is a curve diagram of frequency and imaginary part of complex capacitance in one embodiment;

[0052] Figure 7 It is a structural block diagram of the capacitor loss measurement device based on the frequency domain dielectric spectrum in one embodiment;

[0053] Figure 8 It is a structural block diagram of the computer device in one embodiment. DETAILED DESCRIPTION

[0054] With reference to the drawings of the embodiments of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of the present application.

[0055] Figure 1 An application environment diagram of a capacitor loss measurement method based on frequency domain dielectric spectrum is provided in an embodiment. With reference to Figure 1 , the capacitor loss measurement method based on frequency domain dielectric spectrum is applied to a capacitor loss measurement system based on frequency domain dielectric spectrum. The capacitor loss measurement system based on frequency domain dielectric spectrum includes a terminal 110 and a server 120. The terminal 110 and the server 120 are connected through a network, and the terminal 110 can be a desktop terminal or a mobile terminal, and the mobile terminal can be at least one of a mobile phone, a tablet computer, a notebook computer, etc. The server 120 can be implemented by an independent server or a server cluster composed of multiple servers. The terminal 110 is used to acquire voltage and current, and the server 120 is used to store and analyze voltage and current.

[0056] As shown in Figure 2 , in an embodiment, a capacitor loss measurement method based on frequency domain dielectric spectrum is provided. The method can be applied to a terminal or a server, and the embodiment is exemplified by application to a terminal. The capacitor loss measurement method based on frequency domain dielectric spectrum specifically includes the following steps:

[0057] Step S1, performing a voltage and current acquisition operation, applying a preset frequency steady-state voltage to a to-be-measured capacitor, and acquiring a target voltage and a target current of the to-be-measured capacitor;

[0058] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to an equivalent series circuit, adjusting parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0059] Step S3, performing a marking operation, acquiring the parameters of the adjusted equivalent resistance and equivalent capacitance, and marking them as actual resistance and actual capacitance of the to-be-measured capacitor under the preset frequency steady-state voltage;

[0060] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency values set in the frequency domain dielectric spectrum, repeating steps S1-S3, and thus obtaining the actual resistance and actual capacitance under each frequency steady-state voltage;

[0061] Step S5, calculate the loss of the capacitor under test based on the actual resistance and actual capacitance under each frequency steady state voltage.

[0062] As described in step S1, perform voltage and current acquisition operation, apply a preset frequency steady state voltage to the capacitor under test, and acquire the target voltage and target current of the capacitor under test. The purpose is to acquire the target voltage and target current of the capacitor under test under a certain frequency steady state condition. Specifically, a specific frequency sine voltage is applied to the capacitor, and the frequency is fixed. Record the voltage (target voltage) across the capacitor and the current (target current) generated thereby. These two values directly reflect the response characteristics of the capacitor under a certain frequency.

[0063] As described in step S2, perform parameter adjustment operation, apply a preset frequency steady state voltage to the equivalent series circuit, and adjust the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current. The purpose is to find the equivalent series circuit parameters (equivalent resistance R cs and equivalent capacitance C s ) consistent with the behavior of the capacitor under test. Specifically, an equivalent series circuit is established, which includes an equivalent resistance R cs and an equivalent capacitance C s . Adjust the parameters: by changing the values of the equivalent resistance R cs and the equivalent capacitance C s , repeat iteration until the voltage and current of the equivalent circuit are consistent with the target voltage and target current.

[0064] As described in step S3, perform marking operation, acquire the parameters of the adjusted equivalent resistance and equivalent capacitance, and mark them as the actual resistance and actual capacitance of the capacitor under test under the preset frequency steady state voltage. The values of the adjusted equivalent resistance R cs and the equivalent capacitance C s are taken as the actual parameters of the capacitor under this frequency. Specifically, record the equivalent resistance R cs and the equivalent capacitance C s after adjustment. Mark these parameters as the actual resistance and actual capacitance of the capacitor under the current frequency and applied voltage condition.

[0065] As described in step S4 above, the frequency of the applied steady-state voltage is modified multiple times based on the frequency value set in the frequency domain dielectric spectrum, and steps S1-S3 are repeated to obtain the actual resistance and capacitance at each frequency steady-state voltage. That is, by multi-frequency measurement, the entire frequency domain dielectric spectrum is constructed to obtain the parameter changes of the capacitor at different frequencies. Specifically, the frequency of the applied voltage is modified, and steps S1-S3 are repeated. Each time the frequency is changed, a steady-state sinusoidal voltage is applied and the voltage and current are recorded. The equivalent circuit parameters are adjusted to obtain the equivalent resistance R at that frequency. cs and equivalent capacitance C s Finally, the equivalent resistance R at each frequency was recorded. cs and equivalent capacitance C s This forms the frequency domain dielectric spectrum of the capacitor.

[0066] As described in step S5 above, the loss of the capacitor under test is calculated based on the actual resistance and capacitance at each steady-state voltage at various frequencies. That is, the capacitor loss is calculated based on the frequency domain dielectric spectrum data. Since the capacitor loss is generally linked to the corresponding resistance and capacitance, the dissipation factor (D) can be calculated using the following formula: in, C is the angular frequency. s Here, is the equivalent capacitance; and is the equivalent resistance. Through precise measurement and equivalent circuit modeling, the frequency domain characteristics of the capacitor under test were systematically obtained. Finally, based on these data, the losses were calculated, providing a solid foundation for analyzing the performance and reliability of the capacitor in practical applications.

[0067] In one embodiment, step S1, which involves applying a preset frequency steady-state voltage to the capacitor under test and acquiring the target voltage and target current of the capacitor under test, includes:

[0068] Step S101: Connect the capacitor to be tested, the preset voltage source, and the preset ammeter in sequence to form a first circuit, and connect the preset voltmeter to both ends of the preset voltage source.

[0069] Step S102: Apply a preset frequency steady-state voltage to the capacitor under test based on the preset voltage source;

[0070] Step S103: Obtain the target voltage and target current of the capacitor under test based on the preset ammeter and the preset voltmeter, respectively.

[0071] As described in step S101 above, please refer to Figure 3The to-be-measured capacitor, the preset voltage source and the preset ammeter are connected in sequence to form a first loop, and the preset voltage table is connected to both ends of the preset voltage source. Build a measurement circuit to ensure accurate measurement of the voltage across the capacitor and the current through the capacitor. Specific operation: connect the to-be-measured capacitor, a preset voltage source and an ammeter in series to form a closed loop (i.e. a first loop). Ensure that the to-be-measured capacitor is the main test element in the loop. Voltage measurement connection: use a preset voltage table to directly connect to both ends of the preset voltage source. Since the voltage of the ammeter can be ignored, it can be directly regarded as measuring the voltage across the to-be-measured capacitor.

[0072] As described in step S102, a preset frequency steady-state voltage is applied to the to-be-measured capacitor based on the preset voltage source, providing a to-be-measured capacitor with a sinusoidal steady-state voltage with fixed frequency and amplitude. Specifically, set the output parameters of the preset voltage source, including: frequency and amplitude (effective value or peak value). When applying voltage, it is necessary to ensure that the output sinusoidal voltage is stable, avoid waveform distortion or amplitude drift, so that the circuit enters a steady state, ensuring that the current and voltage characteristics of the capacitor are stable and suitable for measurement.

[0073] As described in step S103, the target voltage and target current of the to-be-measured capacitor are obtained based on the preset ammeter and the preset voltage table, respectively. That is, the actual voltage across the to-be-measured capacitor and the current through it are measured. Use the preset voltage table to directly read the voltage value at the output end of the voltage source as the target voltage of the to-be-measured capacitor. Measure the current value through the to-be-measured capacitor through the preset ammeter. The readings of the voltage table and the ammeter are marked as target voltage and target current, respectively, for subsequent analysis and processing.

[0074] In one embodiment, a workstation is also included, the preset voltage source is connected to the workstation and controlled by the workstation, and the preset ammeter and the preset voltmeter are respectively connected to the workstation. The workstation and the preset voltage source: connection mode: the workstation is connected to the preset voltage source through a communication interface (such as RS-485, USB or LAN). The output parameters of the voltage source can be controlled, including the amplitude and frequency of the applied voltage, and the applied steady-state voltage can be dynamically adjusted to meet the measurement requirements of different frequencies. The workstation and the preset ammeter and the preset voltmeter: connection mode: the readings of the ammeter and the voltmeter are obtained through a standard data acquisition interface (such as MODBUS, GPIB, CAN or other protocols). Real-time acquisition of target voltage and target current data can be realized, and the acquired data can be recorded, stored, processed and visualized. The workstation can be programmed to control the voltage source to automatically cycle through different frequency steady-state voltages, avoiding manual intervention, reducing errors, and realizing complex test processes, including frequency domain scanning, multi-parameter iteration, etc. Real-time measurement data (target voltage and target current) are obtained through the interface, and the acquired data are processed through filtering, noise suppression, calibration, etc. to improve the measurement accuracy. The voltage and current values at each frequency point are recorded. Equivalent parameters (such as equivalent resistance and equivalent capacitance) can be directly calculated and a frequency domain dielectric spectrum graph can be generated. A human-machine interface (HMI) can also be provided to display the measurement state and data curve in real time. The user can set parameters and monitor the entire test process. In addition, the workstation is easy to integrate into larger test or production systems, such as material testing equipment, manufacturing process control systems, etc. Through software upgrades, more functions can be extended, such as temperature control, multi-element testing, etc.

[0075] In one embodiment, the step S2 of adjusting the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current, when the execution parameter adjustment operation is performed on the equivalent series circuit to apply a steady-state voltage of a preset frequency, includes:

[0076] Step S201, calculating complex capacitance constant and dielectric loss tangent according to the target voltage and the target current;

[0077] Step S202, adjusting the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit based on the complex capacitance constant and the dielectric loss tangent until the voltage and the current in the equivalent series circuit are the target voltage and the target current.

[0078] Reference Figure 4 As described in steps S201-S202 above, the complex capacitance constant and the dielectric loss tangent are calculated according to the target voltage and the target current; (1)

[0079] (2)

[0080] In the formula: is the real part of complex capacitance, which represents the part of capacitive current, representing the polarization characteristics on the micro level; is the imaginary part of complex capacitance, which represents the part of resistive current, representing the loss characteristics on the micro level, is the target voltage, is the target current, dielectric loss angle, dielectric loss angle tangent, is the imaginary unit, is the frequency.

[0081] The equivalent impedance of the capacitor is:

[0082] (3)

[0083] Complex capacitance in dielectric spectrum The equivalent series circuit of the capacitor has the following corresponding relationship.

[0084] (4)

[0085] (5)

[0086] Thus, the equivalent series resistance and the equivalent capacitance The relationship between the real part and the imaginary part of the complex capacitance is:

[0087] (6)

[0088] (7)

[0089] Formulas (6) and (7) establish the relationship between the real part and the imaginary part of the complex capacitance and the equivalent resistance and the equivalent capacitance, that is, the frequency domain dielectric spectrum curve The corresponding values of the capacitor device under different voltage frequencies and their change trend can be obtained.

[0090] In one embodiment, the equivalent series circuit includes an equivalent resistance and an equivalent capacitance in series.

[0091] In one embodiment, the step S5 of calculating the loss of the capacitor to be measured based on the actual resistance and the actual capacitance under the steady-state voltage of each frequency includes:

[0092] Step S501, obtaining a lossless capacitor with the same parameters as the capacitor to be measured;

[0093] Step S502, measuring the reference resistance and reference capacitance of the lossless capacitor under the steady-state voltage of each frequency of the lossless in the frequency domain dielectric spectrum;

[0094] Step S503, comparing the actual resistance and the reference resistance under different frequencies, and comparing the actual capacitance and the reference capacitance, to obtain the loss of the capacitor to be measured under different frequencies.

[0095] As described in the above step S501, the lossless capacitor with the same parameters as the capacitor to be measured is obtained. The lossless capacitor can be introduced as a reference standard to eliminate the loss effect of the ideal capacitor. The ideal lossless capacitor refers to a capacitor with infinite resistance (no leakage current) in the working frequency range. In experiments, a high-quality capacitor is usually used to simulate a lossless capacitor. A high-quality capacitor with the same parameters such as capacitance value and rated working voltage as the capacitor to be measured is selected. Low-loss ceramic capacitors or thin-film capacitors can be selected as reference samples.

[0096] As described in the above step S502, the frequency domain characteristics of the lossless capacitor are measured to obtain the reference resistance and the reference capacitance as the basis for loss calculation. The measurement environment: the same preset frequency steady-state voltage as the capacitor to be measured is applied. The same test conditions (such as temperature, frequency range and voltage amplitude) are maintained. The reference resistance and the reference capacitance of the lossless capacitor under different frequencies are recorded. The resistance of the ideal lossless capacitor is theoretically infinite; the capacitance is constant and does not change with frequency.

[0097] As described in the above step S503, the loss is calculated by comparing the actual resistance, capacitance and reference resistance, capacitance to calculate the loss of the capacitor to be measured under each frequency. The loss under different frequencies is recorded to draw a frequency domain curve. The law of the loss changing with frequency is analyzed to evaluate the performance of the capacitor to be measured.

[0098] In one embodiment, after the step S5 of calculating the loss of the capacitor to be measured based on the actual resistance and the actual capacitance under the steady-state voltage of each frequency, the method further comprises:

[0099] Step S601, determining whether the loss of the capacitor to be measured reaches a preset value;

[0100] Step S602, if the loss of the capacitor to be measured reaches the preset value, determining that the capacitor to be measured is an unusable capacitor.

[0101] As described in the above steps S601-S602, the judgment of the capacitor to be measured is realized, wherein the preset value can be any one of the manufacturer's technical specification, the reliability requirement in application, and the experimentally determined critical value, and if the measured loss value exceeds the preset threshold, it indicates that the performance of the capacitor to be measured is unqualified. If the loss value exceeds the preset threshold value, the capacitor is determined to be unusable (i.e. the performance does not meet the requirements). The reason for being unusable can be: the dielectric loss is too large, resulting in energy waste or overheating; the leakage current is too high, reducing the reliability of the capacitor; the capacitance value deviates from the design range, affecting the circuit function.

[0102] Referring to Figures 5-6 In a specific detection process, the corresponding relationship between each frequency and the corresponding equivalent resistance (i.e. the real part of the complex capacitance) and the equivalent capacitance (i.e. the imaginary part of the complex capacitance) can be obtained, the frequency domain characteristics of the capacitor to be measured are systematically obtained, and finally the loss is calculated based on these data, thereby providing a solid foundation for analyzing the performance and reliability of the capacitor in actual application.

[0103] Referring to Figure 7 The application further provides a capacitor loss measuring device based on frequency domain dielectric spectrum, which comprises:

[0104] The acquisition module 10 is configured to instruct to implement step S1 and perform a voltage and current acquisition operation, apply a preset frequency steady-state voltage to the capacitor to be measured, and acquire a target voltage and a target current of the capacitor to be measured.

[0105] The adjustment module 20 is configured to instruct to implement step S2 and perform a parameter adjustment operation, apply a preset frequency steady-state voltage to the equivalent series circuit, and adjust the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current.

[0106] The marking module 30 is configured to instruct to implement step S3 and perform a marking operation, acquire the parameters of the adjusted equivalent resistance and the equivalent capacitance, and mark them as the actual resistance and the actual capacitance of the capacitor to be measured under the preset frequency steady-state voltage.

[0107] The modification module 40 is configured to instruct to implement step S4 and modify the frequency of the applied steady-state voltage multiple times based on the frequency values set in the frequency domain dielectric spectrum, and repeat steps S1-S3, so as to obtain the actual resistance and the actual capacitance under the steady-state voltage of each frequency.

[0108] The calculation module 50 is configured to instruct to implement step S5 and calculate the loss of the capacitor to be measured based on the actual resistance and the actual capacitance under the steady-state voltage of each frequency.

[0109] In an embodiment, the acquisition module 10 comprises:

[0110] A connecting module is configured to instruct to implement step S101, connect a to-be-tested capacitor, a preset voltage source and a preset ammeter in sequence to form a first loop, and connect a preset voltmeter to both ends of the preset voltage source;

[0111] An applying module is configured to instruct to implement step S102, apply a preset frequency steady-state voltage to the to-be-tested capacitor based on the preset voltage source.

[0112] An obtaining module is configured to instruct to implement step S103, obtain a target voltage and a target current of the to-be-tested capacitor based on the preset ammeter and the preset voltmeter respectively.

[0113] In an embodiment, the device further comprises an industrial computer, the preset voltage source is connected to the industrial computer and controlled by the industrial computer, and the preset ammeter and the preset voltmeter are connected to the industrial computer respectively.

[0114] In an embodiment, the adjusting module 20 comprises:

[0115] A calculating module is configured to instruct to implement step S201, calculate a complex capacitance constant and a dielectric loss tangent based on the target voltage and the target current.

[0116] An adjusting module is configured to instruct to implement step S202, adjust parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit based on the complex capacitance constant and the dielectric loss tangent until a voltage and a current in the equivalent series circuit are the target voltage and the target current.

[0117] In an embodiment, the equivalent series circuit comprises the equivalent resistance and the equivalent capacitance connected in series.

[0118] In an embodiment, the calculating module 50 comprises:

[0119] A lossless capacitor obtaining module is configured to instruct to implement step S501, obtain a lossless capacitor with same parameters as the to-be-tested capacitor.

[0120] A measuring module is configured to instruct to implement step S502, measure a reference resistance and a reference capacitance of the lossless capacitor under a steady-state voltage at each frequency in a frequency domain dielectric spectrum.

[0121] A comparing module is configured to instruct to implement step S503, compare the actual resistance and the reference resistance at different frequencies, and compare the actual capacitance and the reference capacitance, to obtain a loss of the to-be-tested capacitor at different frequencies.

[0122] In an embodiment, the capacitor loss measuring device based on the frequency domain dielectric spectrum further comprises:

[0123] a loss determining module configured to instruct to implement step S601, and determine whether the loss of the capacitor under test reaches a preset value;

[0124] a determining module configured to instruct to implement step S602, and determine that the capacitor under test is an unusable capacitor if the loss of the capacitor under test reaches the preset value.

[0125] The application has the following beneficial effects: the frequency domain characteristics of the capacitor under test are systematically obtained through accurate measurement and equivalent circuit modeling, the loss is calculated based on the obtained data, a solid foundation is provided for analyzing the performance and reliability of the capacitor in actual application, the relationship between the series equivalent circuit of the capacitor and the frequency domain dielectric spectrum parameters is researched, the corresponding values of the capacitor equipment under different voltage frequencies and the change trend thereof are obtained, and the active loss characteristics of the capacitor are better characterized than the current fixed frequency measurement.

[0126] Figure 8 An internal structure diagram of a computer device in an embodiment is shown. The computer device can be a terminal or a server. As shown in the figure, Figure 8 the computer device includes a processor, a memory and a network interface connected through a system bus. The memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system, and can also store a computer program, which, when executed by the processor, can enable the processor to implement the capacitor loss measurement method. The internal memory can also store a computer program, which, when executed by the processor, can enable the processor to execute the capacitor loss measurement method. Those skilled in the art can understand that Figure 8 the structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device can include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0127] In one embodiment, a computer device is provided, which includes a memory and a processor, the memory stores a computer program, and the computer program, when executed by the processor, enables the processor to execute the following steps:

[0128] Step S1, performing voltage and current acquisition operation, applying a preset frequency steady-state voltage to the capacitor under test, and acquiring target voltage and target current of the capacitor under test;

[0129] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, adjusting parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0130] Step S3, performing a marking operation, obtaining the parameters of the adjusted equivalent resistance and the equivalent capacitance, and marking them as the actual resistance and the actual capacitance of the capacitor under the steady-state voltage of the preset frequency;

[0131] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency values set in the frequency domain dielectric spectrum, repeating steps S1-S3, so as to obtain the actual resistance and the actual capacitance under the steady-state voltage of each frequency;

[0132] Step S5, calculating the loss of the capacitor based on the actual resistance and the actual capacitance under the steady-state voltage of each frequency.

[0133] The relationship between the capacitor series equivalent circuit and the frequency domain dielectric spectrum parameters is studied, and the corresponding values of the capacitor device under different voltage frequencies and their change trend are obtained, which is different from the current fixed frequency measurement, and better characterizes the active loss characteristics of the capacitor.

[0134] In one embodiment, a computer readable storage medium is provided, which stores a computer program, and the computer program is executed by a processor to make the processor execute the following steps:

[0135] Step S1, performing a voltage and current acquisition operation, applying a steady-state voltage of a preset frequency to the capacitor under test, and obtaining a target voltage and a target current of the capacitor under test;

[0136] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, adjusting parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0137] Step S3, performing a marking operation, obtaining the parameters of the adjusted equivalent resistance and the equivalent capacitance, and marking them as the actual resistance and the actual capacitance of the capacitor under the steady-state voltage of the preset frequency;

[0138] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency values set in the frequency domain dielectric spectrum, repeating steps S1-S3, so as to obtain the actual resistance and the actual capacitance under the steady-state voltage of each frequency;

[0139] Step S5, calculating the loss of the capacitor based on the actual resistance and the actual capacitance under the steady-state voltage of each frequency.

[0140] The relationship between the capacitor series equivalent circuit and the frequency domain dielectric spectrum parameters is studied, and the corresponding values and their trends of the capacitor device under different voltage frequencies are obtained, which is different from the current fixed frequency measurement, and better characterizes the active power loss characteristics of the capacitor.

[0141] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by a computer program instructing related hardware, and the program can be stored in a non-volatile computer readable storage medium. When the program is executed, it can include the processes of the above-mentioned embodiments of each method. Among them, any reference to memory, storage, database or other medium used in each embodiment provided by the present application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0142] Each technical feature of the above embodiments can be combined arbitrarily. In order to make the description simple, not all possible combinations of each technical feature in the above embodiments are described, however, as long as the combination of these technical features does not exist contradictory, it should be considered as the scope of the present application.

[0143] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the patent scope of the present application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the patent protection scope of the present application should be subject to the appended claims.

Claims

1. A method for measuring capacitor loss based on frequency domain dielectric spectrum, characterized in that, The method includes: Step S1: Perform voltage and current acquisition operation, apply a preset frequency steady-state voltage to the capacitor under test, and acquire the target voltage and target current of the capacitor under test; Step S2: Perform parameter adjustment operation, apply a steady-state voltage of preset frequency to the capacitor equivalent series circuit, and adjust the parameters of the equivalent resistance and equivalent capacitance in the capacitor equivalent series circuit until the voltage and current in the capacitor equivalent series circuit are the target voltage and the target current. Step S3: Perform a marking operation to obtain the parameters of the adjusted equivalent resistance and equivalent capacitance, and mark them as the actual resistance and actual capacitance of the capacitor under test under the preset frequency steady-state voltage. Step S4: Based on the frequency value set in the frequency domain dielectric spectrum, modify the frequency of the applied steady-state voltage multiple times, repeat steps S1-S3, and thus obtain the actual resistance and actual capacitance under the steady-state voltage at each frequency. Step S5: Calculate the loss of the capacitor under test based on the actual resistance and actual capacitance under steady-state voltage at each frequency; The parameter adjustment operation, which involves applying a steady-state voltage of a preset frequency to the equivalent series circuit of the capacitor and adjusting the parameters of the equivalent resistance and equivalent capacitance in the equivalent series circuit until the voltage and current in the equivalent series circuit are the target voltage and the target current, includes the following steps: Step S201: Calculate the complex capacitance constant and dielectric loss tangent based on the target voltage and the target current; Step S202: Based on the complex capacitance constant and the dielectric loss tangent, adjust the parameters of the equivalent resistance and equivalent capacitance in the equivalent series circuit of the capacitor until the voltage and current in the equivalent series circuit of the capacitor are the target voltage and the target current. The capacitor equivalent series circuit includes an equivalent resistance and an equivalent capacitance connected in series. Step S5, which calculates the loss of the capacitor under test based on the actual resistance and actual capacitance at each frequency steady-state voltage, includes: Step S501: Obtain a non-destructive capacitor with the same parameters as the capacitor under test; Step S502: Measure the reference resistance and reference capacitance of the lossless capacitor at steady-state voltages at various frequencies of the frequency domain dielectric spectrum; Step S503: Compare the actual resistance and the reference resistance at different frequencies, and compare the actual capacitance and the reference capacitance to obtain the loss of the capacitor under test at different frequencies.

2. The capacitor loss measurement method based on frequency domain dielectric spectrum according to claim 1, characterized in that, The step S1 of performing the voltage and current acquisition operation, which involves applying a preset frequency steady-state voltage to the capacitor under test and acquiring the target voltage and target current of the capacitor under test, includes: Step S101: Connect the capacitor to be tested, the preset voltage source, and the preset ammeter in sequence to form a first circuit, and connect the preset voltmeter to both ends of the preset voltage source. Step S102: Apply a preset frequency steady-state voltage to the capacitor under test based on the preset voltage source; Step S103: Obtain the target voltage and target current of the capacitor under test based on the preset ammeter and the preset voltmeter, respectively.

3. The capacitor loss measurement method based on frequency domain dielectric spectrum according to claim 2, characterized in that, It also includes an industrial control computer, the preset voltage source is connected to and controlled by the industrial control computer, and the preset ammeter and the preset voltmeter are respectively connected to the industrial control computer.

4. The capacitor loss measurement method based on frequency domain dielectric spectrum according to claim 1, characterized in that, After step S5, which calculates the loss of the capacitor under test based on the actual resistance and actual capacitance at each frequency steady-state voltage, the method further includes: Step S601: Determine whether the loss of the capacitor under test has reached a preset value; Step S602: If the loss of the capacitor under test reaches a preset value, the capacitor under test is determined to be an unusable capacitor.

5. A capacitor loss measurement device based on frequency domain dielectric spectrum, characterized in that, The device includes: The acquisition module is used to instruct the implementation of step S1, perform voltage and current acquisition operations, apply a preset frequency steady-state voltage to the capacitor under test, and acquire the target voltage and target current of the capacitor under test. The adjustment module is used to instruct the implementation of step S2, perform parameter adjustment operation, apply a steady-state voltage of a preset frequency to the capacitor equivalent series circuit, and adjust the parameters of the equivalent resistance and equivalent capacitance in the capacitor equivalent series circuit until the voltage and current in the capacitor equivalent series circuit are the target voltage and the target current. The marking module is used to indicate the implementation of step S3, perform the marking operation, obtain the parameters of the adjusted equivalent resistance and equivalent capacitance, and mark them as the actual resistance and actual capacitance of the capacitor under test under the preset frequency steady-state voltage. The modification module is used to instruct the implementation of step S4, which involves modifying the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, repeating steps S1-S3, thereby obtaining the actual resistance and actual capacitance under the steady-state voltage at each frequency. The calculation module is used to instruct the implementation of step S5, which calculates the loss of the capacitor under test based on the actual resistance and actual capacitance under steady-state voltage at each frequency. The adjustment module includes: The calculation submodule is used to instruct the implementation step S201 to calculate the complex capacitance constant and dielectric loss tangent based on the target voltage and the target current. The adjustment submodule is used to instruct the implementation of step S202, adjusting the parameters of the equivalent resistance and equivalent capacitance in the equivalent series circuit of the capacitor based on the complex capacitance constant and the dielectric loss tangent, until the voltage and current in the equivalent series circuit of the capacitor are the target voltage and the target current. The capacitor equivalent series circuit includes an equivalent resistance and an equivalent capacitance connected in series. The computing module includes: The non-destructive capacitor acquisition submodule is used to instruct the implementation of step S501 to acquire a non-destructive capacitor with the same parameters as the capacitor under test; The measurement submodule is used to instruct the implementation of step S502, measuring the reference resistance and reference capacitance of the lossless capacitor at steady-state voltages at various frequencies of the frequency domain dielectric spectrum. The comparison submodule is used to instruct the implementation of step S503, comparing the actual resistance and the reference resistance at different frequencies, and comparing the actual capacitance and the reference capacitance to obtain the loss of the capacitor under test at different frequencies.

6. A computer-readable storage medium, characterized in that, The device contains a computer program that, when executed by a processor, causes the processor to perform the steps of the capacitor loss measurement method based on frequency domain dielectric spectrum as described in any one of claims 1 to 4.

7. A computer device, characterized in that, The device includes a memory and a processor, the memory storing a computer program that, when executed by the processor, causes the processor to perform the steps of the capacitor loss measurement method based on frequency domain dielectric spectrum as described in any one of claims 1 to 4.

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