Aging test method, device and storage medium for a high-frequency generator

Abstract

The present invention provides an aging test method, device and storage medium for a high-frequency generator, which relates to the technical field of ventilator testing. The aging test method for the high-frequency generator includes: first, controlling the high-frequency generator to be tested to operate in first and second frequency modes respectively and recording the initial working current values; subsequently, realizing the alternating operation of the two frequency modes through a linear frequency gradient method, and real-time monitoring the relative deviation ratio of the working current value in each mode to the corresponding initial value. If the deviation in any mode exceeds the set threshold, it is determined that aging failure occurs; otherwise, the frequency switching, current monitoring and deviation calculation processes are cyclically executed until the failure standard is reached. The present invention can accurately perform an aging test on the performance of the high-frequency generator.

Description

Technical Field

[0001] The present invention relates to the technical field of ventilator testing, and more particularly, to an aging test method, device, and storage medium for a high-frequency generator. Background Art

[0002] The high-frequency generator is the core component of a high-frequency ventilator. It drives the diaphragm in a sealed cavity to move bidirectionally through the reciprocating motion of a moving shaft, thereby generating a high-frequency oscillating airflow. When the high-frequency ventilator is operating normally, the high-frequency generator outputs an oscillating airflow of an air-oxygen mixture to ensure the realization of the basic functions of the ventilator.

[0003] During use, the output performance parameters of the ventilator need to be changed according to the settings of the operator. Therefore, the high-frequency generator needs to adjust the frequency or amplitude accordingly to meet the accuracy and stability of the ventilator output. However, as the usage time of the ventilator increases, the output performance of the high-frequency generator may gradually decline. To ensure the stability of the ventilator over a period of time, it is particularly important to perform an aging test on the performance of the high-frequency generator. Summary of the Invention

[0004] The problem solved by the present invention is how to accurately perform an aging test on the performance of a high-frequency generator.

[0005] To solve the above problems, the present invention provides an aging test method, device, and storage medium for a high-frequency generator.

[0006] In a first aspect, the present invention provides an aging test method for a high-frequency generator, including:

[0007] Step S11: Control the high-frequency generator to be tested to operate in a first frequency mode, and record the initial working current value of the high-frequency generator to be tested in the first frequency mode;

[0008] Step S12: Control the high-frequency generator to be tested to operate in a second frequency mode, and record the initial working current value of the high-frequency generator to be tested in the second frequency mode;

[0009] Step S13: Control the high-frequency generator to be tested to alternately switch and operate between the first frequency mode and the second frequency mode, wherein the switch between the first frequency mode and the second frequency mode is completed through a linear frequency gradient change;

[0010] Step S14: Monitor the real-time working current values of the high-frequency generator to be tested in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio of the real-time working current value to the initial working current value in the corresponding mode;

[0011] Step S15: When the relative deviation ratio in any mode exceeds the threshold, it is determined that the high-frequency generator is aging and fails, and the total operating time of the high-frequency generator to be tested is recorded;

[0012] Step S16: If the relative deviation ratios in both the first frequency mode and the second frequency mode do not exceed the threshold, return to execute Step S13, and perform the aging determination in Step S15 after each cycle until it is determined that the high-frequency generator is aging and fails.

[0013] Optionally, the frequency range of the first frequency mode is from 0.4 Hz to 2 Hz, the frequency range of the second frequency mode is from 3 Hz to 20 Hz, and when switching between the first frequency mode and the second frequency mode, the frequency transition difference corresponding to each mode switch is at least 2.5 Hz.

[0014] Optionally, the threshold is a dynamic threshold, and the dynamic threshold is updated according to the following formula based on the number of cycle tests;

[0015] When N ≤ the first test number, the dynamic threshold is T1;

[0016] When the first test number < N ≤ the second test number, the dynamic threshold is T2;

[0017] When N > the second test number, the dynamic threshold is T3;

[0018] Wherein, N is the number of cycle tests, and T1 is the initially set threshold.

[0019] Optionally, the calculation formula for T2 is:

[0020] ;

[0021] The calculation formula for T3 is:

[0022] ;

[0023] Wherein, e represents the natural constant.

[0024] Optionally, Step S11 specifically includes: randomly selecting a first quantity of different first sub-frequency points in the first frequency mode, controlling the high-frequency generator to be tested to operate sequentially according to each of the first sub-frequency points, wherein, controlling the high-frequency generator to be tested to continuously operate for at least a preset duration according to each of the first sub-frequency points, recording the current measurement values of the high-frequency generator to be tested at each of the first sub-frequency points, and calculating the arithmetic mean of the current measurement values corresponding to each of the first sub-frequency points as the initial operating current value of the first frequency mode;

[0025] Step S12 specifically includes: selecting a second quantity of different second sub - frequency points at equal intervals in the second frequency mode, controlling the high - frequency generator under test to operate in sequence according to each of the second sub - frequency points. Among them, controlling the high - frequency generator under test to continuously operate at each of the second sub - frequency points for at least the preset duration, recording the current measurement values of the high - frequency generator under test at each of the second sub - frequency points. After removing the maximum and minimum values among all the current measurement values corresponding to the second sub - frequency points, taking the average value of the remaining current measurement values corresponding to the sub - frequency points as the initial working current value of the second frequency mode.

[0026] Optionally, step S14 further includes: synchronously monitoring the temperature rise rate of the high - frequency generator under test, and starting the accelerated aging determination when the following conditions are met; in the accelerated aging determination, the aging determination threshold is 80% of the threshold;

[0027] ;

[0028] Among them, represents the temperature rise rate, represents the absolute difference between the real - time working current value and the initial working current value of the corresponding mode, represents the initial working current value in the first frequency mode or the second frequency mode.

[0029] Optionally, during the process of returning to execute step S13, the corresponding current deviation ratios are extracted every time a preset number of cycles are completed. The current deviation ratios of the preset number of times form an independent sliding window. The mean value and standard deviation of the current deviation ratios within each of the sliding windows are calculated in sequence. When M consecutive sliding windows satisfy the following formula, where M is greater than or equal to 2, it is determined that an irreversible aging trend has occurred, and the aging failure determination is triggered;

[0030] , and ;

[0031] Among them, represents the mean value of the current deviation ratio within the nth sliding window, represents the mean value of the current deviation ratio within the (n + 1)th sliding window, represents the standard deviation of the current deviation ratio within the (n - 1)th sliding window, represents the standard deviation of the current deviation ratio within the nth sliding window.

[0032] In a second aspect, the present invention provides an aging test system for a high - frequency generator, including:

[0033] The first frequency mode control module is used to control the high-frequency generator under test to operate in the first frequency mode and record the initial working current value of the high-frequency generator under test in the first frequency mode;

[0034] The second frequency mode control module is used to control the high-frequency generator under test to operate in the second frequency mode and record the initial working current value of the high-frequency generator under test in the second frequency mode;

[0035] The switching module is used to control the high-frequency generator under test to alternately switch and operate between the first frequency mode and the second frequency mode. Among them, the switching between the first frequency mode and the second frequency mode is completed through linear frequency gradient;

[0036] The monitoring and calculation module is used to monitor the real-time working current values of the high-frequency generator under test in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio of the real-time working current value to the initial working current value in the corresponding mode;

[0037] The determination module is used to determine that the high-frequency generator is aging and failed when the relative deviation ratio in any mode exceeds the threshold, and record the total running time of the high-frequency generator under test;

[0038] The loop determination module, if the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, returns to sequentially run the switching module, the monitoring and calculation module, and the determination module until it is determined that the high-frequency generator is aging and failed.

[0039] In a third aspect, the present invention provides an electronic device, including a memory and a processor;

[0040] The memory is used to store a computer program;

[0041] The processor is used to implement the aging test method of the high-frequency generator as described in any one of the above when executing the computer program.

[0042] In a fourth aspect, the present invention provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the aging test method of the high-frequency generator as described in any one of the above is implemented.

[0043] Compared with the prior art, the beneficial effects of the present invention are as follows: By respectively obtaining the initial operating current values in the first frequency mode and the second frequency mode, and alternately switching and operating in the first frequency mode and the second frequency mode, the dynamic operating state of the high-frequency generator in the actual clinical use of the high-frequency ventilator is simulated, overcoming the limitation of the traditional single-mode test being divorced from the real scenario, making the aging evaluation result of the high-frequency generator highly correlated with the actual service life; The operating current in the first frequency mode and the second frequency mode is monitored in real time and the relative deviation ratio is calculated. By quantifying the current offset, the mechanical wear and electrical performance degradation of the high-frequency generator are directly correlated, and a highly sensitive aging determination criterion is established. Compared with the prior art that relies on the judgment experience of a single absolute current value, the aging test accuracy is significantly improved; Based on the loop test mechanism determined by the threshold, the aging trend can be continuously captured during the gradual decay of the performance of the high-frequency generator, solving the problems of over-testing and under-testing caused by the fixed test cycle in the prior art, and covering the monitoring requirements of the performance decay of the entire life cycle of the high-frequency generator while ensuring the test efficiency. The present invention can perform accurate aging tests on the performance of the high-frequency generator. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 It is a schematic flow chart of an aging test method for a high-frequency generator provided by an embodiment of the present invention;

[0045] Figure 2 It is a schematic structural diagram of an aging test system for a high-frequency generator provided by an embodiment of the present invention;

[0046] Figure 3 It is a schematic structural diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0047] In order to make the above-mentioned objects, features, and advantages of the present invention more obvious and understandable, the following detailed description of the specific embodiments of the present invention is provided in conjunction with the drawings. Although some embodiments of the present invention are shown in the drawings, it should be understood that the present invention can be implemented in various forms and should not be construed as limited to the embodiments described herein. On the contrary, these embodiments are provided to more thoroughly and completely understand the present invention. It should be understood that the drawings and embodiments of the present invention are only for exemplary purposes and are not used to limit the protection scope of the present invention.

[0048] It should be understood that the various steps recorded in the method embodiments of the present invention can be executed in different orders and / or executed in parallel. In addition, the method embodiments may include additional steps and / or omit the steps shown. The scope of the present invention is not limited in this regard.

[0049] As used herein, the term "comprising" and its variations are open-ended, i.e., "including but not limited to"; the term "based on" means "at least partially based on"; the term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments"; the term "optionally" means "optional embodiments". The relevant definitions of other terms will be given in the following description. It should be noted that the concepts such as "first" and "second" mentioned in the present invention are only used to distinguish different devices, modules or units, and are not used to limit the order or mutual dependence relationship of the functions performed by these devices, modules or units.

[0050] It should be noted that the modification of "one" and "multiple" mentioned in the present invention is illustrative rather than restrictive. Those skilled in the art should understand that, unless clearly specified otherwise in the context, it should be understood as "one or more".

[0051] The names of the messages or information exchanged between multiple devices in the embodiments of the present invention are only for illustrative purposes and are not used to limit the scope of these messages or information.

[0052] As a key medical device for providing respiratory support to critically ill patients, the high-frequency ventilator mainly outputs aerosolized air-oxygen mixed gas rapidly through high-frequency oscillation technology to ensure effective gas exchange in the patient's lungs. The core power component of the high-frequency ventilator is the high-frequency generator, which is composed of three parts: the moving shaft as the driving unit, which uses the principle of electromagnetic induction to achieve reciprocating motion hundreds of times per minute; the sealed cavity as the pressure vessel, which is filled with inert gas to avoid oxidation and corrosion; the flexible diaphragm as the energy conversion medium, which converts the mechanical energy of the moving shaft into the vibration energy of the air flow. When the high-frequency generator is in the working state, the moving shaft drives the flexible diaphragm to perform periodic displacement at a preset vibration frequency, so that an alternating pressure field is formed inside the sealed cavity, and finally a stable output of high-frequency oscillating air flow in the range of 5 to 20 Hz is achieved. To meet the requirements of different clinical scenarios, such as the differential treatment of adult respiratory distress syndrome and neonatal pulmonary hypoplasia, the operator needs to adjust the amplitude and frequency parameters of the output air flow in real time through the ventilator control interface, which poses strict requirements on the dynamic response accuracy and multi-modal compatibility ability of the high-frequency generator.

[0053] It should be particularly noted that, as a key component that operates under high load for a long time, the internal mechanical structure and electronic components of the high-frequency generator will experience performance degradation due to material fatigue and electrochemical aging. Existing aging test systems generally adopt the steady-state simulation detection method, that is, the device is continuously operated in a single constant frequency mode and the current and temperature parameters are recorded. This method has two major technical defects: First, in medical clinics, high-frequency ventilators need to switch between low-frequency ventilation modes and high-frequency oscillation modes in real time according to the changes in the airway resistance of patients. However, the fixed-frequency working conditions in traditional tests cannot reproduce the dynamic load fluctuation characteristics in actual use, resulting in the aging assessment results deviating from the true service life. Second, the existing technology relies on a failure judgment mechanism based on absolute current thresholds. For example, when the working current exceeds 15% of the rated value, the device is determined to fail. However, in actual operation, the instantaneous current spikes generated by the high-frequency generator during the start-stop stage or mode switching instant will trigger false alarms, making the test results lack engineering referenceability. The above problems seriously restrict the accuracy of the performance stability verification of high-frequency ventilators during long-term use. There is an urgent need for an aging test method that can simulate dynamic working scenarios and has anti-interference capabilities.

[0054] Referring to Figure 1 , the present invention provides an aging test method for a high-frequency generator, including:

[0055] Step S11: Control the high-frequency generator to be tested to operate in the first frequency mode, and record the initial working current value of the high-frequency generator to be tested in the first frequency mode.

[0056] Specifically, the high-frequency generator to be tested can be fixed to a standard test fixture, connected to a control module and a data acquisition unit, and the high-frequency generator to be tested is controlled to operate in the first frequency mode. The first frequency mode can be a low-frequency mode, and the low-frequency band mode covers the clinically common low-frequency ventilation range (0.5 Hz - 2.0 Hz).

[0057] The initial working current value in the first frequency mode refers to the calibrated current value measured under specific test conditions when the high-frequency generator is in a new and unaged state and operates stably in the first frequency mode, which is used as the subsequent aging determination reference value.

[0058] Step S12: Control the high-frequency generator to be tested to operate in the second frequency mode, and record the initial working current value of the high-frequency generator to be tested in the second frequency mode.

[0059] Specifically, close the control signal of the first frequency mode, and control the high-frequency generator to be tested to operate in the second frequency mode through a digital isolator. The second frequency mode can be a high-frequency mode, and the high-frequency mode covers the clinically common high-frequency ventilation range (3 Hz - 20 Hz).

[0060] The initial operating current value in the second frequency mode refers to the calibrated current value measured under specific test conditions when the high-frequency generator is in a new and unaged state and operating stably in the second frequency mode, which serves as the subsequent aging determination reference value.

[0061] Step S13: Control the high-frequency generator under test to alternately operate between the first frequency mode and the second frequency mode. Among them, the switching between the first frequency mode and the second frequency mode is completed through linear frequency gradient change.

[0062] Specifically, when switching from the first frequency mode to the second frequency mode, starting from the minimum frequency in the first frequency mode, the frequency continuously changes at a rate until the maximum frequency in the second frequency mode is reached. Among them, refers to the frequency change rate, represents the frequency change time, which can be set as an adjustable parameter from 0.5 seconds to 3 seconds. The process of switching from the second frequency mode to the first frequency mode is opposite to that of switching from the first frequency mode to the second frequency mode, and will not be elaborated here.

[0063] Step S14: Monitor the real-time operating current values of the high-frequency generator under test in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio between the real-time operating current value and the initial operating current value in the corresponding mode.

[0064] Specifically, when any mode is activated, retrieve the initial operating current value in that mode, and calculate the current relative deviation ratio. The calculation formula for the current relative deviation ratio is:

[0065] ;

[0066] Among them, represents the absolute difference between the real-time operating current value and the initial operating current value in the corresponding mode, represents the initial operating current value in the corresponding mode in step S11 or step S12.

[0067] Step S15: When the relative deviation ratio in any mode exceeds the threshold, it is determined that the high-frequency generator is aging and fails, and record the total operating time of the high-frequency generator under test.

[0068] The threshold here can be flexibly adjusted according to actual application needs. It can be a preset value or a dynamic threshold, so as to improve the accuracy of high-frequency generator aging assessment. The total operating time can be used to characterize the performance of the high-frequency generator in the aging test.

[0069] Step S16: If the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, return to execute step S13 until it is determined that the high-frequency generator is aging and fails.

[0070] Compared with the prior art, the beneficial effects of the present invention are as follows: By respectively obtaining the initial operating current values in the first frequency mode and the second frequency mode, and alternately switching and operating in the first frequency mode and the second frequency mode, the dynamic operating state of the high-frequency generator in the actual clinical use of the high-frequency ventilator is simulated, overcoming the limitation that the traditional single-mode test is divorced from the real scenario, and making the aging evaluation result of the high-frequency generator highly correlated with the actual service life; The operating current in the first frequency mode and the second frequency mode is monitored in real time and the relative deviation ratio is calculated. By quantifying the current offset, the mechanical wear and electrical performance degradation of the high-frequency generator are directly correlated, and a high-sensitivity aging determination criterion is established. Compared with the prior art that relies on the judgment experience of a single absolute current value, the aging test accuracy is significantly improved; Based on the threshold determination loop test mechanism, it can continuously capture the aging trend during the gradual attenuation of the high-frequency generator performance, solve the problems of over-testing and under-testing caused by the fixed test cycle in the prior art, and fully cover the monitoring requirements of the performance attenuation of the high-frequency generator throughout its life cycle while ensuring the test efficiency. The present invention can accurately perform an aging test on the performance of the high-frequency generator.

[0071] In this embodiment, the frequency range of the first frequency mode is 0.4 Hz to 2 Hz, the frequency range of the second frequency mode is 3 Hz to 20 Hz, and when switching between the first frequency mode and the second frequency mode, the frequency transition difference corresponding to each mode switch is at least 2.5 Hz.

[0072] Specifically, the first frequency mode is configured as 0.4 Hz - 2 Hz, which is used to cover the clinical extremely low frequency to the conventional breathing frequency (for example, for neonatal ventilation), and the second frequency mode is set as 3 Hz - 20 Hz, which is used to meet the requirements of high-frequency oscillatory ventilation (HFOV). When it is necessary to switch from the first frequency mode to the second frequency mode, the control system will forcibly verify the difference between the target frequency and the current frequency. For example, if the current is running at 2 Hz (the upper limit of the first mode), when switching, it is necessary to directly jump to a frequency point above 4.5 Hz, and the frequency in the range of 3 Hz - 4.5 Hz cannot be selected, so as to ensure that the frequency difference ≥ 2.5 Hz. To meet the constraint, the hardware design adopts a two-stage phase-locked loop circuit. When the detected frequency difference is insufficient, the frequency buffering mechanism is triggered, and the frequency is first forcibly increased to the intermediate transition point (such as 4.5 Hz), and after staying for 30 milliseconds, it is then switched to the target frequency. This embodiment can not only avoid the mechanical resonance risk in the frequency overlap area, but also reduce the influence of electromagnetic interference on the control signal through the frequency difference buffer.

[0073] In this embodiment, the threshold is a dynamic threshold, and the dynamic threshold is updated according to the number of cyclic tests according to the following formula;

[0074] When N ≤ the first test number, the dynamic threshold is T1;

[0075] When the first test number < N ≤ the second test number, the dynamic threshold is T2;

[0076] When N > the second test number, the dynamic threshold is T3;

[0077] wherein, N is the number of cyclic tests, and T1 is the initially set threshold.

[0078] In this embodiment, by introducing a dynamic threshold, the problem of unreasonable threshold setting in the aging test of the high-frequency generator is solved. Specifically, the dynamic threshold can be updated according to the number of cyclic tests, and is divided into three stages: the initial stage, the intermediate stage, and the later stage. The initially set threshold T1 is adopted in the initial stage; the updated threshold T2 is adopted in the intermediate stage; the further updated threshold T3 is adopted in the later stage. For example: the first test number can be 50 times, the second test number can be 200 times, and the test number refers to the number of cyclic tests. Each complete round of the first frequency mode and the second frequency mode is regarded as achieving one test number. In this embodiment, by refining the threshold setting in different stages according to the aging characteristics of the high-frequency generator at different times, the aging test accuracy of the high-frequency generator is improved.

[0079] Optionally, the calculation formula of T2 is:

[0080] ;

[0081] The calculation formula of T3 is:

[0082] ;

[0083] wherein, e represents the natural constant.

[0084] Specifically, in the initial stage of the aging test, since the performance is in a stable period during this period, a fixed threshold can be set for aging determination; when the aging test is in the middle stage, it can be adapted to progressive aging according to a preset formula; when the aging test is in the later stage, a coefficient decay formula can be used for threshold setting.

[0085] In this embodiment, step S11 specifically includes: randomly selecting a first number of different first sub-frequency points in the first frequency mode, controlling the high-frequency generator under test to operate in sequence according to each of the first sub-frequency points, where the high-frequency generator under test is controlled to continuously operate for at least a preset duration according to each of the first sub-frequency points, recording the current measurement values of the high-frequency generator under test at each of the first sub-frequency points, and calculating the arithmetic mean of the current measurement values corresponding to each of the first sub-frequency points as the initial operating current value of the first frequency mode;

[0086] Step S12 specifically includes: equally spacing and selecting a second number of different second sub-frequency points in the second frequency mode, controlling the high-frequency generator under test to operate in sequence according to each of the second sub-frequency points, where the high-frequency generator under test is controlled to continuously operate for at least the preset duration according to each of the second sub-frequency points, recording the current measurement values of the high-frequency generator under test at each of the second sub-frequency points, and after removing the maximum and minimum values from all the current measurement values corresponding to the second sub-frequency points, taking the average of the current measurement values corresponding to the remaining sub-frequency points as the initial operating current value of the second frequency mode.

[0087] Specifically, in low-frequency calibration (first frequency mode), 3 non-consecutive frequency points (such as 0.6 Hz, 1.3 Hz, 1.9 Hz) are selected from the range of 0.4 Hz - 2 Hz through a pseudo-random algorithm. After each frequency point operates for 10 seconds, the transient data of the first 2 seconds can be filtered out, and the average current of the last 8 seconds is collected. Finally, the arithmetic mean of the three is taken as the initial operating current value of the first frequency mode; high-frequency calibration (second frequency mode) adopts equally spaced sampling: the range of 3 Hz - 20 Hz is divided into 4 sub-intervals (such as 3 - 7 Hz, 7 - 11 Hz, 11 - 15 Hz, 15 - 20 Hz), and 5 test points are formed by the center frequency points (5 Hz, 9 Hz, 13 Hz, 17.5 Hz) of each interval and the upper limit of 20 Hz. After each operates for 15 seconds, the maximum and minimum values are removed, and the average of the remaining 3 test points is used as the initial operating current value of the second frequency mode. The multi-frequency point coverage in this embodiment can ensure that the calibration result reflects the characteristics of the entire frequency band, and the extreme value removal strategy eliminates the influence of accidental electromagnetic interference, thereby improving the accuracy of the aging test of the high-frequency generator.

[0088] In this embodiment, step S14 further includes: synchronously monitoring the temperature rise rate of the high-frequency generator under test, and starting the accelerated aging determination when the following conditions are met; in the accelerated aging determination, the aging determination threshold is 80% of the threshold;

[0089] ;

[0090] Wherein, represents the temperature rise rate, represents the absolute difference between the real-time working current value and the initial working current value in the corresponding mode, represents the initial working current value in the first frequency mode or the second frequency mode, The unit is degrees Celsius per second.

[0091] Specifically, at the moment of frequency mode switching, the temperature rise rate and the current deviation ratio are synchronously collected. Among them, the temperature rise rate can calculate the temperature rise value per second through a patch-type NTC thermistor (sampling rate 10Hz). If the above conditions are met, the accelerated aging determination mode is activated. The dual-condition trigger in this embodiment can avoid the aging misjudgment caused by single-parameter determination and increase the timeliness of aging determination.

[0092] In this embodiment, during the process of returning to execute step S13, the current deviation ratios corresponding to each preset number of cycles are extracted. The current deviation ratios of the preset number of cycles form an independent sliding window, and the mean and standard deviation of the current deviation ratios within each sliding window are calculated in turn. When M consecutive sliding windows satisfy the following formula, where M is greater than or equal to 2, it is determined that an irreversible aging trend has occurred, and the aging failure determination is triggered;

[0093] , and ;

[0094] Among them, represents the mean value of the current deviation ratio within the nth sliding window, represents the mean value of the current deviation ratio within the (n + 1)th sliding window, represents the standard deviation of the current deviation ratio within the (n - 1)th sliding window, represents the standard deviation of the current deviation ratio within the nth sliding window.

[0095] This embodiment can identify the irreversible aging trend of the high-frequency generator by using the window analysis method, and can predict the end of the life of the high-frequency generator in advance compared with the traditional threshold method, providing data support for the preventive maintenance of the high-frequency generator.

[0096] Referring to Figure 2 , the present invention provides an aging test system for a high-frequency generator, including:

[0097] The first frequency mode control module 21 is used to control the high-frequency generator to be tested to operate in the first frequency mode and record the initial working current value of the high-frequency generator to be tested in the first frequency mode;

[0098] The second frequency mode control module 22 is configured to control the high-frequency generator under test to operate in the second frequency mode, and record the initial operating current value of the high-frequency generator under test in the second frequency mode;

[0099] The switching module 23 is configured to control the high-frequency generator under test to alternately operate between the first frequency mode and the second frequency mode, wherein the switching between the first frequency mode and the second frequency mode is completed through a linear frequency gradient;

[0100] The monitoring and calculation module 24 is configured to monitor the real-time operating current values of the high-frequency generator under test in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio of the real-time operating current value to the initial operating current value in the corresponding mode;

[0101] The determination module 25 is configured to determine that the high-frequency generator is aging and fails when the relative deviation ratio in any mode exceeds the threshold, and record the total operating time of the high-frequency generator under test;

[0102] The loop determination module 26, if the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, returns to sequentially operate the switching module 23, the monitoring and calculation module 24, and the determination module 25 until it is determined that the high-frequency generator is aging and fails.

[0103] Refer to Figure 3 , the present invention provides an electronic device 30, including a memory and a processor;

[0104] The memory is used to store a computer program;

[0105] The processor is configured to implement the aging test method of the high-frequency generator as described in any one of the above when executing the computer program.

[0106] In a fourth aspect, the present invention provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the aging test method of the high-frequency generator as described in any one of the above is implemented.

[0107] The present invention provides an electronic device 30, including a memory 31 and a processor 32;

[0108] The memory 31 is used to store a computer program;

[0109] The processor 32 is configured to implement the aging test method of the high-frequency generator as described above when executing the computer program.

[0110] Alternatively, an electronic device 30 includes a memory 31 and a processor 32 coupled to the memory 31; the memory 31 is configured to store a computer program; the processor 32 is configured to perform the following operations when executing the computer program:

[0111] Step S11: Control the high-frequency generator under test to operate in a first frequency mode, and record the initial operating current value of the high-frequency generator under test in the first frequency mode;

[0112] Step S12: Control the high-frequency generator under test to operate in a second frequency mode, and record the initial operating current value of the high-frequency generator under test in the second frequency mode;

[0113] Step S13: Control the high-frequency generator under test to alternately switch between the first frequency mode and the second frequency mode, wherein the switch between the first frequency mode and the second frequency mode is completed by a linear frequency gradient;

[0114] Step S14: Monitor the real-time operating current values of the high-frequency generator under test in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio of the real-time operating current value to the initial operating current value in the corresponding mode;

[0115] Step S15: When the relative deviation ratio in any mode exceeds the threshold, determine that the high-frequency generator is aging and failed, and record the total operating time of the high-frequency generator under test;

[0116] Step S16: If the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, return to execute Step S13 until it is determined that the high-frequency generator is aging and failed.

[0117] The present invention provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the aging test method of the above high-frequency generator is implemented.

[0118] Alternatively, a non-volatile computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the processor is caused to perform the following operations:

[0119] Step S11: Control the high-frequency generator under test to operate in a first frequency mode, and record the initial operating current value of the high-frequency generator under test in the first frequency mode;

[0120] Step S12: Control the high-frequency generator under test to operate in a second frequency mode, and record the initial operating current value of the high-frequency generator under test in the second frequency mode;

[0121] Step S13: Control the high-frequency generator under test to alternately operate between the first frequency mode and the second frequency mode, wherein the switching between the first frequency mode and the second frequency mode is completed through linear frequency gradient.

[0122] Step S14: Monitor the real-time working current values of the high-frequency generator under test in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio of the real-time working current value to the initial working current value in the corresponding mode.

[0123] Step S15: When the relative deviation ratio in any mode exceeds the threshold, it is determined that the high-frequency generator is aging and fails.

[0124] Step S16: If the relative deviation ratios in both the first frequency mode and the second frequency mode do not exceed the threshold, return to execute Step S13 until it is determined that the high-frequency generator is aging and fails.

[0125] Now, an electronic device 30 that can be a server or a client of the present invention will be described. It is an example of a hardware device that can be applied to various aspects of the present invention. The electronic device 30 is intended to represent various forms of digital electronic computer devices, such as, laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device 30 can also represent various forms of mobile devices, such as, personal digital processors, cellular phones, smart phones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described herein and / or claimed.

[0126] The electronic device 30 includes a computing unit that can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) or a computer program loaded from a storage unit into a random access memory (RAM). In the RAM, various programs and data required for device operation can also be stored. The computing unit, the ROM, and the RAM are connected to each other through a bus. An input / output (I / O) interface is also connected to the bus.

[0127] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The program can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above methods. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM), etc. In this application, the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiments of the present invention. In addition, the functional units in each embodiment of the present invention can be integrated into a processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.

[0128] Although the present invention is disclosed as above, the protection scope of the present invention is not limited thereto. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, and these changes and modifications will all fall within the protection scope of the present invention.

Claims

1. A high frequency generator aging test method, characterized in that: Including: Step S11: Control the high-frequency generator under test to operate in the first frequency mode, and record the initial operating current value of the high-frequency generator under test in the first frequency mode; Step S12: Control the high-frequency generator under test to operate in the second frequency mode, and record the initial operating current value of the high-frequency generator under test in the second frequency mode; Step S13: Control the high-frequency generator under test to alternately switch and operate between the first frequency mode and the second frequency mode, wherein the switching between the first frequency mode and the second frequency mode is completed through linear frequency gradient; Step S14: Monitor the real-time operating current values of the high-frequency generator under test in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio of the real-time operating current value to the initial operating current value in the corresponding mode; Step S15: When the relative deviation ratio in any mode exceeds the threshold, it is determined that the high-frequency generator is aging and fails, and record the total operating time of the high-frequency generator under test; Step S16: If the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, return to execute Step S13 until it is determined that the high-frequency generator is aging and fails; Among them, Step S14 further includes: synchronously monitoring the temperature rise rate of the high-frequency generator under test, and starting the accelerated aging determination when the following conditions are met; in the accelerated aging determination, the aging determination threshold is 80% of the threshold; ； in, represents the rate of temperature rise, represents the absolute difference between the real-time working current value and the initial working current value of the corresponding mode, Indicates the initial operating current value in the first frequency mode or the second frequency mode; During the process of returning to execute Step S13, extract the corresponding current deviation ratios every time a preset number of cycles are completed. The current deviation ratios of the preset number of times form an independent sliding window, and calculate the mean and standard deviation of the current deviation ratios within each sliding window in turn. When M consecutive sliding windows satisfy the following formula, M is greater than or equal to 2, it is determined that an irreversible aging trend occurs, and the aging failure determination is triggered; ,and ; in, represents the mean value of the current deviation ratio in the nth sliding window, represents the mean value of the current deviation ratio in the n+1th sliding window, represents the standard deviation of the current deviation ratio in the n-1th sliding window, It represents the standard deviation of the current deviation ratio in the nth sliding window.

2. The aging test method of the high frequency generator according to claim 1, characterized in that: The frequency range of the first frequency mode is from 0.4 Hz to 2 Hz, the frequency range of the second frequency mode is from 3 Hz to 20 Hz, and when switching between the first frequency mode and the second frequency mode, the frequency transition difference corresponding to each mode switch is at least 2.5 Hz.

3. The aging test method of the high frequency generator according to claim 1, characterized in that: The threshold is a dynamic threshold, and the dynamic threshold is updated according to the following formula based on the number of cycle tests: When N ≤ the first test number, the dynamic threshold is T1; When the first test number < N ≤ the second test number, the dynamic threshold is T2; When N > the second test number, the dynamic threshold is T3; Among them, N is the number of cycle tests, and T1 is the initially set threshold.

4. The aging test method for a high frequency generator according to claim 3, characterized in that: The calculation formula of T2 is: ； The calculation formula of T3 is: ； Among them, e represents the natural constant.

5. The aging test method of a high frequency generator according to claim 1, characterized in that: Step S11 specifically includes: randomly selecting a first number of different first sub-frequency points in the first frequency mode, controlling the high-frequency generator to be tested to operate in accordance with each of the first sub-frequency points in sequence, wherein the high-frequency generator to be tested is controlled to continuously operate for at least a preset time at each of the first sub-frequency points, recording the current measurement value of the high-frequency generator to be tested at each of the first sub-frequency points, and calculating the arithmetic mean of the current measurement values ​​corresponding to each of the first sub-frequency points as the initial working current value of the first frequency mode; Step S12 specifically includes: selecting a second number of different second sub-frequency points at equal intervals in the second frequency mode, controlling the high-frequency generator to be tested to operate in turn according to each of the second sub-frequency points, wherein the high-frequency generator to be tested is controlled to continuously operate for at least the preset time length according to each of the second sub-frequency points, recording the current measurement value of the high-frequency generator to be tested at each of the second sub-frequency points, and after eliminating the maximum value and the minimum value of the current measurement values ​​corresponding to all the second sub-frequency points, taking the average value of the current measurement values ​​corresponding to the remaining sub-frequency points as the initial working current value of the second frequency mode.

6. An aging test system for a high frequency generator, used to execute the aging test method for a high frequency generator according to any one of claims 1 to 5, characterized in that: include: A first frequency mode control module, used to control the high-frequency generator to be tested to operate in a first frequency mode, and record an initial operating current value of the high-frequency generator to be tested in the first frequency mode; A second frequency mode control module, used for controlling the high frequency generator to be tested to operate in a second frequency mode, and recording an initial operating current value of the high frequency generator to be tested in the second frequency mode; A switching module, used for controlling the high-frequency generator to be tested to switch between the first frequency mode and the second frequency mode alternately, wherein the switching between the first frequency mode and the second frequency mode is completed by linear frequency gradient; A monitoring and calculation module, used for monitoring the real-time working current value of the high-frequency generator to be tested in the first frequency mode and the second frequency mode during the switching operation, and calculating the relative deviation ratio between the real-time working current value and the initial working current value in the corresponding mode; A determination module, configured to determine that the high-frequency generator is aged and failed when the relative deviation ratio in any mode exceeds a threshold value, and record the total operating time of the high-frequency generator to be tested; The cyclic determination module returns to sequentially execute the switching module, the monitoring and calculation module, and the determination module until it is determined that the high-frequency generator is aged and failed if the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold value.

7. An electronic device, characterized in that: including memory and processor; The memory is used to store computer programs; The processor is used to implement the aging test method for the high frequency generator according to any one of claims 1 to 5 when executing the computer program.

8. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by the processor, the aging test method for the high-frequency generator according to any one of claims 1 to 5 is implemented.

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