Comprehensive analysis method and system for various parameters of power control board

Abstract

The invention relates to the technical field of electrical parameter measurement, in particular to a comprehensive analysis method and system for various parameters of a power supply control board, and the method comprises the steps: obtaining a test item of a to-be-tested power supply control board and the test parameter information of a historical power supply control board which is the same as the to-be-tested power supply control board; constructing a test circuit corresponding to each test item, and determining a test sequence according to the types and the number of the electronic components in every two test circuits; determining a reference control board of the to-be-tested power supply control board by using the test parameter information of each test parameter of the historical power supply control board; determining a to-be-tested parameter scheme of the to-be-tested power supply control board according to the test parameter information of each test parameter of each reference control board in each working condition environment; and testing the to-be-tested power supply control board by using the test sequence and the to-be-tested parameter scheme, and analyzing a test result. According to the invention, the accuracy and authenticity of the test result of the power control board are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical parameter measurement, and in particular to a method and system for comprehensively analyzing multiple parameters of a power supply control board. Background Art

[0002] The Power Control Board (PCB) is a component used in electronic devices to manage and control the distribution and conversion of electrical energy. It integrates various circuits and components to ensure that the system can operate stably and efficiently, and can adjust the output voltage and current according to actual needs. Because the PCB needs to maintain many key parameters of the power output within a safe and stable range, it is necessary to conduct comprehensive tests on multiple parameters of the PCB.

[0003] In some scenarios, the corresponding test circuits are connected according to the test requirements of the PCB, and then the test parameters are continuously changed to obtain comprehensive test data of the PCB. Among them, in the process of testing each PCB, the existing test system mostly directly tests various PCBs according to the preset test sequence and test parameters when working, but the different test sequences and test parameters of different PCBs may cause differences in the test results of the PCB. Therefore, using a unified test sequence and test parameters for various PCBs will result in poor accuracy and authenticity of the PCB test results, and cannot reflect the actual status of the PCB. Summary of the invention

[0004] In order to solve the technical problem of poor accuracy and authenticity of PCB test results, the purpose of the present invention is to provide a method and system for comprehensive analysis of multiple parameters of a power control board. The technical solutions adopted are as follows: In a first aspect, an embodiment of the present invention provides a method for comprehensive analysis of multiple parameters of a power control board, comprising: obtaining test items of a power control board to be tested and test parameter information of a historical power control board that is the same as the power control board to be tested; constructing a test circuit corresponding to each test item, and determining a test sequence of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of electronic components in the test circuits, wherein the circuit replacement complexity between adjacent test circuits corresponding to the test items of the power control board to be tested is minimized; determining a reference control board of the power control board to be tested using the test parameter information of each test parameter of the historical power control board; determining a parameter scheme for the power control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each operating condition, a first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each operating condition, and a second average value of the first average value under each operating condition; testing the power control board to be tested using the test sequence and the parameter scheme, and analyzing the test results.

[0005] Optionally, determining the test sequence of test circuits corresponding to the test items of the power control board to be tested based on the types and quantities of electronic components in the pairwise test circuits includes: determining the circuit replacement complexity of switching from one test circuit to another test circuit based on the types and quantities of electronic components in the pairwise test circuits, and determining two test circuits with circuit replacement complexity less than or equal to a first threshold as continuous circuits; and determining the test sequence of the test circuits corresponding to the test items of the power control board to be tested based on the circuit replacement complexity.

[0006] Optionally, determining the circuit replacement complexity of switching from one test circuit to another test circuit based on the types and quantities of electronic components in the pairwise test circuits includes: determining a first number of electronic components of different types in the pairwise test circuits, a second number of total electronic components in one of the pairwise test circuits, and a third number of total electronic components in the other test circuit; determining a maximum value from the second number and the third number; calculating a first ratio between the first number and the maximum value, and a first difference between a predetermined value and the first ratio; and normalizing the first difference to obtain the circuit replacement complexity.

[0007] Optionally, determining the test order of test circuits corresponding to the test items of the power control board to be tested based on the circuit replacement complexity includes: randomly selecting a test circuit as the first test circuit; selecting a continuous circuit with the smallest circuit replacement complexity with the first test circuit as the second test circuit; selecting a continuous circuit with the smallest circuit replacement complexity with the second test circuit as the third test circuit, and repeating the above process until the test circuits corresponding to all the test items of the power control board to be tested are arranged, thereby obtaining the test order of the test circuits corresponding to the test items of the power control board to be tested.

[0008] Optionally, using the test parameter information of each test parameter of the historical power control board to determine the reference control board of the power control board to be tested includes: using the test parameter information of the historical power control board to determine the possible normal parameter value of the historical power control board; calculating the absolute value of the second difference between the possible normal parameter value and the test parameter information, normalizing the absolute value of the second difference to obtain the parameter normality index of the historical power control board; calculating the average parameter index of the parameter normality index of each test parameter of the historical power control board, and using the average parameter index as the test normality index of the historical power control board; using the historical power control board whose test normality index is greater than or equal to the second threshold as the reference control board of the power control board to be tested.

[0009] Optionally, determining the parameter scheme to be tested of the power control board to be tested based on the standard deviation of the test parameter information of each test parameter of each reference control board under each operating condition, the first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each operating condition, and the second average value of the first average value under each operating condition includes: determining the second average value as the feedback difference factor of the working conditions of each reference control board under the test parameter scheme; using the feedback difference factor to determine the feedback consistency index of each reference control board in response to the test parameter scheme; and selecting the test parameter scheme whose feedback consistency index is greater than or equal to a third threshold as the parameter scheme to be tested of the power control board to be tested.

[0010] Optionally, using the feedback difference factor to determine the feedback consistency index of each reference control board for the test parameter scheme feedback includes: using an inverse proportional normalization function to normalize the feedback difference factor to obtain the feedback consistency index of each reference control board for the test parameter scheme feedback.

[0011] Optionally, the power control board to be tested is tested using a test sequence and a test parameter scheme, and the test results are analyzed, including: determining a standard fixture based on application information of electronic components in historical test circuits of historical power control boards, the standard fixture being used to place the power control board to be tested; selecting corresponding test circuits and test parameter schemes in sequence according to the test sequence to test the power control board to be tested placed on the standard fixture; and inputting the test results into a trained neural network for analysis to obtain analysis results of the power control board to be tested.

[0012] Optionally, determining a standard fixture based on application information of electronic components in historical test circuits of historical power control boards includes: determining the number of electronic components used in historical test circuits and the total number of historical test circuits; determining a second ratio between the number of components and the total number as a utilization rate of the electronic components, and selecting electronic components whose utilization rates exceed a fourth threshold as target electronic components; and The layout algorithm determines the position coordinates of the target electronic component in the standard fixture in combination with the connection information of the target electronic component in the historical test circuit, and the corresponding position coordinates in the standard fixture are used to place the corresponding target electronic component.

[0013] In a second aspect, an embodiment of the present invention provides a system for comprehensive analysis of multiple parameters of a power control board, comprising: a processor and a memory; wherein the memory is used to store computer programs that can be run on the processor; and the processor is used to execute the program stored in the memory to implement the steps of the method for comprehensive analysis of multiple parameters of a power control board as mentioned in the first aspect.

[0014] The invention has the following beneficial effects: firstly, the test items of the power control board to be tested and the test parameter information of the historical power control board which is the same as the power control board to be tested are obtained; then, the test circuits corresponding to the test items are constructed, and the test sequence of the test circuits corresponding to the test items of the power control board to be tested is determined according to the types and quantities of the electronic components in the test circuits, wherein the circuit replacement complexity between the adjacent test circuits corresponding to the test items of the power control board to be tested is minimized; secondly, the reference control board of the power control board to be tested is determined by using the test parameter information of each test parameter of the historical power control board; then, the parameter scheme to be tested of the power control board to be tested is determined according to the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition, the first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each working condition, and the second average value of the first average value under each working condition; finally, the power control board to be tested is tested by using the test sequence and the parameter scheme to be tested, and the test result is analyzed.

[0015] In this way, the embodiment of the present invention can analyze the complexity of circuit replacement between the test circuits of the test items of the power control board to be tested, and select the sequence with the least complexity of circuit replacement between the test circuits to formulate the test sequence of the power control board to be tested. After that, the test parameter information of the test parameters of many historical power control boards under various working conditions is analyzed to obtain the reference control board of the power control board to be tested, and then combined with the consistency of the change of the test parameter information of the reference control board under different working conditions, the most stable parameter change process of many historical power control boards is selected as the parameter scheme to be tested of the power control board to be tested. Finally, the power control board to be tested is tested according to the above test sequence and test scheme. Therefore, the embodiment of the present invention determines the test sequence and test parameters applicable to the power control board to be tested according to the test circuit of the power control board to be tested and the test parameter information of the same historical power control board, thereby improving the accuracy and authenticity of the test result of the power control board, so as to reflect the actual state of the power control board. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 A flowchart of a method for comprehensive analysis of multiple parameters of a power control board provided by an embodiment of the present invention.

[0018] Figure 2A schematic structural diagram of a device for comprehensive analysis of multiple parameters of a power control board provided by an embodiment of the present invention.

[0019] Figure 3 A schematic structural diagram of a system for comprehensive analysis of multiple parameters of a power control board provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0020] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of the method and system for comprehensive analysis of multiple parameters of a power control board proposed by the present invention, its specific implementation method, structure, features and effects, in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0021] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0022] The specific scheme of the comprehensive analysis method of multiple parameters of a power control board provided by the present invention is described in detail below with reference to the accompanying drawings.

[0023] Embodiment 1: See also Figure 1 , which shows a flow chart of a method for comprehensive analysis of multiple parameters of a power control board provided by an embodiment of the present invention, including: S101, acquiring test items of a power control board to be tested and test parameter information of a historical power control board that is the same as the power control board to be tested.

[0024] Specifically, the test items of the power control board to be tested in the embodiment of the present invention include but are not limited to functional testing, electrical performance testing, and safety testing. Functional testing includes but is not limited to current input testing, voltage output testing, and load testing. Electrical performance testing includes but is not limited to ripple and noise testing, transient response testing, and efficiency testing. Safety testing includes but is not limited to insulation resistance testing and withstand voltage testing. The historical power control board that is the same as the power control board to be tested refers to a power control board of the same type as the power control board to be tested. Test parameter information includes but is not limited to historical test circuits of historical power control boards, various test schemes during the test process, and parameter values ​​of test parameters such as voltage, current, resistance, and power recorded during the test process.

[0025] Further, when the same power control board is tested for the same test item, the test circuit used is the same, which can effectively avoid the test error caused by the change of the test environment; at the same time, because the power control board to be tested needs to be tested for a comprehensive test of multiple test parameters, that is, it is necessary to complete multiple tests on the power control board to be tested. In order to complete the conversion adjustment of the test circuit of the test item more simply and quickly, it is necessary to compare the differences between many test circuits, link the test circuits corresponding to the test items with smaller differences, and generate the test sequence in sequence. When the power control board to be tested is tested, it is necessary to continuously adjust the input parameters of the power control board to be tested and the load in the line in the test circuit, so as to evaluate the performance of the power control board to be tested under various working conditions, but in order to ensure that the test parameter environment of the previous group, such as the load and input parameters, have the lowest impact on the test environment of the next group, it is necessary to analyze the differences in the test results of other power control boards under many test parameter environments and formulate the corresponding test parameter change process. Therefore, the embodiment of the present invention determines the test sequence and test parameters of the power control board to be tested based on the test circuit corresponding to the test item of the power control board to be tested and the test parameter information of the historical power control board.

[0026] S102, constructing a test circuit corresponding to each test item, and determining a test sequence of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of electronic components in the test circuits.

[0027] Among them, the complexity of circuit replacement between adjacent test circuits corresponding to the test items of the power control board to be tested is minimal.

[0028] Specifically, due to the different test items for the power control board, the corresponding test circuits are different. In past tests, although the electronic components may have different series connection orders on the test circuit due to different picking orders, because the purpose to be tested is the same, the number of electronic components used and the types of electronic components between nodes are the same, and the test circuit corresponding to each test item is constructed accordingly. In the embodiment of the present invention, the names of many test items are first used as the input of the model and the corresponding test circuits are used as the output of the model, and the generation model of the test circuit is trained through the graph neural network. At the same time, the graph neural network can optimize the wiring of the corresponding test circuit and improve the circuit performance. Accordingly, the test circuits corresponding to the test items of the power control board to be tested in the embodiment of the present invention are obtained. That is, the name of the test item of the power control board to be tested is input into the trained graph neural network model, and the trained graph neural network model will generate the corresponding test circuit.

[0029] Furthermore, considering that each time a test item is completed, the test circuit needs to be adjusted to proceed to the next test item, and the adjustment of these lines will take some time, the fewer the test circuits are changed, the fewer lines need to be reconnected, and the corresponding time required is less. Therefore, according to the difference in the test circuits, the test sequence of many test items is constructed. Among them, as an optional embodiment of the present invention, the circuit replacement complexity of switching from one test circuit to another is first determined according to the type and number of electronic components in the test circuits, and the two test circuits with a circuit replacement complexity less than or equal to a first threshold are determined as continuous circuits; then, the test sequence of the test circuits corresponding to the test items of the power supply control board to be tested is determined according to the circuit replacement complexity.

[0030] Specifically, the circuit replacement complexity refers to the complexity of switching between two test circuits. The greater the circuit replacement complexity, the more lines need to be reconnected, the more time is required, and the lower the test efficiency is, and vice versa. The types of electronic components in the test circuit include but are not limited to resistors, capacitors, and switching devices. When calculating the circuit replacement complexity of switching from one test circuit to another test circuit, as an optional embodiment of the present invention, a first number of electronic components of different types in the two test circuits, a second number of total electronic components in one of the two test circuits, and a third number of total electronic components in the other test circuit are determined; the maximum value is determined from the second number and the third number; a first ratio between the first number and the maximum value, and a first difference between the predetermined value and the first ratio are calculated; the first difference is normalized to obtain the circuit replacement complexity.

[0031] The embodiment of the present invention specifically uses the following formula to calculate the circuit replacement complexity: ; In the above formula, Indicates the current test circuit Switch to test circuit The circuit replacement complexity is used to evaluate the complexity of switching circuits. Indicates the test circuit Relative to the test circuit Let's say a first number of different electronic components. Indicates the test circuit A second number of electronic components. Indicates the test circuit The third number of electronic components. represents a maximum function, which is used to determine the maximum value from the second quantity and the third quantity. Represents the inverse normalization function, which is used to Perform inverse proportional normalization.

[0032] Furthermore, the first threshold value can be set according to actual conditions. In the embodiment of the present invention, the first threshold value is recorded as , the first threshold The value is 0.1. The embodiment of the present invention screens the circuit replacement complexity of a large number of test circuits, and when the circuit replacement complexity of two test circuits is less than or equal to 0.1, the two test circuits are considered to be similar, and the two test circuits are recorded as continuous circuits.

[0033] Furthermore, when determining the test sequence, as an optional embodiment of the present invention, first randomly select a test circuit as the first test circuit; then select the continuous circuit with the smallest circuit replacement complexity with the first test circuit as the second test circuit, and select the continuous circuit with the smallest circuit replacement complexity with the second test circuit as the third test circuit, and repeat the above process until the test circuits corresponding to all test items of the power control board to be tested are sorted, and the test sequence of the test circuits corresponding to the test items of the power control board to be tested is obtained. It is worth noting that each test circuit can only participate once during sorting. When a test circuit has no available continuous circuit, return to the previous sorting and replace other test circuits in the continuous circuit. This process is similar to the breadth-first search process. The breadth-first search process can be specifically referred to the prior art, and the embodiments of the present invention will not be repeated here.

[0034] S103, determining a reference control board of the power control board to be tested by using the test parameter information of each test parameter of the historical power control board.

[0035] Specifically, since the design parameters used for the same model of power control boards are the same, the process used in production and the parameter models of various raw materials are also the same, so when facing the same working environment, the various parameters shown in the operation process are also the same. However, considering that the differences in production batches and equipment will cause a certain degree of fluctuation in its operating parameters, these fluctuations are less than the impact of defective power control boards. Based on this, the power control boards that work normally under the same test environment are selected as reference control boards.

[0036] Furthermore, when determining a reference control board for a power control board to be tested, as an optional embodiment of the present invention, firstly, the test parameter information of the historical power control board is used to determine the possible normal parameter value of the historical power control board; then, the absolute value of the second difference between the possible normal parameter value and the test parameter information is calculated, and the absolute value of the second difference is normalized to obtain the parameter normality index of the historical power control board; then, the average parameter index of the parameter normality index of each test parameter of the historical power control board is calculated, and the average parameter index is used as the test normality index of the historical power control board; finally, the historical power control board whose test normality index is greater than or equal to the second threshold is used as the reference control board of the power control board to be tested.

[0037] Specifically, the test parameter information of the historical power control board includes but is not limited to the output current value, the output voltage value, and the output power. In the embodiment of the present invention, the central trend of the test parameter information of many historical power control boards can be used to infer the possible normal parameter values ​​of the power control board of this type. In the embodiment of the present invention, the test parameter information of the historical power control board is explained by taking the output current value as an example. The possible normal parameter value of the current parameter in the embodiment of the present invention is specifically calculated using the following formula: ; In the above formula, Indicates that the environmental parameters are The possible normal parameter values ​​of the historical power control board are inferred through the central trend of the test parameters of many historical power control boards. Indicates that many historical power control boards have the following environmental parameters: The average output current. Indicates that many historical power control boards have the following environmental parameters: The mode of the output current. Indicates that many historical power control boards have the following environmental parameters: The environmental parameters include but are not limited to temperature, humidity, etc.

[0038] Further, the parameter normality index of the historical power control board can be determined based on the deviation between the historical power control board and the possible normal parameter value. The embodiment of the present invention specifically uses the following formula to calculate the parameter normality index of the current parameter of the historical power control board: ; In the above formula, Indicates the historical power control board Normal parameters in terms of current, used to describe the history of the power control board Similarity to other normal power control boards in terms of current. Indicates the historical power control board In environmental parameters The output current value below. Indicates that the environmental parameters are The possible normal parameter values ​​of the current parameters of the historical power control board. represents an exponential function with a natural constant as the base, i.e., an inverse proportional normalization function, which is used to calculate the current difference Perform inverse normalization.

[0039] It is worth noting that the possible normal parameter values ​​of other test parameters of the historical power supply control board and the parameter normality index can refer to the above-mentioned current parameter calculation method, and the current parameter values ​​in the calculation formula of the possible normal parameter values ​​of the current parameter and the calculation formula of the parameter normality index can be replaced with the voltage parameter values ​​or the power parameter values. The embodiments of the present invention will not be repeated here.

[0040] Further, as an optional embodiment of the present invention, the normal index of the test of the historical power control board can be calculated using the following formula: ; In the above formula, Indicates the historical power control board The normal indicators of the test under this environmental parameter characterize its similarity to other normal power control boards. Indicates the historical power control board In the test parameters Normal indicators of the test. Indicates the type of test parameter. The types of test parameters include but are not limited to voltage, current, and power.

[0041] Furthermore, in the embodiment of the present invention, the second threshold is recorded as , the second threshold The value of can be determined according to the actual situation. In the embodiment of the present invention, the value is 0.6. The normal test indexes of many historical power control boards are screened. If the corresponding normal test index is greater than or equal to 0.6, it is considered that the reaction of the power test board is consistent with that of many power control boards under this environmental parameter, and these power control boards are recorded as reference control boards. Thus, reference control boards under various environmental parameters are obtained.

[0042] S104, determining the parameter scheme for the power control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each operating condition, the first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each operating condition, and the second average value of the first average value under each operating condition.

[0043] Specifically, during the test, the input current, input voltage and other parameters of the power control board need to be constantly changed to test the operating conditions of the power control board under various working conditions. However, because the responses of the electronic components in the power control board to many working conditions are inconsistent, the output of the power control board is different after the working conditions change. In order to avoid the differences in the output and working conditions of different power control boards caused by changes in the working conditions, a test parameter scheme with consistent parameter changes of many reference control boards is selected as the test parameter scheme of the power control board to be tested.

[0044] Furthermore, when determining the parameter scheme to be tested, as an optional embodiment of the present invention, the second average value is first determined as the feedback difference factor of the working conditions of each reference control board under the test parameter scheme; then the feedback difference factor is used to determine the feedback consistency index of each reference control board in response to the test parameter scheme; finally, the test parameter scheme with a feedback consistency index greater than or equal to the third threshold is selected as the parameter scheme to be tested for the power supply control board to be tested.

[0045] Specifically, the embodiment of the present invention uses the following formula to calculate the feedback difference factor: ; In the above formula, Indicates that the test parameter scheme The feedback difference factor of the working conditions of many reference control panels in the test parameter scheme is characterized As the parameters in the test circuit change, the working feedback of many reference control boards varies. Indicates reference control board In the working environment Time test parameters The test parameter information, that is, the parameter value. Represents the standard deviation calculation function, which is used to calculate the discreteness of many reference control panels under a certain test parameter under the corresponding working environment. It means calculating the first average value of the standard deviations corresponding to the test parameters of many reference control boards, which represents the difference in the feedback of many reference control boards to the working environment under the working condition, that is, is the feedback parameter of the reference control board. It represents the difference in feedback parameters of reference control boards under various working conditions, that is, the second average value of the difference in feedback of various reference control boards to the working conditions, which characterizes the working differences of various reference control boards facing different working conditions.

[0046] Furthermore, the consistency of the working parameter changes of many reference control panels under each test parameter scheme is calculated. As an optional embodiment of the present invention, the feedback difference factor is normalized using an inverse proportional normalization function to obtain the feedback consistency index of each reference control panel to the test parameter scheme.

[0047] Specifically, the embodiment of the present invention specifically uses the following formula to calculate the feedback consistency index: ; In the above formula, Indicates the test parameter schemes of many reference control boards Feedback consistency indicator for feedback. Indicates that the test parameter scheme The feedback difference factor of the working conditions of many reference control boards in . Represents an exponential function with a natural constant as the base, that is, an inverse proportional normalization function, which is used to Perform inverse proportional normalization.

[0048] Furthermore, the third threshold value can be set according to actual conditions. In the embodiment of the present invention, the third threshold value is recorded as , the third threshold The value of is 0.6. The embodiment of the present invention screens the feedback consistency index of many test parameter schemes. If the feedback consistency index of a test parameter scheme is greater than or equal to 0.6, it is considered that the working states of many reference control boards under the current test parameter scheme are almost the same, and the test parameter scheme is recorded as the parameter scheme to be tested. So far, the parameter scheme to be tested when the power control board to be tested performs various tests is obtained.

[0049] S105, testing the power control board to be tested using the test sequence and the test parameter scheme, and analyzing the test results.

[0050] Specifically, considering the importance of the power control board to be tested, it is necessary to conduct a comprehensive test on it. In order to ensure that the power control board to be tested completes a comprehensive test in the same standard fixture, the standard fixture needs to contain corresponding electronic components for completing various tests. Therefore, the embodiment of the present invention analyzes the test circuits of many historical power control boards in the past historical time and sets a standard fixture. The power control board to be tested is placed in the standard fixture, the corresponding circuits are connected and tested.

[0051] Furthermore, as an optional embodiment of the present invention, the power control board to be tested is tested using a test sequence and a test parameter scheme, and the test results are analyzed, including: determining a standard fixture based on application information of electronic components in historical test circuits of historical power control boards, the standard fixture being used to place the power control board to be tested; selecting corresponding test circuits and test parameter schemes in turn according to the test sequence to test the power control board to be tested placed on the standard fixture; and inputting the test results into a trained neural network for analysis to obtain analysis results of the power control board to be tested.

[0052] The standard fixture includes a combination of electronic components and circuits that are likely to be involved in the power control board to be tested. In the embodiment of the present invention, when determining the standard fixture, the number of electronic components used in the historical test circuit and the total number of historical test circuits are first determined; then the second ratio between the number of components and the total number is determined as the utilization rate of the electronic components, and the electronic components whose utilization rate exceeds the fourth threshold are selected as the target electronic components; finally, The layout algorithm determines the position coordinates of the target electronic component in the standard fixture in combination with the connection information of the target electronic component in the historical test circuit, and the corresponding position coordinates in the standard fixture are used to place the corresponding target electronic component.

[0053] Specifically, the fourth threshold value can be determined according to actual conditions, and in the embodiment of the present invention, the value is 10%. In the embodiment of the present invention, the electronic components used in many test circuits are first collected, and any electronic components with a usage rate exceeding 10% need to be set in the standard fixture. Based on this, the types of electronic components required for the standard fixture are obtained.

[0054] Furthermore, the embodiment of the present invention uses the following formula to calculate the usage rate: ; In the above formula, Indicates electronic components utilization rate. Indicates the use of electronic components The number of components, that is, the use of electronic components The number of circuits. Indicates the total number of historical test circuits.

[0055] Furthermore, the embodiment of the present invention is based on the series and parallel connection of electronic components in a plurality of test circuits, combined with Layout algorithm, obtain the position coordinates of each electronic component in the standard fixture, The edges in the layout algorithm correspond to the connection information of two electronic components, such as series connection and parallel connection. The specific process of the layout algorithm is as follows: The input of the layout algorithm is nodes, lines, graph structures, initial coordinates of nodes, gravitational coefficients, and repulsive coefficients, etc. Nodes are numerous electronic components, and edges are wire lines connecting two electronic components in a circuit. Graph structures refer to numerous graph structures simplified from test circuits, and simplification refers to simplifying electronic components into nodes and converting lines into edges. The initial coordinates of the nodes are randomly generated positions. The gravitational coefficient is the number of circuits in which two electronic components are directly connected in series and in parallel in numerous test circuits. Direct series connection means that the number of other electronic components between the electronic components is less than or equal to a preset value. In the embodiment of the present invention, the preset value is 2. The repulsive coefficient is the number of test circuits in which two electronic components are unconnected in numerous test circuits. Unconnected means that the number of other electronic components between the two electronic components is more than or equal to a preset value. In the embodiment of the present invention, the preset value is 6. The algorithm output of the layout algorithm is the position of each node and the edges connecting the nodes.

[0056] The embodiment of the present invention can analyze the complexity of circuit replacement between test circuits of the test items of the power control board to be tested, and select the sequence with the least complexity of circuit replacement between test circuits to formulate the test sequence of the power control board to be tested. Then, the test parameter information of the test parameters of many historical power control boards under various working conditions is analyzed to obtain the reference control board of the power control board to be tested, and then the consistency of the change of the test parameter information of the reference control board under different working conditions is combined to select the most stable parameter change process of many historical power control boards as the parameter scheme to be tested of the power control board to be tested. Finally, the power control board to be tested is tested according to the above test sequence and test scheme. Therefore, the embodiment of the present invention determines the test sequence and test parameters suitable for the power control board to be tested according to the test circuit of the power control board to be tested and the test parameter information of the same historical power control board, thereby improving the accuracy and authenticity of the test result of the power control board, so as to reflect the actual state of the power control board.

[0057] Embodiment 2: Based on the method for comprehensive analysis of multiple parameters of a power control board provided in the above embodiment, and based on the same technical concept, an embodiment of the present invention further provides a device for comprehensive analysis of multiple parameters of a power control board. Figure 2 A schematic diagram of a comprehensive analysis device for multiple parameters of a power control board provided by an embodiment of the present invention is shown in FIG. Figure 2shown. The device 200 for comprehensively analyzing multiple parameters of a power control board comprises: an acquisition module 201, which is used to acquire test items of a power control board to be tested and test parameter information of a historical power control board that is the same as the power control board to be tested; a determination module 202, which is used to construct test circuits corresponding to each test item, and determine the test sequence of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of electronic components in the test circuits, wherein the circuit replacement complexity between adjacent test circuits corresponding to the test items of the power control board to be tested is minimal; the determination module 202 is also used to determine a reference control board of the power control board to be tested by using the test parameter information of each test parameter of the historical power control board; the determination module 202 is also used to determine the parameter scheme to be tested of the power control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition, the first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each working condition, and the second average value of the first average value under each working condition; and a testing module 203, which is used to test the power control board to be tested by using the test sequence and the parameter scheme to be tested, and analyze the test results.

[0058] The embodiment of the present invention can analyze the complexity of circuit replacement between test circuits of the test items of the power control board to be tested, and select the sequence with the least complexity of circuit replacement between test circuits to formulate the test sequence of the power control board to be tested. Then, the test parameter information of the test parameters of many historical power control boards under various working conditions is analyzed to obtain the reference control board of the power control board to be tested, and then the consistency of the test parameter information change of the reference control board under different working conditions is combined to select the most stable parameter change process of many historical power control boards as the parameter scheme to be tested of the power control board to be tested. Finally, the power control board to be tested is tested according to the above test sequence and test scheme. Therefore, the embodiment of the present invention determines the test sequence and test parameters applicable to the power control board to be tested according to the test circuit of the power control board to be tested and the test parameter information of the same historical power control board, thereby improving the accuracy and authenticity of the test result of the power control board, so as to reflect the actual state of the power control board.

[0059] Embodiment three: Corresponding to the comprehensive analysis method of multiple parameters of a power control board provided in the above embodiment, based on the same technical concept, an embodiment of the present invention further provides a comprehensive analysis system of multiple parameters of a power control board, and the comprehensive analysis system of multiple parameters of a power control board is used to execute the comprehensive analysis method of multiple parameters of a power control board provided in the above embodiment. Figure 3 A schematic diagram of a comprehensive analysis system for multiple parameters of a power control board provided by another embodiment of the present invention is shown in FIG. Figure 3The power control board multiple parameter comprehensive analysis system may have relatively large differences due to different configurations or performances, and may include one or more processors 301 and memory 302, the memory 302 is used to store computer programs that can be run on the processor 301, and the processor 301 is used to execute the program stored in the memory 302 to achieve the above Figure 1 The memory 302 may be a temporary storage or a permanent storage. The application stored in the memory 302 may include one or more modules (not shown in the figure), each of which may include a series of computer executable instructions in the system for comprehensive analysis of multiple parameters of the power control board.

[0060] Furthermore, the processor 301 can be configured to communicate with the memory 302, and execute a series of computer executable instructions in the memory 302 on the power control board multiple parameter comprehensive analysis system. The power control board multiple parameter comprehensive analysis system can also include one or more power supplies 303, one or more wired or wireless network interfaces 304, one or more input and output interfaces 305, and one or more keyboards 306.

[0061] Specifically in this embodiment, the power control board multiple parameter comprehensive analysis system includes a processor, a communication interface, a memory and a communication bus; wherein the processor, the communication interface and the memory communicate with each other through the bus; the memory is used to store computer programs; the processor is used to execute the programs stored in the memory to achieve the above Figure 1 The various steps in the method embodiment are similar to those in the method embodiment, and have the beneficial effects of the above method embodiments. To avoid repetition, the embodiments of the present invention will not be described in detail here.

[0062] It should be noted that the power control board multiple parameter comprehensive analysis system provided in the embodiment of the present invention and the power control board multiple parameter comprehensive analysis method provided in the embodiment of the present invention are based on the same application concept. Therefore, the specific implementation of this embodiment can refer to the implementation of the aforementioned power control board multiple parameter comprehensive analysis method, and has the same or similar beneficial effects, and the repeated parts will not be repeated.

[0063] It should be noted that the sequence of the above embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0064] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

Claims

1. A comprehensive analysis method for multiple parameters of a power control board, characterized in that: The method for comprehensive analysis of multiple parameters of the power control board includes: Acquire test items of the power control board to be tested and test parameter information of the same historical power control board as the power control board to be tested; Constructing test circuits corresponding to the test items, and determining the test order of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of the electronic components in the test circuits, wherein the circuit replacement complexity between adjacent test circuits corresponding to the test items of the power control board to be tested is minimal; Determine a reference control board of the power control board to be tested by using the test parameter information of each test parameter of the historical power control board; Determine the parameter scheme for the power control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition, the first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each working condition, and the second average value of the first average value under each working condition; The power control board to be tested is tested using the test sequence and the test parameter scheme, and the test results are analyzed.

2. The method for comprehensive analysis of multiple parameters of a power control board according to claim 1, characterized in that: The method of determining the test sequence of the test circuits corresponding to the test items of the power control board to be tested according to the types and quantities of the electronic components in the two-by-two test circuits includes: Determine the circuit replacement complexity of switching from one test circuit to another test circuit according to the types and quantities of electronic components in the two test circuits, and determine the two test circuits whose circuit replacement complexity is less than or equal to a first threshold as continuous circuits; The test sequence of the test circuits corresponding to the test items of the power control board to be tested is determined according to the circuit replacement complexity.

3. The method for comprehensive analysis of multiple parameters of a power control board according to claim 2, characterized in that: Determining the complexity of circuit replacement from one test circuit to another test circuit according to the types and quantities of electronic components in the two test circuits comprises: Determining a first number of electronic components of different types in the pairwise test circuits, a second number of total electronic components in one of the pairwise test circuits, and a third number of total electronic components in the other test circuit; determining a maximum value from the second number and the third number; calculating a first ratio between the first number and the maximum value, and a first difference between a predetermined value and the first ratio; The first difference is normalized to obtain the circuit replacement complexity.

4. The method for comprehensive analysis of multiple parameters of a power control board according to claim 2, characterized in that: The step of determining the test sequence of the test circuits corresponding to the test items of the power control board to be tested according to the circuit replacement complexity comprises: randomly selecting a test circuit as a first test circuit; Select a continuous circuit with the smallest circuit replacement complexity compared with the first test circuit as the second test circuit, select a continuous circuit with the smallest circuit replacement complexity compared with the second test circuit as the third test circuit, and repeat the above process until the test circuits corresponding to all test items of the power control board to be tested are arranged, and obtain the test order of the test circuits corresponding to the test items of the power control board to be tested.

5. The method for comprehensive analysis of multiple parameters of a power control board according to any one of claims 1 to 4, characterized in that: The method of determining the reference control board of the power control board to be tested by using the test parameter information of each test parameter of the historical power control board comprises: Determining possible normal parameter values ​​of the historical power control board using the test parameter information of the historical power control board; Calculating an absolute value of a second difference between the possible normal parameter value and the test parameter information, and normalizing the absolute value of the second difference to obtain a parameter normality index of the historical power supply control board; Calculating an average parameter index of the parameter normality indexes of each test parameter of the historical power control board, and using the average parameter index as the test normality index of the historical power control board; The historical power control board whose test normal index is greater than or equal to the second threshold is used as a reference control board for the power control board to be tested.

6. The method for comprehensive analysis of multiple parameters of a power control board according to any one of claims 1 to 4, characterized in that: The scheme for determining the tested parameters of the power control board to be tested according to the standard deviation of the test parameter information of each test parameter of each reference control board under each working condition, the first average value corresponding to the standard deviation of the parameter value of each test parameter of each reference control board under each working condition, and the second average value of the first average value under each working condition comprises: Determining the second average value as a feedback difference factor of the working conditions of each of the reference control panels under the test parameter scheme; Determining the feedback consistency index of each of the reference control panels in response to the test parameter scheme using the feedback difference factor; A test parameter scheme in which the feedback consistency index is greater than or equal to a third threshold is selected as the test parameter scheme of the power supply control board to be tested.

7. The method for comprehensive analysis of multiple parameters of a power control board according to claim 6, characterized in that: The method of using the feedback difference factor to determine the feedback consistency index of each reference control board in response to the test parameter scheme includes: The feedback difference factor is normalized using an inverse proportional normalization function to obtain a feedback consistency index of each reference control board for the test parameter scheme.

8. The method for comprehensive analysis of multiple parameters of a power control board according to claim 1, characterized in that: The step of testing the power control board to be tested by using the test sequence and the test parameter scheme, and analyzing the test results includes: Determine a standard fixture according to application information of electronic components in a historical test circuit of a historical power control board, wherein the standard fixture is used to place the power control board to be tested; Selecting the corresponding test circuits and the parameter schemes to be tested in sequence according to the test sequence to test the power control board to be tested placed on the standard fixture; The test results are input into a trained neural network for analysis to obtain analysis results of the power control board to be tested.

9. The method for comprehensive analysis of multiple parameters of a power control board according to claim 8, characterized in that: The method of determining the standard fixture according to the application information of the electronic components in the historical test circuit of the historical power supply control board comprises: determining a component quantity of electronic components used in the historical test circuit and a total quantity of the historical test circuit; Determine a second ratio between the number of components and the total number as a usage rate of the electronic components, and select the electronic components whose usage rates exceed a fourth threshold as target electronic components; pass The layout algorithm determines the position coordinates of the target electronic component in the standard fixture in combination with the connection information of the target electronic component in the historical test circuit, and the corresponding position coordinates in the standard fixture are used to place the corresponding target electronic component.

10. A comprehensive analysis system for multiple parameters of a power control board, characterized in that: include: A processor and a memory; wherein the memory is used to store a computer program that can be run on the processor; The processor is used to execute the program stored in the memory to implement the steps of the method for comprehensive analysis of multiple parameters of a power control board as described in any one of claims 1 to 9.

Images