Test tool structure of magnetron filament
By designing a magnetron filament testing tooling structure with integrated automation, positioning, infrared sensing, monitoring and buffering design, the problems of low testing efficiency, poor accuracy, incomplete testing and insufficient safety in the existing technology are solved, and efficient, accurate, comprehensive and safe testing results are achieved.
Patent Information
- Application Number
- CN202411919694.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-25
- Publication Date
- 2025-04-11
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
In the prior art, the testing efficiency of magnetron filaments is low, the accuracy is poor, the testing is incomplete and the safety is insufficient, making it difficult to quickly and accurately detect the resistance value of magnetron filaments, and easily cause damage.
A test tooling structure including a test base, a support arm, a sliding groove, a touch assembly, a resistance testing unit, an indicator light, a positioning device, an infrared sensing device, a monitoring device, a push device and a conveying device are designed. This structure achieves automation, comprehensive coverage, security protection and continuity testing through automated testing, position adjustment in three-dimensional space, infrared sensing recognition, real-time monitoring of surveillance cameras and buffer design.
It improves the efficiency and accuracy of magnetron filament testing, ensures the comprehensiveness and safety of the test, realizes automation and continuous testing, and reduces the difficulty of manual intervention and operation.
Smart Images

Figure CN119804984A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of magnetrons, and in particular to a testing fixture structure for a magnetron filament. Background Art
[0002] As the core component of microwave equipment, the performance of magnetron directly affects the operating efficiency and stability of the entire equipment. As an important component of magnetron, the accuracy and stability of the resistance value of magnetron filament is crucial to the normal operation of magnetron. However, in the production and maintenance process of magnetron filament, how to quickly and accurately detect its resistance value has always been a technical problem.
[0003] Traditionally, the testing of magnetron filaments mainly relies on manual operation, and tests are performed one by one through tools such as multimeters. This method is not only inefficient, but also easily affected by human factors, resulting in inaccurate test results. At the same time, due to the complex and delicate structure of the magnetron filament, the slightest carelessness during the test may cause damage, further increasing the difficulty and cost of the test.
[0004] With the continuous development of automation technology, people have begun to try to apply automation technology to the testing of magnetron filaments. However, the existing automated testing tools can only test the fixed position of the magnetron filament and cannot fully cover the different parts of the filament, resulting in limitations in the test results. In addition, the design of existing testing tools often lacks sufficient safety protection measures, which can easily cause damage to the magnetron filament during the test process.
[0005] Therefore, it is necessary to develop a new magnetron filament test fixture structure to solve the problems of low test efficiency, poor accuracy, incomplete testing and insufficient safety in the prior art. This new test fixture structure has the functions of automated testing, comprehensive coverage, flexible adjustment and safety protection to meet the actual needs of magnetron filament production and maintenance. Summary of the invention
[0006] The present invention provides a test fixture structure for a magnetron filament, comprising: a test base and a support arm arranged on the test base, wherein the test base comprises a test cavity slot having an opening opened upward, and a test device and a positioning device are arranged in the test base; wherein the test device comprises a sliding slot arranged at one end of the test cavity slot close to the opening, a first touch component and a second touch component which can be driven to slide in the sliding slot, and a resistance test unit electrically connecting the first touch component and the second touch component, and an indicator light electrically connecting the resistance test unit is arranged on the support arm.
[0007] Furthermore, the positioning device includes a lifting device arranged at the bottom of the test cavity and a rotating device arranged on the lifting device, and an infrared sensing device arranged on the inner wall of the test cavity, and the infrared sensing device is located below the sliding groove.
[0008] Furthermore, a monitoring device is arranged on the support arm, and the monitoring device is arranged on a camera on the support arm facing the test cavity.
[0009] Furthermore, the first touch assembly includes a first driving rod and a first front supporting rod elastically abutting the first driving rod, a first battery core is arranged in the first front supporting rod, the first battery core is fixedly connected to the first front supporting rod and movably passes through the first driving rod, and a first fixing ring is fixedly connected to one end of the first battery core passing through the first driving rod, wherein a first buffer is arranged between the first driving rod and the first front supporting rod.
[0010] Furthermore, the second touch assembly includes a second driving rod and a second front supporting rod elastically abutting the second driving rod, a second battery core is arranged in the second front supporting rod, the second battery core is fixedly connected to the second front supporting rod and movably passes through the second driving rod, and a second fixing ring is fixedly connected to the two ends of the second battery core passing through the second driving rod, wherein a second buffer is arranged between the second driving rod and the second front supporting rod.
[0011] Furthermore, a driving device is connected to both the first driving rod and the second driving rod. The driving device includes a transmission rod and a movable block threadedly connected to the transmission rod. The movable block is used to fix the first driving rod or the second driving rod.
[0012] Furthermore, a pushing device is provided on the support arm for pushing the magnetron filament after detection away from the test base.
[0013] Furthermore, it also includes a conveying device, which includes a conveyor belt and a pushing device. The conveyor belt is used to transport the magnetron filament. The pushing device is arranged at a position corresponding to the pushing device, wherein the pushing device pushes the magnetron filament that has been inspected onto the conveyor belt and transfers it through the conveyor belt, and the pushing device pushes the magnetron filament that has not been inspected and is transported by the conveyor belt to the corresponding lifting device position onto the lifting device.
[0014] Furthermore, an inclined surface is provided at the opening.
[0015] The beneficial effects of the present invention are:
[0016] The present invention can automatically detect the resistance value of the magnetron filament by arranging the first touch component and the second touch component in the sliding groove in cooperation with the resistance testing unit, and instantly display the test result through the indicator light, thereby greatly improving the test efficiency and accuracy;
[0017] The positioning device includes a lifting device and a rotating device, so that the position of the magnetron filament can be adjusted in three dimensions in the test chamber, ensuring that different parts of the filament can be accurately contacted during the test, thereby improving the comprehensiveness and accuracy of the test;
[0018] The setting of infrared sensing device can intelligently identify the position of magnetron filament to ensure the correct alignment of filament during the test;
[0019] The monitoring device monitors the test process in real time through a camera, making it easy to record and trace test data, ensuring the transparency and traceability of the test process;
[0020] The buffer design in the first touch assembly and the second touch assembly can provide safety protection during the test to avoid damage to the magnetron filament due to excessive test force, thus ensuring the reliability and safety of the test;
[0021] The driving device realizes precise movement of the first driving rod and the second driving rod. Cooperating with the ejection device and the conveying device, the feeding, testing and sending out of the magnetron filament can be completed automatically, thus realizing the continuity and automation of the test. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:
[0023] Figure 1 It is a schematic diagram of the test fixture structure of the magnetron filament;
[0024] Figure 2 Schematic diagram of the test base and support arm;
[0025] Figure 3 for Figure 2 Another schematic diagram of;
[0026] Figure 4 is a cross-sectional view of the test base;
[0027] Figure 5 A cross-sectional view of the test base and support arm;
[0028] Figure 6 for Figure 4 The enlarged schematic diagram of point A in the middle;
[0029] Figure 7 for Figure 4 A magnified schematic diagram of point B in the middle.
[0030] In the figure: a test base (1); a test cavity (11); an opening (12); an inclined surface (121); a support arm (2); a push-out device (21); a test device (3); a sliding groove (301); a first contact assembly (31); a first drive rod (311); a first front push rod (312); a first battery core (313); a first fixing ring (314); a first buffer (315); a second contact assembly (32); a second drive rod (321); a second front push rod ( 322); a second battery core (323); a second fixing ring (324); a second buffer (325); a resistance test unit (33); an indicator light (34); a driving device (35); a transmission rod (351); a movable block (352); a positioning device (40); a lifting device (41); a rotating device (42); an infrared sensing device (43); a monitoring device (5); a camera (51); a conveying device (6); a conveyor belt (61); and a pushing device (611). DETAILED DESCRIPTION
[0031] The technical solution of the present invention will be described below in conjunction with the accompanying drawings of the present invention, but the described embodiments are only part of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present invention.
[0032] like Figures 1 to 7 As shown, the present invention provides a test fixture structure for a magnetron filament, comprising a test base 1 and a support arm 2 arranged on the test base 1, wherein the test base 1 comprises a test cavity 11, wherein the test cavity 11 has an opening 12 opened upward, and a test device 3 and a positioning device 40 are arranged in the test base 1;
[0033] Among them, the testing device 3 includes a sliding groove 301 arranged at one end of the test cavity groove 11 close to the opening 12, a first touch component 31 and a second touch component 32 that can be driven to slide in the sliding groove 301, and a resistance testing unit 33 electrically connecting the first touch component 31 and the second touch component 32, and an indicator light 34 electrically connected to the resistance testing unit 33 is arranged on the support arm 2.
[0034] Specifically, the test base, as the core support structure of the entire test fixture, provides a stable and easy-to-operate test environment. The design of the test cavity allows the installation and positioning of the magnetron filament. At the same time, the upward opening design facilitates the operator to install and remove the filament from above, improving work efficiency.
[0035] The support arm is not only used to support various components in the test device, such as the resistance test unit and indicator light, but also has other auxiliary equipment such as monitoring devices attached. The support arm can also be set as an adjustable structure to facilitate adjustment of the angle and position to meet different test requirements.
[0036] In this embodiment, the test device includes a sliding groove, a first touch component, a second touch component and a resistance testing unit. The sliding groove is arranged at one end of the test cavity groove close to the opening, and the first touch component and the second touch component can be driven to slide in the sliding groove and respectively contact the two ends of the magnetron filament. The resistance testing unit electrically connects the first touch component and the second touch component to measure the resistance value of the magnetron filament. The sliding groove enables the first touch component and the second touch component to move along a predetermined trajectory and accurately contact the two ends of the magnetron filament for resistance testing. The design of the driving rod and the front support rod in the first touch component and the second touch component, as well as the combination of the battery core and the fixing ring, not only ensures the stability of the contact, but also increases the adaptability of the test through elastic design, thereby avoiding test errors caused by poor contact.
[0037] like Figure 1 , Figure 2 and Figure 5 As shown, in this embodiment, the positioning device 40 includes a lifting device 41 arranged at the bottom of the test cavity slot 11 and a rotating device 42 arranged on the lifting device 41, and an infrared sensing device 43 arranged on the inner wall of the test cavity slot 11, and the infrared sensing device 43 is located below the sliding slot 301.
[0038] like Figure 3 and Figure 5 As shown, in this embodiment, a monitoring device 5 is provided on the support arm 2 , and the monitoring device 5 is provided on the support arm 2 with a camera 51 facing the test cavity 11 .
[0039] Specifically, a camera is installed on the support arm, which can monitor the situation in the test chamber in real time and detect whether the magnetron filament has been correctly placed in the test position. At the same time, it is convenient for the operator to remotely monitor the test process, discover and solve problems in time, and improve the efficiency and safety of the test.
[0040] The positioning device includes a lifting device, a rotating device and an infrared sensing device. The lifting device is used to adjust the height of the magnetron filament in the test cavity, the rotating device is used to adjust the angle of the magnetron filament, the infrared sensing device is used to detect whether the magnetron filament has been correctly placed at the test height, and the monitoring device is used to detect whether the magnetron filament has been correctly placed at the test position.
[0041] The positioning device realizes the precise vertical positioning of the magnetron filament through the lifting device and the infrared sensing device, while the rotating device and the monitoring device are responsible for the angle adjustment on the horizontal plane. This design can fully cover magnetron filaments of different sizes and types, improving the versatility and flexibility of the test. The infrared sensing device is located below the sliding slot to monitor whether the magnetron filament has been correctly placed in the test position, ensuring the safety and accuracy of the test process.
[0042] like Figure 2 , Figure 4 and Figure 6 As shown, in this embodiment, the first touch component 31 includes a first driving rod 311 and a first front supporting rod 312 elastically abutting the first driving rod 311, and a first battery core 313 is arranged in the first front supporting rod 312. The first battery core 313 is fixedly connected to the first front supporting rod 312 and movably passes through the first driving rod 311. A first fixing ring 314 is fixedly connected to one end of the first battery core 313 passing through the first driving rod 311, wherein a first buffer 315 is arranged between the first driving rod 311 and the first front supporting rod 312.
[0043] Specifically, the first contact assembly includes a first driving rod, a first front push rod and a first battery core. The first front push rod elastically pushes against the first driving rod, and the battery core is fixedly connected to the first front push rod and movably passes through the first driving rod. One end of the battery core passing through the first driving rod is fixedly connected with a first fixing ring, which is used to ensure a stable connection between the battery core and the first driving rod.
[0044] like Figure 2 , Figure 4 and Figure 7 As shown, in this embodiment, the second touch component 32 includes a second driving rod 321 and a second front supporting rod 322 elastically supporting the second driving rod 321, and a second battery component 323 is arranged in the second front supporting rod 322. The second battery component 323 is fixedly connected to the second front supporting rod 322 and movably passes through the second driving rod 321. A second fixing ring 324 is fixedly connected to the two ends of the second battery component 323 passing through the second driving rod 321, wherein a second buffer component 325 is arranged between the second driving rod 321 and the second front supporting rod 322.
[0045] Specifically, the structure of the second touch assembly is similar to that of the first touch assembly, and includes a second driving rod, a second front push rod, and a second battery core. The second battery core is also fixedly connected to the second front push rod and movably passes through the second driving rod, and one end of the battery core passes through the second driving rod and is fixedly connected to a second fixing ring. The buffer is arranged between the first driving rod and the first front push rod, and between the second driving rod and the second front push rod, respectively, to reduce wear and error caused by mechanical impact and improve the stability and durability of the test.
[0046] like Figure 5 As shown, in this embodiment, a driving device 35 is connected to the first driving rod 311 and the second driving rod 321. The driving device 35 includes a transmission rod 351 and a movable block 352 threadedly connected to the transmission rod 351. The movable block 352 is used to fix the first driving rod 311 or the second driving rod 321.
[0047] Specifically, the driving device includes a transmission rod and a movable block, and the movable block is used to be fixedly connected to the first driving rod or the second driving rod. By rotating the transmission rod, the movable block and the first driving rod or the second driving rod connected thereto can be driven to move along the sliding groove. The driving device realizes precise control of the first driving rod and the second driving rod through the threaded connection design of the transmission rod and the movable block, simplifies the operation process, and improves the automation level of the test.
[0048] like Figures 1 to 3 ,and Figure 5 As shown, in this embodiment, a pushing device 21 is provided on the support arm 2 for pushing the magnetron filament after detection away from the test base 1 to facilitate subsequent processing and transfer.
[0049] like Figure 1 As shown, in this embodiment, it also includes a conveying device 6, which includes a conveyor belt 61 and a pushing device 611. The conveyor belt 61 is used to transport the magnetron filament. The pushing device 611 is arranged at a position corresponding to the pushing device 21, wherein the pushing device 21 pushes the magnetron filament that has been inspected onto the conveyor belt 61 and transfers it through the conveyor belt 61, and the pushing device 611 pushes the magnetron filament that has not been inspected and that has been transported by the conveyor belt 61 to the position corresponding to the lifting device 41 onto the lifting device 41.
[0050] The support arm is provided with a push-out device, which is used to push the magnetron filament that has been tested away from the test base. The conveying device includes a conveyor belt and a push-out device. The conveyor belt is used to transport the magnetron filament, and the push-out device is arranged at a position corresponding to the push-out device. The push-out device pushes the magnetron filament that has been tested to the conveyor belt and transfers it through the conveyor belt. At the same time, the push-out device pushes the magnetron filament that has not been tested and is transported by the conveyor belt to the corresponding lifting device position onto the lifting device, thereby realizing an automated test process.
[0051] The ejection device realizes the automatic removal of the magnetron filament after the test is completed, while the conveying device is responsible for quickly and safely transferring the magnetron filament from the test area to the next process, which not only improves production efficiency but also reduces manual intervention, lowering the difficulty and cost of operation.
[0052] like Figure 2 As shown, in this embodiment, an inclined surface 121 is provided in the opening 12 .
[0053] The present invention also provides a method for testing a magnetron filament, which requires the use of the above-mentioned magnetron filament testing fixture structure, and the steps are:
[0054] S1. Push the magnetron filament to be tested on the conveyor belt of the pushing device to the lifting device raised in the test cavity, and adjust the lifting device and the rotating device to align them with the first touch component and the second touch component.
[0055] S2. Start the test device to drive the first touch component and the second touch component to contact the two ends of the magnetron filament.
[0056] S3. The resistance test unit measures the resistance value of the magnetron filament and displays the result on the indicator light on the support arm.
[0057] S4. Determine whether the performance of the magnetron filament is qualified based on the display of the indicator light.
[0058] S5. After the test is completed, the ejection device is started to push the magnetron filament away from the test base and transfer it through the conveying device.
[0059] S6. Repeat the above steps to carry out the next round of testing.
[0060] The present invention has many usage scenarios, including but not limited to the following description scenarios: on the production line of magnetron filaments, the test tooling structure can be used as an important part of the quality inspection link, and is used to perform batch and rapid resistance tests on the produced magnetron filaments to ensure that the product quality meets the standards; in the maintenance and inspection center of magnetrons, the test tooling structure can be used to perform resistance tests on the filaments of faulty magnetrons to help maintenance personnel quickly locate the problem and improve maintenance efficiency; in scientific research institutions and laboratories, the test tooling structure can be used to conduct in-depth research and analysis on the performance of magnetron filaments to provide data support for the optimal design of magnetrons; in electronic product inspection centers, the test tooling structure can be used to perform quality inspection on electronic products containing magnetrons to ensure that the performance of the magnetron filaments in the products meets the design requirements and improve the overall quality of the products.
Claims
1. A magnetron filament testing fixture structure, characterized in that: include: A test base (1) and a support arm (2) arranged on the test base (1), the test base (1) comprising a test cavity (11), the test cavity (11) having an opening (12) opened upwards, and a test device (3) and a positioning device (40) being arranged in the test base (1); The test device (3) comprises a sliding groove (301) arranged at one end of the test cavity groove (11) close to the opening (12), a first touch component (31) and a second touch component (32) that can be driven to slide in the sliding groove (301), and a resistance test unit (33) electrically connected to the first touch component (31) and the second touch component (32), and an indicator light (34) electrically connected to the resistance test unit (33) is arranged on the support arm (2).
2. The magnetron filament testing fixture structure according to claim 1, characterized in that: The positioning device (40) comprises a lifting device (41) arranged at the bottom of the test cavity slot (11), a rotating device (42) arranged on the lifting device (41), and an infrared sensing device (43) arranged on the inner wall of the test cavity slot (11), wherein the infrared sensing device (43) is located below the sliding slot (301).
3. The magnetron filament testing fixture structure according to claim 2, characterized in that: A monitoring device (5) is arranged on the support arm (2); the monitoring device (5) is arranged on a camera (51) on the support arm (2) facing the test cavity (11).
4. The magnetron filament testing fixture structure according to claim 3, characterized in that: The first contact assembly (31) comprises a first driving rod (311) and a first front supporting rod (312) elastically supporting the first driving rod (311); a first battery core (313) is arranged in the first front supporting rod (312); the first battery core (313) is fixedly connected to the first front supporting rod (312) and movably passes through the first driving rod (311); a first fixing ring (314) is fixedly connected to one end of the first battery core (313) passing through the first driving rod (311); and a first buffer (315) is arranged between the first driving rod (311) and the first front supporting rod (312).
5. The magnetron filament testing fixture structure according to claim 4, characterized in that: The second contact assembly (32) comprises a second driving rod (321) and a second front supporting rod (322) elastically supporting the second driving rod (321); a second battery core (323) is arranged in the second front supporting rod (322); the second battery core (323) is fixedly connected to the second front supporting rod (322) and movably passes through the second driving rod (321); second fixing rings (324) are fixedly connected to the two ends of the second battery core (323) passing through the second driving rod (321); and a second buffer (325) is arranged between the second driving rod (321) and the second front supporting rod (322).
6. The magnetron filament testing fixture structure according to claim 5, characterized in that: A driving device (35) is connected to both the first driving rod (311) and the second driving rod (321), and the driving device (35) comprises a transmission rod (351) and a movable block (352) threadedly connected to the transmission rod (351), and the movable block (352) is used for fixedly connecting the first driving rod (311) or the second driving rod (321).
7. The magnetron filament testing fixture structure according to claim 6, characterized in that: The support arm (2) is provided with a pushing device (21) for pushing the magnetron filament after detection away from the test base (1).
8. The magnetron filament testing fixture structure according to claim 7, characterized in that: The device also comprises a conveying device (6), wherein the conveying device (6) comprises a conveyor belt (61) and a pushing device (611), wherein the conveyor belt (61) is used to transport the magnetron filament, and the pushing device (611) is arranged at a position corresponding to the pushing device (21), wherein the pushing device (21) pushes the magnetron filament that has been inspected onto the conveyor belt (61) and transfers it via the conveyor belt (61), and the pushing device (611) pushes the magnetron filament that has not been inspected and that has been transported by the conveyor belt (61) to a position corresponding to the lifting device (41) onto the lifting device (41).
9. The magnetron filament testing fixture structure according to claim 8, characterized in that: The opening (12) is provided with an inclined surface (121).