Methods, apparatus and electronic equipment for modeling semi-steady-state arcs caused by partial insulation breakdown in cables

Abstract

This disclosure provides a method, apparatus, and electronic device for modeling semi-steady-state arcs during partial insulation breakdown in cables. The method includes: acquiring a transient oscillating arc waveform based on a periodic pulse function within the cable; acquiring a steady-state breakdown arc waveform based on an arc gap energy balance equation within the cable; calculating the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the insulation breakdown voltage of the cable; and combining the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the switching time to obtain a semi-steady-state arc waveform. The semi-steady-state arc waveform is used to describe the arc conductance at different times. This disclosure, by establishing a semi-steady-state arc model characterizing the partial insulation breakdown process of cables, overcomes the shortcomings of existing models, such as poor interpretability and difficulty in parameter tuning. This provides a theoretical basis for research on early fault warning and fault identification in cables, and is beneficial for reducing the risk of distribution network accidents and minimizing line hazards.

Description

Technical Field

[0001] This disclosure relates to the field of detection technology, and in particular to a method, apparatus and electronic equipment for modeling semi-steady-state arcs caused by partial insulation breakdown of cables. Background Technology

[0002] The main line type in urban power distribution networks is cable, and the reliable operation of cables is of great significance to the safety of urban power distribution networks. Urban power distribution networks typically use cross-linked polyethylene (XLPE) cables. XLPE cables have a multi-layered coaxial insulation structure, making them difficult to break down in a single instance after a fault occurs. This results in early-stage cable faults exhibiting intermittent and high-resistivity characteristics, and these faults develop over a long period.

[0003] Existing fault detection and protection methods are insufficient to quickly address cable faults in their early stages, leading to permanent grounding faults or even cable trench fires, which seriously affect the safe and reliable power supply of the power distribution network. Summary of the Invention

[0004] This disclosure provides a method, apparatus, and electronic device for modeling semi-steady-state arcs caused by partial insulation breakdown in cables, in order to solve the aforementioned technical problems.

[0005] According to a first aspect of this disclosure, a method for modeling a semi-steady-state arc caused by partial insulation breakdown in a cable is provided, the method comprising:

[0006] Obtain the transient oscillating arc waveform based on a periodic pulse function within the cable;

[0007] Obtain the steady-state breakdown arc waveform within the cable based on the arc gap energy balance equation;

[0008] The switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform is calculated based on the insulation breakdown voltage of the cable.

[0009] By combining the transient oscillating arc waveform and the steady-state breakdown arc waveform at the switching time, a semi-steady-state arc waveform is obtained; the semi-steady-state arc waveform is used to describe the arc conductance at different times.

[0010] Optionally, the expression for the transient oscillating arc waveform is:

[0011]

[0012] W(i)=θ[t0(i)+3σ]-θ[t0(i)-3σ];

[0013]

[0014] In the formula, G s(t) represents the transient oscillating arc waveform inside the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter, used to control the symmetric position of the oscillation; σ represents the standard deviation, used to control the width of the oscillation pulse; G0 represents the amplitude of the pulse function.

[0015] Optionally, the expression for the steady-state breakdown arc waveform is:

[0016]

[0017] In the formula, u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

[0018] Optionally, the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform is calculated based on the insulation breakdown voltage of the cable, including:

[0019] Obtain the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage;

[0020] Based on the mapping relationship between the occurrence time of the transient oscillating arc waveform and the occurrence time of the steady-state breakdown arc waveform, as well as the breakdown voltage of the local insulation defect region, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage, the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform is determined.

[0021] Optionally, the expression for the switching moment between the transient oscillating arc waveform and the steady-state breakdown arc waveform is:

[0022]

[0023] In the formula, t b Indicates the moment when the steady-state breakdown arc waveform appears; t g Indicates the moment when the transient oscillating arc waveform appears; U g U represents the breakdown voltage of a region with a localized insulation defect. b U represents the breakdown voltage of the remaining insulation layer; ω represents the angular frequency of the power system operation; U i This indicates the input voltage.

[0024] Optionally, the expression for the semi-steady-state arc waveform is:

[0025]

[0026] In the formula, G s (t) represents the transient oscillating arc waveform within the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter; u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

[0027] According to a second aspect of this disclosure, a device for modeling semi-steady-state arcs caused by partial insulation breakdown in cables is provided, the device comprising:

[0028] The transient oscillating arc waveform acquisition module is used to acquire the transient oscillating arc waveform based on the periodic pulse function within the cable;

[0029] The steady-state breakdown arc waveform acquisition module is used to acquire the steady-state breakdown arc waveform in the cable based on the arc gap energy balance equation.

[0030] The switching time determination module is used to calculate the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the insulation breakdown voltage of the cable.

[0031] A semi-steady-state arc waveform acquisition module is used to combine the transient oscillating arc waveform and the steady-state breakdown arc waveform according to the switching time to obtain a semi-steady-state arc waveform; the semi-steady-state arc waveform is used to describe the arc conductance at different times.

[0032] Optionally, the expression for the transient oscillating arc waveform is:

[0033]

[0034] W(i)=θ[t0(i)+3σ]-θ[t0(i)-3σ];

[0035]

[0036] In the formula, G s (t) represents the transient oscillating arc waveform inside the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter, used to control the symmetric position of the oscillation; σ represents the standard deviation, used to control the width of the oscillation pulse; G0 represents the amplitude of the pulse function.

[0037] Optionally, the expression for the steady-state breakdown arc waveform is:

[0038]

[0039] In the formula, u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

[0040] Optionally, the switching time determination module includes:

[0041] The parameter acquisition unit is used to acquire the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage.

[0042] The switching time acquisition unit is used to determine the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the mapping relationship between the occurrence time of the transient oscillating arc waveform and the occurrence time of the steady-state breakdown arc waveform, as well as the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage.

[0043] Optionally, the expression for the switching moment between the transient oscillating arc waveform and the steady-state breakdown arc waveform is:

[0044]

[0045] In the formula, t b Indicates the moment when the steady-state breakdown arc waveform appears; t g Indicates the moment when the transient oscillating arc waveform appears; U g U represents the breakdown voltage of a region with a localized insulation defect. b U represents the breakdown voltage of the remaining insulation layer; ω represents the angular frequency of the power system operation; U i This indicates the input voltage.

[0046] Optionally, the expression for the semi-steady-state arc waveform is:

[0047]

[0048] In the formula, G s (t) represents the transient oscillating arc waveform within the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter; u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N dτ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

[0049] According to a third aspect of this disclosure, an electronic device is provided, comprising: a processor and a memory;

[0050] The memory is used to store computer programs that can be executed by the processor;

[0051] The processor is configured to execute a computer program in the memory to implement the method as described in any of the first aspects.

[0052] According to a fourth aspect of this disclosure, a non-transitory computer-readable storage medium is provided, which, when an executable computer program in the storage medium is executed by a processor, enables the implementation of the method as described in any of the first aspects.

[0053] The technical solutions provided by the embodiments of this disclosure may include the following beneficial effects:

[0054] The semi-steady-state arc modeling method for partial insulation breakdown in cables disclosed herein first obtains a transient oscillating arc waveform based on a periodic pulse function within the cable; then, it obtains a steady-state breakdown arc waveform based on the arc gap energy balance equation within the cable; subsequently, it calculates the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the insulation breakdown voltage of the cable; finally, it combines the transient oscillating arc waveform and the steady-state breakdown arc waveform according to the switching time to obtain a semi-steady-state arc waveform; the semi-steady-state arc waveform is used to describe the arc conductance at different times. Thus, by establishing a semi-steady-state arc model characterizing the partial insulation breakdown process of cables, this disclosure overcomes the shortcomings of existing models, such as poor interpretability and difficulty in parameter tuning, thereby providing a theoretical basis for research on early fault warning and fault identification in cables, and contributing to reducing the risk of distribution network accidents and minimizing line hazards.

[0055] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0056] Figure 1 This is a flowchart illustrating a method for modeling a semi-steady-state arc caused by partial insulation breakdown in a cable, according to an embodiment of this disclosure.

[0057] Figure 2 This is a flowchart illustrating the switching moment between a transient oscillating arc waveform and a steady-state breakdown arc waveform, according to an embodiment of this disclosure.

[0058] Figure 3This is a block diagram of a semi-steady-state arc modeling device for partial insulation breakdown of a cable, according to an embodiment of this disclosure. Detailed Implementation

[0059] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numerals in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. Rather, they are merely examples of apparatuses consistent with some aspects of this disclosure as detailed in the appended claims.

[0060] To address the aforementioned technical problems, this disclosure provides a method, apparatus, and electronic device for modeling semi-steady-state arcs caused by partial insulation breakdown in cables. For a method for modeling semi-steady-state arcs caused by partial insulation breakdown in cables provided in this disclosure, see [link to relevant documentation]. Figure 1 This includes steps 11 to 14.

[0061] In step 11, the transient oscillating arc waveform based on the periodic pulse function is obtained within the cable.

[0062] In this step, the transient oscillating arc waveform based on the periodic pulse function inside the cable can be obtained, as shown in equations (1) to (3).

[0063]

[0064] W(i)=θ[t0(i)+3σ]-θ[t0(i)-3σ]; (2)

[0065]

[0066] In equations (1) to (3), G s (t) represents the transient oscillating arc waveform inside the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter, used to control the symmetric position of the oscillation; σ represents the standard deviation, used to control the width of the oscillation pulse; G0 represents the amplitude of the pulse function.

[0067] In one example, the width of the oscillating pulse is 6σ, that is, with the time delay parameter t0 as the center position, the width before and after it is 6σ.

[0068] In this example, the calculated values ​​of the transient oscillating arc waveform are shown in Table 1.

[0069] Table 1 Calculation values ​​of transient oscillating arc waveform

[0070]

[0071]

[0072] In step 12, the steady-state breakdown arc waveform based on the arc gap energy balance equation is obtained within the cable.

[0073] In this step, the steady-state breakdown arc waveform based on the arc gap energy balance equation can be obtained inside the cable, as shown in equation (4).

[0074]

[0075] In equation (4), u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

[0076] In this example, the calculated values ​​of the steady-state breakdown arc are shown in Table 2.

[0077] Table 2 Calculation values ​​of steady-state breakdown arc

[0078]

[0079]

[0080] In step 13, the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform is calculated based on the insulation breakdown voltage of the cable.

[0081] In this step, the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform can be calculated based on the insulation breakdown voltage of the cable. (See [link to relevant documentation]). Figure 2 This includes steps 21 and 22.

[0082] In step 21, the breakdown voltage U of the local insulation defect region can be obtained. g The breakdown voltage U of the remaining insulation layer b The angular frequency ω and input voltage U of the power system operation i .

[0083] In step 22, based on the mapping relationship between the occurrence time of the transient oscillating arc waveform and the occurrence time of the steady-state breakdown arc waveform, and the breakdown voltage U of the local insulation defect region... g The breakdown voltage U of the remaining insulation layer b The angular frequency ω and input voltage U of the power system operation i The switching moment between the transient oscillating arc waveform and the steady-state breakdown arc waveform is determined.

[0084] The expression for the switching moment between the transient oscillating arc waveform and the steady-state breakdown arc waveform is shown in equation (5).

[0085]

[0086] In equation (5), t b Indicates the moment when the steady-state breakdown arc waveform appears; t g Indicates the moment when the transient oscillating arc waveform appears; U g U represents the breakdown voltage of a region with a localized insulation defect. b U represents the breakdown voltage of the remaining insulation layer; ω represents the angular frequency of the power system operation; U i This indicates the input voltage.

[0087] In step 14, the transient oscillating arc waveform and the steady-state breakdown arc waveform are combined according to the switching time to obtain a semi-steady-state arc waveform; the semi-steady-state arc waveform is used to describe the arc conductance at different times.

[0088] In this step, the transient oscillating arc waveform and the steady-state breakdown arc waveform can be combined according to the switching time to obtain the semi-steady-state arc waveform. The expression of the semi-steady-state arc waveform is shown in equation (6).

[0089]

[0090] In equation (6), G s (t) represents the transient oscillating arc waveform within the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter; u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

[0091] In this example, the semi-steady-state arc waveform is shown in Table 3.

[0092] Table 3 Calculated values ​​of semi-steady-state arc waveform

[0093]

[0094] Thus, by establishing a semi-steady-state arc model that characterizes the partial insulation breakdown process of cables, this disclosure overcomes the shortcomings of existing models, such as poor interpretability and difficulty in parameter tuning. This provides a theoretical basis for the research on early fault warning and fault identification of cables, and is conducive to reducing the risk of distribution network accidents and reducing line hazards.

[0095] Based on the method for modeling semi-steady-state arcs caused by partial insulation breakdown in cables provided in this disclosure, this disclosure also provides a device for modeling semi-steady-state arcs caused by partial insulation breakdown in cables. (See attached document.) Figure 3 The device includes:

[0096] The transient oscillating arc waveform acquisition module 31 is used to acquire the transient oscillating arc waveform based on the periodic pulse function inside the cable;

[0097] The steady-state breakdown arc waveform acquisition module 32 is used to acquire the steady-state breakdown arc waveform in the cable based on the arc gap energy balance equation.

[0098] The switching time determination module 33 is used to calculate the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the insulation breakdown voltage of the cable.

[0099] The semi-steady-state arc waveform acquisition module 34 is used to combine the transient oscillating arc waveform and the steady-state breakdown arc waveform according to the switching time to obtain a semi-steady-state arc waveform; the semi-steady-state arc waveform is used to describe the arc conductance at different times.

[0100] In one embodiment, the expression for the transient oscillating arc waveform is:

[0101]

[0102] W(i)=θ[t0(i)+3σ]-θ[t0(i)-3σ];

[0103]

[0104] In the formula, G s (t) represents the transient oscillating arc waveform inside the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter, used to control the symmetric position of the oscillation; σ represents the standard deviation, used to control the width of the oscillation pulse; G0 represents the amplitude of the pulse function.

[0105] In one embodiment, the expression for the steady-state breakdown arc waveform is:

[0106]

[0107] In the formula, u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ Dσ represents the arc time constant; σ0 represents the arc volume conductivity constant.

[0108] In one embodiment, the switching time determination module includes:

[0109] The parameter acquisition unit is used to acquire the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage.

[0110] The switching time acquisition unit is used to determine the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the mapping relationship between the occurrence time of the transient oscillating arc waveform and the occurrence time of the steady-state breakdown arc waveform, as well as the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage.

[0111] In one embodiment, the expression for the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform is:

[0112]

[0113] In the formula, t b Indicates the moment when the steady-state breakdown arc waveform appears; t g Indicates the moment when the transient oscillating arc waveform appears; U g U represents the breakdown voltage of a region with a localized insulation defect. b U represents the breakdown voltage of the remaining insulation layer; ω represents the angular frequency of the power system operation; U i This indicates the input voltage.

[0114] In one embodiment, the expression for the semi-steady-state arc waveform is:

[0115]

[0116] In the formula, G s (t) represents the transient oscillating arc waveform within the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter; u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

[0117] It should be noted that the device embodiments of this disclosure have already been described in the system embodiments of the cable partial insulation breakdown semi-steady-state arc modeling system, and the details can be found in the above embodiments, which will not be repeated here.

[0118] In some possible embodiments, an electronic device is provided, including a processor and a memory;

[0119] The memory is used to store computer programs that can be executed by the processor;

[0120] The processor is used to execute the computer program in the memory to implement the method as described above.

[0121] In some possible embodiments, a non-transitory computer-readable storage medium is provided, which, when executed by a processor, enables the implementation of the semi-steady-state arc modeling method for partial insulation breakdown of cables as described above.

[0122] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the disclosure herein. This disclosure is intended to cover any variations, uses, or adaptations that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the following claims.

[0123] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A method for modeling semi-steady-state arcs caused by partial insulation breakdown in cables, characterized in that, The method includes: Obtain the transient oscillating arc waveform based on a periodic pulse function within the cable; Obtain the steady-state breakdown arc waveform within the cable based on the arc gap energy balance equation; The switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform is calculated based on the insulation breakdown voltage of the cable. By combining the transient oscillating arc waveform and the steady-state breakdown arc waveform at the switching time, a semi-steady-state arc waveform is obtained; the semi-steady-state arc waveform is used to describe the arc conductance at different times. The switching moments between the transient oscillating arc waveform and the steady-state breakdown arc waveform are calculated based on the insulation breakdown voltage of the cable, including: Obtain the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage; Based on the mapping relationship between the occurrence time of the transient oscillating arc waveform and the occurrence time of the steady-state breakdown arc waveform, as well as the breakdown voltage of the local insulation defect region, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage, the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform is determined. The expression for the switching moment between the transient oscillating arc waveform and the steady-state breakdown arc waveform is: In the formula, t b Indicates the moment when the steady-state breakdown arc waveform appears; t g Indicates the moment when the transient oscillating arc waveform appears; U g U represents the breakdown voltage of a region with a localized insulation defect. b U represents the breakdown voltage of the remaining insulation layer; ω represents the angular frequency of the power system operation; U i This indicates the input voltage.

2. The method according to claim 1, characterized in that, The expression for the transient oscillating arc waveform is: W(i)=θ[t0(i)+3σ]-θ[t0(i)-3σ]; In the formula, G s (t) represents the transient oscillating arc waveform inside the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter, used to control the symmetric position of the oscillation; σ represents the standard deviation, used to control the width of the oscillation pulse; G0 represents the amplitude of the pulse function.

3. The method according to claim 1, characterized in that, The expression for the steady-state breakdown arc waveform is: In the formula, u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

4. The method according to claim 1, characterized in that, The expression for the semi-steady-state arc waveform is: In the formula, G s (t) represents the transient oscillating arc waveform within the cable; W(i) represents the rectangular window function; G[t0(i)] represents the pulse function; i represents the number of the rectangular window function, with a value range of [1, n]; t represents the time corresponding to the pulse function; t0 represents the time delay parameter; u represents the arc voltage; i represents the arc current; g represents the arc conductance; D represents the arc channel diameter; N d τ represents the heat dissipation constant of the electric arc region; l represents the arc length of the electric arc; τ D σ represents the arc time constant; σ0 represents the arc volume conductivity constant.

5. A device for modeling semi-steady-state arcs caused by partial insulation breakdown in cables, characterized in that, The device includes: The transient oscillating arc waveform acquisition module is used to acquire the transient oscillating arc waveform based on the periodic pulse function within the cable; The steady-state breakdown arc waveform acquisition module is used to acquire the steady-state breakdown arc waveform in the cable based on the arc gap energy balance equation. The switching time determination module is used to calculate the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the insulation breakdown voltage of the cable. A semi-steady-state arc waveform acquisition module is used to combine the transient oscillating arc waveform and the steady-state breakdown arc waveform according to the switching time to obtain a semi-steady-state arc waveform; the semi-steady-state arc waveform is used to describe the arc conductance at different times; The switching time determination module includes: The parameter acquisition unit is used to acquire the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage. The switching time acquisition unit is used to determine the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the mapping relationship between the occurrence time of the transient oscillating arc waveform and the occurrence time of the steady-state breakdown arc waveform, as well as the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage. Optionally, the expression for the switching moment between the transient oscillating arc waveform and the steady-state breakdown arc waveform is: In the formula, t b Indicates the moment when the steady-state breakdown arc waveform appears; t g Indicates the moment when the transient oscillating arc waveform appears; U g U represents the breakdown voltage of a region with a localized insulation defect. b U represents the breakdown voltage of the remaining insulation layer; ω represents the angular frequency of the power system operation; U i This indicates the input voltage.

6. The apparatus according to claim 5, characterized in that, The switching time determination module includes: The parameter acquisition unit is used to acquire the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage. The switching time acquisition unit is used to determine the switching time between the transient oscillating arc waveform and the steady-state breakdown arc waveform based on the mapping relationship between the occurrence time of the transient oscillating arc waveform and the occurrence time of the steady-state breakdown arc waveform, as well as the breakdown voltage of the local insulation defect area, the breakdown voltage of the remaining insulation layer, the angular frequency of the power system operation, and the input voltage.

7. An electronic device, characterized in that, Including processor and memory; The memory is used to store computer programs that can be executed by the processor; The processor is configured to execute a computer program in the memory to implement the method as described in any one of claims 1 to 4.

8. A non-transitory computer-readable storage medium, characterized in that, When the executable computer program in the storage medium is executed by a processor, it can implement the method as described in any one of claims 1 to 4.

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