Field in-situ calibration method and device for non-contact blade vibration measurement equipment
By generating pulse waveforms and modulating laser light sources on the on-site calibration device of the non-contact blade vibration measurement equipment, the problem of difficulty in on-site calibration of the equipment is solved, high-fidelity calibration and error assessment are achieved, and measurement accuracy and accuracy are improved.
Patent Information
- Application Number
- CN202510317237.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-18
- Publication Date
- 2025-04-15
- Estimated Expiration
- 2045-03-18
AI Technical Summary
Existing non-contact blade vibration measurement equipment is difficult to calibrate in situ on site, resulting in the inability to accurately evaluate the measurement accuracy and fail to meet the testing requirements.
When the non-contact blade vibration measurement equipment is installed on site, the on-site in-situ calibration device is used to generate the pulse waveform of the rotating blade swept through the sensor, modulate the semiconductor laser light source, input it into the sensor transmitting optical fiber, reflect it back to the receiving optical fiber, and perform signal processing to obtain the output amplitude, frequency and other parameters, so as to realize the on-situ calibration of the equipment.
It realizes high-fidelity calibration and error assessment in situ, no need to disassemble and assemble the equipment, and is convenient to operate. It can be calibrated in one go, and the equipment can be detected comprehensive performance indicators, improving measurement accuracy and accuracy.
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Figure CN119826950A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of non-contact blade vibration testing, and in particular relates to an on-site in-situ calibration method and device for non-contact blade vibration measuring equipment. Background Art
[0002] Rotating rotor blades are the core working elements of major equipment such as aircraft engines, gas turbines, and steam turbines. Their health status directly determines the safety and efficiency of equipment operation. Blade vibration is the most direct reflection of the blade health status, so non-contact vibration measurement of the blades is crucial.
[0003] At present, non-contact blade vibration measurement equipment based on the blade tip timing principle has been widely used to realize online monitoring of all blade vibrations. Among them, the sensor in the non-contact blade vibration measurement equipment is mainly a Y-type light intensity reflection fiber optic sensor, that is, a fiber bundle composed of 1 transmitting fiber and 6 or more receiving fibers. The basic principle is that the transmitting fiber projects the laser light source (stable laser light intensity) to the direction of the blade tip. When the blade sweeps over the sensor probe, the reflected light from the blade tip is received by the receiving fiber around the transmitting fiber, and the returned light is converted into voltage through photoelectric conversion, that is, the blade sweeps once, and the device receives a pulse voltage signal. The pulse voltage signal carries the blade vibration information, especially the advance or delay of the pulse arrival time, which reflects the blade vibration displacement. The non-contact blade vibration measurement equipment obtains the blade vibration amplitude, frequency, etc. through algorithm analysis based on the arrival time data of multiple sensors.
[0004] However, the blade vibration measurement equipment based on the blade tip timing principle currently lacks a complete calibration method, and it is impossible to prove the measurement accuracy of the equipment through metrological verification to meet the test requirements. The existing method is to make the equipment and strain gauges measure the test blades in a rotating state in the laboratory at the same time, and verify the accuracy of the equipment by comparison. However, the use of this method is limited. The shortcomings are: (1) The strain gauge and the equipment are at different measurement positions, resulting in measurement errors, and there are unknown system errors when used to calibrate the measurement accuracy of the equipment; (2) The test blades need to be specially designed, and the test cycle is long; (3) When conducting comparative tests in the laboratory, there are certain differences in the working environment, installation layout and connection of sensors and other parts of the equipment compared with field tests.
[0005] In addition, the on-site working environment is complex, the installation of sensor measuring points on the casing is time-consuming and laborious, and the distance between the measuring points and other parts of the equipment is usually far, requiring a long optical and electrical signal transmission. Therefore, if the equipment can be calibrated under on-site conditions after the equipment has been integrated and installed, a more accurate and real measurement accuracy (uncertainty) can be obtained, which can be used to evaluate whether the equipment meets the test requirements and the quality of the test data.
[0006] Therefore, how to realize on-site in-situ calibration of non-contact blade vibration measurement equipment and determine the measurement accuracy of the installed non-contact blade vibration measurement equipment is an urgent problem to be solved by those skilled in the art. Summary of the invention
[0007] The purpose of the present invention is to propose an on-site in-situ calibration method and device for a non-contact blade vibration measuring device, so as to solve the problem that the current non-contact blade vibration measuring device is difficult to calibrate on-site in-situ. On the premise that the non-contact blade vibration measuring device is installed on-site and remains unchanged, an on-site in-situ calibration device is used to generate a rotating blade sweeping sensor pulse waveform, modulate a semiconductor laser light source, input it into the sensor transmitting optical fiber, emit it to the tip of the stationary blade and then reflect it back to the receiving optical fiber, and the signal is processed to obtain output parameters such as amplitude and frequency, which are compared with the input values to achieve on-site in-situ calibration of the non-contact blade vibration measuring device.
[0008] On the one hand, to achieve the above-mentioned purpose, the present invention provides an on-site in-situ calibration method of a non-contact blade vibration measurement device, comprising the following steps: S1. Obtain a voltage-time lookup table file according to vibration parameter information; S2. Acquire an optical pulse signal simulating blade rotation according to the voltage-time lookup table file; S3. Obtaining an on-site in-situ calibration result of a non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information.
[0009] Optionally, obtaining a voltage-time lookup table file according to vibration parameter information includes: Get vibration parameter information; Acquiring blade vibration parameter information according to the vibration parameter information; Acquire a central time series according to the blade vibration parameter information; Based on the central time series, segmentation is performed using signal waveform characteristics to obtain time segmentation points; Obtaining a function analytical expression according to the time segmentation point; Acquire the voltage-time lookup table file according to the function analytical expression and the time division point; The signal waveform of the blade sweeping across the sensor probe is obtained as the signal waveform feature.
[0010] Optionally, the vibration parameter information includes blade vibration parameter information and field test information; Among them, the blade vibration parameter information includes blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed and blade tip linear velocity, and the field test information includes the number of blades, blade tip diameter, light spot diameter, sensor working distance and sensor installation angle.
[0011] Optionally, the function parsing expression includes 0- t a Segment function parsing expression, t a - t b Segment function parsing expression, t b - t c Segment function parsing expression and t c - t d Segment function parsing expressions; The 0- t a The segment function analysis expression is:
[0012] Said t a - t b The segment function analysis expression is:
[0013] Said t b - t c The segment function analysis expression is:
[0014] Said t c - t d The segment function analysis expression is:
[0015] in, t a for a The time division point of the moment, t b for b The time division point of the moment, t c for c The time division point of the moment, t d for d The time division point of the moment, F 1( t ) is 0- t a Segment function parsing expression, L1 is a fixed value, indicating no light or weak light reception return. F 2( t )for t a - t b Segment function parsing expression, L 2 is the voltage at the maximum received light intensity at the sensor working distance, w 1 for t a - t b The standard deviation of the segment function, t For time, F 3( t )for t b - t c Segment function parsing expression, w 2 for t c - t d The standard deviation of the segment function, F 4( t )for t c - t d Segment functions parse expressions.
[0016] Optionally, obtaining the optical pulse signal simulating blade rotation according to the voltage-time lookup table file includes: Acquire discrete voltage values according to the voltage-time lookup table file; Performing circuit smoothing processing according to the discrete voltage value to obtain a continuous voltage pulse waveform; Converting the continuous voltage pulse waveform to obtain a driving current value of the semiconductor laser light source; The driving current value of the semiconductor laser light source is used for modulation to obtain the optical pulse signal simulating the rotation of the blade.
[0017] Optionally, obtaining an on-site in-situ calibration result of a non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information includes: Using the optical pulse signal simulating the rotation of the blade to obtain a voltage signal simulating the rotation of the blade; Acquiring blade vibration calibration parameter information using a calibrated non-contact blade vibration measurement system according to the voltage signal simulating blade rotation; The blade vibration calibration parameter information is compared with the blade vibration parameter information to obtain an on-site in-situ calibration result of the non-contact blade vibration measurement device.
[0018] On the other hand, to achieve the above-mentioned purpose, the present invention provides an on-site in-situ calibration device for a non-contact blade vibration measurement device, comprising a blade vibration parameter input device, a blade vibration simulation voltage waveform generator and a voltage-light intensity controller; The blade vibration parameter input device is used to input the vibration parameter information required by the on-site in-situ calibration device; The simulated blade vibration potential waveform generator is used to obtain a voltage-time lookup table file according to the vibration parameter information; The voltage-light intensity controller is used to obtain the light pulse signal simulating the rotation of the blade according to the voltage-time lookup table file.
[0019] Compared with the closest prior art, the present invention has the following beneficial effects: The present invention can realize the calibration and error assessment of non-contact vibration measurement equipment in situ with high fidelity; the calibration method of the present invention can be executed multiple times before the test without disassembling the relevant test equipment, and the operation is portable; the calibration method of the present invention can inject pulse waveforms into multiple sensors at the same time, and can perform overall in-situ calibration and error assessment on all measurement channels and measurement equipment at one time, and can detect the comprehensive performance indicators of the equipment when all channels are working at the same time, which is convenient and fast. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0021] Figure 1 A schematic diagram of an on-site in-situ calibration device for a non-contact blade vibration measurement device according to an embodiment of the present invention; Figure 2 This is a flow chart of an on-site in-situ calibration method for a non-contact blade vibration measurement device according to an embodiment of the present invention; Figure 3 A flowchart of a piecewise function analytical method for generating a sensor voltage-time lookup table file with blade vibration information according to an embodiment of the present invention; Figure 4 A piecewise function analytical model diagram of a sensor voltage waveform proposed in an embodiment of the present invention; Figure 5 A flow chart of generating a voltage-time lookup table file for strain test comparison and high-speed acquisition card waveform acquisition method proposed in an embodiment of the present invention; Figure 6This is a signal processing flow chart of the voltage-light intensity controller proposed in an embodiment of the present invention. DETAILED DESCRIPTION
[0022] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in combination with the specific embodiments of the present invention and the corresponding drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0023] The terms used in the embodiments of the present invention are only used to explain the specific embodiments of the present invention and are not intended to limit the present invention.
[0024] like Figure 1 As shown, the on-site in-situ calibration device of the non-contact blade vibration measurement equipment is composed of a blade vibration parameter input device, a blade vibration simulation voltage waveform generator, and a voltage-light intensity controller connected in sequence. The blade vibration parameter input device is used to set the blade vibration parameter information required by the on-site in-situ calibration device. The blade vibration parameter information includes information such as blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed, blade tip linear velocity, and the number of blades, blade tip diameter, spot diameter, sensor working distance, sensor installation angle, etc. of the on-site test. In addition, the blade vibration parameter input device can be implemented through buttons, touch screens, keyboards, files, etc. The voltage waveform generator simulating dynamic blade vibration is used to receive the blade vibration parameter information set by the blade vibration parameter input device, and generate a voltage-time lookup table file with blade vibration parameter information according to the blade vibration parameter information. It can run on a processor platform such as a CPU, MPU, FPGA, etc., and write a corresponding program to realize this function. The voltage-light intensity controller is used to read the voltage-time lookup table file, smooth and generate a continuous voltage pulse waveform, and convert the voltage pulse waveform into a current pulse waveform, which can modulate the light intensity of the semiconductor laser light source.
[0025] Example 1 Figure 2 As shown, an embodiment of the present invention provides an on-site in-situ calibration method for a non-contact blade vibration measurement device, comprising the following steps: S1. Obtain a voltage-time lookup table file according to vibration parameter information; S2. Acquire an optical pulse signal simulating blade rotation according to the voltage-time lookup table file; S3. Obtaining an on-site in-situ calibration result of a non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information.
[0026] S1 specifically includes: Get vibration parameter information; Acquiring blade vibration parameter information according to the vibration parameter information; Acquire a central time series according to the blade vibration parameter information; Based on the central time series, segmentation is performed using signal waveform characteristics to obtain time segmentation points; Obtaining a function analytical expression according to the time segmentation point; Acquire the voltage-time lookup table file according to the function analytical expression and the time division point; The signal waveform of the blade sweeping across the sensor probe is obtained as the signal waveform feature.
[0027] Further, the vibration parameter information includes blade vibration parameter information and field test information; Among them, the blade vibration parameter information includes blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed and blade tip linear velocity, and the field test information includes the number of blades, blade tip diameter, light spot diameter, sensor working distance and sensor installation angle.
[0028] Furthermore, the function analytical expression includes 0- t a Segment function parsing expression, t a - t b Segment function parsing expression, t b - t c Segment function parsing expression and t c - t d Segment function parsing expressions; The 0- t a The segment function analysis expression is:
[0029] Said t a - t b The segment function analysis expression is:
[0030] Said t b - t c The segment function analysis expression is:
[0031] Said t c - t d The segment function analysis expression is:
[0032] in, t a for a The time division point of the moment, t b for b The time division point of the moment, t c for c The time division point of the moment, t d for d The time division point of the moment, F 1( t ) is 0- t a Segment function parsing expression, L 1 is a fixed value, indicating no light or weak light reception return. F 2( t )for t a - t b Segment function parsing expression, L 2 is the voltage at the maximum received light intensity at the sensor working distance, w 1 for t a - t b The standard deviation of the segment function, t For time, F 3( t )for t b - t c Segment function parsing expression, w 2 for t c - t d The standard deviation of the segment function, F 4( t )for t c - t d Segment functions parse expressions.
[0033] S2 specifically includes: Acquire discrete voltage values according to the voltage-time lookup table file; Performing circuit smoothing processing according to the discrete voltage value to obtain a continuous voltage pulse waveform; Converting the continuous voltage pulse waveform to obtain a driving current value of the semiconductor laser light source; The driving current value of the semiconductor laser light source is used for modulation to obtain the optical pulse signal simulating the rotation of the blade.
[0034] S3 specifically includes: Using the optical pulse signal simulating the rotation of the blade to obtain a voltage signal simulating the rotation of the blade; Acquiring blade vibration calibration parameter information using a calibrated non-contact blade vibration measurement system according to the voltage signal simulating blade rotation; The blade vibration calibration parameter information is compared with the blade vibration parameter information to obtain an on-site in-situ calibration result of the non-contact blade vibration measurement device.
[0035] like Figure 1 As shown, the on-site in-situ calibration device of the non-contact blade vibration measurement equipment includes a blade vibration parameter input device, a blade vibration simulation voltage waveform generator and a voltage-light intensity controller; The blade vibration parameter input device is used to input the vibration parameter information required by the on-site in-situ calibration device; The simulated blade vibration potential waveform generator is used to obtain a voltage-time lookup table file according to the vibration parameter information; The voltage-light intensity controller is used to obtain the light pulse signal simulating the rotation of the blade according to the voltage-time lookup table file.
[0036] Example 2 Figure 1 As shown, this embodiment provides an on-site in-situ calibration method for a non-contact blade vibration measurement device, comprising the following steps: Step 1: Get the vibration blade parameters, specifically: Input preset theoretical blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed, blade tip linear velocity and other blade vibration parameter information, as well as field test information such as the number of blades, blade tip diameter, spot diameter, sensor working distance, sensor installation angle and so on in the field test into the blade vibration parameter input device, wherein the blade vibration parameter input device can be implemented through buttons, touch screens, keyboards, files, etc.
[0037] Step 2: Obtain the voltage-time lookup table file based on the vibration parameter information. Specifically: According to the vibration parameter information, the voltage waveform generator simulating the vibration of the moving blade generates a voltage-time lookup table file with the blade vibration information, as shown in Table 1, the voltage value of each sensor corresponds to time. In addition, the voltage-time lookup table file can also be directly imported by the blade vibration parameter input device, or the voltage-time lookup table file saved last time can be called. The voltage waveform generator simulating the vibration of the moving blade can run on a processor platform such as a CPU, MPU, FPGA, etc., and a corresponding program can be written to realize this function.
[0038] Table 1
[0039] Step 2 designs two methods for generating voltage waveforms with blade vibration information. One is to use the piecewise function analytical method to calculate and generate the voltage-time lookup table file, and the other is to use the strain gauge to compare the measured waveform with the waveform collected by the high-speed acquisition card to generate the voltage-time lookup table file. Specifically: Step 2.1: Figure 3 As shown in the figure, the detailed steps of generating a voltage-time lookup table file based on the piecewise function analytical method of vibration parameter information are as follows: Step 2.1.1, obtaining blade vibration parameter information according to the vibration parameter information, that is, obtaining blade rotation speed, blade tip linear velocity and each blade vibration frequency, amplitude, phase and other information according to the vibration parameter information; Step 2.1.2: Calculate the central time series of each blade reaching the sensor based on the blade vibration parameter information { t i},in,{ t i}It can be calculated based on the existing classical blade tip timing theory and blade vibration theory formula; Step 2.1.3: Based on the central time series and the signal waveform characteristics of the blade passing through the sensor probe, the waveform of each blade is segmented to obtain the time segmentation point ( t a , t b , t c , t d ),like Figure 4 As shown, the signal waveform of a blade is divided into 4 segments, and the time division points are t a , t b , t c , t d Time division point ta , t b , t c , t d The time it takes to reach the center of the sensor through the blades t i , holding time A, rise time B, number of blades, rotation speed, etc., where the holding time A is related to the blade tip thickness h and the blade tip linear velocity v, and the simplified calculation is A=h / v; the rise time B is related to the spot diameter d and the blade tip linear velocity v, and the simplified calculation is B=d / v; Step 2.1.4: Calculate the analytical expression of each function segment based on the time segmentation point F ( t ), including: (1) 0- t a Segment function parsing expression F 1( t ) is expressed as:
[0040] in, L 1 is a fixed value, indicating no light or weak light reception return; (2) t a - t b Segment function parsing expression F 2( t ) is expressed as:
[0041] in, t a - t b The analytical expression of the segment function is expressed by the left half of the Gaussian function, and the rise time B can be taken as w 3 times, L 2 is the voltage at the maximum received light intensity at the sensor working distance, w 1 for t a - t b The standard deviation of the segment function, t For time; (3) t b - t c Segment function parsing expression F 3( t ) is expressed as:
[0042] (4) t c - t d Segment function parsing expression F 4( t ) is expressed as:
[0043] in, w 2 for t c - t d The standard deviation of the segment function, t c - t d Segment function parsing expression and t a - t b Similar to the paragraph, t c - t d The analytical expression of the segment function uses the right half formula of the Gaussian function; Step 2.1.5, and so on, calculate the voltage-time data of the next blade according to the analytical expression and segmentation point of each function, and finally continuously generate the voltage-time lookup table file.
[0044] Step 2.2: Figure 5 As shown in the figure, the detailed steps of generating a voltage-time lookup table file based on vibration parameter information by using strain gauges to compare actual measurements and high-speed acquisition card waveform collection are as follows: Step 2.2.1. Use strain gauges to obtain the actual vibration frequency and amplitude of the blade. Specifically: Conduct a rotating blade vibration measurement experiment, that is, let the rotating rotor work and use strain gauges to measure the blade's true vibration frequency, amplitude, etc.; Step 2.2.2, when measuring the strain gauge, use a non-contact blade vibration measurement device to synchronously monitor the blade sweeping across the sensor waveform; Step 2.2.3, based on the blade sweeping the sensor waveform, use a high-speed acquisition card to collect the original voltage waveform when the blade sweeps over the sensor to obtain the original voltage waveform data; Step 2.2.4, obtain the voltage-time lookup table file according to the original voltage waveform data, specifically: The voltage and the corresponding time in the original voltage waveform are stored as a voltage-time lookup table file.
[0045] Step 3: Obtain the optical pulse signal simulating blade rotation according to the voltage-time lookup table file. Specifically: The voltage-light intensity controller reads the lookup table file to smooth and generate a continuous voltage pulse waveform, which contains known information such as blade vibration frequency, amplitude, phase, etc., and then converts the voltage pulse waveform into a current pulse waveform and injects it into the semiconductor laser light source. The light intensity of the semiconductor laser light source is modulated by the injected current pulse waveform, and an optical pulse signal simulating blade rotation is emitted, which enters the transmitting optical fiber of the calibrated non-contact blade vibration measurement device; like Figure 6 As shown, the detailed steps of the signal processing flow of the voltage-light intensity controller are as follows: Step 3.1, generate precise time (moment) using a high-resolution clock; Step 3.2, obtaining discrete voltage values according to the voltage-time lookup table file and the precise time, that is, obtaining the output discrete voltage value corresponding to the precise time according to the voltage-time lookup table file or obtaining the discrete voltage value according to the interpolation of the voltage values before and after the voltage-time lookup table file; Step 3.3, performing circuit smoothing processing according to the discrete voltage value to obtain a continuous voltage pulse waveform; Step 3.4, converting the continuous voltage pulse waveform through the circuit to obtain the driving current value of the semiconductor laser light source; Step 3.5: Use the driving current value of the semiconductor laser light source to modulate and obtain an optical pulse signal simulating blade rotation. Specifically: The driving current value of the semiconductor laser light source is driven and modulated by current, and is coupled to the sensor transmitting optical fiber to obtain an optical pulse signal simulating the rotation of the blade.
[0046] Step 4: Obtaining the on-site in-situ calibration result of the non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information, specifically: The optical pulse signal simulating the rotation of the blade is emitted to the tip of the blade (at this time, the rotating rotor is in a stopped state and has not started running), and is returned to the photoelectric conversion preamplifier through the blade tip and the receiving optical fiber of the sensor, and converted into a voltage signal simulating the rotation of the blade; then the calibrated non-contact blade vibration measurement system signal processing outputs the blade vibration frequency, amplitude, phase and other blade vibration calibration parameter information. By comparing with the preset blade vibration frequency, amplitude, phase and other blade vibration parameter information, the measurement accuracy, measurement error, etc. of the non-contact blade vibration measurement equipment can be calculated and evaluated, and then the on-site in-situ calibration result of the non-contact blade vibration measurement equipment can be obtained.
[0047] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0048] The present invention is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of the processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.
[0049] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.
[0050] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.
[0051] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.
Claims
1. A method for in-situ calibration of a non-contact blade vibration measurement device, characterized in that: The specific steps include: S1. Obtain a voltage-time lookup table file according to vibration parameter information; S2. Acquire an optical pulse signal simulating blade rotation according to the voltage-time lookup table file; S3. Obtaining an on-site in-situ calibration result of a non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information.
2. The on-site in-situ calibration method of the non-contact blade vibration measurement device according to claim 1, characterized in that: The voltage-time lookup table file obtained based on the vibration parameter information includes: Get vibration parameter information; Acquiring blade vibration parameter information according to the vibration parameter information; Acquire a central time series according to the blade vibration parameter information; Based on the central time series, segmentation is performed using signal waveform characteristics to obtain time segmentation points; Obtaining a function analytical expression according to the time segmentation point; Acquire the voltage-time lookup table file according to the function analytical expression and the time division point; The signal waveform of the blade sweeping across the sensor probe is obtained as the signal waveform feature.
3. The on-site in-situ calibration method of the non-contact blade vibration measurement device according to claim 2, characterized in that: The vibration parameter information includes blade vibration parameter information and field test information; Among them, the blade vibration parameter information includes blade vibration frequency, blade vibration amplitude, blade vibration phase, blade rotation speed and blade tip linear velocity, and the field test information includes the number of blades, blade tip diameter, light spot diameter, sensor working distance and sensor installation angle.
4. The on-site in-situ calibration method of the non-contact blade vibration measurement device according to claim 3, characterized in that: The function analytical expression includes 0- t a Segment function parsing expression, t a - t b Segment function parsing expression, t b - t c Segment function parsing expression and t c - t d Segment function parsing expressions; The 0- t a The segment function analysis expression is: Said t a - t b The segment function analysis expression is: Said t b - t c The segment function analysis expression is: Said t c - t d The segment function analysis expression is: in, t a for a The time division point of the moment, t b for b The time division point of the moment, t c for c The time division point of the moment, t d for d The time division point of the moment, F 1( t ) is 0- t a Segment function parsing expression, L 1 is a fixed value, indicating no light or weak light reception return. F 2( t )for t a - t b Segment function parsing expression, L 2 is the voltage at the maximum received light intensity at the sensor working distance, w 1 for t a - t b The standard deviation of the segment function, t For time, F 3( t )for t b - t c Segment function parsing expression, w 2 for t c - t d The standard deviation of the segment function, F 4( t )for t c - t d Segment functions parse expressions.
5. The on-site in-situ calibration method of the non-contact blade vibration measurement device according to claim 1, characterized in that: Acquiring an optical pulse signal simulating blade rotation according to the voltage-time lookup table file includes: Acquire discrete voltage values according to the voltage-time lookup table file; Performing circuit smoothing processing according to the discrete voltage value to obtain a continuous voltage pulse waveform; Converting the continuous voltage pulse waveform to obtain a driving current value of the semiconductor laser light source; The driving current value of the semiconductor laser light source is used for modulation to obtain the optical pulse signal simulating the rotation of the blade.
6. The on-site in-situ calibration method of the non-contact blade vibration measurement device according to claim 3, characterized in that: Acquiring an on-site in-situ calibration result of a non-contact blade vibration measurement device according to the optical pulse signal simulating blade rotation and the vibration parameter information includes: Using the optical pulse signal simulating the rotation of the blade to obtain a voltage signal simulating the rotation of the blade; Acquiring blade vibration calibration parameter information using a calibrated non-contact blade vibration measurement system according to the voltage signal simulating blade rotation; The blade vibration calibration parameter information is compared with the blade vibration parameter information to obtain an on-site in-situ calibration result of the non-contact blade vibration measurement device.
7. An on-site in-situ calibration device for non-contact blade vibration measurement equipment, implementing the method according to any one of claims 1 to 6, characterized in that: It includes a blade vibration parameter input device, a blade vibration simulation voltage waveform generator and a voltage-light intensity controller; The blade vibration parameter input device is used to input the vibration parameter information required by the on-site in-situ calibration device; The simulated blade vibration potential waveform generator is used to obtain a voltage-time lookup table file according to the vibration parameter information; The voltage-light intensity controller is used to obtain the light pulse signal simulating the rotation of the blade according to the voltage-time lookup table file.
Citation Information
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