Engineering machinery instrument panel hardware detection system and detection method thereof

Abstract

The engineering machinery instrument panel hardware detection system comprises an upper computer, the upper computer is sequentially connected with a CAN analyzer and an automatic detection table, and the automatic detection table is connected with a power source and is connected with a detected instrument panel through a detection wire harness; a detection APP is contained in the upper computer, the upper computer provides a running environment for the detection APP, and the detection APP is used for man-machine interaction, sending a work instruction to the automatic detection table and generating a detection report after detection is completed; the CAN analyzer is used for transmitting data through a J-1939 protocol; the automatic detection platform receives an instruction of the upper computer, and collects ports and related function states of a detected instrument panel; according to the technical scheme, the hardware of the engineering instrument panel and the key panel can be automatically detected in batches, the detection report can be quickly generated, the product detection time is greatly shortened, and the generation efficiency is improved.

Description

Technical Field

[0001] The invention relates to an engineering machinery instrument panel hardware detection system and a detection method thereof. Background Art

[0002] At present, the hardware of embedded devices (instrument panels, keypads) is checked to see if it is normal by manually inputting the corresponding signal to the device and manually observing the display data to determine if the hardware is normal. For example, when testing analog circuits, it is necessary to input resistance, voltage, current and other signals into the analog circuit port, and then observe the results displayed on the display to determine whether the analog circuit is qualified based on experience. When there are many analog, switch, frequency, input, output and other functional ports to be tested, or when there are many products, it will take a lot of man-hours, and manual testing is subjective, which will lead to omissions of test items, and ultimately cause faulty parts to flow into the market, affecting the company's reputation. Summary of the invention

[0003] In order to solve the above technical problems, the present invention provides an engineering machinery instrument panel hardware detection system and a detection method thereof.

[0004] The present invention is achieved through the following technical solutions.

[0005] The present invention provides an engineering machinery instrument panel hardware detection system and detection method thereof, comprising a host computer, the host computer is connected to a CAN analyzer and an automated detection platform in sequence, the automated detection platform is connected to a power supply and is connected to the instrument panel under test through a detection harness;

[0006] The host computer contains a detection APP, which provides a running environment for the detection APP. The detection APP is used for manual interaction, sends work instructions to the automated detection station, and generates a detection report after the detection is completed;

[0007] The CAN analyzer transmits data via the J-1939 protocol;

[0008] The automated testing platform receives commands from the host computer and collects the ports of the instrument panel under test and related functional states;

[0009] The power supply provides direct current power to the automated testing platform.

[0010] The automated testing platform includes an assembly board, which is respectively connected to a signal board, a calibration board, and a tested instrument panel, and the tested instrument panel is respectively connected to the signal board and the calibration board; the assembly board includes an MCU, which is connected to the signal board and the calibration board through connectors, and is also connected to the tested instrument panel through three AMP plugs, and one extended signal interface is reserved;

[0011] The signal board provides a standard signal for the instrument panel under test, the calibration board collects the output signal of the instrument panel, and the assembly board provides a standard interface for the instrument panel under test and controls the power supply of the instrument panel.

[0012] The assembly board is connected to the instrument panel under test and supplies power to the instrument panel under test through an AMP connector.

[0013] The calibration board includes a high-side calibration board and a low-side calibration board, which are respectively connected to the assembly board. The high-side calibration board is responsible for inputting and outputting high-side signals to the instrument panel for detecting the amount of high-level signals that need to be changed; the low-side calibration board is responsible for inputting and outputting low-side signals to the instrument panel for detecting the amount of low-level signals that need to be changed.

[0014] The CAN analyzer is connected to the automated test bench and the instrument panel under test respectively, and the baud rate of the CAN analyzer to the automated test bench is 250K.

[0015] The detection steps of the instrument panel under test are as follows:

[0016] S1. Connect the instrument panel to be tested to the automated testing platform through the testing harness;

[0017] S2. Open the host computer and import the automated testing process according to the type of instrument panel to be tested;

[0018] S4, start testing;

[0019] S5. Check the test report.

[0020] The connection process in step S1 is as follows:

[0021] S11, test bench power line: connect the red wire harness of the test bench to the positive pole of the DC power supply, and the two black wires to the negative pole of the power supply;

[0022] S12, communication wiring of the test bench: connect CANL and CANH to CANL and CANH of CAN analyzer channel one, and connect CL6 and CH6 to CANL and CANH of CAN analyzer channel two.

[0023] The beneficial effects of the present invention are that the hardware of engineering instrument panels and key panels can be automatically tested in batches, and a test report can be quickly generated, which greatly shortens the product testing time and improves the generation efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a structural schematic diagram of the present invention;

[0025] Figure 2 It is a schematic diagram of the connection structure between the assembly board and the CAN communicator of the present invention;

[0026] Figure 3 Schematic diagram of the assembly plate structure of the present invention

[0027] Figure 4 This is an example diagram of the test report of the present invention. DETAILED DESCRIPTION

[0028] The technical solution of the present invention is further described below, but the scope of protection claimed is not limited to the description.

[0029] A construction machinery instrument panel hardware detection system and detection method thereof, comprising a host computer, the host computer is connected to a CAN analyzer and an automated detection platform in sequence, the automated detection platform is connected to a power supply and is connected to a tested instrument panel through a detection harness;

[0030] The host computer contains a detection APP, which provides a running environment for the detection APP. The detection APP is used for manual interaction, sends work instructions to the automated detection station, and generates a detection report after the detection is completed;

[0031] The CAN analyzer transmits data via the J-1939 protocol;

[0032] The automated testing platform receives commands from the host computer and collects the ports of the instrument panel under test and related functional states;

[0033] The power supply provides direct current power to the automated testing platform.

[0034] The automated testing platform includes an assembly board, which is respectively connected to a signal board, a calibration board, and a tested instrument panel, and the tested instrument panel is respectively connected to the signal board and the calibration board; the assembly board includes an MCU, which is connected to the signal board and the calibration board through connectors, and is also connected to the tested instrument panel through three AMP plugs, and one extended signal interface is reserved;

[0035] The signal board provides a standard signal for the instrument panel under test, the calibration board collects the output signal of the instrument panel, and the assembly board provides a standard interface for the instrument panel under test and controls the power supply of the instrument panel.

[0036] The assembly board is connected to the instrument panel under test and supplies power to the instrument panel under test through an AMP connector.

[0037] The calibration board includes a high-side calibration board and a low-side calibration board, which are respectively connected to the assembly board. The high-side calibration board is responsible for inputting and outputting high-side signals to the instrument panel for detecting the amount of high-level signals that need to be changed; the low-side calibration board is responsible for inputting and outputting low-side signals to the instrument panel for detecting the amount of low-level signals that need to be changed.

[0038] The CAN analyzer is connected to the automated test bench and the instrument panel under test respectively, and the baud rate of the CAN analyzer to the automated test bench is 250K.

[0039] The detection steps are:

[0040] S1. Connect the instrument panel to be tested to the automated testing platform through the testing harness;

[0041] S2. Open the host computer and import the automated testing process according to the type of instrument panel to be tested;

[0042] S4, start testing;

[0043] S5. Check the test report.

[0044] The connection process in step S1 is as follows:

[0045] S11, test bench power line: connect the red wire harness of the test bench to the positive pole of the DC power supply, and the two black wires to the negative pole of the power supply;

[0046] S12, communication wiring of the test bench: connect CANL and CANH to CANL and CANH of CAN analyzer channel one, and connect CL6 and CH6 to CANL and CANH of CAN analyzer channel two.

[0047] As shown in the figure, the automated testing equipment consists of a host computer, CAN communication, a testing platform (signal board, calibration board, assembly board) and an instrument panel.

[0048] The host computer provides a graphical operation interface to control the detection process; the signal board provides standard signals for the instrument panel to collect and detect; the calibration board (one high side and one low side) collects the output signal of the instrument panel to detect the output function of the instrument panel; the assembly board provides a standard interface to connect the instrument panel and control the power supply. The CAN communication part uses CAN1 and CAN2 of the CAN analyzer at the same time. CAN1 is connected to the test bench (line mark CANH, CANL), fixed at 250K, and CAN2 is connected to the embedded device, and the baud rate is freely configurable.

[0049] The test bench consists of four circuit boards: assembly board, signal board, high-side calibration board and low-side calibration board.

[0050] The board is always powered on, and the power supply of the detection board (signal board, calibration board) and the instrument panel (B+, P+) is controlled by the host computer software.

[0051] The assembly board is connected to the signal board and the calibration board through connectors inside, and is connected to the instrument panel through three AMP plugs outside, with one extended signal interface reserved.

[0052] Step 1: Automated detection equipment port connection:

[0053] 1. Test bench power cord: Connect the red wire of the test bench harness to the positive pole of the DC power supply, and the two black wires to the negative pole of the power supply.

[0054] 2. Communication wiring of the test bench: CANL and CANH are connected to CANL and CANH of CAN analyzer channel one, and CL6 and CH6 are connected to CANL and CANH of CAN analyzer channel two.

[0055] AMP port definition table:

[0056]

[0057]

[0058]

[0059]

[0060]

Claims

1. A construction machinery instrument panel hardware detection system, characterized by: It includes a host computer, which is connected to a CAN analyzer and an automated testing platform in sequence, and the automated testing platform is connected to a power supply and is connected to a tested instrument panel through a testing harness; The host computer contains a detection APP, which provides a running environment for the detection APP. The detection APP is used for manual interaction, sends work instructions to the automated detection station, and generates a detection report after the detection is completed; The CAN analyzer transmits data via the J-1939 protocol; The automated testing platform receives commands from the host computer and collects the ports of the instrument panel under test and related functional states; The power supply provides direct current power to the automated testing platform.

2. The engineering machinery instrument panel hardware detection system according to claim 1, characterized in that: The automated testing platform includes an assembly board, which is respectively connected to a signal board, a calibration board, and a tested instrument panel, and the tested instrument panel is respectively connected to the signal board and the calibration board; the assembly board includes an MCU, which is connected to the signal board and the calibration board through connectors, and is also connected to the tested instrument panel through three AMP plugs, and one extended signal interface is reserved; The signal board provides a standard signal for the instrument panel under test, the calibration board collects the output signal of the instrument panel, and the assembly board provides a standard interface for the instrument panel under test and controls the power supply of the instrument panel.

3. The engineering machinery instrument panel hardware detection system according to claim 1, characterized in that: The assembly board is connected to the instrument panel under test and supplies power to the instrument panel under test through an AMP connector.

4. The engineering machinery instrument panel hardware detection system according to claim 1, characterized in that: The calibration board includes a high-side calibration board and a low-side calibration board, which are respectively connected to the assembly board. The high-side calibration board is responsible for inputting and outputting high-side signals to the instrument panel for detecting the amount of high-level signals that need to be changed; the low-side calibration board is responsible for inputting and outputting low-side signals to the instrument panel for detecting the amount of low-level signals that need to be changed.

5. The engineering machinery instrument panel hardware detection system according to claim 1, characterized in that: The CAN analyzer is connected to the automated test bench and the instrument panel under test respectively, and the baud rate of the CAN analyzer to the automated test bench is 250K.

6. A method for checking the hardware of an engineering instrument panel, wherein the checking steps are as follows: S1. Connect the instrument panel to be tested to the automated testing platform through the testing harness; S2. Open the host computer and import the automatic detection engineering file according to the type of the instrument panel to be tested; S4, start testing; S5. Check the test report.

7. The method for checking the hardware of an engineering instrument panel according to claim 1, characterized in that: The connection process in step S1 is as follows: S11, test bench power line: connect the red wire of the test bench harness to the positive pole of the DC power supply, and the two black wires to the negative pole of the power supply; S12, communication wiring of the test bench: connect CANL and CANH to CANL and CANH of CAN analyzer channel one, and connect CL6 and CH6 to CANL and CANH of CAN analyzer channel two.

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