Method and system for detecting test stability

Abstract

The invention discloses a method and a device for detecting test stability, the method and the device are suitable for a light splitting machine, and the method comprises the following steps: when a set time is reached, controlling a test probe to be in contact with a detection part; acquiring a voltage value of the test probe; and if the difference value between the voltage value and the standard voltage value is not within the set range, the light splitting machine is triggered to stop. According to the invention, the test stability can be monitored by periodically detecting the voltage value of the test probe.

Description

Technical Field

[0001] The present invention relates to the field of spectrometers, and in particular to a method and system for detecting test stability. Background Art

[0002] The LED spectrometer in the prior art cannot detect test stability. When testing in batches, the contact resistance between the test probe and the product increases due to wear of the test probe, resulting in reduced accuracy of electrical testing. Currently, to achieve stability testing, the existing method is to shut down the machine for manual testing of test stability; or to manage through the life prediction of the test probe, which has low accuracy. Summary of the invention

[0003] In order to overcome the above technical defects, the present invention provides a method and system for detecting and testing stability, which can realize automatic testing of stability.

[0004] In order to solve the above problems, the present invention is implemented according to the following technical solutions:

[0005] A method for detecting test stability, applicable to a spectrometer, comprising the steps of:

[0006] Set the initial standard voltage value and setting range;

[0007] When the set time is reached, the test probe is controlled to contact the detection component;

[0008] Get the voltage value of the test probe;

[0009] If the difference between the voltage value and the standard voltage value is not within the set range, the spectrometer will be triggered to alarm and shut down.

[0010] As a further improvement of the present invention, the step of controlling the test probe to contact the detection component includes:

[0011] The detection area is rotated to below the test probe, and the test probe is energized to contact the two ends of the detection component respectively.

[0012] As a further improvement of the present invention, if the difference between the voltage value and the standard voltage value is within a set range, the voltage value is recorded.

[0013] As a further improvement of the present invention, the present invention further comprises the steps of:

[0014] Determine the state of the input power supply based on the fluctuations in the recorded voltage values.

[0015] As a further improvement of the present invention, the step of setting the initial standard voltage value includes:

[0016] When the number of times the test probe is used is 0, the test probe is controlled to contact the detection component, and the voltage value of the test probe is recorded as the initial standard voltage value.

[0017] As a further improvement of the present invention, the present invention also includes the step of: if the difference between the voltage value and the standard voltage value is not within a set range, and after completing several test stability tests, compensating the test voltage value of the product.

[0018] As a further improvement of the present invention, the step of compensating the test voltage value of the product after completing several test stability tests includes:

[0019] After completing several test stability tests, obtaining the voltage value of the test probe;

[0020] Calculate the difference between the standard voltage value and the voltage value to obtain the compensation voltage value;

[0021] When testing a product, the actual test voltage value minus the compensation voltage value is used as the test voltage value of the product.

[0022] As a further improvement of the present invention, after the spectrometer alarm is triggered to shut down, the initial standard voltage value of the replaced test probe is reset.

[0023] Compared with the prior art, the present invention has the following beneficial effects: the wear of the test probe will lead to an increase in contact resistance. When the excessively worn test probe is connected to the two ends of the detection component, the voltage value of the test probe will increase compared to the voltage value on both sides of the detection component itself. Alternatively, when the output of the power supply to which the test probe is connected changes, the voltage of the test probe will also change. By regularly detecting the voltage value of the test probe, the test stability can be monitored.

[0024] The present invention also provides a system for detecting and testing stability, which is used to implement the above method, including: a turntable, a detection component, a test probe, a nozzle, and a motor;

[0025] The motor is connected to the turntable. In the working state, the motor controls the turntable to rotate at equal intervals, and the test probe contacts the suction nozzle in sequence based on the rotation of the turntable. In the detection state, the motor controls the turntable to rotate to a position where the test probe contacts the detection component.

[0026] The suction nozzles are evenly arranged on the turntable; and the detection component is arranged between two adjacent suction nozzles in one group.

[0027] As a further improvement of the present invention, the detection component is a resistor.

[0028] Compared with the prior art, the present invention has the following beneficial effects: on the basis of the prior art, a detection component is added to the turntable, and used in conjunction with the method, it can realize automatic monitoring of test stability and avoid batch defects of products. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The specific embodiments of the present invention are further described in detail below in conjunction with the accompanying drawings, wherein:

[0030] Figure 1 is a flow chart of the method described in Example 1;

[0031] Figure 2 is another flow chart of the method described in Example 1;

[0032] Figure 3 This is a schematic diagram of the structure of the system described in Example 2.

[0033] Explanation of the accompanying drawings: 1. turntable; 2. detection component; 3. test probe; 4. suction nozzle; 5. motor. DETAILED DESCRIPTION

[0034] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention.

[0035] Example 1

[0036] This embodiment provides a method for detecting test stability, such as Figure 1 and Figure 2 As shown, it is suitable for a spectrometer, comprising the steps of:

[0037] S0. Set the standard voltage value U1 and the setting range. When the test times of the test probe is 0, control the test probe to contact the two ends of the detection component, and record the voltage value of the test probe at this time, which is recorded as the standard voltage value U1.

[0038] S1. When the set time is reached, the test probe is controlled to contact the detection component. The detection frequency can be customized according to the actual situation. For example, the time after the test probe completes M detections. The detection component can be implemented with a resistor. It should be noted that the test probe is a pair of test probes. After completing one detection, the set time is reset and the life count is 1N.

[0039] It should be noted that, for example, setting the test to 100 times as a cycle, 100 / 200 / 300 and so on, 1N 2N3N, until the probe life ends or the voltage exceeds the limit alarm, then the probe needs to be cleaned or replaced in advance.

[0040] The detection area is rotated to below the test probes, and a pair of test probes are energized to contact the two ends of the detection component respectively.

[0041] S2. Obtain the voltage value of the test probe, that is, use the test probe to test the voltage value across the resistor. The voltage value will change with the loss of the test probe.

[0042] S3. If the difference between the voltage value and the standard voltage value is not within the set range, the spectrometer will be shut down and an alarm will be triggered, and the staff will replace the test probe. For example, if the absolute value of the difference between the voltage value U2 and the standard voltage value U1 is greater than the set value x, or the difference between the voltage value U2 and the standard voltage value U1 is not within the range of (-x, x).

[0043] Under ideal conditions, when current I is input to resistor R through the test probe, the standard voltage value should theoretically be U1=IR. If the difference between the voltage value U2 of the test probe and the standard voltage value U1 is X during the test, and X exceeds the error range of the product specification, it can be determined that the test accuracy is poor. At this time, the abnormal conditions that may occur are: 1. The current output of the power supply deviates; 2. The test probe is worn, the contact resistance increases, and the voltage value increases. At this time, it is necessary to stop the machine and alarm to avoid batch failure of the product.

[0044] S4. After the spectrometer alarm is triggered to shut down, the initial standard voltage value of the replaced test probe is reset.

[0045] S4. If the difference between the voltage value and the standard voltage value is within the set range, it is judged that the test accuracy is normal, the test probe is controlled to return to the nozzle position, the product test continues, and the voltage value is recorded.

[0046] S5. According to the fluctuation of the recorded voltage value, the state of the input power is judged, based on which it can be known whether the fluctuation of the input power exceeds the allowed range.

[0047] S6. If the difference between the voltage value and the standard voltage value is not within the set range, and after completing several test stability tests, the test voltage value of the product is compensated to offset the increase in contact resistance caused by probe wear.

[0048] Assume that after completing N test stability tests, the voltage value of the test probe is U N .

[0049] Calculate the difference between the standard voltage value and the voltage value to get the compensation voltage value. The output current of the power supply is I. When a new test probe is used for detection, the probe is controlled to contact both ends of the resistor to obtain the standard voltage value U0 of the probe. At this time, the voltage difference U x =U N -U0,Ux It can be considered as the contact resistance voltage value caused by the wear of the test probe.

[0050] When testing a product, the actual test voltage value U a Subtract the compensation voltage value U x , as the test voltage value of the product U b , U b =U a -U x .

[0051] Regarding the control of the turntable, the energization of the test probes and the acquisition of the voltage value, please refer to the prior art and will not be described in detail here.

[0052] In summary, the wear of the test probe will lead to an increase in contact resistance. When the excessively worn test probe is connected to the two ends of the detection component, the voltage value of the test probe will increase compared to the voltage value on both sides of the detection component itself. Alternatively, when the power output to which the test probe is connected changes, the voltage of the test probe will also change. By regularly detecting the voltage value of the test probe, the test stability can be monitored and determined. In addition, adding a voltage compensation step can improve the accuracy of product testing.

[0053] Example 2

[0054] This embodiment provides a system for detecting test stability, such as Figure 3 As shown, the method used in Example 1 includes: a turntable 1, a detection component 2, a test probe 3, a suction nozzle 4, and a motor 5; the motor 5 is connected to the turntable 1, and when in a working state, the motor 5 controls the turntable 1 to rotate at equal intervals, and the test probe 3 contacts the suction nozzle 4 in sequence based on the rotation of the turntable 1; when in a detection state, the motor 5 controls the turntable 1 to rotate to a position where the test probe 3 contacts the detection component 2; the suction nozzles 4 are evenly arranged on the turntable 1; the detection component 2 is arranged between two adjacent suction nozzles 4 in one group.

[0055] Specifically, in the normal working state, the test probe 3 is connected to the power supply and contacts the product pin to obtain the voltage value of the product; in the detection state, the test probe 3 is connected to the power supply and contacts the two ends of the detection component 2 to obtain the voltage value of the test probe 3.

[0056] Furthermore, the detection component 2 is a resistor, and the shape of the resistor imitates the appearance design of the product, which can ensure that the test probe 3 can contact both ends of the resistor.

[0057] For the specific implementation process of this embodiment, please refer to Embodiment 1, which will not be described in detail here.

[0058] To summarize, in this embodiment, a station for adding resistors is designed on the turntable. The resistor design is comparable to the product appearance, and the resistor pin electrodes are made of the same material as the product, ensuring that the contact state between the probe and the standard resistor is consistent with the state between the probe and the product. The resistor trigger test timing can be customized. Under normal working conditions, the test probe only tests the nozzle station. When the resistor test is triggered, the resistor is electrically tested using the test probe by controlling the rotation position of the turntable. When the voltage value of the test probe is out of the software range, an alarm is triggered and the machine is shut down. Through this embodiment, the test stability can be automatically monitored to avoid batch defects.

[0059] The above are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the protection scope of the present application.

Claims

1. A method for detecting test stability, characterized in that: Applicable to the spectrometer, comprising the steps of: Set the initial standard voltage value and setting range; When the set time is reached, the test probe is controlled to contact the detection component; Get the voltage value of the test probe; If the difference between the voltage value and the standard voltage value is not within the set range, the spectrometer will be triggered to alarm and shut down.

2. The method according to claim 1, characterized in that The step of controlling the test probe to contact the detection component comprises: The detection area is rotated to below the test probe, and the test probe is energized to contact the two ends of the detection component respectively.

3. The method according to claim 1, characterized in that If the difference between the voltage value and the standard voltage value is within the set range, the voltage value is recorded.

4. The method according to claim 3, characterized in that Also includes the steps: Determine the state of the input power supply based on the fluctuations in the recorded voltage values.

5. The method according to claim 1, characterized in that The step of setting the initial standard voltage value includes: When the number of times the test probe is used is 0, the test probe is controlled to contact the detection component, and the voltage value of the test probe is recorded as the initial standard voltage value.

6. The method according to claim 1, characterized in that The method also includes the following steps: if the difference between the voltage value and the standard voltage value is not within the set range, and after completing several test stability tests, compensating the test voltage value of the product.

7. The method according to claim 6, characterized in that The step of compensating the test voltage value of the product after completing several test stability tests includes: After completing several test stability tests, obtaining the voltage value of the test probe; Calculate the difference between the standard voltage value and the voltage value to obtain the compensation voltage value; When testing a product, the actual test voltage value minus the compensation voltage value is used as the test voltage value of the product.

8. The method according to claim 1, characterized in that After the spectrometer alarm is triggered and the machine is shut down, the replaced test probe is reset to its initial standard voltage value.

9. A system for detecting test stability, characterized in that: Used to implement the method according to any one of claims 1 to 8, comprising: a turntable, a detection component, a test probe, a nozzle, and a motor; The motor is connected to the turntable. In the working state, the motor controls the turntable to rotate at equal intervals, and the test probe contacts the suction nozzle in sequence based on the rotation of the turntable. In the detection state, the motor controls the turntable to rotate to a position where the test probe contacts the detection component. The suction nozzles are evenly arranged on the turntable; and the detection component is arranged between two adjacent suction nozzles in one group.

10. The system according to claim 9, characterized in that The detection component is a resistor.

Images